Material quality multi-parameter detection method and device based on interdigital electrode sensor

Abstract

The application relates to the technical field of material quality detection of food and the like, in particular to a material quality multi-parameter detection method and device based on an interdigital electrode sensor, which comprises the following steps: periodically moving a force loading mechanism so that the interdigital electrode sensor contacts, extrudes and releases a measured object; the interdigital electrode sensor comprises an interdigital electrode pair and has an electrical impedance detection mode and a triboelectric detection mode; the interdigital electrode sensor is used to acquire an electrical impedance signal of the measured object based on the electrical impedance detection mode and a triboelectric signal of the measured object based on the triboelectric detection mode in the process of contacting, extruding and releasing the measured object, and the signals are analyzed to obtain multi-parameter information of the measured object, so that the material quality of the measured object is determined. Therefore, the problems of high cost, less information, environmental influence, low detection accuracy, inability to comprehensively reflect the quality of food and reduction of the comprehensiveness and accuracy of material quality detection in the prior art are solved.

Description

Technical Field

[0001] This application relates to the field of material quality testing technology, and in particular to a method and apparatus for multi-parameter material quality testing based on interdigital electrode sensors. Background Technology

[0002] In the food industry and agricultural production, identifying and assessing the state and quality of specific substances is crucial. For example, in fermented wine production, the strength, viscosity, and moisture content of the mash are tested; in fermented tea processing, the degree of fermentation, shape, and tenderness of the tea leaves are examined; in meat processing, the freshness, moisture content, and quality of the meat are assessed; and in agricultural production and harvesting, the maturity, moisture content, and sugar content of fruits and vegetables are measured. Currently, most of these identifications are performed using human senses, which suffers from high reliance on experience and subjective judgment, low efficiency, and inconsistencies between different testers. Therefore, it is essential to automate, digitize, and intelligently identify and assess the quality of raw materials and processed products in the food industry and agricultural production using modern testing technologies.

[0003] With the development of testing technology, several techniques have emerged for identifying and assessing the quality of specific objects in the food industry and agricultural production. These include spectral analysis, conductivity / dielectric constant measurement, and texture analysis. Spectroscopic analysis, based on the absorption and reflection characteristics of the tested object at different wavelengths of light, can achieve multi-parameter detection of components. Conductivity / dielectric constant measurement can detect characteristics such as moisture content and maturity of the object. Texture analysis assesses the mechanical properties of materials, including hardness and elasticity, by applying force.

[0004] However, the related technologies are costly or provide limited information, and are easily affected by the external environment, reducing the accuracy of the detection. In addition, conductivity / dielectric constant measurement can only detect the moisture content or maturity of the object, and cannot fully reflect the quality of food, thus reducing the comprehensiveness and accuracy of material quality detection, which urgently needs to be addressed. Summary of the Invention

[0005] This application provides a method and apparatus for multi-parameter detection of material quality based on interdigital electrode sensors, in order to solve the problems of high cost or limited information provided by related technologies, as well as susceptibility to external environmental influences, resulting in low detection accuracy, inability to fully reflect food quality, and reduced comprehensiveness and accuracy of material quality detection.

[0006] The first aspect of this application provides a method for detecting multiple parameters of material quality based on an interdigital electrode sensor. The force loading mechanism is equipped with an interdigital electrode sensor. The method includes the following steps: performing periodic motion on the force loading mechanism, causing the interdigital electrode sensor to contact, compress, and release the object being tested. The interdigital electrode sensor includes interdigital electrode pairs and has an impedance detection mode and a triboelectric detection mode. The interdigital electrode sensor is used to acquire impedance signals based on the impedance detection mode and triboelectric signals based on the triboelectric detection mode of the object being tested during the contact, compression, and release process. The impedance signals and triboelectric signals are analyzed to obtain multiple parameter information of the object being tested, and the material quality of the object being tested is determined using the multiple parameter information.

[0007] Optionally, in one embodiment of this application, the step of using the interdigital electrode sensor to acquire the impedance signal of the test object based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode during the process of contacting, squeezing, and releasing the test object includes: during the periodic motion of the force loading mechanism, the interdigital electrode sensor alternately switches between the impedance detection mode and the triboelectric detection mode to acquire the impedance signal and the triboelectric signal of the test object collected by the interdigital electrode sensor during the periodic motion.

[0008] Optionally, in one embodiment of this application, the step of analyzing the impedance signal and the triboelectric signal to obtain multi-parameter information of the tested object, and using the multi-parameter information to determine the material quality of the tested object, includes: analyzing the impedance signal and the triboelectric signal to obtain multi-parameter information of the tested object, wherein the multi-parameter information includes mechanical information, internal composition information, and surface information; the mechanical information includes the compressibility, resilience, and softness of the tested object; the internal composition information includes the moisture content, material composition, and other components affecting the impedance and triboelectricity of the tested object; the surface information includes the surface viscosity, surface roughness, and surface texture of the tested object; and using the mechanical information, the internal composition information, and the surface information to determine the material quality of the tested object.

[0009] Optionally, in one embodiment of this application, the step of acquiring the impedance signal based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode during the contact, compression, and release of the test object using the interdigital electrode sensor includes: after the force loading mechanism performs a movement close to the test object and moves to a contact position with the test object, the force loading mechanism performs a compression movement of the test object, and acquires a first impedance signal collected by the interdigital electrode sensor during the compression movement of the test object; after the force loading mechanism moves to the lowest contact limit with the test object, the force loading mechanism stops moving and presses the test object to acquire a second impedance signal collected by the interdigital electrode sensor when pressing the test object; after the force loading mechanism runs to the lowest contact limit and remains stationary for a preset time, it performs a release movement of the test object and moves to a separation position from the test object, and the force loading mechanism performs a movement away from the test object, and acquires a third impedance signal collected by the interdigital electrode sensor during the release movement of the test object;

[0010] After the force loading mechanism moves closer to the object under test and reaches a contact position with the object under test, the force loading mechanism squeezes the object under test to the lowest contact limit. During the squeezing motion, the force loading mechanism acquires a first current signal or a first voltage signal generated by the contact between the surface of the interdigital electrode sensor and the surface of the object under test, which is collected by the interdigital electrode sensor, as a first triboelectric signal. After the force loading mechanism reaches the lowest contact limit and remains stationary for a preset time, it releases the object under test and moves to the separation position from the object under test. During the releasing motion, the force loading mechanism moves away from the object under test. During the releasing motion, the force loading mechanism acquires a second current signal or a second voltage signal generated by the contact between the surface of the interdigital electrode sensor and the surface of the object under test, which is collected by the interdigital electrode sensor, as a second triboelectric signal.

[0011] Optionally, in one embodiment of this application, determining the material quality of the tested object using the multi-parameter information includes: determining first mechanical information and first surface information of the tested object based on the first impedance signal and the third impedance signal; determining first internal composition information of the tested object based on the second impedance signal; determining second internal composition information, second mechanical information, and second surface information of the tested object based on the first triboelectric signal and the second triboelectric signal; and analyzing the first mechanical information, the first internal composition information, the first surface information, the second mechanical information, the second internal composition information, and the second surface information to obtain the material quality of the tested object.

[0012] Optionally, in one embodiment of this application, the method further includes: when the force loading mechanism performs periodic motion, contacting, squeezing, and releasing the object under test at different speeds or with different forces to obtain multiple first impedance signals, multiple second impedance signals, multiple third impedance signals, multiple first triboelectric signals, and multiple second triboelectric signals based on the different speeds or forces of contacting, squeezing, and releasing the object under test; and using the multiple first impedance signals, the multiple second impedance signals, the multiple third impedance signals, the multiple first triboelectric signals, and the multiple second triboelectric signals to obtain the target material quality of the object under test.

[0013] A second aspect of this application provides a multi-parameter material quality detection device based on an interdigital electrode sensor. The force loading mechanism is equipped with an interdigital electrode sensor. The device includes: a control module for performing periodic motion on the force loading mechanism, causing the interdigital electrode sensor to contact, compress, and release the object being tested; wherein the interdigital electrode sensor comprises interdigital electrode pairs and has an impedance detection mode and a triboelectric detection mode; a signal detection module for acquiring, using the interdigital electrode sensor, an impedance signal based on the impedance detection mode and a triboelectric signal based on the triboelectric detection mode of the object being tested during the contact, compression, and release process; and a data analysis module for analyzing the impedance signal and the triboelectric signal to obtain multi-parameter information of the object being tested and using the multi-parameter information to determine the material quality of the object being tested.

[0014] Optionally, in one embodiment of this application, the signal detection module includes: a detection unit, configured to, during the periodic movement of the force loading mechanism, alternately switch between the impedance detection mode and the triboelectric detection mode by the interdigital electrode sensor to acquire the impedance signal and the triboelectric signal of the object under test collected by the interdigital electrode sensor during the periodic movement; a first acquisition unit, configured to, after the force loading mechanism moves closer to the object under test and reaches a contact position with the object under test, the force loading mechanism performs a squeezing movement of the object under test, and acquire the first impedance signal collected by the interdigital electrode sensor during the squeezing movement; a second acquisition unit, configured to, after the force loading mechanism moves to the lowest contact limit with the object under test, the force loading mechanism stops moving and presses the object under test, to acquire the second impedance signal collected by the interdigital electrode sensor when pressing the object under test; and a third acquisition unit, configured to, after the force loading mechanism moves to the lowest contact limit and remains stationary for a preset time, perform a releasing movement of the object under test and moves to the point where the object under test is... The force loading mechanism moves away from the object under test at the separation position of the object under test, and acquires the third impedance signal collected by the interdigital electrode sensor during the release of the object under test. A fourth acquisition unit is used to, after the force loading mechanism moves closer to the object under test and reaches the contact position with the object under test, squeeze the object under test to the lowest contact limit position, and acquire the first current signal or first voltage signal generated by the contact between the interdigital electrode sensor surface and the object under test surface collected by the interdigital electrode sensor during the squeezing movement of the object under test, as a first triboelectric signal. A fifth acquisition unit is used to, after the force loading mechanism reaches the lowest contact limit position and remains stationary for a preset time, release the object under test and move to the separation position of the object under test, and the force loading mechanism moves away from the object under test, and acquire the second current signal or second voltage signal generated by the contact between the interdigital electrode sensor surface and the object under test surface collected by the interdigital electrode sensor during the release movement of the object under test, as a second triboelectric signal.

[0015] Optionally, in one embodiment of this application, the data analysis module includes: an analysis unit, configured to analyze the impedance signal and the triboelectric signal to obtain multi-parameter information of the object under test, wherein the multi-parameter information includes mechanical information, internal composition information, and surface information; the mechanical information includes the compressibility, resilience, and softness of the object under test; the internal composition information includes the moisture content, material composition, and other components affecting the impedance and triboelectricity of the object under test; the surface information includes the surface viscosity, surface roughness, and surface texture of the object under test; a first determination unit, configured to determine the material quality of the object under test using the mechanical information, the internal composition information, and the surface information; and a second determination unit, configured to perform a squeezing motion on the object under test when the force loading mechanism moves closer to the object under test and reaches a contact position with the object under test. The system moves to the lowest contact limit position, and determines the contact position based on the impedance signal and the triboelectric signal to determine the lowest contact limit between the force loading mechanism and the object under test; a third determining unit is used to determine the first mechanical information and the first surface information of the object under test based on the first impedance signal and the third impedance signal; a fourth determining unit is used to determine the first internal composition information of the object under test based on the second impedance signal; a fifth determining unit is used to determine the second internal composition information, the second mechanical information, and the second surface information of the object under test based on the first triboelectric signal and the second triboelectric signal; a data analysis unit is used to analyze the first mechanical information, the first internal composition information, the first surface information, the second mechanical information, the second internal composition information, and the second surface information to obtain the material quality of the object under test.

[0016] A third aspect of this application provides an electronic device, including: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the material quality multi-parameter detection method based on interdigital electrode sensors as described in the above embodiments.

[0017] A fourth aspect of this application provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-described method for multi-parameter detection of material quality based on an interdigital electrode sensor.

[0018] A fifth aspect of this application provides a computer program product, including a computer program that, when executed, is used to implement the above-described method for multi-parameter detection of material quality based on interdigitated electrode sensors.

[0019] This application embodiment can perform periodic motion of the force loading mechanism, causing the interdigitated electrode sensor to contact, squeeze, and release the object under test. The interdigitated electrode sensor includes interdigitated electrode pairs and has an impedance detection mode and a triboelectric detection mode. Then, the interdigitated electrode sensor is used to acquire the impedance signal based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode of the object under test during the contact, squeezing, and release process, and the above signals are analyzed to obtain multi-parameter information of the object under test, thereby determining the material quality of the object under test. This can more accurately and comprehensively reflect the quality of food, improving the comprehensiveness and accuracy of material quality detection. Thus, it solves the problems of high cost or limited information provided by related technologies, and susceptibility to external environmental influences, resulting in low detection accuracy, inability to comprehensively reflect food quality, and reduced comprehensiveness and accuracy of material quality detection.

[0020] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0021] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the following description of the embodiments taken in conjunction with the accompanying drawings, wherein:

[0022] Figure 1 This is a schematic diagram of a multi-parameter material quality detection system based on an interdigitated electrode sensor according to an embodiment of this application;

[0023] Figure 2 This is a basic structural diagram of the interdigital electrode sensor provided according to an embodiment of this application;

[0024] Figure 3 This is a flowchart of a multi-parameter material quality detection method based on an interdigitated electrode sensor provided in an embodiment of this application;

[0025] Figure 4 This is a schematic diagram of the impedance mode detection principle of an interdigitated multifunctional sensor according to a specific embodiment of this application.

[0026] Figure 5 This is a schematic diagram illustrating the triboelectric mode detection principle of a multifunctional sensor with an interdigital structure according to a specific embodiment of this application.

[0027] Figure 6 This is a schematic diagram of a material quality multi-parameter detection process based on an interdigitated electrode sensor according to a specific embodiment of this application.

[0028] Figure 7 This is a logic diagram of a multi-parameter material quality detection system based on an interdigitated electrode sensor, according to a specific embodiment of this application.

[0029] Figure 8 This is a schematic diagram of a multi-parameter material quality detection device based on an interdigitated electrode sensor provided in an embodiment of this application.

[0030] Figure 9 This is a schematic diagram of the structure of an electronic device provided according to an embodiment of this application. Detailed Implementation

[0031] The embodiments of this application are described in detail below. Examples of these embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain this application, and should not be construed as limiting this application.

[0032] The following description, with reference to the accompanying drawings, describes a method and apparatus for multi-parameter detection of material quality based on an interdigital electrode sensor, according to embodiments of this application. Addressing the issues mentioned in the background section regarding the high cost or limited information provided by related technologies, and their susceptibility to external environmental influences leading to low detection accuracy and an inability to comprehensively reflect food quality, thus reducing the comprehensiveness and accuracy of material quality detection, this application provides a method for multi-parameter detection of material quality based on an interdigital electrode sensor. In this method, a force-loading mechanism performs periodic motion, causing the interdigital electrode sensor to contact, compress, and release the object being tested. The interdigital electrode sensor includes interdigital electrode pairs and has both an impedance detection mode and a triboelectric detection mode. Then, the interdigital electrode sensor acquires the impedance signal based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode of the object being tested during the contact, compression, and release process. These signals are analyzed to obtain multi-parameter information of the object being tested, thereby determining the material quality of the object and thus more accurately and comprehensively reflecting the quality of food, improving the comprehensiveness and accuracy of material quality detection. This solves the problems of high cost or limited information provided by related technologies, as well as susceptibility to external environmental influences, resulting in low detection accuracy, inability to fully reflect food quality, and reduced comprehensiveness and precision of material quality testing.

[0033] This application provides a multi-parameter material quality detection system based on an interdigital electrode sensor, which consists of a force loading mechanism and an interdigital electrode sensor, as detailed below. Figure 1As shown, assuming the force loading mechanism performs periodic motion, the interdigital electrode sensor is fixed on the force loading mechanism, and the object under test is placed on the stage. For example, the force loading mechanism can be a robotic finger, and the interdigital electrode sensor is attached to the surface of the robotic finger. The robotic finger grasps and pinches the object under test according to a certain program to perform the test. Among them, the force loading mechanism performs a programmed periodic motion in a certain pattern, contacting, squeezing, and releasing the object under test. The interdigital electrode sensor acquires the dynamic impedance signal and triboelectric signal during the contact and separation process with the object under test, as well as the static impedance signal when pressing the object under test.

[0034] It should be noted that the basic structure of the interdigital electrode sensor is as follows: Figure 2 As shown, it mainly consists of a substrate and planar interdigitated electrodes. The interdigitated electrode sensor contains pairs of interdigitated electrodes, and the signal acquisition modes include: impedance detection between interdigitated electrode pairs, and triboelectric detection using a single electrode or electrode pair. The structural parameters of the interdigitated electrodes, such as finger length, finger width, and finger spacing, can be optimized according to the object being measured.

[0035] For example, in the interdigitated electrode sensor of this application embodiment, i.e., the interdigitated structure multi-parameter sensor, the electrode substrate can be a PI (Polyimide) film, and the electrode can be made of copper (Cu). A layer of gold (Au) can be deposited on the copper surface to enhance corrosion resistance. The electrode substrate can also be prepared by vapor deposition of parylene film, and chromium (Cr) can be used as the bonding layer between the substrate film and other metals. The specific settings can be made by those skilled in the art and are not specifically limited here.

[0036] In practical applications, force loading mechanisms can be made of either rigid or flexible materials, depending on the requirements. Planar interdigitated multifunctional sensors can also be made of either rigid or flexible materials. Using rigid materials offers advantages such as lower control complexity and better robustness; using flexible materials provides greater adaptability to irregular objects. Specific configurations can be determined by relevant technical personnel and are not limited here.

[0037] Specifically, Figure 3 This is a schematic flowchart of a multi-parameter material quality detection method based on an interdigital electrode sensor provided in an embodiment of this application.

[0038] like Figure 3 As shown, the multi-parameter material quality detection method based on interdigitated electrode sensors includes the following steps:

[0039] In step S301, the force loading mechanism performs periodic motion, causing the interdigital electrode sensor to contact, squeeze, and release the object being measured. The interdigital electrode sensor includes interdigital electrode pairs and has an impedance detection mode and a triboelectric detection mode.

[0040] It is understood that the force loading mechanism of the above system can perform periodic motion. For example, the force loading mechanism of the above system can perform up-and-down periodic motion, left-and-right periodic motion, etc. in a certain pattern. Without specific limitations, this allows the interdigital electrode sensor to contact, squeeze, and release the object being measured. The interdigital electrode sensor includes interdigital electrode pairs and has an impedance detection mode and a triboelectric detection mode. Thus, the interdigital electrode sensor can perform impedance detection between interdigital electrode pairs and triboelectric detection using a single electrode or electrode pair, effectively improving the feasibility of multi-parameter detection of material quality.

[0041] It should be noted that the interdigitated electrode pairs may or may not have an insulating layer; the force loading mechanism can be any mechanism that can apply force to the object under test; the direction of movement of the force loading mechanism is not limited and can be any direction of movement that can apply force to the object under test.

[0042] In step S302, the interdigitated electrode sensor is used to acquire the impedance signal of the test object based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode during the process of contacting, squeezing and releasing the test object.

[0043] It is understood that the embodiments of this application can control the force loading mechanism to perform periodic motion, and use interdigital electrode sensors to acquire the impedance signal of the test object based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode during the contact, compression and release of the test object, so as to obtain multi-parameter information of the test object, such as mechanical information, internal composition information and surface information, thereby accurately determining the material quality of the test object.

[0044] In one embodiment of this application, the interdigitated electrode sensor is used to acquire the impedance signal of the test object based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode during the contact, compression and release of the test object. This includes: during the periodic motion of the force loading mechanism, the interdigitated electrode sensor alternately switches between the impedance detection mode and the triboelectric detection mode to acquire the impedance signal and triboelectric signal of the test object collected by the interdigitated electrode sensor during the periodic motion.

[0045] In actual implementation, the embodiments of this application can alternately switch between impedance detection mode and triboelectric detection mode during the periodic motion of the force loading mechanism to obtain the impedance signal and triboelectric signal of the object under test collected by the interdigital electrode sensor during the periodic motion. By analyzing the impedance signal and triboelectric signal, multi-parameter information of the object under test can be obtained, which effectively improves the accuracy and comprehensiveness of multi-parameter detection of material quality.

[0046] It should be noted that the timing and method of the interdigital electrode sensor switching are determined by skill and technology, and are not specifically limited here.

[0047] Optionally, in one embodiment of this application, the interdigitated electrode sensor is used to acquire impedance signals based on impedance detection mode and triboelectric signals based on triboelectric detection mode during the contact, compression, and release of the test object. This includes: after the force loading mechanism moves closer to the test object and reaches a contact position with it, the force loading mechanism performs a compression movement of the test object, acquiring a first impedance signal collected by the interdigitated electrode sensor during the compression movement; after the force loading mechanism reaches the lowest contact limit with the test object, the force loading mechanism stops moving and presses the test object firmly, acquiring a second impedance signal collected by the interdigitated electrode sensor when pressing the test object; after the force loading mechanism reaches the lowest contact limit and remains stationary for a preset time, it performs a release movement of the test object and moves to a separation position from the test object, and the force loading mechanism performs a movement away from the test object. During the release of the test object, a third impedance signal is acquired from the interdigitated electrode sensor. After the force loading mechanism moves closer to the test object and reaches the contact position with the test object, the force loading mechanism squeezes the test object to the lowest contact limit. During the squeezing of the test object, a first current signal or a first voltage signal generated by the contact between the surface of the interdigitated electrode sensor and the surface of the test object is acquired from the interdigitated electrode sensor, serving as a first triboelectric signal. After the force loading mechanism reaches the lowest contact limit and remains stationary for a preset time, the test object is released and moves to the separation position from the test object. The force loading mechanism then moves away from the test object. During the release of the test object, a second current signal or a second voltage signal generated by the contact between the surface of the interdigitated electrode sensor and the surface of the test object is acquired from the interdigitated electrode sensor, serving as a second triboelectric signal.

[0048] For example, assuming the force loading mechanism of the above system performs up-and-down cyclic motion, and after moving downward to the contact position with the object under test, the force loading mechanism continues to perform downward pressing motion on the object under test. During the pressing motion, the first impedance signal collected by the interdigital electrode sensor is acquired. After moving downward to the lowest contact limit with the object under test, the force loading mechanism stops moving and presses the object under test, acquiring the second impedance signal collected by the interdigital electrode sensor when pressing the object under test. After the force loading mechanism moves to the lowest contact limit and remains stationary for a certain period of time, it performs upward releasing motion on the object under test and moves to the separation position from the object under test, that is, the force loading mechanism performs a motion away from the object under test. During the releasing motion, the third impedance signal collected by the interdigital electrode sensor is acquired. Among them, the impedance signal acquired during pressing mainly reflects the internal information of the pressed object under test, such as the moisture content and composition, which affect the electrical conductivity of the object under test. The change of the dynamic impedance signal acquired during the movement contains the mechanical information related to the structure of the object under test during the compression deformation and recovery process, effectively improving the accuracy of multi-parameter detection of material quality.

[0049] For example, such as Figure 4 As shown, in impedance detection mode, the test object and the electrode surface are in contact. The inherent impedance of the electrode itself, the impedance of the test object, and the contact impedance between the test object and the electrode constitute the impedance between the two interdigitated electrodes, which can be regarded as a two-port network. In impedance detection mode, an AC signal of a specific frequency is applied between the two interdigitated electrodes to excite them, and the electrical signal response is measured. By analyzing the relationship between the input and output electrical signals, the impedance information at that frequency can be obtained. Furthermore, by sweeping the frequency range, the impedance spectrum of that frequency range can be obtained, which contains more information than the impedance value at a specific frequency. The impedance of the test object reflects the internal component information of the test object, such as water content, which affects the electrical conductivity of the test object; the contact impedance between the test object and the electrode reflects the surface electrochemical information of the test object and the contact state between the test object and the electrode (surface morphology and mechanical information).

[0050] When acquiring impedance signals, a small-amplitude sinusoidal voltage (or current) of a certain frequency is applied to the interdigital electrode pairs of the interdigital electrode sensor, and the waveform of the current (or voltage on the interdigital electrode pairs) flowing through the interdigital electrode pairs is recorded. The current or voltage waveform contains amplitude and phase information. When acquiring impedance signals, current or voltage information at several different frequency points can be acquired, or frequency sweeping can be performed within a certain frequency range to acquire current or voltage information at each frequency within the sweep range.

[0051] It should be noted that the two pairs of interdigital electrodes in the interdigital electrode sensor can be of any other shape, such as arc-shaped, ring-shaped, spiral-shaped, etc. Furthermore, they can also be electrode pairs composed of multiple sets of interdigital electrodes connected in series and parallel.

[0052] For example, assuming the force loading mechanism of the above system performs up-and-down cyclical motion, after the force loading mechanism moves downward toward the object under test and reaches the contact position with the object under test, the force loading mechanism continues to move downward to squeeze the object under test to the lowest contact limit. During the downward squeezing of the object under test, the first current signal or the first voltage signal generated by the contact between the surface of the interdigital electrode sensor and the surface of the object under test is acquired by the interdigital electrode sensor, which serves as the first triboelectric signal. Then, after the force loading mechanism moves downward to the lowest contact limit and remains stationary for a certain period of time, it moves upward to release the object under test and moves to the separation position from the object under test, that is, the force loading mechanism moves away from the object under test. During the release of the object under test, the second current signal or the second voltage signal generated by the contact between the surface of the interdigital electrode sensor and the surface of the object under test is acquired by the interdigital electrode sensor, which serves as the second triboelectric signal. This effectively improves the accuracy of multi-parameter detection of material quality.

[0053] For example, such as Figure 5 As shown, in triboelectric detection mode, when the interdigital electrode sensor contacts, presses against, and separates from the object under test, the surfaces of both the interdigital electrode sensor and the object under test will acquire opposite charges due to the triboelectric effect. The amount of charge is related to the triboelectric sequence of the object under test material, surface state, surface texture, and the contact condition between the sensor and the object. When the interdigital electrode sensor is connected to a reference ground through a resistor, the charge on the electrode will flow into the reference ground through the resistor, generating a voltage across the resistor. By measuring the current or the voltage across the resistor, a triboelectric signal can be obtained. In other words, when the sensor moves relative to the object under test, a triboelectric signal reflecting the characteristics of the object under test can be detected. The triboelectric detection mode can utilize one electrode or a pair of electrodes of the interdigital electrode as the triboelectric detection electrode. During triboelectric signal acquisition, any one electrode of the interdigital electrode sensor can be used, or both electrodes of the interdigital electrode can be connected and used simultaneously. When using electrode pairs as electrodes for triboelectric detection, short-circuiting the electrode pairs together as a single electrode increases the contact area between the tested material and the electrode, enhances the output triboelectric signal, and effectively improves the accuracy of multi-parameter detection of material quality.

[0054] When the force loading mechanism drives the interdigital electrode sensor to complete the contact, compression, and separation actions with the object being measured, the surface of the interdigital electrode sensor and the surface of the object being measured will be charged with opposite signs due to the triboelectric effect. The amount of charge is related to the triboelectric sequence of the material of the object being measured, the surface state, the surface texture, and the contact condition between the interdigital electrode sensor and the object being measured. Therefore, during the multiple contact, compression, and separation actions, the triboelectric signal integrates the mechanical information (contact condition), material information (triboelectric sequence), and surface state and texture information of the object being measured.

[0055] It should be noted that the preset duration is set by those skilled in the art based on the actual situation, and no specific limitation is made here.

[0056] In step S303, the impedance signal and triboelectric signal are analyzed to obtain multi-parameter information of the object under test, and the material quality of the object under test is determined using the multi-parameter information.

[0057] It is understood that the embodiments of this application can analyze impedance signals and triboelectric signals to obtain multi-parameter information of the object under test, such as mechanical information, internal composition information, and surface information. For example, the embodiments of this application can detect the impedance signals and triboelectric signals of the interdigital electrode sensor. Then, machine learning algorithms are used to decouple the signals of different parameters to obtain the mechanical information, internal composition information, and surface information of the object under test. Furthermore, by analyzing the obtained multi-parameter information, the multi-parameter detection results of the material quality of the object under test can be determined, effectively improving the comprehensiveness and accuracy of material quality detection.

[0058] Specifically, the multi-parameter information in this application embodiment includes mechanical information, internal composition information, and surface information. The mechanical information includes the compressibility, resilience, and softness of the tested object; the internal composition information includes the moisture content, material properties, and other components that affect the electrical resistance and triboelectricity of the tested object; and the surface information includes the surface viscosity, surface roughness, and surface texture of the tested object. By using the mechanical information, internal composition information, and surface information, the material quality of the tested object is determined. Through the analysis of the acquired multi-parameter information, the comprehensiveness and accuracy of material quality detection are effectively improved.

[0059] Optionally, in one embodiment of this application, determining the material quality of the object under test using multi-parameter information includes: determining first mechanical information and first surface information of the object under test based on a first impedance signal and a third impedance signal; determining first internal composition information of the object under test based on a second impedance signal; determining second internal composition information, second mechanical information, and second surface information of the object under test based on a first triboelectric signal and a second triboelectric signal; and analyzing the first mechanical information, first internal composition information, first surface information, second mechanical information, second internal composition information, and second surface information to obtain the material quality of the object under test.

[0060] For example, such as Figure 6 As shown, the force loading mechanism of the above system performs cyclic motion. In this embodiment, the force loading mechanism can perform a motion close to the object under test from the initial position, squeezing the object under test. During the squeezing motion, the first impedance signal collected by the interdigital electrode sensor is acquired, and a motion away from the object under test is performed until a separation position is reached. During the motion away from the object under test, the third impedance signal collected by the interdigital electrode sensor is acquired, and the first mechanical information and first surface information of the object under test are determined. The first internal composition information of the object under test is determined based on the second impedance signal collected by pressing the object under test. The force loading mechanism continues to perform the squeezing motion of the object under test. When the device moves to the lowest contact limit, a first triboelectric signal is acquired during the compression of the tested object and a second triboelectric signal is acquired during the release of the tested object. This determines the second internal composition information, second mechanical information, and second surface information of the tested object. By analyzing the first mechanical information, first internal composition information, first surface information, second mechanical information, second internal composition information, and second surface information, and through the analysis of the acquired multi-parameter information, the material quality of the tested object is obtained. This allows for the evaluation and classification of the state and quality of the tested object, thereby obtaining multi-parameter detection results of the material quality of the tested object, effectively improving the comprehensiveness of material quality detection.

[0061] For example, such as Figure 7The diagram shows the logic diagram for multi-parameter material quality detection based on interdigital electrode sensors. First, after system startup, the force loading mechanism moves closer to the object being measured from its initial position, beginning to collect sensor signals, such as impedance or triboelectric signals. Once the sensor reaches contact with the object, the force loading mechanism continues to move closer to the object, compressing it and remaining stationary at the lowest limit for a period. Then, the force loading mechanism releases the object, the sensor separates from the object, signal acquisition stops, and the mechanism moves away from the object, returning to its initial position. Second, when the measured object reaches the set number of detections, detection stops; otherwise, the signal detection mode is switched, such as from impedance detection mode to triboelectric detection mode, thereby improving the comprehensiveness of material quality detection.

[0062] It should be noted that, since the detection circuits of the interdigital electrode sensor's impedance detection mode and triboelectric detection mode are different, the detection circuit can be switched by changing the electrode connection method during use to perform time-division detection and achieve multi-functional multiplexing.

[0063] Furthermore, to address the identification and assessment needs of different materials in the food industry and agricultural production, a fixed force loading parameter process can be designed based on the characteristics of the object being tested. When the driving force or relative maximum displacement of the force loading mechanism is consistent, objects with different mechanical properties will produce different deformations, resulting in different impedance and triboelectric signals. This allows for the differentiation of different mechanical properties, material properties, or surface states. By detecting the impedance and triboelectric signals of sensors, the mechanical, internal composition, and surface information of the object being tested can be simultaneously acquired. Using machine learning algorithms, these three dimensions of information can be effectively decoupled and utilized, thereby enabling the identification and assessment of the quality of raw materials and processed materials in the food industry and agricultural production.

[0064] Optionally, in one embodiment of this application, it further includes: when the force loading mechanism performs periodic motion, contacting, squeezing, and releasing the object under test at different speeds or with different forces to obtain multiple first impedance signals, multiple second impedance signals, multiple third impedance signals, multiple first triboelectric signals, and multiple second triboelectric signals based on contacting, squeezing, and releasing the object under test at different speeds or with different forces; and using the multiple first impedance signals, multiple second impedance signals, multiple third impedance signals, multiple first triboelectric signals, and multiple second triboelectric signals to obtain the target material quality of the object under test.

[0065] In this embodiment of the application, the target material quality is a more accurate material quality obtained through multiple signals.

[0066] In some embodiments, when the force loading mechanism performs periodic motion, it can contact, squeeze, and release the object under test at different speeds or with different forces to obtain multiple first impedance signals, multiple second impedance signals, multiple third impedance signals, multiple first triboelectric signals, and multiple second triboelectric signals of the object under different speeds or with different forces. By utilizing more signals, the material quality of the object under test can be obtained more accurately, and the comprehensiveness of material quality detection can be improved.

[0067] The multi-parameter material quality detection method based on interdigital electrode sensors proposed in this application involves a force-loading mechanism performing periodic motion, causing the interdigital electrode sensors to contact, compress, and release the object being tested. The interdigital electrode sensors include pairs of interdigital electrodes and have both impedance detection and triboelectric detection modes. The interdigital electrode sensors then acquire the impedance signal based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode of the object being tested during the contact, compression, and release process. These signals are analyzed to obtain multi-parameter information about the object being tested, thereby determining its material quality. This allows for a more accurate and comprehensive reflection of food quality, improving the comprehensiveness and accuracy of material quality detection. This solves the problems of high cost or limited information provided by related technologies, as well as susceptibility to external environmental influences, leading to low detection accuracy and an inability to comprehensively reflect food quality, thus reducing the comprehensiveness and accuracy of material quality detection.

[0068] Next, referring to the accompanying drawings, a multi-parameter material quality detection device based on an interdigitated electrode sensor is described according to an embodiment of this application.

[0069] Figure 8 This is a block diagram of a material quality multi-parameter detection device based on an interdigital electrode sensor according to an embodiment of this application.

[0070] like Figure 8 As shown, the material quality multi-parameter detection device 10 based on interdigital electrode sensors includes: a control module 100, a signal detection module 200, and a data analysis module 300.

[0071] Specifically, the control module 100 is used to perform periodic motion on the force loading mechanism, so that the interdigital electrode sensor contacts, squeezes, and releases the object being measured. The interdigital electrode sensor includes interdigital electrode pairs and has an impedance detection mode and a triboelectric detection mode.

[0072] The signal detection module 200 is used to acquire the impedance signal of the test object based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode during the process of contacting, squeezing and releasing the test object using interdigital electrode sensors.

[0073] The data analysis module 300 is used to analyze the impedance signal and triboelectric signal to obtain multi-parameter information of the object under test, and to use the multi-parameter information to determine the material quality of the object under test.

[0074] Optionally, in one embodiment of this application, the signal detection module 200 includes: a detection unit, a first acquisition unit, a second acquisition unit, a third acquisition unit, a fourth acquisition unit, and a fifth acquisition unit.

[0075] The detection unit is used to alternately switch between impedance detection mode and triboelectric detection mode by the interdigital electrode sensor during the periodic motion of the force loading mechanism, so as to obtain the impedance signal and triboelectric signal of the object under test collected by the interdigital electrode sensor during the periodic motion.

[0076] The first acquisition unit is used to acquire the first impedance signal collected by the interdigital electrode sensor during the squeezing motion after the force loading mechanism performs a motion close to the object under test and moves to the contact position with the object under test.

[0077] The second acquisition unit is used to acquire the second impedance signal collected by the interdigital electrode sensor when the force loading mechanism stops moving after it moves to the lowest contact limit with the object under test and presses the object under test.

[0078] The third acquisition unit is used to release the object under test and move to a position of separation from the object under test after the force loading mechanism has moved to the lowest contact limit and remained stationary for a preset time. The force loading mechanism moves away from the object under test, and the third impedance signal collected by the interdigital electrode sensor is acquired during the movement of releasing the object under test.

[0079] The fourth acquisition unit is used to, after the force loading mechanism moves close to the object under test and moves to the contact position with the object under test, squeeze the object under test to the lowest contact limit position, and acquire the first current signal or the first voltage signal generated by the contact between the surface of the interdigital electrode sensor and the surface of the object under test collected by the interdigital electrode sensor during the squeezing movement of the object under test, as the first triboelectric signal.

[0080] The fifth acquisition unit is used to release the object under test and move to a position of separation from the object under test after the force loading mechanism has moved to the lowest contact limit and remained stationary for a preset time. The force loading mechanism moves away from the object under test. During the release of the object under test, the second current signal or the second voltage signal generated by the contact between the surface of the interdigital electrode sensor and the surface of the object under test is acquired by the interdigital electrode sensor and used as the second triboelectric signal.

[0081] Optionally, in one embodiment of this application, the data analysis module 300 includes: an analysis unit, a first determination unit, a second determination unit, a third determination unit, a fourth determination unit, a fifth determination unit, and a data analysis unit.

[0082] The analysis unit is used to analyze the electrical impedance signal and triboelectric signal to obtain multi-parameter information of the object under test. The multi-parameter information includes mechanical information, internal composition information and surface information. The mechanical information includes the compressibility, resilience and softness of the object under test; the internal composition information includes the water content, material and other components that affect the electrical impedance and triboelectricity of the object under test; the surface information includes the surface viscosity, surface roughness and surface texture of the object under test.

[0083] The first determining unit is used to determine the material quality of the object being measured by utilizing mechanical information, internal composition information, and surface information.

[0084] The second determining unit is used to squeeze the object under test to the lowest contact limit when the force loading mechanism moves close to the object under test and moves to the contact position with the object under test. The contact position is determined based on the impedance signal and the triboelectric signal to determine the lowest contact limit between the force loading mechanism and the object under test.

[0085] The third determining unit is used to determine the first mechanical information and the first surface information of the object under test based on the first impedance signal and the third impedance signal.

[0086] The fourth determining unit is used to determine the first internal component information of the object under test based on the second impedance signal.

[0087] The fifth determining unit is used to determine the second internal composition information, the second mechanical information, and the second surface information of the object under test based on the first triboelectric signal and the second triboelectric signal.

[0088] The data analysis unit is used to analyze first mechanical information, first internal composition information, first surface information, second mechanical information, second internal composition information, and second surface information to obtain the material quality of the object being tested.

[0089] It should be noted that the foregoing explanation of the embodiment of the material quality multi-parameter detection method based on interdigital electrode sensors also applies to the material quality multi-parameter detection device based on interdigital electrode sensors in this embodiment, and will not be repeated here.

[0090] The multi-parameter material quality detection device based on interdigital electrode sensors proposed in this application can perform periodic motion of the force loading mechanism, causing the interdigital electrode sensors to contact, squeeze, and release the object being tested. The interdigital electrode sensors include pairs of interdigital electrodes and have both impedance detection and triboelectric detection modes. Then, the interdigital electrode sensors acquire the impedance signal based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode of the object being tested during the contact, squeezing, and release process. These signals are analyzed to obtain multi-parameter information of the object being tested, thereby determining the material quality of the object. This allows for a more accurate and comprehensive reflection of food quality, improving the comprehensiveness and accuracy of material quality detection. Therefore, this solves the problems of high cost or limited information provided by related technologies, as well as susceptibility to external environmental influences, leading to low detection accuracy and an inability to comprehensively reflect food quality, thus reducing the comprehensiveness and accuracy of material quality detection.

[0091] Figure 9 A schematic diagram of the structure of an electronic device provided in an embodiment of this application. The electronic device may include:

[0092] The memory 901, the processor 902, and the computer program stored on the memory 901 and capable of running on the processor 902.

[0093] When the processor 902 executes the program, it implements the material quality multi-parameter detection method based on interdigitated electrode sensor provided in the above embodiments.

[0094] Furthermore, electronic devices also include:

[0095] Communication interface 903 is used for communication between memory 901 and processor 902.

[0096] The memory 901 is used to store computer programs that can run on the processor 902.

[0097] The memory 901 may include high-speed RAM memory, and may also include non-volatile memory, such as at least one disk storage device.

[0098] If the memory 901, processor 902, and communication interface 903 are implemented independently, then the communication interface 903, memory 901, and processor 902 can be interconnected via a bus to complete communication between them. The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. Buses can be divided into address buses, data buses, control buses, etc. For ease of representation, Figure 9 The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0099] Optionally, in a specific implementation, if the memory 901, processor 902, and communication interface 903 are integrated on a single chip, then the memory 901, processor 902, and communication interface 903 can communicate with each other through an internal interface.

[0100] The processor 902 may be a central processing unit (CPU), an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of this application.

[0101] This embodiment also provides a computer-readable storage medium storing a computer program that, when executed by a processor, implements the above-described method for multi-parameter detection of material quality based on interdigital electrode sensors.

[0102] This embodiment also provides a computer program product, including a computer program that, when executed, is used to implement the above-described multi-parameter material quality detection method based on interdigital electrode sensors.

[0103] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0104] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "N" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0105] Any process or method described in the flowchart or otherwise herein can be understood as representing a module, segment, or portion of code comprising one or N executable instructions for implementing custom logic functions or processes, and the scope of the preferred embodiments of this application includes additional implementations in which functions may be performed not in the order shown or discussed, including substantially simultaneously or in reverse order depending on the functions involved, as should be understood by those skilled in the art to which embodiments of this application pertain.

[0106] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as a ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by, or in conjunction with, an instruction execution system, apparatus, or device (such as a computer-based system, a processor-included system, or other system that can fetch and execute instructions from, an instruction execution system, apparatus, or device). For the purposes of this specification, "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transmit programs for use by, or in conjunction with, an instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of computer-readable media include: an electrical connection having one or more wires (electronic device), a portable computer disk drive (magnetic device), random access memory (RAM), read-only memory (ROM), erasable and editable read-only memory (EPROM or flash memory), fiber optic devices, and portable optical disc read-only memory (CDROM). Alternatively, the computer-readable medium may be paper or other suitable media on which the program can be printed, since the program can be obtained electronically by optically scanning the paper or other medium, followed by editing, interpreting, or otherwise processing as necessary, and then stored in a computer memory.

[0107] It should be understood that the various parts of this application can be implemented using hardware, software, firmware, or a combination thereof. In the above embodiments, the N steps or methods can be implemented using software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, it can be implemented using any one or a combination of the following techniques known in the art: discrete logic circuits having logic gates for implementing logical functions on data signals, application-specific integrated circuits (ASICs) having suitable combinational logic gates, programmable gate arrays (PGAs), field-programmable gate arrays (FPGAs), etc.

[0108] Those skilled in the art will understand that all or part of the steps of the methods in the above embodiments can be implemented by a program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, the program includes one or a combination of the steps of the method embodiments.

[0109] Furthermore, the functional units in the various embodiments of this application can be integrated into a processing module, or each unit can exist physically separately, or two or more units can be integrated into a module. The integrated module can be implemented in hardware or as a software functional module. If the integrated module is implemented as a software functional module and sold or used as an independent product, it can also be stored in a computer-readable storage medium.

[0110] The storage medium mentioned above can be a read-only memory, a disk, or an optical disk, etc. Although embodiments of this application have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting this application. Those skilled in the art can make changes, modifications, substitutions, and variations to the above embodiments within the scope of this application.

Claims

1. A method for detecting multiple parameters of material quality based on an interdigital electrode sensor, characterized in that, The force loading mechanism is equipped with an interdigitated electrode sensor. The method for detecting multiple parameters of material quality based on the interdigitated electrode sensor includes the following steps: The force loading mechanism performs periodic motion, causing the interdigitated electrode sensor to contact, squeeze, and release the object being measured. The interdigitated electrode sensor includes interdigitated electrode pairs and has an impedance detection mode and a triboelectric detection mode. The interdigitated electrode sensor is used to acquire impedance signals based on the impedance detection mode and triboelectric signals based on the triboelectric detection mode during the process of contacting, squeezing, and releasing the object under test. The impedance signal and the triboelectric signal are analyzed to obtain multi-parameter information of the object under test, and the material quality of the object under test is determined using the multi-parameter information. The steps for obtaining the impedance signal and the triboelectric signal include: After the force loading mechanism moves closer to the object under test and moves to the contact position with the object under test, the force loading mechanism performs a squeezing motion on the object under test, and acquires the first impedance signal collected by the interdigital electrode sensor during the squeezing motion on the object under test. After the force loading mechanism moves to the lowest contact limit with the object under test, the force loading mechanism stops moving and presses the object under test to obtain the second impedance signal collected by the interdigital electrode sensor when the object under test is pressed. After the force loading mechanism moves to the lowest contact limit and remains stationary for a preset time, it performs a movement to release the object under test and moves to a position separated from the object under test. The force loading mechanism performs a movement away from the object under test. During the movement to release the object under test, the third impedance signal collected by the interdigital electrode sensor is acquired. After the force loading mechanism moves closer to the object under test and moves to the contact position with the object under test, the force loading mechanism squeezes the object under test to the lowest contact limit. During the squeezing of the object under test, the first current signal or the first voltage signal generated by the contact between the surface of the interdigital electrode sensor and the surface of the object under test collected by the interdigital electrode sensor is acquired as the first triboelectric signal. After the force loading mechanism moves to the lowest contact limit and remains stationary for a preset time, it releases the object under test and moves to the separation position from the object under test. The force loading mechanism moves away from the object under test. During the release of the object under test, it acquires the second current signal or the second voltage signal generated by the contact between the surface of the interdigital electrode sensor and the surface of the object under test, collected by the interdigital electrode sensor, as the second triboelectric signal.

2. The method according to claim 1, characterized in that, The method of acquiring the impedance signal of the test object based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode during the process of contacting, squeezing, and releasing the test object using the interdigitated electrode sensor further includes: During the periodic motion performed by the force loading mechanism, the interdigital electrode sensor alternately switches between the impedance detection mode and the triboelectric detection mode to acquire the impedance signal and triboelectric signal of the object under test collected by the interdigital electrode sensor during the periodic motion.

3. The method according to claim 2, characterized in that, The analysis of the impedance signal and the triboelectric signal to obtain multi-parameter information of the tested object, and the use of the multi-parameter information to determine the material quality of the tested object, includes: The electrical impedance signal and the triboelectric signal are analyzed to obtain multi-parameter information of the object under test, wherein the multi-parameter information includes mechanical information, internal composition information and surface information, and the mechanical information includes the compressibility, resilience and softness of the object under test; The internal composition information includes the water content, material, and other components that affect the electrical resistance and triboelectricity of the tested object; The surface information includes the surface viscosity, surface roughness, and surface texture of the object being tested. The material quality of the tested object is determined using the mechanical information, the internal composition information, and the surface information. The process of determining the material quality of the tested object using the multi-parameter information includes: Based on the first impedance signal and the third impedance signal, the first mechanical information and the first surface information of the object under test are determined; Based on the second impedance signal, the first internal component information of the object under test is determined; Based on the first triboelectric signal and the second triboelectric signal, the second internal composition information, the second mechanical information, and the second surface information of the object under test are determined; The material quality of the tested object is obtained by analyzing the first mechanical information, the first internal composition information, the first surface information, the second mechanical information, the second internal composition information, and the second surface information.

4. The method according to claim 1, characterized in that, Also includes: When the force loading mechanism performs the periodic motion, it contacts, squeezes, and releases the object under test at different speeds or with different forces to obtain multiple first impedance signals, multiple second impedance signals, multiple third impedance signals, multiple first triboelectric signals, and multiple second triboelectric signals based on the different speeds or different forces of contacting, squeezing, and releasing the object under test. The target material quality of the object under test is obtained by using the plurality of first impedance signals, the plurality of second impedance signals, the plurality of third impedance signals, the plurality of first triboelectric signals, and the plurality of second triboelectric signals.

5. A multi-parameter material quality detection device based on an interdigital electrode sensor, characterized in that, The force loading mechanism is equipped with an interdigital electrode sensor, wherein the material quality multi-parameter detection device based on the interdigital electrode sensor includes: The control module is used to perform periodic motion on the force loading mechanism, so that the interdigital electrode sensor contacts, squeezes, and releases the object being measured. The interdigital electrode sensor includes interdigital electrode pairs and has an impedance detection mode and a triboelectric detection mode. The signal detection module is used to acquire, using the interdigital electrode sensor, the impedance signal of the test object based on the impedance detection mode and the triboelectric signal based on the triboelectric detection mode during the process of contacting, squeezing and releasing the test object; The data analysis module is used to analyze the impedance signal and the triboelectric signal to obtain multi-parameter information of the object under test, and to use the multi-parameter information to determine the material quality of the object under test. The signal detection module includes: a first acquisition unit, used to acquire a first impedance signal collected by the interdigital electrode sensor during the squeezing motion after the force loading mechanism performs a movement close to the object under test and moves to a contact position with the object under test, and the force loading mechanism performs a squeezing motion on the object under test. The second acquisition unit is used to acquire the second impedance signal collected by the interdigital electrode sensor when the object under test is pressed after the force loading mechanism stops moving and presses the object under test after moving to the lowest contact limit with the object under test. The third acquisition unit is used to release the object under test and move to a separation position from the object under test after the force loading mechanism runs to the lowest contact limit and remains stationary for a preset time. The force loading mechanism performs a movement away from the object under test, and acquires the third impedance signal collected by the interdigital electrode sensor during the movement of releasing the object under test. The fourth acquisition unit is used to perform a squeezing motion of the object under test to the lowest contact limit after the force loading mechanism performs a motion close to the object under test and moves to the contact position with the object under test. During the squeezing motion of the object under test, the unit acquires the first current signal or the first voltage signal generated by the contact between the surface of the interdigital electrode sensor and the surface of the object under test collected by the interdigital electrode sensor, and uses it as the first triboelectric signal. The fifth acquisition unit is used to release the object under test and move to the separation position from the object under test after the force loading mechanism has moved to the lowest contact limit and remained stationary for a preset time. The force loading mechanism moves away from the object under test. During the release of the object under test, the unit acquires the second current signal or the second voltage signal generated by the contact between the surface of the interdigital electrode sensor and the surface of the object under test, collected by the interdigital electrode sensor, as the second triboelectric signal.

6. The apparatus according to claim 5, characterized in that, The signal detection module also includes: The detection unit is used to allow the interdigitated electrode sensor to alternately switch between the impedance detection mode and the triboelectric detection mode during the periodic motion of the force loading mechanism, so as to obtain the impedance signal and the triboelectric signal of the object under test collected by the interdigitated electrode sensor during the periodic motion.

7. The apparatus according to claim 6, characterized in that, The data analysis module includes: An analysis unit is used to analyze the electrical impedance signal and the triboelectric signal to obtain multi-parameter information of the object under test, wherein the multi-parameter information includes mechanical information, internal composition information and surface information, and the mechanical information includes the compressibility, resilience and softness of the object under test; The internal composition information includes the water content, material, and other components that affect the electrical resistance and triboelectricity of the tested object; The surface information includes the surface viscosity, surface roughness, and surface texture of the object being tested. The first determining unit is used to determine the material quality of the object under test using the mechanical information, the internal composition information and the surface information; The second determining unit is used to squeeze the object under test to the lowest contact limit when the force loading mechanism moves closer to the object under test and moves to the contact position with the object under test. The contact position is determined based on the impedance signal and the triboelectric signal, and the lowest contact limit between the force loading mechanism and the object under test is determined. The third determining unit is used to determine the first mechanical information and the first surface information of the object under test based on the first impedance signal and the third impedance signal. The fourth determining unit is used to determine the first internal component information of the object under test based on the second impedance signal; The fifth determining unit is used to determine the second internal composition information, the second mechanical information, and the second surface information of the object under test based on the first triboelectric signal and the second triboelectric signal. The data analysis unit is used to analyze the first mechanical information, the first internal composition information, the first surface information, the second mechanical information, the second internal composition information, and the second surface information to obtain the material quality of the object under test.

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