Drive test switching load system and method

Abstract

This invention provides a drive test load switching system and method, belonging to the field of automotive basic software development technology. The system includes: a storage module, communicating with a host computer, for acquiring and storing load parameters; a human-machine interface module, also communicating with the host computer, for acquiring load parameters to be matched; the load parameters to be matched include: data on various controller-under-test (DUT) models and load data for configuring drive loops for multiple drive test cases to be configured; a host computer, communicating with a main control MCU, for obtaining load configuration information based on the load parameters and the load parameters to be matched, and obtaining drive loop load configuration results based on test data; and a main control MCU, communicating with the drive loops, for configuring grouped drive loops based on the load configuration information, and obtaining test data for the grouped drive loop load configuration. This invention simplifies the operation process and improves load switching efficiency.

Description

Technical Field

[0001] This invention relates to the field of automotive basic software development technology, specifically to a drive test load switching system and method. Background Technology

[0002] Option 1 (CN118409914A) - HIL Test System and Method: During HIL testing, the load switching of each channel is controlled individually based on the test signal. The main problems are: basic software function verification is incomplete, not all problems can be exposed, and if problems occur after integration, considerable effort is required to troubleshoot and locate the cause. Furthermore, manual test results are easily affected by human factors and have low testing efficiency.

[0003] Option 2 (CN208459849U) – A general-purpose automotive electronic control unit functional testing system: manual load switching. The main problem is that each test requires setting a load switching signal for each channel, making test cases complex and prone to errors. Therefore, because different controllers have different load types for each drive circuit, switching controllers for testing during functional verification requires manual load switching. Connecting real loads or resistive loads to the circuits according to functional verification needs leads to low efficiency. Therefore, existing technologies for load switching in drive testing suffer from cumbersome operation and low efficiency. Summary of the Invention

[0004] In view of this, it is necessary to provide a system and method for switching loads in driving tests to solve the technical problems of cumbersome operation and low efficiency in the existing technology for switching loads in driving tests.

[0005] To address the aforementioned technical problems, this invention provides, on the one hand, a load switching system for driving tests, comprising: Storage module, human-machine interface module, host computer, main control MCU and drive circuit; The storage module, which communicates with the host computer, is used to acquire and store load parameters; the load parameters include: load data for various controller models and load data for various drive test case configuration drive loops; The human-machine module communicates with the host computer and is used to obtain the load parameters to be matched. The load parameters to be matched are: data of various controller models under test and load data of the drive loops of multiple drive test cases to be configured. The host computer communicates with the main control MCU and is used to obtain load configuration information based on load parameters and load parameters to be matched, and to obtain the load configuration result of the drive circuit based on test data. The main control MCU communicates with the drive circuit and is used to configure the grouped drive circuit based on the load configuration information to obtain the test data of the grouped drive circuit with the configured load.

[0006] In one possible implementation, the system further includes a communication bus for connecting the host computer and the main control MCU.

[0007] In one possible implementation, the system further includes a display screen that is communicatively connected to a host computer.

[0008] In one possible implementation, the system further includes: The host computer is used to generate control signals; The controller communicates with the host computer to receive control signals and configure the load by controlling the drive circuit based on the control signals.

[0009] In one possible implementation, the control signal includes: The calibration frequency and duty cycle of the controller's XCP.

[0010] In one possible implementation, the host computer is also used to display the load configuration results of the drive circuit.

[0011] In one possible implementation, the test data for the drive circuit configuration load includes: The current, frequency, duty cycle, and voltage of the drive circuit.

[0012] On the other hand, a method for driving test load switching includes: The load parameters are obtained and stored through the storage module; the load parameters are: load data of various controller models and load data of various drive test case configuration drive loops; The load parameters to be matched are obtained through the human-machine module. The load parameters to be matched are: data of various controller models under test and load data of the drive loops of multiple drive test cases to be configured. The host computer obtains load configuration information based on load parameters and load parameters to be matched, and obtains the load configuration result of the drive circuit based on test data; The test data of the grouped drive circuit configuration load is obtained by configuring the grouped drive circuit with the load based on the load configuration information by the main control MCU.

[0013] In one possible implementation, obtaining the load configuration information based on load parameters and load parameters to be matched includes: Data matching is performed based on the load parameters and the load parameters to be matched to obtain the load configuration information.

[0014] In one possible implementation, obtaining the drive loop configuration load result based on test data includes: The drive loop configuration load result is obtained by matching the test data with the preset standard threshold.

[0015] The beneficial effects of this invention are as follows: The drive test load switching system provided by this invention includes: a storage module, a human-machine module, a host computer, a main control MCU, and a drive loop; the storage module is communicatively connected to the host computer and is used to acquire and store load parameters; the load parameters are: data of multiple controller models and load data of multiple drive test case configurations for drive loops; the human-machine module is communicatively connected to the host computer and is used to acquire load parameters to be matched; the load parameters to be matched are: data of multiple controller models to be tested and load data of multiple drive test case configurations for drive loops to be configured; the host computer is communicatively connected to the main control MCU and is used to obtain load configuration information based on the load parameters and the load parameters to be matched, and to obtain the drive loop configuration load result based on the test data; the main control MCU is communicatively connected to the drive loop and is used to configure the grouped drive loops based on the load configuration information, and obtain the test data of the grouped drive loops configured with load. This invention mainly proposes that the drive test load switching system can achieve automated implementation of drive loop configuration load test data through information exchange between the host computer, the main control MCU, and the drive loops, and simplifies the load configuration process by pre-grouping the drive loops, thereby improving work efficiency. Attached Figure Description

[0016] To more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0017] Figure 1 A schematic diagram of an embodiment of the drive test load switching system provided by the present invention; Figure 2 A schematic diagram of a basic software function verification device for an embodiment of the drive test load switching system provided by the present invention; Figure 3 A schematic diagram illustrating the verification principle of a complex driver function of an embodiment of the driver test load switching system provided by the present invention; Figure 4 A load control principle diagram of an embodiment of the drive test load switching system provided by the present invention; Figure 5 A schematic diagram of an adjustable simulated load for an embodiment of the drive test switching load system provided by the present invention; Figure 6 A load switching flowchart of an embodiment of the drive test load switching system provided by the present invention; Figure 7 This is a schematic flowchart of an embodiment of the load switching method for drive testing provided by the present invention. Detailed Implementation

[0018] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, and not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0019] In the description of the embodiments of this application, unless otherwise stated, "a plurality of" means two or more.

[0020] In this embodiment of the invention, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, apparatus, product or device that includes a series of steps or modules is not necessarily limited to those steps or modules that are explicitly listed, but may include other steps or modules that are not explicitly listed or that are inherent to such process, method, product or device.

[0021] The naming or numbering of steps in the embodiments of the present invention does not mean that the steps in the method flow must be executed in the time / logical order indicated by the naming or numbering. The execution order of the named or numbered process steps can be changed according to the technical purpose to be achieved, as long as the same or similar technical effect can be achieved.

[0022] In this document, the term "embodiment" means that a particular feature, structure, or characteristic described in connection with an embodiment may be included in at least one embodiment of the invention. The appearance of this phrase in various places throughout the specification does not necessarily refer to the same embodiment, nor is it a separate or alternative embodiment mutually exclusive with other embodiments. It will be explicitly and implicitly understood by those skilled in the art that the embodiments described herein can be combined with other embodiments.

[0023] This invention provides a system and method for driving test load switching, which will be described below.

[0024] Figure 1 This is a schematic diagram of an embodiment of the drive test load switching system provided by the present invention. Figure 2 A schematic diagram of the basic software function verification device for an embodiment of the drive test load switching system provided by the present invention. Figure 3A schematic diagram illustrating the complex driver function verification principle of an embodiment of the driver test load switching system provided by the present invention includes: Storage module 101, human-machine module 102, host computer 103, main control MCU 104 and drive circuit 105; The storage module 101 is communicatively connected to the host computer 103 and is used to acquire and store load parameters; the load parameters are: data of various controller models and load data of various drive test case configuration drive loops 105; The human-machine module 102 is communicatively connected to the host computer 103 and is used to obtain the load parameters to be matched. The load parameters to be matched are: data of various controller models under test and load data of the drive loop 105 configured with multiple drive test cases to be configured. The host computer 103 communicates with the main control MCU 104 and is used to obtain load configuration information based on load parameters and load parameters to be matched, and to obtain the load configuration result of drive circuit 105 based on test data. The main control MCU 104 is connected to the drive circuit 105 and is used to configure the grouped drive circuit 105 based on the load configuration information to obtain the test data of the grouped drive circuit 105 configured with the load.

[0025] It is understood that the specific steps for switching the load system in the drive test provided by this invention are as follows: a) Configure the load of each drive loop 105 according to the model of the controller under test and the test case, and store the load configuration information in the load data storage module 101 in advance.

[0026] b) Set the controller model and test cases in the human-machine module 102.

[0027] c) The host computer 103 automatically retrieves the load configuration information that matches the settings of the human-machine module 102 from the load data storage module 101.

[0028] d) Transmit the load configuration information to the load master controller MCU104 via the communication bus.

[0029] e) The load master control MCU104 configures the load of each drive circuit 105 according to the received load configuration information.

[0030] f) The load master control MCU104 sends the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0031] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0032] Methods for determining simulated load parameters: 1. Measure the impedance of the actual load, then calculate the maximum current in the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current in the loop.

[0033] 2. The simulated load resistance value is close to the measured real part of the impedance resistance value, and the power of the simulated load is greater than the calculated minimum power value.

[0034] To further understand, the load master control MCU 104 pins are connected to the load control loop, controlling the connection or disconnection of the corresponding load in the drive loop 105. The load connection of the controller under test drive loop 1051 is controlled by pins P1.1, P1.2, and P1.3 of the load master control MCU 104. At any given time, only one pin of P1.1, P1.2, or P1.3 is allowed to output a high level, and the pin that outputs a high level controls the connection of the corresponding load to the drive loop 105.

[0035] It can be further understood that this testing equipment can save the preset groups according to the pre-set load of each drive circuit 105. Different controllers correspond to different groups, and the same controller can correspond to multiple different groups. See Table 1 for details: Table 1: Drive Circuit Configuration Load Table

[0036] Understandably, the load controller MCU104 energizes the relay coil circuit, thereby connecting the corresponding load circuit, and the corresponding load is connected to the drive circuit 105 of the controller under test. After connection, the corresponding indicator light illuminates.

[0037] Each drive circuit 105 can connect to a maximum of one load; connecting multiple loads will result in an error message.

[0038] When a simulated load is selected to be connected to the drive circuit 105, the simulated load parameters can be adjusted by controlling one of the pins of L1, L2, and L3 to output a high level, thereby controlling one of the switches of K1, K2, and K3 to close.

[0039] In the embodiments provided by the present invention, the system further includes: a communication bus for connecting the host computer 103 and the main control MCU 104.

[0040] It is understood that the specific steps for switching the load system in the drive test provided by this invention are as follows: a) Configure the load of each drive loop 105 according to the model of the controller under test and the test case, and store the load configuration information in the load data storage module 101 in advance.

[0041] b) Set the controller model and test cases in the human-machine module 102.

[0042] c) The host computer 103 automatically retrieves the load configuration information that matches the settings of the human-machine module 102 from the load data storage module 101.

[0043] d) Transmit the load configuration information to the load master controller MCU104 via the communication bus.

[0044] e) The load master control MCU104 configures the load of each drive circuit 105 according to the received load configuration information.

[0045] f) The load master control MCU104 sends the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0046] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0047] Methods for determining simulated load parameters: 1. Measure the impedance of the actual load, then calculate the maximum current in the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current in the loop.

[0048] 2. The simulated load resistance value is close to the measured real part of the impedance resistance value, and the power of the simulated load is greater than the calculated minimum power value.

[0049] In the embodiments provided by the present invention, the system further includes: a display screen, which is communicatively connected to the host computer 103.

[0050] It is understood that the specific steps for switching the load system in the drive test provided by this invention are as follows: a) Configure the load of each drive loop 105 according to the model of the controller under test and the test case, and store the load configuration information in the load data storage module 101 in advance.

[0051] b) Set the controller model and test cases in the human-machine module 102.

[0052] c) The host computer 103 automatically retrieves the load configuration information that matches the settings of the human-machine module 102 from the load data storage module 101.

[0053] d) Transmit the load configuration information to the load master controller MCU104 via the communication bus.

[0054] e) The load master control MCU104 configures the load of each drive circuit 105 according to the received load configuration information.

[0055] f) The load master control MCU104 sends the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0056] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0057] Methods for determining simulated load parameters: 1. Measure the impedance of the actual load, then calculate the maximum current in the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current in the loop.

[0058] 2. The simulated load resistance value is close to the measured real part of the impedance resistance value, and the power of the simulated load is greater than the calculated minimum power value.

[0059] Figure 4 A load control schematic diagram of an embodiment of the drive test load switching system provided by the present invention includes: The host computer 103 is used to generate control signals; The controller is connected to the host computer 103 to receive control signals and configure the load by controlling the drive circuit 105 based on the control signals.

[0060] It is understood that the specific steps for switching the load system in the drive test provided by this invention are as follows: a) Configure the load of each drive loop 105 according to the model of the controller under test and the test case, and store the load configuration information in the load data storage module 101 in advance.

[0061] b) Set the controller model and test cases in the human-machine module 102.

[0062] c) The host computer 103 automatically retrieves the load configuration information that matches the settings of the human-machine module 102 from the load data storage module 101.

[0063] d) Transmit the load configuration information to the load master controller MCU104 via the communication bus.

[0064] e) The load master control MCU104 configures the load of each drive circuit 105 according to the received load configuration information.

[0065] f) The load master control MCU104 sends the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0066] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0067] Methods for determining simulated load parameters: 1. Measure the impedance of the actual load, then calculate the maximum current in the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current in the loop.

[0068] 2. The simulated load resistance value is close to the measured real part of the impedance resistance value, and the power of the simulated load is greater than the calculated minimum power value.

[0069] Figure 5 A schematic diagram of an adjustable simulated load for an embodiment of the drive test switching load system provided by the present invention includes: The calibration frequency and duty cycle of the controller's XCP.

[0070] Understandably, the host computer 103 of the complex drive function verification device uses XCP to calibrate the frequency, duty cycle, and drive control switch to turn on the drive output of the controller under test.

[0071] The specific steps for switching the load system during driver testing provided by this invention are as follows: a) Configure the load of each drive loop 105 according to the model of the controller under test and the test case, and store the load configuration information in the load data storage module 101 in advance.

[0072] b) Set the controller model and test cases in the human-machine module 102.

[0073] c) The host computer 103 automatically retrieves the load configuration information that matches the settings of the human-machine module 102 from the load data storage module 101.

[0074] d) Transmit the load configuration information to the load master controller MCU104 via the communication bus.

[0075] e) The load master control MCU104 configures the load of each drive circuit 105 according to the received load configuration information.

[0076] f) The load master control MCU104 sends the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0077] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0078] Methods for determining simulated load parameters: 1. Measure the impedance of the actual load, then calculate the maximum current in the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current in the loop.

[0079] 2. The simulated load resistance value is close to the measured real part of the impedance resistance value, and the power of the simulated load is greater than the calculated minimum power value.

[0080] In the embodiments provided by the present invention, the host computer 103 is also used to display the load configuration results of the drive circuit 105.

[0081] It is understood that the specific steps for switching the load system in the drive test provided by this invention are as follows: a) Configure the load of each drive loop 105 according to the model of the controller under test and the test case, and store the load configuration information in the load data storage module 101 in advance.

[0082] b) Set the controller model and test cases in the human-machine module 102.

[0083] c) The host computer 103 automatically retrieves the load configuration information that matches the settings of the human-machine module 102 from the load data storage module 101.

[0084] d) Transmit the load configuration information to the load master controller MCU104 via the communication bus.

[0085] e) The load master control MCU104 configures the load of each drive circuit 105 according to the received load configuration information.

[0086] f) The load master control MCU104 sends the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0087] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0088] Methods for determining simulated load parameters: 1. Measure the impedance of the actual load, then calculate the maximum current in the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current in the loop.

[0089] 2. The simulated load resistance value is close to the measured real part of the impedance resistance value, and the power of the simulated load is greater than the calculated minimum power value.

[0090] Figure 6 A load switching flowchart of an embodiment of the drive test load switching system provided by the present invention includes: Data matching is performed based on the load parameters and the load parameters to be matched to obtain the load configuration information.

[0091] It is understood that the specific steps for switching the load system in the drive test provided by this invention are as follows: a) Configure the load of each drive loop 105 according to the model of the controller under test and the test case, and store the load configuration information in the load data storage module 101 in advance.

[0092] b) Set the controller model and test cases in the human-machine module 102.

[0093] c) The host computer 103 automatically retrieves the load configuration information that matches the settings of the human-machine module 102 from the load data storage module 101.

[0094] d) Transmit the load configuration information to the load master controller MCU104 via the communication bus.

[0095] e) The load master control MCU104 configures the load of each drive circuit 105 according to the received load configuration information.

[0096] f) The load master control MCU104 sends the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0097] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0098] Methods for determining simulated load parameters: 1. Measure the impedance of the actual load, then calculate the maximum current in the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current in the loop.

[0099] 2. The simulated load resistance value is close to the measured real part of the impedance resistance value, and the power of the simulated load is greater than the calculated minimum power value.

[0100] In the embodiments provided by the present invention, the test data of the load configured in the drive circuit 105 includes: The current, frequency, duty cycle, and voltage of the drive circuit 105.

[0101] Understandably, the test equipment signal acquisition module acquires the output signal of the actuator drive circuit 105 and measures the circuit current, voltage, frequency, and duty cycle.

[0102] The specific steps for switching the load system during driver testing provided by this invention are as follows: a) Configure the load of each drive loop 105 according to the model of the controller under test and the test case, and store the load configuration information in the load data storage module 101 in advance.

[0103] b) Set the controller model and test cases in the human-machine module 102.

[0104] c) The host computer 103 automatically retrieves the load configuration information that matches the settings of the human-machine module 102 from the load data storage module 101.

[0105] d) Transmit the load configuration information to the load master controller MCU104 via the communication bus.

[0106] e) The load master control MCU104 configures the load of each drive circuit 105 according to the received load configuration information.

[0107] f) The load master control MCU104 sends the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0108] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0109] Methods for determining simulated load parameters: 1. Measure the impedance of the actual load, then calculate the maximum current in the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current in the loop.

[0110] 2. The simulated load resistance value is close to the measured real part of the impedance resistance value, and the power of the simulated load is greater than the calculated minimum power value.

[0111] In the embodiments provided by the present invention, obtaining the configuration load result of the drive circuit 105 based on test data includes: The load configuration result of drive loop 105 is obtained by matching the test data with the preset standard threshold.

[0112] Understandably, the expected current, voltage, calibrated frequency, and duty cycle are compared with the acquired current, voltage, frequency, and duty cycle to determine whether the drive output signal matches the design.

[0113] The specific steps for switching the load system during driver testing provided by this invention are as follows: a) Configure the load of each drive loop 105 according to the model of the controller under test and the test case, and store the load configuration information in the load data storage module 101 in advance.

[0114] b) Set the controller model and test cases in the human-machine module 102.

[0115] c) The host computer 103 automatically retrieves the load configuration information that matches the settings of the human-machine module 102 from the load data storage module 101.

[0116] d) Transmit the load configuration information to the load master controller MCU104 via the communication bus.

[0117] e) The load master control MCU104 configures the load of each drive circuit 105 according to the received load configuration information.

[0118] f) The load master control MCU104 sends the configuration result back to the load configuration display interface of the host computer 103 and displays the load configuration result.

[0119] It can be further understood that the loads involved in this application are divided into real loads and simulated loads.

[0120] Methods for determining simulated load parameters: 1. Measure the impedance of the actual load, then calculate the maximum current in the loop at full duty cycle, and calculate the minimum power of the simulated load based on the maximum current in the loop.

[0121] 2. The simulated load resistance value is close to the measured real part of the impedance resistance value, and the power of the simulated load is greater than the calculated minimum power value.

[0122] Figure 7 A schematic flowchart of an embodiment of the drive test load switching method provided by the present invention includes: S701. Obtain and store load parameters through the storage module; the load parameters are: load data of various controller models and load data of various drive test case configuration drive loops; S702. Obtain the load parameters to be matched through the human-machine module; the load parameters to be matched are: data of various controller models under test and load data of the drive loops of multiple drive test cases to be configured; S703: The host computer obtains the load configuration information based on the load parameters and the load parameters to be matched, and obtains the load configuration result of the drive circuit based on the test data. S704. The main control MCU configures the grouped drive circuits based on the load configuration information to obtain the test data of the grouped drive circuits configured with load.

[0123] The above provides a detailed description of the drive test load switching system and method provided by the present invention. Specific examples have been used to illustrate the principles and implementation methods of the present invention. The description of the above embodiments is only for the purpose of helping to understand the method and core ideas of the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A load switching system for driving tests, characterized in that, include: Storage module, human-machine interface module, host computer, main control MCU and drive circuit; The storage module, which communicates with the host computer, is used to acquire and store load parameters; the load parameters include: load data for various controller models and load data for various drive test case configuration drive loops; The human-machine module communicates with the host computer and is used to obtain the load parameters to be matched. The load parameters to be matched are: data of various controller models under test and load data of the drive loops of multiple drive test cases to be configured. The host computer communicates with the main control MCU and is used to obtain load configuration information based on load parameters and load parameters to be matched, and to obtain the load configuration result of the drive circuit based on test data. The main control MCU is connected to the drive circuit and is used to configure the grouped drive circuit based on the load configuration information to obtain test data of the grouped drive circuit with load configuration. The grouped drive circuit is a drive circuit that has been pre-grouped. Different controllers correspond to different groups, and the same controller corresponds to multiple different groups.

2. The drive test load switching system according to claim 1, characterized in that, The system also includes a communication bus for connecting the host computer and the main control MCU.

3. The drive test load switching system according to claim 2, characterized in that, The system also includes a display screen that is connected to a host computer for communication.

4. The drive test load switching system according to claim 3, characterized in that, The system also includes: The host computer is used to generate control signals; The controller communicates with the host computer to receive control signals and configure the load by controlling the drive circuit based on the control signals.

5. The drive test switching load system according to claim 4, characterized in that, The control signals include: The calibration frequency and duty cycle of the controller's XCP.

6. The drive test load switching system according to claim 1, characterized in that, The host computer is also used to display the load configuration results of the drive circuit.

7. The drive test load switching system according to claim 1, characterized in that, The test data for the load configuration of the drive circuit includes: The current, frequency, duty cycle, and voltage of the drive circuit.

8. A method for driving test load switching, applied to the driving test load switching system as described in any one of claims 1-7, characterized in that, The method includes: The load parameters are obtained and stored through the storage module; the load parameters are: load data of various controller models and load data of various drive test case configuration drive loops; The load parameters to be matched are obtained through the human-machine module. The load parameters to be matched are: data of various controller models under test and load data of the drive loops of multiple drive test cases to be configured. The host computer obtains load configuration information based on load parameters and load parameters to be matched, and obtains the load configuration result of the drive circuit based on test data; The main control MCU configures the grouped drive circuits based on the load configuration information to obtain test data of the grouped drive circuits configured with load. The grouped drive circuits are drive circuits that have been pre-grouped. Different controllers correspond to different groups, and the same controller corresponds to multiple different groups.

9. The drive test load switching method according to claim 8, characterized in that, The process of obtaining load configuration information based on load parameters and load parameters to be matched includes: Data matching is performed based on the load parameters and the load parameters to be matched to obtain the load configuration information.

10. The drive test load switching method according to claim 8, characterized in that, The process of obtaining the drive circuit configuration load result based on test data includes: The drive loop configuration load result is obtained by matching the test data with the preset standard threshold.

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