一种电子器件温度监测方法
By acquiring the detection temperature and attribute data of electronic devices, setting test samples, detecting temperature change differences, and creating an environmental compensation formula, the problem of inaccurate temperature monitoring of electronic devices is solved, and accurate temperature monitoring of electronic devices in different environments is achieved.
CN119666158BActive Publication Date: 2026-07-17QINGDAO ZITN MICROELECTRONICS CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- QINGDAO ZITN MICROELECTRONICS CO LTD
- Filing Date
- 2025-02-21
- Publication Date
- 2026-07-17
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Figure CN119666158B_ABST
Abstract
本发明公开了一种电子器件温度监测方法，涉及温度监测技术领域。包括：获取目标电子器件的检测温度数据，得到目标检测温度项，目标检测温度项用于表述实时检测到的目标电子器件的表面温度；获取目标电子器件的属性数据，得到目标属性项，目标属性项用于表述目标电子器件的壳体信息。本发明通过获取到的相关数据，创建环境影响补偿公式，计算出目标电子器件在不同环境温度以及环境湿度状态下的实际温度补偿数值，从而得到目标电子器件的实际温度数据，实现了对目标电子器件的真实温度监测效果，并且不受环境温度以及环境湿度的干扰，使得监测结果更加准确。
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