Sandstone thickness map acquisition method and device, electronic equipment and medium
By analyzing the log sensitive parameter and well-seismic lithologic inversion for drilling in the research area, and combining the inverse distance interpolation method to obtain the sandstone threshold value data body, the problem of large error in the sandstone thickness map caused by standardized treatment in the existing technology is solved, and a higher precision sandstone thickness prediction and graph drawing is achieved.
Patent Information
- Application Number
- CN202311279278.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2023-09-28
- Publication Date
- 2025-03-28
- Estimated Expiration
- 2043-09-28
AI Technical Summary
When compiling sandstone thickness maps in the prior art, due to the standardized processing of logging curves, the value of the rock-electrical parameters changes, making it difficult to accurately calculate the true sandstone thickness, especially in areas with large structural drops and large lithologic changes, the error is large and the graph is unreliable.
By analyzing log sensitive parameters for drilling in the research area, logging parameters for lithology inversion are determined, well-seismic inversion is combined with seismic data, sandstone threshold value of drilling is determined, threshold value plane data is obtained using inverse distance interpolation method, residual value data body is determined based on the inversion data body and threshold value data body, and sandstone thickness map is obtained according to the inversion data body and the threshold value data body, and data points perpendicularly reflecting the sandstone data are statistically obtained.
The prediction accuracy of sandstone thickness and the drawing accuracy of sandstone thickness map are improved, errors are reduced, and the reliability of the map is enhanced.