Verification method and device for quantum state control signal distortion

Abstract

The application discloses a quantum state control signal distortion verification method and device, which comprises the following steps: acquiring a connected domain in a first gray scale image or a first black and white image processed by image processing, and performing fitting processing on the connected domain to acquire a fitting function of each connected domain; and directly judging whether the quantum state control signal of the to-be-tested quantum bit is distorted according to the result of the fitting function. Moreover, the working frequency of the quantum bit can be iterated constantly, and the distortion condition of the quantum state control signal of the to-be-tested quantum bit under the corresponding working frequency can be acquired, so that the appropriate working point range of the to-be-tested quantum bit is determined.

Description

Technical Field

[0001] This invention relates to the field of quantum computing technology, and in particular to a method and apparatus for verifying the distortion of quantum state control signals. Background Technology

[0002] A quantum computer is a physical device that performs high-speed mathematical and logical operations, stores and processes quantum information, following the laws of quantum mechanics. The main characteristics of quantum computers include high operating speed, strong information processing capabilities, and a wide range of applications. Compared to conventional computers, the greater the amount of information processed, the more advantageous it is for quantum computers to perform calculations, and the more accurately the calculations can be ensured.

[0003] Quantum chips are to quantum computers what CPUs are to traditional computers; they are the core components of quantum computers. As research into quantum computing technologies continues to advance, the number of qubits on quantum chips is increasing year by year. It is foreseeable that larger-scale quantum chips will emerge in the future, containing even more qubits, and quantum computers will be equipped with even larger-scale quantum chips.

[0004] The signals on the quantum state control line are used to control the quantum state of the qubit. Generally, most single-qubit gate signals are transmitted to the qubit through the quantum state control line. The quantum state control line typically contains attenuators and other components. The presence of these components makes the quantum state control line not an ideal circuit. Therefore, when the voltage waveform output from the AWG (Arbitrary Waveform Generator) reaches the qubit, waveform distortion occurs. Waveform distortion refers to the situation where a waveform with amplitude A and duration T is applied to the quantum state control line at time t0. The waveform ends at time t0+T, but for a period of time afterward, a voltage still exists on the quantum state control line; this voltage is the distorted waveform. When the quantum circuit needs to apply a waveform to the quantum state control line sequentially during execution, the waveform distortion of the previous waveform will affect the subsequent waveform, causing errors in the final execution result of the quantum circuit.

[0005] Therefore, a scheme is needed to verify whether the quantum state control signal of a quantum bit has been distorted.

[0006] It should be noted that the information disclosed in the background section of this application is intended only to enhance the understanding of the general background of this application, and should not be construed as an admission or in any way implying that the information constitutes prior art known to those skilled in the art. Summary of the Invention

[0007] The purpose of this invention is to provide a method and apparatus for verifying the distortion of quantum state control signals, in order to solve the problem in the prior art of lacking a way to verify whether the quantum state control signals of qubits have been distorted.

[0008] To address the above technical problems, this invention proposes a method for verifying quantum state control signal distortion, comprising:

[0009] Obtain the experimental results view of the first experiment, which is used to obtain the change of the probability of the sub-bit to be measured being in the first selected eigenstate with the magnitude of detuning and time, wherein the detuning is the frequency difference between the quantum state control signal and the X gate signal applied to the sub-bit to be measured;

[0010] The experimental result view is processed to output a first grayscale image or a first black and white image, wherein the first grayscale image is composed of multiple pixels with different grayscale values, and the pixels of the first black and white image are composed of black and white.

[0011] When the similarity comparison result of the first grayscale image or the first black and white image does not reach the preset value, the first grayscale image or the first black and white image is fitted to all connected components to obtain the fitting function of each connected component.

[0012] Based on the fitting function, it is determined whether the quantum state control signal of the sub-bit to be measured has been distorted.

[0013] Optionally, the fitting process for all connected components in the first grayscale image or the first black-and-white image includes:

[0014] Process each connected component to obtain the average y value corresponding to each x-coordinate in the Cartesian coordinate system for each connected component;

[0015] The processed connected components are fitted to obtain the fitted curve.

[0016] Optionally, the fitting process for the processed connected components includes:

[0017] The quadratic function is used to fit all the processed connected components of the first grayscale image or the first black and white image.

[0018] Optionally, determining whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function includes:

[0019] When the coefficient of the quadratic term of the fitting function of any processed connected region in the first grayscale image or the first black-and-white image is greater than 0, it is determined that the quantum state control signal of the sub-bit to be measured has been distorted.

[0020] Optionally, the fitting process for the processed connected components includes:

[0021] A cubic function is used to fit all the processed connected components of the first grayscale image or the first black and white image.

[0022] Optionally, determining whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function includes:

[0023] Based on the fitting function, obtain the first difference between the maximum and minimum values ​​of the y-coordinate of each fitted curve in the Cartesian coordinate system;

[0024] When the first difference exceeds the first preset threshold, it is determined that the quantum state control signal of the sub-bit to be measured has been distorted.

[0025] Optionally, determining whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function includes:

[0026] Based on the fitting function, obtain the first coordinate corresponding to the minimum value of the y-coordinate of the fitted curve in the Cartesian coordinate system;

[0027] Based on the first coordinate, the fitted curve is divided into a first curve and a second curve, wherein the first curve is the part that does not contain the maximum point;

[0028] Based on the second difference between the maximum and minimum y-coordinates of the first curve in a Cartesian coordinate system, it is determined whether the quantum state control signal of the sub-bit to be measured has been distorted.

[0029] Optionally, after performing image processing on the experimental result view to output a first grayscale image or a first black and white image, the method further includes:

[0030] Determine whether the number of connected components in the first grayscale image or the first black-and-white image exceeds a second preset threshold.

[0031] If not, then it is determined that the quantum state control signal of the sub-bit to be measured has been distorted;

[0032] If so, then when the result of the similarity comparison of the first grayscale image or the first black and white image does not reach a preset value, the process of fitting all connected components in the first grayscale image or the first black and white image is performed to obtain the fitting function for each connected component.

[0033] Based on the same inventive concept, this invention also proposes a verification device for quantum state control signal distortion, comprising:

[0034] The experimental result view acquisition unit is used to acquire the experimental result view of the first experiment, which is used to acquire the change of the probability of the sub-bit to be measured being in the first selected eigenstate with the magnitude of detuning and time. The detuning is the frequency difference between the quantum state control signal and the X gate signal applied to the sub-bit to be measured.

[0035] An image processing unit is used to perform image processing on the experimental result view and output a first grayscale image or a first black and white image, wherein the first grayscale image is composed of multiple pixels with different grayscale values, and the pixels of the first black and white image are composed of black and white.

[0036] The fitting processing unit is used to perform fitting processing on all connected components in the first grayscale image or the first black and white image when the result of the similarity comparison of the first grayscale image or the first black and white image does not reach a preset value, and to obtain the fitting function of each connected component.

[0037] The determination unit is used to determine, based on the fitting function, whether the quantum state control signal of the sub-bit to be measured has been distorted.

[0038] Based on the same inventive concept, this invention also proposes a quantum computing measurement and control system, which utilizes the verification method for quantum state control signal distortion described in any of the above-described features.

[0039] Based on the same inventive concept, the present invention also proposes a quantum computer, including the quantum computing measurement and control system described in the above feature description.

[0040] Based on the same inventive concept, the present invention also proposes a readable storage medium storing a computer program thereon, which, when executed by a processor, can implement the verification method for quantum state control signal distortion as described in any of the above-described features.

[0041] Compared with the prior art, the present invention has the following beneficial effects:

[0042] This invention proposes a method for verifying the distortion of quantum state control signals. The method involves acquiring an experimental result view of a first experiment, performing image processing on the result view to output a first grayscale image or a first black-and-white image, and when the similarity comparison result of the first grayscale image or the first black-and-white image does not reach a preset value, fitting processing is performed on all connected components in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected component. Finally, based on the fitting function, it is determined whether the quantum state control signal of the sub-bit to be measured has been distorted. The solution of this invention obtains the connected components in the processed first grayscale image or the first black-and-white image, performs fitting processing on the connected components to obtain a fitting function for each connected component, and directly determines whether the quantum state control signal of the sub-bit to be measured has been distorted based on the result of the fitting function. Furthermore, by continuously traversing the operating frequency of the quantum bit and obtaining the distortion of the quantum state control signal of the sub-bit to be measured at the corresponding operating frequency, a suitable operating point range for the sub-bit to be measured can be determined.

[0043] The verification device, quantum computing measurement and control system, quantum computer, and readable storage medium for quantum state control signal distortion proposed in this invention belong to the same inventive concept as the verification method for quantum state control signal distortion, and therefore have the same beneficial effects, which will not be elaborated here. Attached Figure Description

[0044] Figure 1 This is a flowchart illustrating the verification method for quantum state control signal distortion proposed in an embodiment of the present invention.

[0045] Figure 2 This is a view of the experimental results of the first experiment in an example;

[0046] Figure 3 A view of the experimental results showing interference in the first experiment in another example;

[0047] Figure 4 To Figure 3 The view output after grayscale processing;

[0048] Figure 5 To Figure 4 The view after performing a connected component search;

[0049] Figure 6 To be Figure 5 The result is the average of the y values ​​corresponding to the x positions of the three connected components in the diagram.

[0050] Figure 7 To fit using a quadratic function Figure 6 The result view is obtained for the discrete cluster corresponding to the connected component 1 in the middle;

[0051] Figure 8 A view of the experimental results for the first experiment in another example;

[0052] Figure 9 This is a simplified structural diagram of a verification device for quantum state control signal distortion proposed in another embodiment of the present invention. Detailed Implementation

[0053] The specific embodiments of the present invention will now be described in more detail with reference to the accompanying drawings. The advantages and features of the present invention will become clearer from the following description and claims. It should be noted that the drawings are all in a very simplified form and use non-precise proportions, and are only used to facilitate and clarify the illustration of the embodiments of the present invention.

[0054] In the description of this invention, it should be understood that the terms "center", "upper", "lower", "left", "right", etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0055] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0056] Please refer to Figure 1 This invention proposes a method for verifying quantum state control signal distortion, comprising:

[0057] S100: Obtain the experimental result view of the first experiment, which is used to obtain the change of the probability of the sub-bit to be measured being in the first selected eigenstate with the magnitude of detuning and time, wherein the detuning is the frequency difference between the quantum state control signal and the X gate signal applied to the sub-bit to be measured.

[0058] S200: Perform image processing on the experimental result view to output a first grayscale image or a first black and white image, wherein the first grayscale image is composed of multiple pixels with different grayscale values, and the pixels of the first black and white image are composed of black and white.

[0059] S300: When the similarity comparison result of the first grayscale image or the first black and white image does not reach the preset value, the first grayscale image or the first black and white image is fitted to all connected components to obtain the fitting function of each connected component.

[0060] S400: Based on the fitting function, determine whether the quantum state control signal of the sub-bit to be measured has been distorted.

[0061] Unlike existing technologies, this invention proposes a method for verifying the distortion of quantum state control signals. The method involves acquiring an experimental result view of a first experiment, performing image processing on the result view to output a first grayscale image or a first black-and-white image, and when the similarity comparison result of the first grayscale image or the first black-and-white image does not reach a preset value, fitting processing is performed on all connected components in the first grayscale image or the first black-and-white image to obtain a fitting function for each connected component. Finally, based on the fitting function, it is determined whether the quantum state control signal of the sub-bit to be measured has been distorted. This invention obtains connected components in the processed first grayscale image or the first black-and-white image, performs fitting processing on these components to obtain a fitting function for each connected component, and directly determines whether the quantum state control signal of the sub-bit to be measured has been distorted based on the fitting function result. Furthermore, by continuously traversing the operating frequency of the quantum bit and obtaining the distortion of the quantum state control signal of the sub-bit to be measured at the corresponding operating frequency, a suitable operating point range for the sub-bit to be measured can be determined.

[0062] It should be noted that the first experiment mentioned in this embodiment refers to traversing the detuning magnitude of the quantum state control signal within a set range, performing a Rabi experiment on the sub-bit to be measured at each detuning. Those skilled in the art will understand that the Rabi experiment refers to applying a quantum state control signal of duration t to the quantum state control line of the sub-bit to be measured, applying a frequency control signal to the frequency control line of the sub-bit to be measured, obtaining the change in the probability of the sub-bit to be measured being in an excited state or a ground state with time t, and finally summing the experimental results of all Rabi experiments to obtain the experimental result view of the first experiment. Please refer to [link / reference]. Figure 2 , Figure 2 This is a view of the experimental results of the first experiment in an example; the view of the experimental results is a 3D plot. Figure 2 The depth information in the graph represents the probability that the measured sub-bit is in the first selected eigenstate. The horizontal axis represents the magnitude of the detuning, and the vertical axis represents time. Ideally, if the quantum state control signal of the measured sub-bit is not distorted, the experimental result view is a symmetrical image along the center line. If the quantum state control signal of the measured sub-bit is distorted, the experimental result view will show some deformation, resulting in an image that is not symmetrical along the center line.

[0063] By utilizing the characteristic of the experimental result view, in order to automatically identify the distortion of the quantum state control signal of the measured sub-bit, the experimental result view can be image-processed and output as a first black-and-white image or a first grayscale image. By comparing the similarity of the first black-and-white image or the first grayscale image with a first image under ideal conditions, it can be directly determined whether the quantum state control signal of the measured sub-bit has distortion. The first image mentioned here refers to the result view of the first experiment when the experimental results meet the preset requirements, that is, the experimental result view under ideal conditions.

[0064] In this embodiment, when processing the experimental result view, we can perform grayscale processing or binarization to convert the 3D depth map into a grayscale image or a black and white image. When the similarity comparison result of the first grayscale image or the first black and white image does not reach a preset value, it means comparing the similarity between the first black and white image and the first image. Specifically, a structural similarity algorithm can be used to compare the similarity between the first black and white image or the first grayscale image and the first image.

[0065] Those skilled in the art will understand that Structure Similarity Index Measure (SSIM) is an index that measures the similarity between two images. The SSIM algorithm takes two images as input, i.e., two images for which structural similarity is required. One image is an uncompressed, distortion-free image, and the other is an image to be compared with the distortion-free image. The SSIM index mainly extracts three key features from the image: brightness, contrast, and structure. The comparison between two images is based on these three features. We process the original experimental result view to output a first black and white image, which can reduce the running cost of the algorithm and improve computational efficiency to a certain extent. The SSIM value ranges from [0,1]. In this embodiment, the result of the similarity comparison can be considered as the SSIM value. In this embodiment, the preset threshold can be set to 0.6. It should be noted that in other embodiments, the preset threshold can be adjusted according to actual needs. For example, for scenarios with high accuracy requirements, the preset threshold can be set to 0.8 or 0.9, and for scenarios with low accuracy requirements, the preset threshold can be set to 0.5. These will not be elaborated further here. It should be noted that the first image is a black and white image composed of black and white that has undergone image processing.

[0066] It should be noted that, in this embodiment, the similarity comparison of the first grayscale image or the first black-and-white image can be performed by comparing the first grayscale image or the first black-and-white image with the first image. The result of the similarity comparison can determine whether the quantum state control signal of the measured qubit has been distorted. Here, the first image refers to the result view of the first experiment meeting the preset requirements, that is, the experimental result view under ideal conditions. Those skilled in the art will understand that, since the final experimental result views obtained from different qubits and quantum state control signals of different frequencies will definitely be different, it is necessary to prepare multiple result views reflecting that the experimental results of the first experiment have met the preset requirements in advance. That is, multiple first images need to be prepared. As long as the similarity of the experimental result view of the first experiment with any one of the multiple first images meets the requirements, it can be considered that the quantum state control signal has not been distorted. Since this method requires comparison with multiple standard images, its overall efficiency is relatively low. To improve efficiency, the processed first grayscale image or first black-and-white image can be segmented, and a mirror image of the right image can be obtained. The similarity comparison between the left image and the mirror image can be used to directly determine whether the quantum state control signal of the sub-bit to be measured has been distorted. This method can directly determine whether the quantum state control signal of the sub-bit to be measured has been distorted by comparing the similarity with its own mirror image, which effectively improves the overall efficiency of the method.

[0067] Furthermore, in practical applications, we have found that if the quantum state control signal of the measured sub-qubit is distorted, there is a certain probability that interference will occur in the experimental results of the first experiment. (See reference...) Figure 3 If the experimental result view showing interference has good left-right symmetry, then a misjudgment will occur when using a similarity comparison scheme based on mirror images, mistaking a distorted situation as one without distortion.

[0068] To address the issue of misjudgment that occurs when using mirror images for similarity comparison, this application proposes that after a successful similarity comparison, connected components are obtained from the processed first grayscale or black-and-white image. These connected components are then fitted to obtain a fitting function. Based on the results of the fitting functions, it can be directly determined whether the quantum state control signal of the measured sub-bit has been distorted. This effectively avoids misjudgment. This embodiment provides two example schemes: a quadratic function fitting scheme and a cubic function fitting scheme.

[0069] It's important to note that a connected component is a set of pixels consisting of adjacent pixels with the same pixel value. We can use this condition to find connected components in an image. For each connected component found, we assign it a unique identifier to distinguish it from other connected components. See the following for details. Figure 5 Connected components 1, 2, and 3 in the image are shown. Those skilled in the art will understand that connected components in an image can generally be obtained through two-pass scanning or seed-filling, which will not be elaborated upon here.

[0070] After obtaining all connected components of the first grayscale image or the first black-and-white image, we first determine the average y-value corresponding to the x-position of each connected component. The average y-value here refers to the average of all y-coordinates corresponding to the x-coordinate of each connected component in a Cartesian coordinate system. (See reference...) Figure 5 and Figure 6 , Figure 6 To be Figure 5 The result of averaging the y-values ​​corresponding to the x-positions of the three connected components in the image is represented as discrete coordinate points in a coordinate system. Specifically, in this embodiment, the fitting process for all connected components in the first grayscale image or the first black-and-white image includes:

[0071] Process each connected component to obtain the average y value corresponding to each x-coordinate in the Cartesian coordinate system for each connected component;

[0072] The processed connected components are fitted to obtain the fitted curve.

[0073] As described above, we have provided two fitting schemes. We will first introduce the first scheme.

[0074] Specifically, in this embodiment, the fitting process for the processed connected components includes:

[0075] The quadratic function is used to fit all the processed connected components of the first grayscale image or the first black and white image.

[0076] Those skilled in the art will understand that, in this embodiment, the improved method of fitting all processed connected components of the first grayscale image or the first black-and-white image using a quadratic function refers to fitting each processed connected component using y = ax² + bx + c, i.e., fitting as shown in the figure. Figure 6 The discrete clusters corresponding to each connected component are shown below. (See reference.) Figure 7 , Figure 7 To fit using a quadratic function Figure 6The result view is obtained from the discrete cluster corresponding to the connected component 1. Figure 7 For example, it is clear that the fitting result shows that the coefficient of the quadratic term of the quadratic function is greater than 0. This situation reflects that the experimental results of the first experiment show an interference phenomenon. Therefore, it can be directly determined from the fitting result that the quantum state control signal of the sub-bit to be measured has been distorted.

[0077] It should be noted that in this embodiment, Figure 6 and Figure 7 The units of the horizontal and vertical coordinates are both the number of pixels, that is, in terms of... Figure 5 The horizontal axis is the X-axis and the vertical axis is the Y-axis. The position of each connected component in the entire image is calculated in pixels.

[0078] Specifically, in this embodiment, determining whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function includes:

[0079] When the coefficient of the quadratic term of the fitting function of any connected region in the first grayscale image or the first black-and-white image is greater than 0, it is determined that the quantum state control signal of the sub-bit to be measured has been distorted.

[0080] In practical applications, we have also found that sometimes connected components cannot be accurately fitted using quadratic functions. (See reference...) Figure 8 The results shown in the figure illustrate that this application proposes that each connected component can also be fitted using a cubic function. Specifically, in this embodiment, the fitting process for the processed connected components includes:

[0081] The connected components of the first grayscale image or the first black-and-white image are fitted using a cubic function.

[0082] Specifically, in this embodiment, determining whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function includes:

[0083] Based on the fitting function, obtain the first difference between the maximum and minimum values ​​of the y-coordinate of each fitted curve in the Cartesian coordinate system;

[0084] When the first difference exceeds the first preset threshold, it is determined that the quantum state control signal of the sub-bit to be measured has been distorted.

[0085] Specifically, in this embodiment, determining whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function includes:

[0086] Based on the fitting function, obtain the first coordinate corresponding to the minimum value of the y-coordinate of the fitted curve in the Cartesian coordinate system;

[0087] Based on the first coordinate, the connected region is divided into a first curve and a second curve, wherein the first curve is the part that does not contain the maximum point;

[0088] Based on the second difference between the maximum and minimum y-coordinates of the first curve in a Cartesian coordinate system, it is determined whether the quantum state control signal of the sub-bit to be measured has been distorted.

[0089] Specifically, in this embodiment, after performing image processing on the experimental result view and outputting a first grayscale image or a first black and white image, the method further includes:

[0090] Determine whether the number of connected components in the first grayscale image or the first black-and-white image exceeds a second preset threshold.

[0091] If not, then it is determined that the quantum state control signal of the sub-bit to be measured has been distorted;

[0092] If so, then when the result of the similarity comparison of the first grayscale image or the first black and white image does not reach a preset value, the process of fitting all connected components in the first grayscale image or the first black and white image is performed to obtain the fitting function for each connected component.

[0093] It should be noted that in this embodiment, the first curve refers to the portion that does not include the maximum point. Figure 8 For example, Figure 8 The curve fitted to the right side of the first connected component can be considered as the first curve, that is, the first curve analyzes the possible interference part in the curve.

[0094] Based on the same inventive concept, please refer to Figure 9 This invention also proposes a verification device for quantum state control signal distortion, comprising:

[0095] The experimental result view acquisition unit 100 is used to acquire the experimental result view of the first experiment, which is used to acquire the change of the probability of the sub-bit to be measured being in the first selected eigenstate with the magnitude of detuning and time. The detuning is the frequency difference between the quantum state control signal and the X gate signal applied to the sub-bit to be measured.

[0096] The image processing unit 200 is used to perform image processing on the experimental result view and output a first grayscale image or a first black and white image, wherein the first grayscale image is composed of multiple pixels with different grayscale values, and the pixels of the first black and white image are composed of black and white.

[0097] The fitting processing unit 300 is used to perform fitting processing on all connected components in the first grayscale image or the first black and white image when the result of the similarity comparison of the first grayscale image or the first black and white image does not reach a preset value, and to obtain the fitting function of each connected component.

[0098] The determination unit 400 is used to determine, based on the fitting function, whether the quantum state control signal of the sub-bit to be measured has been distorted.

[0099] It is understood that the experimental result view acquisition unit 100, the image processing unit 200, the fitting processing unit 300, and the determination unit 400 can be implemented in a single device, or any one of these modules can be split into multiple sub-modules. Alternatively, at least some of the functions of one or more modules of the experimental result view acquisition unit 100, the image processing unit 200, the fitting processing unit 300, and the determination unit 400 can be combined with at least some of the functions of other modules and implemented in a single functional module. According to embodiments of the present invention, at least one of the experimental result view acquisition unit 100, the image processing unit 200, the fitting processing unit 300, and the determination unit 400 can be at least partially implemented as hardware circuitry, such as a field-programmable gate array (FPGA), a programmable logic array (PLA), a system-on-a-chip, a system-on-a-substrate, a system-on-package, an application-specific integrated circuit (ASIC), or any other reasonable method of integrating or packaging circuitry, or implemented in hardware or firmware, or in a suitable combination of software, hardware, and firmware implementations. Alternatively, at least one of the experimental result view acquisition unit 100, the image processing unit 200, the fitting processing unit 300, and the determination unit 400 may be implemented at least partially as a computer program module, which can perform the functions of the corresponding module when the program is run by a computer.

[0100] Based on the same inventive concept, this invention also proposes a quantum computing measurement and control system, which utilizes the verification method for quantum state control signal distortion described in any of the above-described features.

[0101] Based on the same inventive concept, this invention also proposes a quantum computer, including the quantum computing measurement and control system described in the above feature description.

[0102] Based on the same inventive concept, embodiments of the present invention also propose a readable storage medium storing a computer program thereon, wherein the computer program, when executed by a processor, can implement the verification method for quantum state control signal distortion as described in any of the above-described features.

[0103] The readable storage medium can be a tangible device capable of holding and storing instructions for use by an instruction execution device, such as, but not limited to, electrical storage devices, magnetic storage devices, optical storage devices, electromagnetic storage devices, semiconductor storage devices, or any suitable combination thereof. More specific examples of readable storage media (a non-exhaustive list) include: portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), static random access memory (SRAM), portable compact disc read-only memory (CD-ROM), digital multifunction disc (DVD), memory sticks, floppy disks, mechanical encoding devices, such as punch cards or recessed protrusions storing instructions thereon, and any suitable combination thereof. The computer programs described herein can be downloaded from the readable storage medium to various computing / processing devices, or downloaded via a network, such as the Internet, local area network, wide area network, and / or wireless network, to an external computer or external storage device. The network can include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers, and / or edge servers. Each computing / processing device's network adapter card or network interface receives the computer program from the network and forwards it for storage in a readable storage medium within the respective computing / processing device. The computer program used to perform the operations of this invention can be assembly instructions, instruction set architecture (ISA) instructions, machine instructions, machine-dependent instructions, microcode, firmware instructions, status setting data, or source code or object code written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Smalltalk, C++, etc., and conventional procedural programming languages ​​such as "C" or similar languages. The computer program can be executed entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving remote computers, the remote computer can be connected to the user's computer via any type of network, including a local area network (LAN) or a wide area network (WAN), or it can be connected to an external computer (e.g., via the Internet using an Internet service provider). In some embodiments, electronic circuits, such as programmable logic circuits, field-programmable gate arrays (FPGAs), or programmable logic arrays (PLAs), are personalized by utilizing state information from a computer program. These electronic circuits can execute computer-readable program instructions, thereby realizing various aspects of the present invention.

[0104] Various aspects of the present invention are described herein with reference to flowchart illustrations and / or block diagrams of methods, systems, and computer program products according to embodiments of the invention. It should be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by a computer program. These computer programs can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing apparatus to produce a machine such that, when executed by the processor of the computer or other programmable data processing apparatus, they create means for implementing the functions / actions specified in one or more blocks of the flowchart illustrations and / or block diagrams. These computer programs can also be stored in a readable storage medium that causes a computer, programmable data processing apparatus, and / or other device to operate in a particular manner; thus, the readable storage medium storing the computer program comprises an article of manufacture including instructions for implementing aspects of the functions / actions specified in one or more blocks of the flowchart illustrations and / or block diagrams.

[0105] A computer program may also be loaded onto a computer, other programmable data processing apparatus, or other device to cause a series of operational steps to be performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the computer program executing on the computer, other programmable data processing apparatus, or other device to perform the functions / actions specified in one or more boxes of a flowchart and / or block diagram.

[0106] In the description of this specification, references to terms such as "one embodiment," "some embodiments," "example," or "specific example," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments. In addition, those skilled in the art can combine and integrate the different embodiments or examples described in this specification.

[0107] The above are merely preferred embodiments of the present invention and do not constitute any limitation on the present invention. Any equivalent substitutions or modifications made by those skilled in the art to the technical solutions and content disclosed in the present invention without departing from the scope of the present invention shall be deemed to have remained within the protection scope of the present invention.

Claims

1. A method for verifying quantum state-controlled signal distortion, characterized in that, include: Obtain the experimental results view of the first experiment, which is used to obtain the change of the probability of the sub-bit to be measured being in the first selected eigenstate with the magnitude of detuning and time, wherein the detuning is the frequency difference between the quantum state control signal and the X gate signal applied to the sub-bit to be measured; The experimental result view is processed to output a first grayscale image or a first black and white image, wherein the first grayscale image is composed of multiple pixels with different grayscale values, and the pixels of the first black and white image are composed of black and white. When the similarity comparison result of the first grayscale image or the first black and white image does not reach the preset value, the first grayscale image or the first black and white image is fitted to all connected components to obtain the fitting function of each connected component. The similarity comparison refers to the comparison between the first grayscale image or the first black and white image and the first image. The first image refers to the result view of the first experiment meeting the preset requirements. Based on the fitting function, it is determined whether the quantum state control signal of the sub-bit to be measured has been distorted; The fitting process for all connected components in the first grayscale image or the first black-and-white image includes: Process each connected component to obtain the average y value corresponding to each x-coordinate in the Cartesian coordinate system for each connected component; The processed connected components are fitted to obtain the fitted curve.

2. The method as described in claim 1, characterized in that, The fitting process for the processed connected components includes: The quadratic function is used to fit all the processed connected components of the first grayscale image or the first black and white image.

3. The method as described in claim 2, characterized in that, The step of determining whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function includes: When the coefficient of the quadratic term of the fitting function of any processed connected region in the first grayscale image or the first black-and-white image is greater than 0, it is determined that the quantum state control signal of the sub-bit to be measured has been distorted.

4. The method as described in claim 1, characterized in that, The fitting process for the processed connected components includes: A cubic function is used to fit all the processed connected components of the first grayscale image or the first black and white image.

5. The method as described in claim 4, characterized in that, The step of determining whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function includes: Based on the fitting function, obtain the first difference between the maximum and minimum values ​​of the y-coordinate of each fitted curve in the Cartesian coordinate system; When the first difference exceeds the first preset threshold, it is determined that the quantum state control signal of the sub-bit to be measured has been distorted.

6. The method as described in claim 4, characterized in that, The step of determining whether the quantum state control signal of the sub-bit to be measured is distorted based on the fitting function includes: Based on the fitting function, obtain the first coordinate corresponding to the minimum value of the y-coordinate of the fitted curve in the Cartesian coordinate system; Based on the first coordinate, the fitted curve is divided into a first curve and a second curve, wherein the first curve is the part that does not contain the maximum point; Based on the second difference between the maximum and minimum y-coordinates of the first curve in a Cartesian coordinate system, it is determined whether the quantum state control signal of the sub-bit to be measured has been distorted.

7. The method as described in claim 1, characterized in that, After performing image processing on the experimental result view and outputting a first grayscale image or a first black and white image, the method further includes: Determine whether the number of connected components in the first grayscale image or the first black-and-white image exceeds a second preset threshold. If not, then it is determined that the quantum state control signal of the sub-bit to be measured has been distorted; If so, then when the result of the similarity comparison of the first grayscale image or the first black and white image does not reach a preset value, the process of fitting all connected components in the first grayscale image or the first black and white image is performed to obtain the fitting function for each connected component.

8. A verification device for quantum state control signal distortion, characterized in that, include: The experimental result view acquisition unit is used to acquire the experimental result view of the first experiment, which is used to acquire the change of the probability of the sub-bit to be measured being in the first selected eigenstate with the magnitude of detuning and time. The detuning is the frequency difference between the quantum state control signal and the X gate signal applied to the sub-bit to be measured. An image processing unit is used to perform image processing on the experimental result view and output a first grayscale image or a first black and white image, wherein the first grayscale image is composed of multiple pixels with different grayscale values, and the pixels of the first black and white image are composed of black and white. The fitting processing unit is used to perform fitting processing on all connected components in the first grayscale image or the first black and white image when the similarity comparison result of the first grayscale image or the first black and white image does not reach a preset value, and obtain the fitting function of each connected component. The similarity comparison refers to the comparison of the similarity between the first grayscale image or the first black and white image and the first image. The first image refers to the result view of the experimental result of the first experiment reaching the preset requirements. The determination unit is used to determine, based on the fitting function, whether the quantum state control signal of the sub-bit to be measured has been distorted; The fitting process for all connected components in the first grayscale image or the first black-and-white image includes: Process each connected component to obtain the average y value corresponding to each x-coordinate in the Cartesian coordinate system for each connected component; The processed connected components are fitted to obtain the fitted curve.

9. A quantum computing measurement and control system, characterized in that, The verification method for quantum state control signal distortion using any one of claims 1-7.

10. A quantum computer, characterized in that, Includes the quantum computing measurement and control system as described in claim 9.

11. A readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it can implement the verification method for quantum state control signal distortion as described in any one of claims 1-7.

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