一种用于电子级多晶硅硅芯的清洗方法

By employing a multi-step cleaning method and high-purity treatment, the problems of contamination and residue in silicon core cleaning have been solved, achieving efficient removal of impurities and improving the quality and production efficiency of polycrystalline silicon cores.

CN119747292BActive Publication Date: 2026-07-17PARAMATIC IND AUTOMATION (SHANGHAI) CO LTD

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
PARAMATIC IND AUTOMATION (SHANGHAI) CO LTD
Filing Date
2024-12-16
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing silicon core cleaning processes suffer from problems such as poor cleaning effect, contamination during manual wiping, metal ion contamination in alkaline solutions, and residues of degreasing agents and acids, which affect the quality and yield of polysilicon.

Method used

A multi-step cleaning method is adopted, which includes plasma cleaning, ultrasonic cleaning, ozone degreasing, mixed acid pickling, hydrofluoric acid pickling, megasonic cleaning, and high-purity water rinsing. Combined with negative pressure and air curtain to prevent gas leakage, high-purity water and high-purity nitrogen are used to ensure the cleaning effect.

Benefits of technology

It effectively removes fine particles, metal contaminants, and organic matter from the surface of silicon cores, improves surface oxidation, yellowing, blackening, and acid spots, enhances the quality and yield of polycrystalline silicon products, and reduces energy consumption.

✦ Generated by Eureka AI based on patent content.

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Abstract

本发明涉及一种用于电子级多晶硅硅芯的清洗方法,属于电子级多晶硅硅芯生产技术领域。本发明提供一种硅芯清洗的方法,该方法不仅能够去除硅芯表面的细小颗粒、金属污染、油脂等有机物等杂质,也能极大程度改善清洗完毕后硅芯表面氧化发黄、发黑、酸斑、表金含量超标、碳含量超标,脱脂剂和酸液残留等问题。从而使得在多晶硅硅棒在生长过程中进一步提高产品质量和成品率,减少能耗。
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