Photoelectric network target measurement task allocation method based on KM algorithm
By applying the KM algorithm in the optoelectronic network, the problem of long measurement allocation time and low efficiency in the existing joint measurement methods is solved, and multi-objective, all-round and high-efficiency network detection is achieved, which improves the reliability and intelligence of the measurement data.
Patent Information
- Application Number
- CN202411511831.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-28
- Publication Date
- 2025-04-04
- Estimated Expiration
- 2044-10-28
AI Technical Summary
The existing joint measurement methods have a long measurement allocation time, low measurement efficiency, and unreasonable matching methods between task goals and measurement equipment, which cannot meet the task requirements of multi-task multi-equipment rapid and intelligent joint measurement.
A method of photoelectric network target measurement task allocation based on KM (kuhn-munkres) algorithm is designed. Through the quantitative analysis model of joint rendezvous measurement, the observation targets and time of each device are reasonably planned and dispatched to achieve multi-objective, all-round and high-efficiency network detection.
The KM algorithm achieves fast and effective matching between task goals and measurement equipment, shortens the equipment deployment and allocation time of measurement tasks, improves the level of intelligence and measurement efficiency, optimizes the task allocation and execution methods, and improves the reliability and effectiveness of measurement data.