Galvanometer lifetime evaluation method and device, computer equipment, storage medium and program product

Abstract

The application relates to a galvanometer life evaluation method and device, computer equipment, a storage medium and a program product, and is applied to a galvanometer test system. The method comprises the following steps: acquiring the test life of a galvanometer in the galvanometer test system under multiple test conditions; constructing a galvanometer acceleration model according to the test life, a test temperature and a test rotating speed; determining the galvanometer life of the galvanometer under normal working conditions according to the galvanometer acceleration model, the test conditions and the normal working conditions; and the test conditions comprise the test temperature and the test rotating speed. The method determines the galvanometer life of the galvanometer under normal working conditions by constructing a galvanometer acceleration model according to the test life, the test temperature and the test rotating speed, and then determining the galvanometer life of the galvanometer under normal working conditions based on the galvanometer acceleration model, the test conditions and the normal working conditions, thereby providing a method for determining the galvanometer life under normal working conditions and filling the gap that the galvanometer life cannot be evaluated.

Description

Technical Field

[0001] This application relates to the field of laser scanning galvanometer technology, and in particular to a method, apparatus, computer equipment, storage medium, and program product for galvanometer lifetime assessment. Background Technology

[0002] A galvanometer is a scanning galvanometer used in the laser industry. Its professional name is high-speed scanning galvanometer, Galvoscanning system. Due to its high scanning speed and accurate positioning precision, it is widely used in laser marking, laser engraving, stage lighting control, laser drilling and other fields.

[0003] Like other scanning mirrors, the lifespan of a galvanometer is affected by both its own inherent factors and the external environment. If the galvanometer is used for laser marking, laser engraving, or other operations after it has reached the end of its lifespan, it will lead to a waste of resources due to its substandard positioning accuracy and linearity.

[0004] Therefore, how to assess the lifespan of a high-speed scanning galvanometer has become an urgent problem to be solved. Summary of the Invention

[0005] Therefore, it is necessary to provide a method, apparatus, computer equipment, storage medium, and program product for evaluating the lifespan of high-speed scanning galvanometers, in order to address the aforementioned technical problems.

[0006] In a first aspect, this application provides a method for evaluating the lifetime of a galvanometer, applied to a galvanometer testing system, comprising:

[0007] Obtain the test life of the galvanometer in the galvanometer testing system under multiple test conditions; the test conditions include test temperature and test rotation speed;

[0008] Based on the test life, test temperature, and test rotation speed, a galvanometer acceleration model is constructed;

[0009] Based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under various test conditions, the galvanometer life under normal operating conditions is determined.

[0010] In one embodiment, obtaining the test life of the galvanometer in the galvanometer testing system under multiple test conditions includes:

[0011] For a given test condition, obtain the scanning parameters of the galvanometer under that test condition; the scanning parameters include positioning accuracy and linearity;

[0012] If the positioning accuracy meets the first preset condition and / or the linearity meets the second preset condition, the scanning time of the galvanometer is obtained and the scanning time is determined as the test life.

[0013] In one embodiment, the acquisition of the scanning parameters of the galvanometer under test conditions includes:

[0014] Obtain characteristic information of the scanning spot of the galvanometer under experimental conditions;

[0015] Based on the characteristic information of the scanning spot, the scanning parameters of the galvanometer are determined.

[0016] In one embodiment, determining the galvanometer lifetime under each test condition based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test lifetime of the galvanometer in the galvanometer test system under each test condition includes:

[0017] For a given test condition, the normal operating conditions and test conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions;

[0018] Based on the acceleration factor and test life under the test conditions, the galvanometer life under normal operating conditions is determined.

[0019] In one embodiment, the above-mentioned input of normal operating conditions and test conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions includes:

[0020] Normal operating conditions are input into the accelerated model for calculation to obtain the test life under normal operating conditions;

[0021] The test life and test conditions under normal operating conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0022] In one embodiment, the galvanometer acceleration model constructed based on the test lifetime, test temperature, and test rotation speed includes:

[0023] Based on the nonlinear fitting algorithm, the test life, test temperature and test rotation speed are fitted to obtain the galvanometer acceleration model; the nonlinear fitting algorithm includes the maximum likelihood estimation algorithm.

[0024] In one embodiment, the above test conditions meet the normal operating range of the galvanometer, and / or the above test conditions meet the failure mechanism of the galvanometer.

[0025] Secondly, this application also provides a galvanometer lifetime assessment device, applied to a galvanometer testing system, comprising:

[0026] The acquisition module is used to acquire the test life of the galvanometer in the galvanometer testing system under multiple test conditions; the test conditions include test temperature and test rotation speed.

[0027] The module is used to build a galvanometer acceleration model based on the test life, test temperature, and test rotation speed.

[0028] The determination module is used to determine the galvanometer life under normal operating conditions based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0029] In one embodiment, the above-mentioned acquisition module includes: an acquisition unit and a determination unit, wherein:

[0030] The acquisition unit is specifically used to acquire the scanning parameters of the galvanometer under a given test condition; the scanning parameters include positioning accuracy and linearity.

[0031] The determining unit is specifically used to obtain the scanning time of the galvanometer when the positioning accuracy meets the first preset condition and / or the linearity meets the second preset condition, and to determine the scanning time as the test life.

[0032] In one embodiment, the acquisition unit is further configured to acquire feature information of the scanning spot of the galvanometer under test conditions; and determine the scanning parameters of the galvanometer based on the feature information of the scanning spot.

[0033] In one embodiment, the determining module includes: an acquisition unit and a determining unit, wherein:

[0034] The acquisition unit is specifically used to input normal working conditions and experimental conditions into the acceleration model for calculation under a given experimental condition, and obtain the acceleration factor under the experimental condition.

[0035] The determination unit is specifically used to determine the lifespan of the galvanometer under normal operating conditions based on the acceleration factor and test lifespan under the test conditions.

[0036] In one embodiment, the acquisition unit is further configured to input normal operating conditions into the acceleration model for calculation to obtain the test lifetime under normal operating conditions; and to input the test lifetime and test conditions under normal operating conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under test conditions.

[0037] In one embodiment, the aforementioned building module is further used to perform fitting processing on the test life, test temperature and test rotation speed based on a nonlinear fitting algorithm to obtain a galvanometer acceleration model; the nonlinear fitting algorithm includes a maximum likelihood estimation algorithm.

[0038] In one embodiment, the above test conditions meet the normal operating range of the galvanometer, and / or the test conditions meet the failure mechanism of the galvanometer.

[0039] Thirdly, this application also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0040] Obtain the test life of the galvanometer in the galvanometer testing system under multiple test conditions; the test conditions include test temperature and test rotation speed;

[0041] Based on the test life, test temperature, and test rotation speed, a galvanometer acceleration model is constructed;

[0042] Based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under various test conditions, the galvanometer life under normal operating conditions is determined.

[0043] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, performs the following steps:

[0044] Obtain the test life of the galvanometer in the galvanometer testing system under multiple test conditions; the test conditions include test temperature and test rotation speed;

[0045] Based on the test life, test temperature, and test rotation speed, a galvanometer acceleration model is constructed;

[0046] Based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under various test conditions, the galvanometer life under normal operating conditions is determined.

[0047] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, performs the following steps:

[0048] Obtain the test life of the galvanometer in the galvanometer testing system under multiple test conditions; the test conditions include test temperature and test rotation speed;

[0049] Based on the test life, test temperature, and test rotation speed, a galvanometer acceleration model is constructed;

[0050] Based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under various test conditions, the galvanometer life under normal operating conditions is determined.

[0051] The aforementioned galvanometer lifetime assessment method, apparatus, computer equipment, storage medium, and program product are applied to a galvanometer testing system to obtain the test lifetime of the galvanometer under multiple test conditions. Based on the test lifetime, test temperature, and test rotation speed, a galvanometer acceleration model is constructed. Based on the galvanometer acceleration model, various test conditions, and normal operating conditions, the galvanometer lifetime under each test condition is determined. Test conditions include test temperature and test rotation speed. This method first constructs a galvanometer acceleration model using the galvanometer's test lifetime, test temperature, and test rotation speed. Then, based on the galvanometer acceleration model, various test conditions, and normal operating conditions, the galvanometer lifetime under normal operating conditions is determined. This provides a method for determining the galvanometer lifetime under different test conditions, filling the gap in the ability to assess galvanometer lifetime. Attached Figure Description

[0052] To more clearly illustrate the technical solutions in the embodiments of this application or related technologies, the drawings used in the description of the embodiments of this application or related technologies will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0053] Figure 1 This is a diagram illustrating the application environment of the galvanometer lifetime assessment method in one embodiment.

[0054] Figure 2 This is a flowchart illustrating a galvanometer lifetime assessment method in one embodiment;

[0055] Figure 3 This is a flowchart illustrating the galvanometer lifetime assessment method in another embodiment;

[0056] Figure 4 This is a flowchart illustrating the galvanometer lifetime assessment method in another embodiment;

[0057] Figure 5 This illustrates the relationship between test temperature, test rotation speed, and test life under test conditions in one embodiment.

[0058] Figure 6 This is a schematic diagram of the galvanometer acceleration model in one embodiment;

[0059] Figure 7 This is a flowchart illustrating the galvanometer lifetime assessment method in another embodiment;

[0060] Figure 8 This is a flowchart illustrating the galvanometer lifetime assessment method in another embodiment;

[0061] Figure 9 This is a structural block diagram of a galvanometer lifetime assessment device in one embodiment;

[0062] Figure 10 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0063] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0064] A galvanometer is a scanning galvanometer used in the laser industry. Its professional name is high-speed scanning galvanometer, Galvoscanning system. Due to its high scanning speed and accurate positioning precision, it is widely used in laser marking, laser engraving, stage lighting control, laser drilling and other fields.

[0065] Like other scanning mirrors, the lifespan of a galvanometer is affected by both its own inherent characteristics and the external environment. If a galvanometer is used for laser marking, laser engraving, or other operations after it has reached the end of its lifespan, it will result in wasted resources due to substandard positioning accuracy and linearity. Therefore, how to assess the lifespan of a high-speed scanning galvanometer has become an urgent problem to be solved. This application aims to address this issue.

[0066] Having described the background technology of the galvanometer lifetime assessment method provided in the embodiments of this application, the following is a brief description of the implementation environment involved in the galvanometer lifetime assessment method provided in the embodiments of this application. The galvanometer lifetime assessment method provided in the embodiments of this application can be applied to, for example... Figure 1 The galvanometer testing system 01 shown includes a light source 102, a galvanometer to be evaluated 104, a detector 106, and a server 108. The light source 102 emits a laser signal to the galvanometer to be evaluated 104. The galvanometer to be evaluated 104 processes the laser signal to obtain a processed light spot. The angle of the galvanometer to be evaluated 104 is adjusted so that the light spot within the entire range of the galvanometer to be evaluated can be normally incident on the detector 106. The detector 106 determines the positioning accuracy and linearity of the galvanometer to be evaluated 104 based on information such as the position and intensity of the light spot, and sends the positioning accuracy and linearity of the galvanometer to be evaluated 104 to the server 108. The server 108 evaluates the lifespan of the galvanometer to be evaluated 104 based on the positioning accuracy and linearity of the galvanometer to be evaluated 104.

[0067] In other possible implementations, the galvanometer lifetime assessment method provided in this application can also be applied to a terminal, which can be, but is not limited to, various personal computers, laptops, smartphones, tablets, IoT devices, and portable wearable devices. IoT devices can be smart speakers, smart TVs, smart in-vehicle devices, etc. Portable wearable devices can be smartwatches, smart bracelets, head-mounted devices, etc.

[0068] After introducing the application scenarios of the galvanometer lifetime assessment method provided in the embodiments of this application above, the following focuses on the galvanometer lifetime assessment method described in this application.

[0069] In one embodiment, such as Figure 2 As shown, a method for evaluating the lifetime of a galvanometer is provided, which can be applied to... Figure 1 Taking the server in the example, the following steps are included:

[0070] S201. Obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions.

[0071] The test conditions refer to the conditions that meet the normal operating range of the galvanometer under evaluation and / or the conditions that meet the failure mechanism of the galvanometer. The normal operating range refers to the range of conditions under which the galvanometer under evaluation can operate normally, and the failure mechanism refers to the range of conditions under which the galvanometer under evaluation cannot operate normally. The test conditions include the test temperature and the test speed. For example, the test speeds are 10 rpm, 20 rpm, 30 rpm, and 40 rpm, and the test temperatures are 20℃, 40℃, 60℃, and 80℃, respectively.

[0072] The test life refers to the time it takes for the galvanometer to fail. The test life of the galvanometer can be due to the positioning accuracy of the galvanometer not meeting the preset positioning accuracy, or the linearity of the galvanometer not meeting the preset positioning linearity.

[0073] In this embodiment of the application, when it is necessary to evaluate the life of the galvanometer under different test conditions, it is necessary to first obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions.

[0074] Optionally, it can be based on, for example Figure 1 The galvanometer testing system shown can be configured with different test conditions. The system collects the positioning accuracy and linearity under these conditions using a detector, and sends these measurements to a server. The server then determines the test lifetime under each test condition based on the positioning accuracy and linearity. Alternatively, after obtaining the test lifetime under each test condition, the system stores these lifetimes in a database. When it is necessary to evaluate the galvanometer lifetime under different test conditions, the corresponding test lifetime can be directly retrieved from the database.

[0075] S202. Based on the test life, test temperature and test speed, construct the galvanometer acceleration model.

[0076] In this embodiment of the application, after obtaining the test life of the galvanometer in the galvanometer test system under various test temperatures and test speeds, the test life, test temperature and test speed of the galvanometer can be fitted to obtain the galvanometer acceleration model.

[0077] S203. Based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under various test conditions, determine the galvanometer life under normal operating conditions.

[0078] Among them, normal working conditions refer to the preset test temperature. and preset test speed Preset test temperature and preset test speed The positioning accuracy and linearity of the galvanometer can be predetermined. For example, the test temperature can be preset. It can be 25℃, with a preset test speed. It can be 20 rpm.

[0079] In this embodiment of the application, after obtaining the galvanometer acceleration model, the test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under each test condition can be input into the galvanometer acceleration model for calculation to determine the galvanometer life under normal operating conditions.

[0080] The galvanometer lifetime assessment method provided in this application is applied to a galvanometer testing system to obtain the test lifetime of the galvanometer under multiple test conditions. Based on the test lifetime, test temperature, and test rotation speed, a galvanometer acceleration model is constructed. Based on the galvanometer acceleration model, various test conditions, and normal operating conditions, the galvanometer lifetime under each test condition is determined. The test conditions include test temperature and test rotation speed. This method first constructs a galvanometer acceleration model using the galvanometer's test lifetime, test temperature, and test rotation speed. Then, based on the galvanometer acceleration model, various test conditions, and normal operating conditions, the galvanometer lifetime under normal operating conditions is determined. This provides a method for determining the galvanometer lifetime under normal operating conditions, filling the gap in the ability to assess galvanometer lifetime.

[0081] The above methods can provide a basis for life testing and evaluation in laser scanning galvanometer applications such as laser marking, laser additive manufacturing, laser projection, and laser cosmetic procedures. This helps downstream laser scanning galvanometer companies select suppliers, and also assists midstream and upstream companies in optimizing the design of scanning galvanometers and core components.

[0082] In one embodiment, in Figure 2 Based on the illustrated embodiments, the process of obtaining the test lifetime of the galvanometer under various test conditions can be described, such as... Figure 3 As shown, S201, "obtaining the test life of the galvanometer in a galvanometer test system under multiple test conditions," includes:

[0083] S301. For a given test condition, obtain the scanning parameters of the galvanometer under the test condition.

[0084] The scanning parameters include positioning accuracy and linearity.

[0085] In this embodiment of the application, when it is necessary to evaluate the life of the galvanometer to be evaluated under a test condition, it is necessary to first obtain the positioning accuracy and linearity of the galvanometer to be evaluated under that test condition.

[0086] Optionally, the following provides a method for obtaining the positioning accuracy and linearity of the experimental galvanometer to be evaluated, based on, for example... Figure 1 The galvanometer testing system shown sets certain test conditions (e.g., test temperature) for the galvanometer to be evaluated. It can be 40℃, test speed (It can be 30 rpm). After the light source generates a light spot at the detector position through the galvanometer to be evaluated, the detector determines the positioning accuracy and positioning linearity of the galvanometer to be evaluated based on information such as the position and intensity of the light spot, and sends the collected positioning accuracy and positioning linearity under certain test conditions to the server. The server obtains the positioning accuracy and positioning linearity under certain test conditions.

[0087] Optionally, a method for obtaining the scanning parameters of the galvanometer under experimental conditions is provided below, such as... Figure 4 As shown, S301, "acquiring the scanning parameters of the galvanometer under test conditions," includes:

[0088] S3011. Obtain the characteristic information of the scanning spot of the galvanometer under the test conditions.

[0089] The characteristic information of the light spot includes its location and intensity.

[0090] In this embodiment, a light source can generate a light spot on a position sensitive detector (PSD) via a galvanometer to be evaluated. The PSD can acquire the feature information of the corresponding light spot to analyze the positioning accuracy and linearity of the galvanometer to be evaluated based on the features of the light spot.

[0091] S3012. Determine the scanning parameters of the galvanometer based on the characteristic information of the scanning spot.

[0092] In this embodiment of the application, after obtaining the feature information of the light spot as described above, the positioning accuracy and linearity of the galvanometer can be determined based on information such as the position and intensity of the scanned light spot.

[0093] Optionally, it can be assumed that the smaller the distance between the position of the light spot and the position of the galvanometer to be evaluated, the higher the positioning accuracy and linearity of the galvanometer; and that the greater the intensity of the light spot, the higher the positioning accuracy and linearity of the galvanometer.

[0094] S302. If the positioning accuracy meets the first preset condition and / or the linearity meets the second preset condition, obtain the scanning time of the galvanometer and determine the scanning time as the test life.

[0095] The first preset condition can be that the positioning accuracy is greater than a preset positioning accuracy threshold, and the second preset condition can be that the linearity is greater than a preset positioning linearity threshold. The preset positioning accuracy threshold and the preset linearity threshold can be preset.

[0096] In this embodiment of the application, after obtaining the positioning accuracy and linearity of the galvanometer at each time under various test conditions, the moment when the positioning accuracy is greater than a preset positioning accuracy threshold and / or the moment when the linearity is greater than a preset linearity threshold is determined is the test life.

[0097] Optionally, the test life can be defined as the moment when the positioning accuracy is greater than a preset positioning accuracy threshold, the test life can be defined as the moment when the linearity is greater than a preset linearity threshold, or the test life can be defined as the moment when both the positioning accuracy and linearity are greater than a preset linearity threshold.

[0098] Optionally, at least two galvanometers to be evaluated can be set under each test condition. After obtaining the test lifetimes of multiple galvanometers to be evaluated under the same test conditions, the average of the test lifetimes of multiple galvanometers to be evaluated under the same test conditions can be used as the test lifetime under that test condition.

[0099] The method for obtaining the test life of a galvanometer provided in this application determines the test life of the galvanometer based on its positioning accuracy and linearity, providing a certain data foundation for subsequent determination of the galvanometer's life based on its test life.

[0100] In one embodiment, in Figure 2 Based on the illustrated embodiment, the method for constructing the galvanometer acceleration model can be described. S202, "Constructing the galvanometer acceleration model based on the test life, test temperature, and test rotation speed," includes:

[0101] Based on a nonlinear fitting algorithm, the test life, test temperature, and test rotation speed are fitted to obtain the galvanometer acceleration model.

[0102] Among them, nonlinear fitting algorithms include the maximum likelihood estimation algorithm.

[0103] In this embodiment of the application, after obtaining the test lifetimes corresponding to different test temperatures and different test speeds, the test lifetimes corresponding to different test temperatures and different test speeds can be fitted using the maximum likelihood estimation algorithm to obtain the galvanometer acceleration model. Optionally, the galvanometer acceleration model can be expressed by the following formula (1):

[0104]

[0105] in, This refers to the test life of the galvanometer to be tested. , , and These are parameters to be determined. In the embodiments of this application, =1.5, =0.6, =0.05, =0.5, For test temperature, For the test speed, is Boltzmann's constant.

[0106] Optional, as follows Figure 5 As shown, the corresponding relationships between 5 different test temperatures and 5 different test speeds and test lifespans are also provided. Furthermore, based on the 5 test temperatures and 5 test speeds, i.e., the test lifespans under 25 test conditions, a galvanometer acceleration model as shown in formula (1) above is fitted. Additionally, as... Figure 6 The figure also shows the curves of the galvanometer acceleration model fitted based on the test lifetime under 25 sets of test conditions.

[0107] The method for determining the galvanometer acceleration model provided in this application provides data support for subsequently determining the galvanometer lifetime based on the galvanometer acceleration model.

[0108] In one embodiment, in Figure 2 Based on the illustrated embodiments, the process of determining the galvanometer lifetime under various test conditions can be described, such as... Figure 7 As shown, the above-mentioned S203 "determines the galvanometer lifespan under normal operating conditions based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test lifespan of the galvanometer in the galvanometer test system under various test conditions" includes:

[0109] S401. For a given test condition, input the normal operating conditions and test conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0110] In this embodiment of the application, after obtaining the galvanometer acceleration model, normal operating conditions and various test conditions as described above, for a test condition, the normal operating conditions and test conditions can be input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0111] Optionally, the following provides a specific implementation method for inputting normal working conditions and test conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under test conditions. The acceleration factor under test conditions can be expressed by the following formula (2):

[0112]

[0113] in, Indicates the test temperature is The test rotation speed was Acceleration factor under certain conditions The test temperature is the temperature under normal operating conditions. The test rotation speed is the speed under normal operating conditions.

[0114] Optionally, the method for obtaining the acceleration factor under experimental conditions can be further described, such as... Figure 8 As shown, the above-mentioned S401, "inputting normal operating conditions and test conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under test conditions," includes:

[0115] S4011. Input the normal operating conditions into the galvanometer acceleration model for calculation to obtain the test life under normal operating conditions.

[0116] In this embodiment of the application, before determining the acceleration factor under test conditions, the normal operating parameters under normal operating conditions can be determined first. The normal operating conditions can be input into the galvanometer acceleration model for calculation to obtain the test lifetime under normal operating conditions. Optionally, the test lifetime under normal operating conditions can be determined by the following formula (3):

[0117]

[0118] in, This refers to the test life under normal working conditions. The test temperature is the temperature under normal operating conditions. The test rotation speed is the speed under normal operating conditions.

[0119] S4012. Input the test life and test conditions under normal working conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0120] In this embodiment of the application, after the test life under normal working conditions is determined above, the test life under normal working conditions and the test conditions can be input together into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions. The acceleration factor under the test conditions is given by the above formula (2).

[0121] S402. Based on the acceleration factor under test conditions and the test life of the galvanometer in the galvanometer test system under test conditions, determine the galvanometer life under normal working conditions.

[0122] In this embodiment of the application, after obtaining the acceleration factor under the test conditions, the galvanometer lifespan under normal working conditions can be determined based on the acceleration factor under the test conditions and the test lifespan of the galvanometer in the galvanometer test system under the test conditions.

[0123] Optionally, a method for determining the galvanometer lifespan under normal operating conditions is provided below, as shown in the following formula (4). The galvanometer lifespan under test conditions can be expressed as:

[0124]

[0125] in, The test temperature is The test rotation speed is Galvanometer lifetime under certain conditions The test temperature is The test rotation speed is Acceleration factor under certain conditions The test temperature is The test rotation speed was Test life of the galvanometer under certain conditions.

[0126] The method for determining the galvanometer lifetime under test conditions provided in this application first constructs a galvanometer acceleration model, and then determines the galvanometer lifetime under each test condition based on the galvanometer acceleration model, each test condition, and normal operating condition. This provides a method for determining the galvanometer lifetime under normal operating conditions and fills the gap in the inability to evaluate the galvanometer lifetime.

[0127] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0128] Based on the same inventive concept, this application also provides a galvanometer lifetime assessment device for implementing the aforementioned galvanometer lifetime assessment method. The solution provided by this device is similar to the implementation described in the above method; therefore, the specific limitations in one or more embodiments of the galvanometer lifetime assessment device provided below can be found in the limitations of the galvanometer lifetime assessment method described above, and will not be repeated here.

[0129] In one exemplary embodiment, such as Figure 9 As shown, a galvanometer lifetime assessment device is provided, applied to a galvanometer testing system, including: an acquisition module 10, a construction module 11, and a determination module 12, wherein:

[0130] The acquisition module 10 is used to acquire the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test rotation speed.

[0131] Module 11 is used to construct a galvanometer acceleration model based on the test life, test temperature, and test rotation speed.

[0132] The determination module 12 is used to determine the galvanometer life under normal operating conditions based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0133] In an exemplary embodiment, the acquisition module 10 includes: an acquisition unit and a determination unit, wherein:

[0134] The acquisition unit is specifically used to acquire the scanning parameters of the galvanometer under a given test condition; the scanning parameters include positioning accuracy and linearity.

[0135] The determining unit is specifically used to obtain the scanning time of the galvanometer when the positioning accuracy meets the first preset condition and / or the linearity meets the second preset condition, and to determine the scanning time as the test life.

[0136] In an exemplary embodiment, the acquisition unit is further configured to acquire feature information of the scanning spot of the galvanometer under experimental conditions; and determine the scanning parameters of the galvanometer based on the feature information of the scanning spot.

[0137] In an exemplary embodiment, the determining module 12 includes: an acquisition unit and a determining unit, wherein:

[0138] The acquisition unit is specifically used to input the normal working conditions and the test conditions into the galvanometer acceleration model for calculation under a test condition, and obtain the acceleration factor under the test condition.

[0139] The determination unit is specifically used to determine the galvanometer lifespan under normal operating conditions based on the acceleration factor and the test lifespan of the galvanometer in the galvanometer test system under the test conditions.

[0140] In an exemplary embodiment, the acquisition unit is further configured to input normal operating conditions into the acceleration model for calculation to obtain the test lifetime under normal operating conditions; and to input the test lifetime and test conditions under normal operating conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under test conditions.

[0141] In an exemplary embodiment, the aforementioned construction module 11 is further configured to perform fitting processing on the test life, test temperature, and test rotation speed based on a nonlinear fitting algorithm to obtain a galvanometer acceleration model; the nonlinear fitting algorithm includes a maximum likelihood estimation algorithm.

[0142] In one exemplary embodiment, the above test conditions meet the normal operating range of the galvanometer, and / or the test conditions meet the failure mechanism of the galvanometer.

[0143] Each module in the aforementioned galvanometer life assessment device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in the processor of a computer device in hardware form or independent of it, or stored in the memory of a computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0144] In one exemplary embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 10As shown, the computer device includes a processor, memory, input / output (I / O) interfaces, and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides the environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The database stores relevant data for the galvanometer. The I / O interfaces are used for exchanging information between the processor and external devices. The communication interface is used for communication with external terminals via a network connection. When the computer program is executed by the processor, it implements a galvanometer lifetime assessment method.

[0145] Those skilled in the art will understand that Figure 10 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0146] In one exemplary embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0147] Obtain the test life of the galvanometer in the galvanometer testing system under multiple test conditions; the test conditions include test temperature and test rotation speed;

[0148] Based on the test life, test temperature, and test rotation speed, a galvanometer acceleration model is constructed;

[0149] Based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under various test conditions, the galvanometer life under normal operating conditions is determined.

[0150] In one embodiment, the processor, when executing a computer program, also performs the following steps:

[0151] For a given test condition, obtain the scanning parameters of the galvanometer under that test condition; the scanning parameters include positioning accuracy and linearity;

[0152] If the positioning accuracy meets the first preset condition and / or the linearity meets the second preset condition, the scanning time of the galvanometer is obtained and the scanning time is determined as the test life.

[0153] In one embodiment, the processor, when executing a computer program, also performs the following steps:

[0154] Obtain characteristic information of the scanning spot of the galvanometer under experimental conditions;

[0155] Based on the characteristic information of the scanning spot, the scanning parameters of the galvanometer are determined.

[0156] In one embodiment, the processor, when executing a computer program, also performs the following steps:

[0157] For a given test condition, the normal operating conditions and test conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions;

[0158] Based on the acceleration factor and test life under the test conditions, the galvanometer life under normal operating conditions is determined.

[0159] In one embodiment, the processor, when executing a computer program, also performs the following steps:

[0160] Normal operating conditions are input into the accelerated model for calculation to obtain the test life under normal operating conditions;

[0161] The test life and test conditions under normal operating conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0162] In one embodiment, the processor, when executing a computer program, also performs the following steps:

[0163] Based on the nonlinear fitting algorithm, the test life, test temperature and test rotation speed are fitted to obtain the galvanometer acceleration model; the nonlinear fitting algorithm includes the maximum likelihood estimation algorithm.

[0164] In one embodiment, the processor, when executing a computer program, also performs the following steps:

[0165] The test conditions meet the normal operating range of the galvanometer, and / or the test conditions meet the failure mechanism of the galvanometer.

[0166] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, the computer program performing the following steps when executed by a processor:

[0167] Obtain the test life of the galvanometer in the galvanometer testing system under multiple test conditions; the test conditions include test temperature and test rotation speed;

[0168] Based on the test life, test temperature, and test rotation speed, a galvanometer acceleration model is constructed;

[0169] Based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under various test conditions, the galvanometer life under normal operating conditions is determined.

[0170] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0171] For a given test condition, obtain the scanning parameters of the galvanometer under that test condition; the scanning parameters include positioning accuracy and linearity;

[0172] If the positioning accuracy meets the first preset condition and / or the linearity meets the second preset condition, the scanning time of the galvanometer is obtained and the scanning time is determined as the test life.

[0173] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0174] Obtain characteristic information of the scanning spot of the galvanometer under experimental conditions;

[0175] Based on the characteristic information of the scanning spot, the scanning parameters of the galvanometer are determined.

[0176] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0177] For a given test condition, the normal operating conditions and test conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions;

[0178] Based on the acceleration factor and test life under the test conditions, the galvanometer life under normal operating conditions is determined.

[0179] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0180] Normal operating conditions are input into the accelerated model for calculation to obtain the test life under normal operating conditions;

[0181] The test life and test conditions under normal operating conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0182] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0183] Based on the nonlinear fitting algorithm, the test life, test temperature and test rotation speed are fitted to obtain the galvanometer acceleration model; the nonlinear fitting algorithm includes the maximum likelihood estimation algorithm.

[0184] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0185] The test conditions meet the normal operating range of the galvanometer, and / or the test conditions meet the failure mechanism of the galvanometer.

[0186] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, performs the following steps:

[0187] Obtain the test life of the galvanometer in the galvanometer testing system under multiple test conditions; the test conditions include test temperature and test rotation speed;

[0188] Based on the test life, test temperature, and test rotation speed, a galvanometer acceleration model is constructed;

[0189] Based on the galvanometer acceleration model, various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under various test conditions, the galvanometer life under normal operating conditions is determined.

[0190] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0191] For a given test condition, obtain the scanning parameters of the galvanometer under that test condition; the scanning parameters include positioning accuracy and linearity;

[0192] If the positioning accuracy meets the first preset condition and / or the linearity meets the second preset condition, the scanning time of the galvanometer is obtained and the scanning time is determined as the test life.

[0193] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0194] Obtain characteristic information of the scanning spot of the galvanometer under experimental conditions;

[0195] Based on the characteristic information of the scanning spot, the scanning parameters of the galvanometer are determined.

[0196] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0197] For a given test condition, the normal operating conditions and test conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions;

[0198] Based on the acceleration factor and test life under the test conditions, the galvanometer life under normal operating conditions is determined.

[0199] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0200] Normal operating conditions are input into the accelerated model for calculation to obtain the test life under normal operating conditions;

[0201] The test life and test conditions under normal operating conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0202] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0203] Based on the nonlinear fitting algorithm, the test life, test temperature and test rotation speed are fitted to obtain the galvanometer acceleration model; the nonlinear fitting algorithm includes the maximum likelihood estimation algorithm.

[0204] In one embodiment, when the computer program is executed by a processor, it also performs the following steps:

[0205] The test conditions meet the normal operating range of the galvanometer, and / or the test conditions meet the failure mechanism of the galvanometer.

[0206] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.

[0207] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0208] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for evaluating the lifetime of a galvanometer, characterized in that, The method is applied to a galvanometer testing system, and the method includes: The test life of the galvanometer in the galvanometer test system is obtained under multiple test conditions; the test conditions include test temperature and test rotation speed. Based on the test life, the test temperature, and the test rotation speed, a galvanometer acceleration model is constructed. Based on the galvanometer acceleration model, the various test conditions, normal operating conditions, and the test life of the galvanometer in the galvanometer test system under the various test conditions, the galvanometer life under the normal operating conditions is determined, including: For a given test condition, the normal operating conditions and the test conditions are input into the acceleration model for calculation to obtain the acceleration factor under the test conditions; Based on the acceleration factor and test life under the test conditions, the galvanometer life under the normal operating conditions is determined; The galvanometer acceleration model is represented by the following formula (1): in, This refers to the test life of the galvanometer to be tested. =1.5, =0.6, =0.05, =0.5, For test temperature, For the test speed, Boltzmann's constant; The acceleration factor is expressed by the following formula (2): in, Indicates the test temperature is The test rotation speed was Acceleration factor under certain conditions The test temperature is the temperature under normal operating conditions. The test rotation speed is the speed under normal operating conditions.

2. The method according to claim 1, characterized in that, The method of obtaining the test life of the galvanometer in the galvanometer test system under multiple test conditions includes: For a given test condition, obtain the scanning parameters of the galvanometer under that test condition; the scanning parameters include positioning accuracy and linearity; If the positioning accuracy meets the first preset condition and / or the linearity meets the second preset condition, the scanning time of the galvanometer is obtained, and the scanning time is determined as the test life.

3. The method according to claim 2, characterized in that, The process of obtaining the scanning parameters of the galvanometer under the test conditions includes: Obtain the characteristic information of the scanning spot of the galvanometer under the test conditions; The scanning parameters of the galvanometer are determined based on the characteristic information of the scanning spot.

4. The method according to claim 1, characterized in that, The step of constructing a galvanometer acceleration model based on the test life, the test temperature, and the test rotation speed includes: The test lifetime, test temperature, and test rotation speed are fitted using a nonlinear fitting algorithm to obtain the galvanometer acceleration model; the nonlinear fitting algorithm includes a maximum likelihood estimation algorithm.

5. The method according to any one of claims 1-4, characterized in that, The test conditions meet the normal operating range of the galvanometer, and / or the test conditions meet the failure mechanism of the galvanometer.

6. A galvanometer lifetime assessment device, characterized in that, Applied to a galvanometer testing system, the device includes: The acquisition module is used to acquire the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test rotation speed; A construction module is used to construct a galvanometer acceleration model based on the test life, the test temperature, and the test rotation speed; The determination module is used to determine the galvanometer life under normal working conditions based on the galvanometer acceleration model, each of the test conditions, normal working conditions, and the test life of the galvanometer in the galvanometer test system under each of the test conditions. The determining module further includes: The calculation unit is used to input the normal working conditions and the test conditions into the acceleration model for calculation under a test condition, and obtain the acceleration factor under the test condition. A determining unit is configured to determine the galvanometer lifetime under normal operating conditions based on the acceleration factor and the test lifetime under the test conditions. The galvanometer acceleration model is represented by the following formula (1): in, This refers to the test life of the galvanometer to be tested. =1.5, =0.6, =0.05, =0.5, For test temperature, For the test speed, Boltzmann's constant; The acceleration factor is expressed by the following formula (2): in, Indicates the test temperature is The test rotation speed was Acceleration factor under certain conditions The test temperature is the temperature under normal operating conditions. The test rotation speed is the speed under normal operating conditions.

7. The apparatus according to claim 6, characterized in that, The acquisition module includes: The acquisition unit is used to acquire the scanning parameters of the galvanometer under a test condition; the scanning parameters include positioning accuracy and linearity. The determining unit is configured to, when the positioning accuracy meets a first preset condition and / or the linearity meets a second preset condition, acquire the scanning time of the galvanometer and determine the scanning time as the test life.

8. The apparatus according to claim 7, characterized in that, The acquisition unit is used to acquire the feature information of the scanning spot of the galvanometer under the test conditions; and to determine the scanning parameters of the galvanometer based on the feature information of the scanning spot.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 5.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 5.

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