Optical path adjusting system and method applied to optical storage

Abstract

The invention discloses an optical path adjusting system and method applied to optical storage, and the method comprises the steps: carrying out the twice adjustment of a parallel light beam after the shaping of a collimation shaping system through a first reflector adjusting structure and a second reflector adjusting structure which are made of a first piezoelectric material; and the parallel light beams can pass through the first standard point and the second standard point in sequence after being adjusted for the second time, and then pass through the objective lens to be converged to the recording material. Due to the fact that the first reflector adjusting structure and the second reflector adjusting structure which are based on the piezoelectric materials are adopted, the precision is high, micron-scale and nano-scale precision adjustment can be conducted through an optical adjusting structure, and the problems that the size is large and the adjustment precision is low when a traditional mechanical structure mode is used are solved.

Description

Technical Field

[0001] The present invention relates to the technical field of optical device debugging, and in particular to an optical path adjustment system and method applied to optical storage. Background Art

[0002] In the optical system of optical storage, the precision and quality of the optical path are very important. The deviation of the optical path will directly affect the recording and reading effect of data.

[0003] In a simple model of a traditional optical storage optical system, a laser light source emits light, which is then formed into a parallel light beam with a certain beam width that meets the requirements by a collimation and shaping system. The light beam enters the objective lens and converges to act on the information recording material. The recording material reacts with the laser spot to form an information recording point.

[0004] However, due to errors in optical path calculation, mechanical processing technology, assembly technology, and other factors, as well as environmental temperature changes, equipment vibrations, and other factors, the light beam after collimation and shaping often deviates and cannot enter the objective lens according to the designed standard optical path, thus affecting the optical system. Therefore, an adjustment scheme is added to the optical path to ensure the accuracy of the optical path, so that it can propagate in space according to the design standard and enter the objective lens correctly to ensure the quality of the optical path. However, in the optical system of optical storage, the overall structure has the characteristics of small size and compact layout, and its optical components are all at the millimeter level. At the same time, the optical storage optical system has extremely high requirements for the accuracy of the optical path, even to the micron and nanometer level. Therefore, its optical adjustment structure cannot use the traditional mechanical structure method. First of all, the size cannot be compressed too small, and the adjustment accuracy cannot meet the requirements. Summary of the invention

[0005] The present invention discloses an optical path adjustment system and method applied to optical storage, so as to overcome the above technical problems.

[0006] In order to achieve the above object, the technical solution of the present invention is:

[0007] An optical path adjustment system for optical storage, characterized in that it comprises: a laser light source, a collimation and shaping system, a first reflector adjustment structure based on a piezoelectric material, a second reflector adjustment structure based on a piezoelectric material, a first reflective transmission mirror, a second reflective transmission mirror, an objective lens, a recording material, a first detection camera, a second detection camera, and a controller;

[0008] The collimation and shaping system is arranged in the light emission direction of the laser light source to shape the light emitted by the laser light source into a parallel light beam;

[0009] The first reflector adjustment structure is disposed on the optical path of the parallel light beam to perform a first adjustment on the parallel light beam; the second reflector adjustment structure is disposed on the optical path of the parallel light beam after the first adjustment to perform a second adjustment on the parallel light beam;

[0010] The parallel light beam adjusted for the second time passes through the first reflection and transmission mirror and the second reflection and transmission mirror in sequence and then passes through the objective lens to converge onto the recording material;

[0011] The first reflecting mirror is used to obtain the first detection light of the parallel light beam adjusted for the second time and transmit it to the first detection camera; the second reflecting mirror is used to obtain the second detection light of the parallel light beam adjusted for the second time and transmit it to the second detection camera;

[0012] The input end of the controller is respectively connected to the first detection camera and the second detection camera signal to respectively obtain the deviation between the first detection light and the first standard point and the deviation between the second detection light and the second standard point;

[0013] The output end of the controller is connected to the first reflector adjustment structure and the second reflector adjustment structure signals respectively, so as to adjust the first reflector adjustment structure and the second reflector adjustment structure alternately and repeatedly according to the deviation between the first detection light and the first standard point and the deviation between the second detection light and the second standard point, so that the parallel light beam can pass through the first standard point and the second standard point in sequence after adjustment, and then pass through the objective lens to converge onto the recording material.

[0014] Beneficial effects: The optical path adjustment system and method for optical storage of the present invention alternately and repeatedly adjusts the parallel light beam shaped by the collimation shaping system through the first reflector adjustment structure and the second reflector adjustment structure of the first piezoelectric material, so that the parallel light beam can pass through the first standard point and the second standard point in sequence after the second adjustment, and then pass through the objective lens to converge to the recording material. The present invention uses the high precision of the first reflector adjustment structure and the second reflector adjustment structure based on piezoelectric materials, and can perform micron and nanometer precision adjustment through the optical adjustment structure, solving the problem of large size and low adjustment precision when using the traditional mechanical structure. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0016] Figure 1 It is a schematic diagram of the overall structure of the optical path adjustment system applied to optical storage of the present invention;

[0017] Figure 2 A schematic diagram of the positions of the first standard point and the second standard point of the present invention;

[0018] Figure 3 A schematic diagram of a typical arrangement of an optical path adjustment system in an embodiment of the present invention;

[0019] Figure 4 is a schematic diagram of the overall structure of the first reflector adjustment structure in an embodiment of the present invention;

[0020] Figure 5 It is a schematic diagram of the decomposition of the adjustment structure of the first reflector in an embodiment of the present invention;

[0021] Figure 6 It is a schematic diagram of the structure of the yield opening at the bottom of the adjustment seat in an embodiment of the present invention;

[0022] Figure 7 is a schematic diagram of a spherical top of a support column in an embodiment of the present invention;

[0023] Figure 8 It is a schematic diagram of a piezoelectric driving structure and a support column forming a three-point support in an embodiment of the present invention;

[0024] Fig. 9 is a schematic diagram of a block piezoelectric drive structure in an embodiment of the present invention;

[0025] Fig.10 is a schematic diagram of the function of a piezoelectric drive block in an embodiment of the present invention;

[0026] Fig.11 is a schematic structural diagram of a strip-shaped piezoelectric drive block in an embodiment of the present invention;

[0027] Fig.12 A schematic diagram of a strip-shaped piezoelectric driving block shifting upward in an embodiment of the present invention;

[0028] Fig.13 It is a schematic diagram of a strip-shaped piezoelectric driving block shifting downward in an embodiment of the present invention;

[0029] Fig.14 A schematic diagram of a micro-size reflector adjustment structure in an embodiment of the present invention:

[0030] Fig.15 A schematic diagram of the deflection of a reflector fixing plate using a block-shaped piezoelectric driving block in an embodiment of the present invention;

[0031] Fig.16 is a schematic diagram of a strip-shaped piezoelectric driving block in an embodiment of the present invention;

[0032] Fig.17 It is a schematic diagram of the installation of the reflector adjustment structure of the strip-shaped piezoelectric drive block in an embodiment of the present invention;

[0033] Fig.18 A schematic diagram of the deflection of a reflector fixing plate using a strip-shaped piezoelectric drive block in an embodiment of the present invention;

[0034] Fig.19 Schematic diagram of the adjustment spring structure in an embodiment of the present invention

[0035] Fig. 20 It is a schematic diagram of the installation of the adjustment spring and the adjustment base in an embodiment of the present invention;

[0036] Fig.21 It is a schematic diagram of the installation of the adjustment spring and the reflector fixing plate in the reflector adjustment structure in an embodiment of the present invention;

[0037] Fig. 22 A schematic diagram of a groove corresponding to the bottom of the reflector fixing plate and the spherical structure of the support column, i.e., the piezoelectric drive block in an embodiment of the present invention;

[0038] Fig.23 is a schematic cross-sectional assembly diagram of a groove at the bottom of a reflector fixing plate in an embodiment of the present invention;

[0039] Fig.24 A schematic diagram of a state in which the light spot in an embodiment of the present invention is located at the reference center of the detection camera;

[0040] Fig.25 A schematic diagram of a state when there is a deviation between the light spot and the reference center of the detection camera in an embodiment of the present invention;

[0041] Fig.26 is a logic flow chart of the controller adjusting the optical path in an embodiment of the present invention;

[0042] Fig. 27 It is a schematic diagram of the dimensions in the logic flow of the visit adjustment in the embodiment of the present invention. DETAILED DESCRIPTION

[0043] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0044] This embodiment introduces an optical path adjustment system for optical storage. Figure 1 As shown, including:

[0045] Laser light source 1, collimation and shaping system 2, first reflector adjustment structure 3, second reflector adjustment structure 4, first reflective transmission mirror 5, second reflective transmission mirror 6, objective lens 7, recording material 8, first detection camera 9, second detection camera 10, controller;

[0046] The collimation and shaping system 2 is arranged in the light emission direction of the laser light source 1 to shape the light emitted by the laser light source 1 into a parallel light beam;

[0047] The first reflector adjustment structure 3 is disposed on the optical path of the parallel light beam to perform a first adjustment on the parallel light beam;

[0048] The second reflector adjustment structure 4 is arranged on the optical path of the parallel light beam after the first adjustment, so as to perform a second adjustment on the parallel light beam;

[0049] The parallel light beam adjusted for the second time passes through the first reflection and transmission mirror 5 and the second reflection and transmission mirror 6 in sequence, and then passes through the objective lens 7, and converges to the recording material 8;

[0050] The first reflective mirror 5 is arranged at the position of the first standard point, and is used to obtain the first detection light of the parallel light beam adjusted for the second time and transmit it to the first detection camera 9;

[0051] The second reflective mirror 6 is disposed at the position of the second standard point, and is used to obtain the second detection light of the parallel light beam adjusted for the second time and transmit it to the second detection camera 10;

[0052] The input end of the controller is respectively connected to the first detection camera 9 and the second detection camera 10 to respectively obtain the deviation between the first detection light and the first standard point and the deviation between the second detection light and the second standard point;

[0053] The output end of the controller is connected to the first reflector adjustment structure 3 and the second reflector adjustment structure 4 by signals, respectively, so as to adjust the first reflector adjustment structure 3 and the second reflector adjustment structure 4 alternately and repeatedly according to the deviation between the first detection light and the first standard point and the deviation between the second detection light and the second standard point, so that the parallel light beam can pass through the first standard point 92 and the second standard point 102 in sequence after adjustment, and then pass through the objective lens 7 and converge to the recording material 8.

[0054] Specifically, the entire optical system includes a main optical path and a monitoring and control device, wherein the main optical path includes: a laser light source 1, a collimation and shaping system 2, a first reflector adjustment structure 3, a second reflector adjustment structure 4, a first reflective mirror 5, a second reflective mirror 6, an objective lens 7, and a recording material 8; the monitoring and control device includes: a controller, a first detection device 9, a second detection device 10 and a first detection phase data line 91 for connecting data transmission, a second detection camera data line 101, a first reflector adjustment structure control line 31, and a first reflector adjustment structure control line 41.

[0055] Specifically, when the light beam propagates in space, if it can accurately pass through the first standard point and the second standard point, such as Figure 2 As shown, it is considered to be a standard light beam. This embodiment uses a first reflector adjustment structure 3 and a second reflector adjustment structure 4 to adjust the light beam to align with the first standard point and the second standard point respectively.

[0056] At the same time, in order not to affect the propagation of the light beam, a reflective lens is used at the first standard point 92 and the second standard point 102, so that the main light beam still propagates in the original direction, and a part of the light beam is reflected for information confirmation. The reflected light beam will enter two detection cameras respectively, and these two detection cameras serve as detection devices for replacing the standard points of the light beam.

[0057] After the laser light source emits light, it is shaped by the collimation and shaping system into a parallel light beam with a certain beam width that meets the requirements. After the parallel light beam is reflected twice by the first reflector adjustment structure 3 and the second reflector adjustment structure 4, it passes through the first reflection mirror 5, and the separated first detection light is reflected into the first detection camera 9. The main light continues to propagate along the original optical path, and then passes through the second reflection mirror 6, and the separated second detection light is reflected into the second detection camera 10. The main light enters the objective lens 7 and converges onto the recording material 8.

[0058] In this embodiment, since the first reflector adjustment structure 3 and the second reflector adjustment structure 4 are provided to adjust the direction of the parallel light beam, the arrangement of the optical path of the optical system is more flexible. Figure 3 a and Figure 3 The two typical arrangements b in this embodiment are shown in FIG. 1 , and the other arrangements are not listed one by one.

[0059] Specifically, the first reflecting mirror, the second reflecting mirror, the first detection camera, the second detection camera and the controller in this embodiment all adopt existing modules that can realize the functions of this embodiment, which will not be described in detail here.

[0060] Preferably, the first reflector adjustment structure 3 and the second reflector adjustment structure 4 have the same structure.

[0061] Preferably, if Figure 4 and Figure 5 As shown, the first reflector adjustment structure 3 includes an adjustment base 31, a support column 312, two sets of piezoelectric drive structures 32, an adjustment spring 33, a reflector fixing plate 34 and a reflector 35;

[0062] A sliding spring buckle 311 is fixedly arranged at the center position of the top of the adjustment base 31;

[0063] The support column 312 and the two groups of piezoelectric drive structures 32 are fixedly arranged at the edge position of the top of the adjustment base 31, and the two groups of piezoelectric drive structures 32 are arranged on both sides of the support column 312; and the top of the piezoelectric drive structure 32 and the top of the support column 312 are both in contact with the bottom of the reflector fixing plate 34, so that when the piezoelectric drive structure 32 is deformed, the reflector fixing plate 34 can rotate around the axis formed by the top of the support column 312 and the top of another piezoelectric drive structure;

[0064] The adjustment spring 33 is fixed by the sliding spring buckle 311 and the support column 312, and is fixedly connected to the reflector fixing plate 34;

[0065] The reflector 35 is fixedly disposed on the top of the reflector fixing plate 34, and the reflector 35 is disposed on the optical path of the parallel light beam to perform a first adjustment on the parallel light beam;

[0066] Preferably, the top of the support column 312 and the top of the piezoelectric drive structure 32 are both spherical structures, such as Figure 7 shown.

[0067] Preferably, the adjustment spring 33 includes a fixing structure 331 and two tensioning structures 332;

[0068] The two ends of the fixing structure 331 are fixedly connected to the sliding spring buckle 311 and the support column 312 respectively, so that the adjustment spring 33 is fixed by the sliding spring buckle 311 and the support column 312;

[0069] One end of the tensioning structure 332 is fixedly connected to the fixing structure 331 at a side where the fixing structure 331 is connected to the support column 312;

[0070] The other ends of the two tensioning structures 332 are respectively connected to the two sides of the reflector fixing plate 34, so that when the piezoelectric drive structure 32 is deformed, the reflector fixing plate 34 can rotate around the axis formed by the top of the support column 312 and the top of another piezoelectric drive structure.

[0071] Specifically, the adjustment spring of this embodiment is composed of a fixed structure and two tensioning structures; one end of the fixed structure is first installed into the fixed buckle structure 313 on the support column of the adjustment base, and then the other end is pressed into the sliding spring buckle 311 at the center of the adjustment base to ensure that the adjustment spring will not fall off; the tensioning structures at both ends are respectively inserted into the ears on both sides of the reflector fixing plate, and the reflector fixing plate is pulled downward to be pressed tightly on the three supporting points. Fig.19 , Fig. 20 , Fig.21 shown.

[0072] Specifically, in this embodiment, the other end of the tensioning structure 332 is provided with a bent portion 333 corresponding to the lug 341 on the side of the reflector fixing plate 34, so that the elastic connecting portion 332 is connected to the lug 341 through the bent portion 333. When the reflector fixing plate 34 rotates around the top of the support column 312 through the adjustment spring 33 as the two groups of piezoelectric drive structures 32 are deformed, the connection between the bent portion and the lug can make the rotation of the reflector fixing plate smoother.

[0073] Specifically, the adjustment base 31 serves as the support of the entire reflector adjustment structure, and is usually installed on the optical system by gluing or welding; a support column 312 is provided at one corner of the adjustment base, a fixed spring buckle structure 313 is provided on the support column, and a spring buckle structure that can slide into the center is provided, namely a sliding spring buckle 311, and the two buckles jointly clamp the adjustment spring; the top of the support column adopts a spherical structure, which is in point contact with the supported moving end - the reflector fixing plate 34; when the moving end moves, the point contact structure can ensure the smoothness of the movement; the spring buckle at the center of the bottom of the adjustment base is provided with a processing clearance opening 314 to facilitate the processing of the buckle. Figure 6 shown.

[0074] Preferably, the piezoelectric driving structure 32 includes a piezoelectric driving block 321 and a supporting top block 322;

[0075] The top of the piezoelectric driving block 321 is fixedly connected to the bottom of the supporting top block 322;

[0076] The bottom of the piezoelectric driving block 321 is fixedly arranged at the edge of the adjustment base 31;

[0077] The bottom of the reflector fixing plate 34 abuts against the top of the supporting top block 322;

[0078] The top of the supporting top block 322 is a spherical structure.

[0079] Preferably, the piezoelectric driving structure 32 comprises a piezoelectric driving bar 325 and a second supporting top block 326;

[0080] A piezoelectric drive bar fixing plate 327 is fixedly arranged on the top of the adjustment base 31; one end of the piezoelectric drive bar is fixedly arranged on the top of the piezoelectric drive bar fixing plate 327, and the top of the other end is fixedly connected to the bottom of the second support top block 326; the top of the second support top block 326 abuts against the bottom of the reflector fixing plate 34. The top of the second support top block 326 is a spherical structure. Fig.17 shown.

[0081] Specifically, in the embodiment of the present invention, according to the characteristics of the piezoelectric drive block, the piezoelectric drive block can be in the form of a block or a strip. Due to the characteristics of the piezoelectric material, the piezoelectric drive block can be made into a small shape, with a size of Fig. 9 shown.

[0082] Specifically, in a specific embodiment of the present invention, the piezoelectric driving structure 32 is composed of a piezoelectric driving block 321 and a supporting top block 322; the top of the supporting top block 322 of the piezoelectric driving structure 32 is also a spherical structure, supported on the bottom of the reflector fixing plate 34, and the supporting point formed by the supporting column 312 of the adjustment base, a total of three points form a supporting plane; in order to make the angle adjustment easy to quantify, the three points are usually set to a right triangle, and the adjusting base support column is the point at the right angle position. Figure 8 As shown. The block-shaped piezoelectric drive block can directly extend and shorten when powered, so its telescopic deformation properties can be directly utilized. It is connected to the support top block on the top and fixed to the two corners of the adjustment base by gluing or welding on the bottom. When it moves, it directly drives the support top block to move upward or downward, so that the corresponding position of the reflector fixing plate flips up or downward to achieve the angle adjustment of the reflector. The block-shaped piezoelectric drive block reacts more directly and quickly, and the angle change is easier to form a corresponding relationship with the current required for the deformation of the piezoelectric drive block. When one of the piezoelectric drive blocks moves, it drives the reflector fixing plate to flip along the axis formed by the support column and the support top block of the other piezoelectric drive block; as shown Fig.15 shown.

[0083] Specifically, the strip-mounted piezoelectric drive block is suitable for a larger adjustment range, but its stability is slightly worse and it is more difficult to adjust the parameters. Therefore, the two piezoelectric drive block forms can be selected according to the needs.

[0084] Similarly, when one of the strip-mounted piezoelectric drive blocks moves, it drives the reflector fixing plate to flip along the axis formed by the support column and the support top block of the other strip-mounted piezoelectric drive block. Fig.18 The display shown is the action form of the reflector fixing plate when the two piezoelectric drive strips are respectively actuated.

[0085] Specifically, the piezoelectric drive block is composed of piezoelectric materials and electrodes, and the piezoelectric material has the characteristic of being able to produce piezoelectric effect. The characteristic of exchanging mechanical energy and electrical energy is called piezoelectric effect. When a corresponding electric field is applied to the piezoelectric material, the crystals in the piezoelectric material will produce polarization effect and stretch or shrink, so the piezoelectric material will expand or shrink. The piezoelectric drive block works like Fig.10 As shown:

[0086] Among them, piezoelectric materials have the advantages of high precision, which can achieve sub-nanometer or even nanometer resolution; secondly, piezoelectric materials have a fast response and can be used in high-speed adjustment situations; and piezoelectric materials are small in size and suitable for high-precision adjustment of structures in narrow spaces. The reflector adjustment structure of this embodiment adopts a miniaturized design, and the adjustment motion structure adopts a piezoelectric drive block.

[0087] The strip of piezoelectric material is also composed of two parts bonded together. The upper and lower parts are independently controlled by three electrodes, and they are not affected by each other. That is, the upper and lower piezoelectric sheets can be extended or shortened independently. At the same time, the position of the electrode on the structure is a fixed end, and the other side is a free end, such as Fig.11 When the upper piezoelectric sheet contracts and the lower piezoelectric sheet stretches, its free end deflects upward, as shown in Fig.12 As shown; when the upper piezoelectric sheet is stretched and the lower piezoelectric sheet is shortened, its free end deflects downward, thereby achieving control of the displacement of its free end deformation, as shown in FIG. Fig.13 Similarly, the size of the entire reflector adjustment structure is also very small, as shown in Fig.14 As shown: Among them, the strip piezoelectric drive block has the same size and is made into a small size form, such as Fig.16 As shown: the strip-shaped piezoelectric drive block can realize bending action when powered. Utilizing this feature, one end of the strip-shaped piezoelectric drive block is connected to the supporting top block, and the other end is pasted or welded to the piezoelectric drive block fixing block arranged on the adjustment base at a distance from the supporting point; when the piezoelectric drive block strip bends upward or downward, it drives the supporting top block to move upward or downward, causing the corresponding position of the reflector fixing plate to flip upward or downward, thereby realizing the angle adjustment of the reflector.

[0088] Preferably, the bottom of the reflector fixing plate 34 is provided with a first spherical groove 315 corresponding to the top of the support column 312 and a second spherical groove 323 corresponding to the top of the piezoelectric driving structure 32;

[0089] Specifically, in this embodiment, the reflector is usually installed on the upper surface of the reflector fixing plate by pasting; two hanging ears are used to install two tensioning structures of the adjustment spring; three positioning grooves are set at the bottom of the reflector fixing plate corresponding to the three supporting points, and the grooves are set in a spherical groove state, which can cooperate with the spherical supporting head of the supporting structure to achieve the positioning function, and at the same time, it can also ensure that the reflector fixing plate moves smoothly in the state of point contact. Fig. 22 and Fig.23 As shown;

[0090] Specifically, the operating principle of the reflector adjustment structure of this embodiment is as follows:

[0091] Taking three supporting points as reference, the position of the support column of the adjustment base is set as the origin, and the connecting lines with the two piezoelectric drive block supporting points, namely support point 1 and support point 2, are set as the X axis and Y axis respectively; the distance between the origin and support point 1 is Dx, and the distance between the origin and support point 2 is Dy; when the deformation distance of the first piezoelectric drive block is dx, the Y axis formed by the support point of the support column and the support point of another piezoelectric drive block becomes the rotation axis, so that the reflector fixing plate rotates around the Y axis at an angle of αx=arctan(dx / Dx); Fig.18 As shown: Similarly, when the deformation distance of another piezoelectric drive block is dy, the X-axis formed by the support point of the support column and the support point of the first piezoelectric drive block becomes the rotation axis, so that the reflector fixing plate rotates around the X-axis at an angle of αy=arctan(dy / Dy);

[0092] Through the combination of movements in two directions, the reflector fixing plate can be deflected at any angle, thereby driving the reflector thereon to rotate at any desired angle.

[0093] After the light path passes through the reflector adjustment structure, it is reflected through the lens and divided into a main beam and a detection beam; the main beam continues to propagate along the original light path, and the detection beam is reflected into the detection camera.

[0094] This embodiment also discloses an adjustment method of an optical path adjustment system applied to optical storage, comprising the following steps:

[0095] S1: Obtaining a deviation between the first detection light and the first standard point; obtaining a deformation distance of the piezoelectric drive block in the first reflector adjustment structure according to a relationship between the deviation between the first detection light and the first standard point and a deformation displacement of the piezoelectric drive block in the first reflector adjustment structure;

[0096] Specifically, the relationship between the deviation between the first detection light and the first standard point and the deformation displacement of the piezoelectric drive block in the first reflector adjustment structure in this embodiment is:

[0097] ΔX=[2(A+B+C)dx·Dx] / [(Dx)2-(dx)2]

[0098] ΔY=[2(A+B+C)dy·Dy] / [(Dy)2-(dy)2]

[0099] Wherein: ΔX represents the deviation between the first detection light and the first standard point in the x-axis direction; ΔY represents the deviation between the first detection light and the first standard point in the y-axis direction; A represents the distance between the first reflector adjustment structure and the second reflector adjustment structure; B represents the distance between the second reflector adjustment structure and the first reflective mirror; C represents the distance between the first reflective mirror and the first detection camera; dx represents the deformation distance of the first reflector adjustment structure in the x-direction, and dy represents the deformation distance of the first reflector adjustment structure in the y-direction; Dx represents the distance between the support point 1 in the first reflector adjustment structure and the origin in the x-direction; Dy represents the distance between the support point 2 in the first reflector adjustment structure and the origin in the y-direction;

[0100] S2: adjusting the first reflector adjustment structure according to the deformation distance of the piezoelectric drive block in the first reflector adjustment structure;

[0101] S3: Obtaining a deviation between the second detection light and the second standard point; obtaining a deformation distance of the piezoelectric drive block in the second reflector adjustment structure according to a relationship between the deviation between the second detection light and the second standard point and a deformation displacement of the piezoelectric drive block in the second reflector adjustment structure;

[0102] Specifically, the formula used in this embodiment to obtain the deformation distance of the piezoelectric drive block in the second reflector adjustment structure is as follows:

[0103] ΔX'=[2(B+E+D)dx'·Dx'] / [(Dx')2-(dx')2]

[0104] ΔY'=[2(B+E+D)dy'·Dy'] / [(Dy')2-(dy')2]

[0105] Wherein: ΔX' represents the deviation between the second detection light and the second standard point in the x-axis direction; ΔY' represents the deviation between the second detection light and the second standard point in the y-axis direction; B represents the distance between the second reflector adjustment structure and the first reflective mirror; E represents the distance between the second reflective mirror and the second detection camera; D represents the distance between the first reflective mirror and the second reflective mirror; dx' represents the deformation distance of the second reflector adjustment structure in the x-direction, dy' represents the deformation distance of the second reflector adjustment structure in the y-direction; Dx' represents the distance between the support point 1 in the second reflector adjustment structure and the origin in the x-direction; Dy represents the distance between the support point 2 in the second reflector adjustment structure and the origin in the y-direction;

[0106] S4: adjusting the second reflector adjustment structure according to the deformation distance of the piezoelectric drive block in the second reflector adjustment structure;

[0107] S5: Repeat S1 to re-acquire the deformation distance of the piezoelectric driving block in the first reflector adjustment structure. When the re-acquired deformation distance of the piezoelectric driving block in the first reflector adjustment structure is less than a set deviation threshold, the optical path adjustment is completed.

[0108] When the deformation distance of the piezoelectric drive block in the first reflector adjustment structure is not less than the set deviation threshold, execute S2-S3 to re-acquire the deformation distance of the piezoelectric drive block in the second reflector adjustment structure; execute S6;

[0109] S6: when the deformation distance of the piezoelectric drive block in the second reflector adjustment structure that is retrieved is less than the set deviation threshold, the optical path adjustment is completed;

[0110] When the deformation distance of the piezoelectric driving block in the re-acquired second reflector adjustment structure is not less than the set deviation threshold, S5 is repeatedly executed until the optical path adjustment is completed.

[0111] Specifically, in this embodiment, the optical path reference position is set in the detection camera, and the coordinates of the standard point position are set to the coordinates (0, 0) of the two-dimensional coordinate system. The light beam is irradiated into the detection camera, and the deviation from the standard point is (ΔX, ΔY); and through the deformation of the piezoelectric drive block, the angle of the reflector adjustment structure is changed, so that (ΔX, ΔY) is infinitely connected to the reference coordinate (0, 0), which is the position where the light beam passes through a standard point in the optical path; when the light beam passes through two standard points at the same time, it is considered that the light beam is a standard light beam that meets the optical path design benchmark. The figure below shows the state when the light spot is located at the center of the reference, (ΔX, ΔY) are both 0, such as Fig.24 As shown; Fig.25 This is a schematic diagram showing the state of the light spot offset and the coordinate deviation (ΔX, ΔY).

[0112] Specifically, the relationship between the optical path deviation obtained by the detection camera and the deformation displacement of the piezoelectric drive block in the reflector adjustment structure is as follows:

[0113] For example, the distance from the first reflector adjustment structure 3 to the second reflector adjustment structure 4 is A, the distance from the second reflector adjustment structure 4 to the first reflective mirror 5 is B, the distance from the first reflective mirror 5 to the first detection camera 9 is C, the distance from the first reflective mirror 5 to the second reflective mirror 6 is D, and the distance from the second reflective mirror 6 to the second detection camera 10 is E. Fig. 27 As shown:

[0114] The deviation between the light beam of the first detection camera 9 and the first standard point is (ΔX, ΔY), and the deviation between the light beam of the second detection camera 10 and the second standard point is (ΔX', ΔY'). Then, the deviation angles of the light beam from the first reflector adjustment structure 3 to the first detection camera 9 in the X and Y directions are:

[0115] βx=arctan(ΔX / (A+B+C))

[0116] βy=arctan(ΔY / (A+B+C))

[0117] The deviation angles of the light beam from the second reflector adjustment structure 4 to the second detection camera 10 in the X and Y directions are:

[0118] βx'=arctan(ΔX' / (B+E+D))

[0119] βy'=arctan(ΔY' / (B+E+D))

[0120] Assume that the deflection XY direction of the reflector adjustment structure corresponds to the XY direction of the standard point deviation set in the detection camera, and the reflector rotation angle of the first reflector adjustment structure 3 is:

[0121] αx=arctan(dx / Dx)

[0122] αy=arctan(dy / Dy)

[0123] The reflector rotation angle of the second reflector adjustment structure (4) is:

[0124] αx'=arctan(dx' / Dx')

[0125] αy'=arctan(dy' / Dy')

[0126] According to the reflection angle principle of the reflector,

[0127] 2αx=βx,2αy=βy

[0128] 2αx'=βx',2αy'=βy'

[0129] It can be concluded that:

[0130] 2arctan(dx / Dx)=arctan(ΔX / (A+B+C)), 2arctan(dy / Dy)=arctan(ΔY / (A+B+C))

[0131] 2arctan(dx' / Dx')=arctan(ΔX' / (B+E+D)), 2arctan(dy' / Dy')=arctan(ΔY' / (B+E+D))

[0132] Therefore, the relationship between the optical path deviation obtained by the first detection camera 9 and the deformation displacement of the piezoelectric drive block in the first reflector adjustment structure 3 can be obtained:

[0133] ΔX=[2(A+B+C)dx·Dx] / [(Dx)2-(dx)2]

[0134] ΔY=[2(A+B+C)dy·Dy] / [(Dy)2-(dy)2]

[0135] Similarly, the relationship between the optical path deviation obtained by the second detection camera 10 and the deformation displacement of the piezoelectric drive block in the second reflector adjustment structure 4 can be obtained:

[0136] ΔX'=[2(B+E+D)dx'·Dx'] / [(Dx')2-(dx')2]

[0137] ΔY'=[2(B+E+D)dy'·Dy'] / [(Dy')2-(dy')2]

[0138] It can be seen from the above relationship that the correspondence between the optical path deviation and the deformation action distance of the piezoelectric drive block is a very simple mathematical model, which can achieve fast real-time response of the adjustment structure without the need for high-computing power hardware.

[0139] Since it is the same optical path system, when the optical path is adjusted to the standard point position of the detection camera through one of the reflector adjustment structures, a certain deviation will occur for the standard point of another detection camera. At this time, it is necessary to adjust the corresponding other reflector adjustment structure to adjust the optical path to the standard point of the second detection camera; then adjust the first reflector to correct the error generated in the first optical path. In this way, the adjustments are continuously made alternately, and finally the optical path reaches the standard point position of the two detection cameras, and the adjustment is completed.

[0140] In the system, the controller connects the first detection camera 9, the second detection camera 10 and the first reflector adjustment structure 3 and the second reflector adjustment structure 4, and its main functions are as follows:

[0141] Receive data from the detection camera; process the data and determine whether adjustment is required; and send adjustment instructions to the reflector adjustment structure.

[0142] The entire optical adjustment system requires that the position deviation between the two detection cameras and the standard point reach the standard value at the same time, that is, the adjustment is considered complete, so the deviation data returned by the two detection cameras needs to be compared simultaneously in the controller. In this embodiment, a counter is designed in the controller, and the counter is initially set to assign a value of n=0. Whenever a deviation data is judged to reach the standard, n=n+1 is set, and the deviation judgment of the next detection camera is continued; if the standard is not reached, the adjustment is continued, and n=0 is assigned again; when the deviation judgments of the two detection cameras reach the standard at the same time, the counter undergoes two assignments of n=n+1, so that n=2, and the controller determines that the adjustments at both locations have been completed, and the adjustment is completed.

[0143] The standard deviation in the two detection cameras is set to (ΔX0, ΔY0) and (ΔX0', ΔY0'), and the deviation reaches the standard:

[0144] ΔX≤ΔX0,ΔY≤ΔY0

[0145] ΔX'≤ΔX0', ΔY'≤ΔY0'

[0146] The setting of the standard deviation must first meet the accuracy requirements of the optical path. At the same time, the minimum deviation that can be adjusted must be derived from the minimum displacement of the piezoelectric drive block based on the conversion relationship between the optical path deviation and the displacement of the piezoelectric drive block of the adjustment structure.

[0147] The logic flow chart of the controller adjusting the optical path is as follows: Fig.26 shown.

[0148] This embodiment adopts a two-point adjustment method to perform optical path calibration; at the same time, a micro piezoelectric drive block is used as the motion structure for adjustment, thereby achieving miniaturization of the adjustment structure and precision of the adjustment.

[0149] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. An optical path adjustment system for optical storage, characterized in that: include: Laser light source (1), collimation and shaping system (2), a first reflector adjustment structure based on piezoelectric material (3), a second reflector adjustment structure based on piezoelectric material (4), a first reflective transmission mirror (5), a second reflective transmission mirror (6), an objective lens (7), a recording material (8), a first detection camera (9), a second detection camera (10), and a controller; The collimation and shaping system (2) is arranged in the light emission direction of the laser light source (1) to shape the light emitted by the laser light source (1) into a parallel light beam; The first reflector adjustment structure (3) is arranged on the optical path of the parallel light beam to perform a first adjustment on the parallel light beam; the second reflector adjustment structure (4) is arranged on the optical path of the parallel light beam after the first adjustment to perform a second adjustment on the parallel light beam; The parallel light beam adjusted for the second time passes through the first reflection and transmission mirror (5) and the second reflection and transmission mirror (6) in sequence, and then passes through the objective lens (7) to converge onto the recording material (8); The first reflection and transmission mirror (5) is used to obtain the first detection light of the parallel light beam adjusted for the second time and transmit it to the first detection camera (9); the second reflection and transmission mirror (6) is used to obtain the second detection light of the parallel light beam adjusted for the second time and transmit it to the second detection camera (10); The input end of the controller is respectively connected to the signals of the first detection camera (9) and the second detection camera (10) to respectively obtain the deviation between the first detection light and the first standard point and the deviation between the second detection light and the second standard point; The output end of the controller is respectively connected to the first reflector adjustment structure (3) and the second reflector adjustment structure (4) by signals, so as to adjust the first reflector adjustment structure (3) and the second reflector adjustment structure (4) alternately and repeatedly according to the deviation between the first detection light and the first standard point and the deviation between the second detection light and the second standard point, so that the parallel light beam can pass through the first standard point (92) and the second standard point (102) in sequence after adjustment, and then pass through the objective lens (7) to converge onto the recording material (8).

2. The optical path adjustment system for optical storage according to claim 1, characterized in that: The first reflector adjustment structure (3) comprises an adjustment base (31), a support column (312), two groups of piezoelectric drive structures (32), an adjustment spring (33), a reflector fixing plate (34) and a reflector (35); A sliding spring buckle (311) is fixedly arranged at the center position of the top of the adjustment base (31); The support column (312) and the two groups of piezoelectric drive structures (32) are fixedly arranged on the top of the adjustment base (31); and the top of the piezoelectric drive structure (32) and the top of the support column (312) are both in contact with the bottom of the reflector fixing plate (34), so that when the piezoelectric drive structure (32) is deformed, the reflector fixing plate (34) can rotate around an axis formed by the top of the support column (312) and the top of another piezoelectric drive structure; The adjustment spring (33) is fixed by the sliding spring buckle (311) and the support column (312), and is fixedly connected to the reflector fixing plate (34); The reflector (35) is fixedly arranged on the top of the reflector fixing plate (34), and the reflector (35) is arranged on the optical path of the parallel light beam to perform a first adjustment on the parallel light beam.

3. The optical path adjustment system for optical storage according to claim 1, characterized in that: The first reflector adjustment structure (3) and the second reflector adjustment structure (4) have the same structure.

4. The optical path adjustment system for optical storage according to claim 2, characterized in that: The top of the support column (312) and the top of the piezoelectric drive structure (32) are both spherical structures.

5. The optical path adjustment system for optical storage according to claim 2, characterized in that: The adjustment spring (33) comprises a fixing structure (331) and two tensioning structures (332); Two ends of the fixing structure (331) are fixedly connected to the sliding spring buckle (311) and the supporting column (312) respectively; One end of the tensioning structure (332) is fixedly connected to the fixing structure (331) at one side where the fixing structure (331) is connected to the support column (312); The other ends of the two tensioning structures (332) are respectively connected to the two sides of the reflector fixing plate (34), so that when the piezoelectric drive structure (32) is deformed, the reflector fixing plate (34) can rotate around the axis formed by the top of the support column (312) and the top of the other piezoelectric drive structure.

6. The optical path adjustment system for optical storage according to claim 2, characterized in that: The piezoelectric driving structure (32) comprises a piezoelectric driving block (321) and a supporting top block (322); The top of the piezoelectric drive block (321) is fixedly connected to the bottom of the supporting top block (322); The bottom of the piezoelectric driving block (321) is fixedly arranged on the top of the adjustment base (31); The bottom of the reflector fixing plate (34) abuts against the top of the supporting top block (322); the top of the supporting top block (322) is a spherical structure.

7. The optical path adjustment system for optical storage according to claim 2, characterized in that: The piezoelectric driving structure (32) comprises a piezoelectric driving strip (325) and a second supporting top block (326); A piezoelectric drive strip fixing plate (327) is fixedly arranged on the top of the adjustment base (31); one end of the piezoelectric drive strip is fixedly arranged on the top of the piezoelectric drive strip fixing plate (327), and the top of the other end is fixedly connected to the bottom of the second support top block (326); the top of the second support top block (326) is in contact with the bottom of the reflector fixing plate (34), and the top of the second support top block (326) is a spherical structure.

8. The optical path adjustment system for optical storage according to claim 4, characterized in that: The bottom of the reflector fixing plate (34) is provided with a first spherical groove (315) corresponding to the top of the support column (312) and a second spherical groove (323) corresponding to the top of the piezoelectric drive structure (32).

9. The adjustment method of the optical path adjustment system for optical storage according to any one of claims 1 to 8, characterized in that: The steps include: S1: Obtaining a deviation between the first detection light and the first standard point; obtaining a deformation distance of the piezoelectric drive block in the first reflector adjustment structure according to a relationship between the deviation between the first detection light and the first standard point and a deformation displacement of the piezoelectric drive block in the first reflector adjustment structure; S2: adjusting the first reflector adjustment structure according to the deformation distance of the piezoelectric drive block in the first reflector adjustment structure; S3: Obtaining a deviation between the second detection light and the second standard point; Obtaining the deformation distance of the piezoelectric drive block in the second reflector adjustment structure according to the relationship between the deviation between the second detection light and the second standard point and the deformation displacement of the piezoelectric drive block in the second reflector adjustment structure; S4: adjusting the second reflector adjustment structure according to the deformation distance of the piezoelectric drive block in the second reflector adjustment structure; S5: Repeat S1 to re-acquire the deformation distance of the piezoelectric driving block in the first reflector adjustment structure. When the re-acquired deformation distance of the piezoelectric driving block in the first reflector adjustment structure is less than a set deviation threshold, the optical path adjustment is completed. When the deformation distance of the piezoelectric drive block in the first reflector adjustment structure is not less than the set deviation threshold, execute S2-S3 to re-acquire the deformation distance of the piezoelectric drive block in the second reflector adjustment structure; execute S6; S6: when the deformation distance of the piezoelectric drive block in the second reflector adjustment structure that is retrieved is less than the set deviation threshold, the optical path adjustment is completed; When the deformation distance of the piezoelectric driving block in the re-acquired second reflector adjustment structure is not less than the set deviation threshold, S5 is repeatedly executed until the optical path adjustment is completed.

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