Dual-wavelength optical frequency domain reflection device and method for Doppler frequency shift suppression
CN119845173AActive Publication Date: 2025-04-18BEIJING INST OF TECH
Patent Information
- Application Number
- CN202510003001.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-02
- Publication Date
- 2025-04-18
- Estimated Expiration
- 2045-01-02
Smart Images

Figure CN119845173A_ABST
Abstract
The invention belongs to the technical field of optical fiber sensing, and particularly relates to a Doppler frequency shift suppression dual-wavelength optical frequency domain reflection device and method, and the device comprises a frequency sweeping laser emission unit, a light splitting interference unit, a to-be-measured optical fiber and a data acquisition and processing unit which are connected. The sweep frequency laser emission unit is used for emitting upper sweep frequency laser and lower sweep frequency laser with different initial wavelengths; the light splitting interference unit is used for splitting a combined light path of the upper sweep-frequency laser and the lower sweep-frequency laser into a detection path and a local oscillation path, a to-be-detected optical fiber is arranged on the detection path, the sweep-frequency laser is injected into the to-be-detected optical fiber, and a generated backward scattered light or reflected light signal enters the detection path to form a detection path echo signal; the output end of the light splitting interference unit is connected with the data acquisition and processing unit, and the light splitting interference unit is used for performing interference processing on the echo signal of the detection path and the optical signal of the local oscillation path, combining and outputting to the data acquisition and processing unit for analysis and processing; the invention also provides a Doppler frequency shift suppressed dual-wavelength optical frequency domain reflection method using the device.
Need to check novelty before this filing date? Find Prior Art
Citation Information
Patent Citations
Full-analog microwave detector with multi-distance selection and ultra-low power
CN104656092A
High-precision double-frequency optical frequency domain reflectometer with large strain measurement range
CN115235367A
Wide-range quasi-distributed optical fiber sensing method and system
CN117451203A
Optical frequency domain reflection measurement method and device for dual-detection differential phase noise suppression
CN118443066A
Lidar receiving apparatus and detection method, and lidar
WO2024230560A1
Cited By
Analysis method, measurement method and device for frequency domain distortion caused by environmental disturbance
CN121384105A
Method for analyzing frequency domain distortion caused by environmental disturbance, measurement method and device
CN121384105B
Optical frequency domain reflectometer with environmental disturbance resistance and large strain measurement capability
CN121384106A
An optical frequency domain reflectometer with environmental disturbance resistance and large strain measurement capability
CN121384106B
Phase-frequency noise suppression optical frequency domain reflection measurement method and system without auxiliary interferometer
CN121384108A