一种引脚缺陷检测方法、电子设备和存储介质
By acquiring height and texture maps of components in automated optical inspection, determining pin profiles, and using preset thresholds for defect detection, the problem of complexity and poor versatility in existing technologies is solved, achieving efficient and accurate defect detection for different components.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- GUANGZHOU LEICHEN INTELLIGENT EQUIP TECH CO LTD
- Filing Date
- 2024-04-30
- Publication Date
- 2026-07-17
AI Technical Summary
Existing automated optical inspection technologies are complex to program, have poor versatility, and suffer from false positives and false negatives when facing the inspection needs of various components. In particular, they are difficult to adapt to the differences in installation details of different types and models of components when dealing with defects such as pin floating and collapse.
By acquiring the height map and texture map of the component under test, the pin outline is determined, and defect detection is performed based on the position and height value of the reference point and the preset threshold. This adapts to changes in component type and differences in installation details, improving the versatility of the test.
This technology enables the testing of different components without reprogramming, improving the versatility and accuracy of testing and reducing false positives and false negatives.
Smart Images
Figure CN119845949B_ABST