Chip performance detection device

Abstract

This invention relates to the field of chip testing technology and discloses a chip performance testing device, comprising: a housing, wherein a conveying device, a testing mechanism, and a transfer mechanism are disposed within the housing; wherein the transfer mechanism includes a grooved wheel, a dial, and a drive motor, a first shaft is fixedly connected to the bottom of the dial, the bottom of the first shaft is connected to the bottom of the housing via a bearing, a driven pulley is fixedly connected to the first shaft, a driving pulley is disposed at the output end of the drive motor, the driving pulley and the driven pulley are connected by a belt drive, and a second shaft is fixedly connected to the center of the grooved wheel. This invention is designed with four working positions, including a clamping working position, a front detection working position, a back detection working position, and a release working position. The transfer mechanism drives the gripper to each working position through intermittent rotation and realizes pause operation, which facilitates accurate testing. The multi-station design enables the device to efficiently complete the testing of the front and back sides of the chip within the same testing cycle, significantly shortening the testing time.

Description

Technical Field

[0001] This invention belongs to the field of chip testing technology, specifically a chip performance testing device. Background Technology

[0002] In the large-scale research and development and production of semiconductor chips, pin morphology inspection is one of the key steps to ensure chip performance and quality. The quality of pin morphology directly affects the reliability of the chip's electrical connections, especially in applications such as high-frequency signal transmission, complex packaging, and multi-layer circuit board assembly, where its performance is particularly important. Defects in pin morphology can lead to problems such as poor electrical contact, signal attenuation, or short circuits, and in severe cases, can cause the entire device to malfunction.

[0003] Currently, pin morphology inspection mainly includes parameters such as pin height, spacing, flatness, curvature, and integrity. However, some inspections require inspection of both the front and back of the chip and continuous inspection of batches of chips. To address this, a chip performance testing device has been proposed. Summary of the Invention

[0004] To address the problems mentioned in the background art, the present invention provides the following technical solution: a chip performance testing device, comprising: a housing, wherein a conveying device, a testing mechanism, and a transfer mechanism are disposed within the housing;

[0005] The transfer mechanism includes a grooved wheel, a dial, and a drive motor. A first shaft is fixedly connected to the bottom of the dial, and the bottom of the first shaft is connected to the bottom of the housing via a bearing. A driven pulley is fixedly connected to the first shaft. A drive pulley is provided at the output end of the drive motor. The drive pulley and the driven pulley are connected by a belt drive. A second shaft is fixedly connected to the center of the grooved wheel, and the bottom of the second shaft is connected to the bottom of the housing via a bearing. A star-shaped connector is fixedly connected to the top of the second shaft. The star-shaped connector has four branches, and the vertical center lines of the four branches correspond one-to-one with the grooves of the grooved wheel. A clamping mechanism is rotatably connected to the distal ends of the four branches. The transfer mechanism can drive the clamping mechanism to pause intermittently at four working positions in sequence. The four working positions include a front detection working position and a back detection working position.

[0006] The clamping mechanism includes a rotating rod, one end of which is rotatably connected to a branch. A flipping gear is fixedly connected to the rotating rod circumferentially. A bracket is provided on the inner wall of the box, and an arc-shaped rack is provided on the top of the bracket. The flipping gear and the arc-shaped rack are meshed and connected. The arc-shaped rack coincides with the vertical center line of the back detection work position. When the flipping gear moves to the center line of the arc-shaped rack, it can just cause the clamping mechanism to flip 180 degrees.

[0007] The testing mechanism includes a first imaging probe and a second imaging probe, which are located above the front testing station and the back testing station.

[0008] Furthermore, the working position also includes a clamping working position and a releasing working position, and the conveying device includes a first transmission belt and a second transmission belt, which are respectively matched with the clamping working position and the releasing working position.

[0009] Furthermore, the clamping mechanism has a groove at one end, and connecting tubes are respectively provided on both sides of the groove. The connecting tubes have a rectangular cross-section and a through-hole. Claws are provided on both sides of the two connecting tubes, and each of the two claws is provided with a sliding rod. The cross-section of the sliding rod is the same as the cross-section of the inner cavity of the connecting tube. The sliding rod is slidably connected to the inner cavity of the connecting tube. A connecting rod is provided between the two sliding rods. The two ends of the connecting rod are threaded and can be threadedly connected to the two sliding rods. The thread directions at the two ends of the connecting rod are opposite. An adjusting wheel is sleeved in the middle of the connecting rod. The adjusting wheel can make frictional contact with the surfaces of the first transmission belt and the second transmission belt.

[0010] Furthermore, both the first and second transmission belts are equipped with transmission belts, and the side wall of the adjusting wheel is provided with anti-slip ribs. The transmission belt can drive the adjusting wheel to rotate through the anti-slip ribs.

[0011] Furthermore, the gripper is provided with a ramp.

[0012] Furthermore, there are two ramps, and a protective pad made of silicone is provided between the two ramps.

[0013] Furthermore, both the first and second transmission belts are at the same horizontal height, and the bottom of the gripper is 0.5-1mm higher than the surface of the first transmission belt.

[0014] Compared with the prior art, the beneficial effects of the present invention are:

[0015] 1. The device is designed with four working positions, including a clamping working position, a front detection working position, a back detection working position, and a release working position. The transfer mechanism drives the gripper to each working position through intermittent rotation and realizes the pause operation, which facilitates accurate detection. The multi-station design enables the device to efficiently complete the detection of the front and back of the chip in the same detection cycle, which greatly shortens the detection time.

[0016] 2. Through the meshing design of the flip gear and the arc rack, the chip can be accurately flipped 180°. When the flip gear moves to the center line of the arc rack, it can complete the accurate flipping operation, so that the pins on the reverse side of the chip are facing up, which is convenient for the second imaging probe to complete the reverse detection. In addition, when leaving the reverse detection working position, the flip gear and the arc rack mesh again, so that the chip is flipped to the front-facing state, ensuring that the chip enters the release working position in the correct direction.

[0017] 3. By adjusting the friction transmission between the wheel and the transmission belt, and in conjunction with the threaded slide bar and connecting rod, the synchronous movement of the gripper during the gripping and releasing process is achieved. The threaded design allows the slide bar to quickly and smoothly approach or move away, ensuring that the chip is held stably and efficiently. During the release process, the gripper moves away synchronously, allowing the chip to be accurately released onto the conveyor belt without any extra operations. Attached Figure Description

[0018] The accompanying drawings are provided to further illustrate the invention and form part of the specification. They are used in conjunction with embodiments of the invention to explain the invention and do not constitute a limitation thereof. In the drawings:

[0019] Figure 1 This is a front view of the overall structure of the present invention;

[0020] Figure 2 This is a top view of the grooved wheel and dial portion of the present invention.

[0021] Figure 3 This is a top view of the clamping mechanism of the present invention.

[0022] Figure 4 This is a top-view cross-sectional structural diagram of the clamping mechanism portion of the present invention;

[0023] Figure 5 This is a side view of the clamping mechanism of the present invention.

[0024] In the diagram: 1. Housing; 2. Transfer mechanism; 201. Grooved wheel; 202. Dial; 203. First shaft; 204. Driven pulley; 205. Drive motor; 206. Drive pulley; 207. Belt; 208. Second shaft; 209. Star connector; 3. Clamping mechanism; 301. Rotating rod; 302. Reversing gear; 303. Gripper; 304. Connecting pipe; 305. Slide rod; 306. Connecting rod; 307. Adjusting wheel; 308. Ramp; 309. Protective pad; 4. Bracket; 5. Arc rack; 6. First imaging probe; 7. Second imaging probe; 8. First transmission belt; 9. Second transmission belt. Detailed Implementation

[0025] The technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments of the present invention. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without creative effort are within the scope of protection of the present invention.

[0026] Depend on Figure 1-5 The present invention provides a chip performance testing device, comprising:

[0027] Box 1, which contains a conveying device, a detection mechanism, and a transfer mechanism 2;

[0028] The transfer mechanism 2 includes a grooved wheel 201, a dial 202, and a drive motor 205. A first shaft 203 is fixedly connected to the bottom of the dial 202, and the bottom of the first shaft 203 is connected to the bottom of the housing 1 via a bearing. A driven pulley 204 is fixedly connected to the first shaft 203. A drive pulley 206 is provided at the output end of the drive motor 205. The drive pulley 206 and the driven pulley 204 are connected by a belt 207. A second shaft 208 is fixedly connected to the center of the grooved wheel 201, and the bottom of the second shaft 208 is connected to the bottom of the housing 1 via a bearing. During operation, the drive motor 205 transmits power through the belt 207. The belt 207 transmits the action to the dial 202. The dial 202 rotates into and out of the groove of the groove wheel 201 via the lever, thereby driving the groove wheel 201 to rotate intermittently. The top of the second shaft 208 is fixedly connected to a star-shaped connector 209. The star-shaped connector 209 has four branches. The vertical center lines of the four branches correspond one-to-one with the grooves of the groove wheel 201. The far ends of the four branches are rotatably connected to a clamping mechanism 3. The transfer mechanism 2 can drive the clamping mechanism 3 to pause intermittently in sequence at four working positions. The four working positions include a front detection working position and a back detection working position.

[0029] The clamping mechanism 3 includes a rotating rod 301, one end of which is rotatably connected to a branch. A flipping gear 302 is fixedly connected to the rotating rod 301 circumferentially. A bracket 4 is provided on the inner wall of the housing 1. An arc-shaped rack 5 is provided on the top of the bracket 4. The flipping gear 302 and the arc-shaped rack 5 are meshed and connected. The arc-shaped rack 5 coincides with the vertical center line of the back detection work position. When the flipping gear 302 moves to the center line of the arc-shaped rack 5, the clamping mechanism 3 can be flipped 180 degrees.

[0030] The testing mechanism includes a first imaging probe 6 and a second imaging probe 7, which are located above the front testing station and the back testing station.

[0031] The working position also includes a clamping working position and a releasing working position. The conveying device includes a first transmission belt 8 and a second transmission belt 9, which are respectively matched with the clamping working position and the releasing working position.

[0032] The clamping mechanism 3 has a groove at one end, and connecting tubes 304 are respectively provided on both sides of the groove. The connecting tubes 304 have a rectangular cross-section and a through-hole. The two connecting tubes 304 are respectively provided with jaws 303 on both sides. Each jaw 303 is provided with a sliding rod 305. The cross-section of the sliding rod 305 is the same as the cross-section of the inner cavity of the connecting tube 304. The sliding rod 305 can be slidably connected to the inner cavity of the connecting tube 304. A connecting rod 306 is provided between the two sliding rods 305. The two ends of the connecting rod 306 are respectively threaded and can be threadedly connected to the two sliding rods 305. The threads at the two ends of the connecting rod 306 are opposite in direction. An adjusting wheel 307 is sleeved in the middle of the connecting rod 306. The adjusting wheel 307 can make frictional contact with the surfaces of the first transmission belt 8 and the second transmission belt 9.

[0033] Both the first transmission belt 8 and the second transmission belt 9 are equipped with transmission belts, and the side wall of the adjusting wheel 307 is provided with anti-slip ribs. The transmission belt can drive the adjusting wheel 307 to rotate through the anti-slip ribs.

[0034] The jaws 303 are provided with ramps 308, which help to clamp the chip along the two edges of the chip, and the ramps 308 extend outward to help keep the chip stable between the two jaws 303.

[0035] There are two ramps 308, and a protective pad 309 is provided between the two ramps 308. The protective pad 309 is made of silicone material.

[0036] The first transmission belt 8 and the second transmission belt 9 are both at the same horizontal height. The bottom of the gripper 303 is 0.5-1mm higher than the surface of the first transmission belt 8. When the gripper 303 just rotates into the clamping and releasing positions, the adjusting wheel 307 can make contact with the transmission belt. By starting the first transmission belt 8 and the second transmission belt 9, the surface of the transmission belt rubs against the anti-slip ridge, which drives the adjusting wheel 307 to rotate.

[0037] In one detection cycle, the chip is first fed into the gripper 303 in the clamping position via the first transmission belt 8. The friction adjustment wheel 307 of the first transmission belt 8 is activated to rotate, causing the threaded transmission slide rods 305 of the connecting rod 306 to move closer together, driving the gripper 303 to clamp the chip from both sides. Then, the drive motor 205 drives the dial 202 to rotate the grooved wheel 201, causing the gripper 303 to move the chip to the front detection position and pause intermittently. The front of the chip is detected by the first imaging probe 6. The drive motor 205 then continues to rotate, and the gripper 303 clamps the chip into the reverse detection position. During the movement... During the process, the flip gear 302 meshes with the arc-shaped rack 5. When the flip gear 302 moves to the center line of the arc-shaped rack 5, the gripper 303 can rotate the chip 180 degrees, so that the pins on the reverse side of the chip are facing upwards. The chip is then detected by the second imaging probe 7. The gripper 303 holds the chip away from the reverse detection position. The flip gear 302 meshes with the arc-shaped rack 5 and rotates it 180 degrees again, so that the chip faces upwards and enters the release position. The second transmission belt 9 is activated, and its transmission direction is opposite to that of the first transmission belt 8. This allows the two grippers 303 to move away from each other, releasing the chip onto the surface of the second transmission belt 9 and sending it away.

[0038] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0039] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A chip performance detection device, characterized by, include: The box (1) is equipped with a conveying device, a detection mechanism, and a transfer mechanism (2). The transfer mechanism (2) includes a grooved wheel (201), a dial (202), and a drive motor (205). A first shaft (203) is fixedly connected to the bottom of the dial (202). The bottom of the first shaft (203) is connected to the bottom of the housing (1) via a bearing. A driven pulley (204) is fixedly connected to the first shaft (203). A drive pulley (206) is provided at the output end of the drive motor (205). The drive pulley (206) and the driven pulley (204) are connected by a belt (207). A second shaft is fixedly connected to the center of the grooved wheel (201). (208), the bottom of the second shaft (208) is connected to the bottom of the housing (1) by a bearing, and a star-shaped connector (209) is fixed to the top of the second shaft (208). The star-shaped connector (209) has four branches, and the vertical center lines of the four branches correspond one-to-one with the grooves of the groove wheel (201). The far ends of the four branches are rotatably connected to a clamping mechanism (3). The transfer mechanism (2) can drive the clamping mechanism (3) to pause intermittently at four working positions in sequence. The four working positions include a front detection working position and a back detection working position. The clamping mechanism (3) includes a rotating rod (301), one end of which is rotatably connected to a branch. A rotating gear (302) is fixedly connected to the rotating rod (301) circumferentially. A bracket (4) is provided on the inner wall of the housing (1). An arc-shaped rack (5) is provided on the top of the bracket (4). The rotating gear (302) and the arc-shaped rack (5) are meshed and connected. The arc-shaped rack (5) coincides with the vertical center line of the back detection work position. When the rotating gear (302) moves to the center line of the arc-shaped rack (5), the clamping mechanism (3) can be rotated 180 degrees. The testing mechanism includes a first imaging probe (6) and a second imaging probe (7), which are located above the front testing station and the back testing station.

2. The chip performance detection device of claim 1, wherein: The working position also includes a clamping working position and a releasing working position. The conveying device includes a first transmission belt (8) and a second transmission belt (9), which are respectively matched with the clamping working position and the releasing working position.

3. The chip performance detection device of claim 2, wherein: The clamping mechanism (3) has a groove at one end, and connecting tubes (304) are respectively provided on both sides of the groove. The connecting tubes (304) have a rectangular cross-section and a through cavity. The two connecting tubes (304) are respectively provided with jaws (303) on both sides. Each of the two jaws (303) is provided with a slide rod (305). The cross-section of the slide rod (305) is the same as the cross-section of the cavity of the connecting tube (304). The slide rod (305) can slide and connect to the cavity of the connecting tube (304). A connecting rod (306) is provided between the two slide rods (305). The two ends of the connecting rod (306) are respectively threaded and can be threadedly connected to the two slide rods (305). The thread directions of the two ends of the connecting rod (306) are opposite. An adjusting wheel (307) is sleeved in the middle of the connecting rod (306). The adjusting wheel (307) can have frictional contact with the surfaces of the first transmission belt (8) and the second transmission belt (9).

4. The chip performance detection device of claim 3, wherein: Both the first transmission belt (8) and the second transmission belt (9) are equipped with transmission belts. The side wall of the adjusting wheel (307) is provided with anti-slip ribs. The transmission belt can drive the adjusting wheel (307) to rotate through the anti-slip ribs.

5. The chip performance detection device of claim 4, wherein: The gripper (303) is provided with a ramp (308).

6. The chip performance detection device of claim 5, wherein: There are two ramps (308), and a protective pad (309) is provided between the two ramps (308). The protective pad (309) is made of silicone material.

7. The chip performance detection device of claim 6, wherein: The first transmission belt (8) and the second transmission belt (9) are at the same horizontal height, and the bottom of the gripper (303) is 0.5-1mm higher than the surface of the first transmission belt (8).

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