Thermal infrared sensor calibration method and device, electronic equipment and storage medium
CN119915388AActive Publication Date: 2025-05-02BEIJING RES CENT FOR INFORMATION TECH & AGRI
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Patent Information
- Application Number
- CN202411853088.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-16
- Publication Date
- 2025-05-02
- Estimated Expiration
- 2044-12-16
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Figure CN119915388A_ABST
Abstract
The invention provides a thermal infrared sensor calibration method and device, electronic equipment and a storage medium, and relates to the technical field of sensor calibration, and the method comprises the steps: inputting an original image into a segmentation model, obtaining a binary image corresponding to the original image outputted by the segmentation model, the original image is a thermal infrared image of a calibration plate acquired by a thermal infrared sensor to be calibrated, performing image reconstruction on the binarized image to obtain a contrast-enhanced image corresponding to the original image, performing feature enhancement on visual features of angular points of a checkerboard pattern in the contrast-enhanced image to obtain a thermal infrared image of the calibration plate; and obtaining a feature enhancement image corresponding to the original image, identifying the angular points of the checkerboard pattern in the feature enhancement image, and obtaining the internal and external parameter values of the thermal infrared sensor to be calibrated based on the position information of the identified angular points. According to the method, the thermal infrared sensor can be calibrated more accurately and more efficiently, the calibration robustness of the thermal infrared sensor can be improved, and the thermal infrared sensor can be calibrated in a complex scene.
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