An intelligent storage device for a sampling probe

Abstract

An intelligent storage device for a sampling probe, comprising: the intelligent storage device comprises a box body, a storage rack, a discharging assembly and a feeding assembly, the storage rack is fixed in the box body and enables the sampling probes to be stacked and stored, the sampling probes are stacked in at least three layers, the discharging assembly comprises a turnover driving element, a turnover shaft, a supporting plate and a pushing link, the turnover shaft is located directly below the storage rack and is rotationally connected to the box body at both ends, the turnover driving element is fixed to one side of the box body and is connected to the turnover shaft, the supporting plate comprises a first supporting section, a second supporting section and a connecting section, the connecting section is fixed to the turnover shaft, the first supporting section and the second supporting section are fixed to the connecting section, the pushing link is arranged on the second supporting section, the first supporting section supports the first layer of probes, the supporting plate drives the first layer of probes to fall from the bottom of the storage rack to the feeding assembly while the second supporting section supports the second layer of probes to rise, and the pushing link pushes the third layer of probes to rise.

Description

Technical Field

[0001] This invention relates to the field of sampling probe storage bins, and particularly to an intelligent storage device for sampling probes. Background Technology

[0002] In the steel smelting industry, sampling probes are required for steel sampling and testing. Current sampling operations are highly manual, requiring workers to manually hold the sampling rod and insert the probe into the ladle to obtain a sample. The high temperature and hazardous nature of the work environment pose significant safety risks to workers. With the rise of Industry 4.0, robots are replacing manual sampling. By mounting the sampling rod to the robot's robotic arm, robots can perform steel sampling. However, sampling probes are disposable consumables and need to be replaced after each sampling operation. Replacing the sampling probe still relies on manual labor, which is cumbersome and inefficient. Therefore, this invention is proposed. Summary of the Invention

[0003] To address the problems of cumbersome and inefficient manual replacement of sampling probes, this invention provides an intelligent material storage device for sampling probes.

[0004] To solve the above-mentioned technical problems, the present invention provides an intelligent storage device for sampling probes, comprising: the intelligent storage device includes a box, a storage rack, a feeding component and a feeding component, wherein the bottom of the box is provided with an inclined guide plate, the feeding component is located at the bottom of the guide plate, the storage rack is fixed in the box and the sampling probes are stacked and stored therein, the sampling probes are stacked in at least three layers, and from bottom to top are the first layer of probes, the second bottom layer of probes and the third layer of probes;

[0005] The feeding assembly includes a flipping drive, a flipping shaft, a support plate, and a pushing rod. The flipping shaft is located directly below the storage rack and its two ends are rotatably connected to the box body. The flipping drive is fixed to one side of the box body and connected to the flipping shaft. The support plate includes a first support section, a second support section, and a connecting section. The connecting section is fixed to the flipping shaft. The first support section and the second support section are fixed to the connecting section. The pushing rod is disposed on the second support section. The first support section supports the first layer probe. When the support plate rotates, it drives the first layer probe to rotate out from the bottom of the storage rack and fall onto the feeding assembly through the guide plate. At the same time, the second support section supports the second layer probe and rises. The pushing rod pushes the third layer probe and rises.

[0006] In an embodiment of the present invention, the first support section is arc-shaped with the arc opening facing upward, and the second support section is arc-shaped with the arc opening facing downward. The first support section is directly opposite the bottom of the storage rack to support the first layer probe. After the support plate rotates, it drives the second support section to rotate to the bottom of the storage rack and support the second layer probe. At the same time, the first support section drives the first layer probe to rotate out of the storage rack.

[0007] In an embodiment of the present invention, the pusher link includes a first hinge rod, a second hinge rod, and an arc-shaped support plate. The first hinge rod is fixed on the second support section. The two ends of the second hinge rod are respectively hinged to the first hinge rod and the arc-shaped support plate. The rotation of the support plate can drive the arc-shaped support plate to support the third layer probe to rise.

[0008] In an embodiment of the present invention, the second hinge rod is provided with a first limiting groove and a second limiting groove at one end near the arc-shaped support plate. When the arc-shaped support plate supports the third layer probe, it drives the arc-shaped support plate to rotate from the first limiting groove to the second limiting groove.

[0009] In an embodiment of the present invention, when the support plate rotates and the second support segment supports the second layer probe, the side of the first hinge rod abuts against the second layer probe and restricts the rotation of the support plate.

[0010] In an embodiment of the present invention, the intelligent storage device further includes an alarm. A first proximity switch electrically connected to the alarm is provided on the box on one side of the storage rack. The first proximity switch is used to detect whether there is a sampling probe at the position of the storage rack corresponding to the third layer probe. When the first proximity switch does not detect a sampling probe, it triggers the alarm to sound an alarm.

[0011] In an embodiment of the present invention, the intelligent storage device further includes an alarm. A contact is provided in the second limiting groove. The alarm is connected in series with the circuit of the flipping drive, and the circuit of the contact is connected in parallel with the alarm. When the arc-shaped tray rotates to the second limiting groove, it triggers the contact to conduct and short-circuits the alarm.

[0012] In an embodiment of the present invention, the feeding assembly includes a support plate, a feeding plate, and a feeding drive. The support plate is fixed to one side of the guide plate, and the support plate has a support groove for supporting the sampling probe. The feeding drive is fixed to one side of the support plate and connected to the feeding plate to drive the feeding plate to push the sampling probe to move laterally.

[0013] The feeding assembly also includes a second proximity switch, which is mounted on the side of the support plate to detect whether a sampling probe is present in the support groove.

[0014] In an embodiment of the present invention, the feeding assembly includes a first flipping pressure member, a second flipping pressure member, and a clamping drive member. The clamping drive member is located on the side of the material receiving plate opposite to the feeding drive member, and two fingers of the clamping drive member are respectively connected to the first flipping pressure member and the second flipping pressure member to drive the first flipping pressure member and the second flipping pressure member to be together sleeved on the sampling probe.

[0015] In an embodiment of the present invention, at least two storage racks are arranged side by side in the box to store different types of sampling probes, and the number of unloading components is adapted to the number of storage racks.

[0016] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0017] The offline calibration apparatus and method provided in the embodiments of the present invention have at least the following technical effects:

[0018] Sampling probes are stacked in a storage rack, with a support plate positioned at the bottom. When the support plate is rotated by the flipping drive, the first support section rotates the first layer of probes out of the storage rack. The rotated probes then fall onto the feeding assembly via an inclined guide plate, allowing the robot to pick them up from the feeding assembly. The feeding assembly also eliminates the positioning time required for the robot to pick up the probes, thus improving the efficiency of probe replacement. Since the probes are stacked, to ensure that only one probe is removed from the storage rack with each rotation of the support plate, the second support section rotates synchronously with the support plate. This second support section supports and lifts the second layer of probes, preventing them from falling from the bottom of the storage rack. To reduce friction between the second support section and the second layer of probes, the rotating support plate drives a pusher rod to support and lift the third layer of probes, reducing the weight of the second layer of probes on the second support section and making the rotation of the support plate easier.

[0019] Other features and advantages of the embodiments of the present invention will be described in the following detailed embodiments section. Attached Figure Description

[0020] To more clearly illustrate the specific embodiments of this application or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0021] Figure 1 This is a three-dimensional structural diagram of the intelligent storage device provided in the embodiments of this application;

[0022] Figure 2 This is a three-dimensional structural diagram of the intelligent storage device provided in the embodiment of this application after removing the box;

[0023] Figure 3 A partial three-dimensional structural diagram of the intelligent material storage device in the first state provided in the embodiments of this application;

[0024] Figure 4 A partial three-dimensional structural diagram of the intelligent storage device in the second state provided in the embodiments of this application;

[0025] Figure 5 for Figure 3 Enlarged view of point C in the image;

[0026] Figure 6 for Figure 4 Enlarged view of point D in the image;

[0027] Figure 7 This is a three-dimensional structural diagram of the feeding component in the intelligent storage device provided in the embodiments of this application;

[0028] Figure 8 for Figure 1 Enlarged view of point A in the image;

[0029] Figure 9 for Figure 1 Enlarged view of point B in the image.

[0030] The reference numerals in the attached figures are explained as follows:

[0031] 1. Intelligent material storage device; 2. Sampling probe; 11. Box; 12. Storage rack; 13. Unloading assembly; 14. Feeding assembly; 21. First layer probe; 22. Second layer probe; 23. Third layer probe;

[0032] 111. Guide plate;

[0033] 121. Material support plate; 122. Feeding plate; 123. Feeding drive component; 124. Support groove; 125. First flipping pressure component; 126. Second flipping pressure component; 127. Clamping drive component;

[0034] 131. Tilting drive component; 132. Tilting shaft; 133. Support plate; 134. Pushing connecting rod; 1331. First support section; 1332. Second support section; 1333. Connecting section; 1334. Bearing; 1341. First hinge rod; 1342. Second hinge rod; 1343. Arc-shaped support plate; 1344. First limiting groove; 1345. Second limiting groove. Detailed Implementation

[0035] Unless otherwise specified, the terms “second direction,” “first direction,” “third direction,” “inner,” and “outer” used in the following descriptions, indicating orientation or positional relationships, are understood to be based on the orientation or positional relationships shown in the accompanying drawings. They are used only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application.

[0036] Furthermore, features specified with "first" or "second" for descriptive purposes only should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Features specified with "first" or "second" may explicitly or implicitly include at least one of the specified features. The description of "multiple" generally means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0037] In this application, unless otherwise explicitly specified and limited, terms such as "installation," "connection," "joining," and "fixing" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can be a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0038] In the description of this specification, the terms "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that the specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0039] Please see Figures 1-4 To address the problems in the prior art, the present invention provides an intelligent storage device 1 for sampling probe 2, comprising: an intelligent storage device 1 including a housing 11, a storage rack 12, a feeding assembly 13, and a feeding assembly 14; an inclined guide plate 111 is provided at the bottom of the housing 11; the feeding assembly 14 is located at the bottom of the guide plate 111; the storage rack 12 is fixed inside the housing 11 and the sampling probes 2 are stacked and stored; the sampling probes 2 are stacked in at least three layers, and from bottom to top are the first layer probe 21, the second bottom layer probe, and the third layer probe 23;

[0040] The unloading assembly 13 includes a tilting drive 131, a tilting shaft 132, a support plate 133, and a pushing rod 134. The tilting shaft 132 is located directly below the storage rack 12 and its two ends are rotatably connected to the housing 11. The tilting drive 131 is fixed to one side of the housing 11 and connected to the tilting shaft 132. The support plate 133 includes a first support section 1331, a second support section 1332, and a connecting section 1333. The connecting section 1333 is fixed to the tilting shaft 132. Section 1331 and the second support section 1332 are fixed on the connecting section 1333. The pusher rod 134 is set on the second support section 1332. The first support section 1331 supports the first layer probe 21. When the support plate 133 rotates, it drives the first layer probe 21 to rotate out from the bottom of the storage rack 12 and fall onto the feeding assembly 14 through the guide plate 111. At the same time, the second support section 1332 supports the second layer probe 22 to rise, and the pusher rod 134 pushes the third layer probe 23 to rise.

[0041] By placing multiple sampling probes 2 into the storage rack 12, the multiple sampling probes 2 are stacked on the storage rack 12. A support plate 133 is placed at the bottom of the storage rack 12, causing the first layer of probes 21 in the storage rack 12 to fall onto the first support section 1331. Then, when the robot needs to replace the sampling probes 2, the flipping drive 131 drives the flipping shaft 132 to rotate, causing the flipping shaft 132 to drive the support plate 133 to rotate synchronously. At this time, the first support section 1331 drives the first layer of probes 21 to rotate out of the storage rack 12. The first layer of probes 21, which are rotated out, falls onto the guide plate 111 under the action of gravity. Since the guide plate 111 is inclined and the feeding assembly 14 is located at the bottom of the guide plate 111, the first layer of probes 21 that fall onto the guide plate 111 rolls down the inclined guide plate 111 onto the feeding assembly 14. This makes it easier for the robot to pick up the sampling probes 2 from the feeding assembly 14. Furthermore, the feeding assembly 14 saves the positioning time when the robot picks up the sampling probes 2, thereby improving the replacement efficiency of the sampling probes 2.

[0042] While the support plate 133 rotates, the second support section 1332 rotates synchronously and moves to the bottom of the storage rack 12 to support the second layer probe 22, thereby raising the height of the sampling probe 2 above the second layer probe 22, thus preventing the second layer probe 22 from falling out of the storage rack 12, and ensuring that only one sampling probe 2 is taken out of the storage rack 12 in a single drive of the flipping drive component 131, so that the robot can accurately grab the sampling probe 2 from the feeding component 14.

[0043] Because the second support section 1332 has sliding friction with the second layer probe 22 when lifting the second layer probe 22, the torque required for the second support section 1332 to lift the second layer probe 22 is relatively large. When there are more than three sampling probes 2 on the second support section 1332, the gravity on the second support section 1332 will increase, which will increase the friction between the second support section 1332 and the second layer probe 22, and increase the difficulty of rotating the support plate 133. Therefore, the pusher rod 134 is set on the second support section 1332 so that the pusher rod 134 pushes the third layer probe 23 and above sampling probes 2 to rise, thereby reducing the gravity of the second layer probe 22 on the second support section 1332, so as to reduce the difficulty of rotating the support plate 133.

[0044] After the first layer probe 21 rotates out of the first support section 1331, the flipping drive 131 reverses its direction and drives the flipping shaft 132 to rotate in the opposite direction. At the same time, the support plate 133 rotates in the opposite direction. At this time, the pusher rod 134 supports the third layer probe 23 to descend and moves away from the bottom of the third layer probe 23. At the same time, the second support section 1332 supports the second layer probe 22 to descend and moves away from the bottom of the second layer probe 22. Meanwhile, the first support end returns to its original position and the second layer probe 22 falls onto the first support section 1331 so that the flipping drive 131 can perform the next flipping action. This cycle is repeated so that the robot can quickly and efficiently change the sampling probe 2, improving work efficiency.

[0045] In an embodiment of the present invention, the first support section 1331 is arc-shaped with the arc opening facing upward, and the second support section 1332 is arc-shaped with the arc opening facing downward. The first support section 1331 is directly opposite the bottom of the storage rack 12 to support the first layer probe 21. After the support plate 133 rotates, it drives the second support section 1332 to rotate to the bottom of the storage rack 12 and support the second layer probe 22. At the same time, the first support section 1331 drives the first layer probe 21 to rotate out of the storage rack 12.

[0046] The first support section 1331 is set as an upward-facing arc shape so that when the support plate 133 is not rotated, the first support section 1331 is directly facing the bottom of the storage rack 12, and provides a stable support force for the first layer of probes 21, preventing the first layer of probes 21 from rolling or slipping on the first support section 1331. After the support plate 133 rotates, the first layer of probes 21 can automatically fall out of the first support section 1331, thereby realizing the automatic dropping of the sampling probes 2. This ensures that only one sampling probe 2 is taken out of the storage rack 12 and falls to the feeding component 14 each time the support plate 133 rotates, so that the robot can accurately grab the sampling probe 2 from the feeding component 14, improving the replacement efficiency of the sampling probe 2.

[0047] The second support section 1332 is set to be an arc shape with the opening facing downwards, so that when the support plate 133 rotates and drives the second support section 1332 to move to the bottom of the storage rack 12, the second support section 1332 contacts the second layer probe 22 and slides against the second layer probe 22, so that the second layer probe 22 is lifted by adhering to the arc shape of the second support section 1332, thus preventing the second layer probe 22 from falling out of the storage rack 12 and causing the support plate 133 to flip once, resulting in two sampling probes 2 falling out.

[0048] Please see Figures 5-7 In an embodiment of the present invention, the pusher rod 134 includes a first hinge rod 1341, a second hinge rod 1342, and an arc-shaped support plate 1343. The first hinge rod 1341 is fixed on the second support section 1332. The two ends of the second hinge rod 1342 are respectively hinged to the first hinge rod 1341 and the arc-shaped support plate 1343. The rotation of the support plate 133 can drive the arc-shaped support plate 1343 to support the third layer probe 23 and rise.

[0049] By fixing the first hinge rod 1341 to the second support section 1332 and hinged the second hinge rod 1342 between the first hinge rod 1341 and the arc-shaped support plate 1343, the first hinge connecting rod moves synchronously when the support plate 133 rotates. When the arc-shaped support plate 1343 contacts the third layer probe 23, it drives the second hinge connecting rod to rotate upward around the first hinge connecting rod. As the support plate 133 continues to rotate, the second hinge connecting rod continues to rotate upward, driving the arc-shaped support plate 1343 to support and lift the third layer probe 23. When the arc-shaped support plate 1343 supports and lifts the third layer probe 23, the third layer probe 23... The relative arc-shaped support plate 1343 is stationary, thereby reducing the friction between the third layer probe 23 and the arc-shaped support plate 1343. After the third layer probe 23 is lifted by the arc-shaped support plate 1343, the weight of the second layer probe 22 on the second support section 1332 is reduced, thereby reducing the friction between the second layer probe 22 and the second support section 1332. This allows the second support section 1332 to support the lifting height of the second layer probe 22, and finally allows the first support section 1331 to remove the first layer probe 21 from the storage rack 12, so that the robot can grasp the sampling probe 2 at the feeding assembly 14 and improve the replacement efficiency of the sampling probe 2.

[0050] When the support plate 133 does not rotate, such as Figure 5 As shown in the diagram, the first layer of probes 21 falls onto the first support section 1331, and the second layer of probes 22 and the third layer of probes 23 are stacked on top of the first layer of probes 21. When the flipping drive 131 drives the support plate 133 to rotate, as shown in the diagram... Figure 6 As shown, after rotation, the first support section 1331 rotates the first layer probe 21 out of the storage rack 12. At the same time, the second support section 1332 rotates to the bottom of the storage rack 12 and supports the second layer probe 22 to prevent the second layer probe 22 from falling off the bottom of the storage rack 12, ensuring that only one sampling probe 2 is removed each time the support plate 133 rotates. While the support plate 133 rotates, the arc-shaped support plate 1343 contacts the third layer probe 23. As the support plate 133 continues to rotate, the second hinge rod 1342 rotates around the first hinge rod 1341. At the same time, the arc-shaped support plate 1343 rotates around the second hinge rod 1342, so that the arc-shaped support plate 1343 supports the third layer support plate to rise, thereby reducing the weight of the second layer probe 22 on the second support section 1332 and facilitating the rotation of the support plate 133.

[0051] Please see Figure 7In an embodiment of the present invention, the second hinge rod 1342 is provided with a first limiting groove 1344 and a second limiting groove 1345 at one end near the arc-shaped support plate 1343. When the arc-shaped support plate 1343 supports the third layer probe 23, it rotates from the first limiting groove 1344 to the second limiting groove 1345. Under the action of the second limiting groove 1345, the arc-shaped support plate 1343 remains stable when supporting the third layer probe 23, avoiding excessive rotation angle of the arc-shaped support plate 1343 which would affect the supporting effect on the third layer probe 23. At the same time, it can prevent the arc-shaped support plate 1343 from rotating into the first limiting groove 1344 when supporting the third layer probe 23, thereby improving the supporting stability of the arc-shaped support plate 1343 on the sampling probe 2.

[0052] In an embodiment of the present invention, a bearing 1334 is provided on the second support section 1332. When the support plate 133 rotates, it drives the bearing 1334 to contact the second probe 22, so that the sliding friction between the second probe 22 and the second support section 1332 is changed to rolling friction, thereby improving the smoothness of rotation of the support plate 133.

[0053] Please see Figure 6 In an embodiment of the present invention, when the support plate 133 rotates and the second support section 1332 supports the second layer probe 22, the side of the first hinge rod 1341 abuts against the second layer probe 22 and restricts the rotation of the support plate 133, so as to avoid the support plate 133 rotating excessively and causing the second support section 1332 to rotate away from the bottom of the storage rack 12, thereby causing the second layer probe 22 to fall from the bottom of the storage rack 12. At the same time, when the first hinge rod 1341 abuts against the second layer probe 22, the second hinge rod 1342 supports the third layer probe 23 at an inclined angle, so as to avoid the rotation angle of the second hinge rod 1342 being too large and causing the supported third layer probe 23 to fall off the arc-shaped support plate 1343.

[0054] In an embodiment of the present invention, the intelligent storage device 1 further includes an alarm. A first proximity switch electrically connected to the alarm is provided on the box 11 on one side of the storage rack 12. The first proximity switch is used to detect whether there is a sampling probe 2 at the position of the storage rack 12 corresponding to the third layer probe 23. When the first proximity switch does not detect the sampling probe 2, it triggers the alarm to issue an alarm, so that the operator can carry out the supplementary operation of the sampling probe 2 according to the alarm, avoid production interruption due to probe shortage, and ensure the continuity and stability of production.

[0055] In an embodiment of the present invention, the intelligent storage device 1 further includes an alarm. A contact is provided within the second limiting groove 1345. The alarm is connected in series with the circuit of the flipping drive 131, and the circuit of the contact is connected in parallel with the alarm. When the arc-shaped support plate 1343 rotates to the second limiting groove 1345, the contact is triggered to conduct and short-circuit the alarm. This ensures that the alarm will not sound only when the flipping drive 131 drives the support plate 133 to rotate and the arc-shaped support plate 1343 moves to the second limiting groove 1345, i.e., when the arc-shaped support plate 1343 supports the third layer of probes 23. An alarm will sound when the sampling probes 2 in the storage rack 12 are sufficient. Conversely, when the flipping drive 131 drives the support plate 133 to rotate, and the arc-shaped support plate 1343 is still in the first limit groove 1344, i.e., the arc-shaped support plate 1343 does not support the sampling probes 2, the alarm will sound. This avoids alarm abnormalities caused by misoperation or equipment failure, ensures the accuracy of equipment operation and alarms, and allows operators to replenish the sampling probes 2 according to the alarm, avoiding production interruptions caused by probe shortages and ensuring the continuity and stability of production.

[0056] Please see Figure 8 In an embodiment of the present invention, the feeding assembly 14 includes a support plate 121, a feeding plate 122, and a feeding drive 123. The support plate 121 is fixed to one side of the guide plate 111, and a support groove 124 for supporting the sampling probe 2 is provided on the support plate 121. The feeding drive 123 is fixed to one side of the support plate 121 and connected to the feeding plate 122 to drive the feeding plate 122 to push the sampling probe 2 laterally. After the sampling probe 2 falls onto the guide plate 111, it slides down the guide plate 111 into the support groove 124. Then, the feeding drive 123 drives the feeding plate 122 to move, so that the feeding plate 122 drives the sampling probe 2 to move laterally in the support groove 124 from one side of the sampling probe 2, so that the sampling probe 2 moves horizontally, which facilitates the robot to grasp and replace the moved sampling probe 2, and improves the accuracy and efficiency when replacing the sampling probe 2.

[0057] In an embodiment of the present invention, the feeding assembly 14 further includes a second proximity switch, which is installed on the side of the support plate 121 to detect whether there is a sampling probe 2 in the support groove 124. The second proximity switch detects whether there is a sampling probe 2 in the support groove 124 under the action of the second proximity switch, so that the operator can understand the feeding status in time according to the feedback of the second proximity switch and avoid the sampling probe 2 being missed.

[0058] Please see Figure 9In an embodiment of the present invention, the feeding assembly 14 includes a first flipping pressure member 125, a second flipping pressure member 126, and a clamping drive member 127. The clamping drive member 127 is located on the side of the material receiving plate 121 away from the feeding drive member 123, and the two fingers of the clamping drive member 127 are respectively connected to the first flipping pressure member 125 and the second flipping pressure member 126 to drive the first flipping pressure member 125 and the second flipping pressure member 126 to be together sleeved on the sampling probe 2.

[0059] The clamping drive 127 drives the first flipping pressure member 125 and the second flipping pressure member 126 to rotate respectively. When the feeding drive 123 drives the feeding plate 122 to push the sampling probe 2 to the position between the first flipping pressure member 125 and the second flipping pressure member 126, the clamping drive 127 drives the first flipping pressure member 125 and the second flipping pressure member 126 to rotate. This allows the rotated first flipping pressure member 125 and the second flipping pressure member 126 to be fitted together on the sampling probe 2, thereby achieving the positioning and fixing effect of the sampling probe 2. This makes it easier for the robot to grasp the sampling probe 2 from the first flipping pressure member 125 and the second flipping pressure member 126, further improving the accuracy and efficiency of the sampling probe 2 replacement.

[0060] In an embodiment of the present invention, at least two storage racks 12 are arranged side by side in the housing 11 to store different types of sampling probes 2. The number of unloading components 13 is adapted to the number of storage racks 12 so that different types of sampling probes 2 can be stored under the action of at least two storage racks 12. The number of unloading components 13 is adapted to the number of unloading components 13 so that the operator can control the flipping drive 131 in the corresponding unloading component 13 according to the working condition of the robot, and make the corresponding sampling probe 2 fall to the feeding component 14 for the robot to grab and replace, thereby improving the applicability and flexibility of the intelligent storage device 1 and reducing the cost and time of replacing equipment due to changes in production needs.

[0061] The technical features described above can be combined arbitrarily. Although not all possible combinations of these technical features are described, any combination of these technical features should be considered to be covered by this specification, provided that such combination does not contain contradictions.

[0062] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application, and not to limit them; although this application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that they can still adjust the technical solutions described in the foregoing embodiments, or make equivalent substitutions for some or all of the technical features; and these adjustments or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. An intelligent material storage device for a sampling probe, characterized in that, include: The intelligent storage device includes a box, a storage rack, a feeding component, and a conveying component. The bottom of the box is provided with an inclined guide plate. The conveying component is located at the bottom of the guide plate. The storage rack is fixed inside the box and the sampling probes are stacked. The sampling probes are stacked in at least three layers, and from bottom to top, they are the first layer probe, the second bottom layer probe, and the third layer probe. The feeding assembly includes a flipping drive, a flipping shaft, a support plate, and a pushing rod. The flipping shaft is located directly below the storage rack and its two ends are rotatably connected to the box body. The flipping drive is fixed to one side of the box body and connected to the flipping shaft. The support plate includes a first support section, a second support section, and a connecting section. The connecting section is fixed to the flipping shaft. The first support section and the second support section are fixed to the connecting section. The pushing rod is disposed on the second support section. The first support section supports the first layer probe. When the support plate rotates, it drives the first layer probe to rotate out from the bottom of the storage rack and fall onto the feeding assembly through the guide plate. At the same time, the second support section supports the second layer probe and rises. The pushing rod pushes the third layer probe and rises.

2. The intelligent material storage device according to claim 1, characterized in that, The first support section is arc-shaped with the arc opening facing upwards, and the second support section is arc-shaped with the arc opening facing downwards. The first support section is directly opposite the bottom of the storage rack to support the first layer of probes. After the support plate rotates, it drives the second support section to rotate to the bottom of the storage rack and support the second layer of probes. At the same time, the first support section drives the first layer of probes to rotate out of the storage rack.

3. The intelligent material storage device according to claim 2, characterized in that, The pusher linkage includes a first hinge rod, a second hinge rod, and an arc-shaped support plate. The first hinge rod is fixed on the second support section. The two ends of the second hinge rod are respectively hinged to the first hinge rod and the arc-shaped support plate. The rotation of the support plate can drive the arc-shaped support plate to support the third layer probe to rise.

4. The intelligent material storage device according to claim 3, characterized in that, The second hinge rod is provided with a first limiting groove and a second limiting groove at one end near the arc-shaped support plate. When the arc-shaped support plate supports the third layer probe, it drives the arc-shaped support plate to rotate from the first limiting groove to the second limiting groove.

5. The intelligent material storage device according to claim 4, characterized in that, When the support plate rotates and the second support section supports the second layer probe, the side of the first hinge rod abuts against the second layer probe and restricts the rotation of the support plate.

6. The intelligent material storage device according to claim 1, characterized in that, The intelligent storage device also includes an alarm. A first proximity switch electrically connected to the alarm is provided on the box on one side of the storage rack. The first proximity switch is used to detect whether there is a sampling probe at the position of the storage rack corresponding to the third layer probe. When the first proximity switch does not detect a sampling probe, it triggers the alarm to sound an alarm.

7. The intelligent material storage device according to claim 5, characterized in that, The intelligent storage device also includes an alarm. A contact is provided in the second limiting groove. The alarm is connected in series with the circuit of the flipping drive, and the circuit of the contact is connected in parallel with the alarm. When the arc-shaped tray rotates to the second limiting groove, it triggers the contact to conduct and short-circuits the alarm.

8. The intelligent material storage device according to claim 1, characterized in that, The feeding assembly includes a support plate, a feeding plate, and a feeding drive. The support plate is fixed to one side of the guide plate, and the support plate has a support groove for supporting the sampling probe. The feeding drive is fixed to one side of the support plate and connected to the feeding plate to drive the feeding plate to push the sampling probe to move laterally. The feeding assembly also includes a second proximity switch, which is mounted on the side of the support plate to detect whether a sampling probe is present in the support groove.

9. The intelligent material storage device according to claim 8, characterized in that, The feeding assembly includes a first flipping pressure member, a second flipping pressure member, and a clamping drive member. The clamping drive member is located on the side of the material receiving plate opposite to the feeding drive member, and the two fingers of the clamping drive member are respectively connected to the first flipping pressure member and the second flipping pressure member to drive the first flipping pressure member and the second flipping pressure member to be sleeved together on the sampling probe.

10. The intelligent storage device according to claim 1, characterized in that, The storage rack has at least two side by side inside the box to store different types of sampling probes, and the number of the feeding components is adapted to the storage rack.

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