Method for separating internal and external parameters of star sensor based on characteristic trajectory imaging
Through the method based on feature trajectory imaging, the initial alignment deviation between the starlight simulator and the turntable is eliminated, the main points are separated, and the elliptical trajectory is optimized, which solves the problem of internal and external parameter coupling in ground calibration of the star sensor, and achieves high-precision separation of internal and external parameters.
Patent Information
- Application Number
- CN202510008277.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-03
- Publication Date
- 2025-05-06
- Estimated Expiration
- 2045-01-03
AI Technical Summary
The existing star-sensitive ground calibration method ignores the coupling effect between internal and external parameters when modeling internal and external parameters, resulting in a reduction in the accuracy of measurement results in some application scenarios.
By deeply analyzing the imaging model of the star sensor and its calibration system, an internal and external parameter separation method based on feature trajectory imaging was discovered and proposed. This method eliminates the initial alignment deviation between the starlight simulator and the turntable, separates the main points, and improves the accuracy of the main points by optimizing the design of the elliptical trajectory, and ultimately realizes the separation of internal and external parameters.
The effective separation of internal and external parameters of the star sensor is achieved, and the accuracy of the measurement results is improved, especially in some application scenarios where only the internal parameters of the star sensor are used, which significantly improves calibration efficiency and accuracy.
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Abstract
Citation Information
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