计算设备的性能测试方法、装置、系统以及电子设备
By acquiring test data and carbon emission parameters of computing devices and using formulas to calculate their performance parameters, the problem of insufficient applicability of computing device performance testing is solved, and more accurate performance evaluation and environmental impact assessment are achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- INSPUR SUZHOU INTELLIGENT TECH CO LTD
- Filing Date
- 2025-01-17
- Publication Date
- 2026-07-17
AI Technical Summary
The performance testing of computing devices is poorly applicable and cannot effectively measure their operating performance under different pressure and carbon emission conditions, which affects application and deployment design.
By acquiring test data and carbon emission parameters of computing equipment, its performance parameters are calculated using formulas, including computing power efficiency under pressure load, computing power efficiency under workload, and computing power efficiency under scenario. Taking carbon emission factors into account, the operating performance of the equipment under unit carbon emission is evaluated.
This improves the applicability of computing device performance testing, enabling more accurate measurement of their operational performance under different pressure and carbon emission conditions, assessment of their environmental impact, and support for more appropriate applications and deployments.
Smart Images
Figure CN119961127B_ABST