Method and device for evaluating performance of single photon detector, computer device and medium

Abstract

The application relates to a single-photon detector performance evaluation method and device, computer equipment and a medium. The method comprises the following steps: connecting a to-be-tested detector into a performance test circuit to build a performance test environment; applying a voltage to the to-be-tested detector in the performance test environment according to a preset working voltage range of the to-be-tested detector, so that the to-be-tested detector is in a working state, and sampling an electric quantity parameter of the to-be-tested detector by using a sampling frequency corresponding to each performance degradation parameter of the to-be-tested detector, to obtain an electric quantity time sequence corresponding to each performance degradation parameter; each performance degradation parameter at least comprises a dark current parameter, a breakdown voltage parameter and a noise parameter; determining an evaluation index value corresponding to each performance degradation parameter according to the electric quantity time sequence corresponding to each performance degradation parameter; and evaluating a performance degradation condition of the to-be-tested detector according to the evaluation index value corresponding to each performance degradation parameter. The method can accurately evaluate the performance of the detector.

Description

Technical Field

[0001] This application relates to the field of detector technology, and in particular to a method, apparatus, computer equipment, and medium for evaluating the performance of a single-photon detector. Background Technology

[0002] Single-photon detectors enable secure and efficient information transmission in quantum communication; they capture faint light signals in astronomy, propelling deep space exploration; and they also demonstrate significant application value in biomedical imaging, lidar, and other fields. Performance degradation is a major problem facing single-photon detectors, primarily manifested in decreased device stability due to prolonged operation at high reverse bias voltages, performance decay caused by the failure to quench avalanche currents in a timely manner, and gradual performance reduction due to material aging and environmental factors such as radiation and temperature changes. These factors work together to cause detector performance to degrade over time.

[0003] Currently, there are two methods for evaluating the performance degradation of single-photon detectors: the resistance method, which measures the change in resistance over time, and the placement method, which measures the performance change under external stress. However, the first method requires additional analysis and modeling, which increases the complexity and uncertainty of the analysis; the second method, because the performance change may be caused by the combined effect of multiple factors, makes it difficult to accurately distinguish the degree of influence of each factor, increasing the difficulty and uncertainty of data analysis. Summary of the Invention

[0004] Therefore, it is necessary to provide a method, apparatus, computer equipment, and medium for evaluating the performance of a single-photon detector, which can accurately evaluate the performance of the detector, in order to address the aforementioned technical problems.

[0005] Firstly, this application provides a method for evaluating the performance of a single-photon detector, including:

[0006] The detector under test is connected to the performance test circuit to build a performance test environment; wherein, the detector under test is a single-photon detector;

[0007] According to the preset operating voltage range of the detector under test, a voltage is applied to the detector under test in the performance test environment to make the detector under test work.

[0008] When the detector under test is in operation, the electrical parameters of the detector under test are sampled using the sampling frequency corresponding to each performance degradation parameter of the detector under test, so as to obtain the electrical time series corresponding to each performance degradation parameter; wherein, the electrical parameters include the current flowing through the detector under test and the voltage across the detector under test; each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter and the noise parameter.

[0009] Based on the power consumption time series corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter;

[0010] The performance degradation of the detector under test is evaluated based on the evaluation index values ​​corresponding to each performance degradation parameter.

[0011] In one embodiment, the performance test circuit includes a voltage regulator, a protection resistor, a voltmeter, and an ammeter;

[0012] Wherein, the positive terminal of the voltage regulator is connected to the first terminal of the protective resistor, the negative terminal of the voltage regulator is connected to the first terminal of the voltmeter and the first terminal of the ammeter, and the second terminal of the protective resistor is connected to the second terminal of the voltmeter;

[0013] Accordingly, connecting the detector under test to the performance test circuit includes:

[0014] Connect the positive terminal of the detector under test to the second terminal of the ammeter, and connect the negative terminal of the detector under test to the second terminal of the voltmeter.

[0015] In one embodiment, the performance testing environment further includes a light shield; wherein the detector under test is located inside the light shield.

[0016] In one embodiment, determining the evaluation index value corresponding to each performance degradation parameter based on the power consumption time series corresponding to each performance degradation parameter includes:

[0017] Based on the electrical time series corresponding to each performance degradation parameter, determine the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter.

[0018] Based on the voltage and current characteristic curves of the detector under test at the sampling frequencies corresponding to each performance degradation parameter, the evaluation index values ​​corresponding to each performance degradation parameter are determined.

[0019] In one embodiment, the evaluation index value corresponding to the dark current parameter includes the dark current value, the ground fault current value, and the short-circuit instantaneous current value; the evaluation index value corresponding to the breakdown voltage parameter includes the breakdown voltage value; and the evaluation index value corresponding to the noise parameter includes the noise value.

[0020] In one embodiment, determining the evaluation index value corresponding to each performance degradation parameter based on the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter includes:

[0021] Based on the test standard corresponding to the dark current parameter, the dark current value, ground fault current value and short circuit instantaneous current value are determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the dark current parameter.

[0022] Based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the breakdown current parameter.

[0023] Based on the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to the noise parameters, determine the voltage change information and current change information of the voltage under test at the sampling frequency corresponding to the noise parameters.

[0024] Based on the voltage change information and the current change information, the noise value of the detector under test under positive pressure, the noise value under zero bias, and the noise value under negative pressure are determined.

[0025] In one embodiment, evaluating the performance degradation of the detector under test based on the evaluation index values ​​corresponding to each performance degradation parameter includes:

[0026] Based on the evaluation index value corresponding to the dark current parameter, determine the first performance degradation result of the dark current parameter;

[0027] Based on the evaluation index value corresponding to the breakdown voltage parameter, the second performance degradation result of the breakdown voltage parameter is determined;

[0028] Based on the evaluation index value corresponding to the noise parameter, determine the third performance degradation result corresponding to the noise parameter;

[0029] The performance degradation of the detector under test is evaluated based on the first performance degradation result, the second performance degradation result, and the third performance degradation result.

[0030] Secondly, this application also provides a single-photon detector performance evaluation device, comprising:

[0031] An environment setup module is used to connect the detector under test to the performance test circuit to set up a performance test environment; wherein the detector under test is a single-photon detector.

[0032] A voltage application module is used to apply voltage to the detector under test in the performance test environment according to the preset operating voltage range of the detector under test, so as to make the detector under test work.

[0033] The information determination module is used to sample the electrical parameters of the detector under test (DUT) at the sampling frequency corresponding to each performance degradation parameter of the DUT when the DUT is in the working state, thereby obtaining the electrical time series corresponding to each performance degradation parameter; wherein, the electrical parameters include the current flowing through the DUT and the voltage across the DUT; each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter, and the noise parameter;

[0034] The indicator evaluation module is used to determine the evaluation indicator value corresponding to each performance degradation parameter based on the power consumption time series corresponding to each performance degradation parameter.

[0035] The performance evaluation module is used to evaluate the performance degradation of the detector under test based on the evaluation index values ​​corresponding to each performance degradation parameter.

[0036] Thirdly, this application also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0037] The detector under test is connected to the performance test circuit to build a performance test environment; wherein, the detector under test is a single-photon detector;

[0038] According to the preset operating voltage range of the detector under test, a voltage is applied to the detector under test in the performance test environment to make the detector under test work.

[0039] When the detector under test is in operation, the electrical parameters of the detector under test are sampled using the sampling frequency corresponding to each performance degradation parameter of the detector under test, so as to obtain the electrical time series corresponding to each performance degradation parameter; wherein, the electrical parameters include the current flowing through the detector under test and the voltage across the detector under test; each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter and the noise parameter.

[0040] Based on the power consumption time series corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter;

[0041] The performance degradation of the detector under test is evaluated based on the evaluation index values ​​corresponding to each performance degradation parameter.

[0042] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, performs the following steps:

[0043] The detector under test is connected to the performance test circuit to build a performance test environment; wherein, the detector under test is a single-photon detector;

[0044] According to the preset operating voltage range of the detector under test, a voltage is applied to the detector under test in the performance test environment to make the detector under test work.

[0045] When the detector under test is in operation, the electrical parameters of the detector under test are sampled using the sampling frequency corresponding to each performance degradation parameter of the detector under test, so as to obtain the electrical time series corresponding to each performance degradation parameter; wherein, the electrical parameters include the current flowing through the detector under test and the voltage across the detector under test; each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter and the noise parameter.

[0046] Based on the power consumption time series corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter;

[0047] The performance degradation of the detector under test is evaluated based on the evaluation index values ​​corresponding to each performance degradation parameter.

[0048] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, performs the following steps:

[0049] The detector under test is connected to the performance test circuit to build a performance test environment; wherein, the detector under test is a single-photon detector;

[0050] According to the preset operating voltage range of the detector under test, a voltage is applied to the detector under test in the performance test environment to make the detector under test work.

[0051] When the detector under test is in operation, the electrical parameters of the detector under test are sampled using the sampling frequency corresponding to each performance degradation parameter of the detector under test, so as to obtain the electrical time series corresponding to each performance degradation parameter; wherein, the electrical parameters include the current flowing through the detector under test and the voltage across the detector under test; each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter and the noise parameter.

[0052] Based on the power consumption time series corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter;

[0053] The performance degradation of the detector under test is evaluated based on the evaluation index values ​​corresponding to each performance degradation parameter.

[0054] The aforementioned single-photon detector performance evaluation method, apparatus, computer equipment, and medium establish a performance testing environment by connecting the detector under test (DUT) to a performance testing circuit. A voltage is applied to the DUT within this environment according to its preset operating voltage range to ensure its operational status, thus guaranteeing flexibility in both the testing environment and process. Furthermore, while the DUT is operational, the electrical parameters are sampled using the sampling frequencies corresponding to each performance degradation parameter, yielding an electrical time series for each parameter. This enables real-time online monitoring of the DUT's current and voltage, with a flexibly adjustable sampling frequency. Finally, the electrical time series corresponding to each degradation parameter ensures the determination of the evaluation index values ​​for each parameter, further guaranteeing the accuracy of the evaluation results assessing the DUT's performance degradation. Attached Figure Description

[0055] To more clearly illustrate the technical solutions in the embodiments or related technologies of this application, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0056] Figure 1 This is a diagram illustrating the application environment of a single-photon detector performance evaluation method in one embodiment.

[0057] Figure 2 This is a flowchart illustrating a single-photon detector performance evaluation method in one embodiment;

[0058] Figure 3A This is a schematic diagram of a performance test circuit provided in one embodiment;

[0059] Figure 3B This is a schematic diagram of a performance testing environment provided in one embodiment;

[0060] Figure 4 This is a flowchart illustrating the process of determining the evaluation index values ​​corresponding to each performance degradation parameter in one embodiment.

[0061] Figure 5A This is a flowchart illustrating the process for determining the evaluation index values ​​corresponding to each performance degradation parameter in another embodiment.

[0062] Figure 5B The curves showing the changes in dark current, ground fault current, and short-circuit instantaneous current over time, obtained from monitoring in one embodiment, are shown.

[0063] Figure 5CHere is a voltage-current characteristic curve obtained from monitoring in one embodiment;

[0064] Figure 5D This is a curve showing the change of noise value over time as monitored in one embodiment;

[0065] Figure 6 This is a flowchart illustrating the process of evaluating the performance degradation of the detector under test in one embodiment.

[0066] Figure 7 This is a flowchart illustrating a single-photon detector performance evaluation method in another embodiment;

[0067] Figure 8 This is a structural block diagram of a single-photon detector performance evaluation device in one embodiment;

[0068] Figure 9 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0069] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0070] The single-photon detector performance evaluation method provided in this application embodiment can be applied to, for example... Figure 1 In the application environment shown, the control device 101 is used to execute the single-photon detector performance evaluation method provided in the embodiments of this application, that is, to control the detector under test 102 and the performance test circuit 103; the detector under test 102 can be a single-photon detector, and the performance test circuit is used to test the performance of the detector under test. Optionally, the control device 101 connects the detector under test 102 (i.e., a single-photon detector) to the performance test circuit 103 to establish a performance test environment; according to the preset operating voltage range of the detector under test, a voltage is applied to the detector under test in the performance test environment to make the detector under test operational; when the detector under test is operational, the electrical parameters of the detector under test are sampled using the sampling frequency corresponding to each performance degradation parameter of the detector under test, to obtain the electrical time series corresponding to each performance degradation parameter; wherein, the electrical parameters include the current flowing through the detector under test and the voltage across the detector under test; each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter, and the noise parameter; according to the electrical time series corresponding to each performance degradation parameter, the evaluation index value corresponding to each performance degradation parameter is determined; according to the evaluation index value corresponding to each performance degradation parameter, the performance degradation of the detector under test is evaluated.

[0071] In one embodiment, such as Figure 2 As shown, a method for evaluating the performance of a single-photon detector is provided, which can be applied to... Figure 1 Taking the control device 101 as an example, the following steps are specifically included:

[0072] S201 connects the detector under test to the performance test circuit to build a performance test environment.

[0073] The performance test circuit is a pre-built circuit environment; the performance test environment is a circuit environment built according to the detector under test for testing the performance of the detector under test. In this embodiment, the detector under test is a single-photon detector.

[0074] For example, a performance test circuit can be as follows: Figure 3A As shown, the performance test circuit includes a voltage regulator G and a protection resistor R. C voltmeter V R and ammeter I D Furthermore, the positive terminal of the voltage regulator is connected to the first terminal of the protective resistor, the negative terminal of the voltage regulator is connected to the first terminal of the voltmeter and the first terminal of the ammeter, and the second terminal of the protective resistor is connected to the second terminal of the voltmeter.

[0075] Optionally, according to the circuit principle of the performance test circuit, the detector under test is connected to the pre-built performance test circuit to obtain a performance test environment for testing the performance of the detector under test.

[0076] For example, in Figure 3A Based on the performance test circuit shown, connect the positive terminal of the detector under test (DUT) to the second terminal of the ammeter, and connect the negative terminal of the DUT to the second terminal of the voltmeter to build a performance test environment; as shown Figure 3B As shown, the voltage regulator, protective resistor, detector under test (DUT), and ammeter are connected in series. A voltmeter is connected in parallel across the DUT to monitor its voltage, and the ammeter monitors the current flowing through it. It should be noted that the performance testing environment also includes a light shield; the DUT is located inside the light shield. Understandably, placing the DUT inside the light shield ensures it is not exposed to direct sunlight.

[0077] S202, Apply voltage to the detector under test in the performance test environment according to the preset operating voltage range of the detector under test, so as to make the detector under test work.

[0078] The preset operating voltage range is a pre-defined range of operating voltages for the detector under test, which is generally related to the material of the detector. For example, for silicon-based single-photon detectors, the linear region of the preset operating voltage range is generally 0-30V. For indium gallium arsenide single-photon detectors, the linear region of the preset operating voltage range is generally 0-60V.

[0079] Optionally, within the preset operating voltage range of the detector under test (DUT), a voltage regulator is controlled to generate voltage to apply voltage to the DUT, thereby putting the DUT into operation. For example, depending on the different test requirements of the DUT, the voltage can be gradually increased within the preset operating voltage range.

[0080] S203, with the detector under test in working condition, the electrical parameters of the detector under test are sampled using the sampling frequency corresponding to each performance degradation parameter of the detector under test, so as to obtain the electrical time series corresponding to each performance degradation parameter.

[0081] Among them, the performance degradation parameter characterizes the degree of performance degradation of the detector under test (DUT). The electrical parameters include the current flowing through the DUT and the voltage across its terminals. The electrical time series includes voltage and current values ​​arranged in chronological order. It should be noted that different performance parameters correspond to different sampling frequencies.

[0082] Understandably, dark current, breakdown voltage, and noise are crucial degradation parameters for detectors, significantly impacting their performance. Dark current, the current in the detector during photon-free illumination, is a clear indicator of performance degradation. Increased dark current not only increases power consumption but can also introduce additional noise, reducing the signal-to-noise ratio (SNR) of the detected signal. Breakdown voltage is the voltage required for an avalanche photodiode (SPAD) to break down. With use, the breakdown voltage may drift, causing the detector's operating point to deviate from its optimal state, thus affecting detection efficiency and stability. Noise is an unwanted component of the detector's output signal, potentially originating from thermal noise, shot noise, or internal defects. Performance degradation leads to increased noise levels, making detection more difficult in weak light signals and reducing accuracy. Increased dark current is often accompanied by increased noise levels, showing a close correlation. High dark current and noise levels together limit the detector's dynamic range and sensitivity, reducing its performance in practical applications. Variations in breakdown voltage not only affect detector stability but can also impact detection efficiency by altering avalanche breakdown conditions. Shifts in breakdown voltage can cause the detector to become less sensitive to photons, thus reducing detection efficiency. During detector operation, continuous monitoring of degradation parameters such as dark current, breakdown voltage, and noise is crucial for timely detection of performance degradation, prediction of detector lifespan, and the development of maintenance strategies.

[0083] Noise is a critical parameter in the performance of single-photon detectors, and its impact is mainly reflected in the following three aspects: ① Reduced signal-to-noise ratio: Increased noise significantly reduces the detector's signal-to-noise ratio, causing the useful signal to be submerged in background noise and difficult to extract accurately, thus affecting the detector's detection accuracy and reliability. ② Limited detection efficiency: High noise levels limit the detector's detection efficiency, especially in weak light signal detection scenarios. Noise interference makes it difficult for the detector to distinguish between the real photon signal and background noise, leading to a decrease in detection efficiency. ③ Performance evaluation and optimization: Noise level is one of the important indicators for measuring detector performance. By reducing noise, the overall performance of the detector can be significantly improved. Therefore, in the embodiments of this application, the performance degradation parameters may include dark current parameters, breakdown voltage parameters, and noise parameters.

[0084] Optionally, when the detector under test is in operation, the voltage and current of the detector under test are sampled according to the sampling frequency corresponding to each performance degradation parameter, and the power time series corresponding to each performance degradation parameter is constructed based on the voltage and current values ​​obtained from sampling at different sampling frequencies.

[0085] S204. Based on the power consumption time series corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter.

[0086] The evaluation index corresponding to each performance degradation parameter is an index that can characterize that performance degradation parameter, and the evaluation index value is the value of the evaluation index. There can be one or more evaluation indices for each performance degradation parameter, without any limitation.

[0087] For example, in the embodiments of this application, the evaluation index values ​​corresponding to the dark current parameter include, but are not limited to, the dark current value, the ground fault current value, and the short-circuit instantaneous current value; the evaluation index values ​​corresponding to the breakdown voltage parameter include, but are not limited to, the breakdown voltage value; and the evaluation index values ​​corresponding to the noise parameter include, but are not limited to, the noise value.

[0088] Optionally, for each performance degradation parameter, an evaluation index value corresponding to the performance degradation parameter can be calculated based on the parameter characteristics of the performance degradation parameter and the voltage and current values ​​in the power time series corresponding to the performance degradation parameter.

[0089] S205 assesses the performance degradation of the detector under test based on the evaluation index values ​​corresponding to each performance degradation parameter.

[0090] Optionally, a comprehensive analysis can be performed on the evaluation index values ​​corresponding to each performance degradation parameter; for example, the error between the evaluation index value corresponding to each performance degradation parameter and the corresponding theoretical value of the evaluation index can be calculated, and the errors corresponding to each performance degradation parameter can be summed, and then the performance degradation of the detector under test can be evaluated based on the sum.

[0091] In the aforementioned single-photon detector performance evaluation method, a performance testing environment is established by connecting the detector under test (DUT) to a performance testing circuit. A voltage is applied to the DUT within this environment according to its preset operating voltage range to ensure its operational status, thus guaranteeing the flexibility of the testing environment and process. Furthermore, while the DUT is operational, the electrical parameters are sampled using the sampling frequencies corresponding to each performance degradation parameter, yielding an electrical time series for each parameter. This enables real-time online monitoring of the DUT's current and voltage, with a flexibly adjustable sampling frequency. Finally, the electrical time series corresponding to each degradation parameter ensures the determination of the evaluation index values ​​for each parameter, further guaranteeing the accuracy of the evaluation results assessing the DUT's performance degradation.

[0092] Optionally, to ensure the evaluation index values ​​corresponding to the determined performance degradation parameters, in one embodiment, such as... Figure 4As shown, a method for determining the evaluation index values ​​corresponding to each performance degradation parameter is provided to refine the above S204, specifically including the following steps:

[0093] S401, based on the electrical time series corresponding to each performance degradation parameter, determine the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter.

[0094] Among them, the voltage-current characteristic curve is a characteristic curve that characterizes the corresponding relationship between voltage and current.

[0095] Optionally, for any performance degradation parameter, the voltage and current values ​​at the same time can be obtained based on the power time series corresponding to the performance degradation parameter; further, based on the voltage and current values ​​at the same time, the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the performance degradation parameter can be fitted using a fitting tool.

[0096] S402, based on the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter.

[0097] Optionally, for any performance degradation parameter, extract the characteristics related to the evaluation index of the performance degradation parameter from the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the performance degradation parameter, such as voltage change characteristics, current change characteristics, current characteristics at a specific voltage value, etc., and determine the evaluation index value corresponding to the performance degradation parameter based on the extracted characteristics.

[0098] In this embodiment, since the power time series corresponding to each performance degradation parameter is the voltage and current values ​​sorted by time, and the changes in voltage and current values ​​over time can reflect the characteristics of the detector under test to a certain extent, the accuracy of the evaluation index values ​​corresponding to each performance degradation parameter is guaranteed.

[0099] For example, the evaluation index values ​​corresponding to the dark current parameter include the dark current value, the ground fault current value, and the short-circuit instantaneous current value; the evaluation index values ​​corresponding to the breakdown voltage parameter include the breakdown voltage value; and the evaluation index values ​​corresponding to the noise parameter include the noise value. Based on this, in one embodiment, such as... Figure 5A As shown, a method for determining the evaluation index values ​​corresponding to each performance degradation parameter is provided to refine the above S402, specifically including the following steps:

[0100] S501, based on the test standard corresponding to the dark current parameter, determines the dark current value, ground fault current value and short circuit instantaneous current value according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the dark current parameter.

[0101] Among them, the test standard corresponding to the dark current parameter indicates the voltage selection standard during the test of the dark current parameter; the dark current value (Id) refers to the unidirectional current flowing through the detector under test under the action of external voltage in the absence of light; the ground fault current value (ig) is the current caused by the direct contact of equipment or line with the ground; the short circuit instantaneous current value (is) refers to the instantaneous current when the short circuit current reaches its maximum value when a short circuit fault occurs in the circuit.

[0102] Optionally, based on the test standard corresponding to the dark current parameter, the dark current value of the detector under test can be extracted from the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the dark current parameter; at the same time, the current of the detector under test when it is in a ground fault can be extracted as the ground fault current value; further, the instantaneous current of the maximum short circuit current when the detector under test is in a short circuit fault can be extracted as the short circuit instantaneous current value.

[0103] For example, such as Figure 5B As shown, the curves of the monitored dark current value, ground fault current value, and short-circuit instantaneous current value change over time. Figure 5B In the graph, the horizontal axis represents time, the vertical axis represents current, Id represents dark current, ig represents ground fault current value, and is represents short-circuit instantaneous current value.

[0104] S502, based on the test standard corresponding to the breakdown voltage, determines the breakdown voltage value according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the breakdown current parameter.

[0105] The breakdown voltage is the voltage at which a dielectric material suddenly loses its insulating ability and discharges when subjected to voltage exceeding a certain critical value. The breakdown voltage is related to the type and thickness of the material and the environment in which it is used.

[0106] Optionally, based on the test standard corresponding to the breakdown voltage, i.e. the judgment condition of the breakdown voltage, and combined with the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the breakdown current parameter, the voltage value corresponding to the current value is determined according to the current value when the detector under test discharges, and the voltage value corresponding to the current value is further used as the breakdown voltage.

[0107] For example, such as Figure 5C As shown, this is the voltage-current characteristic curve obtained by monitoring in the embodiment of this application, that is, the curve of voltage changing with current. Figure 5C In the curve, the horizontal axis vd represents voltage, and the vertical axis Id represents current. Figure 5CThe curves in the figure are, in order, the current change curves with voltage in the range of (-100, 1), the current change curves with voltage in the range of (-10-1), the current change curves with voltage in the range of (-100, -60), and the current change curves with voltage in the range of (-60, -30).

[0108] S503, based on the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to the noise parameters, determines the voltage change information and current change information of the voltage under test at the sampling frequency corresponding to the noise parameters.

[0109] Among them, voltage change information represents the change in voltage; current change information represents the change in current.

[0110] Optionally, statistical analysis can be performed on the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to the noise parameters to obtain the voltage value change at each sampling time and the current value change at each sampling time at the sampling frequency corresponding to the noise parameters, and generate voltage change information and current change information respectively.

[0111] S504 determines the noise value of the detector under test under positive voltage, zero bias, and negative voltage conditions based on voltage and current change information.

[0112] Among them, the noise value under positive pressure is the noise value when the voltage of the detector under test is positive; the noise value under zero bias is the noise value when the detector under test is in a zero bias state; and the noise value under negative pressure is the noise value when the detector under test is in a negative pressure state.

[0113] Optionally, the voltage and current change information of the detector under test under positive voltage, zero bias, and negative voltage can be extracted from the voltage and current change information, respectively. Furthermore, based on the voltage and current change information under each state, the noise value of the detector under test in each state can be determined.

[0114] For example, such as Figure 5D As shown, this is a curve of the noise value monitored in an embodiment of this application changing over time. Figure 5D The horizontal axis of the curve represents frequency, and the vertical axis represents noise level. Figure 5D The curves in the figure are, in order, the noise curve when the voltage is 0.5, the noise curve when the voltage is -1, the noise curve when the voltage is -10, and the noise curve when the voltage is 0.

[0115] In this embodiment, the evaluation index values ​​of dark current parameter, breakdown voltage parameter and noise parameter are calculated by comprehensively considering the voltage and current characteristic curve of the detector under test, so as to ensure the accuracy of the determined evaluation index values ​​of each performance degradation parameter.

[0116] Optionally, to ensure the accuracy of the degradation performance evaluation results of the detector under test, in one embodiment, such as Figure 6 As shown, a method for evaluating the performance degradation of the detector under test is provided, which refines the above S205, and specifically includes the following steps:

[0117] S601, based on the evaluation index value corresponding to the dark current parameter, determines the first performance degradation result of the dark current parameter.

[0118] The first degradation performance result characterizes the degradation of the dark current parameter.

[0119] Optionally, the evaluation index value corresponding to the dark current parameter can be compared and analyzed with the theoretical value of the dark current parameter, and the first performance degradation result of the dark current parameter can be determined based on the analysis results.

[0120] For example, the first performance degradation level can be graded, such as into low performance degradation level, medium performance degradation level and high performance degradation level; further, an error threshold is set for each first performance degradation level, and the first performance degradation result of the dark current parameter is determined according to the error between the evaluation index value corresponding to the dark current parameter and the theoretical value.

[0121] S602, based on the evaluation index value corresponding to the breakdown voltage parameter, determine the second performance degradation result of the breakdown voltage parameter.

[0122] The second degradation performance result characterizes the degradation of the breakdown voltage parameter.

[0123] Optionally, the evaluation index value corresponding to the breakdown voltage parameter can be compared and analyzed with the theoretical value of the breakdown voltage parameter, and the second performance degradation result of the breakdown voltage parameter can be determined based on the analysis results.

[0124] For example, the degree of second performance degradation can be graded, such as into low performance degradation, medium performance degradation and high performance degradation; further, an error threshold is set for each degree of second performance degradation, and the second performance degradation result of the breakdown voltage parameter is determined based on the error between the evaluation index value corresponding to the breakdown voltage parameter and the theoretical value.

[0125] For example, the theoretical breakdown voltage for silicon-based single-photon detectors is typically 20-30V. For indium gallium arsenide (IGaAs) single-photon detectors, the theoretical breakdown voltage is typically 55-65V.

[0126] S603 determines the third performance degradation result corresponding to the noise parameter based on the evaluation index value corresponding to the noise parameter.

[0127] Among them, the third degradation performance result characterizes the degradation of the noise parameters.

[0128] Optionally, the evaluation index value corresponding to the noise parameter can be compared and analyzed with the theoretical value of the noise parameter, and the third performance degradation result of the noise parameter can be determined based on the analysis results.

[0129] For example, the degree of third performance degradation can be classified into levels such as low performance degradation, medium performance degradation, and high performance degradation. Furthermore, an error threshold is set for each degree of third performance degradation, and the result of third performance degradation of the noise parameter is determined based on the error between the evaluation index value and the theoretical value corresponding to the noise parameter.

[0130] S604. Based on the first performance degradation result, the second performance degradation result, and the third performance degradation result, the performance degradation of the detector under test is evaluated.

[0131] Optionally, the first performance degradation result, the second performance degradation result, and the third performance degradation result can be analyzed comprehensively. For example, the degradation values ​​in the first performance degradation result, the degradation values ​​in the second performance degradation result, and the degradation values ​​in the third performance degradation result can be accumulated, and the performance degradation of the detector under test can be evaluated based on the accumulated value.

[0132] In this embodiment, by comprehensively considering the performance degradation results of different performance parameters, namely introducing the first degradation result, the second degradation result, and the third degradation result, the comprehensiveness and accuracy of the performance degradation assessment of the detector under test are ensured.

[0133] Figure 7 This is a flowchart illustrating a single-photon detector performance evaluation method in another embodiment. Based on the above embodiments, this embodiment provides an optional example of a single-photon detector performance evaluation method. (Combined with...) Figure 7 The specific implementation process is as follows:

[0134] S701 connects the detector under test to the performance test circuit to build a performance test environment.

[0135] The performance test circuit includes a voltage regulator, a protective resistor, a voltmeter, and an ammeter. The positive terminal of the voltage regulator is connected to the first terminal of the protective resistor, the negative terminal of the voltage regulator is connected to the first terminals of both the voltmeter and the ammeter, and the second terminal of the protective resistor is connected to the second terminal of the voltmeter. The detector under test is a single-photon detector.

[0136] Optionally, the positive terminal of the detector under test is connected to the second terminal of the ammeter, and the negative terminal of the detector under test is connected to the second terminal of the voltmeter.

[0137] Optionally, the performance testing environment may also include a light shield; in which the detector under test is located inside the light shield.

[0138] S702 applies voltage to the detector under test in the performance test environment according to the preset operating voltage range of the detector under test, so as to make the detector under test work.

[0139] S703, when the detector under test is in working condition, uses the sampling frequency corresponding to each performance degradation parameter of the detector under test to sample the electrical parameters of the detector under test respectively, and obtains the electrical time series corresponding to each performance degradation parameter.

[0140] Among them, the electrical parameters include the current flowing through the detector under test and the voltage across the detector under test; each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter and the noise parameter.

[0141] S704, based on the electrical time series corresponding to each performance degradation parameter, determines the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter.

[0142] S705, based on the test standard corresponding to the dark current parameter, determines the dark current value, ground fault current value and short-circuit instantaneous current value according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the dark current parameter.

[0143] S706, based on the test standard corresponding to the breakdown voltage, determines the breakdown voltage value according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the breakdown current parameter.

[0144] S707 determines the voltage and current variation information of the voltage under test at the sampling frequency corresponding to the noise parameter based on the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the noise parameter.

[0145] S708 determines the noise value of the detector under test under positive pressure, zero bias, and negative pressure based on voltage and current change information.

[0146] S709 determines the first performance degradation result of the dark current parameter based on the dark current value, the ground fault current value, and the short-circuit instantaneous current value.

[0147] S710 determines the second performance degradation result of the breakdown voltage parameter based on the breakdown voltage value.

[0148] S711, based on the noise value, determines the third performance degradation result corresponding to the noise parameter.

[0149] S712 evaluates the performance degradation of the detector under test based on the first performance degradation result, the second performance degradation result, and the third performance degradation result.

[0150] The specific processes of S701-S712 described above can be found in the description of the above method embodiments. Their implementation principles and technical effects are similar and will not be repeated here.

[0151] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0152] Based on the same inventive concept, this application also provides a single-photon detector performance evaluation device for implementing the single-photon detector performance evaluation method described above. The solution provided by this device is similar to the implementation described in the above method; therefore, the specific limitations in one or more embodiments of the single-photon detector performance evaluation device provided below can be found in the limitations of the single-photon detector performance evaluation method described above, and will not be repeated here.

[0153] In one exemplary embodiment, such as Figure 8 As shown, a single-photon detector performance evaluation device 800 is provided, including: an environment setup module 810, a voltage application module 820, an information determination module 830, an index evaluation module 840, and a performance evaluation module 850, wherein:

[0154] The environment setup module 810 is used to connect the detector under test to the performance test circuit to build a performance test environment; wherein, the detector under test is a single-photon detector.

[0155] The voltage application module 820 is used to apply voltage to the detector under test in the performance test environment according to the preset operating voltage range of the detector under test, so as to make the detector under test work.

[0156] The information determination module 830 is used to sample the electrical parameters of the detector under test using the sampling frequency corresponding to each performance degradation parameter of the detector under test when the detector under test is in operation, so as to obtain the electrical time series corresponding to each performance degradation parameter; wherein, the electrical parameters include the current flowing through the detector under test and the voltage across the detector under test; each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter and the noise parameter.

[0157] The indicator evaluation module 840 is used to determine the evaluation indicator value corresponding to each performance degradation parameter based on the power consumption time series corresponding to each performance degradation parameter.

[0158] The performance evaluation module 850 is used to evaluate the performance degradation of the detector under test based on the evaluation index values ​​corresponding to each performance degradation parameter.

[0159] The aforementioned single-photon detector performance evaluation device establishes a performance testing environment by connecting the detector under test (DUT) to a performance testing circuit. Based on the DUT's preset operating voltage range, a voltage is applied to the DUT within this environment to ensure its operational status, thus guaranteeing flexibility in both the testing environment and process. Furthermore, while the DUT is operational, the device samples its electrical parameters using the sampling frequencies corresponding to each performance degradation parameter, obtaining the electrical time series for each parameter. This enables real-time online monitoring of the DUT's current and voltage, with a flexibly adjustable sampling frequency. Finally, the electrical time series corresponding to each performance degradation parameter ensures the determination of the evaluation index values ​​for each parameter, further guaranteeing the accuracy of the evaluation results assessing the DUT's performance degradation.

[0160] In one embodiment, the performance test circuit includes a voltage regulator, a protective resistor, a voltmeter, and an ammeter; wherein the positive terminal of the voltage regulator is connected to the first terminal of the protective resistor, the negative terminal of the voltage regulator is connected to the first terminal of the voltmeter and the first terminal of the ammeter, and the second terminal of the protective resistor is connected to the second terminal of the voltmeter.

[0161] Accordingly, the environment setup module 810 is specifically used for:

[0162] Connect the positive terminal of the detector under test to the second terminal of the ammeter, and connect the negative terminal of the detector under test to the second terminal of the voltmeter.

[0163] In one embodiment, the performance testing environment further includes a light shield; wherein the detector under test is located inside the light shield.

[0164] In one embodiment, the indicator evaluation module 840 includes:

[0165] The curve determination unit is used to determine the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter, based on the electrical time series corresponding to each performance degradation parameter.

[0166] The performance evaluation unit is used to determine the evaluation index value corresponding to each performance degradation parameter based on the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter.

[0167] In one embodiment, the evaluation index values ​​corresponding to the dark current parameter include the dark current value, the ground fault current value, and the short-circuit instantaneous current value; the evaluation index values ​​corresponding to the breakdown voltage parameter include the breakdown voltage value; and the evaluation index values ​​corresponding to the noise parameter include the noise value.

[0168] In one embodiment, the indicator evaluation unit is specifically used for:

[0169] Based on the test standard corresponding to the dark current parameter, the dark current value, ground fault current value, and short-circuit instantaneous current value are determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the dark current parameter. Based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the breakdown current parameter. According to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the noise parameter, the voltage change information and current change information of the voltage under test at the sampling frequency corresponding to the noise parameter are determined. Based on the voltage change information and current change information, the noise value of the detector under test under positive voltage condition, the noise value under zero bias condition, and the noise value under negative voltage condition are determined.

[0170] In one embodiment, the performance evaluation module 850 is specifically used for:

[0171] Based on the evaluation index value corresponding to the dark current parameter, the first performance degradation result of the dark current parameter is determined; based on the evaluation index value corresponding to the breakdown voltage parameter, the second performance degradation result of the breakdown voltage parameter is determined; based on the evaluation index value corresponding to the noise parameter, the third performance degradation result of the noise parameter is determined; based on the first performance degradation result, the second performance degradation result, and the third performance degradation result, the performance degradation of the detector under test is evaluated.

[0172] Each module in the aforementioned single-photon detector performance evaluation device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device, or stored in the memory of a computer device as software, so that the processor can call and execute the corresponding operations of each module.

[0173] In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 9 As shown, the computer device includes a processor, memory, communication interface, display screen, and input device connected via a system bus. The processor provides computational and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage medium. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, NFC (Near Field Communication), or other technologies. When executed by the processor, the computer program implements a method for evaluating the performance of a single-photon detector.

[0174] Those skilled in the art will understand that Figure 9 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0175] In one exemplary embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0176] The detector under test is connected to the performance test circuit to build a performance test environment; the detector under test is a single-photon detector.

[0177] According to the preset operating voltage range of the detector under test, a voltage is applied to the detector under test in the performance test environment to make the detector under test work.

[0178] With the detector under test (DUT) in operation, the electrical parameters of the DUT are sampled using the sampling frequencies corresponding to the various performance degradation parameters of the DUT, to obtain the electrical time series corresponding to each performance degradation parameter. The electrical parameters include the current flowing through the DUT and the voltage across the DUT. Each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter, and the noise parameter.

[0179] Based on the power consumption time series corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter;

[0180] The performance degradation of the detector under test is evaluated based on the evaluation index values ​​corresponding to each performance degradation parameter.

[0181] In one embodiment, the performance test circuit includes a voltage regulator, a protection resistor, a voltmeter, and an ammeter;

[0182] In this circuit, the positive terminal of the voltage regulator is connected to the first terminal of the protective resistor, the negative terminal of the voltage regulator is connected to the first terminals of the voltmeter and the ammeter, and the second terminal of the protective resistor is connected to the second terminal of the voltmeter. Correspondingly, when the processor executes the computer program to connect the detector under test into the performance test circuit, it also performs the following steps:

[0183] Connect the positive terminal of the detector under test to the second terminal of the ammeter, and connect the negative terminal of the detector under test to the second terminal of the voltmeter.

[0184] In one embodiment, the performance testing environment further includes a light shield; wherein the detector under test is located inside the light shield.

[0185] In one embodiment, when the processor executes a computer program to determine the evaluation index value corresponding to each performance degradation parameter based on the power consumption time series corresponding to each performance degradation parameter, it also performs the following steps:

[0186] Based on the electrical time series corresponding to each performance degradation parameter, determine the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter; based on the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter.

[0187] In one embodiment, the evaluation index values ​​corresponding to the dark current parameter include the dark current value, the ground fault current value, and the short-circuit instantaneous current value; the evaluation index values ​​corresponding to the breakdown voltage parameter include the breakdown voltage value; and the evaluation index values ​​corresponding to the noise parameter include the noise value.

[0188] In one embodiment, when the processor executes a computer program to determine the evaluation index value corresponding to each performance degradation parameter based on the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter, it also performs the following steps:

[0189] Based on the test standard corresponding to the dark current parameter, the dark current value, ground fault current value, and short-circuit instantaneous current value are determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the dark current parameter. Based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the breakdown current parameter. According to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the noise parameter, the voltage change information and current change information of the voltage under test at the sampling frequency corresponding to the noise parameter are determined. Based on the voltage change information and current change information, the noise value of the detector under test under positive voltage condition, the noise value under zero bias condition, and the noise value under negative voltage condition are determined.

[0190] In one embodiment, when the processor executes a computer program to evaluate the performance degradation of the detector under test based on the evaluation index values ​​corresponding to each performance degradation parameter, it also performs the following steps:

[0191] Based on the evaluation index value corresponding to the dark current parameter, the first performance degradation result of the dark current parameter is determined; based on the evaluation index value corresponding to the breakdown voltage parameter, the second performance degradation result of the breakdown voltage parameter is determined; based on the evaluation index value corresponding to the noise parameter, the third performance degradation result of the noise parameter is determined; based on the first performance degradation result, the second performance degradation result, and the third performance degradation result, the performance degradation of the detector under test is evaluated.

[0192] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, the computer program performing the following steps when executed by a processor:

[0193] The detector under test is connected to the performance test circuit to build a performance test environment; the detector under test is a single-photon detector.

[0194] According to the preset operating voltage range of the detector under test, a voltage is applied to the detector under test in the performance test environment to make the detector under test work.

[0195] With the detector under test (DUT) in operation, the electrical parameters of the DUT are sampled using the sampling frequencies corresponding to the various performance degradation parameters of the DUT, to obtain the electrical time series corresponding to each performance degradation parameter. The electrical parameters include the current flowing through the DUT and the voltage across the DUT. Each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter, and the noise parameter.

[0196] Based on the power consumption time series corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter;

[0197] The performance degradation of the detector under test is evaluated based on the evaluation index values ​​corresponding to each performance degradation parameter.

[0198] In one embodiment, the performance test circuit includes a voltage regulator, a protection resistor, a voltmeter, and an ammeter;

[0199] In this circuit, the positive terminal of the voltage regulator is connected to the first terminal of the protective resistor, the negative terminal of the voltage regulator is connected to the first terminals of the voltmeter and the ammeter, and the second terminal of the protective resistor is connected to the second terminal of the voltmeter. Correspondingly, when the processor executes the computer program to connect the detector under test into the performance test circuit, it also performs the following steps:

[0200] Connect the positive terminal of the detector under test to the second terminal of the ammeter, and connect the negative terminal of the detector under test to the second terminal of the voltmeter.

[0201] In one embodiment, the performance testing environment further includes a light shield; wherein the detector under test is located inside the light shield.

[0202] In one embodiment, when the processor executes a computer program to determine the evaluation index value corresponding to each performance degradation parameter based on the power consumption time series corresponding to each performance degradation parameter, it also performs the following steps:

[0203] Based on the electrical time series corresponding to each performance degradation parameter, determine the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter; based on the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter.

[0204] In one embodiment, the evaluation index values ​​corresponding to the dark current parameter include the dark current value, the ground fault current value, and the short-circuit instantaneous current value; the evaluation index values ​​corresponding to the breakdown voltage parameter include the breakdown voltage value; and the evaluation index values ​​corresponding to the noise parameter include the noise value.

[0205] In one embodiment, when the processor executes a computer program to determine the evaluation index value corresponding to each performance degradation parameter based on the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter, it also performs the following steps:

[0206] Based on the test standard corresponding to the dark current parameter, the dark current value, ground fault current value, and short-circuit instantaneous current value are determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the dark current parameter. Based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the breakdown current parameter. According to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the noise parameter, the voltage change information and current change information of the voltage under test at the sampling frequency corresponding to the noise parameter are determined. Based on the voltage change information and current change information, the noise value of the detector under test under positive voltage condition, the noise value under zero bias condition, and the noise value under negative voltage condition are determined.

[0207] In one embodiment, when the processor executes a computer program to evaluate the performance degradation of the detector under test based on the evaluation index values ​​corresponding to each performance degradation parameter, it also performs the following steps:

[0208] Based on the evaluation index value corresponding to the dark current parameter, the first performance degradation result of the dark current parameter is determined; based on the evaluation index value corresponding to the breakdown voltage parameter, the second performance degradation result of the breakdown voltage parameter is determined; based on the evaluation index value corresponding to the noise parameter, the third performance degradation result of the noise parameter is determined; based on the first performance degradation result, the second performance degradation result, and the third performance degradation result, the performance degradation of the detector under test is evaluated.

[0209] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, performs the following steps:

[0210] The detector under test is connected to the performance test circuit to build a performance test environment; the detector under test is a single-photon detector.

[0211] According to the preset operating voltage range of the detector under test, a voltage is applied to the detector under test in the performance test environment to make the detector under test work.

[0212] With the detector under test (DUT) in operation, the electrical parameters of the DUT are sampled using the sampling frequencies corresponding to the various performance degradation parameters of the DUT, to obtain the electrical time series corresponding to each performance degradation parameter. The electrical parameters include the current flowing through the DUT and the voltage across the DUT. Each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter, and the noise parameter.

[0213] Based on the power consumption time series corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter;

[0214] The performance degradation of the detector under test is evaluated based on the evaluation index values ​​corresponding to each performance degradation parameter.

[0215] In one embodiment, the performance test circuit includes a voltage regulator, a protection resistor, a voltmeter, and an ammeter;

[0216] In this circuit, the positive terminal of the voltage regulator is connected to the first terminal of the protective resistor, the negative terminal of the voltage regulator is connected to the first terminals of the voltmeter and the ammeter, and the second terminal of the protective resistor is connected to the second terminal of the voltmeter. Correspondingly, when the processor executes the computer program to connect the detector under test into the performance test circuit, it also performs the following steps:

[0217] Connect the positive terminal of the detector under test to the second terminal of the ammeter, and connect the negative terminal of the detector under test to the second terminal of the voltmeter.

[0218] In one embodiment, the performance testing environment further includes a light shield; wherein the detector under test is located inside the light shield.

[0219] In one embodiment, when the processor executes a computer program to determine the evaluation index value corresponding to each performance degradation parameter based on the power consumption time series corresponding to each performance degradation parameter, it also performs the following steps:

[0220] Based on the electrical time series corresponding to each performance degradation parameter, determine the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter; based on the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter, determine the evaluation index value corresponding to each performance degradation parameter.

[0221] In one embodiment, the evaluation index values ​​corresponding to the dark current parameter include the dark current value, the ground fault current value, and the short-circuit instantaneous current value; the evaluation index values ​​corresponding to the breakdown voltage parameter include the breakdown voltage value; and the evaluation index values ​​corresponding to the noise parameter include the noise value.

[0222] In one embodiment, when the processor executes a computer program to determine the evaluation index value corresponding to each performance degradation parameter based on the voltage-current characteristic curve of the detector under test at the sampling frequency corresponding to each performance degradation parameter, it also performs the following steps:

[0223] Based on the test standard corresponding to the dark current parameter, the dark current value, ground fault current value, and short-circuit instantaneous current value are determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the dark current parameter. Based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the breakdown current parameter. According to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the noise parameter, the voltage change information and current change information of the voltage under test at the sampling frequency corresponding to the noise parameter are determined. Based on the voltage change information and current change information, the noise value of the detector under test under positive voltage condition, the noise value under zero bias condition, and the noise value under negative voltage condition are determined.

[0224] In one embodiment, when the processor executes a computer program to evaluate the performance degradation of the detector under test based on the evaluation index values ​​corresponding to each performance degradation parameter, it also performs the following steps:

[0225] Based on the evaluation index value corresponding to the dark current parameter, the first performance degradation result of the dark current parameter is determined; based on the evaluation index value corresponding to the breakdown voltage parameter, the second performance degradation result of the breakdown voltage parameter is determined; based on the evaluation index value corresponding to the noise parameter, the third performance degradation result of the noise parameter is determined; based on the first performance degradation result, the second performance degradation result, and the third performance degradation result, the performance degradation of the detector under test is evaluated.

[0226] It should be noted that the data involved in this application (including but not limited to data used for analysis, data stored, data displayed, etc.) are all information and data that have been fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0227] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0228] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0229] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for evaluating the performance of a single-photon detector, characterized in that, The method includes: The detector under test is connected to the performance test circuit to build a performance test environment; wherein, the detector under test is a single-photon detector; According to the preset operating voltage range of the detector under test, a voltage is applied to the detector under test in the performance test environment to make the detector under test work. When the detector under test is in operation, the electrical parameters of the detector under test are sampled using the sampling frequency corresponding to each performance degradation parameter of the detector under test, so as to obtain the electrical time series corresponding to each performance degradation parameter; wherein, the electrical parameters include the current flowing through the detector under test and the voltage across the detector under test; each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter and the noise parameter. Based on the electrical time series corresponding to each performance degradation parameter, the evaluation index value corresponding to each performance degradation parameter is determined; wherein, the evaluation index value corresponding to the dark current parameter includes the dark current value, the ground fault current value, and the short-circuit instantaneous current value, the evaluation index value corresponding to the breakdown voltage parameter includes the breakdown voltage value, and the evaluation index value corresponding to the noise parameter includes the noise value. The performance degradation of the detector under test is evaluated based on the evaluation index values ​​corresponding to each performance degradation parameter.

2. The method according to claim 1, characterized in that, The performance test circuit includes a voltage regulator, a protection resistor, a voltmeter, and an ammeter; Wherein, the positive terminal of the voltage regulator is connected to the first terminal of the protective resistor, the negative terminal of the voltage regulator is connected to the first terminal of the voltmeter and the first terminal of the ammeter, and the second terminal of the protective resistor is connected to the second terminal of the voltmeter; Accordingly, connecting the detector under test to the performance test circuit includes: Connect the positive terminal of the detector under test to the second terminal of the ammeter, and connect the negative terminal of the detector under test to the second terminal of the voltmeter.

3. The method according to claim 2, characterized in that, The performance testing environment also includes a light shield; wherein the detector under test is located inside the light shield.

4. The method according to claim 1, characterized in that, The step of determining the evaluation index value corresponding to each performance degradation parameter based on the power consumption time series corresponding to each performance degradation parameter includes: Based on the electrical time series corresponding to each performance degradation parameter, determine the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter. Based on the voltage and current characteristic curves of the detector under test at the sampling frequencies corresponding to each performance degradation parameter, the evaluation index values ​​corresponding to each performance degradation parameter are determined.

5. The method according to claim 4, characterized in that, The step of determining the evaluation index value corresponding to each performance degradation parameter based on the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to each performance degradation parameter includes: Based on the test standard corresponding to the dark current parameter, the dark current value, ground fault current value and short circuit instantaneous current value are determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the dark current parameter. Based on the test standard corresponding to the breakdown voltage, the breakdown voltage value is determined according to the voltage and current characteristic curve of the detector under test at the sampling frequency corresponding to the breakdown current parameter. Based on the voltage and current characteristic curves of the detector under test at the sampling frequency corresponding to the noise parameters, determine the voltage and current change information of the detector under test at the sampling frequency corresponding to the noise parameters. Based on the voltage change information and the current change information, the noise value of the detector under test under positive pressure, the noise value under zero bias, and the noise value under negative pressure are determined.

6. The method according to claim 1, characterized in that, The evaluation of the performance degradation of the detector under test based on the evaluation index values ​​corresponding to each performance degradation parameter includes: Based on the evaluation index value corresponding to the dark current parameter, determine the first performance degradation result of the dark current parameter; Based on the evaluation index value corresponding to the breakdown voltage parameter, the second performance degradation result of the breakdown voltage parameter is determined; Based on the evaluation index value corresponding to the noise parameter, determine the third performance degradation result corresponding to the noise parameter; The performance degradation of the detector under test is evaluated based on the first performance degradation result, the second performance degradation result, and the third performance degradation result.

7. A single-photon detector performance evaluation device, characterized in that, The device includes: An environment setup module is used to connect the detector under test to the performance test circuit to set up a performance test environment; wherein the detector under test is a single-photon detector. A voltage application module is used to apply voltage to the detector under test in the performance test environment according to the preset operating voltage range of the detector under test, so as to make the detector under test work. The information determination module is used to sample the electrical parameters of the detector under test (DUT) at the sampling frequency corresponding to each performance degradation parameter of the DUT when the DUT is in the working state, thereby obtaining the electrical time series corresponding to each performance degradation parameter; wherein, the electrical parameters include the current flowing through the DUT and the voltage across the DUT; each performance degradation parameter includes at least the dark current parameter, the breakdown voltage parameter, and the noise parameter; The indicator evaluation module is used to determine the evaluation indicator value corresponding to each performance degradation parameter based on the power time series corresponding to each performance degradation parameter; wherein, the evaluation indicator value corresponding to the dark current parameter includes the dark current value, the ground fault current value, and the short-circuit instantaneous current value; the evaluation indicator value corresponding to the breakdown voltage parameter includes the breakdown voltage value; and the evaluation indicator value corresponding to the noise parameter includes the noise value. The performance evaluation module is used to evaluate the performance degradation of the detector under test based on the evaluation index values ​​corresponding to each performance degradation parameter.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

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