Disk array test method, storage medium, electronic device, and program product

CN120066878BActive Publication Date: 2026-03-03INSPUR SUZHOU INTELLIGENT TECH CO LTD
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-04-24
Publication Date
2026-03-03

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Abstract

The application discloses a kind of magnetic disk array test method, storage medium, electronic equipment and program product, it is first to obtain the magnetic disk test data corresponding to magnetic disk test set;Then according to the magnetic disk test data, determine the magnetic disk array corresponding to different disk types in magnetic disk test set respectively, and the fault injection data corresponding to different disk arrays respectively;Finally, according to the fault injection data corresponding to different disk arrays respectively, test different disk arrays, and obtain the test result corresponding to different disk arrays respectively. Compared with the prior art, the application can obtain the fault injection data corresponding to different disk arrays according to the magnetic disk test data, and test different disk arrays using the fault injection data. The application realizes the automatic test of multiple disk arrays, without the need for individual configuration and test operation of each disk array to be tested, reducing the test workload and effectively improving the test efficiency.
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