Method of measuring thickness increase, strip gauge method, system and medium

Abstract

The application discloses a kind of measurement thickness increase method, strip steel thickness measurement method, system and medium, method includes: the tube voltage of X-ray thickness gauge is promoted to target voltage value from preset voltage value, and the tube current of X-ray thickness gauge is promoted to target current value from preset current value, the preset voltage value and the preset current value are the working parameters of X-ray thickness gauge under original thickness measurement range;Based on the multiple thicknesses corresponding to target thickness measurement range, the standard plate under each thickness is measured by multiple measurement channels of the X-ray thickness gauge, wherein the target thickness measurement range is greater than the original thickness measurement range;Based on the result that each measurement channel measures the standard plate of each thickness, the linearization curve of each measurement channel is determined, and the linearization curve is used to determine the thickness of the object to be measured.The above scheme can effectively increase the thickness measurement range of X-ray thickness gauge, and effectively save thickness cost.

Description

Technical Field

[0001] This invention relates to the field of thickness measurement, and in particular to a method for measuring thickness increase, a method for measuring the thickness of strip steel, a system, and a medium. Background Technology

[0002] In the current steel market, the types of strip steel produced are becoming increasingly diverse. Currently, for thick plate products, the X-ray thickness gauges installed at the finishing mill exit of existing rolling lines cannot meet the measurement requirements for ultra-thick rolling. Typically, the maximum measurement capability of an X-ray thickness gauge is 25.4 mm, which is insufficient for measuring strip steel thicker than 25.4 mm. While a separate X-ray single-point thickness gauge can be purchased to measure the thickness of thick plate products, this is costly, requires significant capital investment, and can only measure centerline thickness, failing to meet the measurement requirements for key indicators such as crown and wedge shape for thicker specifications. Summary of the Invention

[0003] This invention provides a method for measuring thickness increase, a method for measuring strip thickness, a system, and a medium.

[0004] In a first aspect, embodiments of the present invention provide a method for measuring thickness increase using an X-ray thickness gauge, comprising:

[0005] The tube voltage of the X-ray thickness gauge is increased from a preset voltage value to a target voltage value, and the tube current of the X-ray thickness gauge is increased from a preset current value to a target current value, wherein the preset voltage value and the preset current value are the operating parameters of the X-ray thickness gauge under the original thickness measurement range;

[0006] Based on multiple thicknesses corresponding to the target thickness measurement range, the standard plate at each thickness is measured through multiple measurement channels of the X-ray thickness gauge, wherein the target thickness measurement range is greater than the original thickness measurement range;

[0007] Based on the measurement results of the standard plate of each thickness using each measurement channel, a linearization curve for each measurement channel is determined, and the linearization curve is used to determine the thickness of the object to be measured.

[0008] In some embodiments, the standard plate includes a first type of standard plate and a second type of standard plate, wherein the first type of standard plate is a standard plate matched with the X-ray thickness gauge, and the second type of standard plate is different from the first type of standard plate. The method further includes:

[0009] Based on the measurement results of the first type of standard plate by the X-ray thickness gauge, the target reference for the first type of standard plate is determined;

[0010] Based on the measurement results of the second type of standard plate by the X-ray thickness gauge and the target reference, the reference of the second type of standard plate is corrected, and the thickness of the second type of standard plate is determined based on the corrected reference of the second type of standard plate.

[0011] In some embodiments, before measuring the standard plate at each thickness using multiple measurement channels of the X-ray thickness gauge based on multiple thicknesses corresponding to the target thickness measurement range, the method further includes:

[0012] The calibration value corresponding to each measurement channel is adjusted to a preset range when the shutter of the X-ray thickness gauge is opened.

[0013] In some embodiments, after measuring a standard plate at each thickness using multiple measurement channels of the X-ray thickness gauge based on multiple thicknesses corresponding to the target thickness measurement range, the method further includes:

[0014] If the measurement results of at least two target measurement channels do not meet the preset conditions, the standard plate at each thickness is remeasured through the target measurement channel based on the multiple thicknesses corresponding to the target thickness range, and the number of repetitions is recorded.

[0015] If the number of repetitions exceeds the preset number, a target alarm message is generated.

[0016] In some embodiments, after determining the linearization curve for each measurement channel, the method further includes:

[0017] Obtain the composition of the strip steel to be tested;

[0018] The X-ray thickness gauge is used to measure the strip steel to be measured, and the target measurement result is obtained.

[0019] The target thickness of the strip is determined based on the composition of the strip, the target measurement results, and the linearization curve of each measurement channel.

[0020] In some embodiments, before measuring the strip steel to be measured using the X-ray thickness gauge, the method further includes:

[0021] The X-ray thickness gauge performs basic calibration on the fixed standard plate built into the shutter mechanism of the X-ray thickness gauge based on the target voltage value and the target current value, using a standard plate of preset thickness.

[0022] In some implementations, the target thickness measurement range is 1 mm to 35 mm.

[0023] Secondly, embodiments of the present invention provide a method for measuring strip thickness, the method comprising:

[0024] Obtain the composition of the strip steel to be tested;

[0025] The strip steel to be measured is measured by an X-ray thickness gauge to obtain the target measurement result. The tube voltage of the X-ray thickness gauge is the target voltage value, and the tube current of the X-ray thickness gauge is the target current value. The target voltage value and the target current value are respectively greater than the preset voltage value and preset current value of the X-ray thickness gauge under the original thickness measurement range.

[0026] Based on the composition of the strip steel, the target measurement results, and the linearization curve of each measurement channel in the X-ray thickness gauge, the target thickness of the strip steel to be measured is determined.

[0027] The linearization curve of each measurement channel is obtained by measuring the standard plate at each thickness based on multiple thicknesses corresponding to the target thickness range under the target voltage value and the target current value, and the target thickness range is greater than the original thickness range.

[0028] Thirdly, embodiments of the present invention provide a thickness measurement system, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the program, it implements the steps in the above-mentioned X-ray thickness gauge thickness increase method and strip thickness measurement method.

[0029] Fourthly, embodiments of the present invention provide a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps in the above-described method for increasing the thickness of an X-ray thickness gauge and the method for measuring the thickness of a strip steel.

[0030] Fifthly, embodiments of the present invention provide a computer program product, the computer program product including a computer program, which, when executed by a processor, is used to load and execute the steps in the above-mentioned X-ray thickness gauge thickness measurement increase method and strip thickness measurement method.

[0031] The above-described one or more technical solutions in the embodiments of this application have at least the following technical effects:

[0032] The method for increasing the measurable thickness of an X-ray thickness gauge provided in this specification involves increasing the tube voltage and current of the X-ray thickness gauge from a preset value to a target value. The preset voltage and current values ​​are operating parameters within the original thickness measurement range. Based on multiple thicknesses corresponding to the target thickness measurement range, the X-ray thickness gauge measures a standard plate at each thickness using multiple measurement channels. The target thickness measurement range is greater than the original thickness measurement range. Based on the measurement results of each measurement channel on the standard plate of each thickness, a linearization curve for each measurement channel is determined for determining the thickness of the object to be measured. This solution increases the X-ray penetration capability of the original X-ray thickness gauge. By recalibrating the linearization curves of multiple channels, the thickness measurement range of the X-ray thickness gauge is increased without the need to purchase new equipment, effectively saving costs. Furthermore, it provides full coverage measurement capability for the convexity and wedge shape of the entire plate. Attached Figure Description

[0033] Figure 1 A flowchart illustrating a method for increasing the thickness of an X-ray thickness gauge, provided as an embodiment of this specification;

[0034] Figure 2 A schematic diagram illustrating a strip thickness measurement method provided in the embodiments of this specification;

[0035] Figure 3 This is a schematic diagram of a thickness measurement system provided in an embodiment of this specification. Detailed Implementation

[0036] The overall technical solution of this application embodiment is as follows: The tube voltage of the X-ray thickness gauge is increased from a preset voltage value to a target voltage value, and the tube current of the X-ray thickness gauge is increased from a preset current value to a target current value, wherein the preset voltage value and the preset current value are the operating parameters of the X-ray thickness gauge under the original thickness measurement range; based on multiple thicknesses corresponding to the target thickness measurement range, a standard plate at each thickness is measured through multiple measurement channels of the X-ray thickness gauge, wherein the target thickness measurement range is greater than the original thickness measurement range; based on the measurement results of the standard plate at each thickness using each measurement channel, a linearization curve for each measurement channel is determined, and the linearization curve is used to determine the thickness of the object to be measured.

[0037] The solution described in this specification can increase the X-ray penetration capability of the original X-ray thickness gauge. By re-linearizing the curves of multiple channels, the thickness measurement range of the X-ray thickness gauge is increased. No new equipment needs to be purchased, which effectively saves costs. It also has the ability to measure the convexity and wedge shape of the entire plate.

[0038] To better understand the above technical solutions, the technical solutions of the embodiments of this specification will be described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the embodiments of this specification and the specific features in the embodiments are detailed descriptions of the technical solutions of the embodiments of this specification, rather than limitations on the technical solutions of this specification. Unless otherwise specified, the embodiments of this specification and the technical features in the embodiments can be combined with each other.

[0039] First, it should be clarified that the term "and / or" in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0040] like Figure 1 The diagram shows a flowchart of a method for measuring thickness increase using an X-ray thickness gauge, as provided in an embodiment of this specification. The method includes the following steps:

[0041] S101: Increase the tube voltage of the X-ray thickness gauge from a preset voltage value to a target voltage value, and increase the tube current of the X-ray thickness gauge from a preset current value to a target current value, wherein the preset voltage value and the preset current value are the operating parameters of the X-ray thickness gauge under the original thickness measurement range;

[0042] S102: Based on multiple thicknesses corresponding to the target thickness measurement range, the standard plate at each thickness is measured through multiple measurement channels of the X-ray thickness gauge, wherein the target thickness measurement range is greater than the original thickness measurement range;

[0043] S103: Based on the measurement results of the standard plate of each thickness by each measurement channel, determine the linearization curve of each measurement channel, and the linearization curve is used to determine the thickness of the object to be measured.

[0044] The methods provided in the embodiments of this specification can be applied to hot rolling production lines, for example, to X-ray thickness gauges in hot rolling production lines, or to control systems of hot rolling production lines, without limitation.

[0045] In the embodiments of this specification, the X-ray thickness gauge can be a multi-functional X-ray thickness gauge, which includes multiple measurement channels. The multi-functional X-ray thickness gauge can be set at the hot rolling mill exit for measuring the thickness of the strip steel.

[0046] To better understand the measurement process of an X-ray thickness gauge, the principle of the X-ray thickness gauge is explained below. The working principle of X-rays is radiation penetration. When measuring the thickness of an object, the X-ray is turned on. As the X-rays penetrate the object, some of the rays are absorbed, while the unabsorbed rays reach the measuring head. The measuring head measures the intensity of the received X-rays and generates an ionizing current signal. This signal is proportional to the thickness of the strip, and the thickness of the object can be calculated based on this signal.

[0047] For hot rolling production lines, the harsh environment means that dust, scrap steel, and other foreign objects can interfere with the measurement path of the X-ray thickness gauge. Additionally, foreign objects on the shield or source window can raise the zero-point reference of the thickness gauge. To ensure the accuracy of the linearization calibration of the tester and to replicate the laboratory calibration environment, in this embodiment, the measurement channel and other components of the thickness gauge can be cleaned and maintained beforehand. For example, the source window can be cleaned, dust can be removed from the gaps between the ionization chamber shields, and any adhering substances on the surface of the ionization chamber shield can be polished. This eliminates the adverse effects of environmental factors on the measurement.

[0048] Typically, the existing range of an X-ray thickness gauge, i.e. the original thickness measurement range, is 1.0 mm to 25.4 mm. It cannot measure the thickness of objects larger than 25.4 mm. In this embodiment of the specification, in order to increase the thickness measurement, in step S101, the tube voltage of the X-ray thickness gauge is increased from a preset voltage value to a target voltage value, and the tube current of the X-ray thickness gauge is increased from a preset current value to a target current value.

[0049] It should be noted that the preset voltage and preset current values ​​are the operating parameters of the X-ray thickness gauge under its original thickness measurement range. For example, the original thickness measurement range can be 1.0mm to 25.4mm. Under the original thickness measurement range, the preset voltage value of the tube voltage is 155kV, and the preset current value of the tube current is 2.6mA.

[0050] Since the energy of X-ray photons depends on the energy of impacting electrons, and the electron energy is related to the tube voltage and tube current, in this embodiment of the specification, to improve the penetration power of X-rays, the tube voltage can be increased to a target voltage value, and the tube current can be increased to a target current value. Specifically, the target voltage value is greater than a preset voltage value, and the target current value is greater than a preset current value. In some embodiments, if the preset voltage value is 155kV, the target voltage value can be set to 160kV; if the preset tube current value is 2.6mA, the target current value can be set to 2.8mA.

[0051] In some embodiments, to minimize the energy consumption of the thickness gauge and for safety reasons, the target voltage and target current values ​​can be gradually increased. For example, the voltage can be increased from a preset voltage value to a first voltage value, and the tube current can be increased from a preset current value to a first current value. Then, the scheme of this application is executed. If it is detected during the test that X-rays cannot penetrate a standard plate of a certain thickness in the target thickness measurement range, the tube voltage and tube current are increased again until the increased voltage and current values ​​can ensure the measurement of any thickness in the target thickness measurement range. The final voltage and current values ​​are then used as the target voltage and target current values.

[0052] In the embodiments described in this specification, the target thickness measurement range is larger than the original thickness measurement range. The specific range of the target thickness measurement range can be set according to actual needs. In some embodiments, the target thickness measurement range is 1mm to 35mm.

[0053] In step S102, multiple thicknesses corresponding to the target thickness measurement range can be set according to actual needs. Taking the target thickness measurement range as 1mm to 35mm as an example, each 1mm can be a thickness, that is, the thicknesses corresponding to the target thickness measurement range are 1mm, 2mm, 3mm...35mm.

[0054] Because the tube voltage and tube current of the X-ray thickness gauge have changed from the original preset current and voltage values ​​to the target current and voltage values, the original linearization curve of the X-ray thickness gauge cannot be used. Therefore, it is necessary to recalibrate each thickness corresponding to the target thickness range in order to obtain a linearization curve corresponding to the target thickness range.

[0055] An X-ray thickness gauge includes multiple measurement channels. For example, an X-ray thickness gauge may have 114 measurement channels. For each measurement channel, a standard plate of each thickness is measured. Continuing with the example above, if it is necessary to measure 35 thicknesses from 1mm to 35mm, then 3990 measurement results will be obtained.

[0056] In the embodiments described in this specification, the standard plate matched with the X-ray thickness gauge may not be able to achieve the required thickness. For example, the cumulative thickness of the standard plates matched with the X-ray thickness gauge is only 30 mm, which cannot meet the requirements for thicknesses above 30 mm. In order to calibrate for thicknesses above 30 mm, it is necessary to use other types of standard plates, such as standard plates corresponding to other thickness gauges.

[0057] In some embodiments, the standard plate may include a first type of standard plate and a second type of standard plate, wherein the first type of standard plate is a standard plate matched with the X-ray thickness gauge, and the second type of standard plate is different from the first type of standard plate. Then, the thickness of the second type of standard plate can be recalibrated by the following steps: based on the measurement results of the first type of standard plate by the X-ray thickness gauge, a target reference for the first type of standard plate is determined; based on the measurement results of the second type of standard plate by the X-ray thickness gauge and the target reference, the reference of the second type of standard plate is corrected, so as to determine the thickness of the second type of standard plate based on the corrected reference of the second type of standard plate.

[0058] Specifically, the first type of standard plate is the one used with X-ray thickness gauges, while the second type is a standard plate that is not compatible with X-ray thickness gauges. For example, the second standard plate could be a standard plate used with other types of thickness gauges. The composition and materials of the first and second type standard plates may differ. If the second standard plate is directly used in a current X-ray thickness gauge for stacking, it will cause deviations in the measurement results. Therefore, the second type standard plate needs to be recalibrated before it can be stacked.

[0059] In some embodiments, the first type of standard plates may include 30 standard plates with a thickness of approximately 1 mm. It should be noted that each standard plate has its own corresponding thickness; for example, one standard plate may have a thickness of 1.02 mm, and another may have a thickness of 1.01 mm. Each thickness within the target thickness measurement range can be obtained by stacking different numbers of standard plates. For example, for a thickness of 8 mm, it can be obtained by stacking 8 first-type standard plates. Since the maximum cumulative thickness of the first-type standard plates is 30 mm, for thicknesses greater than 30 mm, a second type of standard plate needs to be stacked on top of the first-type standard plates. For example, for a thickness of 31 mm, 30 first-type standard plates and 1 second-type standard plate can be stacked. Therefore, for thicknesses from 1 mm to 35 mm, 30 first-type standard plates and 5 second-type standard plates can be used for measurement, with each second-type standard plate also having a thickness of approximately 1 mm.

[0060] It should be noted that because the second type of standard plate is incompatible with the currently used X-ray thickness gauge, the measured thickness and calibrated thickness of the second type of standard plate may have errors when measured under the current X-ray thickness gauge. For example, the calibrated thickness of one second type of standard plate may be 1.1 mm, but under the current X-ray thickness gauge, due to differences in tube voltage, tube current, and the composition and material of the second and first standard plates, the thickness of this standard plate may not be 1.1 mm. Therefore, it is necessary to perform benchmark correction on the second type of standard plate under the current X-ray thickness gauge. Specifically, a target benchmark for the first type of standard plate in the X-ray thickness gauge can be determined, and the benchmark for each second type of standard plate in the X-ray thickness gauge can be corrected based on the target benchmark to obtain the corresponding thickness of each second type of standard plate under the X-ray thickness gauge. This thickness is then used for thickness superposition. For example, a Type II standard plate has a calibrated thickness of 1.1 mm under its matched thickness gauge. By correcting the reference of the Type II standard plate under the current X-ray thickness gauge, the thickness of the standard plate under the current X-ray thickness gauge is calibrated to 1.03 mm. Then, when performing subsequent thickness stacking, the standard plate is stacked according to the 1.03 mm thickness.

[0061] In step S102, the X-ray thickness gauge measures the standard plate of each thickness through each measurement channel, thus obtaining the energy value of the X-rays received after X-rays penetrate each thickness. Therefore, for each measurement channel, each thickness corresponds to its own received X-ray energy value.

[0062] In some embodiments, in order to ensure that the X-ray thickness gauge emits stable rays, when using the X-ray thickness gauge, the tube voltage of the X-ray thickness gauge can be increased to the target voltage value, the tube current can be increased to the target current value, and the measurement can be performed after stabilizing for a preset time. The preset time can be set according to actual needs, for example, the preset time can be 1 hour, 1.5 hours, etc.

[0063] In some embodiments, in order to ensure the accuracy of the measurement results for each channel, the embodiments of this specification may also perform the following steps before measurement: adjusting the calibration value corresponding to each measurement channel when the shutter of the X-ray thickness gauge is opened to a preset range.

[0064] Specifically, when using an X-ray thickness gauge, open the X-ray shutter and adjust the calibration value (CS value) of each measurement channel within the preset range. This preset range can be set according to actual needs; for example, a CS value of 0.86 to 0.97. Within this range, it can be ensured that the measurement results will not drift or become invalid.

[0065] In step S103, for each measurement channel, through the measurement process in step S102, each thickness and the corresponding received X-ray energy value can be obtained. For each measurement channel, a linear fitting can be performed based on the thickness of the measurement channel and the X-ray energy value to obtain the linear fitting curve of the measurement channel.

[0066] Through the above process, the linearization curve of each measurement channel can be obtained. The linearization curve can show the correspondence between the received X-ray energy value and the thickness. The thickness of the object under test can be calculated using the linearization curve.

[0067] In this embodiment of the specification, the following steps can also be performed: if the measurement results corresponding to at least two target measurement channels are detected to not meet the preset conditions, then based on the multiple thicknesses corresponding to the target thickness measurement range, the standard plate at each thickness is remeasured through the target measurement channel, and the number of repetitions is recorded; if the number of repetitions is greater than the preset number, target alarm information is generated.

[0068] Specifically, the preset condition can be a preset accuracy. If the measurement accuracy of at least two target measurement channels exceeds the preset accuracy, it indicates that the measurement results are abnormal. This abnormality may be caused by improper measurement procedures, environmental factors, or a problem with the sensor element in the thickness gauge's ionization chamber. In this embodiment, when the measurement results of at least two target measurement channels fail to meet the preset condition, the problematic target measurement channel can be measured repeatedly to eliminate issues related to measurement parameters or the measurement environment. If the measurement results continue to fail to meet the preset condition, i.e., the number of repetitions exceeds the preset number, it indicates that the impact of the data anomaly cannot be eliminated through repeated measurements. It is highly likely that the sensor element is faulty and needs to be replaced. In this case, a target alarm message can be generated to prompt the user for manual troubleshooting. It should be noted that the preset number of times can be set according to actual needs, such as 3 or 4 times, etc., and is not limited here.

[0069] In the embodiments of this specification, the linearization curves of each measurement channel of the X-ray thickness gauge under the target voltage value and target current value can be obtained again through the above method. Based on the linearization curves, the thickness of the object to be measured can be detected.

[0070] Taking strip steel as an example, the process of determining the thickness of strip steel can be achieved in the following way: obtaining the composition of the strip steel to be measured; measuring the strip steel to be measured by the X-ray thickness gauge to obtain the target measurement result; and determining the target thickness of the strip steel to be measured based on the composition of the strip steel, the target measurement result, and the linearization curve of each measurement channel.

[0071] Specifically, since the composition of the strip to be tested differs from that of the standard plate, and different components absorb X-rays differently, it is necessary to obtain the composition of the strip to be tested, and compensate for the compositional differences between the strip to be tested and the standard plate by measuring the absorption degree of each component to X-rays. Then, based on the linearization curve and the target measurement results (such as the energy value of the received X-rays) obtained by the X-ray thickness gauge, the target thickness of the strip to be tested is calculated.

[0072] In the embodiments of this specification, in order to ensure the accuracy of the measurement results, the fixed standard plate built into the shutter mechanism of the X-ray thickness gauge can be calibrated periodically. For example, the fixed standard plate built into the shutter mechanism can be calibrated before each measurement, or it can be calibrated once every day, once a week, etc. There is no limitation here.

[0073] In some embodiments, a fixed standard plate can be calibrated using 2mm and 14mm standard plates. It should be noted that the basic calibration should be performed when the tube voltage is the target voltage value and the tube current is the target current value.

[0074] In the embodiments of this specification, considering the influence of different temperatures on X-ray energy and the influence of different angles on X-ray energy, when measuring the strip thickness, the temperature of the strip and the installation angle of the measuring channel can also be obtained, and compensation can be performed based on the temperature of the strip and the installation angle of the measuring channel to obtain a more accurate strip thickness.

[0075] In the embodiments of this specification, when the strip steel is thickness detected through different measurement channels, each measurement channel corresponds to the thickness of the strip steel at different positions in the width direction. Based on the thickness at different positions, the uniformity of strip steel thickness can be analyzed, and the convexity and wedge shape index of the strip steel can also be determined.

[0076] It should be noted that, due to the large number of measurement channels in X-ray thickness gauges (e.g., 114 channels), calibrating each channel for every thickness would generate a massive amount of measurement data. To reduce labor costs, in this embodiment, a movable trolley can be installed on each of the 114 measurement channels. The trolley can carry a standard plate, and the movement distance between adjacent measurement channels can be set based on the distance between them. Specifically, the trolley carrying the standard plate stays in the first measurement channel for a set duration to complete the standard plate test in that channel. Then, the trolley automatically moves a preset distance to the second measurement channel and stays there for a set duration to complete the standard plate test in that channel. This process is repeated for all 114 measurement channels to measure the standard plate of the current thickness. For each thickness of standard plate, the measurement can be completed across all 114 measurement channels, significantly reducing labor costs.

[0077] To illustrate the method for increasing the thickness of the X-ray thickness gauge provided in the embodiments of this specification, the following describes the linearization curve generation process and the strip measurement process of the X-ray thickness gauge using the measurement of thick plate and strip steel as an example. This process may include: ① Preparing a standard plate, ensuring the CS and CZ values ​​of the ionization chamber channel are normal and the X-ray path is free of foreign objects; ② Adjusting the booster tube voltage and current, and stabilizing the current state for 1 hour; ③ Opening the shutter of the X-ray thickness gauge, adjusting the CS value of the ionization chamber channel to 0.95, and testing whether X-rays can penetrate the thick plate; ④ If X-rays cannot penetrate the thick plate, returning to step ② and increasing the tube voltage and current again to increase the X-ray thickness. ⑤ If X-rays can penetrate the thick plate, linearize the curves of 114 ionization chamber channels based on the current voltage and current values, and calibrate 35 different thickness specifications (1mm to 35mm); ⑥ Perform basic verification using standard plates (2mm and 14mm) and the built-in fixing plate of the shutter mechanism; ⑦ Determine whether the accuracy of the test results meets the preset conditions. If not, return to step ① and replace the sensor element of the ionization chamber measurement channel, and repeat the above process. If it meets the conditions, proceed to step ⑧; ⑧ Roll the thick plate strip on-site, determine the alloy compensation, temperature compensation, and angle compensation of the measurement system, and obtain data for archiving and analysis. The above process ensures that the measurement accuracy meets the requirements and realizes the measurement function of the X-ray multi-functional thickness gauge for thick plates (25.4mm to 35mm).

[0078] In summary, the solutions provided in the embodiments of this specification enhance the X-ray penetration power by increasing the X-ray high-pressure intensity of existing equipment; and calibrate the plate thickness by re-linearizing the measurement channel, thereby improving the detection capability of the X-ray thickness gauge. Furthermore, the solutions provided in the embodiments of this specification do not require the purchase of additional equipment, effectively saving costs.

[0079] Based on the same inventive concept, embodiments of this specification also provide a method for measuring strip thickness, such as... Figure 2 As shown, the method includes:

[0080] Step S201: Obtain the composition of the strip steel to be tested;

[0081] Step S202: The strip steel to be measured is measured by an X-ray thickness gauge to obtain the target measurement result, wherein the tube voltage of the X-ray thickness gauge is the target voltage value, the tube current of the X-ray thickness gauge is the target current value, and the target voltage value and the target current value are respectively greater than the preset voltage value and the preset current value of the X-ray thickness gauge under the original thickness measurement range.

[0082] Step S203: Based on the composition of the strip steel, the target measurement results, and the linearization curve of each measurement channel in the X-ray thickness gauge, determine the target thickness of the strip steel to be measured;

[0083] The linearization curve of each measurement channel is obtained by measuring the standard plate at each thickness based on multiple thicknesses corresponding to the target thickness range under the target voltage value and the target current value, and the target thickness range is greater than the original thickness range.

[0084] The specific implementation of each step in the above method has been described in detail in the embodiment of the method for increasing the thickness of an X-ray thickness gauge provided in the specification, and will not be elaborated here.

[0085] Based on the same inventive concept, embodiments of the present invention also provide a thickness measurement system, such as... Figure 3 The aforementioned includes a memory 304, a processor 302, and a computer program stored in the memory 304 and executable on the processor 302. When the processor 302 executes the program, it implements any one of the following implementation methods: the method for increasing the thickness of an X-ray thickness gauge and the method for measuring the thickness of a strip.

[0086] Among them, Figure 3In this document, a bus architecture (represented by bus 300) is used. Bus 300 may include any number of interconnected buses and bridges, linking various circuits including one or more processors represented by processor 302 and memory represented by memory 304. Bus 300 may also link various other circuits such as peripheral devices, voltage regulators, and power management circuits, which are well known in the art and therefore will not be described further herein. Bus interface 305 provides an interface between bus 300 and receiver 301 and transmitter 303. Receiver 301 and transmitter 303 may be the same element, i.e., a transceiver, providing a unit for communicating with various other devices over a transmission medium. Processor 302 is responsible for managing bus 300 and general processing, while memory 304 can be used to store data used by processor 302 during operation.

[0087] Based on the same inventive concept, embodiments of this specification provide a computer-readable storage medium storing a computer program that, when executed by a processor, implements the steps of the above-described X-ray thickness gauge thickness measurement increase method and strip thickness measurement method.

[0088] Based on the same inventive concept, embodiments of this specification provide a computer program product, which includes a computer program that, when executed by a processor, loads and executes the steps of the above-described X-ray thickness gauge's method for increasing thickness and the strip thickness measurement method.

[0089] The functions described herein can be implemented in hardware, software executed by a processor, firmware, or any combination thereof. If implemented in software executed by a processor, the functions can be stored as one or more instructions or codes on or transmitted via a computer-readable medium. Other examples and embodiments are within the scope and spirit of this invention and the appended claims. For example, due to the nature of software, the functions described above can be implemented using software executed by a processor, hardware, firmware, hardwired, or any combination thereof. Furthermore, the functional units can be integrated into a single processing unit, or each unit can exist physically separately, or two or more units can be integrated into a single unit.

[0090] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. The device embodiments described above are merely illustrative; for example, the division of units can be a logical functional division, and in actual implementation, there may be other division methods. For instance, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the displayed or discussed mutual coupling, direct coupling, or communication connection may be through some interfaces; the indirect coupling or communication connection between units or modules may be electrical or other forms.

[0091] The units described as separate components may or may not be physically separate. Similarly, the components of the control device may or may not be physical units; they may be located in one place or distributed across multiple units. Some or all of the units can be selected to achieve the purpose of this embodiment, depending on actual needs.

[0092] If the integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, read-only memory (ROM), random access memory (RAM), portable hard drives, magnetic disks, or optical disks.

[0093] The above description is merely an embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of the claims of the present invention.

Claims

1. A method for measuring thickness increase using an X-ray thickness gauge, characterized in that, include: The tube voltage of the X-ray thickness gauge is increased from a preset voltage value to a target voltage value, and the tube current of the X-ray thickness gauge is increased from a preset current value to a target current value, wherein the preset voltage value and the preset current value are the operating parameters of the X-ray thickness gauge under the original thickness measurement range; Based on multiple thicknesses corresponding to the target thickness measurement range, the standard plate at each thickness is measured through multiple measurement channels of the X-ray thickness gauge, wherein the target thickness measurement range is greater than the original thickness measurement range; Based on the measurement results of the standard plate of each thickness by each measurement channel, a linearization curve for each measurement channel is determined, and the linearization curve is used to determine the thickness of the object to be measured; The standard plate includes a first type of standard plate and a second type of standard plate, wherein the first type of standard plate is a standard plate that matches the X-ray thickness gauge, and the second type of standard plate is different from the first type of standard plate. The method further includes: Based on the measurement results of the first type of standard plate by the X-ray thickness gauge, the target reference for the first type of standard plate is determined; Based on the measurement results of the second type of standard plate by the X-ray thickness gauge and the target reference, the reference of the second type of standard plate is corrected, and the thickness of the second type of standard plate is determined based on the corrected reference of the second type of standard plate.

2. The method as described in claim 1, characterized in that, Before measuring the standard plate at each thickness using multiple measurement channels of the X-ray thickness gauge based on multiple thicknesses corresponding to the target thickness measurement range, the method further includes: The calibration value corresponding to each measurement channel is adjusted to a preset range when the shutter of the X-ray thickness gauge is opened.

3. The method as described in claim 1, characterized in that, After measuring a standard plate at each thickness using multiple measurement channels of the X-ray thickness gauge based on multiple thicknesses corresponding to the target thickness measurement range, the method further includes: If the measurement results of at least two target measurement channels do not meet the preset conditions, the standard plate at each thickness is remeasured through the target measurement channel based on the multiple thicknesses corresponding to the target thickness range, and the number of repetitions is recorded. If the number of repetitions exceeds the preset number, a target alarm message is generated.

4. The method as described in claim 1, characterized in that, After determining the linearization curve for each measurement channel, the method further includes: Obtain the composition of the strip steel to be tested; The X-ray thickness gauge is used to measure the strip steel to be measured, and the target measurement result is obtained. The target thickness of the strip is determined based on the composition of the strip, the target measurement results, and the linearization curve of each measurement channel.

5. The method as described in claim 4, characterized in that, Before measuring the strip steel under test using the X-ray thickness gauge, the method further includes: The X-ray thickness gauge performs basic calibration on the fixed standard plate built into the shutter mechanism of the X-ray thickness gauge based on the target voltage value and the target current value, using a standard plate of preset thickness.

6. The method according to any one of claims 1-5, characterized in that, The target thickness measurement range is 1mm~35mm.

7. A method for measuring strip thickness, characterized in that, The method includes: Obtain the composition of the strip steel to be tested; The strip steel to be measured is measured by an X-ray thickness gauge to obtain the target measurement result. The tube voltage of the X-ray thickness gauge is the target voltage value, and the tube current of the X-ray thickness gauge is the target current value. The target voltage value and the target current value are respectively greater than the preset voltage value and preset current value of the X-ray thickness gauge under the original thickness measurement range. Based on the composition of the strip steel, the target measurement results, and the linearization curve of each measurement channel in the X-ray thickness gauge, the target thickness of the strip steel to be measured is determined. The linearization curve of each measurement channel is obtained by measuring the standard plate at each thickness based on multiple thicknesses corresponding to the target thickness measurement range under the target voltage value and the target current value, where the target thickness measurement range is greater than the original thickness measurement range. The standard plate includes a first type of standard plate and a second type of standard plate, wherein the first type of standard plate is a standard plate that matches the X-ray thickness gauge, and the second type of standard plate is different from the first type of standard plate. The method further includes: Based on the measurement results of the first type of standard plate by the X-ray thickness gauge, the target reference for the first type of standard plate is determined; Based on the measurement results of the second type of standard plate by the X-ray thickness gauge and the target reference, the reference of the second type of standard plate is corrected, and the thickness of the second type of standard plate is determined based on the corrected reference of the second type of standard plate.

8. A thickness measurement system, characterized in that, It includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the method as described in any one of claims 1-7.

9. A computer-readable storage medium, characterized in that, It stores a computer program that, when executed by a processor, implements the steps of the method according to any one of claims 1-7.

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