A control method for a test bench for high vacuum environments

Abstract

The application provides a control method of a test bed for a high vacuum environment. The test bed comprises a rotary table body, a base body, a first support plate moving along a first direction on the base body, a second support plate moving along a second direction on the first support plate, a third support plate rotating around a first axis, and an installation station on the third support plate for installing a test piece. An image acquisition mechanism is arranged on the third support plate and comprises an acquisition assembly arranged on the outer periphery of the installation station. The acquisition assembly rotates around the first axis and / or ascends and descends along a third direction. When the test piece has a special shape or performs a pitching action, the acquisition assembly adjusts the shooting angle and position flexibly through its rotation and ascension and the rotation of the third support plate, thereby effectively avoiding a shooting blind area, improving the shooting comprehensiveness, and providing comprehensive data support for accurately evaluating the performance of the test piece.

Description

Technical Field

[0001] This application relates to the field of vacuum test bench technology, and specifically to a control method for a test bench used in a high vacuum environment. Background Technology

[0002] When testing specimens in a high vacuum environment, image acquisition mechanisms are often needed to record information such as the specimen's state and performance. Patent application number 201921568581.3 proposes a high-low temperature turntable for high vacuum environments, with the image acquisition mechanism mounted on one side of the base. Although it has lifting and horizontal extension functions, this structure cannot flexibly adjust the shooting angle and position when facing specially shaped test specimens or when the test specimen undergoes complex movements such as pitch. This results in some areas of the specimen being in blind spots, making it impossible to acquire comprehensive image data, which greatly hinders the accurate evaluation of the specimen's performance and state. For example, in the aerospace field, when conducting vacuum environment simulation tests on some specially shaped aircraft components, the image acquisition mechanism of this structure cannot descend further after reaching the top of the aircraft component (obstructed by the top), making it difficult to capture images of the bottom area on the back of the component, thus preventing a complete analysis of its state changes during the test. Summary of the Invention

[0003] In view of the above-mentioned defects or deficiencies in the prior art, this application aims to provide a control method for a test bench in a high vacuum environment to overcome the limitations of image acquisition in traditional high vacuum environment test benches; In the first aspect, this application proposes a test bench for a high vacuum environment, comprising a turntable body installed inside a vacuum temperature change test chamber; The turntable body includes: The base body is fixed to the support frame inside the vacuum temperature change experimental chamber; A first support plate is disposed on the side of the base body away from the support frame, and the first support plate moves along a first direction on the base body; A second support plate is disposed on the side of the first support plate away from the base body. The second support plate moves on the first support plate along a second direction, which is perpendicular to the first direction. A third support plate is disposed on the side of the second support plate away from the first support plate. The third support plate rotates around a first axis and has an installation station for mounting the test piece. The extension direction of the first axis is a third direction, which is perpendicular to the first direction and the second direction, respectively. An image acquisition mechanism is provided on the third support plate. The image acquisition mechanism includes an acquisition component located on the outer periphery of the installation station. The acquisition component rotates around the first axis and / or moves up and down along the third axis.

[0004] According to the technical solution provided in the embodiments of this application, the acquisition component is rotated around the first axis and / or lifted and lowered along the third direction by a first driving component; the first driving component includes an annular slide groove disposed on the third support plate, the annular slide groove is disposed on the outer periphery of the installation station, the annular slide groove has a first slider, the first slider is vertically provided with a first lifting rod, and the acquisition component is provided at the end of the first lifting rod away from the first slider.

[0005] According to the technical solution provided in the embodiments of this application, a first rotating rod is vertically provided on the second support plate. The first rotating rod is connected to a second driving assembly for driving it to rotate around the first axis. A second rotating rod is vertically provided at the end of the first rotating rod away from the second support plate. The second rotating rod is connected to a third driving assembly for driving it to rotate around the second axis. The side of the second rotating rod away from the first rotating rod is connected to the third support plate. The extension direction of the second axis is the second direction.

[0006] Secondly, this application proposes a control method for a test bench in a high vacuum environment, based on the test bench for a high vacuum environment as described above; characterized in that: the control method includes the following steps: The test information of the test piece is obtained. The test information includes at least an environmental control sequence and a position control sequence. The environmental control sequence includes environmental data inside the vacuum temperature change test chamber at multiple test times. The environmental data includes the target vacuum degree and the target temperature. The position control sequence includes the first coordinates of the test piece at multiple test times. Based on the position control sequence, the first motion strategy of the turntable body is obtained; The vacuum temperature change test chamber is controlled to operate under the environmental control sequence, and the turntable body is controlled to move according to the first motion strategy, so that the test piece on the third support plate reaches the corresponding first coordinate at each test moment.

[0007] According to the technical solution provided in the embodiments of this application, the test information further includes test types, and the test types include at least static tests and dynamic tests; After obtaining the test information of the test piece, and before obtaining the first motion strategy of the turntable body according to the position control sequence, the following steps are also included: Determine the test type; If the test type is the static test, then multiple first initial images of the test piece are acquired to obtain a first initial image set; After controlling the turntable body to move using the first motion strategy, the method further includes the following steps: Multiple first test images of the test piece are acquired to obtain a first test image set; The test results of the test piece are obtained by comparing the first set of test images with the first set of initial images. After determining the test type, the following steps are also included: If the test type is the dynamic test, then the target test area corresponding to the dynamic test is obtained, and the target test area is the surface area of ​​the test piece; Based on the target test area, the second coordinates are obtained; Based on the current position coordinates of the acquisition component and the second coordinates, a second motion strategy is obtained; Before controlling the turntable body movement with the first motion strategy, the following steps are also included: The second motion strategy is used to control the movement of the acquisition component so that the acquisition component is aligned with the target test area.

[0008] According to the technical solution provided in the embodiments of this application, after controlling the movement of the acquisition component with the second motion strategy to align the acquisition component with the target test area, the method further includes the following steps: Acquire a second initial image of the test piece, wherein the second initial image is an image of the target test area when the test piece is in an initial state; The process of controlling the movement of the turntable body using the first motion strategy specifically includes the following steps: The turntable body is controlled to move using the first motion strategy, and a second test image captured by the acquisition component is obtained at each first preset time interval, and a second test image set consisting of multiple second test images is obtained in chronological order. After controlling the turntable body to move using the first motion strategy, the method further includes the following steps: Each of the second test images in the second test image set is compared with the second initial image to obtain the test result of the test piece.

[0009] According to the technical solution provided in the embodiments of this application, obtaining the second coordinates based on the target test area specifically includes the following steps: Obtain the three-dimensional structural model of the test piece and extract the geometric features of the target test area; Based on the geometric features, the exposure type of the target test area is determined, and the exposure type includes at least the recessed type; If the exposure type of the target test area is the concave type, then according to the concave direction, the point coordinates that make the shooting axis of the acquisition component parallel to the concave direction are obtained, and the point coordinates are used as the second coordinates.

[0010] According to the technical solution provided in the embodiments of this application, the exposure type also includes a protruding type; After determining the exposure type of the target test area, the following steps are also included: Extract the protrusion height of the target test area and the spatial distribution of adjacent structures; Based on the protrusion height, calculate the minimum vertical height of the acquisition component, and use the coordinates at the minimum vertical height as the coordinates directly above the target test area; Determine whether the spatial distribution of the adjacent structures would cause occlusion at the coordinates directly above. If not, use the coordinates directly above as the second coordinates.

[0011] According to the technical solution provided in the embodiments of this application, after determining whether the spatial distribution of the adjacent structures will cause occlusion of the coordinates directly above, the method further includes the following steps; If so, the coordinates directly above the target test area are offset according to the lateral exposure direction of the target test area to obtain the second coordinates, so that the angle between the shooting axis of the acquisition component and the lateral exposure direction is less than the first preset angle.

[0012] According to the technical solution provided in the embodiments of this application, after controlling the movement of the acquisition component with the second motion strategy, the method further includes the following steps: After the acquisition component reaches the second coordinate, it captures the current image of the target test area. Extract feature points of the test piece in the current image and calculate the offset vector of the feature points relative to a preset reference position; Based on the offset vector, a dynamic compensation instruction is generated to adjust the acquisition component until the offset vector is less than a first preset threshold.

[0013] Compared with existing technologies, the beneficial effects of this application are as follows: the image acquisition mechanism of this solution allows the acquisition component to rotate around a first axis and / or rise and fall along a third axis. Thus, when the test piece has a special shape or is undergoing pitch or other movements, the acquisition component can flexibly adjust the shooting angle and position through its own rotation and rise and fall, as well as the rotation of the third support plate, effectively avoiding blind spots. Therefore, it effectively solves the problem of blind spots caused by special test piece shapes or complex movements in traditional methods, improves the comprehensiveness of image acquisition, and ensures that images can be acquired from all parts of the test piece and in all movement states, providing comprehensive data support for accurately evaluating test piece performance. The structural design of this test bench makes it suitable for test pieces of various shapes and with different testing requirements, greatly expanding the application range of the test bench in high vacuum environments. For example, in the aerospace field, when conducting vacuum environment simulation tests on some specially shaped aircraft components, if it is necessary to photograph the area on the bottom of the back of the component, the acquisition component is controlled to rotate around the first axis to the back side, and then the height is adjusted to capture the image of that area. Attached Figure Description

[0014] Figure 1 A schematic diagram of the structure of a test bench for a high vacuum environment provided in an embodiment of this application; Figure 2 Provided for the embodiments of this application Figure 1 A partial schematic diagram of A in the middle; Figure 3 A top view of the test bench for a high vacuum environment provided in an embodiment of this application; Figure 4 Provided for the embodiments of this application Figure 3 A partial schematic diagram of B in the diagram; Figure 5 A flowchart illustrating the steps of a control method for a test bench in a high vacuum environment provided in an embodiment of this application.

[0015] The text labels in the image represent: 1. Vacuum temperature change experimental chamber; 2. Base body; 3. First electric telescopic rod; 4. First support plate; 5. Ball screw; 6. Second support plate; 7. Third support plate; 8. First rotating rod; 9. Second rotating rod; 10. First slider; 11. First branch rod; 12. Second branch rod; 13. Data acquisition component; 14. First slide rail; 15. Annular slide groove; 16. Control system. Detailed Implementation

[0016] The present application will now be described in further detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and not intended to limit it. Furthermore, it should be noted that, for ease of description, only the parts relevant to the invention are shown in the accompanying drawings.

[0017] It should be noted that, unless otherwise specified, the embodiments and features described in this application are to be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0018] Example 1 As mentioned in the background section, in view of the problems in the prior art, this application proposes a test bench for a high vacuum environment, including: a turntable body installed in a vacuum temperature change test chamber 1; Please refer to Figure 1 , 2 As shown in Figures 3 and 4, the turntable body includes: Base body 2, which is fixed to a support frame inside the vacuum temperature change test chamber 1; A first support plate 4 is disposed on the side of the base body 2 away from the support frame, and the first support plate 4 moves along a first direction on the base body 2. The second support plate 6 is disposed on the side of the first support plate 4 away from the base body 2. The second support plate 6 moves on the first support plate 4 along a second direction, which is perpendicular to the first direction. The third support plate 7 is disposed on the side of the second support plate 6 away from the first support plate 4. The third support plate 7 rotates around the first axis and has an installation station for installing the test piece. The extension direction of the first axis is a third direction, which is perpendicular to the first direction and the second direction, respectively. An image acquisition mechanism is provided, which is mounted on the third support plate 7. The image acquisition mechanism includes an acquisition component 13 located on the outer periphery of the installation station. The acquisition component 13 rotates around the first axis and / or moves up and down along the third axis. The acquisition component 13 is a camera or camera with shooting function. Specifically, it also includes a control system 16 located outside the vacuum temperature change test chamber 1, which is used to control the environment inside the vacuum temperature change test chamber 1, control the movement of the turntable body, and collect and process experimental data inside the vacuum temperature change test chamber 1. The control system 16 is mainly used to execute the control method of the subsequent embodiment 2. The control system 16 is electrically connected to each drive device on the turntable body.

[0019] In a preferred embodiment, a first rotating rod 8 is vertically provided on the second support plate 6. The first rotating rod 8 is connected to a second driving assembly for driving it to rotate around the first axis. A second rotating rod 9 is vertically provided at the end of the first rotating rod 8 away from the second support plate 6. The second rotating rod 9 is connected to a third driving assembly for driving it to rotate around a second axis. The extension direction of the second axis is the second direction.

[0020] Specifically, the first rotating rod 8 can be directly hinged to the third support plate 7 to achieve pitch, or it can be achieved through the second rotating rod 9, with the side of the second rotating rod 9 away from the first rotating rod 8 connected to the third support plate 7.

[0021] Specifically, the upper surface of the base body 2 is provided with a pair of parallel first electric telescopic rods 3. The ends of the pair of first electric telescopic rods 3 are respectively connected to the side of one side of the first support plate 4. The pair of first electric telescopic rods 3 drive the first support plate 4 to slide along the first direction on the upper surface of the base body 2. The first direction is the length direction of the base body 2 (rectangular). The first support plate 4 is provided with a ball screw 5. The setting direction of the ball screw 5 is perpendicular to the first electric telescopic rod 3. A connector is threaded on the ball screw 5. A second support plate 6 is fixed on the side surface of the connector away from the ball screw 5. A third support plate 7 is provided above the second support plate 6. A first rotating rod 8 is vertically arranged between the second support plate 6 and the third support plate 7. The second support plate 6 is provided with a second driving component that drives the first rotating rod 8 to rotate and a third driving component that drives the second rotating rod 9 to rotate. The second rotating rod 9 and the first rotating rod 8 cooperate to achieve a motion state that can both rotate and pitch, simulating more diverse scenarios. The base body 2 has a first slide rail 14 recessed inwards corresponding to the first electric telescopic rod 3. The surface of the first support plate 4 near the base body 2 is provided with balls corresponding to the first slide rail 14. Balls are provided on both sides of the first support plate 4 corresponding to any one of the first slide rails 14. The balls are rotatably engaged in the first slide rail 14.

[0022] In a preferred embodiment, the acquisition component 13 is rotated around the first axis and / or lifted and lowered along the third direction by a first driving component; the first driving component includes an annular groove 15 disposed on the third support plate 7, the annular groove 15 is disposed on the outer periphery of the installation station, the annular groove 15 has a first slider 10 inside, the first slider 10 is vertically provided with a first lifting rod, and the acquisition component 13 is provided at the end of the first lifting rod away from the first slider 10.

[0023] Specifically, the third support plate 7 is provided with an annular groove 15. A first lifting rod is fixedly connected to the first slider 10, which is slidably connected to the annular groove 15. The first lifting rod is a first branch rod 11. A second branch rod 12 is vertically connected to the end of the first branch rod 11. The first branch rod 11 is vertically fixedly connected to the first slider 10. The end of the first branch rod 11 away from the first slider 10 is connected to the second branch rod 12. The acquisition component 13 is movably mounted on the second branch rod 12. The first branch rod 11 moves up and down, and the second branch rod 12 extends and retracts horizontally.

[0024] Specifically, the annular groove 15 can be circular, providing 360° omnidirectional rotation, allowing the acquisition component 13 to capture images of the test piece without blind spots. When the center of the circle coincides with the first axis, the distance between the acquisition component 13 and the test piece remains relatively stable during rotation around the axis, which is beneficial to the stability and consistency of image acquisition. It can also be elliptical, suitable for situations where the test piece requires a wider shooting angle in certain directions or has a special motion trajectory. When the test piece has a large range of motion in a certain direction, the elliptical annular groove 15 allows the acquisition component 13 more room to move in that direction, better tracking the movement of the test piece. For small test pieces, the annular groove 15 is relatively close to the test piece, selected as 100-300 mm. This ensures image clarity while fully utilizing the shooting angle of the acquisition component 13 to obtain more details. For large test pieces, in order to capture the entire appearance and overall motion state of the test piece, the annular groove 15 may need to be 300-1000 mm away from the test piece.

[0025] Based on this test bench for high vacuum environments, multiple shooting modes can be achieved, such as 360° surround shooting: the acquisition component 13 rotates around the first axis within the circular annular slide 15, enabling 360° all-around surround shooting of the test piece, completely recording the state of the test piece from various angles, such as capturing the entire surface of a spherical test piece. Pitch shooting: through the cooperation of the second rotating rod 9 and the first rotating rod 8, the acquisition component 13 can achieve pitch movement, thereby capturing images of the test piece from different angles, such as capturing images of a test piece in an inclined state from multiple angles, simulating the observation of the test piece from different heights and angles. Multi-angle tracking shooting: when the test piece moves, the acquisition component 13 can not only rotate around the first axis, but also track the movement of the test piece from multiple angles through the position adjustment of the annular slide 15 and the lifting and lowering of the first branch rod 11 and the horizontal extension and retraction of the second branch rod 12, such as capturing images of a part of a small aircraft model performing a complex motion trajectory inside the vacuum temperature change test chamber 1. Zoom shooting: By horizontally extending and retracting the second branch rod 12, the distance between the acquisition component 13 and the test piece can be adjusted to achieve a zoom-like effect. It can capture the overall or partial details of the test piece as needed, such as taking close-up shots of some small parts on the test piece.

[0026] Based on this test bench for high vacuum environments, a multi-mode imaging principle is implemented: the first support plate 4 moves along a first direction on the base body 2, and the second support plate 6 moves along a second direction on the first support plate 4, allowing the third support plate 7 and the acquisition component 13 on it to be adjusted in two dimensions on a plane, enabling alignment with different positions of the test specimen. Simultaneously, the acquisition component 13 is raised and lowered along a third direction via the first lifting rod in the first drive assembly, achieving position adjustment in three-dimensional space to ensure a suitable imaging position. The third support plate 7 rotates around a first axis, allowing the acquisition component 13 mounted on it to be adjusted horizontally around this axis. The second rotating rod 9 and the first rotating rod 8 cooperate to enable the acquisition component 13 to perform pitch motion, further increasing the dimension of angle adjustment and enabling imaging of the specimen from different tilt angles. When the test piece moves, the control system 16 controls the movement of the first support plate 4 and the second support plate 6, the rotation of the third support plate 7, and the rotation, lifting and stretching of the acquisition component 13 according to the movement trajectory of the test piece and the preset shooting strategy, so that the acquisition component 13 can track the movement of the test piece in real time and maintain effective shooting of the test piece.

[0027] Example 2 Based on Example 1, this example proposes a control method for a test bench in a high vacuum environment, implemented using the test bench for a high vacuum environment as described above; Figure 5 As shown. The control method includes the following steps: S1. Obtain the test information of the test piece, the test information including at least an environmental control sequence and a position control sequence, the environmental control sequence including environmental data inside the vacuum temperature change test chamber 1 at multiple test times, the environmental data including target vacuum degree and target temperature, and the position control sequence including the first coordinates of the test piece at multiple test times; S2. Based on the position control sequence, obtain the first motion strategy of the turntable body; Specifically, based on the first coordinate in the position control sequence, the first motion strategy of the turntable body is calculated using kinematic algorithms and the motion capability of the turntable body.

[0028] For example, a satellite antenna model was tested, and the test information showed that the target vacuum level was [value missing] at the first second. Pa, target temperature -50°C, the first coordinate of the test piece is (10, 20, 30) (assuming this is a Cartesian coordinate system), at the 2nd second, the target vacuum degree is... Pa, target temperature -60°C, first coordinate (15, 25, 35). Based on this information, the control system 16 determines the moving distance of the first support plate 4 and the second support plate 6, and the rotation angle of the third support plate 7 by analyzing the difference of the first coordinate, in order to calculate the first motion strategy. For example, the first support plate 4 needs to move 5 units along the first direction, the second support plate 6 needs to move 5 units along the second direction, and the third support plate 7 needs to rotate a certain angle around the first axis to realize the transformation from the first position (the first coordinate corresponding to the 1st second) to the second position (the first coordinate corresponding to the 2nd second), and so on.

[0029] S3. Control the vacuum temperature change test chamber 1 to operate under the environmental control sequence, and control the movement of the turntable body with the first motion strategy so that the test piece on the third support plate 7 reaches the corresponding first coordinate at each test moment.

[0030] Based on the coordinate information in the position control sequence, the control system 16 converts the coordinates into motion commands for each moving component according to the motion capabilities and constraints of each part of the turntable body. For translational motion, the displacement of the corresponding support plate is calculated based on the coordinate differences at different times; for rotation, the rotation angle of the third support plate 7 is calculated based on the angle change. This ensures that the test piece can accurately reach the predetermined position at different test times, allowing the test to be conducted under specified spatial conditions, thereby improving the accuracy and repeatability of the test.

[0031] In a preferred embodiment, the test information further includes a test type, which includes at least a static test; After obtaining the test information of the test piece, and before obtaining the first motion strategy of the turntable body according to the position control sequence, the following steps are also included: Determine the test type; If the test type is the static test, then multiple first initial images of the test piece are acquired to obtain a first initial image set; After controlling the turntable body to move using the first motion strategy, the method further includes the following steps: Multiple first test images of the test piece are acquired to obtain a first test image set; The test results of the test piece are obtained by comparing the first set of test images with the first set of initial images.

[0032] Specifically, when the test type is determined to be a static test, the control system 16 first controls the acquisition component 13 to take multiple images of the stationary (before the vacuum cryogenic test) test piece from multiple angles, storing multiple initial images in a first initial image set. After the turntable body completes the test according to the first motion strategy, it takes another image of the test piece at the same position to obtain a first test image set. By matching image feature points and comparing pixel values, the first initial images and first test images at corresponding positions in the first test image set and the first initial image set are compared one by one to find the differences between the images and obtain the test result of the test piece.

[0033] For example, when performing static testing on a high-precision mechanical part, before the test, the acquisition component 13 takes multiple initial images of the part from different angles. After the test, the part remains in the same position, and a new set of test images is acquired. If a part undergoes a slight deformation during the test, a comparison between the first set of test images and the first set of initial images will reveal changes in the pixel values ​​or shifts in the feature point positions of the corresponding initial and test images. Then, considering the required precision for the part's application, the test result is obtained. For example, if the precision requirement is extremely high, and the part cannot deform to any extent when moving in a vacuum or low-temperature environment, then the test result is considered unqualified.

[0034] This embodiment provides an implementation method for acquiring images through the acquisition component 13 in a static testing scenario. It can acquire local images of the test piece from multiple angles to stitch them into a whole image, and can also acquire some local images of the test piece that are difficult to capture. For example, for the part of the test piece near the bottom, the third support plate 7 is tilted to lift the part, and the first slider 10 is slid to the corresponding direction of the part. By adjusting the height of the first split rod 11 and the extension length of the second split rod 12, the back side that cannot be captured by traditional solutions can be photographed.

[0035] In a preferred embodiment, the test type further includes dynamic testing; After determining the test type, the following steps are also included: If the test type is the dynamic test, then the target test area corresponding to the dynamic test is obtained, and the target test area is the surface area of ​​the test piece; Based on the target test area, the second coordinates are obtained; Specifically, a 3D model of the test piece is created or a known geometric model is used, and the geometric information of the test piece is stored in the control system 16. When the target test area is determined to be the surface area of ​​the test piece, its coordinates are determined by the relative positional relationship of this area on the test piece model.

[0036] Furthermore, obtaining the second coordinates based on the target test area specifically includes the following steps: Obtain the three-dimensional structural model of the test piece and extract the geometric features of the target test area; Specifically, a laser 3D scanner is used to scan the test piece from all directions to obtain accurate 3D point cloud data, which is then used to generate a 3D structural model. The geometric features include information such as the shape, size, and depth of the target test area.

[0037] Based on the geometric features, the exposure type of the target test area is determined, and the exposure type includes at least the recessed type; Specifically, the rules for determining the exposure type of the target test area are as follows: From a structural perspective, if the test piece has a recessed groove structure, and its target test area is located inside the groove or in a similar position, it is determined to be a recessed type. From the perspective of exposure: For a test piece with a regular shape, when placed in a specific manner at the installation position of the third support plate 7, if the target test area is not exposed when viewed from directly above, that is, when taking a picture from directly above, the target test area cannot be photographed due to obstruction by other parts of the test piece itself, this situation also belongs to the recessed type.

[0038] If the exposure type of the target test area is the concave type, then according to the concave direction, the point coordinates that make the shooting axis of the acquisition component 13 parallel to the concave direction are obtained, and the point coordinates are used as the second coordinates; For example, the test piece is a cube, standing on the third support plate 7 with one edge. The target test area is the bottom side of the cube near the third support plate 7, which needs to be dynamically tested. In the traditional solution, the test piece can only be photographed from above, which makes it impossible to perform dynamic testing on the target test area because the target test area cannot be photographed due to being blocked by the upper part. In this solution, when this situation is determined, the second coordinate is set at a point where the shooting axis of the acquisition component 13 is parallel to the concave direction, that is, the shooting is performed on the side that is flush with it, so as to achieve the technical effect of dynamic tracking and shooting, and adapt to more diverse test scenarios.

[0039] Furthermore, the exposure type also includes convex types; After determining the exposure type of the target test area, the following steps are also included: Extract the protrusion height of the target test area and the spatial distribution of adjacent structures; For example, modeling software is used to extract the protrusion height of the target test area (top surface of the small cylinder) and the spatial distribution information of adjacent structures (surrounding irregular structures) from the previously constructed 3D structural model. For instance, the software measures the height of the small cylinder to be 5mm, and simultaneously records the position, shape, and other information of the surrounding irregular structures. Based on the protrusion height, calculate the minimum vertical height of the acquisition component 13, and use the coordinates at the minimum vertical height as the coordinates directly above the target test area; Specifically, the lens angle and resolution of the acquisition component 13 are known. With the goal of clearly and completely capturing the target test area (the top surface of the small cylinder), the minimum vertical height is calculated (this height is based on ensuring image quality and coverage). The coordinates of the minimum vertical height from the target test area (the top surface of the small cylinder) are used as the coordinates directly above.

[0040] Determine whether the spatial distribution of the adjacent structures would cause occlusion at the coordinates directly above. Specifically, the model is analyzed using modeling software to determine whether the surrounding irregular structures at the coordinates directly above will obstruct the shooting line of the acquisition component 13.

[0041] If not, use the coordinates directly above as the second coordinates; If there is no obstruction, the calculated coordinates of the directly above position are used as the second coordinates. When the acquisition component 13 is actually moved, the control system of the test bench precisely controls the acquisition component 13 to move to the corresponding position based on the second coordinates.

[0042] Furthermore, after determining whether the spatial distribution of the adjacent structures would cause occlusion of the coordinates directly above, the method further includes the following steps; If so, the coordinates directly above the target test area are offset according to the lateral exposure direction of the target test area to obtain the second coordinates, so that the angle between the shooting axis of the acquisition component 13 and the lateral exposure direction is less than the first preset angle.

[0043] For example, in this scenario, the target test area is a marked area on the side of the protruding small cylinder, and the surrounding adjacent structures obstruct the view at the top coordinate. The lateral exposure direction of this marked area is parallel to a certain edge of the test piece. Assuming the first preset angle is 30°, the top coordinate is offset by the driving elements of the test bench along a direction with an angle less than 30° to the lateral exposure direction. For example, the angle between the shooting axis and the lateral exposure direction is set to 20°, and the offset coordinate is used as the second coordinate.

[0044] This embodiment aims to find a suitable shooting angle when the target test area of ​​the test piece is blocked by other structures from directly above the shooting path, so as to ensure that the shooting line of the acquisition component 13 is not obstructed.

[0045] Furthermore, if the exposure type of the target test area is planar, then the coordinates directly above the geometric center of the target test area are generated as the second coordinates. This is the easiest case to capture; simply move the acquisition component 13 directly above the target test area for vertical imaging.

[0046] For example, if the test piece is a regular cuboid, its center is located at the origin of a spatial rectangular coordinate system, and its length, width, and height are L, W, and H, respectively. Assuming the target test area is a face of the cuboid, its coordinate range is determined based on the face's position on the cuboid. If the target test area is part of the top face of the cuboid, its range can be determined using... arrive This means that here and The coordinates are the planar coordinates of the region on the top surface of the cuboid, with the center of the target test area used as the second coordinate. The second coordinate is calculated as , H is the height of the top surface of the cuboid, thus obtaining the center coordinates of the target test area, i.e., the second coordinates.

[0047] Based on the current position coordinates of the acquisition component 13 and the second coordinates, a second motion strategy is obtained; For example, the current position coordinates are known to be Calculate the difference between the current position coordinates and the second coordinate, and the displacement in the x-direction is: The displacement in the y direction is The displacement in the z-direction is .

[0048] Furthermore, a motion strategy is determined based on the displacement and the motion characteristics of the acquisition component 13. For example, if the acquisition component 13 reaches the target position through translational and vertical motion, and its motion speeds in the x, y, and z directions are respectively... , , Then the time required for the movement can be calculated. , , Linear interpolation is used to generate the corresponding motion trajectory, which is the second motion strategy. The motion trajectory equation is given by the equation at time t. Inside, the position of the acquisition component 13 in the x-direction is represented as , The positions in the y-direction and z-direction are obtained similarly.

[0049] Furthermore, after controlling the movement of the acquisition component 13 with the second motion strategy, the method further includes the following steps: After the acquisition component 13 reaches the second coordinate, the current image of the target test area is captured by the acquisition component 13. Extract feature points of the test piece in the current image and calculate the offset vector of the feature points relative to a preset reference position; Based on the offset vector, a dynamic compensation instruction is generated to adjust the acquisition component 13 until the offset vector is less than a first preset threshold.

[0050] Specifically, since the first driving components that drive the acquisition component 13 are all mechanical transmission components, their gaps and backlash errors can cause the actual position of the third support plate to deviate from the theoretical coordinates. Therefore, after the acquisition component 13 reaches the second coordinate, it is necessary to check in this embodiment whether the acquisition component has accurately reached the position to completely capture the target acquisition area. Specifically, during the movement, the position of the acquisition component is monitored in real time with the help of a position feedback sensor (such as an encoder). Once the acquisition component is detected to have reached the theoretical second coordinate position, the action of the first driving component is stopped immediately. Based on the initial calibration image of the test piece, at least 3 non-collinear feature points (such as edge intersections, laser etching marks, etc.) are marked in advance in the target test area. The SIFT (Scale Invariant Feature Transform) algorithm is used to extract the pixel coordinates of feature points from the current image. The pixel coordinates of the feature points in the current image are converted into three-dimensional spatial coordinates through camera calibration parameters (intrinsic parameter matrix, distortion coefficients), and compared with the three-dimensional coordinates of the preset reference position. The offset of each feature point in the X, Y, and Z directions is calculated. The average offset vector (including the average offset vector in the X direction, the average offset vector in the Y direction, and the average offset vector in the Z direction) is obtained based on the offset in the X, Y, and Z directions.

[0051] Specifically, the dynamic compensation commands include translation compensation and focus compensation. If the average offset vector in the X direction or the average offset vector in the Y direction exceeds a threshold (e.g., ±0.1mm), translation compensation is performed. Specifically, the acquisition component 13 is controlled to rotate along the annular slide 15 or the first lifting rod is raised or lowered to align the camera optical axis with the center of the target area. If the average offset vector in the Z direction exceeds the depth-of-field allowable range (determined by the lens optical parameters), focus compensation is performed. Specifically, the vertical height of the first lifting rod is adjusted to ensure that the target area is within the clear imaging focal plane.

[0052] Before controlling the turntable body movement with the first motion strategy, the following steps are also included: The acquisition component 13 is controlled to move using the second motion strategy so that it is aligned with the target test area.

[0053] Specifically, since the acquisition component 13 is mounted on the third support plate 7, it moves synchronously with the test piece when the first support plate 4 and the second support plate 6 translate, and when the third support plate 7 rotates and pitches. This allows for tracking and imaging of the test piece in a specific direction. For dynamic testing, the target test area on the surface of the test piece is first determined, such as the surface of a vulnerable component. Based on the location of this area, the second coordinate is calculated, and then the control system 16 controls the acquisition component 13 to move and align it with the target test area.

[0054] For example, when performing dynamic testing on a flight simulation component, if a certain area on the surface of its wing is set as the target test area, the second coordinates are obtained by measuring the position of this area in the coordinate system of the test component. Assuming the current position of the acquisition component 13 is (100, 100, 100), and the second coordinates of the target test area are (120, 120, 120), the control system 16 calculates the displacement required by the acquisition component 13 in each direction and generates a second motion strategy.

[0055] Furthermore, after controlling the movement of the acquisition component 13 with the second motion strategy to align the acquisition component 13 with the target test area, the method further includes the following steps: Acquire a second initial image of the test piece, wherein the second initial image is an image of the target test area when the test piece is in an initial state; The process of controlling the movement of the turntable body using the first motion strategy specifically includes the following steps: The turntable body is controlled to move using the first motion strategy, and a second test image captured by the acquisition component 13 is obtained at each first preset time interval, and a second test image set consisting of multiple second test images is obtained in sequence. After controlling the turntable body to move using the first motion strategy, the method further includes the following steps: Each of the second test images in the second test image set is compared with the second initial image to obtain the test result of the test piece.

[0056] Specifically, after the acquisition component 13 has aligned with the target test area according to the second motion strategy, the control system 16 triggers the image acquisition mechanism to capture one or more second initial images. These images clearly record the appearance, texture, structure, and other information of the target test area in its initial state. For example, for a satellite solar panel under test, if the target test area is a local area of ​​the panel, the acquisition component 13 will capture images of that area to obtain an initial state image unaffected by any environmental or performance testing. According to the first motion strategy, the control system 16 sends commands to each drive device of the turntable body to initiate movement. Simultaneously, during the turntable body's movement, the acquisition component 13 is triggered to capture a second test image every first preset time interval (e.g., every 0.5 seconds). These images are stored chronologically to form a second test image set. For example, when testing a rotating mechanical component, the turntable body can drive the component to rotate or translate, while the acquisition component 13 continuously captures images of the target test area at regular intervals. Using the image analysis algorithms mentioned above, each image in the second experimental image set is compared with the second initial image. Pixel-based comparison methods can be used, such as calculating the pixel difference between two images, or feature point matching algorithms (such as SIFT, SURF, or ORB algorithms) can be used to detect changes in image feature points. For testing mechanical parts, this can detect whether wear, deformation, displacement, or other problems occur during the part's movement; for electronic components, it can detect color changes caused by component heating, abnormal circuit connections, etc.

[0057] Specifically, the first motion strategy is based on the kinematic principle of the turntable body. According to the position control sequence at different times, the precise movement of the turntable is achieved by driving the moving parts (such as electric telescopic rods, ball screws 5, rotating rods, etc.) of the first support plate 4, the second support plate 6, and the third support plate 7.

[0058] This implementation method monitors the state changes of the target test area in real time during dynamic testing, promptly identifying potential performance problems or anomalies. For complex moving parts, it can track their performance evolution in detail, providing accurate data support for product performance evaluation and quality control.

[0059] In a preferred embodiment, acquiring multiple first initial images of the test piece to obtain a first initial image set specifically includes the following steps: Based on the structural parameters of the test piece, the test piece is divided into multiple total imaging areas; Based on the shooting wide-angle of the acquisition component 13, each of the total shooting areas is divided into multiple sub-shooting areas; Based on each of the sub-shooting regions, the third coordinates corresponding to each sub-shooting region are obtained; Arrange the third coordinates according to the positional order of the sub-shooting areas to obtain a coordinate sequence; The acquisition component 13 is controlled to move according to the coordinate sequence to obtain the first initial image captured when the acquisition component 13 is at each of the third coordinates, thereby obtaining the first initial image set.

[0060] Further, before dividing the test piece into multiple total imaging areas based on its structural parameters, the following steps are included: Determine whether the wide-angle lens of the acquisition component 13 is sufficient to cover the exposed surface of the test piece; The step of dividing the test piece into multiple total imaging areas based on the structural parameters of the test piece specifically includes the following steps: If not, the test piece is divided into multiple total shooting areas according to its structural parameters.

[0061] Specifically, the control system 16 acquires the wide-angle shooting parameters of the acquisition component 13 and, in conjunction with the geometric dimensions of the test piece, determines whether the acquisition component 13 can cover the exposed surface of the test piece in one go. The control system 16 calculates whether the surface of the test piece can be completely captured based on the length and width of the test piece and the horizontal and vertical viewing angles of the acquisition component 13.

[0062] If the wide-angle lens is insufficient to cover the exposed surface, the test piece is divided into multiple total shooting areas based on its structural parameters. For an irregularly shaped complex mechanical structure, the division is based on its functional components or geometric features; for a regular-shaped structure, it is divided into equal parts (e.g., a cylinder is divided into 3 total shooting areas from top to bottom). For each total shooting area, it is further divided into multiple sub-shooting areas based on the shooting wide-angle lens of the acquisition component 13. Considering the angular range of the shooting wide-angle lens, the total area is divided into several smaller areas to ensure that each sub-area is within the shooting range of the acquisition component 13 (e.g., for the 3 total shooting areas of a cylinder, each total shooting area is further divided into 4 sub-shooting areas). For each sub-shooting area, its corresponding third coordinate is calculated based on its position in the total area and the entire test piece. For example, based on its position in the spatial rectangular coordinate system, the intersection of the first extension line passing through the center point of the sub-shooting area (the first extension line is perpendicular to the tangent plane of the center point of the sub-shooting area) and the extension surface of the circular track is used as the third coordinate. The third coordinates of all the sub-shooting areas are arranged into a coordinate sequence according to their positional order so that the acquisition component 13 can access them sequentially. The control system 16 controls the acquisition component 13 to move to each third coordinate in turn according to the coordinate sequence, and takes pictures of the corresponding sub-shooting area to obtain the first initial image set.

[0063] This implementation method is suitable for large or complex-shaped test pieces to avoid missing some areas due to the limitations of wide-angle shooting. It ensures that the initial image set can fully reflect the initial state of the test piece, providing a complete reference for the detection of changes in subsequent tests, and helps to improve the reliability and completeness of the test.

[0064] In a preferred embodiment, after determining whether the wide-angle lens of the acquisition component 13 is sufficient to cover the exposed surface of the test piece, the method further includes the following steps: If so, control the acquisition component 13 to move to the fourth coordinate to obtain the first initial image captured under each different shooting parameter, thereby obtaining the first initial image set; the shooting parameters include at least exposure time and aperture size.

[0065] Specifically, when it is determined that the wide-angle lens of the acquisition component 13 is sufficient to cover the exposed surface of the test piece, the control system 16 moves the acquisition component 13 to the fourth coordinate (the position coordinates of the acquisition component 13 to capture the full view of the test piece) to obtain a full-view image of the test piece. Simultaneously, different shooting parameters are adjusted, such as changing the exposure time and aperture size, to obtain images with different lighting and depth-of-field effects. For example, for a small electronic chip, the acquisition component 13 is moved to a position directly above or diagonally above the chip, while adjusting the exposure time from short to long and the aperture from large to small to capture multiple sets of initial images. Under the fourth coordinate and different shooting parameters, the acquisition component 13 performs shooting operations and stores the captured images as the first initial image set.

[0066] For example, to test a microprocessor chip, the acquisition component 13 uses a wide-angle lens to cover the entire surface of the chip. The acquisition component 13 is moved above the center of the chip (fourth coordinate), and the exposure time is set to different combinations such as 1 ms, 5 ms, and 10 ms, and the aperture is set to f / 2.8, f / 4, and f / 5.6, and multiple sets of first initial images are obtained.

[0067] This implementation method obtains richer initial image data. For some test pieces whose surface details or textures are greatly affected by lighting, different exposure times and aperture combinations are used to better reveal their details, providing a more comprehensive reference for subsequent testing. This helps to detect problems that may occur under different lighting conditions, such as minor scratches on the surface and uneven coating.

[0068] This document uses specific examples to illustrate the principles and implementation methods of this application. The descriptions of the above embodiments are only for the purpose of helping to understand the methods and core ideas of this application. The above descriptions are merely preferred embodiments of this application. It should be noted that due to the limitations of written expression, while there are objectively infinite specific structures, those skilled in the art can make various improvements, modifications, or changes without departing from the principles of this invention, and can also combine the above technical features in an appropriate manner. These improvements, modifications, changes, or combinations, or the direct application of the inventive concept and technical solution to other situations without modification, should all be considered within the scope of protection of this application.

Claims

1. A control method for a test bench in a high vacuum environment, based on a test bench for a high vacuum environment, the test bench for a high vacuum environment comprising: The turntable body is installed inside the vacuum temperature change test chamber (1); The turntable body includes: The base body (2) is fixed on the support frame inside the vacuum temperature change test tank (1); The first support plate (4) is located on the side of the base body (2) away from the support frame, and the first support plate (4) moves along a first direction on the base body (2). The second support plate (6) is disposed on the side of the first support plate (4) away from the base body (2). The second support plate (6) moves on the first support plate (4) along a second direction, which is perpendicular to the first direction. The third support plate (7) is located on the side of the second support plate (6) away from the first support plate (4). The third support plate (7) rotates around the first axis and has an installation station for installing the test piece. The extension direction of the first axis is a third direction, which is perpendicular to the first direction and the second direction, respectively. An image acquisition mechanism is provided on the third support plate (7). The image acquisition mechanism includes an acquisition component (13) located on the outer periphery of the installation station. The acquisition component (13) rotates around the first axis and / or moves up and down along the third axis. The acquisition component (13) is rotated around the first axis and / or lifted along the third direction by the first drive component; the first drive component includes an annular slide groove (15) provided on the third support plate (7), the annular slide groove (15) is provided on the outer periphery of the installation station, the annular slide groove (15) has a first slider (10) in the annular slide groove (15), the first slider (10) is vertically provided with a first lifting rod, and the acquisition component (13) is provided at the end of the first lifting rod away from the first slider (10). A first rotating rod (8) is vertically provided on the second support plate (6). The first rotating rod (8) is connected to a second driving assembly for driving it to rotate around the first axis. A second rotating rod (9) is vertically provided at the end of the first rotating rod (8) away from the second support plate (6). The second rotating rod (9) is connected to a third driving assembly for driving it to rotate around the second axis. The side of the second rotating rod (9) away from the first rotating rod (8) is connected to the third support plate (7). The extension direction of the second axis is the second direction. The control method is characterized by the following steps: Obtain the test information of the test piece, the test information including at least an environmental control sequence and a position control sequence, the environmental control sequence including environmental data inside the vacuum temperature change test chamber (1) at multiple test times, the environmental data including the target vacuum degree and the target temperature, and the position control sequence including the first coordinate of the test piece at multiple test times; Based on the position control sequence, the first motion strategy of the turntable body is obtained; The vacuum temperature change test chamber (1) is controlled to operate under the environmental control sequence, and the turntable body is controlled to move in accordance with the first motion strategy so that the test piece on the third support plate (7) reaches the corresponding first coordinate at each test moment.

2. The control method for a test bench in a high vacuum environment according to claim 1, characterized in that: The test information also includes test types, which include static tests and dynamic tests. After obtaining the test information of the test piece, and before obtaining the first motion strategy of the turntable body according to the position control sequence, the following steps are also included: Determine the test type; If the test type is the static test, then multiple first initial images of the test piece are acquired to obtain a first initial image set; After controlling the turntable body to move using the first motion strategy, the method further includes the following steps: Multiple first test images of the test piece are acquired to obtain a first test image set; The test results of the test piece are obtained by comparing the first set of test images with the first set of initial images. After determining the test type, the following steps are also included: If the test type is the dynamic test, then the target test area corresponding to the dynamic test is obtained, and the target test area is the surface area of ​​the test piece; Based on the target test area, the second coordinates are obtained; Based on the current position coordinates of the acquisition component (13) and the second coordinates, a second motion strategy is obtained; Before controlling the turntable body movement with the first motion strategy, the following steps are also included: The acquisition component (13) is controlled to move using the second motion strategy so that the acquisition component (13) is aligned with the target test area.

3. The control method for a test bench in a high vacuum environment according to claim 2, characterized in that: After controlling the movement of the acquisition component (13) with the second motion strategy to align the acquisition component (13) with the target test area, the method further includes the following steps: Acquire a second initial image of the test piece, wherein the second initial image is an image of the target test area when the test piece is in an initial state; The process of controlling the movement of the turntable body using the first motion strategy specifically includes the following steps: The turntable body is controlled to move using the first motion strategy, and at each first preset time interval, a second test image captured by the acquisition component (13) is obtained, and a second test image set consisting of multiple second test images is obtained in sequence. After controlling the turntable body to move using the first motion strategy, the method further includes the following steps: Each of the second test images in the second test image set is compared with the second initial image to obtain the test result of the test piece.

4. The control method for a test bench in a high vacuum environment according to claim 2, characterized in that: The process of obtaining the second coordinates based on the target test area specifically includes the following steps: Obtain the three-dimensional structural model of the test piece and extract the geometric features of the target test area; Based on the geometric features, the exposure type of the target test area is determined, and the exposure type includes at least the recessed type; If the exposure type of the target test area is the concave type, then according to the concave direction, the point coordinates that make the shooting axis of the acquisition component (13) parallel to the concave direction are obtained, and the point coordinates are used as the second coordinates.

5. The control method for a test bench in a high vacuum environment according to claim 4, characterized in that: The exposure types also include convex types; After determining the exposure type of the target test area, the following steps are also included: Extract the protrusion height of the target test area and the spatial distribution of adjacent structures; Based on the protrusion height, calculate the minimum vertical height of the acquisition component (13), and use the coordinates at the minimum vertical height as the coordinates directly above the target test area; Determine whether the spatial distribution of the adjacent structures would cause occlusion at the coordinates directly above. If not, use the coordinates directly above as the second coordinates.

6. The control method for a test bench in a high vacuum environment according to claim 5, characterized in that: After determining whether the spatial distribution of the adjacent structures would cause occlusion at the coordinates directly above, the method further includes the following steps: If so, the coordinates directly above the target test area are offset according to the lateral exposure direction of the target test area to obtain the second coordinate, so that the angle between the shooting axis of the acquisition component (13) and the lateral exposure direction is less than the first preset angle.

7. The control method for a test bench in a high vacuum environment according to claim 2, characterized in that: After controlling the movement of the acquisition component (13) with the second motion strategy, the following steps are also included: After the acquisition component (13) reaches the second coordinate, the current image of the target test area is captured by the acquisition component (13); Extract feature points of the test piece in the current image and calculate the offset vector of the feature points relative to a preset reference position; Based on the offset vector, a dynamic compensation instruction is generated to adjust the acquisition component (13) until the offset vector is less than a first preset threshold.

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