一种桃园栽培方法
By using scientific plot allocation parameters and real-time monitoring, the problems of uneven seedling growth and low survival rate in traditional peach orchard cultivation have been solved, achieving more efficient and precise peach tree cultivation management and improving survival rate and resource utilization efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- JIANGSU DAQIN AGRI TECH CO LTD
- Filing Date
- 2025-03-19
- Publication Date
- 2026-07-17
AI Technical Summary
Current peach orchard cultivation techniques do not fully consider factors such as slope, soil moisture, and temperature, resulting in uneven seedling growth and a lower survival rate. Furthermore, traditional planting planning relies on experience and lacks scientific rigor and precision.
By measuring the slope and soil composition of the plots and combining them with climate records, plot allocation parameters are generated to carry out scientific planting density planning and seedling planting, monitor the seedling growth environment in real time, optimize water and fertilizer supply and pest and disease control, and establish a refined cultivation management system.
It improves land use efficiency, ensures suitable growing environment for seedlings, reduces growth problems caused by improper site selection, enhances the precision and controllability of cultivation, and reduces resource consumption and environmental impact.
Smart Images
Figure CN120240215B_ABST