一种MiniLED封装测试方法及测试设备
By combining beam irradiation and quantum dot fluorescent labeling with surface plasmon resonance and acoustic stimulation, the problem of performance degradation of micro-optical structures in Mini LED packaging testing was solved, enabling accurate evaluation and performance prediction of functionally sensitive areas and improving the reliability assessment capability of Mini LED packaging.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHENZHEN TONGXING HIGH TECHINDUTION EQUIP CO LTD
- Filing Date
- 2025-05-29
- Publication Date
- 2026-07-17
AI Technical Summary
Existing Mini LED packaging testing methods are unable to accurately predict the long-term performance of Mini LED packages with integrated micro-optical structures in real-world application environments, and cannot effectively identify potential early failure signs. Traditional accelerated aging tests cannot reflect the performance degradation mechanism of micro-optical structures.
Interference patterns are obtained by external light beam illumination, and functionally sensitive regions are determined by comparison with theoretical models. Quantum dot fluorescent markers are injected for monitoring. Surface plasmon resonance spectroscopy scanning and acoustic stimulation are used, combined with nonlinear optical material layers to record performance degradation, to achieve multispectral dynamic monitoring and performance prediction of functionally sensitive regions.
It can accurately identify functionally sensitive areas, monitor the working status of micro-optical structures in real time, detect potential defects early, quantify the degree of performance degradation, predict future trends, and improve the accuracy of reliability assessment for Mini LED packaging.
Smart Images
Figure CN120275357B_ABST