A method, device, medium and program product for testing an NVMe solid state disk

Abstract

The application discloses a kind of NVMe solid state disk test method, equipment, medium and program product, it is related to data processing field.The method comprises the following steps: when the temperature in the temperature control box reaches the preset temperature, the real-time temperature of the hard disk in the temperature control box is obtained;When the real-time temperature of the hard disk is kept in the stable temperature range, the reference performance data of the measured hard disk is obtained;The temperature in the temperature control box is adjusted from the preset temperature;The real-time performance data of the measured hard disk is obtained;According to the real-time performance data and reference performance data, the performance change data of the measured hard disk is determined;When the performance change data reaches the set change threshold, the fluctuation response temperature and fluctuation response time are determined;According to the fluctuation response time and the temperature difference between the preset temperature and the fluctuation response temperature in the temperature control box, the temperature fluctuation resistance test result of the measured hard disk is determined.The temperature fluctuation resistance of NVMe solid state disk can be accurately tested by the above method steps.

Description

Technical Field

[0001] This invention relates to the field of data processing technology, and in particular to a testing method, device, medium, and program product for NVMe solid-state drives. Background Technology

[0002] NVMe (Non-Volatile Memory Express) solid-state drives are hard disk drives that use non-volatile memory for fast storage. They connect directly to computer systems using a PCIe (peripheral component interconnect express) interface, support the NVMe protocol to optimize solid-state drive performance, and provide extremely high data transfer speeds and low latency. They are suitable for high-performance computing and data-intensive applications that require fast read and write operations.

[0003] In applications such as portable mobile devices, outdoor monitoring equipment, some industrial environments, and edge computing devices, there are often frequent fluctuations in ambient temperature, and temperature has a significant impact on the performance of NVMe solid-state drives.

[0004] Therefore, temperature fluctuation resistance testing of NVMe SSDs is crucial for ensuring their reliability and stability under different environmental conditions. Temperature fluctuation resistance testing assesses how the SSD's performance changes under different temperatures and temperature fluctuations, thus revealing the NVMe SSD's ability to maintain its performance unaffected by temperature fluctuations within a certain range.

[0005] Currently, there is a lack of technical solutions that can accurately test the temperature fluctuation resistance of NVMe hard drives. Summary of the Invention

[0006] To address the aforementioned technical problems and deficiencies, the purpose of this invention is to provide an NVMe solid-state drive testing method, equipment, media, and program product that can accurately test the temperature fluctuation resistance of NVMe hard drives.

[0007] To achieve the above objectives, in a first aspect, the present invention provides an NVMe solid-state drive (SSD) testing method, comprising: acquiring the real-time temperature of a hard drive under test (including an NVMe SSD) in a temperature-controlled chamber when the chamber temperature reaches a preset temperature; acquiring baseline performance data of the hard drive under test when the real-time temperature remains within a stable temperature range; controlling the temperature-controlled chamber to adjust the chamber temperature from the preset temperature when the baseline performance data is determined; acquiring real-time performance data of the hard drive under test when the chamber temperature changes; determining performance change data of the hard drive under test based on the real-time performance data and the baseline performance data; determining the chamber temperature fluctuation response temperature as the fluctuation response temperature when the performance change data reaches a set change threshold, and determining the adjustment time from the preset temperature to the fluctuation response temperature as the fluctuation response time; and determining the temperature fluctuation resistance test result of the hard drive under test based on the fluctuation response time and the temperature difference between the preset temperature and the fluctuation response temperature.

[0008] This invention employs the aforementioned technical solution to accurately test the temperature fluctuation resistance of NVMe solid-state drives (SSDs) by precisely controlling and monitoring temperature changes and corresponding performance changes within a temperature-controlled enclosure. First, after the temperature-controlled enclosure reaches a preset temperature and stabilizes, the baseline performance data of the tested SSD is recorded to ensure consistency at the starting point of the test. Then, the enclosure temperature is gradually adjusted to simulate temperature fluctuations that may be encountered in actual use, while continuously collecting real-time performance data from the SSD. By comparing the real-time performance data with the baseline performance data, the changes in SSD performance are quantified, and when the changes reach a preset threshold, the fluctuation response temperature and fluctuation response time are determined. These two parameters directly reflect the SSD's response speed and adaptability to temperature changes. Finally, by combining the fluctuation response time and the temperature change range, the SSD's temperature fluctuation resistance—its ability to maintain stable performance under temperature fluctuations—is comprehensively evaluated. This invention not only considers the SSD's performance under extreme temperatures but also the performance changes during temperature variations, providing a comprehensive assessment to ensure the reliability and stability of NVMe SSDs under various environmental conditions. This method allows for accurate testing of the performance stability of NVMe SSDs under temperature fluctuations, thereby evaluating their temperature fluctuation resistance.

[0009] In conjunction with some embodiments of the first aspect, in some embodiments, controlling the temperature control box to adjust the internal temperature from a preset temperature includes: generating a temperature control command based on a set temperature change rate; and sending the temperature control command to the temperature control box so that the temperature control box adjusts the internal temperature from the preset temperature.

[0010] By employing the technical solution described in the above embodiments, precise control of the internal temperature is achieved by generating temperature control commands based on a set temperature change rate and sending them to the temperature control chamber. This operational method makes the testing process more operable and controllable, avoiding arbitrariness in temperature adjustment and ensuring the consistency and repeatability of the test. For testers, being able to accurately adjust the temperature according to a predetermined test plan provides a reliable foundation for accurately evaluating the performance of the hard drive as a function of temperature, helps improve the standardization of the test, and ensures the accuracy and reliability of the test results.

[0011] In conjunction with some embodiments of the first aspect, in some embodiments, before generating a temperature control command based on a set temperature change rate, the method further includes: determining the temperature change rate based on a preset temperature and the volume of the temperature control chamber.

[0012] By adopting the technical solution of the above embodiments and considering the volume of the temperature control chamber, the determination of the temperature change rate can be more closely aligned with the actual testing environment. Temperature control chambers of different volumes will have different effects on temperature adjustment. By incorporating this into the calculation, the determination of the temperature change rate can be made more scientific and reasonable, improving the accuracy of the temperature adjustment process. This provides more targeted and effective data for subsequent performance testing of NVMe solid-state drives, better reflecting the true performance of the hard drive under different environments and providing more accurate conditions for hard drive performance evaluation.

[0013] In conjunction with some embodiments of the first aspect, in some embodiments, determining the temperature change rate based on a preset temperature and the volume of the temperature control chamber includes: calculating the temperature change rate according to a preset temperature change rate formula, the temperature change rate formula including: ; in, v Represents the rate of temperature change; v 0 Represents the rate of change of the reference temperature; T target This represents the target temperature that needs to be adjusted to; T preset Indicates the preset temperature; T ref Represents the reference temperature difference; V Indicates the volume of the temperature control box; V ref Indicates the reference volume; m and n These are control parameters.

[0014] The technical solution described in the above embodiments provides a standardized and quantifiable method for determining the rate of temperature change through this formulaic calculation. It considers multiple influencing factors, including the target temperature, preset temperature, and temperature control chamber volume, making the calculation of the rate of temperature change more rigorous and detailed. It can be flexibly adjusted according to different test conditions. By reasonably setting these parameters, various complex real-world environments can be simulated, providing an accurate basis for testing the performance of NVMe solid-state drives of different specifications under different temperature scenarios.

[0015] In conjunction with some embodiments of the first aspect, in some embodiments, the temperature fluctuation resistance test result of the tested hard drive is determined based on the fluctuation response time and the temperature difference within the enclosure between the preset temperature and the fluctuation response temperature. This includes: calculating the temperature fluctuation resistance test result using a preset temperature fluctuation resistance evaluation formula, which includes: ; Δ T = T r －T 0 ; Δ P ( t )= P ( t ) －P 0 ; in, S Δ represents the result of the temperature fluctuation resistance test. T Represents the temperature difference inside the chamber. T 0 Represents the preset temperature. T r Represents the fluctuating reaction temperature, Δ P ( t () represents performance change data. P ( t ) represents time t Real-time performance data at that time P 0 For baseline performance data, P th The set performance change threshold, t r Represents the fluctuation response time. α、β To adjust the parameters.

[0016] The technical solution described in the above embodiment introduces a temperature fluctuation resistance evaluation formula to calculate the temperature fluctuation resistance test results. This formula comprehensively considers multiple important factors, including the integral term of performance change data over time and the logarithmic term of the internal temperature difference. Furthermore, the weights can be adjusted according to different testing requirements by adjusting parameters. This makes the evaluation of temperature fluctuation resistance test results more comprehensive and detailed, avoiding the limitations of single-index evaluation. It can evaluate hard drive performance from multiple dimensions, such as performance changes over time and temperature differences, providing a scientific, quantitative, and adjustable evaluation method for accurately assessing the hard drive's resistance to temperature fluctuations. This facilitates more precise comparison and selection of different hard drives.

[0017] In conjunction with some embodiments of the first aspect, in some embodiments, the temperature fluctuation resistance test result of the hard drive under test is determined based on the fluctuation response time and the temperature difference between the preset temperature and the fluctuation response temperature inside the enclosure. Specifically, this includes: when the temperature inside the enclosure reaches the fluctuation response temperature, the real-time temperature of the hard drive at this time is determined as the hard drive response temperature; and the temperature fluctuation resistance test result is determined based on the hard drive response temperature, the fluctuation response time, and the temperature difference inside the enclosure.

[0018] The technical solution adopted in the above embodiments further refines the judgment indicators of the test results, making the evaluation of hard drive performance more accurate. The hard drive response temperature provides temperature information when hard drive performance begins to be affected, which, together with the fluctuation response time and the internal temperature difference, constitutes a more complete evaluation system. This provides testers with richer data dimensions, helping to understand the details of hard drive performance changes during temperature fluctuations more deeply and to more accurately assess the hard drive's temperature fluctuation resistance.

[0019] In conjunction with some embodiments of the first aspect, in some embodiments, after determining the temperature fluctuation resistance test result of the hard drive under test based on the fluctuation response time and the temperature difference between the preset temperature and the fluctuation response temperature, the method further includes: adjusting the temperature inside the enclosure from the fluctuation response temperature to the preset temperature; determining the recovery time for the real-time temperature of the hard drive to recover from the hard drive response temperature to the stable temperature range when the temperature inside the enclosure is adjusted to the preset temperature; and determining the temperature fluctuation recovery capability test result of the hard drive under test based on the recovery time.

[0020] The technical solution described in the above embodiments further improves the testing method, extending the testing of NVMe solid-state drives (SSDs) to the evaluation of thermal recovery performance. It not only focuses on the drive's resistance during temperature increases but also considers its recovery capability during temperature decreases, making the performance evaluation of NVMe SSDs more comprehensive. By measuring recovery time, a better understanding of the drive's self-regulation and recovery capabilities after temperature fluctuations can be obtained, providing a more complete evaluation of the product's performance in application scenarios with frequent temperature changes, and offering a more comprehensive reference for drive optimization and practical applications.

[0021] In a second aspect, embodiments of the present invention provide an electronic device, including: one or more processors and a memory; the memory is coupled to the one or more processors, the memory being used to store computer program code, the computer program code including computer instructions, the one or more processors calling the computer instructions to cause the electronic device to perform the method described in the first aspect or the second aspect, and any possible implementation thereof.

[0022] Thirdly, the present invention provides a computer-readable storage medium including instructions that, when executed on the electronic device, cause the electronic device to perform the method described in the first aspect or the second aspect, and any possible implementation thereof.

[0023] Fourthly, the present invention provides a computer program product comprising instructions that, when the computer program product is run on the electronic device, cause the electronic device to perform the method described in the first aspect or the second aspect, and any possible implementation thereof.

[0024] Understandably, the electronic device provided in the second aspect, the storage medium provided in the third aspect, and the computer program product provided in the fourth aspect are all used to execute the method provided by this invention. Therefore, the beneficial effects they can achieve can be referred to the beneficial effects in the corresponding methods, and will not be repeated here.

[0025] One or more technical solutions provided by this invention have at least the following technical effects or advantages: 1. It provides a comprehensive NVMe SSD testing process, covering multiple aspects from temperature control to performance data acquisition and analysis. First, it places the drive in a temperature-controlled chamber, acquires baseline performance data after reaching and stabilizing at a preset temperature, then adjusts the chamber temperature while continuously acquiring real-time performance data to calculate performance changes. When performance changes reach a threshold, it determines key indicators such as fluctuation response temperature and fluctuation response time, and then derives temperature fluctuation resistance test results through a series of complex calculations. Furthermore, it involves adjusting the temperature from the fluctuation response temperature back to the preset temperature and measuring the recovery time to evaluate temperature fluctuation recovery capability. This complete testing process makes the performance evaluation of NVMe SSDs more systematic and comprehensive, allowing for a full examination of the drive's performance under different temperature conditions, including various scenarios during temperature rise and fall. It provides rich data for product performance evaluation, helps to deeply understand the performance characteristics of drives in different temperature scenarios, and provides comprehensive performance information for drive research, development, production, and application.

[0026] 2. Regarding temperature control, this invention demonstrates a high degree of precision. By considering the preset temperature and the volume of the temperature control chamber, a specific temperature change rate formula is used to determine the temperature change rate, and temperature control commands are generated and sent based on this rate, ensuring the accuracy and controllability of temperature adjustment and avoiding the arbitrariness and inaccuracy that may have occurred in previous tests. Simultaneously, in terms of performance evaluation, a complex temperature fluctuation resistance evaluation formula is employed, comprehensively considering multiple dimensions such as performance changes over time and temperature differences. By adjusting parameter settings, the evaluation becomes more scientific and flexible, enabling quantitative evaluation of hard drive performance from multiple important indicators and different perspectives. This allows for detailed and precise testing of hard drive performance, providing a more scientific and quantitative means for performance comparison and selection between different hard drives, thus contributing to improved accuracy and reliability of the evaluation.

[0027] 3. A comprehensive evaluation of hard drive performance considers not only the hard drive's resistance to temperature fluctuations during temperature increases but also its recovery capability during temperature decreases. During testing, a series of operations and calculations precisely determine the hard drive's resistance to temperature fluctuations, including fluctuation response time, fluctuation response temperature, and the corresponding temperature difference. Furthermore, the internal temperature is adjusted from the fluctuation response temperature back to a preset temperature, and the recovery time of the hard drive from its response temperature back to a stable temperature range is measured to assess its temperature fluctuation recovery capability. This comprehensive approach provides a more complete understanding of hard drive performance, avoiding the limitations of evaluating solely from a resistance perspective. It offers more comprehensive information on hard drive performance in practical applications, helping to better select and use hard drives in scenarios with frequent temperature fluctuations. It also provides comprehensive guidance for hard drive performance optimization and improvement, ensuring the reliability and stability of hard drives in different environments. Attached Figure Description

[0028] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention. It is obvious that the drawings described below are merely some embodiments of the invention, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort. In the drawings: Figure 1 This is a flowchart illustrating an NVMe solid-state drive testing method according to an embodiment of the present invention; Figure 2 This is a schematic diagram illustrating an application scenario of an NVMe solid-state drive testing method according to an embodiment of the present invention; Figure 3 This is a flowchart illustrating another NVMe solid-state drive testing method according to an embodiment of the present invention; Figure 4 This is a schematic diagram of the architecture of an electronic device according to an embodiment of the present invention. Detailed Implementation

[0029] The terminology used in the following embodiments of the present invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used in the specification of the invention, the singular expressions “a,” “an,” “the,” “the,” and “this” are intended to include the plural expressions as well, unless the context clearly indicates otherwise. It should also be understood that the term “and / or” as used in the invention refers to any or all possible combinations comprising one or more of the listed items.

[0030] Hereinafter, the terms "first" and "second" are used for descriptive purposes only and should not be construed as implying relative importance or implicitly indicating the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature, and in the description of the embodiments of the present invention, unless otherwise stated, "a plurality of" means two or more.

[0031] It should also be noted that, unless otherwise explicitly specified and limited, the terms "setting" and "connection" in the embodiments of the present invention should be interpreted broadly. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be a connection within two components; it can be a wired communication connection or a wireless communication connection. Those skilled in the art can understand the specific meaning of the above terms in the present invention according to the specific circumstances. The embodiments of the present invention will be described in detail below.

[0032] This invention provides a testing method for NVMe solid-state drives, which can accurately evaluate the performance and temperature fluctuation resistance of NVMe solid-state drives at different temperatures.

[0033] First, the internal temperature of the test hard drive is raised to the preset temperature using a temperature-controlled enclosure. The real-time temperature of the hard drive under test is then acquired to ensure it remains within a stable range. The baseline performance data obtained at this stage provides crucial reference for subsequent comparisons. Next, after establishing the baseline performance data, the temperature-controlled enclosure is adjusted from the preset temperature. As the internal temperature changes, real-time performance data of the test hard drive is continuously acquired. By comparing the real-time performance data with the baseline performance data, the performance changes of the test hard drive can be determined.

[0034] When performance changes reach a set threshold, the internal temperature at that point is defined as the fluctuation response temperature. This temperature reflects the point at which hard drive performance begins to fluctuate significantly under temperature changes. The adjustment time from the preset temperature change to the fluctuation response temperature is defined as the fluctuation response time, which reflects the length of time it takes for hard drive performance to stabilize and then exhibit significant fluctuations.

[0035] Finally, the temperature fluctuation resistance test results of the tested hard drive are determined based on the fluctuation response time and the temperature difference within the enclosure between the preset temperature and the fluctuation response temperature. If the fluctuation response time is long and the temperature difference within the enclosure is large, it indicates that the hard drive can maintain stable performance for a longer period of time during temperature changes, and a large temperature change is required before significant performance fluctuations occur. This indicates that the hard drive has good temperature fluctuation resistance. Conversely, if the fluctuation response time is short and the temperature difference within the enclosure is small, it indicates that the hard drive is more sensitive to temperature changes and has weak temperature fluctuation resistance.

[0036] The following is combined with Figure 1 The method of this embodiment is described in detail below, including the following steps: Step 201: When the internal temperature of the temperature control box reaches the preset temperature, obtain the real-time temperature of the hard drive being tested in the temperature control box.

[0037] The tested hard drives include NVMe solid-state drives. For ease of explanation, the tested hard drives or NVMe solid-state drives will be referred to simply as hard drives in the following text.

[0038] Temperature control chambers possess precise temperature control capabilities, stabilizing the internal temperature at a preset level according to testing requirements. A typical temperature control chamber consists of a temperature control system, heating and cooling elements, and temperature sensors. For example... Figure 2 As shown, the temperature control chamber is connected to the testing device and can receive commands from the device to accurately adjust the internal temperature. It can also perform heating or cooling operations at different rates. Temperature sensors monitor the internal temperature in real time and feed the data back to the testing device to ensure temperature accuracy and stability. The temperature control chamber is designed to provide a controllable temperature environment for solid-state drives.

[0039] In this embodiment, temperature sensors can be installed on the hard drive. These sensors can directly measure the surface temperature of the hard drive or the temperature of key internal components to obtain the real-time temperature of the hard drive, and transmit this temperature data to the connected testing device.

[0040] Alternatively, you can utilize the hard drive's built-in temperature monitoring function. If the hard drive has this function, you can read the real-time temperature report through specific software or interfaces. In addition, you can use external temperature monitoring devices, such as infrared thermometers, to perform non-contact temperature measurement of the hard drive from the outside. Regardless of the method used, it is essential to ensure the accuracy and timeliness of the temperature measurement to provide reliable temperature data for subsequent testing steps.

[0041] Step 202: When the real-time temperature of the hard drive remains within a stable temperature range, acquire the baseline performance data of the hard drive under test.

[0042] The benchmark performance data includes key performance indicators such as sequential read / write speed, random read / write speed, IOPS (input / output operations per second), and response time of the tested hard drive within a stable temperature range.

[0043] Specifically, the testing equipment can utilize professional hard drive performance testing software, such as CrystalDiskMark and ASSD Benchmark. These software programs can comprehensively test key performance indicators of the hard drive, such as sequential read / write speed, random read / write speed, and IOPS.

[0044] Additionally, you can use the operating system's built-in performance monitoring tools, such as Task Manager or Resource Monitor in Windows, to obtain the hard drive's performance under different operations, such as data transfer rate and response time. Furthermore, for server-grade NVMe SSDs, dedicated server performance monitoring software and tools can be used, which typically provide more detailed and accurate performance data.

[0045] In the process of obtaining benchmark performance data, multiple tests should be conducted and the average value should be taken to reduce the impact of random factors and ensure that the obtained benchmark performance data has high reliability and representativeness.

[0046] Step 203: With the baseline performance data determined, control the temperature control box to adjust the internal temperature from the preset temperature.

[0047] In this embodiment, the testing device typically has dedicated control software and a communication module. This communication module establishes a connection with the temperature control chamber, which can be a wired connection (such as a serial cable, USB cable, etc.) or a wireless connection (such as Bluetooth, Wi-Fi, etc.). The control software of the testing device sends detailed temperature adjustment instructions to the temperature control chamber, specifying the target temperature and the rate and method of temperature adjustment, such as linear heating or exponential heating. Upon receiving the instructions, the temperature control chamber activates its internal heating or cooling mechanism to adjust the internal temperature.

[0048] The testing device continuously receives real-time temperature data from the temperature control chamber and analyzes this data to determine whether the temperature adjustment progress meets expectations. If a deviation is detected during the temperature adjustment process, the testing device will promptly adjust the command parameters and resend them to the temperature control chamber. For example, if the temperature rises too slowly, the testing device may increase the heating power of the temperature control chamber or adjust the operating time ratio of the heating element.

[0049] Meanwhile, the testing device can precisely control the temperature control chamber to reach specific temperature values ​​at different time points according to preset complex temperature change scenarios, so as to better simulate various temperature changes that may be encountered in actual use and provide an accurate and diverse temperature environment for the performance testing of NVMe solid-state drives.

[0050] Step 204: Acquire real-time performance data of the hard drive under test while the internal temperature of the enclosure changes.

[0051] Specifically, the testing device can communicate with the hard drive using its built-in performance monitoring module to continuously read key performance indicators of the hard drive at different temperatures. For example, the testing device can periodically send commands to the hard drive to request information such as current read / write speeds, response times, and data transmission stability. Simultaneously, the testing device can also be combined with professional hard drive performance testing software to obtain more detailed performance data through the software's provided interfaces.

[0052] The testing device continuously collects data at preset time intervals to ensure it can capture subtle changes in hard drive performance during temperature variations. During data collection, the device processes and analyzes the data in real time, filtering out valid performance data and storing it for subsequent comparison and analysis. Furthermore, the device can collaborate with other external monitoring devices, such as temperature sensors, to correlate temperature data with hard drive performance data, providing a more comprehensive understanding of the hard drive's performance under different temperatures. Through these methods, the testing device can accurately acquire real-time performance data of the tested hard drive under varying internal temperature conditions.

[0053] Step 205: Determine the performance change data of the tested hard drive based on real-time performance data and benchmark performance data.

[0054] Specifically, for each specific performance metric, such as read / write speed, response time, and IOPS, the testing device performs precise comparative analysis. Taking read / write speed as an example, the device subtracts the real-time read / write speed values ​​acquired at different temperatures from the previously determined baseline performance data to obtain the speed difference. Then, this difference is divided by the baseline read / write speed and multiplied by 100% to obtain the percentage change in read / write speed. A similar operation is performed for response time to calculate the percentage change. For IOPS, the change is also calculated by comparing the real-time value with the baseline value.

[0055] Next, the testing equipment assigns different weights to each performance metric based on different application scenarios and testing requirements. For example, if read / write speed is more important in a specific application, then the read / write speed metric may be given a larger weight; while response time may have a greater weight in scenarios with high real-time requirements. By using a weighted average method, the change in each performance metric is multiplied by its corresponding weight and then summed to obtain a comprehensive performance change value.

[0056] Throughout the process, the testing device continuously records the time points when performance changes occur and the corresponding temperature values. This clearly shows the relationship between performance and temperature changes, such as in which temperature range performance begins to change significantly, and whether the trend is linear or non-linear. Simultaneously, the testing device analyzes the stability of performance changes, determining whether the performance change is a continuous and stable decrease or increase, or whether fluctuations exist. If fluctuations occur, the amplitude and frequency of the fluctuations are analyzed to determine the hard drive's performance stability at different temperatures. Through these detailed and comprehensive analyses, the testing device can accurately determine the performance change data of the tested hard drive, providing a strong basis for evaluating the hard drive's resistance to temperature fluctuations.

[0057] Step 206: When the performance change data reaches the set change threshold, the temperature inside the chamber at this time is determined as the fluctuation response temperature, and the adjustment time taken for the preset temperature to change to the fluctuation response temperature is determined as the fluctuation response time.

[0058] Specifically, when performance changes reach a set threshold, the testing device performs the following steps to determine the fluctuation response temperature and fluctuation response time. First, to determine the fluctuation response temperature, the testing device continuously monitors the internal temperature of the enclosure and the performance change data of the hard drive under test. Once the performance change data meets the set threshold, the testing device immediately reads the internal temperature of the temperature-controlled enclosure and marks this temperature as the fluctuation response temperature. This means that at this temperature, the hard drive's performance change has reached a critical level, which may significantly impact the normal use or stability of the hard drive.

[0059] To determine the fluctuation response time, the testing device records the starting time of temperature adjustment within the chamber from the preset temperature, and the time when the performance change data reaches the threshold. By calculating the time difference between these two points, the adjustment time from the preset temperature change to the fluctuation response temperature can be determined, i.e., the fluctuation response time.

[0060] By accurately determining the fluctuation response temperature and fluctuation response time, the testing device can more comprehensively evaluate the temperature fluctuation resistance of the tested hard drive, providing important reference for the design, production and use of the hard drive.

[0061] Step 207: Determine the temperature fluctuation resistance test result of the hard drive under test based on the fluctuation response time and the temperature difference between the preset temperature and the fluctuation response temperature inside the chamber.

[0062] When determining the temperature fluctuation resistance test results of the hard drive under test, the testing device mainly relies on two key factors: the fluctuation response time and the temperature difference inside the enclosure between the preset temperature and the fluctuation response temperature.

[0063] First, fluctuation response time reflects the length of time it takes for hard drive performance to change significantly from a stable state. A longer fluctuation response time means that the hard drive can maintain stable performance for a relatively long period during temperature changes. This indicates that the hard drive has low sensitivity to temperature changes and good resistance to their effects. For example, in environments with slow temperature fluctuations, such a hard drive can operate stably and continuously without experiencing a rapid performance degradation due to gradual temperature changes.

[0064] Secondly, the temperature difference between the preset temperature and the fluctuation response temperature within the enclosure reflects the magnitude of temperature change required to trigger performance changes in the hard drive. A larger temperature difference indicates that the hard drive's performance will only change within a relatively large temperature range, reflecting its strong resistance to temperature fluctuations. For example, in environments with drastic temperature changes, hard drives with good temperature fluctuation resistance can maintain relatively stable performance within a large temperature fluctuation range, and will not immediately lose their expected performance due to large temperature changes.

[0065] By comprehensively considering fluctuation response time and internal temperature difference, the testing device can fully evaluate the stability and reliability of the tested hard drive under different temperature variations. If a hard drive has a long fluctuation response time and a large internal temperature difference, the testing device can determine that the hard drive has good temperature fluctuation resistance under different temperature environments, and its performance is not easily affected by temperature fluctuations, maintaining stable and reliable performance over a wide temperature range. Conversely, if the fluctuation response time is short and the internal temperature difference is small, it can be determined that the tested hard drive has weak temperature fluctuation resistance, and its performance is prone to instability when the temperature changes, making it susceptible to the impact of temperature fluctuations.

[0066] This embodiment employs the method described above to accurately assess the temperature fluctuation resistance of NVMe SSDs by precisely controlling and monitoring their real-time temperature and performance data within a temperature-controlled enclosure. When the enclosure reaches a preset temperature and the SSD temperature stabilizes, the baseline performance data of the tested SSD is recorded. Then, the enclosure temperature is gradually adjusted to simulate temperature fluctuations that may be encountered in real-world applications, while continuously monitoring the SSD's performance changes. By comparing the real-time performance data with the baseline data, the changes in SSD performance can be quantified, and the fluctuation response temperature and fluctuation response time can be determined when the change reaches a preset threshold. These two parameters directly reflect the SSD's response speed and adaptability to temperature changes. Finally, by combining the fluctuation response time and temperature change range, the temperature fluctuation resistance of the tested SSD is evaluated, i.e., its ability to maintain stable performance under temperature fluctuations. This method not only considers the real-time performance of the NVMe SSD at different temperatures but also the performance changes during temperature variations, accurately assessing the temperature fluctuation resistance of NVMe SSDs to ensure their reliability and stability under various temperature conditions.

[0067] The following is combined with Figure 3 The method of this embodiment will be explained in detail below, including the following steps.

[0068] Step 301: When the internal temperature of the temperature control box reaches the preset temperature, obtain the real-time temperature of the hard drive being tested in the temperature control box.

[0069] This step can be referred to the description in the foregoing embodiments, and will not be repeated here.

[0070] Step 302: When the real-time temperature of the hard drive remains within a stable temperature range, acquire the baseline performance data of the hard drive under test.

[0071] This step can be referred to the description in the foregoing embodiments, and will not be repeated here.

[0072] Step 303: Given the baseline performance data, generate a temperature control command based on the set temperature change rate.

[0073] A suitable rate of temperature change can more realistically simulate temperature variations that might be encountered in real-world application scenarios. The testing equipment needs to comprehensively consider multiple factors to determine this rate of temperature change, such as the potential amplitude and speed of temperature fluctuations under different application scenarios. If the rate of temperature change is too fast, it may lead to inaccurate test results because the hard drive may not be able to respond realistically to such rapid temperature changes; conversely, if the rate of temperature change is too slow, it will prolong the test time and reduce test efficiency. By accurately calculating and selecting an appropriate rate of temperature change, the temperature control commands generated by the testing equipment can ensure that the subsequent temperature adjustment process is both practically meaningful and efficiently performed during testing.

[0074] In some embodiments, the rate of temperature change needs to be determined based on the preset temperature and the volume of the temperature control chamber.

[0075] The preset temperature provides a reference for the starting point and target range of temperature adjustment. If the preset temperature differs significantly from the typical temperature that the hard drive may face in actual use, such as when simulating extreme environments, the rate of temperature change can be appropriately slowed down to allow for more detailed observation of the hard drive's performance changes over a larger temperature range, avoiding inaccurate test results due to drastic temperature changes.

[0076] Secondly, the volume of the temperature control chamber also plays a crucial role in determining the rate of temperature change. A larger volume means more air inside the chamber, requiring more time to adjust for temperature uniformity. If the rate of temperature change is too rapid, it can lead to significant temperature differences in different areas within the chamber, affecting the accurate assessment of the hard drive's resistance to temperature fluctuations. Therefore, for large-volume temperature control chambers, a relatively slow rate of temperature change should be selected to ensure uniform and stable temperature changes within the chamber. For smaller-volume temperature control chambers, achieving temperature uniformity is relatively easier. While maintaining testing accuracy, the rate of temperature change can be appropriately increased based on factors such as the difference between the preset temperature and the actual application scenario to improve testing efficiency.

[0077] Specifically, the rate of temperature change can be calculated using the formula for the rate of temperature change. The formula for the rate of temperature change includes: ; In the above formula, v This represents the rate of temperature change (°C / min) that needs to be calculated. v 0 The reference temperature change rate (°C / min) is a pre-set reference rate that can be determined based on past experience or test results from similar equipment. T target This represents the target temperature that needs to be adjusted to; T preset Indicates the preset temperature;T ref The reference temperature difference can be selected as a fixed standard temperature difference for normalization, so as to adjust the rate of temperature change according to different temperature ranges and avoid deviations in the calculation of the rate of temperature change due to different test temperature ranges. V Indicates the volume of the temperature control box; V ref The reference volume can be selected as a fixed volume for normalization; m and n are control parameters that can be determined based on prior experimental tests.

[0078] This temperature change formula comprehensively considers the reference temperature change rate, the difference between the target and preset temperatures, the volume of the temperature control chamber, and specific control parameters. It dynamically adjusts the temperature change rate through the interaction of these factors, ensuring the adaptability and accuracy of the test. The temperature difference normalization in the formula makes test results across different temperature ranges comparable, while the volume adjustment term considers the impact of different sized temperature control chambers on the thermal response. The introduction of control parameters allows for fine-tuning based on specific test conditions and equipment characteristics, making the calculated temperature change rate both scientific and practical, applicable to test environments with varying volumes and temperature requirements.

[0079] Step 304: Send the temperature control command to the temperature control box so that the temperature control box can adjust the internal temperature from the preset temperature.

[0080] The testing device acts as the control center, communicating with the temperature control chamber to ensure its accurate execution of temperature regulation commands. Upon receiving a command, the temperature control chamber adjusts its internal temperature according to the specified method and speed. The testing device continuously monitors the temperature adjustment process to ensure that temperature changes meet expectations. If inaccurate or unstable temperature adjustments occur, the testing device must promptly adjust or resend the command. In this way, the testing device effectively controls the entire temperature adjustment process, providing reliable environmental conditions for obtaining performance data of the tested hard drive at different temperatures.

[0081] Step 305: Acquire real-time performance data of the hard drive under test while the internal temperature changes.

[0082] This step can be referred to the description in the foregoing embodiments, and will not be repeated here.

[0083] Step 306: Determine the performance change data of the tested hard drive based on real-time performance data and benchmark performance data.

[0084] This step can be referred to the description in the foregoing embodiments, and will not be repeated here.

[0085] Step 307: When the performance change data reaches the set change threshold, the temperature inside the chamber at this time is determined as the fluctuation response temperature, and the adjustment time taken for the preset temperature to change to the fluctuation response temperature is determined as the fluctuation response time.

[0086] This step can be referred to the description in the foregoing embodiments, and will not be repeated here.

[0087] Step 308: Determine the temperature fluctuation resistance test result of the hard drive under test based on the fluctuation response time and the temperature difference between the preset temperature and the fluctuation response temperature inside the chamber.

[0088] Specifically, the temperature fluctuation resistance test results are calculated using a preset temperature fluctuation resistance assessment formula, which includes: ; Δ T = T r －T 0 ; Δ P ( t )= P ( t ) －P 0 ; In this formula, S Δ represents the result of the temperature fluctuation resistance test. T Represents the temperature difference inside the chamber. T 0 Represents the preset temperature. T r Represents the fluctuating reaction temperature, Δ P ( t () represents performance change data. P ( t ) represents time t Real-time performance data at that time P 0 For baseline performance data, P th The set performance change threshold, t r Represents the fluctuation response time. α、β To adjust the parameters, they can be debugged and determined through extensive experimental calibration and field experience.

[0089] exist In this term, the integral starts from the time the temperature is adjusted. t =0 to fluctuation response time t r .

[0090] e-αt It is an exponentially decaying function, whose value gradually decreases as time increases. This means that during the test, the closer to the fluctuation response time, the smaller this part contributes to the overall result, because performance is more likely to change later, and its contribution to temperature fluctuation resistance is lower. For example, in the initial stage of a sudden temperature change, the hard drive needs to adapt quickly, and performance fluctuations at this time may cause data packet loss or delay, while subsequent fluctuations are less affected by system adjustments.

[0091] α >0 is used to control the weight of the impact of performance changes on the integral part. α The methods for obtaining it are as follows: 1) Experimental design: In a controlled temperature environment, a stepped temperature change test was conducted on multiple NVMe solid-state drives (e.g., from 25°C to 60°C at a rate of 5°C / min), and the performance data (read / write speed, response time, IOPS) were recorded as curves over time.

[0092] 2) Data fitting: Adjust the data using the least squares method or gradient descent algorithm. α This minimizes the residual between the integral term in the formula and the measured performance degradation curve. For example, if early performance fluctuations significantly affect stability, α To enhance the time decay effect, it is necessary to increase the size (e.g.) α =0.05); if subsequent fluctuations remain critical, then reduce... α (like α =0.02).

[0093] 3) Validation criteria: The prediction is evaluated using the correlation coefficient (R²). S The correlation coefficient (R²) measures the consistency between the predicted value and the actual failure rate. If R² ≥ 0.85, then the value of α is valid. R² is an indicator that measures the degree of agreement between the predicted value and the actual data changes; its value ranges from 0 to 1, with values ​​closer to 1 indicating a stronger explanatory power for data changes.

[0094] in, It represents the relative stability of performance and can be used as a stability factor: When |Δ P ( t When |Δ| = 0, meaning there is no change in performance, this term is 1, indicating completely stable performance; when |Δ| = 0, this term is 1, indicating completely stable performance. P ( t )∣= P th When the performance change threshold is reached, this term is 0, indicating that the performance has just begun to change significantly. In this way, the performance change is incorporated into the integral calculation, and by multiplying by an exponential decay function, the contribution to temperature fluctuation resistance is calculated based on the stability of the performance during the time before the performance begins to change.

[0095] It should be noted that in this temperature fluctuation resistance assessment formula, the absolute value of ΔP(t) is calculated as |ΔP(t)|. Even if different indicators cancel each other out, causing ΔP(t) to approach zero, |ΔP(t)| will still accumulate the absolute value changes of each indicator, ensuring that performance fluctuations are fully captured.

[0096] When the performance change approaches the threshold P th When the stability factor approaches zero, it highlights the negative impact of significant deviation from the benchmark. If ΔP(t) = 0 (all indicators remain unchanged), the factor is 1, representing complete stability; if there is positive and negative offsetting, |ΔP(t)| will still accumulate fluctuations to avoid misjudgment.

[0097] exist βln ( 1+ Δ T In item ) ln ( 1+ Δ T ) for temperature difference Δ T Processing is required. The logarithmic function is used because it has the characteristic of slow growth, when Δ... T When it is small, its growth is slow, when Δ T Even when the temperature difference is large, its growth rate will not be too fast, which is consistent with the evaluation logic of temperature difference. That is, the larger the temperature difference, the greater the contribution to resistance to temperature fluctuations, but the growth rate will not increase linearly. For example, the effect of the temperature rising from 30°C to 40°C may be smaller than that of rising from 50°C to 60°C. The logarithmic function can more smoothly characterize this non-linear relationship and avoid distortion of results under large temperature differences.

[0098] β A value greater than 0 is used to adjust the weight of the temperature difference on the overall result. β is obtained as follows: 1) Experimental design: Set multiple temperature differences ΔT (e.g., 10°C, 20°C, 30°C), test hard drive performance under the same temperature change rate, and record the relationship between ΔT and performance degradation rate.

[0099] 2) Logarithmic function adaptation: If the performance degradation rate increases non-linearly with ΔT (e.g., the degradation rate at ΔT=20°C is 1.5 times that at ΔT=10°C), then by adjusting β, the logarithmic function in the formula can be adjusted. β ln(1+ΔT) matches the actual trend. For example, if the measured data fits as a performance degradation rate of 0.3ln(1+ΔT), then β =0.3.

[0100] In experiments, the Taguchi method can also be used to design multi-factor experiments, combining different factors. α , β Value (e.g.) α =0.02 / 0.05, β=0.1 / 0.3), testing each set of parameters S The correlation between the values ​​and actual performance is analyzed to select the optimal combination. Furthermore, optimization algorithms (such as genetic algorithms) can be embedded in the test to dynamically adjust the settings based on real-time test data. α、β This ensures that the formula is compatible with different hard drive models and temperature control modes.

[0101] The calculation obtained in this embodiment S It is a numerical value of the temperature fluctuation resistance test result. S The higher the value, the better the hard drive's resistance to temperature fluctuations.

[0102] The temperature fluctuation resistance evaluation formula in this embodiment combines integral and logarithmic functions to comprehensively consider the impact of performance changes and temperature differences on temperature fluctuation resistance. Furthermore, by adjusting the parameters, the weights of both can be flexibly adjusted, enabling a more comprehensive and detailed evaluation of the temperature fluctuation resistance of NVMe solid-state drives.

[0103] In some embodiments, step 308 may further include: when the temperature inside the enclosure reaches the fluctuation response temperature, determining the real-time temperature of the hard drive at this time as the hard drive response temperature; and determining the temperature fluctuation resistance test result based on the hard drive response temperature, the fluctuation response time, and the temperature difference inside the enclosure.

[0104] Specifically, when the testing equipment performs temperature fluctuation resistance tests on NVMe solid-state drives (SSDs), it regulates the internal temperature of the enclosure through a temperature-controlled chamber and continuously monitors the drive's performance data. During the temperature adjustment process, once the change in drive performance data reaches a pre-set threshold, the internal temperature is marked as the fluctuation response temperature. Simultaneously, the testing equipment records the real-time temperature of the drive at this point and defines it as the drive's response temperature. The drive response temperature is a crucial indicator, representing the actual temperature state at which significant changes in drive performance begin to occur. It accurately reflects the instantaneous temperature at which the drive reacts to temperature fluctuations. This temperature clearly indicates the temperature environment under which drive performance begins to be significantly affected, providing critical data support for subsequent analysis and evaluation.

[0105] In comparative tests of different hard drives, the hard drive response temperature is a valuable reference that can help to understand the temperature characteristics of each hard drive when its performance is affected, thereby better judging the differences in the temperature fluctuation resistance of different hard drives.

[0106] After determining the hard drive response temperature, the testing device evaluates the temperature fluctuation resistance test results based on the hard drive response temperature, fluctuation response time, and internal temperature difference. Among these, the hard drive response temperature, fluctuation response time, and internal temperature difference are the three key factors.

[0107] First, based on the hard drive's operating temperature, the magnitude of the change compared to the initial stable temperature can be determined. The initial stable temperature refers to the real-time temperature of the tested hard drive when the benchmark performance data is acquired in step 302. A smaller magnitude of change means that the hard drive's temperature changes relatively smoothly during temperature fluctuations, without drastic fluctuations. This demonstrates that the hard drive can stabilize its temperature state to a certain extent.

[0108] A longer fluctuation response time indicates a longer period from the start of temperature adjustment to a significant change in hard drive performance, reflecting that the hard drive can withstand temperature changes and maintain relatively stable performance over a longer period. Conversely, a larger internal temperature difference indicates a larger temperature range from the initial setting temperature to when hard drive performance begins to be affected, suggesting that the hard drive can maintain a certain level of performance stability under a wider range of temperature fluctuations.

[0109] When the testing device observes that a hard drive exhibits a small fluctuation in its response temperature, a relatively long response time to temperature fluctuations, and a large temperature difference within the enclosure, it will determine that the hard drive has good temperature fluctuation resistance. This is because these characteristics collectively demonstrate the hard drive's excellent performance in the face of temperature changes; that is, it can withstand large temperature fluctuations over a relatively long period without its own temperature changing drastically, thus ensuring relatively stable performance.

[0110] By comprehensively considering these three indicators, the testing device can evaluate the temperature fluctuation resistance of NVMe solid-state drives in a more comprehensive and accurate way, providing a scientific basis for hard drive performance evaluation, product optimization, and suitability selection in different application scenarios, and ensuring that the reliability and stability of hard drives can be reasonably evaluated under different ambient temperatures.

[0111] Step 309: Adjust the temperature inside the control chamber from the fluctuating reaction temperature to the preset temperature.

[0112] Specifically, the testing device will regulate the temperature of the temperature-controlled chamber, gradually reducing the internal temperature from the already reached fluctuation response temperature back to the initially preset temperature. This process is to further examine the hard drive's performance during the temperature drop process after experiencing a temperature increase and subsequent performance changes. The testing device will precisely control the temperature adjustment through its internal temperature control system to ensure that the temperature change process is controllable, and can set corresponding temperature adjustment rates according to different testing needs, preparing for subsequent evaluation of the hard drive's temperature fluctuation recovery capability.

[0113] By adjusting the temperature back from the fluctuating response temperature, the system simulates the temperature drops that a hard drive might experience in real-world applications, providing a more comprehensive assessment of the hard drive's performance recovery under different temperature variations.

[0114] Step 310: With the internal temperature adjusted to the preset temperature, determine the recovery time for the hard drive's real-time temperature to return to the stable temperature range from the hard drive's response temperature.

[0115] Specifically, when the testing device adjusts the internal temperature to the preset temperature, it closely monitors the real-time temperature of the NVMe SSD under test. The device tracks the drive's real-time temperature from its initial response temperature when performance began to change significantly until it returns to a stable range. The device records the time elapsed from the initial response temperature to the stable temperature range; this time is called the recovery time.

[0116] Recovery time is an important metric, reflecting how quickly a hard drive recovers from a state where performance is initially affected to a normal, stable state after a temperature drop. Testing equipment precisely measures this time to subsequently evaluate the hard drive's ability to recover from temperature fluctuations during a temperature drop. This provides information on the hard drive's ability to recover from performance fluctuations to a normal state under different temperature environments, helping to understand the hard drive's thermal balance and temperature regulation mechanisms.

[0117] Step 311: Determine the test results of the temperature fluctuation recovery capability of the tested hard drive based on the recovery time.

[0118] The testing device will use recovery time as a key criterion for judging the hard drive's ability to recover from temperature fluctuations, because the length of recovery time directly reflects the time required for the hard drive to regain stable performance after the temperature drops.

[0119] If the recovery time is short, it means that the hard drive can quickly return to its normal temperature after the temperature drops, and thus can restore its normal performance more quickly. This means that the hard drive has a good temperature fluctuation recovery capability.

[0120] Conversely, if the recovery time is long, it means that the hard drive needs a long time to recover from the performance instability caused by temperature fluctuations, and its temperature fluctuation recovery ability is relatively weak.

[0121] The testing device will convert the length of recovery time into a quantitative assessment of the hard drive's ability to recover from temperature fluctuations based on pre-set evaluation criteria. This will provide more comprehensive information for hard drive performance evaluation, help determine the hard drive's self-recovery ability after experiencing temperature fluctuations, and provide valuable reference for product performance optimization, application adaptation in different environments, and quality control. This will ensure that the hard drive can operate more stably and reliably in actual applications, especially in environments with frequent temperature fluctuations.

[0122] The method described in this embodiment uses the above steps to accurately evaluate the performance and temperature fluctuation resistance of NVMe solid-state drives under different temperature conditions, while also taking into account their temperature fluctuation recovery capabilities.

[0123] First, the NVMe SSD under test is placed in a temperature-controlled chamber. When the temperature inside the chamber reaches the preset temperature and the hard drive's real-time temperature remains within a stable range, baseline performance data for the hard drive is acquired. After determining the baseline performance data, the temperature change rate is calculated using a preset temperature change rate formula based on the preset temperature and chamber volume. A corresponding temperature control command is then generated and sent to the chamber to adjust the internal temperature starting from the preset temperature. During the temperature change within the chamber, real-time performance data of the hard drive is continuously acquired, and performance change data is calculated accordingly. When the performance change data reaches a set threshold, the internal temperature at this point is defined as the fluctuation response temperature, and the adjustment time from the preset temperature to this threshold is defined as the fluctuation response time.

[0124] To assess the hard drive's resistance to temperature fluctuations, a preset temperature fluctuation resistance assessment formula can be used to calculate the temperature fluctuation resistance test results. This formula involves multiple parameters, including fluctuation response time, preset temperature, fluctuation response temperature, and performance change data. Furthermore, when the internal temperature reaches the fluctuation response temperature, the hard drive's real-time temperature is determined as the hard drive's response temperature. The final temperature fluctuation resistance test result is then determined by comprehensively considering the hard drive's response temperature, fluctuation response time, and the internal temperature difference.

[0125] This embodiment further refines the testing process. After completing the temperature fluctuation resistance test, the internal temperature is adjusted from the fluctuation response temperature back to the preset temperature. During this process, the real-time temperature of the hard drive is monitored to determine the recovery time from the hard drive's response temperature back to the stable temperature range. Based on the recovery time, the temperature fluctuation recovery capability test result of the tested hard drive can be determined, providing a richer dimension for a comprehensive evaluation of hard drive performance. The entire technical solution, through a series of coherent operations including temperature regulation, continuous monitoring of performance data, quantitative evaluation of performance changes, temperature fluctuation resistance testing, and temperature fluctuation recovery capability testing, forms a systematic NVMe solid-state drive performance evaluation system. This helps to gain a deeper understanding of the performance stability and reliability of hard drives under different temperature conditions, providing comprehensive and scientific testing basis for hard drive R&D, production, and application. It can be used for product quality control, performance optimization, and adaptation to different application scenarios to ensure that hard drives can work stably under various ambient temperatures. It is especially suitable for application scenarios with temperature fluctuations, such as portable mobile devices, outdoor monitoring equipment, industrial environments, and edge computing devices.

[0126] This embodiment fully considers the impact of factors such as the volume of the temperature control chamber on the rate of temperature change. By introducing different formulas and parameters, the testing process is made more accurate and quantifiable, and can more accurately reflect the performance of the hard drive under different temperature changes, providing a comprehensive and detailed technical framework for the performance evaluation of NVMe solid-state drives.

[0127] The methods provided in the above embodiments can be executed by a testing device, which may include an electronic device. The electronic device in the embodiments of the present invention is described below from a hardware processing perspective; please refer to [link to relevant documentation]. Figure 4 This is a schematic diagram of the physical device structure of an electronic device in an embodiment of the present invention.

[0128] It should be noted that, Figure 4 The structure of the electronic device shown is merely an example and should not impose any limitation on the functionality and scope of use of the embodiments of the present invention.

[0129] like Figure 4 As shown, the electronic device includes a Central Processing Unit (CPU) 401, which can perform various appropriate actions and processes based on a program stored in Read-Only Memory (ROM) 402 or a program loaded from storage portion 408 into Random Access Memory (RAM) 403, such as performing the methods described in the above embodiments. The Random Access Memory (RAM) 403 also stores various programs and data required for system operation. The CPU 401, ROM 402, and RAM 403 are interconnected via a bus 404. An Input / Output (I / O) interface 405 is also connected to the bus 404.

[0130] The following components are connected to the input / output (I / O) interface 405: an input section 406 including audio input devices, push-button switches, etc.; an output section 407 including displays, audio output devices, indicator lights, etc.; a storage section 408 including hard disks, etc.; and a communication section 409 including network interface cards such as LAN (Local Area Network) cards, modems, etc. The communication section 409 performs communication processing via a network such as the Internet. A drive 410 is also connected to the input / output (I / O) interface 405 as needed. A removable medium 411, such as a disk, optical disk, magneto-optical disk, semiconductor memory, etc., is installed on the drive 410 as needed so that computer programs read from it can be installed into the storage section 408 as needed.

[0131] In particular, according to embodiments of the present invention, the processes described above with reference to the flowcharts can be implemented as computer software programs. For example, embodiments of the present invention include a computer program product comprising a computer program carried on a computer-readable medium, the computer program containing computer programs for performing the methods shown in the flowcharts. In such embodiments, the computer program can be downloaded and installed from a network via communication section 409, and / or installed from removable medium 411. When the computer program is executed by the Central Processing Unit (CPU) 401, it performs the various functions defined in the present invention.

[0132] It should be noted that specific examples of computer-readable storage media may include, but are not limited to: electrical connections having one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM), flash memory, optical fiber, portable compact disc read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination thereof. In this invention, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, apparatus, or device.

[0133] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of systems, methods, and computer program products according to various embodiments of the present invention. Each block in a flowchart or block diagram may represent a module, program segment, or portion of code, which contains one or more executable instructions for implementing a specified logical function. It should also be noted that in some alternative implementations, the functions indicated in the blocks may occur in a different order than those shown in the drawings.

[0134] Specifically, the electronic device of this embodiment includes a processor and a memory. The memory is coupled to one or more processors and is used to store computer program code. The computer program code includes computer instructions. One or more processors call the computer instructions to cause the electronic device to perform the method provided in the above embodiment.

[0135] In another aspect, the present invention also provides a computer-readable storage medium, which may be included in the electronic device described in the above embodiments; or it may exist independently and not assembled into the electronic device. The storage medium carries one or more computer programs that, when executed by a processor of the electronic device, cause the electronic device to implement the methods provided in the above embodiments.

[0136] The above-described embodiments are only used to illustrate the technical solutions of the present invention, and are not intended to limit it. Although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. Such modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

[0137] As used in the above embodiments, depending on the context, the term "when..." can be interpreted as meaning "if...", "after...", "in response to determining...", or "in response to detecting...". Similarly, depending on the context, the phrase "when determining..." or "if (the stated condition or event) is interpreted as meaning "if determining...", "in response to determining...", "when (the stated condition or event) is detected", or "in response to detecting (the stated condition or event)".

[0138] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. This program can be stored in a computer-readable storage medium, and when executed, it can include the processes described in the above method embodiments. The aforementioned storage medium includes various media capable of storing program code, such as ROM or random access memory (RAM), magnetic disks, or optical disks.

Claims

1. A testing method for NVMe solid-state drives, characterized in that, include: When the temperature inside the temperature control box reaches the preset temperature, the real-time temperature of the hard drive under test in the temperature control box is obtained. The hard drive under test includes NVMe solid-state drives. When the real-time temperature of the hard drive remains within a stable temperature range, the baseline performance data of the hard drive under test is obtained; Given the baseline performance data, the temperature control chamber is controlled to adjust the internal temperature starting from the preset temperature. Under varying internal temperature conditions, real-time performance data of the hard drive under test is acquired. Based on the real-time performance data and the baseline performance data, the performance change data of the tested hard disk is determined; When the performance change data reaches the set change threshold, the temperature inside the chamber at this time is determined as the fluctuation response temperature, and the adjustment time taken for the preset temperature to change to the fluctuation response temperature is determined as the fluctuation response time. Based on the fluctuation response time and the temperature difference within the enclosure between the preset temperature and the fluctuation response temperature, the temperature fluctuation resistance test result of the tested hard drive is determined, including: The temperature fluctuation resistance test results are calculated using a preset temperature fluctuation resistance assessment formula, which includes: ;D T = T r -T 0 ;D P ( t )= P ( t )- P 0 ; in, S Δ represents the temperature fluctuation resistance test result. T This represents the temperature difference inside the chamber. T 0 Represents the preset temperature. T r Δ represents the fluctuating reaction temperature. P ( t () represents performance change data. P ( t ) represents time t Real-time performance data at that time P 0 For baseline performance data, P th The set performance change threshold, t r This represents the fluctuation response time. α、β To adjust the parameters, e -αt It is an exponentially decaying function, which decreases with time. t The increase, e -αt The value gradually decreases.

2. The method according to claim 1, characterized in that, The method of controlling the temperature control box to adjust the internal temperature of the box starting from the preset temperature includes: Generate temperature control commands based on the set temperature change rate; The temperature control command is sent to the temperature control box so that the temperature control box adjusts the temperature inside the box starting from the preset temperature.

3. The method according to claim 2, characterized in that, Before generating the temperature control command based on the set temperature change rate, the method further includes: The rate of temperature change is determined based on the preset temperature and the volume of the temperature control chamber.

4. The method according to claim 3, characterized in that, Determining the rate of temperature change based on the preset temperature and the volume of the temperature control chamber includes: The temperature change rate is calculated according to a preset temperature change rate formula, which includes: ;in, v This represents the rate of temperature change; v 0 Represents the rate of change of the reference temperature; T target This represents the target temperature that needs to be adjusted to; T preset Indicates the preset temperature; T ref Represents the reference temperature difference; V This indicates the volume of the temperature control box; V ref Indicates the reference volume; m and n These are control parameters.

5. The method according to claim 1, characterized in that, The step of determining the temperature fluctuation resistance test result of the tested hard drive based on the fluctuation response time and the temperature difference between the preset temperature and the fluctuation response temperature within the enclosure specifically includes: When the temperature inside the enclosure reaches the fluctuation response temperature, the real-time temperature of the hard drive at this time is determined as the hard drive response temperature. The temperature fluctuation resistance test results are determined based on the hard drive response temperature, the fluctuation response time, and the temperature difference inside the enclosure.

6. The method according to claim 5, characterized in that, After determining the temperature fluctuation resistance test result of the tested hard disk based on the fluctuation response time and the temperature difference between the preset temperature and the fluctuation response temperature, the method further includes: The temperature inside the chamber is controlled to be adjusted from the fluctuating reaction temperature to the preset temperature; When the internal temperature of the enclosure is adjusted to the preset temperature, determine the recovery time for the real-time temperature of the hard drive to recover from the hard drive response temperature to the stable temperature range; The test result of the temperature fluctuation recovery capability of the tested hard drive is determined based on the recovery time.

7. An electronic device, characterized in that, Includes one or more processors and memory; The memory is coupled to the one or more processors, the memory being used to store computer program code, the computer program code including computer instructions, the one or more processors invoking the computer instructions to cause the electronic device to perform the method as described in any one of claims 1-6.

8. A computer-readable storage medium storing computer instructions, characterized in that, When the computer instructions are executed on the electronic device, the electronic device causes the electronic device to perform the method as described in any one of claims 1-6.

9. A computer program product, characterized in that, When the computer program product is run on an electronic device, it causes the electronic device to perform the method as described in any one of claims 1-6.

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