一种短波红外高光谱成像系统及方法
By employing multiple short slits and sub-spectrometers in the shortwave infrared hyperspectral imaging system, the problems of large system size and difficult image quality control under ultra-large field of view are solved, achieving efficient and compact spectral imaging.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI INSTITUTE OF TECHNICAL PHYSICS CHINESE ACADEMY OF SCIENCES
- Filing Date
- 2025-04-17
- Publication Date
- 2026-07-17
AI Technical Summary
In existing technologies, shortwave infrared hyperspectral imaging spectrometers with ultra-large slit field of view suffer from problems such as large size and difficulty in image quality control.
The design employs multiple short slits stitched together as slit units and multiple sub-spectrometers. The target light reflected from the telescope forms an ultra-large field of view across multiple short slits, and spectral imaging is performed by independent sub-spectrometers. The design combines staggered slits with even-order aspherical optical elements to optimize imaging quality.
The size of the shortwave infrared hyperspectral imaging system has been reduced, ensuring image quality. Furthermore, image quality has been improved by independently controlling aberrations, preventing image distortion.
Smart Images
Figure CN120333616B_ABST