A method for testing a charging pile and an electronic device

Abstract

Embodiments of the present application provide a test method of a charging pile and an electronic device. The method is applied to the electronic device. The method comprises: generating a test instruction based on a test case; constructing simulation information based on the test instruction; generating test data in response to the simulation information; the test data is used to indicate data generated by an application program of a controller of the charging pile in response to the simulation information; the application program runs in a processor of the electronic device; and determining a test result based on the test data. In the method provided by the embodiments of the present application, the electronic device simulates the behavior of a real hardware device through pure software, realizes the test of the application program in the charging pile, reduces the dependence on the real hardware device, and saves the cost overhead.

Description

Technical Field

[0001] This application relates to the field of charging technology, and in particular to a testing method and electronic device for a charging pile. Background Technology

[0002] A charging pile, also known as an electric vehicle charging station or electric vehicle power supply equipment, is a device that provides electrical energy to electric vehicles. Charging piles can charge various models of electric vehicles according to different voltage levels. Their input terminal is directly connected to the AC power grid, and the output terminal is equipped with a charging plug for charging electric vehicles.

[0003] The controller in a charging station is a crucial component ensuring the normal operation of the charging process. Therefore, testing the application of the controller in the charging station is essential to ensure the safety and stability of the charging process. Current charging station testing methods rely on hardware equipment, which results in high costs.

[0004] Therefore, there is an urgent need for a solution to address the aforementioned technical problems. Summary of the Invention

[0005] To address the aforementioned issues, this application provides a testing method and electronic device for charging piles.

[0006] The embodiments of this application disclose the following technical solutions:

[0007] Firstly, this application provides a testing method for a charging pile, which is applied to an electronic device. The electronic device includes a processor, and the method is executed by the processor. The method includes: generating test instructions based on test cases; constructing simulation information based on the test instructions; generating test data in response to the simulation information, wherein the test data is used to instruct the application of the charging pile's controller to respond to the data generated by the simulation information, and the application is running in processing; and determining test results based on the test data.

[0008] In the method provided in this application embodiment, the electronic device can construct simulated information through pure software simulation, simulating the behavior of real hardware devices, and realizing the testing of applications in charging piles. Compared with traditional testing methods, the method provided in this application embodiment reduces the dependence on real hardware devices, improves the degree of automation, improves testing efficiency, and saves costs.

[0009] In one possible implementation, constructing simulation information based on test instructions includes: determining the test scenario corresponding to the test instructions; and constructing the simulation information according to the simulation module corresponding to the test scenario. Thus, the processor parses the test instructions to determine the test scenario corresponding to them, and further calls the corresponding simulation module to construct the simulation information corresponding to the test scenario. The simulation information is used to indicate information corresponding to the test scenario.

[0010] In one possible implementation, the test instruction includes a command simulating a user's charging gun insertion operation. The simulation information includes sampled voltage data. The electronic device can respond to the sampled voltage data to generate test data indicating the state of the charging gun corresponding to the insertion stage. If the test data indicates that the charging gun is inserted, the test result of the insertion test is determined to be normal; if the test data indicates that the charging gun is not inserted, the test result of the insertion test is determined to be abnormal. In this embodiment, the electronic device can simulate the function of the charging gun, perform an insertion test, and obtain the corresponding test results by constructing sampled voltage data.

[0011] In one possible implementation, during the process of generating test data to indicate the state of the charging gun corresponding to the insertion stage in response to the sampled voltage data, the electronic device may generate test data indicating that the state of the charging gun corresponding to the insertion stage is "inserted" when the sampled voltage data reaches a first preset voltage; and generate test data indicating that the state of the charging gun corresponding to the insertion stage is "not inserted" when the sampled voltage data does not reach the first preset voltage.

[0012] In one possible implementation, the test instruction includes a command simulating a user initiating a charging operation. The simulation information includes the charging start instruction. The electronic device can respond to the charging start instruction by generating test data indicating the status of the charging pile corresponding to the charging stage. When the test data indicates that the charging pile is charging, the test result for the charging stage is determined to be normal; when the test data indicates that the charging pile is not charging, the test result for the charging stage is determined to be abnormal. In this embodiment, the electronic device, through the constructed charging start instruction, can perform charging stage testing based on pure software simulation and obtain the corresponding test results.

[0013] In one possible implementation, during the process of generating test data to indicate the status of the charging pile corresponding to the charging stage in response to a charging start command, the electronic device may, in response to the charging start command, perform insulation detection, discharge detection, and battery management system parameter configuration before generating the status of the charging pile to indicate the charging stage.

[0014] In one possible implementation, the test instruction includes a command simulating a user's action to stop charging. The simulation information includes the stop charging instruction. The electronic device can respond to the stop charging instruction by generating test data indicating the status of the charging pile corresponding to the stop charging phase. If the test data indicates that the charging pile's status is "charging complete," the test result for the stop charging phase is determined to be normal; if the test data indicates that the charging pile's status is "charging in progress," the test result for the stop charging phase is determined to be abnormal. In this embodiment, the electronic device, through the constructed stop charging instruction, can perform a stop charging phase test based on pure software simulation and obtain the corresponding test results.

[0015] In one possible implementation, during the process of generating test data to indicate the status of the charging pile corresponding to the charging stop phase in response to a charging stop command, the electronic device may, in response to the charging stop command, construct sampled current data; and in response to the sampled current data, generate test data to indicate the status of the charging pile corresponding to the charging stop phase.

[0016] In one possible implementation, the test instruction includes a command simulating an electronic lock locking feedback anomaly. The simulation information includes the electronic lock feedback state as unlocked and timed out. The electronic device responds to the simulation information by generating test data indicating the charging pile's status and the cause of the anomaly. When the test data indicates the charging pile's status as startup failure and the cause of the anomaly is an electronic lock malfunction, the detection result of the electronic lock locking feedback anomaly detection is determined to be normal. When the test data does not indicate the charging pile's status as startup failure and the cause of the anomaly is an electronic lock malfunction, the detection result of the electronic lock locking feedback anomaly detection is determined to be abnormal. In this embodiment, the electronic device, through the constructed simulation information of an unlocked and timed-out electronic lock feedback state, can perform electronic lock locking feedback anomaly testing based on pure software simulation and obtain the corresponding test results.

[0017] Second aspect: This application provides a testing device for a charging pile, including: a first generation module, a simulation module, a second generation module, and a determination module;

[0018] The first generation module is used to generate test instructions based on test cases;

[0019] The simulation module is used to construct simulation information based on the test instructions;

[0020] The second generation module is used to generate test data in response to the simulation information; the test data is used to instruct the application of the charging pile controller to generate data in response to the simulation information; the application runs in the testing device.

[0021] The determining module is used to determine the test result based on the test data.

[0022] Thirdly: This application provides an electronic device, which includes a processor and a memory;

[0023] The memory is used to store program code and transmit the program code to the processor;

[0024] The processor is used to execute the steps of the testing method for a charging pile as described in the first aspect above, according to the instructions in the program code.

[0025] Fourth aspect: This application provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of a testing method for a charging pile as described in the first aspect above.

[0026] Fifth aspect: This application provides a program product that, when run on a computer, can execute the steps of a charging pile testing method as described in the first aspect. Attached Figure Description

[0027] To more clearly illustrate the technical solutions in the embodiments of this application or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0028] Figure 1 A flowchart of a charging pile testing method provided in an embodiment of this application;

[0029] Figure 2 A layered architecture diagram of a charging pile system provided in this application embodiment;

[0030] Figure 3 A layered architecture diagram of another charging pile system provided in this application embodiment;

[0031] Figure 4 A schematic diagram of a test system operation provided in an embodiment of this application;

[0032] Figure 5 A schematic diagram of an abstraction layer provided in an embodiment of this application;

[0033] Figure 6 A schematic diagram of a driver layer provided in an embodiment of this application;

[0034] Figure 7 A schematic diagram illustrating the interaction between a test case and an application provided in an embodiment of this application;

[0035] Figure 8 A timing diagram of the first charging pile testing method provided in the embodiments of this application;

[0036] Figure 9 A timing diagram of the second charging pile testing method provided in the embodiments of this application;

[0037] Figure 10 A timing diagram of the third charging pile testing method provided in the embodiments of this application;

[0038] Figure 11 A timing diagram of the fourth charging pile testing method provided in the embodiments of this application;

[0039] Figure 12 A timing diagram of the fifth charging pile testing method provided in the embodiments of this application;

[0040] Figure 13 A timing diagram of the sixth charging pile testing method provided in the embodiments of this application;

[0041] Figure 14 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0042] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the scope of protection of the present application.

[0043] The following describes an application scenario of a charging pile testing method provided in an embodiment of this application.

[0044] It is understood that electronic devices may include, but are not limited to, personal computers (PCs), tablet computers, desktop computers, laptop computers, ultra-mobile personal computers (UMPCs), handheld computers, netbooks, etc. This application does not impose any special restrictions on the specific form of the aforementioned electronic devices. For ease of understanding, the following description will use PCs as an example of electronic devices.

[0045] In this embodiment, the processor (CPU) of an electronic device can run test cases and generate test instructions, which in turn can be used to construct simulation information. This simulation information is used to indicate information about the test scenario corresponding to the test instructions.

[0046] After constructing the simulation information, the electronic device can respond to the simulation information, generate test data, and determine the test results based on the test data. This test data is used to instruct the charging pile's controller application on the data generated in response to the simulation information.

[0047] In one example, a PC runs an application for a charging pile controller, a simulation module, and test cases. The PC's processor generates test instructions by running the test cases and sends these instructions to the simulation module. The simulation module constructs corresponding simulation information based on the test instructions and sends this information to the application. The application generates test data based on the simulation information. Based on this test data, the test results can be determined.

[0048] The simulation module is a purely software simulation of a series of hardware devices that interact with the charging pile controller's application. In this embodiment, the simulation module, based on test commands sent by test cases, can simulate various functions of the hardware devices, thus providing functional support for the test cases.

[0049] Based on the method provided in this application embodiment, electronic devices can construct simulated information through pure software simulation, simulating the behavior of real hardware devices, and thus enabling the testing of applications in charging piles. Compared with traditional testing methods, the method provided in this application embodiment reduces reliance on real hardware devices, improves automation, increases testing efficiency, and saves costs.

[0050] The following is combined Figure 1 The testing method for the charging pile system provided in the embodiments of this application is described.

[0051] like Figure 1 As shown in the figure, this figure is a flowchart of a charging pile testing method provided in an embodiment of this application, including S101-S103.

[0052] S101. Electronic devices generate test instructions based on test cases.

[0053] In this embodiment of the application, the electronic device generates test instructions by running test cases, which can realize automated testing and improve testing efficiency.

[0054] For example, test commands may include, but are not limited to, commands simulating a user inserting a charging gun, commands simulating a user starting charging, commands simulating a user stopping charging, and commands simulating abnormal feedback from an electronic lock.

[0055] S102. Electronic devices construct simulation information based on test instructions.

[0056] Among them, simulation information is used to indicate information based on the test scenario corresponding to the test command.

[0057] In one possible implementation, the electronic device can determine the test scenario corresponding to the test instruction based on the test instruction, and construct the corresponding simulation information based on the test scenario.

[0058] For example, when the test command is a command simulating a user inserting a charging gun, the electronic device can determine that the current test scenario is a charging gun test based on this command. Therefore, corresponding simulation information, such as sampled voltage data, can be constructed based on this charging gun test scenario.

[0059] When the test command simulates a user initiating a charging operation, the electronic device can determine that the current test scenario is a charging initiation test based on this command. Therefore, corresponding simulation information, such as a charging initiation command, can be constructed based on this charging initiation test scenario.

[0060] When the test command simulates a user stopping the charging operation, the electronic device can determine that the current test scenario is a charging stop test based on this simulated user action. Therefore, corresponding simulation information, such as a charging stop command, can be constructed based on this charging stop test scenario.

[0061] When the test command is a command simulating an electronic lock locking feedback anomaly, the electronic device can determine that the current test scenario is a simulated electronic lock locking feedback anomaly test scenario based on this command. Therefore, corresponding simulation information can be constructed based on this simulated electronic lock locking feedback anomaly test scenario, such as constructing simulation information that the electronic lock feedback status is unlocked and a timeout has occurred.

[0062] In another possible implementation, the electronic device can determine the corresponding test scenario based on the test command, call the simulation module corresponding to the test scenario, and construct the corresponding simulation information based on the simulation module.

[0063] The simulation module can be a pure software simulation of various hardware devices that interact with the charging pile controller.

[0064] For example, the simulation module may include, but is not limited to, a charging gun module, a battery management system (BMS) module, an energy management system module, a charging host module, and an operation platform module.

[0065] The system comprises the following modules: a charging gun module, a pure software simulation program corresponding to a real charging gun, used to construct the interaction data between the real charging gun and the charging pile controller's application, simulating the function of a real charging gun; a BMS module, a pure software simulation program corresponding to a real BMS, used to construct the interaction data between the real BMS and the charging pile controller's application, simulating the function of a real BMS; an energy management system module, a pure software simulation program corresponding to a real energy management system, used to construct the interaction data between the real energy management system and the charging pile controller's application, simulating the function of a real energy management system; a charging host module, a pure software simulation program corresponding to a real charging host, used to construct the interaction data between the real charging host and the charging pile controller's application, simulating the function of a real charging host; and an operation platform module, a pure software simulation program corresponding to a real operation platform, used to construct the interaction data between the real operation platform and the charging pile controller's application, simulating the function of a real operation platform.

[0066] For example, when the test command is a command simulating a user inserting a charging gun, the electronic device can determine that the current test scenario is a charging gun insertion test based on this command. Therefore, the electronic device can use this charging gun test scenario to call the charging gun module to construct sampled voltage data.

[0067] When the test command simulates a user initiating a charging operation, the electronic device can determine that the current test scenario is a charging initiation test scenario based on this command. Therefore, the electronic device can invoke the operations platform module to construct a charging initiation command based on this scenario.

[0068] When the test command simulates a user stopping the charging operation, the electronic device can determine that the current test scenario is a charging stop test scenario based on this simulated user action. Therefore, the electronic device can invoke the operations platform module to construct a charging stop command based on this charging stop test scenario.

[0069] When the test command is a command simulating an electronic lock locking feedback anomaly, the electronic device can determine that the current test scenario is a simulated electronic lock locking feedback anomaly test scenario based on this command. Therefore, the electronic device can, based on this simulated electronic lock locking feedback anomaly test scenario, call the charging gun module to construct simulated information such as the electronic lock feedback state being unlocked and timeout.

[0070] S103. The electronic device responds to the analog information and generates test data.

[0071] The test data is used to indicate the data generated by the charging pile's controller application in response to the simulated information.

[0072] S104. The electronic device determines the test result based on the test data.

[0073] In one possible implementation, when the test instruction is a command simulating a user inserting the charging gun and the simulation information is sampled voltage data, the electronic device can respond to the sampled voltage data to generate test data indicating the state of the charging gun corresponding to the insertion stage.

[0074] If the test data indicates that the charging gun is plugged in, the test result of the plugging-in test is determined to be normal; if the test data indicates that the charging gun is not plugged in, the test result of the plugging-in test is determined to be abnormal.

[0075] In one example, when the sampled voltage data reaches a first preset voltage, the electronic device generates test data to indicate that the state of the charging gun corresponding to the insertion stage is that it is inserted; when the sampled voltage data does not reach the first preset voltage, the electronic device generates test data to indicate that the state of the charging gun corresponding to the insertion stage is that it is not inserted.

[0076] For example, the sampled voltage data may include voltage data during the insertion process, such as the voltage data changing from 6V to 12V, then from 12V to 6V, and then from 6V to 4V.

[0077] Once the sampled voltage data reaches 4V, the electronic device can determine that a charging gun has been inserted and generate test data to indicate that the charging gun is inserted during the insertion phase. Before the sampled voltage data reaches 4V, the electronic device can determine that the charging gun is not inserted and generate test data to indicate that the charging gun is not inserted during the insertion phase.

[0078] It is understood that the data of the first preset voltage is not specifically limited in the embodiments of this application, and it can be set according to the requirements. Here, we only take 4V as an example of the first preset voltage.

[0079] In one possible implementation, where the test instruction includes an instruction simulating a user to initiate charging, and the simulation information includes the charge initiation instruction, the electronic device can respond to the charge initiation instruction by generating test data to indicate the status of the charging station corresponding to the charging phase.

[0080] In this embodiment, the electronic device can respond to the charging start command by performing insulation detection, discharge detection, and battery management system parameter configuration, and then generate a status of the charging pile to indicate the charging stage.

[0081] When the test data indicates that the charging pile is charging, the electronic device determines that the test result of the charging phase is normal; when the test data indicates that the charging pile is not charging, the electronic device determines that the test result of the charging phase is abnormal.

[0082] In one possible implementation, where the test instruction includes a command simulating a user's action to stop charging, and the simulation information includes the stop charging instruction, the electronic device can respond to the stop charging instruction by generating test data indicating the state of the charging station corresponding to the stop charging phase.

[0083] In this embodiment of the application, the electronic device can construct sampled current data in response to a stop charging command; and generate test data to indicate the status of the charging pile corresponding to the stop charging phase in response to the sampled current data.

[0084] For example, an electronic device can generate test data to indicate the status of the charging pile corresponding to the charging stop phase when the sampled current data is less than or equal to a first preset current.

[0085] It is understood that the data of the first preset current in this application embodiment is not specifically limited, and it can be set according to needs. For example, the first preset current can be 5A. When the sampled current data is less than or equal to 5A, it indicates that charging has ended.

[0086] If the test data indicates that the charging station is in the charging phase, the test result for the charging stop phase is considered normal; if the test data indicates that the charging station is in the charging phase, the test result for the charging stop phase is considered abnormal.

[0087] In one possible implementation, when the test instruction includes an instruction simulating an electronic lock locking feedback anomaly, and the simulation information includes the electronic lock feedback state being unlocked and timeout, the electronic device can respond to the simulation information to generate test data indicating the status of the charging pile and the cause of the anomaly.

[0088] When the test data indicates that the charging pile has failed to start and the cause of the abnormality is an electronic lock malfunction, the electronic device can determine that the detection result of the electronic lock locking feedback abnormality detection is normal; when the test data does not indicate that the charging pile has failed to start and the cause of the abnormality is an electronic lock malfunction, the electronic device can determine that the detection result of the electronic lock locking feedback abnormality detection is abnormal.

[0089] In this embodiment of the application, after obtaining the test results, the electronic device can automatically generate a test report to provide detailed test results and analysis, which facilitates relevant technical personnel to evaluate the performance and quality of the application.

[0090] In summary, the electronic devices in this application embodiment can construct simulated information through pure software simulation to simulate the behavior of real hardware devices, thereby enabling the testing of applications in charging piles. Compared to traditional testing methods, the method provided in this application embodiment reduces reliance on real hardware devices, improves automation, increases testing efficiency, and saves costs.

[0091] The following is combined Figures 2-3 This application describes the software architecture of a charging pile testing method provided in an embodiment. Among other things, Figure 2 This is a layered architecture diagram of a charging pile system provided in an embodiment of this application. Figure 3 This is a layered architecture diagram of another charging pile system provided in an embodiment of this application.

[0092] In this embodiment of the application, the layered architecture of the charging pile system divides the software into several layers, each with a clear role and division of labor. For example... Figures 2-3 As shown, the charging pile system can be divided into four layers, from bottom to top: hardware layer, driver and system layer, abstraction layer, and application layer.

[0093] During the PC-based and charging pile testing process, the charging pile controller application can be based on... Figure 2 The illustrated scheme runs on a PC. Among them, Figure 2 The middle-level driver and system layers include a simulation driver layer and a PC operating system. In the actual vehicle charging process, the charging pile controller application can be based on... Figure 3 The illustrated scheme runs on the hardware of a real charging station. Among them, Figure 3 The middle driver and system layers include the real driver layer and the embedded operating system.

[0094] This application embodiment provides an interface for communication between the simulation module and the application through a simulated simulation-driven layer. This allows the simulation module to provide simulation information to the application, providing data support for the application's operation at the application layer. Based on the simulation information, the application can generate test data.

[0095] After generating test data, the test data is compared with the preset target data to determine the test result. The preset target data is the desired test data. If the test data matches the preset target data, the test result is considered normal; otherwise, the test result is considered abnormal.

[0096] In this embodiment, by adding an abstraction layer between the application layer and the underlying layer, an interface can be provided for communication between the application layer and the driver and system layers, achieving isolation between the underlying and upper layers, allowing the application layer to run on different platforms. Therefore, after the charging pile controller application passes testing on a PC, the application can be directly migrated to an embedded platform, based on... Figure 2 The charging station system shown runs the application in an embedded operating system to perform the actual charging process.

[0097] like Figure 4 As shown in the figure, this is a schematic diagram of the operation of a test system provided in an embodiment of this application. Taking a PC as an example, in this embodiment of the application, the charging pile test system includes an application program for the charging pile controller, test cases, and a simulation module, all of which run on the PC to enable testing of the charging pile application program on the PC, reducing dependence on hardware devices.

[0098] The simulation module may include, but is not limited to, a charging gun module, a BMS module, an energy management system module, a charging host module, and an operation platform module. A test case set consisting of multiple test cases can be used through the simulation module to test the application of the charging pile controller.

[0099] The following is combined Figures 5-6 The functions of each software layer of the charging pile system are introduced.

[0100] like Figure 5 As shown, in this embodiment of the application, the abstraction layer includes an operating system abstraction layer (OSAL) and a hardware abstraction layer (HAL), which are used to provide a unified interface for upper-layer applications.

[0101] For example, the operating system abstraction layer can provide a unified system application interface for upper layers, such as tasks, semaphores, mutexes, and message queues. The specific internal implementation can then call the interfaces of the Linux operating system or a real-time operating system (RTOS) depending on the actual system differences.

[0102] The hardware abstraction layer provides a unified hardware driver operation interface for upper layers, such as performing operations like open, close, system calls (ioctl), read, and write on analog-to-digital converters (ADCs), universal asynchronous receiver-transmitters (UARTs), two-wire integrated circuits (IICs), and controller area networks (CANs). The specific internal implementation can then call the corresponding driver based on the actual hardware differences.

[0103] In this embodiment, the driver layer can provide a unified operation interface for the hardware abstraction layer, such as open, close, ioctl, read, and write. Simultaneously, the driver layer can support commonly used driver types for embedded devices, such as ADC, digital-to-analog converter (DAC), UART, Serial Peripheral Interface (SPI), Inter-Integrated Circuit (I2C), CAN, General Purpose Input / Output (GPIO), and timers.

[0104] like Figure 6 As shown in the figure, this figure is a schematic diagram of a driving layer provided in an embodiment of this application.

[0105] In this embodiment, the driver layer may include, but is not limited to, Linux drivers, STM32 drivers, and emulation drivers. For example, when the charging pile system is running on a PC, the driver layer may use an emulation driver.

[0106] This application embodiment provides an interface for communication between the simulation module and the application through a simulated simulation driver layer. This allows the simulation module to provide simulation information to the application, providing data support for the application's operation. By adding an abstraction layer between the application layer and the underlying layer, upper-layer applications can run on different platforms without relying on the lower-layer operating system and hardware drivers.

[0107] like Figure 7 As shown in the figure, this is a schematic diagram illustrating the interaction between a test case and an application provided in an embodiment of this application. The test case can interact with the simulation module, for example, by sending test commands to the simulation module, enabling the simulation module to construct corresponding simulation information and simulate the functionality of the hardware device.

[0108] The simulation module is a purely software simulation of a series of hardware devices that interact with the application of the charging pile controller. In this embodiment, the data interface provided by the simulation driver enables information exchange between the simulation module and the application. For example, the simulation module can send simulation information built based on test instructions to the application through the data interface provided by the simulation driver, so that the application can generate test data based on the simulation information and determine the test results.

[0109] To facilitate understanding, the following will be combined with Figures 8-12 This application provides an overall overview of a testing method for a charging pile according to an embodiment.

[0110] In this embodiment, the application program of the charging pile controller is the target under test, running on a PC, and can communicate with the simulation module through the abstraction layer and simulation driver.

[0111] like Figure 8 As shown, this figure is a timing diagram of the first charging pile testing method provided in the embodiment of this application, including S801-S812.

[0112] S801 is executed when the test framework is running, the simulation module and application are in the initialization state, the charging gun is not plugged in, and the charging pile is in the idle state.

[0113] S801: The application connects to the operation platform module and synchronizes the status of the charging gun and charging pile.

[0114] With the test framework running, the simulation module and application initialized, the charging gun unplugged, and the charging pile idle, the application can actively connect to the operation platform module and synchronize the status of the charging gun and charging pile with it. The operation platform module stores the current status of the charging gun and charging pile.

[0115] S802, the test case detects the status of the charging gun and charging pile through the operation platform module.

[0116] The test case reads the status of the charging gun and the charging station to determine whether the charging gun is not plugged in and whether the charging station is idle.

[0117] The test case determines that if the charging gun is not plugged in and the charging station is idle, then S803 is executed; otherwise, an error is reported.

[0118] S803: The test case sends a command to the charging gun module simulating a user inserting the charging gun.

[0119] For example, the instruction simulating a user inserting the charging gun is used to instruct the charging gun module to construct data when the user inserts the charging gun.

[0120] Based on the simulated user's instructions to insert the gun, the current test scenario can be determined as the gun insertion test scenario, so as to construct the simulation information corresponding to the gun insertion test scenario.

[0121] S804, the charging gun module constructs the sampling voltage data corresponding to CC1.

[0122] The charging gun module can construct simulation information corresponding to the test scenario of the charging gun test, simulating the change of the sampling voltage corresponding to the first contact (CC1) of the control guide circuit when the user performs the charging gun operation.

[0123] In one example, the simulation information corresponding to the test scenario of the insertion test includes the sampling voltage data corresponding to CC1. The sampling voltage data corresponding to CC1 can be a change from 6V to 12V, then from 12V to 6V, and then from 6V to 4V.

[0124] S805, the application synchronizes the charging gun status to the operation platform module as follows: the charging gun is plugged in.

[0125] In this embodiment of the application, the application can send test data to the operation platform module indicating that the charging gun is plugged in.

[0126] For example, after the application starts, it can detect the sampling voltage of CC1 in real time. When the sampling voltage of CC1 reaches 4V, it determines that a charging gun has been inserted and actively sends test data indicating that the status of the charging gun is inserted to the operation platform module, and the status of the charging gun is synchronized as: inserted.

[0127] S806. The test case detects and determines that the charging gun is plugged in through the operation platform module.

[0128] The test case can wait 1 second and then check the status of the charging gun through the operation platform module. If the status of the charging gun is determined to be that the charging gun is plugged in, the test result of the plugging test can be determined to be normal and S807 can be executed; otherwise, the test result of the plugging test is determined to be abnormal and an error is reported.

[0129] S807: The test case sends a command to the operation platform module simulating a user initiating a charging operation.

[0130] The test case sends a command to the operation platform module to simulate a user initiating a charging operation, thus simulating the process of a user actually initiating a remote charging command.

[0131] The S808 and the operation platform module send a charging start command to the application.

[0132] In response to the command sent by the test case to simulate a user initiating a charging operation, the operation platform module can construct a charging start command and send the charging start command to the application through the communication protocol.

[0133] S809, The application sends an electronic lock locking command to the charging gun module.

[0134] In response to the charging start command from the operation platform module, the application can send an electronic lock locking command to the charging gun module to simulate the actual charging gun locking process.

[0135] After the S810 charging gun module switches the electronic lock feedback signal to locked, the application detects that the electronic lock feedback signal of the charging gun is locked.

[0136] S811, The application sends a command to the BMS module to turn on the low-voltage auxiliary power supply.

[0137] S812, the application detects the status of the low-voltage auxiliary power supply.

[0138] The BMS module responds to the command to enable the low-voltage auxiliary power supply by constructing the data required to do so. Once the application detects that the low-voltage auxiliary power supply is powered on, the BMS handshake phase test process can proceed.

[0139] like Figure 9 As shown, this figure is a timing diagram of the second charging pile testing method provided in the embodiment of this application, including S901-S915.

[0140] S901, The application periodically sends charger handshake (CHM) messages to the BMS module.

[0141] The S902 and BMS modules periodically send vehicle handshake (BHM) messages to the application.

[0142] When the low-voltage auxiliary power supply is powered on, the BMS module can respond to CHM messages and periodically send BHM messages to the application.

[0143] S903: When the application receives the BHM message, it detects through the energy management system module that the contactors (C1, C2) in the DC power supply circuit inside the charger are open and the front-end voltage is <60V.

[0144] Understandably, only 60V is used as an example here, and the value can be provided by the BMS module.

[0145] S904, the application program switches to the insulation detection circuit and sends a command to the energy management system module to close C1 and C2.

[0146] S905, the application sends a command to the charging host module to start insulation detection.

[0147] The application sends a command to the charging host module to initiate insulation detection, thereby notifying the charging host module to initiate insulation detection.

[0148] S906 The charging host module changes the front-end and back-end voltage values ​​of C1 and C2 to the insulation detection voltage through the energy management system module.

[0149] S907. The application sends one or more of the following commands to the energy management system module: insulation detection, short circuit check, etc.

[0150] S908. After successful detection, the application sends a command to the energy management system module to cut off the insulation detection circuit.

[0151] S909: The application sends a command to the energy management system module to close the discharge circuit switch, initiating the discharge detection process.

[0152] After the insulation detection circuit is disconnected, the application sends a command to the energy management system module to close the discharge circuit switch, thereby closing the discharge circuit switch and starting the discharge detection process.

[0153] The S910 energy management system module gradually reduces the front-end and back-end voltage values ​​of C1 and C2 to below 60V within 5 seconds.

[0154] The energy management system module can simulate a real discharge detection process by gradually reducing the front-end and back-end voltage values ​​of C1 and C2 to below 60V within 5 seconds.

[0155] S911: The application detects that the front-end voltage and back-end voltage of C1 and C2 are less than 60V through the energy management system module, and sends a command to the energy management system module to disconnect the discharge circuit switch.

[0156] S912, The application sends a command to disconnect C1 and C2 to the energy management system module and checks the status of C1 and C2.

[0157] After the application determines that C1 and C2 are disconnected, it completes the insulation detection process.

[0158] S913, The application stops sending CHM messages and begins periodically sending charger identification (CRM(0x00)) messages to the BMS module.

[0159] When the S914 BMS module receives the CRM (0x00) message, it stops sending BHM messages and begins periodically sending vehicle identification (BRM) messages to the application.

[0160] S915. The application receives the BRM message and updates the CRM(0x00) message to the CRM(0xAA) message content.

[0161] After the application updates the CRM(0x00) message to the CRM(0xAA) message content, it can perform the test of the power battery status information (BSM) parameter configuration stage.

[0162] like Figure 10 As shown, this figure is a timing diagram of the third charging pile system testing method provided in the embodiment of this application, including S1001-S1015.

[0163] S1001, the BMS module periodically sends power battery charging parameter (BCP) messages to the application.

[0164] After receiving the CRM(0xAA) message, the BMS module stops sending BRM messages and begins periodically sending BCP messages.

[0165] S1002. The application receives the BCP message, stops sending CRM messages, and determines whether the vehicle parameters are normal.

[0166] If the vehicle parameters are confirmed to be normal, execute S1003.

[0167] S1003. The application periodically sends charger transmission time synchronization information (CTS) messages and charger maximum output capacity (CML) messages to the BMS module.

[0168] CTS messages can be sent selectively.

[0169] S1004, the BMS module determines whether the charging pile parameters are normal and sends an updated BCP message.

[0170] S1005, the BMS module stops sending BCP messages and begins periodically sending vehicle charging ready status (BRO(0x00)) messages to the application.

[0171] The S1006 and BMS modules change the back-end voltage values ​​of C1 and C2 to the battery reference voltage values ​​through the energy management system module.

[0172] S1007, the BMS module notifies the application that the vehicle is ready and periodically sends BRO(0xAA) messages to the application.

[0173] S1008. When the application receives the BRO(0xAA) message, it stops sending CTS and CML messages.

[0174] S1009. The application periodically sends a charger output ready (CRO(0x00)) message to the BMS module.

[0175] S1010: The application reads the battery voltage value, the front-end voltage value of C1 and C2 and the back-end voltage value through the energy management system module.

[0176] S1011, The application notifies the charging host module to start pre-charging.

[0177] S1012, The charging host module sets the front-end voltage values ​​of C1 and C2 to the battery voltage values ​​through the energy management system module.

[0178] For example, the battery voltage value can be greater than or equal to 1V and less than or equal to 10V.

[0179] S1013. The application detects the front-end voltage values ​​of C1 and C2 as battery voltage values ​​through the energy management system module, and determines that the charging pile is ready.

[0180] S1014. The application periodically sends CRO(0xAA) messages to the BMS module.

[0181] S1015, the BMS module receives the CRO(0xAA) message and stops sending BRO messages.

[0182] Based on this, the testing process for the charging phase can begin.

[0183] like Figure 11 As shown, this figure is a timing diagram of the fourth charging pile testing method provided in the embodiment of this application, including S1101-S1105.

[0184] S1101, the BMS module periodically sends battery charging request (BCL) and battery charging status (BCS) messages to the application.

[0185] S1102. The application receives the BCL message, stops sending CRO messages, and periodically sends charger charging status (CCS) messages to the BMS module.

[0186] S1103, BMS module receives CCS messages.

[0187] The BMS module receives the CCS message and enters the charging state normally.

[0188] In some examples, after receiving the CCS message, the BMS module can periodically send BSM messages, single-cell power battery voltage (BMV) messages, power battery temperature (BMT) messages, and power battery reserve (BSP) messages to the application.

[0189] S1104. The application synchronizes the charging pile status with the operation platform module as: Charging.

[0190] The application can generate test data indicating that the charging pile is in the charging process and send the test data to the operation platform module to synchronize the charging pile's status as: charging.

[0191] S1105. The test case reads the status of the charging pile through the operation platform module and determines whether the charging pile is charging.

[0192] After the application synchronizes the charging pile status with the operations platform module, the operations platform module can store the current charging pile status. Based on this, after a 5-second wait, the test cases can read the test data through the operations platform module to obtain the charging pile status and determine whether the charging pile is charging.

[0193] If the charging station is confirmed to be charging, the test result for the charging phase is considered normal, and the charging test can be stopped; otherwise, the test result for the charging phase is considered abnormal, and an error is reported.

[0194] like Figure 12 As shown, this figure is a timing diagram of the fifth charging pile testing method provided in the embodiment of this application, including S1201-S1217.

[0195] S1201: The test case sends a command to the operation platform module simulating a user stopping the charging operation.

[0196] After charging for a period of time, the test case can send a command to the operation platform module to simulate a user stopping the charging operation, thus simulating a remote stop charging command initiated by a real user.

[0197] S1202, The operation platform module sends a stop charging command to the application.

[0198] The operation platform module can construct a stop charging command based on the simulation driver layer according to the command sent by the simulated user in the test case to stop charging, and send the stop charging command to the application through the communication protocol.

[0199] S1203. The application periodically sends a Charger Stop Charging (CST) message to the BMS module.

[0200] After receiving the stop charging command from the operation platform module, the application begins to periodically send CST messages.

[0201] The S1204 and BMS modules receive CST messages, stop sending Vehicle Stop Charging (BST) messages, and periodically send Vehicle Statistics (BSD) messages.

[0202] S1205, The application sends a stop charging command to the charging host module.

[0203] S1206 The charging host module sets the output current value to 5A or less.

[0204] S1207. The application detects that the output current value is less than or equal to 5A through the energy management system module and disconnects C1 and C2.

[0205] S1208. The application sends a command to the energy management system module to close the discharge circuit switch, starting the discharge detection process.

[0206] S1209, the energy management system module gradually reduces the front-end voltage and back-end voltage of C1 and C2 to below 60V within 5 seconds.

[0207] S1210: The application detects that the front-end voltage and back-end voltage of C1 and C2 are less than 60V through the energy management system module, and disconnects the discharge circuit switch.

[0208] S1211. The application stops sending CST messages and begins periodically sending charger statistics (CSD) messages to the BMS module.

[0209] S1212: The BMS module receives CSD messages, stops sending BSD messages, and ends charging.

[0210] S1213, The application sends a command to the BMS module to turn off the low-voltage auxiliary power supply switch.

[0211] S1214. The application sends an electronic lock unlocking command to the charging gun module.

[0212] S1215. The application detects the electronic lock feedback signal as unlocked through the charging gun module.

[0213] The charging gun module responds to the electronic lock unlock command by switching the electronic lock feedback signal to "unlocked". Once the application detects that the electronic lock feedback signal is unlocked, it can normally enter the idle state.

[0214] S1216. The application synchronizes the charging pile status with the operation platform module as: idle state.

[0215] The application can generate test data indicating that the charging pile is in the "charging complete" state and send this test data to the operation platform module. The application also synchronizes the charging pile's status to the operation platform module as "idle."

[0216] S1217. The test case reads the status of the charging pile through the operation platform module to determine that charging has ended.

[0217] After the application synchronizes the charging pile status with the operations platform module, the operations platform module stores the current charging pile status. Test cases read the charging pile status through the operations platform module and determine whether the charging pile is in an idle state.

[0218] If the charging station is confirmed to be in an idle state, it indicates that charging has ended, and the test result for the charging stop phase can be determined to be normal; otherwise, it indicates that charging has not ended, and the test result for the charging stop phase can be determined to be abnormal, and an error will be reported.

[0219] The following is combined Figure 13 This application describes a test process for simulating abnormal locking feedback of an electronic lock, as provided in an embodiment. Figure 13 The timing diagram for the sixth charging pile testing method provided in the embodiments of this application includes S1301-S1314.

[0220] S1301, The test case sends a command to the charging gun module to simulate an electronic lock locking feedback abnormality.

[0221] In a scenario where the test framework is running, the simulation module and application are in the initialization state, the charging gun is not plugged in, and the charging pile is idle, the test case sends a command to the charging gun module to simulate an electronic lock locking feedback error.

[0222] S1302. The application connects to the operation platform module and synchronizes the status of the charging gun and charging pile with the operation platform module.

[0223] After the application actively connects to the operation platform module and synchronizes the status of the charging gun and charging pile with the operation platform module, the operation platform module can store the current status of the charging gun and charging pile.

[0224] S1303: The test case reads the status of the charging gun and charging pile through the operation platform module.

[0225] The test case reads the status of the charging gun and the charging station to determine whether the charging gun is not plugged in and whether the charging station is idle.

[0226] If the test case determines that the charging gun is not plugged in and the charging station is idle, then execute S1304; otherwise, report an error.

[0227] S1304: The test case sends a command to the charging gun module simulating a user inserting the charging gun.

[0228] S1305, the charging gun module constructs the sampling voltage data corresponding to CC1.

[0229] The charging gun module generates a sample voltage change corresponding to CC1 when the user inserts the charging gun. For example, the sample voltage data corresponding to CC1 generated by the charging gun module can change from 6V to 12V, then from 12V to 6V, and then from 6V to 4V.

[0230] S1306, The application synchronizes the charging gun status with the operation platform module as follows: Gun plugged in.

[0231] After the application starts, it can detect the sampling voltage of CC1 in real time. When the sampling voltage of CC1 reaches 4V, it determines that a charging gun has been inserted and actively synchronizes the status of the charging gun to the operation platform module as: plugged in.

[0232] S1307. The test case detects and determines that the charging gun is plugged in through the operation platform module.

[0233] The test case can wait 1 second and then check the status of the charging gun through the operation platform module. If the status of the charging gun is determined to be plugged in, S1308 is executed; otherwise, an error is reported.

[0234] S1308: The test case sends a command to the operation platform module simulating a user to start the charging operation.

[0235] The test case sends a command to the operation platform module to simulate a user initiating a charging operation, thus simulating the process of a user actually initiating a remote charging command.

[0236] S1309, The operation platform module sends a charging start command to the application.

[0237] In response to the command sent by the test case to simulate a user initiating a charging operation, the operation platform module can construct a charging start command and send the charging start command to the application through the communication protocol.

[0238] S1310, The application sends an electronic lock locking command to the charging gun module.

[0239] In response to the start charging command sent by the operation platform module, the application can send an electronic lock locking command to the charging gun module to simulate the real charging gun locking process.

[0240] S1311, The application detects that the electronic lock feedback signal of the charging gun module is not locked and the duration exceeds 5 seconds.

[0241] When the test case is configured with an abnormal electronic lock locking feedback from the charging gun module, the charging gun module, in response to the command simulating the abnormal electronic lock locking feedback, can generate a simulated message indicating that the electronic lock is unlocked and that the timeout has occurred. For example, the application can detect the electronic lock feedback signal from the charging gun module, determine if the electronic lock feedback signal is unlocked and lasts for more than 5 seconds, consider this an electronic lock locking abnormality, and execute the exception handling procedure.

[0242] S1312. The application executes the exception handling process, determines that the charging has failed, and records the fault status.

[0243] S1313 The application reports the status of the charging pile and the cause of any abnormalities to the operation platform module.

[0244] For example, the application can generate test data to indicate the status and cause of the abnormality of the charging pile, and report the test data to the operation platform module. For example, the application can report to the operation platform module that the status of the charging pile is "start-up failed" and the cause of failure is "electronic lock abnormality".

[0245] S1314. The test case reads the status of the charging pile and the cause of any abnormalities through the operation platform module.

[0246] For example, the operation platform module can store the current status of the charging pile and the reason for the abnormality. The test case can wait for 10 seconds and read the status of the charging pile through the operation platform module as "startup failed" and the reason for the abnormality is "electronic lock abnormality". In this case, it can be determined that the detection result of the electronic lock locking feedback abnormality detection is normal; otherwise, it can be determined that the detection result of the electronic lock locking feedback abnormality detection is abnormal.

[0247] In summary, by transforming the cumbersome embedded software development model into a PC software development model, the efficiency of coding self-testing is greatly improved in this embodiment. Through comprehensive test cases, various normal and abnormal scenarios during the use of charging piles can be simulated, enabling a more comprehensive and detailed inspection of software functions, thereby improving the overall quality of the software, facilitating the implementation of automated testing functions, protecting the stability of existing functions, and verifying the correctness of newly added functions.

[0248] In this embodiment, a simulation module is used to simulate the hardware functions of the charging pile, focusing on software function testing and reducing reliance on real hardware, thereby saving hardware costs. An abstraction layer is added to the test architecture to achieve complete isolation between the underlying code and the application layer. After migrating the platform, only the underlying driver needs to be adapted to achieve functional migration, greatly improving code portability.

[0249] like Figure 14As shown, this figure is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. In this embodiment, the electronic device may include, but is not limited to, a personal computer (PC), tablet computer, desktop computer, laptop computer, notebook computer, ultra-mobile personal computer (UMPC), handheld computer, netbook, etc. In some other implementations, the electronic device may also be a server, which may include, but is not limited to, rack server, blade server, etc., or general-purpose server, GPU server, DPU server, etc., and is not limited herein.

[0250] The electronic device includes a memory 1401, a processor 1402, and a communication interface 1403; wherein, the memory 1401 stores computer instructions, and the processor 1402 is used to execute the computer instructions, causing the electronic device to perform the steps of the testing method for a charging pile system described above.

[0251] In some embodiments, the processor 1402 may be a central processing unit (CPU).

[0252] In other implementations, processor 1402 may also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, transistor logic devices, hardware components, or any combination thereof. A general-purpose processor may be a microprocessor or any conventional processor.

[0253] In some embodiments, memory 1401 can be volatile memory or non-volatile memory, such as registers. Specifically, volatile memory refers to memory whose stored data is lost when the power supply is interrupted. Volatile memory is primarily random access memory (RAM), including static random access memory (SRAM) and dynamic random access memory (DRAM). Non-volatile memory refers to memory whose stored data is not lost even when the power supply is interrupted. Common non-volatile memories include read-only memory (ROM), optical discs, hard disks, solid-state drives (SSDs), and various memory cards based on flash memory technology.

[0254] In some embodiments, the memory 1401 has executable code, which is executed by the processor 1402. The bus can be a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (ESA) bus, etc. The bus can be divided into address bus, data bus, control bus, etc. For ease of understanding, Figure 14 The bus is represented by a single thick line, but this does not mean that there is only one bus or one type of bus.

[0255] The above description is merely one specific embodiment of this application, but the scope of protection of this application is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in this application should be included within the scope of protection of this application. Therefore, the scope of protection of this application should be determined by the scope of the claims.

Claims

1. A testing method for a charging pile, characterized in that, Applied to an electronic device, the electronic device including a processor, the method is executed by the processor, the method comprising: Generate test instructions based on test cases; Based on the test instruction, determine the test scenario corresponding to the test instruction; Simulation information is constructed based on the simulation module corresponding to the test scenario; the simulation module is a pure software simulation of the hardware device that interacts with the application of the charging pile controller, used to simulate the function of the hardware device; In response to the simulation information, test data is generated; the test data is used to instruct the application of the charging pile controller to generate data in the processor in response to the simulation information; wherein, the application runs in the processor; Based on the test data, the test results are determined; When the test instruction includes an instruction simulating a user inserting a gun, the simulation information includes sampled voltage data, and the step of generating test data in response to the simulation information includes: In response to the sampled voltage data, test data is generated to indicate the state of the charging gun corresponding to the insertion stage; Determining the test result based on the test data includes: If the test data indicates that the charging gun is plugged in, the test result of the plugging-in test is determined to be normal; if the test data indicates that the charging gun is not plugged in, the test result of the plugging-in test is determined to be abnormal. When the test instruction includes an instruction simulating a user initiating a charging operation, the simulation information includes the charging initiation instruction, and the step of generating test data in response to the simulation information includes: In response to the charging start command, test data is generated to indicate the status of the charging pile corresponding to the charging phase; Determining the test result based on the test data includes: When the test data indicates that the charging pile is charging, the test result of the charging phase is determined to be normal; when the test data indicates that the charging pile is not charging, the test result of the charging phase is determined to be abnormal. When the test instruction includes an instruction simulating a user stopping the charging operation, the simulation information includes the stop charging instruction, and the step of generating test data in response to the simulation information includes: In response to the charging stop command, test data is generated to indicate the status of the charging pile corresponding to the charging stop phase; Determining the test result based on the test data includes: If the test data indicates that the charging pile is in the state of charging completion, the test result of the charging stop phase is determined to be normal; if the test data indicates that the charging pile is in the state of charging, the test result of the charging stop phase is determined to be abnormal. When the test instruction includes an instruction simulating an electronic lock locking feedback anomaly, the simulation information includes the electronic lock feedback status being unlocked and a timeout occurring. In response to the simulation information, generating test data includes: In response to the simulation information, test data is generated to indicate the status of the charging pile and the cause of any abnormalities. Determining the test result based on the test data includes: When the test data indicates that the charging pile has failed to start and the cause of the abnormality is an electronic lock malfunction, the detection result of the electronic lock locking feedback abnormality detection is determined to be normal; when the test data does not indicate that the charging pile has failed to start and the cause of the abnormality is an electronic lock malfunction, the detection result of the electronic lock locking feedback abnormality detection is determined to be abnormal.

2. The method according to claim 1, characterized in that, The step of generating test data in response to the sampled voltage data to indicate the state of the charging gun during the insertion phase includes: When the sampled voltage data reaches a first preset voltage, test data is generated to indicate that the charging gun in the corresponding insertion stage is inserted; when the sampled voltage data does not reach the first preset voltage, test data is generated to indicate that the charging gun in the corresponding insertion stage is not inserted.

3. The method according to claim 1, characterized in that, The step of generating test data in response to the charging start command to indicate the status of the charging pile corresponding to the charging phase includes: In response to the charging start command, insulation detection, discharge detection, and battery management system parameter configuration are performed to generate a status of the charging pile corresponding to the charging stage.

4. The method according to claim 1, characterized in that, The step of generating test data in response to the charging stop command to indicate the status of the charging pile during the charging stop phase includes: In response to the stop charging command, sampled current data is constructed; In response to the sampled current data, test data is generated to indicate the status of the charging pile corresponding to the charging stop phase.

5. An electronic device, characterized in that, The electronic device includes: a processor and a memory; The memory is used to store program code and transmit the program code to the processor; The processor is used to execute the steps of a charging pile testing method as described in any one of claims 1-4 according to the instructions in the program code.

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