A high-resolution particle detector structure suitable for muon imaging

Abstract

The application discloses a kind of high-resolution particle detector structures suitable for muon imaging, by using the whole structure of scintillator, can not need to splice or process etc. Treatment to scintillator material, reduce the processing difficulty and cost, the whole structure of scintillator improves the transmission efficiency of light guide array to photon;Light guide array plays the sampling effect to the distribution of light signal generated by muon and other particles in scintillator, since the array structure formed by light guide block can reflect light signal multiple times, thereby it is favorable for optical fiber to absorb light signal, so that photoelectric sensing module can collect more photon signal for a muon event, improve the position detection resolution and accuracy of muon and other particles;In the case of aging and other failures of scintillator, or in the case of technical update of the material and structure of scintillator etc., the scintillator is easily replaced, thereby reducing maintenance cost, easy to realize replacement upgrade.The application is widely applied in particle detection technology field.

Description

Technical Field

[0001] This invention relates to the field of particle detection technology, and in particular to a high-resolution particle detector structure suitable for muon imaging. Background Technology

[0002] As a product of the collision between primordial cosmic rays and the atmosphere, cosmic muons possess strong penetrating power due to their relatively weak interaction with matter. Most cosmic muons travel at near the speed of light and their tracks are very close to a straight line. Muon imaging technology is a technique developed based on these characteristics of muons, generally divided into transmission imaging and scattering imaging. The former can perform non-destructive internal structure detection on large targets, while the latter is more suitable for detecting small-volume high-atomic-number materials.

[0003] Muon imaging works on a principle similar to X-rays, but with the difference that muons have stronger penetrating power, allowing for imaging of objects of larger volume and area. Applications include monitoring large ancient buildings, monitoring the operation and spent fuel status of nuclear reactors, volcano surveying, glacier surveying, underground mineral exploration, and groundwater surveying. In recent years, 3D muon imaging technology has also been developed. Its principle is similar to CT scans, using multiple detectors to probe the target from multiple angles and reconstructing the target's internal 3D density distribution. Muons are abundant in natural cosmic rays, and muon imaging technology utilizes this natural particle source, making it a green and pollution-free nuclear imaging technique.

[0004] Successful muon imaging applications require a high-performance particle detector. For the detector, given the same amount of data, the core parameter determining the imaging effect is the intrinsic position resolution of the muon detector. The more precise the detector resolution, the more accurately it can reflect the actual muon direction. However, current muon detectors generally suffer from low resolution or require high costs to achieve high resolution. Summary of the Invention

[0005] To address the technical problems of low resolution in muon detectors and high implementation costs of high resolution, the present invention aims to provide a high-resolution particle detector structure suitable for muon imaging.

[0006] This invention includes a high-resolution particle detector structure suitable for muon imaging, the high-resolution particle detector structure suitable for muon imaging comprising:

[0007] The high-resolution particle detector structure suitable for muon imaging includes:

[0008] Scintillator; the scintillator is an integral structure, generally a flat plate type;

[0009] An optical guide array; the optical guide array is made of a transparent first material, the optical guide array includes a base plate and a plurality of optical guide blocks extending from the base plate, one side of the base plate is joined to the scintillator, the optical guide blocks are located on the other side of the base plate, and the optical guide blocks are provided with channels for optical fibers to pass through;

[0010] Multiple optical fibers; the optical fibers pass through the optical guide block via the channel.

[0011] Furthermore, the high-resolution particle detector structure suitable for muon imaging also includes:

[0012] Auxiliary fixing clips; the auxiliary fixing clips are used to fix or release the scintillator and the light guide array, and at the same time, provide clamping for the optical fiber to fix the optical fiber.

[0013] Furthermore, each of the light guide blocks is arranged in a first direction and a second direction to form a rectangular array; the first direction is perpendicular to the second direction.

[0014] Each of the aforementioned light guide blocks includes a first channel and a second channel; the first channel extends along the first direction, and the second channel extends along the second direction;

[0015] In the first direction, the first channels of any two adjacent optical guide blocks are on the same straight line;

[0016] In the second direction, the second channels of any two adjacent optical guide blocks are on the same straight line;

[0017] The first or second channel, which is on the same straight line, allows the same optical fiber to pass through.

[0018] Furthermore, all the first channels are located on the same plane, all the second channels are located on the same plane, and the plane containing the first channels is parallel to the plane containing the second channels.

[0019] Furthermore, the high-resolution particle detector structure suitable for muon imaging also includes:

[0020] Multiple separators; the separators are made of a second material and are disposed between two adjacent light guide blocks.

[0021] Furthermore, the first material is a highly transmissive transparent solid material, and the second material is air; or, the first material is air, and the second material is a highly reflective solid material.

[0022] Furthermore, the high-resolution particle detector structure suitable for muon imaging also includes:

[0023] A highly reflective surface; the highly reflective surface is disposed on the outer surface of the light guide array; the outer surface of the light guide array is the surface of the light guide array that is not connected to the scintillator.

[0024] Furthermore, the transparent solid material is a high-transmittance material such as transparent resin, plexiglass, or polycarbonate; the high-reflectivity surface is a high-reflectivity material such as aluminum foil, reflective film, or titanium dioxide coating; and the optical fiber is a wavelength-shifted optical fiber.

[0025] Furthermore, the high-resolution particle detector structure suitable for muon imaging also includes:

[0026] A photoelectric sensing module; the photoelectric sensing module is connected to each of the optical fibers, and the photoelectric sensing module is used to convert the optical signal transmitted by the optical fiber into an electrical signal;

[0027] Signal processing board; the signal processing board is connected to the photoelectric sensing module, and the signal processing board is used to process the electrical signal into a digital signal;

[0028] A data analysis system; the data analysis system is used to process the digital signal and determine the location of the muon strike in the scintillator based on the processing results.

[0029] Furthermore, the photoelectric sensing module includes:

[0030] Multiple first photoelectric sensors; each first photoelectric sensor is connected to the first end of a corresponding optical fiber, the second end of each optical fiber is light-shielded, and the first photoelectric sensor is used to convert the optical signal transmitted by the connected optical fiber into an electrical signal;

[0031] or

[0032] The device comprises a plurality of first photoelectric sensors and a plurality of second photoelectric sensors; each first photoelectric sensor is connected to a first end of a corresponding optical fiber, and each second photoelectric sensor is connected to a second end of a corresponding optical fiber; the first photoelectric sensors and the second photoelectric sensors are respectively used to convert the optical signals transmitted by the connected optical fibers into electrical signals.

[0033] The beneficial effects of the present invention are as follows: The high-resolution particle detector structure suitable for muon imaging in the embodiments has the following beneficial effects:

[0034] By using a scintillator with an integral structure, there is no need to cut or splice the scintillator material, which reduces the processing difficulty and cost. The scintillator with an integral structure improves the photon transmission efficiency of the optical guide array.

[0035] On the one hand, the optical guide array serves to sample the distribution of light signals generated by particles such as muons in the scintillator. On the other hand, due to the array structure formed by the optical guide block and the reflective surface, the light signal can be reflected multiple times, which is beneficial for the optical fiber to absorb the light signal. This allows the photoelectric sensing module to collect more light signals in a single instance, reduce statistical errors, and improve the resolution and accuracy of position detection of particles such as muons.

[0036] The base plate and each photoconductor in the photoconductor array form an integral structure, which can simultaneously perform the matching of a large number of channels, improve the signal-to-noise ratio of the system, and effectively cope with the influence of the background signal.

[0037] The optical guide array and the scintillator are easily decoupled structures. When the scintillator fails due to aging or other malfunctions, or when there are technological updates to the material and structure of the scintillator, the scintillator can be easily replaced, thereby reducing maintenance costs and facilitating replacement and upgrades.

[0038] By setting auxiliary fixing buckles, the optical fiber can be clamped and fixed, which is beneficial for the optical fiber to absorb optical signals.

[0039] By using a first material to manufacture the optical guide array and a second material to manufacture the separator, it is beneficial for the optical signal to be absorbed by the optical fiber inside the optical guide array. Moreover, the first and second materials can be various different materials, thus providing good flexibility in material selection.

[0040] By setting a highly reflective surface in the optical guide array, the attenuation of the optical signal can be reduced;

[0041] The photoelectric sensing module can be configured with only a first photoelectric sensor, which can realize the function of light signal detection and reduce structural complexity and cost; the photoelectric sensing module can also be configured with a first photoelectric sensor and a second photoelectric sensor, thereby improving the detection efficiency of light signals and the accuracy of particle impact position detection. Attached Figure Description

[0042] Figure 1 This is a side cross-sectional view of the high-resolution particle detector structure suitable for muon imaging in the embodiment.

[0043] Figure 2 This is a schematic diagram of the overall structure of the high-resolution particle detector structure suitable for muon imaging in the embodiment.

[0044] Figure 3 This is a schematic diagram of the optical conductor structure in the embodiment;

[0045] Figure 4 This is a schematic diagram of the first connection method between the photoelectric sensing module and the optical fiber in the embodiment;

[0046] Figure 5 This is a schematic diagram of a second connection method between the photoelectric sensing module and the optical fiber in the embodiment;

[0047] Figure 6 This is a schematic diagram illustrating the working principle of a high-resolution particle detector structure suitable for muon imaging in the embodiment.

[0048] Figure 7 This is a schematic diagram of particle impact direction reconstruction for a high-resolution particle detector structure suitable for muon imaging in the embodiment.

[0049] Figure 8 This is a schematic diagram of the structure of the separator in the embodiment. Detailed Implementation

[0050] Terminology Explanation:

[0051] Muon: also known as muon, is a type of particle in the Standard Model of Particles, belonging to the category of leptons, and carries a single negative charge;

[0052] Cosmic muons: High-energy cosmic rays from outer space collide with atoms and molecules in the atmosphere, producing high-energy particles that decay further to produce secondary particles such as muons. High-energy muons have strong penetrating power and a long average lifetime. Therefore, the flux level of muons near the Earth's surface is significantly higher than that of other particles (such as electrons, positrons, protons, neutrons, etc.), making them the main component of cosmic rays measured at the Earth's surface. Hence, they are also called "cosmic ray muons" or "cosmic muons".

[0053] Plastic scintillator: The main component is polystyrene plastic mixed with some fluorescent agents. When muons pass through the scintillator, some energy is deposited in it, which excites the scintillator to emit light. The light is then converted into an electrical signal by photoelectric devices, which can be used to detect muons. It is a commonly used detection medium in the field of particle detection.

[0054] Position resolution: There is often a certain deviation between the particle impact position detected by the detector and the actual position. Position resolution is a statistical measure of the magnitude of this error. The higher the resolution (which is reflected in the smaller value), the more accurate the position detection.

[0055] Wavelength-shifting fiber: absorbs short-wavelength light (such as blue-violet light) and emits long-wavelength light (such as yellow-green light), playing a role in light collection in the field of particle detection;

[0056] Detection efficiency: The higher the probability that a particle is detected by the detector when it passes through it, the better;

[0057] Background: The signal received at the detector is not entirely the desired target signal. It is inevitable that some other signals will be mixed in, such as the noise of other electronics themselves, the dark noise of optoelectronic devices, etc. These noises can be collectively referred to as background.

[0058] There are two ways to implement muon detectors based on scintillators. The first is to form a detector array composed of a large number of thin scintillator strips, with the array set up in two planes, X and Y. A reflective layer and a light-shielding layer are wrapped around the outside of each scintillator. Position detection is achieved by pixelating the scintillator. The shape of the scintillator strips can include cuboids, triangular prisms, etc. The second method is to cut slots in the scintillator and embed wavelength-shifting optical fibers into the scintillator, which facilitates the reconstruction of the particle's impact position by the scintillating light collected by the optical fiber.

[0059] First, both methods inevitably involve the fabrication of scintillators. Due to the low melting point of scintillators, fabrication is not easy, keeping the cost of scintillator detectors high. In some applications, multiple scintillator detectors are needed simultaneously for data acquisition and 3D reconstruction, further amplifying the cost pressure. This high cost restricts the further application of this green and environmentally friendly technology, MIX imaging, in various imaging scenarios.

[0060] Moreover, in the first method, the detector's resolution is related to the number and size of the scintillator strips. Specifically, the more and smaller the scintillator strips, the higher the granularity of the scintillator and the higher the detector's resolution. Therefore, improving resolution in the first method comes at the cost of increased costs. For example, compared to 30 rectangular scintillator strips of 30cm x 30cm x 1cm, which have the same effective area, the latter's market purchase price is more than 7 times that of the former. Compared to 60 triangular prism scintillator strips of 30cm x 1cm x 1m (height), the market purchase price is more than 12 times that of the whole strip. This means that in the first method, material costs will account for a considerable portion of the detector's cost.

[0061] While the second method, slotting the scintillator, is slightly cheaper than the first approach, its drawbacks are more pronounced. Firstly, it suffers from poor positional accuracy, lacking effective position resolution. Secondly, its detection efficiency is low. The air gap between the slot and the optical fiber leads to significant total internal reflection, preventing many photons emitted by the scintillator from entering the fiber for collection and readout, thus reducing detection efficiency. This results in longer data acquisition times, decreasing imaging efficiency. Furthermore, since the slot does not provide fixation for the optical fiber, it can move within the slot, negatively impacting detector stability and significantly increasing the likelihood of damage during transport.

[0062] Furthermore, the performance of plastic scintillators degrades over time, and this performance decline may affect the accuracy and reliability of data acquisition during long-term monitoring. Both the first and second methods require meticulous encapsulation or processing of the scintillator. If performance degradation or unexpected component failure occurs, complex disassembly and repackaging procedures are necessary, which is time-consuming, labor-intensive, and increases maintenance costs significantly.

[0063] To address the shortcomings of the first and second methods described above, this embodiment provides a high-resolution particle detector structure suitable for muon imaging, which differs from both the first and second methods. While the high-resolution particle detector structure in this embodiment is suitable for muon imaging, it is not limited to it. Due to the similarities in particle detection principles, this invention can also be used to detect other types of charged particles, such as electrons.

[0064] In this embodiment, a side cross-sectional view of the high-resolution particle detector structure suitable for muon imaging is shown below. Figure 1 As shown, the overall structure is as follows Figure 2 As shown. (Refer to...) Figure 1 and Figure 2 The high-resolution particle detector structure suitable for muon imaging includes a scintillator, an optical guide array, and multiple optical fibers.

[0065] Reference Figure 1 The scintillator is a monolithic structure. For example, it is made of polystyrene plastic doped with fluorescent agents and molded into a single piece. In terms of shape, the scintillator is a whole piece of plastic material, not spliced ​​or combined from smaller components, and there is no need for further processing such as division.

[0066] The scintillator can be shaped like a square plate, a circular plate, or a triangular plate. For example, using a square plate-shaped scintillator allows the optical guide array to also be square, resulting in a high-resolution particle detector structure suitable for muon imaging that is as follows: Figure 2 The shape shown is also a square.

[0067] Reference Figure 1 The light guide array includes a base plate and multiple light guide blocks extending from the base plate. One side of the base plate is bonded to a scintillator, while the other side has light guide blocks grown from it. In this embodiment, a transparent first material is used to fabricate the light guide array. Specifically, transparent solid materials such as transparent resin, plexiglass, or polycarbonate can be used as the first material. The light guide array can be 3D printed or fabricated using methods such as machining.

[0068] The structure of a single optical guide block is as follows Figure 3 As shown. (Refer to...) Figure 1 and Figure 3 It is possible to fabricate cuboid-shaped light guide blocks, and all light guide blocks can be the same shape and size. For example, light guide blocks with dimensions of 1cm × 1cm × 0.7cm can be used. The specific size of the light guide block can be adjusted according to the spatial resolution of the target. For example, if a higher resolution detector is desired, a smaller light guide block size is used. Since light guides can be fabricated using 3D printing methods, changing the size will not increase the cost.

[0069] Reference Figure 1 Multiple light guide blocks are arranged along a first direction (X direction) and a second direction (Y direction) that are perpendicular to each other. For example, multiple light guide blocks are arranged in a row along the first direction (X direction) and multiple light guide blocks are arranged in a column along the second direction (Y direction), thus forming a rectangular array.

[0070] Reference Figure 1 and Figure 3 Each light guide block has a first channel extending along a first direction and a second channel extending along a second direction. The light guide blocks can be manufactured using 3D printing technology, with a transparent solid material as the first material.

[0071] In this embodiment, within the acceptable error range, the diameters of the first and second channels are the same as the diameter of the optical fiber, allowing the optical fiber to pass through both channels. The optical guide block simultaneously supports and fixes the optical fiber. The inner walls of the first and second channels can be smoothed to facilitate easy insertion of the optical fiber. Alternatively, when fabricating the optical guide array using 3D printing, the optical fiber can be pre-positioned at the corresponding positions of the first and second channels before 3D printing the optical guide array, thus directly obtaining an optical guide array with the assembled optical fiber.

[0072] In this embodiment, refer to Figure 1 The fabrication parameters of the optical guide blocks can be controlled so that the relative positions of the first and second channels in each optical guide block are the same throughout the entire optical guide block. In this way, when multiple optical guide blocks are fabricated to form a rectangular array, the first channels of each optical guide block in the same row are located on the same straight line, and the second channels of each optical guide block in the same column are located on the same straight line. This makes the optical fibers passing through the first channels of each optical guide block in the same row and the second channels of each optical guide block in the same row straight, reducing the bending loss of the optical fibers.

[0073] In this embodiment, refer to Figure 1 All the first channels are located on the same plane, and all the second channels are located on the same plane, and these two planes are parallel, for example, both are parallel to the base plate. Figure 1In this case, the plane containing the second channel is located above the plane containing the first channel, meaning it is farther away from the base plate. Alternatively, the plane containing the first channel can be located above the plane containing the second channel.

[0074] In this embodiment, the optical fiber used is a wavelength-shifting optical fiber. An optical fiber is inserted into the first channel of each row of optical conductors in the optical guide array, and an optical fiber is inserted into the second channel of each column of optical conductors in the optical guide array. Thus, each optical fiber sequentially passes through multiple optical conductors in the same row along each first channel, or sequentially passes through multiple optical conductors in the same column along each second channel. Each optical fiber has two ends, namely a first end and a second end.

[0075] In this embodiment, refer to Figure 1 The high-resolution particle detector structure suitable for muon imaging also includes a photoelectric sensing module and a signal processing board, as well as Figure 1 The data analysis system is not shown in the diagram.

[0076] In this embodiment, the photoelectric sensing module can be configured according to... Figure 4 or Figure 5 It is connected to each optical fiber in a certain way.

[0077] Reference Figure 4 The photoelectric sensing module includes multiple first photoelectric sensors, the number of which is equal to the number of optical fibers. The first photoelectric sensors can specifically be photomultiplier tubes, silicon photomultiplier devices, or photodiodes. Each first photoelectric sensor is connected to the first end of a corresponding optical fiber, and the second end of each optical fiber, the end not connected to a first photoelectric sensor, can be light-shielded. The data terminals of each first photoelectric sensor are connected to a signal processing board, which in turn is connected to a data analysis system.

[0078] In this embodiment, the working principle of the high-resolution particle detector structure suitable for muon imaging is as follows: Figure 2 and Figure 6 As shown. (Refer to...) Figure 2 When muons or other charged particles enter the scintillator, they strike a specific location within it, depositing energy. The scintillator converts some of this deposited energy into photons, which propagate along the scintillator to the base plate of the optical guide array, and then to the optical guide blocks within the array. Because multiple optical guide blocks form a rectangular array structure, light can undergo total internal reflection at the interface between the optical guide and the air. Therefore, the light signal entering the optical guide array undergoes multiple reflections within the array and does not quickly propagate outside. Consequently, the light signal can be collected by the optical fiber and transmitted to the photoelectric sensor.

[0079] In this embodiment, a highly reflective surface, such as aluminum foil, a reflective film, or a titanium dioxide coating, can also be provided on the outer surface of the optical guide array, that is, the surface that is not connected to the scintillator. By providing a highly reflective surface, the light signal entering the optical guide array can be reflected more inside the optical guide array, thereby being absorbed by the optical fiber.

[0080] Reference Figure 2 and Figure 6 When muons or other particles strike a scintillator and emit light, the light signal enters the corresponding light guide block and is transmitted along the optical fiber to the photoelectric sensor. The first photoelectric sensor converts the light signal transmitted through the connected optical fiber into an electrical signal. A programmable gate array (PGA) signal processing board collects the electrical signals acquired by each of the first photoelectric sensors, packages and processes them into digital signals, and transmits them to a data analysis system, which serves as the host computer system, via media such as Ethernet.

[0081] The data analysis system processes the digital signal and determines the muon impact location in the scintillator based on the processing results. For example, the data analysis system can determine the muon impact location using centroid reconstruction or fitting methods.

[0082] This embodiment provides two reconstruction methods. In the first reconstruction method, the data analysis system uses the following formula...

[0083]

[0084] Calculate the point of impact of the particle. Taking the first direction as an example, X... i E represents the spatial position (e.g., coordinates on the X-axis of the first direction) of the i-th fiber perpendicular to the first direction. i Σ represents the signal strength detected by the photoelectric sensor connected to the i-th optical fiber perpendicular to the first direction, where Σ represents the summation over all optical fibers in the first direction. This represents the reconstructed position coordinates of the particle impact point along the first direction. The formula essentially obtains the distribution of light intensity parallel to the first direction; by weighted averaging, as shown in the formula, the impact point of the particle along the first direction can be obtained. Similarly, the signal intensity detected along the second direction is used as X. i and E i Thus, calculate This represents the position coordinates of the reconstructed particle impact location in the second direction. By combining the position coordinates in both directions, the particle impact location can be determined.

[0085] In the second reconstruction method, the data analysis system uses the following formula

[0086]

[0087] Calculate the point of impact of the particle. Taking the first direction as an example, X... i E represents the spatial position (e.g., coordinates on the X-axis of the first direction) of the i-th fiber perpendicular to the first direction. i It is the signal strength detected by the photoelectric sensor connected to the i-th optical fiber perpendicular to the first direction, t. i It is E i At the signal trigger time, σ t It represents the standard deviation of time, an adjustable coefficient, and Σ indicates summation over all fibers in the first direction. X represents the reconstructed coordinates of the particle impact location along the first direction. Similarly, X is calculated by traversing the fiber optic cables along the second direction and using the detected signal intensity as X. i and E i Thus, calculate This represents the position coordinates of the reconstructed particle impact location in the second direction. By combining the position coordinates in both directions, the particle impact location can be determined.

[0088] In this embodiment, the principle of the second reconstruction method is as follows: Since light transmission takes time, the farther the optical fiber is from the particle's impact point, the later it receives the light signal, meaning the larger the t value. Therefore, a coefficient is set for each optical fiber (the i-th optical fiber). This results in channels with earlier responses receiving higher weights. This further emphasizes the contribution of channels closer to the hit location to the total signal strength detected by the data analysis system, while reducing the contribution of edge channels, effectively improving detection accuracy. This method, which combines time and energy information for reconstruction, is a unique reconstruction method inherent to the structure of this optical guide array.

[0089] In this embodiment, both the first and second reconstruction methods can reconstruct the particle impact position at a certain moment. The data analysis system can reconstruct the particle impact trajectory by tracking the particle impact positions at various moments.

[0090] Reference Figure 5 In another structure of the photoelectric sensing module, multiple first photoelectric sensors and multiple second photoelectric sensors are included, with the number of first and second photoelectric sensors equal to the number of optical fibers. The second photoelectric sensors can specifically be photomultiplier tubes, silicon photomultiplier devices, or photodiodes. The connection method between the first photoelectric sensors and the optical fibers is similar to... Figure 4 The same, but Figure 5In this design, the second end of the optical fiber is not shielded from light but is connected to a second photoelectric sensor. Both the first and second photoelectric sensors participate in the detection of optical signals. For example, the sum of the optical signals detected by the first and second photoelectric sensors on the same optical fiber can be used as the detection result for that fiber. By incorporating a second photoelectric sensor, the detection accuracy and sensitivity of the optical signal can be improved, further enhancing the resolution of the particle detector structure.

[0091] In this embodiment, a high-resolution particle detector structure suitable for muon imaging can also be used for particle orientation reconstruction. For example, such as Figure 7 As shown, two are used Figure 2 The high-resolution particle detector structures shown are suitable for muon imaging. They can be placed in parallel. If the paths of particles such as muons pass through both high-resolution particle detector structures at the same time, then each high-resolution particle detector structure can reconstruct the impact position of the particle, thereby obtaining two impact positions. Based on these two impact positions, the impact direction of the particle can be determined, thereby realizing particle orientation reconstruction.

[0092] In this embodiment, refer to Figure 8 A separator can be placed between every two adjacent light guide blocks. The separator is made of a second material. Specifically, the second material can be air. In this case, if the light guide array is fabricated using a transparent solid material through processes such as 3D printing, then the air in the environment will fill the spaces between adjacent light guide blocks as the second material to form the separator.

[0093] In this embodiment, a solid material with high light reflectivity can also be used as the second material to make a solid separator that is installed between adjacent optical guide blocks. This helps to enhance the reflection of the optical signal inside the optical guide array, thereby allowing it to be better absorbed by the optical fiber.

[0094] In this embodiment, refer to Figure 1 The high-resolution particle detector structure suitable for muon imaging also includes an auxiliary fixing clip. The auxiliary fixing clip consists of two parts, an upper and an lower part, where the lower part can support the scintillator and the upper part can install the separator and fix the optical guide array. Through the mechanical connection between the upper and lower parts, the auxiliary fixing clip can fix the scintillator and the optical guide array together. After the mechanical connection between the upper and lower parts is released, the fixing of the scintillator and the optical guide array can be released, allowing the scintillator and the optical guide array to be separated.

[0095] In this embodiment, the scintillator and the optical guide array are easily decoupled, and the coupling and decoupling between the scintillator and the optical guide array are achieved by setting auxiliary fixing clips. For example, when the scintillator ages and affects the detection effect, the mechanical connection of the auxiliary fixing clips can be released, making it easy to remove and replace the scintillator, thereby reducing maintenance costs.

[0096] Reference Figure 1 and Figure 2 In this embodiment, the auxiliary fixing buckle can also be used to support components such as the photoelectric sensing module and the signal processing board. Therefore, the auxiliary fixing buckle can fix the various components in the high-resolution particle detector structure suitable for muon imaging, improve the overall integrity of the high-resolution particle detector structure suitable for muon imaging, and enable the high-resolution particle detector structure suitable for muon imaging to effectively cope with complex operating environments that may involve severe vibrations, such as long-distance transportation and field exploration.

[0097] In this embodiment, the material properties of the first and second materials can also be reversed. For example, air can be used as the first material to form the photoguide array, and a high-reflectivity solid material such as aluminum foil, a reflective film, or titanium dioxide can be used as the second material to fabricate the separator. Specifically, the separator can be mounted on an auxiliary fixing clip, and ambient air can be used as the second material to fill the space between the scintillator and the separator, thereby forming the photoguide array. When using air, a low-loss medium, to form the photoguide array, the material of this relatively large component is gas, which helps to reduce the overall weight of the high-resolution particle detector structure suitable for muon imaging.

[0098] The high-resolution particle detector structure for muon imaging in this embodiment, by using a monolithic scintillator, avoids the need for splicing or processing of the scintillator material, reducing manufacturing difficulty and cost. Furthermore, since the monolithic scintillator is not composed of multiple smaller scintillator structures, it avoids the negative impacts of incomplete tight bonding and dead zones (areas where particles cannot be detected) caused by encapsulation and light-shielding layers between smaller scintillator structures. This improves the photon transmission efficiency of the optical guide array, enabling the detector to achieve a detection efficiency of over 96%. The optical guide array serves two purposes: firstly, it samples the distribution of light signals generated by muons and other particles within the scintillator; secondly, the array structure formed by the optical guide blocks allows for multi-channel processing of the light signals. Secondary reflection facilitates optical fiber absorption of optical signals, enabling the photoelectric sensing module to collect more photon signals, reducing detection errors, and improving the resolution and accuracy of position detection for particles such as muons. The base plate and each optical conductor in the optical guide array form an integrated structure, allowing for simultaneous coincidence of a large number of channels. Compared with technical solutions with only one or two channels, this significantly reduces the accidental coincidence rate, improves the system's signal-to-noise ratio, and effectively addresses the influence of background signals. The optical guide array and scintillator are easily decoupled, allowing for easy replacement of the scintillator in case of aging or other failures, or when there are technological updates to the scintillator's material and structure. This reduces maintenance costs and facilitates easy replacement and upgrades.

[0099] It should be noted that, unless otherwise specified, when a feature is referred to as "fixed" or "connected" to another feature, it can be directly fixed or connected to the other feature, or indirectly fixed or connected to the other feature. Furthermore, the descriptions of "upper," "lower," "left," and "right" used in this disclosure are only relative to the relative positional relationships of the components of this disclosure in the accompanying drawings. The singular forms "a" and "the" used in this disclosure are also intended to include the plural forms, unless the context clearly indicates otherwise. Moreover, unless otherwise defined, all technical and scientific terms used in this embodiment have the same meaning as commonly understood by one of ordinary skill in the art. The terminology used in this embodiment specification is only for describing particular embodiments and is not intended to limit the invention. The term "and / or" as used in this embodiment includes any combination of one or more of the associated listed items.

[0100] It should be understood that although the terms first, second, third, etc., may be used to describe various elements in this disclosure, these elements should not be limited to these terms. These terms are only used to distinguish elements of the same type from each other. For example, a first element may also be referred to as a second element without departing from the scope of this disclosure, and similarly, a second element may also be referred to as a first element. The use of any and all instances or exemplary language (“e.g.,” “such as,” etc.) provided in this embodiment is intended only to better illustrate embodiments of the invention and, unless otherwise required, does not impose a limitation on the scope of the invention.

[0101] The above are merely preferred embodiments of the present invention. The present invention is not limited to the above-described embodiments. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention, as long as they achieve the technical effects of the present invention by the same means, should be included within the scope of protection of the present invention. Within the scope of protection of the present invention, the technical solutions and / or implementation methods can have various modifications and variations.

Claims

1. A high-resolution particle detector structure suitable for muon imaging, characterized in that, The high-resolution particle detector structure suitable for muon imaging includes: Scintillator; the scintillator is an integral structure; when muons or other charged particles enter the scintillator and strike a certain position in the scintillator, energy is deposited in the scintillator. The scintillator converts part of the deposited energy into photons. The photons propagate along the scintillator to the base plate of the photoconductor array, and then are conducted to the photoconductor block of the photoconductor array. An optical guide array; the optical guide array is made of a transparent first material, the optical guide array includes a base plate and a plurality of optical guide blocks extending from the base plate, one side of the base plate is joined to the scintillator, the optical guide blocks are located on the other side of the base plate, and the optical guide blocks are provided with channels for optical fibers to pass through; Multiple optical fibers; the optical fibers pass through the optical guide blocks via the channels; each optical guide block is arranged in a first direction and a second direction to form a rectangular array; the first direction is perpendicular to the second direction; each optical guide block includes a first channel and a second channel; the first channel extends along the first direction, and the second channel extends along the second direction; the first channels of any two adjacent optical guide blocks in the first direction are on the same straight line; the second channels of any two adjacent optical guide blocks in the second direction are on the same straight line; the first channel or the second channel on the same straight line allows the same optical fiber to pass through; within the error range, the diameters of the first channel and the second channel match the diameter of the optical fiber, and the optical guide blocks support and fix the optical fiber; A photoelectric sensing module; the photoelectric sensing module is connected to each of the optical fibers, and the photoelectric sensing module is used to convert the optical signal transmitted by the optical fiber into an electrical signal; Signal processing board; the signal processing board is connected to the photoelectric sensing module, and the signal processing board is used to process the electrical signal into a digital signal; A data analysis system; the data analysis system is used to process the digital signal and determine the location of the muon strike in the scintillator based on the processing results; The data analysis system determines the location of the muon hit by either a center of gravity reconstruction method or a fitting method.

2. The high-resolution particle detector structure suitable for muon imaging according to claim 1, characterized in that, The high-resolution particle detector structure suitable for muon imaging also includes: Auxiliary fixing clips; the auxiliary fixing clips are used to fix or release the scintillator and the light guide array, and at the same time, provide clamping for the optical fiber to fix the optical fiber.

3. The high-resolution particle detector structure suitable for muon imaging according to claim 1, characterized in that, All of the first channels are located on the same plane, and all of the second channels are located on the same plane. The plane containing the first channels is parallel to the plane containing the second channels.

4. The high-resolution particle detector structure suitable for muon imaging according to claim 1, characterized in that, The high-resolution particle detector structure suitable for muon imaging also includes: Multiple separators; the separators are made of a second material and are disposed between two adjacent light guide blocks.

5. The high-resolution particle detector structure suitable for muon imaging according to claim 4, characterized in that, The first material is a highly transmissive transparent solid material, and the second material is air; or, the first material is air, and the second material is a highly reflective solid material.

6. The high-resolution particle detector structure for muon imaging according to claim 5, characterized in that, The high-resolution particle detector structure suitable for muon imaging also includes: A highly reflective surface; the highly reflective surface is disposed on the outer surface of the light guide array; the outer surface of the light guide array is the surface of the light guide array that is not connected to the scintillator.

7. The high-resolution particle detector structure for muon imaging according to claim 6, characterized in that, The transparent solid material is transparent resin, plexiglass, or polycarbonate; the highly reflective surface is aluminum foil, a reflective film, or a titanium dioxide coating; and the optical fiber is a wavelength-shifted optical fiber.

8. The high-resolution particle detector structure for muon imaging according to claim 1, characterized in that, The photoelectric sensing module includes: Multiple first photoelectric sensors; each first photoelectric sensor is connected to the first end of a corresponding optical fiber, the second end of each optical fiber is light-shielded, and the first photoelectric sensor is used to convert the optical signal transmitted by the connected optical fiber into an electrical signal; or The device comprises a plurality of first photoelectric sensors and a plurality of second photoelectric sensors; each first photoelectric sensor is connected to a first end of a corresponding optical fiber, and each second photoelectric sensor is connected to a second end of a corresponding optical fiber; the first photoelectric sensors and the second photoelectric sensors are respectively used to convert the optical signals transmitted by the connected optical fibers into electrical signals.

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