Test method and device of storage unit and storage medium thereof

Abstract

The application provides a test method and device of a storage unit and a storage medium. The method comprises: obtaining a plurality of target working parameter ranges; determining a first simulation environment according to the plurality of target working parameter ranges, wherein the first simulation environment is used for simulating a plurality of jump environments for driving the storage unit; and controlling the storage unit to perform a target operation based on the plurality of jump environments in the first simulation environment to obtain a first test result. The scheme of the application can realize the test of the storage unit in the actual use environment, thereby improving the detection accuracy of the storage unit, and further screening the storage unit based on the obtained first test result, and further improving the applicability of the actual use of the storage unit.

Description

Technical Field

[0001] This invention relates to the field of data storage, and more specifically to a method, apparatus, and storage medium for testing storage units. Background Technology

[0002] Currently, with the rapid development of technology, storage performance has become one of the most important performance characteristics of a device. Storage performance is primarily related to the device's storage units; therefore, pre-testing the storage units can ensure the device's storage performance in practical applications. However, current methods for testing storage units can only detect easily exposed problems and cannot prevent some faulty products from being detected. Therefore, improving the accuracy of storage unit testing to enhance the applicability of storage units in actual use is an urgent problem to be solved. Summary of the Invention

[0003] The main technical problem solved by this invention is that the existing methods for testing storage units have low accuracy, which in turn leads to low accuracy in screening faulty products and thus low applicability of storage units in actual use.

[0004] According to a first aspect, one embodiment provides a testing method for a storage unit, the method comprising: acquiring a plurality of target operating parameter ranges; determining a first simulation environment based on the plurality of target operating parameter ranges, wherein the first simulation environment is used to simulate a plurality of transition environments driving the storage unit; controlling the storage unit to perform a target operation based on the plurality of transition environments in the first simulation environment to obtain a first test result.

[0005] According to a second aspect, one embodiment provides a testing apparatus for a storage unit, the apparatus comprising: an acquisition module for acquiring a plurality of target operating parameter temperature ranges; a first simulation environment determination module for determining a first simulation environment based on the plurality of target operating parameter ranges, wherein the first simulation environment is used to simulate a plurality of transition environments driving the storage unit; and a first testing module for controlling the storage unit to perform a target operation based on the plurality of transition environments in the first simulation environment, thereby obtaining a first test result.

[0006] According to a third aspect of the embodiments of this application, a computer-readable storage medium is provided, on which computer-readable instructions are stored, which, when executed by a processor, implement the testing method of the storage unit as described above.

[0007] According to a fourth aspect of the embodiments of this application, an electronic device is provided, comprising: a processor; and a memory storing computer-readable instructions, wherein when the computer-readable instructions are executed by the processor, the testing method of the memory unit as described above is implemented.

[0008] According to the storage cell testing method / apparatus of the above embodiments, by acquiring multiple target operating parameter ranges of the storage cell, a first simulation environment corresponding to multiple transition environments for simulating driving the storage cell can be determined based on the multiple operating parameter ranges. In this way, the storage cell can be controlled to perform target operations based on the multiple transition environments in the first simulation environment to obtain a first test result. This enables the storage cell to be tested in a simulated actual use environment, thereby improving the accuracy of storage cell detection. Furthermore, the storage cell can be screened based on the obtained first test result, further improving the applicability of the storage cell in actual use. Attached Figure Description

[0009] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with this application and, together with the description, serve to explain the principles of this application. It is obvious that the drawings described below are merely some embodiments of this application, and those skilled in the art can obtain other drawings based on these drawings without any inventive effort.

[0010] Figure 1 This is a schematic flowchart illustrating a testing method for a storage unit according to an embodiment of this application.

[0011] Figure 2 This is a flowchart illustrating a testing method for a storage cell according to another embodiment of this application.

[0012] Figure 3 This is a flowchart illustrating a testing method for a storage cell according to yet another embodiment of this application.

[0013] Figure 4 This is a flowchart illustrating a testing method for a storage cell according to another embodiment of this application.

[0014] Figure 5 This is a flowchart illustrating the specific steps of step 430 according to an embodiment of this application.

[0015] Figure 6 This is a flowchart illustrating a testing method for a storage cell according to another embodiment of this application.

[0016] Figure 7 This is a block diagram of a testing apparatus for a storage cell according to an embodiment of this application.

[0017] Figure 8 This is a hardware structure diagram of an electronic device according to an embodiment of this application.

[0018] The accompanying drawings above illustrate specific embodiments of the present invention, which will be described in more detail below. Detailed Implementation

[0019] The present invention will now be described in further detail with reference to specific embodiments and accompanying drawings. Similar elements in different embodiments are referred to by associated similar element reference numerals. In the following embodiments, many details are described to facilitate a better understanding of this application. However, those skilled in the art will readily recognize that some features may be omitted in different situations, or may be replaced by other elements, materials, or methods. In some cases, certain operations related to this application are not shown or described in the specification. This is to avoid obscuring the core parts of this application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art.

[0020] Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments. At the same time, the steps or actions in the method description can be rearranged or adjusted in a manner obvious to those skilled in the art. Therefore, the various orders in the specification and drawings are only for the clear description of a particular embodiment and do not imply a necessary order, unless otherwise stated that a particular order must be followed.

[0021] The serial numbers assigned to components in this document, such as "first" and "second," are used only to distinguish the described objects and have no sequential or technical meaning. The terms "connection" and "linkage" used in this application, unless otherwise specified, include both direct and indirect connections (linkages).

[0022] Currently, commonly used storage devices in electronic devices, such as embedded Multi Media Cards (EMMC), generally consist of a controller and flash memory. SRAM memory is a crucial component of the controller chip, serving as the runtime medium for instruction code (RAM), temporary storage for data and tables (cache), and also acting as a register for the controller chip. Therefore, the quality of the SRAM memory directly affects the proper functioning of embedded application devices such as EMMC, UFS, and SSDs. However, current SRAM memory testing methods can only detect relatively easily exposed problems, failing to prevent faulty products from leaving the factory. Furthermore, the actual operating environment of electronic devices is complex, and commonly used testing methods cannot cover the realities of this environment.

[0023] In this embodiment of the invention, multiple target operating parameter ranges of the storage unit are first obtained. This allows for the determination of a first simulation environment corresponding to multiple transition environments used to simulate driving the storage unit, based on these multiple operating parameter ranges. This enables the storage unit to perform target operations within the first simulation environment based on the multiple transition environments, resulting in a first test result. This achieves the simulation of testing the storage unit in a real-world usage environment, thereby improving the accuracy of storage unit detection. Furthermore, the storage unit can be screened based on the obtained first test result, further enhancing the applicability of the storage unit in actual use.

[0024] The block diagrams shown in the accompanying drawings are merely functional entities and do not necessarily correspond to physically independent entities. That is, these functional entities can be implemented in software, in one or more hardware modules or integrated circuits, or in different network and / or processor devices and / or microcontroller devices. The flowcharts shown in the accompanying drawings are merely illustrative and do not necessarily include all content and operations / steps, nor do they necessarily have to be performed in the described order. For example, some operations / steps can be decomposed, while others can be combined or partially combined; therefore, the actual execution order may change depending on the specific circumstances.

[0025] Please see Figure 1 , Figure 1 This application illustrates a testing method for a storage cell according to an embodiment of the present application. In a specific embodiment, this testing method for the storage cell can be applied to, for example... Figure 7 The test apparatus 600 for the storage unit shown and the electronic device 700 configured with the test apparatus 600 for the storage unit are shown. Figure 8 The specific process of this embodiment will be described below. Of course, it is understood that this method can be executed by a computer terminal with computing capabilities, or by other processors, or even a memory chip. The following will focus on... Figure 1 The process shown is described in detail, and the testing method for the storage unit may specifically include the following steps:

[0026] Step 110: Obtain the range of multiple target working parameters.

[0027] As a method, the performance of a storage unit is mainly related to parameters such as read speed, write speed, storage capacity, data reliability, and energy efficiency. These parameters are related to the operating parameters of the storage unit during operation, such as voltage, current, and temperature. Therefore, during the testing phase of the storage unit, the operating parameters of the storage unit during operation can be adjusted to simulate the environment in which the customer uses the storage unit. In this way, the storage unit can be tested in the environment, thereby enabling the storage unit to cover most usage scenarios.

[0028] In some embodiments, the target operating parameters include voltage and / or temperature, wherein the plurality of voltage ranges are determined by the rated voltage of the memory cell, and the plurality of temperature ranges are determined by the rated temperature of the memory cell.

[0029] Optionally, since the storage unit has corresponding operating parameters such as rated voltage, rated current, rated power and rated temperature, and the actual operating parameters of the storage unit can be within the preset range corresponding to the rated voltage, rated current, rated power and rated temperature, multiple voltage ranges can be determined based on the rated voltage of the storage unit and multiple temperature ranges can be determined based on the rated temperature of the storage unit.

[0030] Step 120: Determine a first simulation environment based on the multiple target operating parameter ranges, wherein the first simulation environment is used to simulate multiple transition environments driving the storage unit.

[0031] As one approach, after obtaining multiple target operating parameter ranges, the operating parameters of the storage units can be set to the specific parameter values ​​corresponding to the target operating parameter ranges, thereby determining the first simulation environment.

[0032] Optionally, after obtaining multiple target operating parameter ranges for the storage unit, multiple switching environments for simulating the operation of the storage unit can be set based on these target operating parameter ranges. In each switching environment, the difference in parameter ranges corresponding to different target operating parameters must be greater than a preset value to be used in simulating the first simulation environment. For example, when the target operating parameter is voltage, in the first simulation environment, the voltage difference between the first switching environment and the second switching environment is greater than a preset voltage difference, where the preset voltage difference is a pre-set difference value used to determine the switching voltage.

[0033] Optionally, to better test the memory cells in the first simulated environment, multiple switching environments can be determined based on multiple stepped voltage / temperature levels. Optionally, a switching environment can be determined by merging at least two stepped voltage / temperature levels into one voltage / temperature level.

[0034] Step 130: In the first simulation environment, control the storage unit to perform the target operation based on the multiple jump environment to obtain the first test result.

[0035] In one approach, after determining the first simulation environment, the storage unit can be controlled to perform read operations, write operations, and continuous read / write operations through multiple transition environments within the first simulation environment. This tests whether the storage unit can normally execute the target operation in multiple transition environments, thereby obtaining the first test result.

[0036] Optionally, the first test result includes whether the storage unit can perform the target operation normally or cannot perform the target operation normally in the first simulation environment. If the first test result indicates that the storage unit can perform the target operation normally in the first simulation environment, it is determined that the storage unit can work normally in the transition environment. If the first test result indicates that the storage unit cannot perform the target operation normally in the first simulation environment, it is determined that the storage unit has failed the test and cannot be used online. The storage unit needs to be redesigned to ensure that the storage unit can perform the target operation normally in the transition environment.

[0037] Optionally, to further ensure the accuracy of the storage unit test, if the first test result indicates that the storage unit can work normally in the first simulation environment, then determine whether the data written by the storage unit in the first simulation environment is the same as the data read (when no data is written, there is no other data in the storage unit). If they are the same, the storage unit is determined to have passed the jump environment test; if they are different, the storage unit is determined to have failed the test.

[0038] In the embodiments of this application, multiple target operating parameter ranges of the storage unit are first obtained. This allows for the determination of a first simulation environment corresponding to multiple transition environments used to simulate driving the storage unit, based on the multiple operating parameter ranges. This enables the storage unit to perform target operations in the first simulation environment based on the multiple transition environments, thereby obtaining a first test result. The solution of this application can simulate testing of the storage unit in a real-world usage environment, thereby improving the accuracy of storage unit detection. Furthermore, the storage unit can be screened based on the obtained first test result, further improving the applicability of the storage unit in actual use.

[0039] Please see Figure 2 , Figure 2 A testing method for a storage cell provided in an embodiment of this application is illustrated. The following will focus on... Figure 2 The process shown is described in detail, and the testing method for the storage unit may specifically include the following steps:

[0040] Step 210: Obtain the range of multiple target working parameters.

[0041] Step 220: Determine at least one switching temperature range based on the plurality of temperature ranges, and determine at least one switching temperature range based on the voltage range.

[0042] In one approach, after obtaining multiple temperature ranges, at least two temperature ranges can be merged to obtain at least one switching temperature range; and after obtaining multiple voltage ranges, at least two voltage ranges can be merged to obtain at least one switching voltage range.

[0043] Optionally, within multiple temperature jump ranges, if the temperature difference corresponding to the limiting temperature of each temperature jump range is greater than a temperature difference threshold, then the corresponding temperature jump environment can be determined based on each temperature jump range. Similarly, within multiple voltage jump ranges, if the voltage difference corresponding to the limiting voltage of each voltage jump range is greater than a voltage difference threshold, then the corresponding voltage jump environment can be determined based on each voltage jump range.

[0044] Step 230: Determine the voltage transition environment of the storage cell based on the limiting temperature corresponding to the at least one transition temperature range, and determine the temperature transition environment of the storage cell based on the limiting voltage determined by the at least one transition voltage.

[0045] As one approach, in a voltage-fluctuating environment, due to various reasons (such as power-on or power-off), the operating voltage of a device may experience a sudden drop or a jump. Therefore, to accurately simulate the sudden drop or jump in voltage that occurs during the operation of a storage cell, the voltage fluctuation environment of the storage cell can be determined based on the limiting voltage corresponding to at least one fluctuation voltage range. For example, if a fluctuation voltage range is (1.2-7.2), the voltage fluctuation environment of the storage cell can be determined as the operating voltage of the storage cell switching between 1.2 and 7.2. Similarly, in a temperature-fluctuating environment, due to various reasons (such as the device processing multiple threads simultaneously), the operating temperature of a device may experience a sudden drop or a jump. Therefore, to accurately simulate the sudden drop or jump in temperature that occurs during the operation of a storage cell, the temperature-fluctuating environment of the storage cell can be determined based on the limiting temperature corresponding to at least one fluctuation temperature range.

[0046] Step 240: In the first simulation environment, control the storage unit to perform the target operation based on the multiple jump environment to obtain the first test result.

[0047] For a detailed description of steps 210 and 240, please refer to steps 110 and 130, which will not be repeated here.

[0048] In this embodiment, at least one temperature jump range is determined based on the acquired multiple temperature ranges. Then, the temperature jump environment of the storage cell can be determined based on the extreme temperature corresponding to the at least one temperature jump range. At least one voltage jump range is determined based on the acquired multiple voltage ranges. Then, the voltage jump environment of the storage cell can be determined based on the extreme voltage corresponding to the at least one voltage jump range. Thus, the storage cell can be tested in the voltage jump environment and / or temperature jump environment, thereby simulating the use of the storage cell under extreme conditions and further ensuring the accuracy of the storage cell.

[0049] Please see Figure 3 , Figure 3 A testing method for a storage cell provided in an embodiment of this application is illustrated. The following will focus on... Figure 3 The process shown is described in detail, and the testing method for the storage unit may specifically include the following steps:

[0050] Step 310: Obtain the range of multiple target working parameters.

[0051] For a detailed description of step 310, please refer to step 110, which will not be repeated here.

[0052] Step 320: Determine multiple polling test voltages based on the multiple voltage ranges, and determine multiple polling test temperatures based on the multiple temperature ranges.

[0053] As one approach, to further ensure the availability of the storage unit, the environment in which the storage unit operates normally under the target operating parameter range can be simulated to determine whether the storage unit can operate normally. Optionally, the storage unit can only perform the corresponding target operation within its rated voltage or rated range. Therefore, a stepped polling test voltage can be determined based on multiple voltage ranges of the storage unit, allowing the storage unit to be tested using multiple polling test voltages. Alternatively, a stepped polling test temperature can be determined based on multiple temperature ranges of the storage unit, allowing the storage unit to be tested using multiple polling test temperatures.

[0054] Optionally, the multiple polling test voltages / multiple polling test temperatures can be an arithmetic sequence or a geometric sequence. Appropriate voltage / temperature values ​​can be selected from multiple voltage ranges / multiple temperature ranges to make the obtained multiple voltage / temperature values ​​form an arithmetic or geometric sequence, thereby obtaining multiple polling test voltages / temperatures.

[0055] Step 330: Perform voltage tests on the memory cells sequentially according to the multiple polling test voltages to obtain voltage test results.

[0056] In one approach, after obtaining multiple polling test voltages, the operating voltage of the memory cell can be set according to the multiple polling test voltages, so that the memory cell performs the target operation under the corresponding multiple polling test voltages, thereby realizing voltage testing of the memory cell.

[0057] Optionally, the voltage test results include whether the storage unit can perform the target operation normally under multiple polling test voltages and whether the storage unit cannot perform the target operation normally under certain polling test voltages. Optionally, to further ensure the accuracy of the storage power supply voltage test, when it is determined that the storage unit can perform the target operation normally under multiple polling test voltages, it is determined whether the data written and read by the storage power supply under the same polling test voltage are the same. If they are the same, the storage unit is determined to have passed the voltage test; if they are different, the storage unit is determined to have failed the voltage test.

[0058] Step 340: Perform temperature tests on the storage unit sequentially according to the multiple polled test temperatures to obtain temperature test results.

[0059] In one approach, after obtaining multiple polling test temperatures, the operating temperature of the storage unit can be set according to these multiple polling test temperatures, so that the storage unit performs the target operation at the corresponding multiple polling test temperatures, thereby achieving temperature testing of the storage unit.

[0060] Optionally, the temperature test results include whether the storage unit can perform the target operation normally under multiple polling test temperatures and whether the storage unit cannot perform the target operation normally under certain polling test temperatures. Optionally, to further ensure the accuracy of the storage power supply's temperature test, when it is determined that the storage unit can perform the target operation normally under multiple polling test temperatures, it is determined whether the data written and read by the storage power supply are the same under the same polling test temperature. If they are the same, the storage unit is determined to have passed the temperature test; if they are different, the storage unit is determined to have failed the temperature test.

[0061] In this embodiment, by determining multiple polling test voltages based on multiple voltage ranges and multiple polling test temperatures based on multiple temperature ranges, the storage unit can be voltage-tested based on multiple polling test voltages and temperature-tested based on multiple polling test temperatures. This ensures that the storage unit can operate in a simulated stepped environment, enriching the testing environment and further improving the testing accuracy of the storage unit.

[0062] Please see Figure 4 , Figure 4 A testing method for a storage cell provided in an embodiment of this application is illustrated. The following will focus on... Figure 4The process shown is described in detail, and the testing method for the storage unit may specifically include the following steps:

[0063] Step 410: Obtain the range of multiple target working parameters.

[0064] For a detailed description of step 410, please refer to step 110, which will not be repeated here.

[0065] Step 420: Determine a second simulation environment based on the plurality of temperature ranges and the plurality of voltage ranges, wherein the second simulation environment is used to simulate the environment in which the storage cell performs the first target operation and the second target operation under different conditions.

[0066] In one approach, to ensure that the storage unit can continue to operate normally when the user is using the storage unit, after obtaining multiple temperature ranges and multiple voltage ranges, a second simulation environment can be determined based on the multiple temperature ranges and multiple voltage ranges to simulate the continuous changes in voltage and temperature of the storage unit when the user is using the storage unit.

[0067] Optionally, in the second simulation environment, different operations can be performed under different temperature and voltage conditions to achieve the execution of the first and second target operations under different conditions, thereby testing the memory cell. Optionally, the first and second target operations together constitute the memory cell to complete continuous read and write operations.

[0068] Step 430: Test the storage unit in the second simulation environment to obtain the second test result.

[0069] In one approach, once the second simulation environment is determined, a first target operation is performed at a first temperature and a second voltage in the second simulation environment, and a second target operation is performed at a second temperature and a second voltage in the second simulation environment, thereby enabling the storage cell to be tested in the second simulation environment.

[0070] Optionally, the second test results include the storage unit's ability to perform the first target operation and the second target operation under different conditions in the second environment, and the storage unit's inability to perform the first target operation and / or the second target operation under different conditions in the second environment.

[0071] In some embodiments, such as Figure 5 As shown, step 430 includes:

[0072] Step 431: Determine a first conditional environment based on the second simulation environment, and control the storage unit to perform a first target operation in the first conditional environment to obtain target data.

[0073] As one approach, to ensure accurate second test results, a first conditional environment can be determined based on the second simulated environment. This first conditional environment can be a low-temperature, low-voltage environment determined based on multiple temperature and voltage ranges, thereby enabling the storage unit to perform the first target operation within this low-temperature, low-voltage environment. Optionally, the low-temperature, low-voltage environment can refer to an environment with relatively low temperature and voltage values ​​within the temperature and voltage ranges that support normal operation of the storage device.

[0074] Optionally, the first target operation can be either a read operation or a write operation, which can be set according to actual needs. Whether it's a read or write operation, the corresponding data can be obtained after the corresponding operation is performed in the storage unit.

[0075] Step 432: Determine a second conditional environment based on the second simulation environment, and control the storage unit to perform a second target operation in the second conditional environment to obtain reference data, wherein the temperature range and / or voltage range corresponding to the first conditional environment are different from those of the first conditional environment.

[0076] As one approach, to accurately simulate the constantly changing environment of the storage device during user operation, a second simulated environment, different from the first, can be determined. This second simulated environment can be a high-temperature, high-voltage environment determined based on multiple temperature and voltage ranges. This allows the storage device to be controlled to perform a second target operation within this high-temperature, high-voltage environment. Optionally, the high-temperature, high-voltage environment refers to an environment with higher temperature and voltage values ​​within the temperature and voltage ranges that support normal operation of the storage device, and the temperature and / or voltage ranges corresponding to the second simulated environment differ from those of the first simulated environment.

[0077] Optionally, the second target operation is a different target operation from the first target operation. If the first target operation is a read operation, then the second target operation is a write operation; if the first target operation is a write operation, then the second target operation is a read operation. The order in which the first and second target operations are executed depends on the type of the target operation, i.e., write first and then read, and is independent of the first and second conditional environments. The first and second target operations together constitute a complete read / write operation for the storage unit, thereby ensuring the accuracy of the storage unit's testing.

[0078] In other embodiments, the storage unit may be controlled to perform a first target operation under a second condition and to perform a second target operation under a first condition, so as to ensure that the first target operation and the second target operation are completed under different conditions, thereby ensuring the accuracy of the storage unit test.

[0079] Step 433: Determine the second test result based on the target data and the reference data.

[0080] In one approach, to test whether a storage unit can function properly in a simulated second environment, the target data after the first target operation is performed and the reference data after the second target operation are performed can be compared to determine the second test result of the storage unit. Based on the second test result, it can be determined whether the storage unit can perform the corresponding target operation under different conditions in the second simulated environment.

[0081] In some embodiments, step 433 includes: determining whether the target data is the same as the reference data; if they are the same, determining that the second test result indicates that the storage unit has passed the test; if they are not the same, determining that the second test result indicates that the storage unit has failed the test.

[0082] In one approach, to determine the second test result of the storage unit, the data written to the storage unit in the second simulation environment and the data read in the second simulation environment can be compared to determine whether the target data is the same as the reference data, thereby determining the second test result.

[0083] Optionally, if the target data and the reference data are different, it is determined that a fault occurred during the read operation of the storage unit in the second environment, resulting in the read data being different from the written data. In this case, the storage unit is determined to have failed the test. If the target data and the reference data are the same, it is determined that no fault occurred during the write and read operations of the storage unit in the second environment, resulting in the read data being the same as the written data. In this case, the storage unit is determined to have passed the test.

[0084] In this embodiment, a second simulated environment is determined based on multiple temperature ranges and multiple voltage ranges. This allows the storage unit to perform a first target operation under a first condition in the second simulated environment and a second target operation under a second condition, thereby simulating the constantly changing environment of the storage unit during actual use. This enriches the test environment and further improves the test accuracy of the storage unit.

[0085] Please see Figure 6 , Figure 6 A testing method for a storage cell provided in an embodiment of this application is illustrated. The following will focus on... Figure 6 The process shown is described in detail, and the testing method for the storage unit may specifically include the following steps:

[0086] Step 510: If it is determined that the storage unit has failed the test, then determine the target simulation environment for the storage unit that has failed the test.

[0087] As one approach, when a storage cell fails a test, it can be determined that the storage cell will malfunction in actual application. To ensure the usability of subsequent storage cells, a specific target simulation environment in which the storage cell failed the test is identified. This allows for improvements to the storage cell based on the target simulation environment. Optionally, the target simulation environment may specifically include the voltage and / or temperature environment in which the storage cell failed the test.

[0088] Step 520: Generate prompt information based on the target simulation environment, and provide design prompts for the storage unit based on the prompt information.

[0089] In one approach, after determining the target simulation environment, a prompt message can be generated based on the specific voltage and / or temperature values, voltage range, and temperature range corresponding to the target simulation environment. This prompt message indicates that the storage unit failed the test at a specific temperature and / or voltage.

[0090] Optionally, the prompt message may also include the specific test results of the storage unit failing the test. For example, if the storage unit fails the test in the second simulation environment, the prompt message will include not only the specific voltage and temperature values, but also the specific fault type (read fault, write fault, the read data is different from the written data, and the storage unit cannot work properly, etc.). This way, the prompt message can be sent to the test equipment connected to the storage unit's communication, and developers can improve the storage unit by viewing the prompt message on the test equipment.

[0091] In this embodiment, when it is determined that the storage unit fails the test, the target simulation environment of the storage unit that failed the test is determined. This allows prompt information to be generated based on the target simulation environment, and design prompts to be given to the storage unit based on the prompt information. This enables developers to improve the storage unit based on the design prompts, thereby further improving the development efficiency of the storage unit.

[0092] Figure 7 This is a block diagram of a testing apparatus for a memory cell according to an embodiment of this application, as shown below. Figure 7 As shown, the testing device 600 for the storage unit includes: an acquisition module 610, a first simulation environment determination module 620, and a first testing module 630.

[0093] The acquisition module 610 is used to acquire multiple target operating parameter temperature ranges; the first simulation environment determination module 620 is used to determine a first simulation environment based on the multiple target operating parameter ranges, wherein the first simulation environment is used to simulate multiple transition environments driving the storage unit; the first test module 630 is used to control the storage unit to perform target operations based on the multiple transition environments in the first simulation environment to obtain a first test result.

[0094] In some embodiments, the target operating parameters include voltage and / or temperature, wherein the plurality of voltage ranges are determined by the rated voltage of the memory cell, and the plurality of temperature ranges are determined by the rated temperature of the memory cell.

[0095] In some embodiments, the first simulation environment determination module 620 includes: a first determination submodule, configured to determine at least one jump temperature range based on the plurality of temperature ranges, and to determine at least one jump temperature range based on the plurality of voltage ranges; and a second determination submodule, configured to determine the voltage jump environment of the memory cell based on the limiting temperature corresponding to the at least one jump temperature range, and to determine the temperature jump environment of the memory cell based on the limiting voltage determined by the at least one jump voltage.

[0096] In some embodiments, the testing apparatus 600 for the storage cell further includes: a voltage / temperature determination module, configured to determine a plurality of polling test voltages based on the plurality of voltage ranges, and a plurality of polling test temperatures based on the plurality of temperature ranges; a voltage testing module, configured to sequentially perform voltage tests on the storage cell based on the plurality of polling test voltages to obtain voltage test results; and a temperature testing module, configured to sequentially perform temperature tests on the storage cell based on the plurality of polling test temperatures to obtain temperature test results.

[0097] In some embodiments, the testing apparatus 600 for the storage unit further includes: a second simulation environment determination module, configured to determine a second simulation environment based on the plurality of temperature ranges and the plurality of voltage ranges, wherein the second simulation environment is used to simulate the environment in which the storage unit performs the first target operation and the second target operation under different conditions; and a second testing module, configured to test the storage unit in the second simulation environment to obtain a second test result.

[0098] In some embodiments, the second test module includes: a first control submodule, configured to determine a first conditional environment based on the second simulation environment, and control the storage unit to perform a first target operation in the first conditional environment to obtain target data; a second control submodule, configured to determine a second conditional environment based on the second simulation environment, and control the storage unit to perform a second target operation in the second conditional environment to obtain reference data, wherein the first conditional environment has a different temperature range and / or voltage range than the first conditional environment; and a test result determination submodule, configured to determine the second test result based on the target data and the reference data.

[0099] In some embodiments, the test result determination submodule includes: a judgment unit, configured to determine whether the target data and the reference data are the same; a first determination unit, configured to determine, if they are the same, that the second test result indicates that the storage unit has passed the test; and a second determination unit, configured to determine, if they are not the same, that the second test result indicates that the storage unit has failed the test.

[0100] In some embodiments, the testing apparatus 600 for the storage unit further includes: a target simulation environment determination module, configured to determine the target simulation environment in which the storage unit fails the test if it is determined that the storage unit fails the test; and a prompting module, configured to generate prompting information based on the target simulation environment and provide design prompts to the storage unit based on the prompting information.

[0101] According to one aspect of the embodiments of this application, an electronic device is also provided, such as... Figure 8 As shown, the electronic device 700 includes a processor 710 and one or more memories 720. The one or more memories 720 are used to store program instructions executed by the processor 710. When the processor 710 executes the program instructions, it implements the test method of the memory unit described above.

[0102] Furthermore, the processor 710 may include one or more processing cores. The processor 710 runs or executes instructions, programs, code sets, or instruction sets stored in the memory 720, and retrieves data stored in the memory 720. Optionally, the processor 710 may be implemented using at least one hardware form selected from Digital Signal Processing (DSP), Field-Programmable Gate Array (FPGA), and Programmable Logic Array (PLA). The processor 710 may integrate one or a combination of several of the following: Central Processing Unit (CPU), Graphics Processing Unit (GPU), and modem. The CPU primarily handles the operating system, user interface, and applications; the GPU is responsible for rendering and drawing the displayed content; and the modem handles wireless communication. It is understood that the modem may also not be integrated into the processor and may be implemented using a separate communication chip.

[0103] According to one aspect of this application, a computer-readable storage medium is also provided, which may be included in the electronic device described in the above embodiments; or it may exist independently and not assembled into the electronic device. The computer-readable storage medium carries computer-readable instructions that, when executed by a processor, implement the methods in any of the above embodiments.

[0104] It should be noted that the computer-readable medium shown in the embodiments of this application can be a computer-readable signal medium or a computer-readable storage medium, or any combination of the two. A computer-readable storage medium can be, for example,—but not limited to—an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples of a computer-readable storage medium may include, but are not limited to: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM), flash memory, optical fiber, portable compact disc read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this application, a computer-readable storage medium can be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, apparatus, or device. In this application, a computer-readable signal medium can include a data signal propagated in baseband or as part of a carrier wave, carrying computer-readable program code. Such transmitted data signals can take various forms, including but not limited to electromagnetic signals, optical signals, or any suitable combination thereof. The computer-readable signal medium can also be any computer-readable medium other than a computer-readable storage medium, which can send, propagate, or transmit a program for use by or in connection with an instruction execution system, apparatus, or device. The program code contained on the computer-readable medium can be transmitted using any suitable medium, including but not limited to wireless, wired, etc., or any suitable combination thereof.

[0105] The units described in the embodiments of this application can be implemented in software or hardware, and the described units can also be located in a processor. The names of these units do not necessarily limit the specific unit itself.

[0106] The above examples illustrate the present invention only to aid in understanding it and are not intended to limit the scope of the invention. Those skilled in the art can make various simple deductions, modifications, or substitutions based on the principles of this invention.

Claims

1. A method for testing a storage unit, characterized in that, The method includes: Obtain multiple target operating parameter ranges; the multiple target operating parameter ranges include multiple voltage ranges and / or multiple temperature ranges, the multiple voltage ranges being determined by the rated voltage of the storage cell, and the multiple temperature ranges being determined by the rated temperature of the storage cell; A first simulation environment is determined based on the range of the multiple target operating parameters, wherein the first simulation environment is used to simulate multiple transition environments that drive the storage unit; In the first simulation environment, the storage unit is controlled to perform a target operation based on the multiple jump environment control to obtain a first test result; The step of determining the first simulation environment based on the plurality of target operating parameter ranges includes: At least one switching temperature range is determined based on the plurality of temperature ranges, and at least one switching voltage range is determined based on the plurality of voltage ranges; The temperature jump environment of the memory cell is determined based on the limiting temperature corresponding to the at least one jump temperature range, and the voltage jump environment of the memory cell is determined based on the limiting voltage determined by the at least one jump voltage.

2. The method according to claim 1, characterized in that, After obtaining the multiple target operating parameter temperature ranges, the method further includes: Multiple polling test voltages are determined based on the multiple voltage ranges, and multiple polling test temperatures are determined based on the multiple temperature ranges; The storage cell is tested sequentially based on the multiple polling test voltages to obtain the voltage test results; The storage unit is tested sequentially based on the multiple polled test temperatures to obtain the temperature test results.

3. The method according to claim 1, characterized in that, After obtaining the multiple target operating parameter temperature ranges, the method further includes: A second simulation environment is determined based on the plurality of temperature ranges and the plurality of voltage ranges, wherein the second simulation environment is used to simulate the environment in which the storage cell performs a first target operation and a second target operation under different conditions; The storage unit was tested in the second simulation environment to obtain a second test result.

4. The method according to claim 3, characterized in that, The step of testing the storage unit in the second simulation environment to obtain a second test result includes: Based on the second simulation environment, a first conditional environment is determined, and the storage unit is controlled to perform a first target operation in the first conditional environment to obtain target data; A second conditional environment is determined based on the second simulation environment, and the storage unit is controlled to perform a second target operation in the second conditional environment to obtain reference data. The temperature range and / or voltage range corresponding to the first conditional environment are different from those of the first conditional environment. The second test result is determined based on the target data of the storage unit and the reference data.

5. The method according to claim 4, characterized in that, Determining the second test result based on the target data and the reference data includes: Determine whether the target data is the same as the reference data; If they are the same, then the second test result indicates that the storage unit has passed the test; If they are not the same, then the second test result indicates that the storage unit has failed the test.

6. The method according to any one of claims 1-5, characterized in that, The method further includes: If it is determined that the storage unit fails the test, then the target simulation environment for the storage unit that failed the test is determined; Based on the target simulation environment, prompt information is generated, and design prompts are provided for the storage unit based on the prompt information.

7. A testing apparatus for a storage cell, characterized in that, The device includes: An acquisition module is used to acquire multiple target operating parameter ranges; the multiple target operating parameter ranges include multiple voltage ranges and / or multiple temperature ranges, the multiple voltage ranges being determined by the rated voltage of the storage unit, and the multiple temperature ranges being determined by the rated temperature of the storage unit; The first simulation environment determination module is used to determine a first simulation environment based on the range of the plurality of target operating parameters, wherein the first simulation environment is used to simulate a plurality of transition environments that drive the storage unit; The step of determining the first simulation environment based on the plurality of target operating parameter ranges includes: At least one switching temperature range is determined based on the plurality of temperature ranges, and at least one switching voltage range is determined based on the plurality of voltage ranges; The temperature jump environment of the memory cell is determined based on the limiting temperature corresponding to the at least one jump temperature range, and the voltage jump environment of the memory cell is determined based on the limiting voltage determined by the at least one jump voltage. The first test module is used to control the storage unit to perform target operations based on the multiple jump environments in the first simulation environment, and obtain the first test result.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium contains program code that can be invoked by a processor to execute the method as described in any one of claims 1 to 6.

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