一种基于阶梯式金刚线切割的12吋半导体硅片加工方法

By using a stepped diamond wire cutting method, which employs staged cutting of different thicknesses of diamond wire and a chamfering process, the problem of vibration instability during diamond wire cutting is solved, improving the cutting accuracy and surface quality of 12-inch semiconductor silicon wafers and reducing warpage and surface defects.

CN120516859BActive Publication Date: 2026-07-17MCL ELECTRONICS MATERIALS

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
MCL ELECTRONICS MATERIALS
Filing Date
2025-05-30
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Traditional diamond wire cutting methods suffer from vibration instability during the feed stage, leading to problems such as cut deviation and silicon wafer warping, making it difficult to meet the high-quality requirements of large-size semiconductor silicon wafers.

Method used

The stepped diamond wire cutting method is adopted. First, a thicker diamond wire with higher tension is used to cut the initial groove. Then, a thinner diamond wire with lower tension is used for cutting. The corresponding part of the initial groove is removed by a chamfering process to ensure cutting stability and silicon wafer quality.

Benefits of technology

It significantly reduces silicon wafer warpage, improves cutting accuracy and surface quality, reduces surface defects, and increases silicon wafer yield.

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Abstract

一种基于阶梯式金刚线切割的12吋半导体硅片加工方法,涉及半导体硅片制造技术领域,首先,使用直径为180‑220um的金刚线并施加30‑50N的张力,在半导体硅棒上切割出初始槽;然后,将金刚线更换为直径30‑60um的金刚线,并将张力降低至5‑12N,沿初始槽深度方向切割半导体硅棒,得到硅片毛坯,最后,将硅片毛坯边缘与初始槽对应的部分去除,即得到半导体硅片。本发明能够解决金刚线切割的初始阶段进刀金刚线不稳不易入刀的问题,同时降低硅片翘曲率,提高硅片表面质量和切割精度。
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