Method, apparatus and electronic device for identifying sub-beam

Abstract

The application provides a sub-beam identification method and device and electronic equipment, and relates to the technical field of wireless communication. The method comprises the following steps: determining a serving cell to which a sampling point belongs according to pre-acquired wireless resource configuration information, and identifying a service sub-beam corresponding to the sampling point in the serving cell; determining a target sub-beam in the service sub-beam that satisfies a preset overlapping coverage condition, and acquiring a sampling point set and a neighboring cell set corresponding to the target sub-beam; and identifying a sub-beam used by a first neighboring cell covering a position of a first sampling point, wherein the first neighboring cell is a neighboring cell in the neighboring cell set, and the first sampling point is any sampling point in the sampling point set. In the embodiment of the application, the overlapping coverage sub-beam of the serving cell to which the sampling point belongs can be identified, and the sub-beam of the neighboring cell causing high overlapping coverage of the sampling point can be identified, so that the overlapping coverage at the sub-beam level can be identified, and the identification accuracy of the overlapping coverage can be improved.

Description

Technical Field

[0001] This application relates to the field of wireless technology, and in particular to a method, apparatus and electronic device for identifying sub-beams. Background Technology

[0002] 5G (5th Generation) antenna technology utilizes Massive Multiple Input Multiple Output (MIMO) to achieve multi-beam scanning of broadcast / control channels and narrower beam transmission of service channels. It also employs beamforming based on multi-dimensional adjustable weight parameters to improve coverage and spectral efficiency.

[0003] Current 5G networks utilize Massive MIMO antennas, which, thanks to their multi-beam characteristics and flexible, multi-dimensional antenna weight parameter configurations, can flexibly adapt to various coverage scenarios based on different requirements. However, this flexibility inevitably introduces some coverage issues, especially overlapping coverage problems.

[0004] In existing 5G networks, overlapping coverage identification primarily relies on the signal strength of the Reference Signal Receiving Power (RSRP) of the primary serving cell and neighboring cells, optimizing the coverage by identifying the degree of overlap between cells. However, this method only considers cell-level overlapping coverage, resulting in low identification accuracy. Summary of the Invention

[0005] This application provides a sub-beam identification method, apparatus, and electronic device to solve the problem of low identification accuracy due to only identifying cell-level overlapping coverage.

[0006] To solve the above-mentioned technical problems, this application is implemented as follows:

[0007] In a first aspect, embodiments of this application provide a method for identifying sub-beams, the method comprising:

[0008] Based on the pre-acquired radio resource configuration information, determine the serving cell to which the sampling point belongs, and identify the serving sub-beam corresponding to the sampling point in the serving cell;

[0009] Identify the target sub-beam that meets the preset overlapping coverage conditions among the serving sub-beams, and obtain the sampling point set and neighbor cell set corresponding to the target sub-beam;

[0010] Identify the sub-beam used by the first neighboring cell covering the location of the first sampling point, wherein the first neighboring cell is a neighboring cell in the set of neighboring cells, and the first sampling point is any sampling point in the set of sampling points.

[0011] Optionally, the overlapping coverage condition includes at least one of the following:

[0012] The number of overlapping neighboring cells corresponding to the second sampling point location covered by the target sub-beam is greater than or equal to a first preset value. The second sampling point is any sampling point in the serving cell. When the difference between the reference signal received power of the serving cell corresponding to the second sampling point and the reference signal received power of the neighboring cell is greater than or equal to a preset threshold value, the neighboring cell is the overlapping neighboring cell.

[0013] The ratio of the number of third sampling points covered by the target sub-beam to the number of fourth sampling points is greater than a second preset value, wherein the fourth sampling point is all the sampling points covered by the target sub-beam, and the third sampling point is the sampling point among the fourth sampling points that has the overlapping coverage neighboring area.

[0014] Optionally, the serving cell includes a fifth sampling point; identifying the serving sub-beam corresponding to the sampling point in the serving cell includes:

[0015] Based on the horizontal normal direction of the serving cell, the horizontal angle of arrival of the fifth sampling point, and the actual horizontal direction angle of the first sub-beam of the serving cell in the horizontal direction, the sub-beam information of the fifth sampling point in the horizontal direction is determined in the first sub-beam, and the number of the first sub-beams is at least two.

[0016] Based on the vertical normal direction of the serving cell, the vertical angle of arrival of the fifth sampling point, and the actual vertical downtilt angle of the second sub-beam of the serving cell in the vertical direction, the sub-beam information of the fifth sampling point in the vertical direction is determined in the second sub-beam, and the number of the second sub-beam is at least two.

[0017] Based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction, the service sub-beam covering the location of the fifth sampling point is determined.

[0018] Optionally, the sub-beam information of the fifth sampling point in the horizontal direction is the information of the sub-beam corresponding to the angle with the smallest difference between the first actual horizontal angle and the second actual horizontal angle, wherein the first actual horizontal angle is at least two actual horizontal angles of at least two of the first sub-beams relative to the first target direction, and the second actual horizontal angle is the actual horizontal angle of the line connecting the location of the fifth sampling point and the serving cell base station relative to the first target direction; and / or,

[0019] The sub-beam information of the fifth sampling point in the vertical direction is the information of the sub-beam corresponding to the angle with the smallest difference between the first actual vertical downtilt angle and the second actual vertical downtilt angle. The first actual vertical downtilt angle is at least two actual vertical downtilt angles of the second sub-beams relative to the second target direction. The second actual vertical downtilt angle is the actual vertical downtilt angle of the line connecting the location of the fifth sampling point and the serving cell base station relative to the second target direction.

[0020] Optionally, the actual horizontal azimuth angle of the first sub-beam corresponding to the serving cell is the sum of the azimuth angle of the serving cell and the azimuth angle of the first sub-beam;

[0021] The actual vertical downtilt angle of the second sub-beam corresponding to the serving cell is the sum of the electrical downtilt angle of the serving cell, the mechanical downtilt angle of the serving cell, and the downtilt angle of the second sub-beam.

[0022] Optionally, identifying the sub-beam used by the first neighboring cell covering the location of the first sampling point includes:

[0023] Based on the actual directional angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, a spatial positional relationship is constructed between the first sampling point, the serving cell base station, and the first neighboring cell base station.

[0024] Based on the spatial relationship, the first actual direction angle of the line connecting the location of the first sampling point and the first neighboring base station relative to the target direction is determined;

[0025] Based on the first actual direction angle and the multiple actual direction angles of multiple sub-beams in the first neighboring cell relative to the target direction, determine the sub-beams used by the first neighboring cell covering the location of the first sampling point.

[0026] Wherein, the sub-beam corresponding to the minimum angle difference between the plurality of actual direction angles and the first actual direction angle is the sub-beam used by the first neighboring region to cover the first sampling point.

[0027] Optionally, constructing the spatial relationship between the first sampling point, the serving cell base station, and the first neighboring cell base station based on the actual azimuth angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station includes:

[0028] Based on the actual directional angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, a first distance between the serving cell base station and the first neighboring cell base station is determined, as well as the target directional angle corresponding to the line connecting the serving cell base station and the first neighboring cell base station and a second distance between the location of the first sampling point and the serving cell base station.

[0029] Based on the first distance, the target orientation angle, the second distance, and the actual orientation angle of the location of the first sampling point relative to the serving cell base station, a first angle is determined to be rotated relative to the line connecting the location of the first sampling point and the first neighboring cell base station.

[0030] The step of determining the first actual direction angle relative to the target direction of the line connecting the location of the first sampling point and the first neighboring base station based on the spatial position relationship includes:

[0031] Based on the first angle, determine the first actual direction angle of the line connecting the location of the first sampling point and the first neighboring base station relative to the target direction.

[0032] Optionally, determining the serving cell to which the sampling point belongs based on pre-acquired radio resource configuration information includes:

[0033] Obtain wireless resource configuration information, which includes cell configuration parameters and sampling point measurement report information;

[0034] Based on the correlation between the target information in the configuration parameters and the target information in the sampling point measurement report information, the serving cell to which the sampling point belongs is identified;

[0035] The target information includes at least one of frequency point and physical cell identifier (PCI) information.

[0036] Secondly, embodiments of this application provide a sub-beam identification device, the device comprising:

[0037] The first determining module is used to determine the serving cell to which the sampling point belongs based on the pre-acquired radio resource configuration information, and to identify the serving sub-beam corresponding to the sampling point in the serving cell.

[0038] The second determining module is used to determine the target sub-beam that meets the preset overlapping coverage conditions in the serving sub-beam, and to obtain the sampling point set and neighbor cell set corresponding to the target sub-beam;

[0039] The identification module is used to identify the sub-beam used by the first neighboring cell covering the location of the first sampling point, wherein the first neighboring cell is a neighboring cell in the set of neighboring cells, and the first sampling point is any sampling point in the set of sampling points.

[0040] Thirdly, embodiments of this application provide an electronic device, including: a processor, a memory, and a program stored in the memory and executable on the processor, wherein when the program is executed by the processor, it implements the steps of the sub-beam identification method described in the first aspect.

[0041] Fourthly, embodiments of this application provide a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the sub-beam identification method described in the first aspect.

[0042] Fifthly, a computer program product is provided, including computer instructions that, when executed by a processor, implement the steps of the sub-beam identification method as described in the first aspect.

[0043] In this embodiment of the application, it is possible to identify the overlapping coverage sub-beams of the serving cell to which the sampling point belongs, as well as the sub-beams of neighboring cells that cause high overlap coverage of the sampling point, thereby realizing the identification of overlapping coverage at the sub-beam level and improving the accuracy of overlapping coverage identification. Attached Figure Description

[0044] To more clearly illustrate the technical solutions of the embodiments of this application, the drawings used in the description of the embodiments of this application will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0045] Figure 1 This is one of the flowcharts of a sub-beam identification method provided in the embodiments of this application;

[0046] Figure 2 This is one of the cell beam diagrams provided in the embodiments of this application;

[0047] Figure 3 This is a second schematic diagram of a cell beam provided in the embodiments of this application;

[0048] Figure 4 This is one of the schematic diagrams of a cell beam in the horizontal direction provided in the embodiments of this application;

[0049] Figure 5 This is one of the schematic diagrams of a cell beam in the vertical direction provided in the embodiments of this application;

[0050] Figure 6 This is a second schematic diagram of a cell beam in the horizontal direction provided in the embodiments of this application;

[0051] Figure 7 This is a second schematic diagram of a cell beam in the vertical direction provided in the embodiments of this application;

[0052] Figure 8 This is a second flowchart of a sub-beam identification method provided in an embodiment of this application;

[0053] Figure 9 This is a schematic diagram of the structure of a sub-beam identification device provided in an embodiment of this application;

[0054] Figure 10 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0055] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0056] Currently, 5G Massive MIMO technology uses beamforming based on weighted parameters such as the number of sub-beams, azimuth angle, downtilt angle, horizontal beamwidth, and vertical beamwidth to achieve beam coverage. For overlapping coverage identification in 5G wireless access networks, the main approach follows the rules of 4th Generation (4G) Long Term Evolution (LTE), which determines the degree of overlapping coverage based on the RSRP signal strength difference between the primary serving cell and neighboring cells, and the number of neighboring cells that meet the difference threshold. However, this approach can only locate overlapping coverage at the cell level, and it cannot effectively identify sub-beam overlapping coverage in 5G Massive MIMO multi-beam scenarios.

[0057] For 5G wireless network overlapping coverage identification, related technologies use the RSRP signal strength of the main cell and neighboring cells reported by overlapping coverage sampling points in adjacent cells within the overlapping coverage cell. The signal strength difference between the overlapping coverage cells is set to be less than a preset strength to determine the number of adjacent cells that meet the overlapping coverage sampling point requirement. Then, based on the overlap area between the sub-beams of the target adjacent cell and the building layer covered by the overlapping coverage cell, the problematic sub-beams in the target adjacent cell causing the overlapping coverage are identified.

[0058] The above solutions lack a precise and effective method for identifying sub-beam level overlapping coverage in multi-beam scenarios within 5G networks.

[0059] This application provides a sub-beam identification method, apparatus, and electronic device to solve the problem that overlapping coverage in related technologies only considers cell-level overlapping coverage, resulting in low accuracy.

[0060] See Figure 1 , Figure 1 This is a flowchart of a sub-beam identification method provided in an embodiment of this application, such as... Figure 1 As shown, the method includes the following steps:

[0061] Step 101: Based on the pre-acquired radio resource configuration information, determine the serving cell to which the sampling point belongs, and identify the serving sub-beam corresponding to the sampling point in the serving cell;

[0062] Step 102: Determine the target sub-beam that meets the preset overlapping coverage conditions in the serving sub-beam, and obtain the sampling point set and neighbor cell set corresponding to the target sub-beam;

[0063] Step 103: Identify the sub-beam used by the first neighboring cell covering the location of the first sampling point. The first neighboring cell is a neighboring cell in the set of neighboring cells, and the first sampling point is any sampling point in the set of sampling points.

[0064] The wireless resource configuration information may include cell name, cell azimuth, beam azimuth, cell frequency, PCI, serving cell RSRP, neighboring cell RSRP, etc. This information can be obtained from the cell's engineering parameters, cell beam parameter configuration information, sampling point measurement report information, and other configuration parameters.

[0065] The sampling point measurement report can be used to obtain information about the sampling points, thereby determining the serving cell to which the sampling point belongs, as well as the serving sub-beams corresponding to all or at least some of the sampling points in that serving cell.

[0066] Sampling points can be understood as specific locations within the coverage area of ​​a wireless network used to measure signal strength, quality, or other network performance indicators. These locations can be the actual location of the user equipment or the deployment location of the network testing equipment.

[0067] In a wireless network, the base station cell that provides services to a sampling point can be understood as the serving cell to which that sampling point belongs. Each base station cell has a unique identifier (such as a Cell Global Identity (CGI)) used to distinguish different cells. The coverage area of ​​the cell to which the sampling point belongs can be determined through radio resource configuration information.

[0068] Furthermore, the serving sub-beam corresponding to each sampling point in the serving cell is identified. For example, a sampling point in the cell is connected to the base station, and the first angle of the connection relative to north is obtained; at the same time, the actual azimuth angle of each sub-beam in the cell relative to north is obtained. The first angle is compared with the actual azimuth angle of each sub-beam, and when the two angles are closest, the corresponding sub-beam is determined, that is, the serving sub-beam corresponding to the sampling point.

[0069] The above method can be used to obtain the service sub-beam corresponding to each sampling point.

[0070] From the acquired service sub-beams, the target sub-beam is acquired. The overlapping coverage condition is that the sampling points covered by the sub-beam have overlapping neighboring areas, or the number of overlapping neighboring areas is greater than a preset value.

[0071] All overlapping coverage sub-beams in the serving cell that meet the overlapping coverage conditions are obtained and denoted as high overlap coverage sub-beams. And denote the set of all overlapping sampling points as The neighboring cells causing its high overlap coverage are cells B, C, D, ..., denoted as the set of overlapping neighboring cells.

[0072] For the set of sampling points For each sampling point, iterate through each sampling point and identify the neighboring cells (neighboring cell set) that cover the location of that sampling point. The sub-beam used by the neighboring cell in the middle.

[0073] The above method identifies highly overlapping coverage sub-beams within the serving cell, as well as sub-beams with overlapping coverage between neighboring cells and the serving cell. This ability to identify beam-level overlapping coverage improves identification accuracy.

[0074] Optionally, in some implementations, the overlapping coverage condition includes at least one of the following:

[0075] The number of overlapping neighboring cells corresponding to the second sampling point location covered by the target sub-beam is greater than or equal to a first preset value. The second sampling point is any sampling point in the serving cell. When the difference between the reference signal received power of the serving cell corresponding to the second sampling point and the reference signal received power of the neighboring cell is greater than or equal to a preset threshold value, the neighboring cell is the overlapping neighboring cell.

[0076] The ratio of the number of third sampling points covered by the target sub-beam to the number of fourth sampling points is greater than a second preset value, wherein the fourth sampling point is all the sampling points covered by the target sub-beam, and the third sampling point is the sampling point among the fourth sampling points that has the overlapping coverage neighboring area.

[0077] In 5G Massive MIMO technology, base stations use multiple sub-beams to cover different areas, and the target sub-beam's coverage area includes the second sampling point. Since a sampling point may be covered by the sub-beams of multiple cells (base stations) simultaneously, the overlapping coverage neighboring cells of the location of the second sampling point can be obtained.

[0078] For example, obtain the Reference Signal Received Power (RSRP) of the serving cell and the RSRP of neighboring cells from the measurement report, and determine whether the following conditions are met:

[0079] Condition 1) If RSRP 服务小区 -RSRP 邻小区 >R th If the neighboring cell is not an overlapping neighboring cell, then the neighboring cell is not an overlapping neighboring cell.

[0080] Condition 2) If RSRP 服务小区 -RSRP 邻小区 ≤R th If the neighboring area is , then the neighboring area is recorded as an overlapping neighboring area.

[0081] Among them, R th This is a configurable threshold value, which should be configured according to the actual network conditions.

[0082] If there are overlapping neighboring areas at the location of the second sampling point, or if the number of overlapping neighboring areas is greater than or equal to a first preset value, then the overlapping coverage condition is met. For example, when the first preset value is 1, it means that there are overlapping neighboring areas at the location of the second sampling point, thus meeting the overlapping coverage condition; or, when the first preset value is 3, it means that there are more than 3 overlapping neighboring areas at the location of the second sampling point, thus meeting the overlapping coverage condition.

[0083] By traversing all sampling points in the serving cell, the total number of sampling points covered by the sub-beam with sub-beam ID i can be determined, denoted as M. i This refers to the number of the fourth sampling point. Based on this, the relationship between the number of sampling points of each sub-beam within the cell can be obtained as ∑ i M i =M, where M is the total number of sampling points in the cell.

[0084] All sampling points that meet condition 2) above are counted separately according to the serving cell sub-beam, and denoted as N. iLet i be the sub-beam ID. That is, to obtain the number N of sampling points N that overlap with neighboring areas among the sampling points covered by the sub-beam with ID i. i That is, the number of third sampling points.

[0085] If N i / M i ≥S th This indicates that the overlapping coverage condition is satisfied, where S th This is a configurable high overlap coverage threshold, i.e., a threshold that satisfies the overlap coverage condition.

[0086] The above conditions can be satisfied one by one or simultaneously.

[0087] In some alternative implementations, if N i / M i ≥S th If the number of overlapping neighboring cells is greater than or equal to 3 (3 is a configurable threshold, this is just an example), then sub-beam i is a highly overlapping sub-beam in the serving cell, that is, the target sub-beam that meets the overlapping coverage condition.

[0088] By associating and matching the frequency points and Physical Cell Identifier (PCI) information in the cell engineering parameters with the frequency points and PCI information of neighboring cells in the overlapping coverage neighboring cells in the sampling point measurement report (MR), the cell information of the overlapping coverage neighboring cells can be determined.

[0089] The above method can be used to obtain the sub-beams corresponding to highly overlapping neighboring cells that meet the overlapping coverage conditions.

[0090] Optionally, in some embodiments, the serving cell includes a fifth sampling point; identifying the serving sub-beam corresponding to the sampling point in the serving cell includes:

[0091] Based on the horizontal normal direction of the serving cell, the horizontal angle of arrival of the fifth sampling point, and the actual horizontal direction angle of the first sub-beam of the serving cell in the horizontal direction, the sub-beam information of the fifth sampling point in the horizontal direction is determined in the first sub-beam, and the number of the first sub-beams is at least two.

[0092] Based on the vertical normal direction of the serving cell, the vertical angle of arrival of the fifth sampling point, and the actual vertical downtilt angle of the second sub-beam of the serving cell in the vertical direction, the sub-beam information of the fifth sampling point in the vertical direction is determined in the second sub-beam, and the number of the second sub-beam is at least two.

[0093] Based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction, the service sub-beam covering the location of the fifth sampling point is determined.

[0094] like Figure 2 As shown, under normal circumstances, the azimuth angle and downtilt angle in the cell engineering parameters are the normal directions of the envelope beams formed by each sub-beam of the cell (both horizontal and vertical directions).

[0095] like Figure 3 As shown in the figure, the normal direction of the serving cell is as depicted. The first sub-beam within this cell comprises four sub-beams. The parameter configuration information for each sub-beam includes the beam azimuth angle and downtilt angle, such as α1, α2, α3, and α4. These are the angles by which the normal direction of the sub-beam is offset relative to the normal direction of the cell; clockwise is a positive angle, and counterclockwise is a negative angle. Based on the angles in the above parameter configuration information, a conversion can be performed to determine the actual direction of each sub-beam of the serving cell relative to a specified reference direction (such as north), i.e., the actual azimuth angle (actual horizontal azimuth angle or actual vertical downtilt angle) of the first sub-beam.

[0096] The following sections identify the sub-beams of the serving cell from both the horizontal and vertical directions.

[0097] I. Horizontal Sub-beam Identification

[0098] The horizontal angle of arrival (hAoA) of the sampling point is the angle between the direction of arrival of the signal received at the sampling point by the base station and the direction of the horizontal normal of the cell. For example... Figure 4 As shown, there is an angle between the line connecting the sampling point (i.e., the fifth sampling point) and cell A (i.e., the serving cell) and the horizontal normal direction of the cell, which is the horizontal arrival angle hAoA of the sampling point.

[0099] Among them, the angle of arrival hAoA is positive counterclockwise relative to the horizontal normal of the cell, while θ is positive clockwise relative to north; the specific angular relationship is as follows: Figure 4 As shown, the calculation method is illustrated in the following formula:

[0100]

[0101] Based on the horizontal normal direction angle θ of the cell and the horizontal arrival angle hAoA of the sampling point, the actual horizontal direction angle of the sampling point can be determined according to the above formula.

[0102] The calculated actual horizontal direction angle of the sampling point The angle between the actual horizontal direction angle of the first sub-beam of the aforementioned serving cell is calculated (i.e., the angle difference is obtained). The sub-beam with the smallest angle is designated as the serving sub-beam in the horizontal direction of the sampling point, and the beam information of the serving sub-beam, such as the beam number, is obtained.

[0103] For example, Figure 4 The actual horizontal azimuth angles of the four sub-beams relative to the north direction shown are respectively compared with the actual horizontal azimuth angles of the sampling points. Draw the included angle to obtain the beam corresponding to the smallest included angle, that is, the sub-beam closest to the sampling point is the sub-beam in the horizontal direction of the sampling point.

[0104] II. Identifying Sub-beams in the Vertical Direction

[0105] The vertical angle of arrival (vAoA) of the sampling point is the angle between the direction of arrival of the signal received at the sampling point by the base station and the direction of the vertical normal of the cell. The vertical downtilt angle γ and the angle relative to the cell are denoted as the actual vertical downtilt angle of the sampling point, and are written as... The vertical angle of arrival (vAoA) and the vertical downtilt angle of the cell are both positive when rotated clockwise in the horizontal direction. Their specific angular relationships are as follows: Figure 5 As shown, the calculation method is illustrated in the following formula:

[0106]

[0107] Based on the cell's vertical downtilt angle γ and the sampling point's vertical angle of arrival vAoA, the actual vertical downtilt angle of the sampling point can be determined according to the above formula.

[0108] The calculated actual vertical downtilt angle of the sampling point The angle between the sample point and the actual downtilt angle of each sub-beam of the serving cell is calculated, and the sub-beam with the smallest angle is designated as the serving sub-beam in the vertical direction of the sampling point, and the information of the serving sub-beam is obtained.

[0109] By using the information of the sub-beams in the horizontal and vertical directions, the service sub-beam number of all sampling points in serving cell A can be determined.

[0110] By identifying sub-beam information in both the horizontal and vertical directions, the serving sub-beam corresponding to the sampling point can be determined, enabling more accurate identification of sub-beam information within the serving cell.

[0111] Optionally, in some embodiments, the sub-beam information of the fifth sampling point in the horizontal direction is the information of the sub-beam corresponding to the angle with the smallest difference between the first actual horizontal angle and the second actual horizontal angle, wherein the first actual horizontal angle is at least two actual horizontal angles of at least two of the first sub-beams relative to the first target direction, and the second actual horizontal angle is the actual horizontal angle of the line connecting the location of the fifth sampling point and the serving cell base station relative to the first target direction; and / or,

[0112] The sub-beam information of the fifth sampling point in the vertical direction is the information of the sub-beam corresponding to the angle with the smallest difference between the first actual vertical downtilt angle and the second actual vertical downtilt angle. The first actual vertical downtilt angle is at least two actual vertical downtilt angles of the second sub-beams relative to the second target direction. The second actual vertical downtilt angle is the actual vertical downtilt angle of the line connecting the location of the fifth sampling point and the serving cell base station relative to the second target direction.

[0113] The first actual horizontal azimuth angle includes the actual horizontal azimuth angles of at least two first sub-beams, where the first sub-beams are sub-beams in the serving cell.

[0114] like Figure 4 As shown, in the horizontal direction, cell A includes four sub-beams (the first sub-beam), and the angle of each sub-beam relative to the north (the first target direction) can be obtained. The figure shows the horizontal and north directions of beam 2, and the angle between the horizontal and north directions of beam 2 can be obtained; this angle is the actual horizontal direction angle of beam 2. The four beams correspond to four actual horizontal direction angles.

[0115] The actual horizontal angle of the line connecting the sampling point (fifth sampling point) and cell A (serving cell base station) relative to north (first target direction). This represents the actual horizontal direction angle of the sampling point.

[0116] Based on the angle obtained from the same reference direction, the angle difference between each actual horizontal direction angle and the actual horizontal direction angle of the sampling point can be calculated, thereby obtaining the sub-beam information corresponding to the minimum difference as the sub-beam information of the fifth sampling point in the horizontal direction.

[0117] Similarly, as Figure 5 As shown, in the vertical direction, cell A includes three sub-beams (the second sub-beam), and the angle of each sub-beam relative to the horizontal direction (the second target direction) can be obtained (not shown in the figure). The figure shows the vertical direction of the beam and the horizontal and vertical directions of the coordinate system, and the angle of the vertical direction of the beam relative to the horizontal direction of the coordinate system can be obtained. This angle is the actual vertical downtilt angle of the beam. The three beams can correspond to three actual vertical downtilt angles.

[0118] The actual vertical downtilt angle of the line connecting the sampling point (fifth sampling point) and cell A (serving cell base station) relative to the horizontal direction (second target direction) of the coordinate system. This represents the actual vertical downtilt angle of the sampling point.

[0119] Based on the angle obtained from the same reference direction, the angle difference between each actual vertical downtilt angle and the actual vertical downtilt angle of the sampling point can be calculated, thereby obtaining the sub-beam information corresponding to the minimum difference as the sub-beam information of the fifth sampling point in the vertical direction.

[0120] Optionally, in some implementations, the actual horizontal azimuth angle of the first sub-beam corresponding to the serving cell is the sum of the azimuth angle of the serving cell and the azimuth angle of the first sub-beam;

[0121] The actual vertical downtilt angle of the second sub-beam corresponding to the serving cell is the sum of the electrical downtilt angle of the serving cell, the mechanical downtilt angle of the serving cell, and the downtilt angle of the second sub-beam.

[0122] Among them, the azimuth angle, electrical downtilt angle, and mechanical downtilt angle of the serving cell can be obtained through the engineering parameters of the serving cell, while the beam azimuth angle and beam downtilt angle can be obtained through the beam parameter configuration information.

[0123] By associating the cell engineering parameters and beam parameter configuration information, the actual beam direction angle and actual downtilt angle are calculated, where:

[0124] Sub-beam actual direction angle = cell direction angle + beam direction angle

[0125] Sub-beam actual downtilt angle = cell electric downtilt angle + cell mechanical downtilt angle + beam downtilt angle

[0126] By using the above method, the actual azimuth angles of the first sub-beam corresponding to the serving cell in the horizontal and vertical directions can be obtained, thus obtaining the actual azimuth angle of the beam.

[0127] Optionally, in some embodiments, identifying the sub-beam used by the first neighboring cell covering the location of the first sampling point includes:

[0128] Based on the actual directional angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, a spatial positional relationship is constructed between the first sampling point, the serving cell base station, and the first neighboring cell base station.

[0129] Based on the spatial relationship, the first actual direction angle of the line connecting the location of the first sampling point and the first neighboring base station relative to the target direction is determined;

[0130] Based on the first actual direction angle and the multiple actual direction angles of multiple sub-beams in the first neighboring cell relative to the target direction, determine the sub-beams used by the first neighboring cell covering the location of the first sampling point.

[0131] Wherein, the sub-beam corresponding to the minimum angle difference between the plurality of actual direction angles and the first actual direction angle is the sub-beam used by the first neighboring region to cover the first sampling point.

[0132] like Figure 6 As shown, on the horizontal plane, serving cell A, sampling point X (first sampling point), and neighboring cell B (first neighboring cell) form a triangle XAB. Based on the latitude and longitude coordinates of serving cell A and neighboring cell B, the distance ISDh of line segment AB and the azimuth angle of AB relative to true north can be obtained.

[0133] The actual azimuth angle of the location of the first sampling point relative to the serving cell base station A can be obtained from the actual horizontal angle of the sampling point. Determined, specifically, the angle of the line connecting the sampling point and serving cell A relative to north. Based on the actual horizontal angle of the sampling point. The interior angle θ1 of the triangle can be determined.

[0134] Using the above method, the locations of the serving cell base station A, the neighboring cell base station B, and the sampling point X can be determined, and the spatial relationship between the three points can be constructed. Based on the spatial relationship, the location of the serving cell base station A, the location of the neighboring cell base station B, the angle θ1, and the distance TA between the serving cell base station A and the first sampling point... h (TA h The distance TA between a given sampling point X and the neighboring cell B can be calculated by projecting the time lead (TA) from the measurement report onto the horizontal plane (i.e., converting time into distance). h_nc The sum of the angles is XBA, which is θ2.

[0135] Based on the angle of AB relative to the north and angle θ2, the angle of the line connecting the first sampling point X and the first neighboring base station B relative to the north (target direction) can be obtained, i.e., the first actual direction angle.

[0136] In addition, the actual azimuth angle of each sub-beam relative to the north (target direction) in neighboring cell B can be obtained, and the actual azimuth angle of each sub-beam can be compared with the first actual azimuth angle. Draw the included angle to obtain multiple angle differences. Among these multiple angle differences, obtain the sub-beam information corresponding to the smallest difference, that is, the sub-beam information in the horizontal direction.

[0137] Similarly, in the vertical direction, such as Figure 7 As shown, the distance TA between sampling point X and neighboring cell B can also be calculated using the above method. v_nc The sum of the angles is XBA, which is θ2.

[0138] Based on θ2, the angle between the line connecting the first sampling point X and the first neighboring base station B and the horizontal direction (target direction) can be obtained, i.e., the first actual direction angle.

[0139] In addition, the actual azimuth angle of each sub-beam in neighboring cell B relative to the horizontal direction (target direction) can be obtained, and each actual azimuth angle can be compared with the first actual azimuth angle. Draw the included angle to obtain the angle difference. Among multiple angle differences, obtain the sub-beam information corresponding to the smallest difference, that is, the sub-beam information in the vertical direction.

[0140] Based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction, the sub-beam used by the sampling point X of the neighboring cell B can be determined.

[0141] Optionally, in some embodiments, constructing the spatial relationship between the first sampling point, the serving cell base station, and the first neighboring cell base station based on the actual azimuth angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station includes:

[0142] Based on the actual directional angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, a first distance between the serving cell base station and the first neighboring cell base station is determined, as well as the target directional angle corresponding to the line connecting the serving cell base station and the first neighboring cell base station and a second distance between the location of the first sampling point and the serving cell base station.

[0143] Based on the first distance, the target orientation angle, the second distance, and the actual orientation angle of the location of the first sampling point relative to the serving cell base station, a first angle is determined to be rotated relative to the line connecting the location of the first sampling point and the first neighboring cell base station.

[0144] The step of determining the first actual direction angle relative to the target direction of the line connecting the location of the first sampling point and the first neighboring base station based on the spatial position relationship includes:

[0145] Based on the first angle, determine the first actual direction angle of the line connecting the location of the first sampling point and the first neighboring base station relative to the target direction.

[0146] like Figure 6 As shown, based on the location of the serving cell base station and the location of the first neighboring cell base station, the target northward direction angle (i.e., the angle of AB relative to the north) of the line connecting the serving cell base station and the first neighboring cell base station can be determined. This is based on the target northward direction angle and the actual northward direction angle of the line connecting sampling point X and serving cell A. Angle θ1 can be calculated.

[0147] Based on the distance AB obtained in the above manner (i.e., the first distance), the distance TA from serving cell A to sampling point X is... h (i.e., the second distance) and angle θ1, thus obtaining the lengths of the two sides of the triangle and the included angle. According to the law of cosines, the distance TA from the neighboring cell B to the sampling point X can be calculated. h_nc The sum of the angles is XBA, which is θ2 (i.e., the first angle).

[0148]

[0149]

[0150] Based on the relationship between the angle of arrival and the actual horizontal angle of the sampling point, and the actual horizontal angle of neighboring cell B relative to north, the angle of arrival hAoA of sampling point X relative to neighboring cell B can be obtained by performing the reverse calculation according to the above calculation process. nc Then, the actual horizontal angle of sampling point X relative to neighboring cell B is calculated.

[0151] It is possible to obtain the actual azimuth angle of each sub-beam in neighboring cell B relative to the north (target direction), and compare each actual azimuth angle with the first actual azimuth angle. Draw the included angle to obtain the angle difference. Among multiple angle differences, obtain the sub-beam information corresponding to the smallest difference, that is, the sub-beam information in the horizontal direction.

[0152] In the vertical direction, determine the vertical coverage sub-beam of neighboring region B to X.

[0153] like Figure 7 As shown, in the vertical plane, serving cell A, sampling point X, and neighboring cell B form a triangle XAB. Based on the latitude and longitude coordinates of serving cell A and neighboring cell B, the distance ISDv (i.e., the first distance) of line segment AB and the tilt angle of AB relative to the horizontal direction (i.e., the target orientation angle) can be obtained. Following the above calculation process, the actual downtilt angle of sampling point X can be calculated. Based on this, angle XAB, or θ1, can be calculated.

[0154] Distance TA from service area A to sampling point v It can be obtained from the projection of TA onto the vertical plane in the measurement report.

[0155] Using the above method, we can obtain the lengths of two sides and the included angle of the triangle. Based on the law of cosines, we can calculate the distance TA from the neighboring cell B to the sampling point X. v_nc The sum of the angles is XBA, which is θ2 (i.e., the first angle).

[0156]

[0157] Based on the relationship between the angle of arrival and the actual horizontal angle of the sampling point, and the actual horizontal angle of neighboring cell B relative to the horizontal direction, the angle of arrival vAoA of sampling point X relative to neighboring cell B can be calculated by performing the reverse calculation according to the above calculation process. nc Then, the actual vertical tilt angle of the sampling point relative to neighboring cell B is calculated. The angle between the sample point and the actual tilt angle of each sub-beam of neighboring cell B is calculated, and the sub-beam with the smallest angle is designated as the sub-beam that overlaps and covers the sample point in the vertical direction, thereby obtaining the information of that sub-beam.

[0158] Through the above process, the sub-beam covered by neighboring cell B at the location of sampling point X can be determined.

[0159] Overlapping sampling point set All sampling points and overlapping neighboring regions For all neighboring cells, the sub-beams overlapping with the serving cell are determined sequentially according to this calculation process, and the set of all determined sub-beams of all neighboring cells is denoted as the overlapping coverage sub-beam set.

[0160] Optionally, determining the serving cell to which the sampling point belongs based on pre-acquired radio resource configuration information includes:

[0161] Obtain wireless resource configuration information, which includes cell configuration parameters and sampling point measurement report information;

[0162] Based on the correlation between the target information in the configuration parameters and the target information in the sampling point measurement report information, the serving cell to which the sampling point belongs is identified;

[0163] The target information includes at least one of frequency point and physical cell identifier (PCI) information.

[0164] The configuration parameters of a cell may include cell engineering parameters and cell beam parameter configuration information.

[0165] The parameters for a residential community project may include, but are not limited to, the following fields:

[0166]

[0167] Cell beam parameter configuration information includes, but is not limited to, the following fields:

[0168]

[0169] The sampling point measurement report information includes, but is not limited to, the following fields:

[0170]

[0171] By associating and matching the frequency point and PCI information in the cell engineering parameters with the serving cell frequency point and serving cell PCI information in the sampling point measurement report (MR), the serving cell (primary cell) of the sampling point can be uniquely determined.

[0172] In the case of a multi-beam cell, according to the specifications, users select the sub-beam with the stronger signal to access the cell and establish a Radio Resource Control (RRC) connection. By identifying the sub-beam information accessed by the sampling points in the cell, it can be used for subsequent network optimization and adjustment.

[0173] This application parses relevant data from the sampling point measurement report (MR), determines the spatial relationship between the sampling point and the cell sub-beam by combining the antenna angle of arrival of the sampling point with the cell beam configuration information, identifies the cell sub-beam actually accessed by the sampling point and the affected neighboring cell sub-beams, defines a cell sub-beam level overlapping coverage identification algorithm, identifies overlapping coverage at the cell beam level and obtains neighboring cell sub-beam information that causes overlapping coverage, enabling more accurate and effective network coverage performance analysis.

[0174] As a specific embodiment, such as Figure 8 As shown, the sub-beam identification method of this application may include the following steps:

[0175] Step 1: Obtain the cell engineering parameters, beam parameter configuration information, and sampling point measurement report information.

[0176] Step 2: Associate the parameters in the cell engineering parameters and beam parameter configuration information, and calculate the actual azimuth angle and downtilt angle of the sub-beam.

[0177] Step 3: Identify the serving cell sub-beam to which the sampling point belongs.

[0178] First, the service cell reported by the associated sampling point measurement is matched.

[0179] Secondly, based on the serving cell, the actual horizontal direction angle of the sampling point and the actual horizontal direction angle of each sub-beam of the serving cell are obtained, and the serving sub-beam information of the sampling point in the horizontal direction is determined based on the angle difference between the actual horizontal direction angle of each sub-beam and the actual horizontal direction angle of the sampling point.

[0180] Based on the serving cell, the actual vertical downtilt angle of the sampling point and the actual vertical downtilt angle of each sub-beam of the serving cell are obtained. Based on the angle difference between the actual vertical downtilt angle of each sub-beam and the actual vertical downtilt angle of the sampling point, the serving sub-beam information of the sampling point in the vertical direction is determined.

[0181] Then, based on the service sub-beam information in the horizontal and vertical directions, the service sub-beams of the service cell coverage sampling points are determined.

[0182] Step 4: Identification of sub-beams with high overlap coverage in the service cell.

[0183] Based on the preset high overlap coverage conditions, determine the high overlap coverage sub-beam set, the high overlap coverage sampling point set, and the high overlap coverage neighboring cell set.

[0184] Step 5: Identify the overlapping coverage beams of the overlapping neighboring cells to the serving cell.

[0185] The horizontal and vertical coverage sub-beams of the neighboring cells to the sampling point are determined, thereby determining the coverage sub-beams of the neighboring cells to the location of the sampling point, and then completing the coverage sub-beams of all neighboring cells in the high-overlapping coverage neighboring cell set to all sampling points in the high-overlapping coverage neighboring cell set.

[0186] In this application, the spatial relationship between the cell and the sampling point is calculated based on the horizontal angle of arrival (hAoA) and vertical angle of arrival (vAoA) from the sampling point to the cell. Then, based on the sub-beam weight configuration data of the serving cell, the sub-beam information of the serving cell to which the sampling point belongs is identified. After classifying the sampling points to the corresponding sub-beams, rules are defined from the perspective of the serving cell sub-beams to identify the overlapping coverage of cell sub-beams.

[0187] This application can identify overlapping coverage at the beam level based on the multi-beam characteristics of 5G, which improves the identification accuracy compared to cell-level overlapping coverage identification. Simultaneously, it identifies neighboring cell sub-beams causing overlapping coverage and the affected primary serving cell sub-beams based on spatial location relationships, achieving accurate beam-level overlapping coverage identification and optimization.

[0188] See Figure 9 , Figure 9 This is a schematic diagram of the structure of a sub-beam identification device provided in an embodiment of this application, as shown below. Figure 9 As shown, the sub-beam identification device 900 includes:

[0189] The first determining module 901 is used to determine the serving cell to which the sampling point belongs based on the pre-acquired radio resource configuration information, and to identify the serving sub-beam corresponding to the sampling point in the serving cell.

[0190] The second determining module 902 is used to determine the target sub-beam that meets the preset overlapping coverage conditions in the serving sub-beam, and to obtain the sampling point set and neighbor cell set corresponding to the target sub-beam;

[0191] The identification module 903 is used to identify the sub-beam used by the first neighboring cell covering the location of the first sampling point, wherein the first neighboring cell is a neighboring cell in the set of neighboring cells, and the first sampling point is any sampling point in the set of sampling points.

[0192] Optionally, the overlapping coverage condition includes at least one of the following:

[0193] The number of overlapping neighboring cells corresponding to the second sampling point location covered by the target sub-beam is greater than or equal to a first preset value. The second sampling point is any sampling point in the serving cell. When the difference between the reference signal received power of the serving cell corresponding to the second sampling point and the reference signal received power of the neighboring cell is greater than or equal to a preset threshold value, the neighboring cell is the overlapping neighboring cell.

[0194] The ratio of the number of third sampling points covered by the target sub-beam to the number of fourth sampling points is greater than a second preset value, wherein the fourth sampling point is all the sampling points covered by the target sub-beam, and the third sampling point is the sampling point among the fourth sampling points that has the overlapping coverage neighboring area.

[0195] Optionally, the serving cell includes a fifth sampling point; the identification module includes:

[0196] The first determining submodule is used to determine the sub-beam information of the fifth sampling point in the horizontal direction in the first sub-beam based on the horizontal normal direction of the serving cell, the horizontal angle of arrival of the fifth sampling point, and the actual horizontal direction angle of the first sub-beam of the serving cell in the horizontal direction. The number of the first sub-beams is at least two.

[0197] The second determining submodule is used to determine the sub-beam information of the fifth sampling point in the vertical direction in the second sub-beam based on the vertical normal direction of the serving cell, the vertical angle of arrival of the fifth sampling point, and the actual vertical downtilt angle of the second sub-beam of the serving cell in the vertical direction. The number of the second sub-beam is at least two.

[0198] The third determining submodule is used to determine the service subbeam covering the location of the fifth sampling point based on the subbeam information in the horizontal direction and the subbeam information in the vertical direction.

[0199] Optionally, the sub-beam information of the fifth sampling point in the horizontal direction is the information of the sub-beam corresponding to the angle with the smallest difference between the first actual horizontal angle and the second actual horizontal angle, wherein the first actual horizontal angle is at least two actual horizontal angles of at least two of the first sub-beams relative to the first target direction, and the second actual horizontal angle is the actual horizontal angle of the line connecting the location of the fifth sampling point and the serving cell base station relative to the first target direction; and / or,

[0200] The sub-beam information of the fifth sampling point in the vertical direction is the information of the sub-beam corresponding to the angle with the smallest difference between the first actual vertical downtilt angle and the second actual vertical downtilt angle. The first actual vertical downtilt angle is at least two actual vertical downtilt angles of the second sub-beams relative to the second target direction. The second actual vertical downtilt angle is the actual vertical downtilt angle of the line connecting the location of the fifth sampling point and the serving cell base station relative to the second target direction.

[0201] Optionally, the actual horizontal azimuth angle of the first sub-beam corresponding to the serving cell is the sum of the azimuth angle of the serving cell and the azimuth angle of the first sub-beam;

[0202] The actual vertical downtilt angle of the second sub-beam corresponding to the serving cell is the sum of the electrical downtilt angle of the serving cell, the mechanical downtilt angle of the serving cell, and the downtilt angle of the second sub-beam.

[0203] Optionally, the identification module includes:

[0204] A construction submodule is used to construct the spatial relationship between the first sampling point, the serving cell base station, and the first neighboring cell base station based on the actual directional angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station.

[0205] The fourth determining submodule is used to determine, based on the spatial positional relationship, the first actual direction angle of the line connecting the location of the first sampling point and the first neighboring base station relative to the target direction.

[0206] The fifth determining submodule is used to determine the sub-beam used by the first neighboring cell covering the location of the first sampling point based on the first actual direction angle and the multiple actual direction angles of multiple sub-beams in the first neighboring cell relative to the target direction.

[0207] Wherein, the sub-beam corresponding to the minimum angle difference between the plurality of actual direction angles and the first actual direction angle is the sub-beam used by the first neighboring region to cover the first sampling point.

[0208] Optionally, the construction submodule includes:

[0209] The sixth determining submodule is used to determine, based on the actual directional angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, the target directional angle corresponding to the line connecting the serving cell base station and the first neighboring cell base station, and the second distance between the location of the first sampling point and the serving cell base station;

[0210] The seventh determining submodule is used to determine, based on the first distance, the target direction angle, the second distance, and the actual direction angle of the location of the first sampling point relative to the serving cell base station, the first angle of rotation of the line connecting the location of the first sampling point and the first neighboring cell base station relative to the line connecting the serving cell base station and the first neighboring cell base station.

[0211] The fourth determining submodule is specifically used for:

[0212] Based on the first angle, determine the first actual direction angle of the line connecting the location of the first sampling point and the first neighboring base station relative to the target direction.

[0213] Optionally, the first determining module includes:

[0214] The acquisition submodule is used to acquire wireless resource configuration information, which includes cell configuration parameters and sampling point measurement report information;

[0215] The identification submodule is used to identify the serving cell to which the sampling point belongs based on the correlation between the target information in the configuration parameters and the target information in the sampling point measurement report information;

[0216] The target information includes at least one of frequency point and physical cell identifier (PCI) information.

[0217] The sub-beam identification device can achieve Figure 1 The various processes implemented in the method embodiments can achieve the same technical effect, and will not be described again here to avoid repetition.

[0218] It should be noted that the electronic device provided in this application embodiment is a device capable of executing the above-described sub-beam identification device. Therefore, all implementation methods in the above-described sub-beam identification device method embodiments are applicable to this electronic device and can achieve the same or similar beneficial effects. To avoid repetition, this embodiment will not elaborate further.

[0219] This application also provides an electronic device. Since the principle by which the electronic device solves the problem is similar to the sub-beam identification method in this application, the implementation of this electronic device can be found in the implementation of the method, and repeated details will not be described again. Figure 10 As shown, the electronic device of this application embodiment includes: a processor 500, configured to read a program from a memory 520 and execute the following processes:

[0220] Based on the pre-acquired radio resource configuration information, determine the serving cell to which the sampling point belongs, and identify the serving sub-beam corresponding to the sampling point in the serving cell;

[0221] Identify the target sub-beam that meets the preset overlapping coverage conditions among the serving sub-beams, and obtain the sampling point set and neighbor cell set corresponding to the target sub-beam;

[0222] Identify the sub-beam used by the first neighboring cell covering the location of the first sampling point, wherein the first neighboring cell is a neighboring cell in the set of neighboring cells, and the first sampling point is any sampling point in the set of sampling points.

[0223] Among them, Figure 5 In this context, the bus architecture may include any number of interconnected buses and bridges, specifically linking various circuits together, represented by one or more processors (processor 500) and memory (memory 520). The bus architecture may also link together various other circuits such as peripheral devices, voltage regulators, and power management circuits, which are well known in the art and therefore will not be described further herein. The bus interface provides an interface. The transceiver 510 may be multiple elements, including transmitters and transceivers, providing a unit for communicating with various other devices over a transmission medium. The processor 500 is responsible for managing the bus architecture and general processing, and the memory 520 may store data used by the processor 500 during operation.

[0224] Optionally, the overlapping coverage condition includes at least one of the following:

[0225] The number of overlapping neighboring cells corresponding to the second sampling point location covered by the target sub-beam is greater than or equal to a first preset value. The second sampling point is any sampling point in the serving cell. When the difference between the reference signal received power of the serving cell corresponding to the second sampling point and the reference signal received power of the neighboring cell is greater than or equal to a preset threshold value, the neighboring cell is the overlapping neighboring cell.

[0226] The ratio of the number of third sampling points covered by the target sub-beam to the number of fourth sampling points is greater than a second preset value, wherein the fourth sampling point is all the sampling points covered by the target sub-beam, and the third sampling point is the sampling point among the fourth sampling points that has the overlapping coverage neighboring area.

[0227] Optionally, the processor 500 is further configured to read a program from the memory 520 and execute the service cell including the fifth sampling point; the step of identifying the service sub-beam corresponding to the sampling point in the service cell includes:

[0228] Based on the horizontal normal direction of the serving cell, the horizontal angle of arrival of the fifth sampling point, and the actual horizontal direction angle of the first sub-beam of the serving cell in the horizontal direction, the sub-beam information of the fifth sampling point in the horizontal direction is determined in the first sub-beam, and the number of the first sub-beams is at least two.

[0229] Based on the vertical normal direction of the serving cell, the vertical angle of arrival of the fifth sampling point, and the actual vertical downtilt angle of the second sub-beam of the serving cell in the vertical direction, the sub-beam information of the fifth sampling point in the vertical direction is determined in the second sub-beam, and the number of the second sub-beam is at least two.

[0230] Based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction, the service sub-beam covering the location of the fifth sampling point is determined.

[0231] Optionally, the sub-beam information of the fifth sampling point in the horizontal direction is the information of the sub-beam corresponding to the angle with the smallest difference between the first actual horizontal angle and the second actual horizontal angle, wherein the first actual horizontal angle is at least two actual horizontal angles of at least two of the first sub-beams relative to the first target direction, and the second actual horizontal angle is the actual horizontal angle of the line connecting the location of the fifth sampling point and the serving cell base station relative to the first target direction; and / or,

[0232] The sub-beam information of the fifth sampling point in the vertical direction is the information of the sub-beam corresponding to the angle with the smallest difference between the first actual vertical downtilt angle and the second actual vertical downtilt angle. The first actual vertical downtilt angle is at least two actual vertical downtilt angles of the second sub-beams relative to the second target direction. The second actual vertical downtilt angle is the actual vertical downtilt angle of the line connecting the location of the fifth sampling point and the serving cell base station relative to the second target direction.

[0233] Optionally, the actual horizontal azimuth angle of the first sub-beam corresponding to the serving cell is the sum of the azimuth angle of the serving cell and the azimuth angle of the first sub-beam;

[0234] The actual vertical downtilt angle of the second sub-beam corresponding to the serving cell is the sum of the electrical downtilt angle of the serving cell, the mechanical downtilt angle of the serving cell, and the downtilt angle of the second sub-beam.

[0235] Optionally, the processor 500 is further configured to read a program from the memory 520 and execute the sub-beam used to identify the first neighboring cell covering the location of the first sampling point, including:

[0236] Based on the actual directional angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, a spatial positional relationship is constructed between the first sampling point, the serving cell base station, and the first neighboring cell base station.

[0237] Based on the spatial relationship, the first actual direction angle of the line connecting the location of the first sampling point and the first neighboring base station relative to the target direction is determined;

[0238] Based on the first actual direction angle and the multiple actual direction angles of multiple sub-beams in the first neighboring cell relative to the target direction, determine the sub-beams used by the first neighboring cell covering the location of the first sampling point.

[0239] Wherein, the sub-beam corresponding to the minimum angle difference between the plurality of actual direction angles and the first actual direction angle is the sub-beam used by the first neighboring region to cover the first sampling point.

[0240] Optionally, the processor 500 is further configured to read the program in the memory 520 and execute the step of constructing the spatial positional relationship between the first sampling point, the serving cell base station, and the first neighboring cell base station based on the actual azimuth angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, including:

[0241] Based on the actual directional angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, a first distance between the serving cell base station and the first neighboring cell base station is determined, as well as the target directional angle corresponding to the line connecting the serving cell base station and the first neighboring cell base station and a second distance between the location of the first sampling point and the serving cell base station.

[0242] Based on the first distance, the target orientation angle, the second distance, and the actual orientation angle of the location of the first sampling point relative to the serving cell base station, a first angle is determined to be rotated relative to the line connecting the location of the first sampling point and the first neighboring cell base station.

[0243] The step of determining the first actual direction angle relative to the target direction of the line connecting the location of the first sampling point and the first neighboring base station based on the spatial position relationship includes:

[0244] Based on the first angle, determine the first actual direction angle of the line connecting the location of the first sampling point and the first neighboring base station relative to the target direction.

[0245] Optionally, the processor 500 is further configured to read the program in the memory 520 and execute the step of determining the serving cell to which the sampling point belongs based on the pre-acquired radio resource configuration information, including:

[0246] Obtain wireless resource configuration information, which includes cell configuration parameters and sampling point measurement report information;

[0247] Based on the correlation between the target information in the configuration parameters and the target information in the sampling point measurement report information, the serving cell to which the sampling point belongs is identified;

[0248] The target information includes at least one of frequency point and physical cell identifier (PCI) information.

[0249] The electronic device provided in this application embodiment can execute the above method embodiment, and its implementation principle and technical effect are similar, so it will not be described again here.

[0250] This application also provides a computer-readable storage medium storing a computer program. When executed by a processor, this computer program implements the various processes of the above-described sub-beam identification method embodiments and achieves the same technical effects. To avoid repetition, it will not be described again here. The computer-readable storage medium may be a read-only memory (ROM), a random access memory (RAM), a magnetic disk, or an optical disk, etc.

[0251] This application also provides a computer program product, including computer instructions, which, when executed by a processor, implement the above-described... Figure 1 The various processes of the method embodiments shown can achieve the same technical effect, and will not be described again here to avoid repetition.

[0252] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.

[0253] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0254] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of this application.

Claims

1. A method for identifying sub-beams, characterized in that, include: Based on the pre-acquired radio resource configuration information, determine the serving cell to which the sampling point belongs, and identify the serving sub-beam corresponding to the sampling point in the serving cell; Identify the target sub-beam that meets the preset overlapping coverage conditions among the serving sub-beams, and obtain the sampling point set and neighbor cell set corresponding to the target sub-beam; Identify the sub-beam used by the first neighboring cell covering the location of the first sampling point, wherein the first neighboring cell is a neighboring cell in the set of neighboring cells, and the first sampling point is any sampling point in the set of sampling points; The service cell includes the fifth sampling point; The step of identifying the serving sub-beam corresponding to the sampling point in the serving cell includes: Based on the horizontal normal direction of the serving cell, the horizontal angle of arrival of the fifth sampling point, and the actual horizontal direction angle of the first sub-beam of the serving cell in the horizontal direction, the sub-beam information of the fifth sampling point in the horizontal direction is determined in the first sub-beam, and the number of the first sub-beams is at least two. Based on the vertical normal direction of the serving cell, the vertical angle of arrival of the fifth sampling point, and the actual vertical downtilt angle of the second sub-beam of the serving cell in the vertical direction, the sub-beam information of the fifth sampling point in the vertical direction is determined in the second sub-beam, and the number of the second sub-beam is at least two. Based on the sub-beam information in the horizontal direction and the sub-beam information in the vertical direction, the service sub-beam covering the location of the fifth sampling point is determined.

2. The method according to claim 1, characterized in that, The overlapping coverage condition includes at least one of the following: The number of overlapping neighboring cells corresponding to the second sampling point location covered by the target sub-beam is greater than or equal to a first preset value. The second sampling point is any sampling point in the serving cell. If the difference between the reference signal received power of the serving cell corresponding to the second sampling point and the reference signal received power of the neighboring cell is less than or equal to a preset threshold value, the neighboring cell is the overlapping neighboring cell. The ratio of the number of third sampling points covered by the target sub-beam to the number of fourth sampling points is greater than a second preset value, wherein the fourth sampling point is all the sampling points covered by the target sub-beam, and the third sampling point is the sampling point among the fourth sampling points that has the overlapping coverage neighboring area.

3. The method according to claim 1, characterized in that, The sub-beam information of the fifth sampling point in the horizontal direction is the information of the sub-beam corresponding to the angle with the smallest difference between the first actual horizontal angle and the second actual horizontal angle, wherein the first actual horizontal angle is at least two actual horizontal angles of at least two of the first sub-beams relative to the first target direction, and the second actual horizontal angle is the actual horizontal angle of the line connecting the location of the fifth sampling point and the serving cell base station relative to the first target direction; and / or, The sub-beam information of the fifth sampling point in the vertical direction is the information of the sub-beam corresponding to the angle with the smallest difference between the first actual vertical downtilt angle and the second actual vertical downtilt angle. The first actual vertical downtilt angle is at least two actual vertical downtilt angles of the second sub-beams relative to the second target direction. The second actual vertical downtilt angle is the actual vertical downtilt angle of the line connecting the location of the fifth sampling point and the serving cell base station relative to the second target direction.

4. The method according to claim 1, characterized in that, The actual horizontal azimuth angle of the first sub-beam corresponding to the serving cell is the sum of the azimuth angle of the serving cell and the azimuth angle of the first sub-beam; The actual vertical downtilt angle of the second sub-beam corresponding to the serving cell is the sum of the electrical downtilt angle of the serving cell, the mechanical downtilt angle of the serving cell, and the downtilt angle of the second sub-beam.

5. The method according to claim 1, characterized in that, The identification of the sub-beam used by the first neighboring cell covering the location of the first sampling point includes: Based on the actual directional angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, a spatial positional relationship is constructed between the first sampling point, the serving cell base station, and the first neighboring cell base station. Based on the spatial relationship, the first actual direction angle of the line connecting the location of the first sampling point and the first neighboring base station relative to the target direction is determined; Based on the first actual direction angle and the multiple actual direction angles of multiple sub-beams in the first neighboring cell relative to the target direction, determine the sub-beams used by the first neighboring cell covering the location of the first sampling point; Wherein, the sub-beam corresponding to the minimum angle difference between the plurality of actual direction angles and the first actual direction angle is the sub-beam used by the first neighboring region to cover the first sampling point.

6. The method according to claim 5, characterized in that, The step of constructing the spatial relationship between the first sampling point, the serving cell base station, and the first neighboring cell base station based on the actual azimuth angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station includes: Based on the actual directional angle of the location of the first sampling point relative to the serving cell base station, the location of the serving cell base station, and the location of the first neighboring cell base station, a first distance between the serving cell base station and the first neighboring cell base station is determined, as well as the target directional angle corresponding to the line connecting the serving cell base station and the first neighboring cell base station and a second distance between the location of the first sampling point and the serving cell base station. Based on the first distance, the target orientation angle, the second distance, and the actual orientation angle of the location of the first sampling point relative to the serving cell base station, a first angle is determined to be rotated relative to the line connecting the location of the first sampling point and the first neighboring cell base station. The step of determining the first actual direction angle relative to the target direction of the line connecting the location of the first sampling point and the first neighboring base station based on the spatial position relationship includes: Based on the first angle, determine the first actual direction angle of the line connecting the location of the first sampling point and the first neighboring base station relative to the target direction.

7. The method according to claim 1, characterized in that, The step of determining the serving cell to which the sampling point belongs based on pre-acquired radio resource configuration information includes: Obtain wireless resource configuration information, which includes cell configuration parameters and sampling point measurement report information; Based on the correlation between the target information in the configuration parameters and the target information in the sampling point measurement report information, the serving cell to which the sampling point belongs is identified; The target information includes at least one of frequency point and Physical Cell Identifier (PCI) information.

8. A sub-beam identification device, characterized in that, include: The first determining module is used to determine the serving cell to which the sampling point belongs based on the pre-acquired radio resource configuration information, and to identify the serving sub-beam corresponding to the sampling point in the serving cell. The second determining module is used to determine the target sub-beam that meets the preset overlapping coverage conditions in the serving sub-beam, and to obtain the sampling point set and neighbor cell set corresponding to the target sub-beam; The identification module is used to identify the sub-beam used by the first neighboring cell covering the location of the first sampling point, wherein the first neighboring cell is a neighboring cell in the set of neighboring cells, and the first sampling point is any sampling point in the set of sampling points; The service cell includes the fifth sampling point; The identification module includes: The first determining submodule is used to determine the sub-beam information of the fifth sampling point in the horizontal direction in the first sub-beam based on the horizontal normal direction of the serving cell, the horizontal angle of arrival of the fifth sampling point, and the actual horizontal direction angle of the first sub-beam of the serving cell in the horizontal direction. The number of the first sub-beams is at least two. The second determining submodule is used to determine the sub-beam information of the fifth sampling point in the vertical direction in the second sub-beam based on the vertical normal direction of the serving cell, the vertical angle of arrival of the fifth sampling point, and the actual vertical downtilt angle of the second sub-beam of the serving cell in the vertical direction. The number of the second sub-beam is at least two. The third determining submodule is used to determine the service subbeam covering the location of the fifth sampling point based on the subbeam information in the horizontal direction and the subbeam information in the vertical direction.

9. An electronic device, characterized in that, include: A processor, a memory, and a program stored in the memory and executable on the processor, wherein the program, when executed by the processor, implements the steps of the sub-beam identification method as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the sub-beam identification method as described in any one of claims 1 to 7.

11. A computer program product, characterized in that, It includes computer instructions that, when executed by a processor, implement the steps of the sub-beam identification method as described in any one of claims 1 to 7.

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