Method and apparatus for measuring quantum voltage step width

Abstract

This application relates to a method and apparatus for measuring the width of a quantum voltage step. The method includes: in the implementation of the programmable Josephson quantum voltage standard, determining the microwave frequency range and microwave power range of a microwave source based on the voltage step width requirements of the Josephson array; determining the power range of each scan round during multiple scans of the microwave source based on the microwave power range; performing multiple scans of the microwave source based on a scan function, according to the microwave frequency range and the power range of each scan round; wherein the scan function is a function characterizing the scan time and the measurement accuracy of the quantum voltage step; and determining the quantum voltage step width of the Josephson array based on the scan results of each scan round. This method can improve the scanning efficiency of the microwave source and ensure the observation accuracy of the quantum voltage step.

Description

Technical Field

[0001] This application relates to the field of electronic information technology, and in particular to a method and apparatus for measuring the width of a quantum voltage step. Background Technology

[0002] In the implementation of the programmable Josephson quantum voltage standard, when a microwave source radiates a Josephson array, its current-voltage characteristic curve exhibits a Shapiro step, also known as a quantum voltage step. By changing the microwave frequency and power, the width of the quantum voltage step can be varied. To measure the width of the quantum voltage step, the microwave source needs to be scanned within a specific frequency and power range. Therefore, the scanning strategy of the microwave source is crucial for the observation of the quantum voltage step.

[0003] Although existing studies have extensively investigated the quantum voltage steps of Josephson junctions, current microwave source scanning strategies still employ a full-range equidistant approach, which has limitations such as excessively long scanning times and low scanning efficiency. In particular, it cannot measure complex quantum steps, further reducing scanning efficiency and consequently compromising the observation accuracy of quantum voltage steps. Summary of the Invention

[0004] Therefore, it is necessary to provide a method and apparatus for measuring the width of the quantum voltage step that can improve the scanning efficiency of the microwave source and ensure the observation accuracy of the quantum voltage step, in order to address the above-mentioned technical problems.

[0005] In a first aspect, this application provides a method for measuring the width of a quantum voltage step, comprising:

[0006] In the process of implementing the programmable Josephson quantum voltage standard, the microwave frequency range and microwave power range of the microwave source are determined according to the voltage step width requirements of the Josephson array.

[0007] Based on the microwave power range, determine the power range of each scanning round during the multi-round scanning process of the microwave source;

[0008] Based on the scanning function, the microwave source is scanned multiple times according to the microwave frequency range and the power range of each scanning round; wherein, the scanning function is a function characterizing the scanning time and the accuracy of quantum voltage step measurement;

[0009] The quantum voltage step width of the Josephson array is determined based on the scan results of each scan round.

[0010] In one embodiment, the scan function is constructed as follows:

[0011] Based on the maximum microwave frequency parameter, minimum microwave frequency parameter, maximum power parameter, minimum power parameter, single scan frequency adjustment variable, and single scan power adjustment variable of the microwave source, construct the scan time function;

[0012] A measurement accuracy function is constructed based on the single-scan frequency adjustment variable and the single-scan power adjustment variable;

[0013] Based on the scan time function and the measurement accuracy function, a target function is constructed.

[0014] In one embodiment, constructing the scan time function based on the maximum microwave frequency parameter, minimum microwave frequency parameter, maximum power parameter, minimum power parameter, single-scan frequency adjustment variable, and single-scan power adjustment variable of the microwave source includes:

[0015] The ratio of the difference between the maximum microwave frequency parameter and the minimum microwave frequency parameter to the single-scan frequency adjustment variable is used as a first time function; and...

[0016] The ratio of the difference between the maximum power parameter and the minimum power parameter to the single-scan power adjustment variable is used as the second time function.

[0017] The product of the first time function and the second time function is used as the scan time function.

[0018] In one embodiment, constructing the measurement accuracy function based on the single-scan frequency adjustment variable and the single-scan power adjustment variable includes:

[0019] The reciprocal of the single-scan frequency adjustment variable is used as the first precision function; and,

[0020] The reciprocal of the single-scan power adjustment variable is used as the second precision function;

[0021] The product of the first accuracy function and the second accuracy function is used as the measurement accuracy function.

[0022] In one embodiment, the step of performing multiple scans of the microwave source based on the scan function, according to the microwave frequency range and the power range of each scan round, includes:

[0023] For each scanning cycle, determine the single scan frequency adjustment step size and the single scan power adjustment step size for that scanning cycle;

[0024] Based on the single-scan frequency adjustment step size and single-scan power adjustment step size of the scanning round, the microwave source is scanned within the power range and microwave frequency range of the round to obtain the round scanning result of the scanning round.

[0025] In one embodiment, determining the single-scan frequency adjustment step size and the single-scan power adjustment step size for the scan round includes:

[0026] When the scan round is the first scan round, the minimum frequency adjustment step size is used as the single scan frequency adjustment step size of the scan round, and the minimum power adjustment step size is used as the single scan power adjustment step size of the scan round; wherein, the minimum frequency adjustment step size is determined according to the frequency adjustment step size requirement, and the minimum power adjustment step size is determined according to the power adjustment step size requirement.

[0027] When the scanning round is not the first scanning round, the single scan frequency adjustment step size and single scan power adjustment step size of the scanning round are determined based on the microwave frequency range, the round power range of the scanning round, the round scanning result of the previous scanning round, and the scanning function.

[0028] In one embodiment, determining the single-scan frequency adjustment step size and single-scan power adjustment step size of the scanning cycle based on the microwave frequency range, the cycle power range of the scanning cycle, the scanning result of the previous scanning cycle, and the scanning function includes:

[0029] Based on the scanning results of the previous scanning round and the constraint function that constrains the single scan frequency adjustment step size and the single scan power adjustment step size, a population is generated; wherein, each individual in the population includes a randomly generated initial scan frequency adjustment step size and an initial scan power adjustment step size.

[0030] For each individual in the population, the fitness of the individual is determined based on the scanning function, the microwave frequency range, the power range of the scanning rounds, and the initial scanning frequency adjustment step size and the initial scanning power adjustment step size of the individual.

[0031] The initial scan frequency adjustment step size corresponding to the individual with the lowest fitness is used as the single scan frequency adjustment step size of the scan round, and the initial scan power adjustment step size corresponding to the individual with the lowest fitness is used as the single scan power adjustment step size of the scan round.

[0032] In one embodiment, the constraint function includes a frequency constraint function that constrains the frequency adjustment step size for a single scan and a power constraint function that constrains the power adjustment step size for a single scan; the constraint function is constructed in the following manner:

[0033] Based on the frequency adjustment step size requirements, determine the maximum and minimum frequency adjustment step sizes;

[0034] Determine the maximum power adjustment step size and the minimum frequency adjustment step size based on the power adjustment step size requirements;

[0035] The frequency constraint function is constructed based on the maximum frequency adjustment step size and the minimum frequency adjustment step size;

[0036] The power constraint function is constructed based on the maximum power adjustment step size and the minimum frequency adjustment step size.

[0037] Secondly, this application also provides a device for measuring the width of a quantum voltage step, comprising:

[0038] The first determining module is used to determine the microwave frequency range and microwave power range of the microwave source according to the voltage step width requirement of the Josephson array during the implementation of the programmable Josephson quantum voltage standard.

[0039] The second determining module is used to determine the power range of each scanning round during the multi-round scanning process of the microwave source based on the microwave power range.

[0040] A multi-round scanning module is used to perform multiple rounds of scanning on the microwave source based on a scanning function, according to the microwave frequency range and the power range of each scanning round; wherein, the scanning function is a function characterizing the scanning time and the accuracy of quantum voltage step measurement;

[0041] The width determination module is used to determine the width of the quantum voltage step of the Josephson array based on the scan results of each scan round.

[0042] Thirdly, this application also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0043] In the process of implementing the programmable Josephson quantum voltage standard, the microwave frequency range and microwave power range of the microwave source are determined according to the voltage step width requirements of the Josephson array.

[0044] Based on the microwave power range, determine the power range of each scanning round during the multi-round scanning process of the microwave source;

[0045] Based on the scanning function, the microwave source is scanned multiple times according to the microwave frequency range and the power range of each scanning round; wherein, the scanning function is a function characterizing the scanning time and the accuracy of quantum voltage step measurement;

[0046] The quantum voltage step width of the Josephson array is determined based on the scan results of each scan round.

[0047] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, performs the following steps:

[0048] In the process of implementing the programmable Josephson quantum voltage standard, the microwave frequency range and microwave power range of the microwave source are determined according to the voltage step width requirements of the Josephson array.

[0049] Based on the microwave power range, determine the power range of each scanning round during the multi-round scanning process of the microwave source;

[0050] Based on the scanning function, the microwave source is scanned multiple times according to the microwave frequency range and the power range of each scanning round; wherein, the scanning function package is a function characterizing the scanning time and the accuracy of quantum voltage step measurement;

[0051] The quantum voltage step width of the Josephson array is determined based on the scan results of each scan round.

[0052] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, performs the following steps:

[0053] In the process of implementing the programmable Josephson quantum voltage standard, the microwave frequency range and microwave power range of the microwave source are determined according to the voltage step width requirements of the Josephson array.

[0054] Based on the microwave power range, determine the power range of each scanning round during the multi-round scanning process of the microwave source;

[0055] Based on the scanning function, the microwave source is scanned multiple times according to the microwave frequency range and the power range of each scanning round; wherein, the scanning function is a function characterizing the scanning time and the accuracy of quantum voltage step measurement;

[0056] The quantum voltage step width of the Josephson array is determined based on the scan results of each scan round.

[0057] The aforementioned method and apparatus for measuring the quantum voltage step width, in the process of implementing the programmable Josephson quantum voltage standard, determines the microwave frequency range and microwave power range of the microwave source according to the voltage step width requirements of the Josephson array, and determines the power range of each scanning round during the multi-round scanning process of the microwave source based on the microwave power range, so as to refine the scanning of the microwave power range; furthermore, based on the scanning function characterizing the scanning time and the measurement accuracy of the quantum voltage step, the microwave source is scanned in multiple rounds according to the microwave frequency range and the power range of each scanning round, which can adaptively control the scanning interval of microwave frequency and power, improve scanning efficiency, and thus improve the measurement accuracy of the quantum voltage step width of the Josephson array. Attached Figure Description

[0058] To more clearly illustrate the technical solutions in the embodiments or related technologies of this application, the accompanying drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0059] Figure 1 This is a flowchart illustrating a method for measuring the width of a quantum voltage step in one embodiment.

[0060] Figure 2 This is a flowchart illustrating the construction of the scan time function in one embodiment;

[0061] Figure 3 This is a flowchart illustrating the process of constructing a measurement accuracy function in one embodiment;

[0062] Figure 4 This is a schematic diagram of a process for performing multiple scans on a microwave source in one embodiment;

[0063] Figure 5 This is a flowchart illustrating the process of determining the single-scan frequency adjustment step size and the single-scan power adjustment step size in one embodiment;

[0064] Figure 6 This is a flowchart illustrating a method for measuring the width of a quantum voltage step in another embodiment;

[0065] Figure 7 This is a structural block diagram of a device for measuring the width of a quantum voltage step in one embodiment;

[0066] Figure 8 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0067] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0068] The method for measuring the width of quantum voltage steps provided in this application can be applied to environments where the quantum voltage steps of Josephson arrays are measured. This method for measuring the width of voltage steps can be executed by a computer device, which can be a server or a terminal with powerful computing capabilities.

[0069] In one exemplary embodiment, such as Figure 1 As shown, a method for measuring the width of a quantum voltage step is provided. Taking the application of this method to a server as an example, the method includes the following steps:

[0070] S101, in the process of implementing the programmable Josephson quantum voltage standard, determines the microwave frequency range and microwave power range of the microwave source according to the voltage step width requirements of the Josephson array.

[0071] It should be noted that different Josephson arrays will be encountered during the realization of the quantum voltage standard, thus requiring different microwave signals. The voltage step width requirement of the Josephson array characterizes the required quantum voltage step width. The microwave frequency range of the microwave source refers to the range of microwave frequencies that the microwave source needs to generate during the realization of the quantum voltage standard; the microwave power range refers to the range of microwave power that the microwave source needs to generate during the realization of the quantum voltage standard.

[0072] Optionally, the width and stability of the quantum voltage step in a Josephson junction array are closely related to the microwave frequency and power. To obtain a suitable quantum voltage value, a higher microwave frequency needs to be selected. Within a certain range, increasing the microwave frequency can increase the step width, but excessively high frequencies will increase the junction impedance and reduce the microwave coupling efficiency. Therefore, a microwave frequency range within a reasonable range needs to be selected based on the voltage step width requirements.

[0073] Optionally, if the microwave power is too low, some junctions in the Josephson array cannot be effectively driven, resulting in a narrower step width or even the disappearance of the step. If the microwave power is too high, the array will enter the nonlinear region, inducing multiphoton absorption, which will also cause a narrower step width and may even lead to additional parasitic steps. Therefore, it is necessary to select a microwave power range within a reasonable range based on the voltage step width requirements.

[0074] S102, Based on the microwave power range, determine the power range of each scanning round during the multi-round scanning process of the microwave source.

[0075] In this embodiment, to ensure improved scanning efficiency and accuracy, multiple scans are required across different power ranges of the microwave source. The power range of each scan round is the range of microwave power of the microwave source scanned in that scan round.

[0076] Optionally, the microwave power range can be divided into a preset number of power ranges at equal intervals, or the microwave power range can be divided into a preset number of power ranges according to the preset division rules based on actual needs.

[0077] S103, based on the scanning function, performs multiple scans on the microwave source according to the microwave frequency range and the power range of each scan round.

[0078] The scan function is a function that characterizes the scan time and the measurement accuracy of the quantum voltage step. In the embodiments of this application, the scan function can be constructed based on the scan time function that characterizes the scan time and the measurement accuracy function that characterizes the measurement accuracy of the quantum voltage step.

[0079] In this embodiment, a scanning time function can be constructed based on the maximum microwave frequency parameter, minimum microwave frequency parameter, maximum power parameter, minimum power parameter, single-scan frequency adjustment variable, and single-scan power adjustment variable of the microwave source. The maximum microwave frequency parameter is the maximum value within the microwave frequency range, the minimum microwave frequency parameter is the minimum value within the microwave frequency range, the maximum power parameter is the maximum value within the microwave power range, and the minimum microwave frequency parameter is the minimum value within the microwave power range. The single-scan frequency adjustment variable is the frequency adjustment step size within a single scan cycle, and the single-scan power adjustment variable is the power adjustment step size within a single scan cycle. Optionally, the scanning time function can be constructed based on the corresponding functional relationship between the scanning time and the aforementioned parameters and variables.

[0080] Simultaneously, a measurement accuracy function can be constructed based on the single-scan frequency adjustment variable and the single-scan power adjustment variable. Furthermore, a target function can be constructed based on the scan time function and the measurement accuracy function. For example, the difference between the time function and the measurement accuracy function can be used as the scan function. Weights can also be set for the time function and the measurement accuracy function according to actual needs; for example, both weights can be 0.5, and the scan time function and the measurement accuracy function can be weighted and the difference calculated to obtain the scan function.

[0081] Optionally, for each scanning cycle, the corresponding power range and microwave frequency range can be substituted into the scanning function to update the scanning function, and the updated scanning function can be used as the objective function. Furthermore, the step size adjustment range of frequency and power can be set according to actual needs to constrain the frequency adjustment variable and power adjustment variable for a single scan.

[0082] The objective function can be minimized, and the above constraints can be used as constraints. An optimization algorithm can be used to solve the objective function, and the values ​​of the single-scan frequency adjustment variable and the single-scan power adjustment variable obtained from the solution can be used as the single-scan frequency adjustment step size and the single-scan power adjustment step size for the next scanning round, so that the microwave source can be scanned in the next scanning round according to the single-scan frequency adjustment step size and the single-scan power adjustment step size.

[0083] It should be noted that if the scan round is the first scan round, the minimum frequency adjustment step size can be used as the single scan frequency adjustment step size and the minimum power adjustment step size can be used as the single scan power adjustment step size, according to the set frequency and power step size adjustment range.

[0084] In addition, during each scanning cycle, the microwave power can be kept constant at first, and the microwave frequency can be changed by adjusting the step size according to the single scan frequency. Then, the microwave power can be changed by adjusting the step size according to the single scan power. The power within the cycle power range corresponding to the scanning cycle can be scanned, covering the entire microwave frequency range, and the cycle scanning result of the scanning cycle can be obtained.

[0085] S104. Based on the scan results of each scan cycle, determine the width of the quantum voltage step of the Josephson array.

[0086] It should be noted that the scanning results of each scanning round include the voltage-current characteristic curves at each frequency point and the voltage-current characteristic curves at each power point. Furthermore, the quantum voltage step width of the Josephson array is calculated based on the voltage-current characteristic curves at each frequency point and the voltage-current characteristic curves at each power point.

[0087] In the aforementioned method for measuring the width of the quantum voltage step, during the implementation of the programmable Josephson quantum voltage standard, the microwave frequency range and microwave power range of the microwave source are determined according to the voltage step width requirements of the Josephson array. Based on the microwave power range, the power range of each scanning round during the multi-round scanning of the microwave source is determined to refine the scanning of the microwave power range. Furthermore, based on the scanning function characterizing the scanning time and the measurement accuracy of the quantum voltage step, the microwave source is scanned multiple times according to the microwave frequency range and the power range of each scanning round. This allows for adaptive control of the scanning interval of the microwave frequency and power, improving scanning efficiency and thus enhancing the measurement accuracy of the quantum voltage step width of the Josephson array.

[0088] Optionally, in one embodiment, as Figure 2 As shown, a method for constructing a scan-time function is provided, which specifically includes the following steps:

[0089] S201, the ratio of the difference between the maximum microwave frequency parameter and the minimum microwave frequency parameter to the single-scan frequency adjustment variable is used as a first time function; and the ratio of the difference between the maximum power parameter and the minimum power parameter to the single-scan power adjustment variable is used as a second time function.

[0090] Optionally, the difference between the maximum and minimum microwave frequency parameters can be calculated, and the ratio of the difference to the single-scan frequency adjustment variable can be used as the first time function, which can be expressed as formula (1):

[0091] (1)

[0092] in, It is a first-time function; This refers to the maximum microwave frequency parameter; This is the minimum microwave frequency parameter; This is a variable used to adjust the frequency of a single scan.

[0093] Meanwhile, the difference between the maximum power parameter and the minimum power parameter can be taken, and the ratio of the difference to the power adjustment variable for a single scan can be used as the second time function, which can be expressed as formula (2):

[0094] (2)

[0095] in, It is the second time function; This refers to the maximum power parameter; This is the minimum power parameter; This is the power adjustment variable for a single scan.

[0096] S202, the product between the first time function and the second time function is used as the scan time function.

[0097] Optionally, the first time function and the second time function can be multiplied, and the resulting function can be used as the scan time function, specifically expressed as formula (3):

[0098] (3)

[0099] in, This is the scan time function.

[0100] This embodiment provides a method for quickly and accurately constructing a scan time function by introducing a first time function and a second time function.

[0101] Optionally, in one embodiment, such as Figure 3 As shown, a method for constructing a measurement accuracy function is provided, which specifically includes the following steps:

[0102] S301, the reciprocal of the single-scan frequency adjustment variable is used as the first precision function; and the reciprocal of the single-scan power adjustment variable is used as the second precision function.

[0103] Optionally, the reciprocal of the single scan frequency adjustment variable can be used as the first precision function, which can be expressed as formula (4):

[0104] (4)

[0105] in, This is the first precision function.

[0106] Meanwhile, the reciprocal of the single-scan power adjustment variable can be used as the second precision function, which can be expressed as formula (5):

[0107] (5)

[0108] in, This is a function with second precision.

[0109] S302, the product between the first precision function and the second precision function is used as the measurement precision function.

[0110] Optionally, the product between the first precision function and the second precision function can be used as the measurement precision function, which can be expressed as formula (6):

[0111] (6)

[0112] in, This is a function for measurement accuracy.

[0113] In this embodiment, by introducing a first precision function and a second precision function, a method for quickly and accurately constructing a measurement precision function is provided.

[0114] Optionally, in one embodiment, such as Figure 4 As shown, a method for performing multiple scans of a microwave source is provided, specifically including the following steps:

[0115] S401, for each scanning round, determine the single scan frequency adjustment step size and the single scan power adjustment step size for that scanning round.

[0116] The frequency adjustment step size for each scan cycle is the step size at which the frequency is adjusted during the scanning process of that scan cycle; the power adjustment step size for each scan cycle is the step size at which the power is adjusted during the scanning process of that scan cycle.

[0117] Optionally, in this embodiment of the application, in order to dynamically adjust the adjustment step size of each scanning round (including the single scan frequency adjustment step size and the single scan power adjustment step size), the adjustment step size can be optimized based on the scanning results of the previous round.

[0118] It should be noted that if this scanning round is the first scanning round, i.e., there is no previous scanning round, the single-scan frequency adjustment step size and single-scan power adjustment step size can be preset for this scanning round. For example, when this is the first scanning round, the minimum frequency adjustment step size is used as the single-scan frequency adjustment step size for this scanning round, and the minimum power adjustment step size is used as the single-scan power adjustment step size for this scanning round; wherein, the minimum frequency adjustment step size is determined according to the frequency adjustment step size requirement, and the minimum power adjustment step size is determined according to the power adjustment step size requirement.

[0119] If the scan round is not the first scan round, the single-scan frequency adjustment step size and single-scan power adjustment step size of the scan round can be determined based on the microwave frequency range, the scan power range of the scan round, the scan result of the previous scan round, and the scan function. For example, the scan function can be updated based on the microwave frequency range and the scan power range of the scan round, and the updated scan function can be solved based on the scan result of the previous scan round to obtain the single-scan frequency adjustment step size and single-scan power adjustment step size of the scan round.

[0120] S402, based on the single-scan frequency adjustment step size and single-scan power adjustment step size of the scanning round, scans the microwave source within the power range and microwave frequency range of the round, and obtains the round scanning results of the scanning round.

[0121] Optionally, the microwave power can be kept constant, the microwave frequency can be changed by adjusting the step size according to the single scan frequency, and then the microwave power can be changed by adjusting the step size according to the single scan power. The power within the power range corresponding to the scan round can be scanned, covering the entire microwave frequency range, to obtain the scan result of the scan round.

[0122] In this embodiment, before each scanning round, the single frequency adjustment step size and the single scan power adjustment step size for that scanning round are determined. This is equivalent to continuously adjusting the single frequency adjustment step size and the single scan power adjustment step size, thus ensuring the accuracy of the scanning results for each scanning round.

[0123] Optionally, in one embodiment, when the scan round is not the first scan round, such as Figure 5 As shown, a method for determining the single-scan frequency adjustment step size and single-scan power adjustment step size for a scanning round is provided, specifically including the following steps:

[0124] S501, based on the scanning results of the previous scanning round and the constraint function that constrains the step size of the single scan frequency adjustment and the step size of the single scan power adjustment, generate a population.

[0125] Each individual in the population includes a randomly generated initial scan frequency adjustment step size and an initial scan power adjustment step size.

[0126] Optionally, in this embodiment, the constraint function may include a frequency constraint function that constrains the frequency adjustment step size for a single scan and a power constraint function that constrains the power adjustment step size for a single scan. Specifically, the maximum and minimum frequency adjustment step sizes can be determined according to the frequency adjustment step size requirements, and the maximum and minimum power adjustment step sizes can be determined according to the power adjustment step size requirements. Further, a frequency constraint function is constructed based on the maximum and minimum frequency adjustment step sizes; a power constraint function is constructed based on the maximum and minimum power adjustment step sizes. For example, the frequency constraint function can be expressed as formula (7):

[0127] (7)

[0128] in, Adjust the step size to minimize the frequency; Adjust the step size to achieve the maximum frequency.

[0129] The power constraint function can be expressed as formula (8):

[0130] (8)

[0131] in, Adjust the step size for minimum power; Adjust the step size for maximum power.

[0132] Furthermore, based on the scanning results of the previous scan round, a preset number of individuals are randomly generated under the condition of satisfying the constraint function. For example, each individual can be represented as... It should be noted that the number of individuals can be chosen based on the complexity of the Josephson array.

[0133] S502, for each individual in the population, determines the fitness of an individual based on the scan function, according to the microwave frequency range, the power range of the scan rounds, and the individual's initial scan frequency adjustment step size and initial scan power adjustment step size.

[0134] Optionally, in conjunction with the description of the above embodiments, the scanning function can be expressed as formula (9):

[0135] (9)

[0136] in, For scanning functions; The weights of the scan time function, The weights for the measurement accuracy function; and It can be modified according to actual needs; for example, if you want to focus on scanning speed, then... Bigger, otherwise It's smaller.

[0137] For each individual Substitute the initial scan frequency adjustment step size and initial scan power adjustment step size of each individual into the scan function (e.g., formula (9) above) to obtain the fitness value of each individual. .

[0138] Optionally, during the iteration process, excellent individuals can be selected to update the population based on the fitness evaluation results. The crossover operation is performed according to the following formulas (10) and (11), selecting two parent individuals. and Generate offspring individuals .

[0139] (10)

[0140] (11)

[0141] in, This is the crossover probability, usually taken as 0.5.

[0142] For mutation operations, the generated offspring individuals are mutated to increase randomness:

[0143] (12)

[0144] (13)

[0145] in, and It is the standard deviation of variation, usually taken as 10% of the compensation range.

[0146] In addition, to prevent exceeding the step size range, the following constraints are defined:

[0147] (14)

[0148] (15)

[0149] If the optimal fitness does not improve significantly when the Nth (number of individuals in the population) consecutive iteration is reached (the change is less than the set initial threshold), or if the set number of local iterations is reached, then the local iteration stops.

[0150] S503, the initial scan frequency adjustment step size corresponding to the individual with the lowest fitness is used as the single scan frequency adjustment step size of the scan round, and the initial scan power adjustment step size corresponding to the individual with the lowest fitness is used as the single scan power adjustment step size of the scan round.

[0151] Optionally, the initial scan frequency adjustment step size corresponding to the individual with the lowest fitness can be used as the single scan frequency adjustment step size of the scan round, and the initial scan power adjustment step size corresponding to the individual with the lowest fitness can be used as the single scan power adjustment step size of the scan round, ensuring that the obtained single scan frequency adjustment step size and single scan power adjustment step size are the optimal values.

[0152] In this embodiment, by introducing a population optimization algorithm, the accuracy of the optimization process is ensured, and the accuracy and optimality of the determined single scan frequency adjustment step size and single scan power adjustment step size are also guaranteed. In addition, the population is generated by combining the scanning results of the previous round, which enhances the adaptability to measuring the quantum step width of complex arrays.

[0153] Figure 6 This is a flowchart illustrating a method for measuring the width of a quantum voltage step in another embodiment. Based on the above embodiments, this embodiment provides an optional example of a method for measuring the width of a quantum voltage step. (Combined with...) Figure 6 The specific implementation process is as follows:

[0154] S601 determines the microwave frequency range and microwave power range of the microwave source based on the voltage step width requirements of the Josephson array during the implementation of the programmable Josephson quantum voltage standard.

[0155] S602, based on the microwave power range, determine the power range of each scanning round during the multi-round scanning process of the microwave source.

[0156] S603, in the first scan cycle, uses the minimum frequency adjustment step size as the single scan frequency adjustment step size of the scan cycle, and uses the minimum power adjustment step size as the single scan power adjustment step size of the scan cycle.

[0157] The minimum frequency adjustment step size is determined based on the frequency adjustment step size requirement, and the minimum power adjustment step size is determined based on the power adjustment step size requirement.

[0158] S604, based on the single frequency adjustment step size and single scan power adjustment step size of the first scan round, scans the microwave source within the power range and microwave frequency range of the first scan round to obtain the scan results of the first scan round.

[0159] S605, in the next scanning round, a population is generated based on the scanning results of the previous scanning round and the constraint function that constrains the step size of the single scan frequency adjustment and the step size of the single scan power adjustment.

[0160] Each individual in the population includes a randomly generated initial scan frequency adjustment step size and an initial scan power adjustment step size.

[0161] S606, based on this scanning function, determines the fitness of each individual according to the microwave frequency range, the power range of the scanning rounds, and the initial scanning frequency adjustment step size and the initial scanning power adjustment step size of each individual in the population.

[0162] S607, the initial scan frequency adjustment step size corresponding to the individual with the lowest fitness is used as the single scan frequency adjustment step size of the scan round, and the initial scan power adjustment step size corresponding to the individual with the lowest fitness is used as the single scan power adjustment step size of the scan round.

[0163] S608, based on the single-scan frequency adjustment step size and single-scan power adjustment step size of the scanning round, scans the microwave source within the power range and microwave frequency range of the round, and obtains the round scanning results of the scanning round.

[0164] S609, determine whether the power range of the scan cycle exceeds the microwave power range; if yes, execute S610; if no, return to execute S605.

[0165] S610 determines the width of the quantum voltage step of the Josephson array based on the scan results of each scan round.

[0166] The specific processes of S601-S610 described above can be found in the description of the above method embodiments. Their implementation principles and technical effects are similar, and will not be repeated here.

[0167] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0168] Based on the same inventive concept, this application also provides a quantum voltage step width measuring device for implementing the quantum voltage step width measuring method described above. The solution provided by this device is similar to the solution described in the above method; therefore, the specific limitations of one or more quantum voltage step width measuring device embodiments provided below can be found in the limitations of the quantum voltage step width measuring method described above, and will not be repeated here.

[0169] In one exemplary embodiment, such as Figure 7 As shown, a quantum voltage step width measurement device 700 is provided, comprising: a first determination module 710, a second determination module 720, a multi-round scanning module 730, and a width determination module 740, wherein:

[0170] The first determining module 710 is used to determine the microwave frequency range and microwave power range of the microwave source according to the voltage step width requirements of the Josephson array during the implementation of the programmable Josephson quantum voltage standard.

[0171] The second determining module 720 is used to determine the power range of each scanning round during the multi-round scanning process of the microwave source based on the microwave power range.

[0172] The multi-round scanning module 730 is used to perform multiple rounds of scanning on a microwave source based on a scanning function, according to the microwave frequency range and the power range of each scanning round; wherein, the scanning function is a function characterizing the scanning time and the accuracy of quantum voltage step measurement.

[0173] The width determination module 740 is used to determine the width of the quantum voltage step of the Josephson array based on the scan results of each scan round.

[0174] The aforementioned quantum voltage step width measurement device, in the process of implementing the programmable Josephson quantum voltage standard, determines the microwave frequency range and microwave power range of the microwave source according to the voltage step width requirements of the Josephson array. Based on the microwave power range, it determines the power range of each scanning round during the multi-round scanning of the microwave source, thereby refining the scanning of the microwave power range. Furthermore, based on the scanning function characterizing the scanning time and the measurement accuracy of the quantum voltage step, the microwave source is scanned multiple times according to the microwave frequency range and the power range of each scanning round. This allows for adaptive control of the scanning interval of the microwave frequency and power, improving scanning efficiency and thus enhancing the measurement accuracy of the quantum voltage step width of the Josephson array.

[0175] In one embodiment, the quantum voltage step width measuring device 700 further includes a function construction module, comprising:

[0176] The first building unit is used to build a scanning time function based on the maximum microwave frequency parameter, minimum microwave frequency parameter, maximum power parameter, minimum power parameter, single-scan frequency adjustment variable, and single-scan power adjustment variable of the microwave source.

[0177] The second building unit is used to construct the measurement accuracy function based on the single scan frequency adjustment variable and the single scan power adjustment variable.

[0178] The third building unit is used to construct the target function based on the scan time function and the measurement accuracy function.

[0179] In one embodiment, the first building unit is specifically used for:

[0180] The ratio of the difference between the maximum and minimum microwave frequency parameters to the single-scan frequency adjustment variable is used as the first time function; and the ratio of the difference between the maximum and minimum power parameters to the single-scan power adjustment variable is used as the second time function; the product of the first time function and the second time function is used as the scan time function.

[0181] In one embodiment, the second building unit is specifically used for:

[0182] The reciprocal of the single-scan frequency adjustment variable is used as the first precision function; and the reciprocal of the single-scan power adjustment variable is used as the second precision function; the product of the first precision function and the second precision function is used as the measurement precision function.

[0183] In one embodiment, the multi-round scanning module 730 includes:

[0184] The step size adjustment unit is used to determine the single scan frequency adjustment step size and the single scan power adjustment step size for each scan cycle.

[0185] The scanning unit is used to adjust the step size of the single frequency and the single scan power according to the scanning round, and to scan the microwave source within the power range and frequency range of the round to obtain the scanning results of the scanning round.

[0186] In one embodiment, the compensation adjustment unit is specifically used for:

[0187] When the scan round is the first scan round, the minimum frequency adjustment step size is used as the single scan frequency adjustment step size for the scan round, and the minimum power adjustment step size is used as the single scan power adjustment step size for the scan round; wherein, the minimum frequency adjustment step size is determined according to the frequency adjustment step size requirement, and the minimum power adjustment step size is determined according to the power adjustment step size requirement; when the scan round is not the first scan round, the single scan frequency adjustment step size and single scan power adjustment step size for the scan round are determined according to the microwave frequency range, the scan round power range, the scan results of the previous scan round, and the scan function.

[0188] In one embodiment, the compensation adjustment unit is further configured to:

[0189] Based on the scanning results of the previous scan round and the constraint function that constrains the single scan frequency adjustment step size and single scan power adjustment step size, a population is generated. Each individual in the population includes a randomly generated initial scan frequency adjustment step size and an initial scan power adjustment step size. For each individual in the population, based on the scan function, the fitness of the individual is determined according to the microwave frequency range, the scan round power range, and the individual's initial scan frequency adjustment step size and initial scan power adjustment step size. The initial scan frequency adjustment step size corresponding to the individual with the lowest fitness is used as the single scan frequency adjustment step size for the scan round, and the initial scan power adjustment step size corresponding to the individual with the lowest fitness is used as the single scan power adjustment step size for the scan round.

[0190] In one embodiment, the constraint function includes a frequency constraint function that constrains the frequency adjustment step size for a single scan and a power constraint function that constrains the power adjustment step size for a single scan; the compensation adjustment unit further includes a constraint construction unit, specifically used for:

[0191] Based on the frequency adjustment step size requirement, determine the maximum and minimum frequency adjustment step sizes; based on the power adjustment step size requirement, determine the maximum and minimum power adjustment step sizes; based on the maximum and minimum frequency adjustment step sizes, construct the frequency constraint function; based on the maximum and minimum power adjustment step sizes, construct the power constraint function.

[0192] Each module in the aforementioned quantum voltage step width measurement device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in hardware within or independently of the processor in a computer device, or stored in software within the memory of the computer device, so that the processor can call and execute the operations corresponding to each module.

[0193] In one exemplary embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 8 As shown, this computer device includes a processor, memory, input / output (I / O) interfaces, and a communication interface. The processor, memory, and I / O interfaces are connected via a system bus, and the communication interface is also connected to the system bus via the I / O interfaces. The processor provides computational and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and databases. The internal memory provides the environment for the operating system and computer programs stored in the non-volatile storage media to run. The I / O interfaces are used for exchanging information between the processor and external devices. The communication interface is used for communicating with external terminals via a network connection. When executed by the processor, the computer program implements a method for measuring the width of a quantum voltage step.

[0194] Those skilled in the art will understand that Figure 8 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0195] In one exemplary embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0196] In the process of implementing the programmable Josephson quantum voltage standard, the microwave frequency range and microwave power range of the microwave source are determined according to the voltage step width requirements of the Josephson array.

[0197] Based on the microwave power range, determine the power range of each scanning round during the multi-round scanning process of the microwave source;

[0198] Based on the scanning function, the microwave source is scanned multiple times according to the microwave frequency range and the power range of each scanning round; where the scanning function is a function characterizing the scanning time and the measurement accuracy of the quantum voltage step.

[0199] The width of the quantum voltage step of the Josephson array is determined based on the scan results of each scan round.

[0200] In one embodiment, the processor, when executing a computer program, also performs the following steps:

[0201] Based on the maximum microwave frequency parameters, minimum microwave frequency parameters, maximum power parameters, minimum power parameters, single-scan frequency adjustment variables, and single-scan power adjustment variables of the microwave source, a scanning time function is constructed; based on the single-scan frequency adjustment variables and single-scan power adjustment variables, a measurement accuracy function is constructed; based on the scanning time function and the measurement accuracy function, an objective function is constructed.

[0202] In one embodiment, when the processor executes a computer program to construct a scan time function based on the maximum microwave frequency parameter, minimum microwave frequency parameter, maximum power parameter, minimum power parameter, single-scan frequency adjustment variable, and single-scan power adjustment variable of the microwave source, it also performs the following steps:

[0203] The ratio of the difference between the maximum and minimum microwave frequency parameters to the single-scan frequency adjustment variable is used as the first time function; and the ratio of the difference between the maximum and minimum power parameters to the single-scan power adjustment variable is used as the second time function; the product of the first time function and the second time function is used as the scan time function.

[0204] In one embodiment, when the processor executes a computer program to construct a measurement accuracy function based on a single-scan frequency adjustment variable and a single-scan power adjustment variable, it also performs the following steps:

[0205] The reciprocal of the single-scan frequency adjustment variable is used as the first precision function; and the reciprocal of the single-scan power adjustment variable is used as the second precision function; the product of the first precision function and the second precision function is used as the measurement precision function.

[0206] In one embodiment, when the processor executes a computer program based on a scanning function to perform multiple scans of the microwave source according to the microwave frequency range and the power range of each scan round, it also performs the following steps:

[0207] For each scanning cycle, determine the single-scan frequency adjustment step size and the single-scan power adjustment step size; based on the single-scan frequency adjustment step size and the single-scan power adjustment step size of the scanning cycle, scan the microwave source within the cycle power range and microwave frequency range to obtain the cycle scanning results.

[0208] In one embodiment, when the processor executes a computer program to determine the single-scan frequency adjustment step size and the single-scan power adjustment step size for a scan round, it also performs the following steps:

[0209] When the scan round is the first scan round, the minimum frequency adjustment step size is used as the single scan frequency adjustment step size for the scan round, and the minimum power adjustment step size is used as the single scan power adjustment step size for the scan round; wherein, the minimum frequency adjustment step size is determined according to the frequency adjustment step size requirement, and the minimum power adjustment step size is determined according to the power adjustment step size requirement; when the scan round is not the first scan round, the single scan frequency adjustment step size and single scan power adjustment step size for the scan round are determined according to the microwave frequency range, the scan round power range, the scan results of the previous scan round, and the scan function.

[0210] In one embodiment, when the processor executes a computer program to determine the single-scan frequency adjustment step size and single-scan power adjustment step size of a scanning round based on the microwave frequency range, the power range of the scanning round, the scanning result of the previous scanning round, and the scanning function, it also performs the following steps:

[0211] Based on the scanning results of the previous scan round and the constraint function that constrains the single scan frequency adjustment step size and single scan power adjustment step size, a population is generated. Each individual in the population includes a randomly generated initial scan frequency adjustment step size and an initial scan power adjustment step size. For each individual in the population, based on the scan function, the fitness of the individual is determined according to the microwave frequency range, the scan round power range, and the individual's initial scan frequency adjustment step size and initial scan power adjustment step size. The initial scan frequency adjustment step size corresponding to the individual with the lowest fitness is used as the single scan frequency adjustment step size for the scan round, and the initial scan power adjustment step size corresponding to the individual with the lowest fitness is used as the single scan power adjustment step size for the scan round.

[0212] In one embodiment, the constraint functions include a frequency constraint function that constrains the frequency adjustment step size for a single scan and a power constraint function that constrains the power adjustment step size for a single scan; the processor also implements the following steps when executing the computer program:

[0213] Based on the frequency adjustment step size requirement, determine the maximum and minimum frequency adjustment step sizes; based on the power adjustment step size requirement, determine the maximum and minimum power adjustment step sizes; based on the maximum and minimum frequency adjustment step sizes, construct the frequency constraint function; based on the maximum and minimum power adjustment step sizes, construct the power constraint function.

[0214] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, the computer program performing the following steps when executed by a processor:

[0215] In the process of implementing the programmable Josephson quantum voltage standard, the microwave frequency range and microwave power range of the microwave source are determined according to the voltage step width requirements of the Josephson array.

[0216] Based on the microwave power range, determine the power range of each scanning round during the multi-round scanning process of the microwave source;

[0217] Based on the scanning function, the microwave source is scanned multiple times according to the microwave frequency range and the power range of each scanning round; where the scanning function is a function characterizing the scanning time and the measurement accuracy of the quantum voltage step.

[0218] The width of the quantum voltage step of the Josephson array is determined based on the scan results of each scan round.

[0219] In one embodiment, the processor, when executing a computer program, also performs the following steps:

[0220] Based on the maximum microwave frequency parameters, minimum microwave frequency parameters, maximum power parameters, minimum power parameters, single-scan frequency adjustment variables, and single-scan power adjustment variables of the microwave source, a scanning time function is constructed; based on the single-scan frequency adjustment variables and single-scan power adjustment variables, a measurement accuracy function is constructed; based on the scanning time function and the measurement accuracy function, an objective function is constructed.

[0221] In one embodiment, when the processor executes a computer program to construct a scan time function based on the maximum microwave frequency parameter, minimum microwave frequency parameter, maximum power parameter, minimum power parameter, single-scan frequency adjustment variable, and single-scan power adjustment variable of the microwave source, it also performs the following steps:

[0222] The ratio of the difference between the maximum and minimum microwave frequency parameters to the single-scan frequency adjustment variable is used as the first time function; and the ratio of the difference between the maximum and minimum power parameters to the single-scan power adjustment variable is used as the second time function; the product of the first time function and the second time function is used as the scan time function.

[0223] In one embodiment, when the processor executes a computer program to construct a measurement accuracy function based on a single-scan frequency adjustment variable and a single-scan power adjustment variable, it also performs the following steps:

[0224] The reciprocal of the single-scan frequency adjustment variable is used as the first precision function; and the reciprocal of the single-scan power adjustment variable is used as the second precision function; the product of the first precision function and the second precision function is used as the measurement precision function.

[0225] In one embodiment, when the processor executes a computer program based on a scanning function to perform multiple scans of the microwave source according to the microwave frequency range and the power range of each scan round, it also performs the following steps:

[0226] For each scanning cycle, determine the single-scan frequency adjustment step size and the single-scan power adjustment step size; based on the single-scan frequency adjustment step size and the single-scan power adjustment step size of the scanning cycle, scan the microwave source within the cycle power range and microwave frequency range to obtain the cycle scanning results.

[0227] In one embodiment, when the processor executes a computer program to determine the single-scan frequency adjustment step size and the single-scan power adjustment step size for a scan round, it also performs the following steps:

[0228] When the scan round is the first scan round, the minimum frequency adjustment step size is used as the single scan frequency adjustment step size for the scan round, and the minimum power adjustment step size is used as the single scan power adjustment step size for the scan round; wherein, the minimum frequency adjustment step size is determined according to the frequency adjustment step size requirement, and the minimum power adjustment step size is determined according to the power adjustment step size requirement; when the scan round is not the first scan round, the single scan frequency adjustment step size and single scan power adjustment step size for the scan round are determined according to the microwave frequency range, the scan round power range, the scan results of the previous scan round, and the scan function.

[0229] In one embodiment, when the processor executes a computer program to determine the single-scan frequency adjustment step size and single-scan power adjustment step size of a scanning round based on the microwave frequency range, the power range of the scanning round, the scanning result of the previous scanning round, and the scanning function, it also performs the following steps:

[0230] Based on the scanning results of the previous scan round and the constraint function that constrains the single scan frequency adjustment step size and single scan power adjustment step size, a population is generated. Each individual in the population includes a randomly generated initial scan frequency adjustment step size and an initial scan power adjustment step size. For each individual in the population, based on the scan function, the fitness of the individual is determined according to the microwave frequency range, the scan round power range, and the individual's initial scan frequency adjustment step size and initial scan power adjustment step size. The initial scan frequency adjustment step size corresponding to the individual with the lowest fitness is used as the single scan frequency adjustment step size for the scan round, and the initial scan power adjustment step size corresponding to the individual with the lowest fitness is used as the single scan power adjustment step size for the scan round.

[0231] In one embodiment, the constraint functions include a frequency constraint function that constrains the frequency adjustment step size for a single scan and a power constraint function that constrains the power adjustment step size for a single scan; the processor also implements the following steps when executing the computer program:

[0232] Based on the frequency adjustment step size requirement, determine the maximum and minimum frequency adjustment step sizes; based on the power adjustment step size requirement, determine the maximum and minimum power adjustment step sizes; based on the maximum and minimum frequency adjustment step sizes, construct the frequency constraint function; based on the maximum and minimum power adjustment step sizes, construct the power constraint function.

[0233] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, performs the following steps:

[0234] In the process of implementing the programmable Josephson quantum voltage standard, the microwave frequency range and microwave power range of the microwave source are determined according to the voltage step width requirements of the Josephson array.

[0235] Based on the microwave power range, determine the power range of each scanning round during the multi-round scanning process of the microwave source;

[0236] Based on the scanning function, the microwave source is scanned multiple times according to the microwave frequency range and the power range of each scanning round; where the scanning function is a function characterizing the scanning time and the measurement accuracy of the quantum voltage step.

[0237] The width of the quantum voltage step of the Josephson array is determined based on the scan results of each scan round.

[0238] In one embodiment, the processor, when executing a computer program, also performs the following steps:

[0239] Based on the maximum microwave frequency parameters, minimum microwave frequency parameters, maximum power parameters, minimum power parameters, single-scan frequency adjustment variables, and single-scan power adjustment variables of the microwave source, a scanning time function is constructed; based on the single-scan frequency adjustment variables and single-scan power adjustment variables, a measurement accuracy function is constructed; based on the scanning time function and the measurement accuracy function, an objective function is constructed.

[0240] In one embodiment, when the processor executes a computer program to construct a scan time function based on the maximum microwave frequency parameter, minimum microwave frequency parameter, maximum power parameter, minimum power parameter, single-scan frequency adjustment variable, and single-scan power adjustment variable of the microwave source, it also performs the following steps:

[0241] The ratio of the difference between the maximum and minimum microwave frequency parameters to the single-scan frequency adjustment variable is used as the first time function; and the ratio of the difference between the maximum and minimum power parameters to the single-scan power adjustment variable is used as the second time function; the product of the first time function and the second time function is used as the scan time function.

[0242] In one embodiment, when the processor executes a computer program to construct a measurement accuracy function based on a single-scan frequency adjustment variable and a single-scan power adjustment variable, it also performs the following steps:

[0243] The reciprocal of the single-scan frequency adjustment variable is used as the first precision function; and the reciprocal of the single-scan power adjustment variable is used as the second precision function; the product of the first precision function and the second precision function is used as the measurement precision function.

[0244] In one embodiment, when the processor executes a computer program based on a scanning function to perform multiple scans of the microwave source according to the microwave frequency range and the power range of each scan round, it also performs the following steps:

[0245] For each scanning cycle, determine the single-scan frequency adjustment step size and the single-scan power adjustment step size; based on the single-scan frequency adjustment step size and the single-scan power adjustment step size of the scanning cycle, scan the microwave source within the cycle power range and microwave frequency range to obtain the cycle scanning results.

[0246] In one embodiment, when the processor executes a computer program to determine the single-scan frequency adjustment step size and the single-scan power adjustment step size for a scan round, it also performs the following steps:

[0247] When the scan round is the first scan round, the minimum frequency adjustment step size is used as the single scan frequency adjustment step size for the scan round, and the minimum power adjustment step size is used as the single scan power adjustment step size for the scan round; wherein, the minimum frequency adjustment step size is determined according to the frequency adjustment step size requirement, and the minimum power adjustment step size is determined according to the power adjustment step size requirement; when the scan round is not the first scan round, the single scan frequency adjustment step size and single scan power adjustment step size for the scan round are determined according to the microwave frequency range, the scan round power range, the scan results of the previous scan round, and the scan function.

[0248] In one embodiment, when the processor executes a computer program to determine the single-scan frequency adjustment step size and single-scan power adjustment step size of a scanning round based on the microwave frequency range, the power range of the scanning round, the scanning result of the previous scanning round, and the scanning function, it also performs the following steps:

[0249] Based on the scanning results of the previous scan round and the constraint function that constrains the single scan frequency adjustment step size and single scan power adjustment step size, a population is generated. Each individual in the population includes a randomly generated initial scan frequency adjustment step size and an initial scan power adjustment step size. For each individual in the population, based on the scan function, the fitness of the individual is determined according to the microwave frequency range, the scan round power range, and the individual's initial scan frequency adjustment step size and initial scan power adjustment step size. The initial scan frequency adjustment step size corresponding to the individual with the lowest fitness is used as the single scan frequency adjustment step size for the scan round, and the initial scan power adjustment step size corresponding to the individual with the lowest fitness is used as the single scan power adjustment step size for the scan round.

[0250] In one embodiment, the constraint functions include a frequency constraint function that constrains the frequency adjustment step size for a single scan and a power constraint function that constrains the power adjustment step size for a single scan; the processor also implements the following steps when executing the computer program:

[0251] Based on the frequency adjustment step size requirement, determine the maximum and minimum frequency adjustment step sizes; based on the power adjustment step size requirement, determine the maximum and minimum power adjustment step sizes; based on the maximum and minimum frequency adjustment step sizes, construct the frequency constraint function; based on the maximum and minimum power adjustment step sizes, construct the power constraint function.

[0252] It should be noted that the data involved in this application (including but not limited to data used for analysis, data stored, data displayed, etc.) are all information and data that have been fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0253] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium. When executed, the computer program can include the processes of the embodiments described above. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, etc., and are not limited to these.

[0254] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0255] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A method for measuring the width of a quantum voltage step, characterized in that, The method includes: In the process of implementing the programmable Josephson quantum voltage standard, the microwave frequency range and microwave power range of the microwave source are determined according to the voltage step width requirements of the Josephson array. Based on the microwave power range, determine the power range of each scanning round during the multi-round scanning process of the microwave source; Based on the scanning function, the microwave source is scanned multiple times according to the microwave frequency range and the power range of each scanning round; wherein, the scanning function is a function characterizing the scanning time and the accuracy of quantum voltage step measurement; The quantum voltage step width of the Josephson array is determined based on the scan results of each scan round. The scan function is constructed in the following way: Based on the maximum microwave frequency parameter, minimum microwave frequency parameter, maximum power parameter, minimum power parameter, single scan frequency adjustment variable, and single scan power adjustment variable of the microwave source, construct the scan time function; A measurement accuracy function is constructed based on the single-scan frequency adjustment variable and the single-scan power adjustment variable; Based on the scan time function and the measurement accuracy function, a target function is constructed.

2. The method according to claim 1, characterized in that, The step of constructing a scan time function based on the maximum microwave frequency parameter, minimum microwave frequency parameter, maximum power parameter, minimum power parameter, single-scan frequency adjustment variable, and single-scan power adjustment variable of the microwave source includes: The ratio of the difference between the maximum microwave frequency parameter and the minimum microwave frequency parameter to the single-scan frequency adjustment variable is used as a first time function; and... The ratio of the difference between the maximum power parameter and the minimum power parameter to the single-scan power adjustment variable is used as the second time function. The product of the first time function and the second time function is used as the scan time function.

3. The method according to claim 1, characterized in that, The step of constructing the measurement accuracy function based on the single-scan frequency adjustment variable and the single-scan power adjustment variable includes: The reciprocal of the single-scan frequency adjustment variable is used as the first precision function; and, The reciprocal of the single-scan power adjustment variable is used as the second precision function; The product of the first accuracy function and the second accuracy function is used as the measurement accuracy function.

4. The method according to claim 1, characterized in that, The step of performing multiple scans of the microwave source based on the scanning function, according to the microwave frequency range and the power range of each scan round, includes: For each scanning cycle, determine the single scan frequency adjustment step size and the single scan power adjustment step size for that scanning cycle; Based on the single-scan frequency adjustment step size and single-scan power adjustment step size of the scanning round, the microwave source is scanned within the power range and microwave frequency range of the round to obtain the round scanning result of the scanning round.

5. The method according to claim 4, characterized in that, The determination of the single-scan frequency adjustment step size and single-scan power adjustment step size for the scan cycle includes: When the scan round is the first scan round, the minimum frequency adjustment step size is used as the single scan frequency adjustment step size of the scan round, and the minimum power adjustment step size is used as the single scan power adjustment step size of the scan round; wherein, the minimum frequency adjustment step size is determined according to the frequency adjustment step size requirement, and the minimum power adjustment step size is determined according to the power adjustment step size requirement. When the scan round is not the first scan round, the single scan frequency adjustment step size and single scan power adjustment step size of the scan round are determined based on the microwave frequency range, the scan power range of the scan round, the scan result of the previous scan round, and the scan function.

6. The method according to claim 5, characterized in that, The step of determining the single-scan frequency adjustment step size and single-scan power adjustment step size of the scanning cycle based on the microwave frequency range, the cycle power range of the scanning cycle, the scanning result of the previous scanning cycle, and the scanning function includes: Based on the scanning results of the previous scanning round and the constraint function that constrains the single scan frequency adjustment step size and the single scan power adjustment step size, a population is generated; wherein, each individual in the population includes a randomly generated initial scan frequency adjustment step size and an initial scan power adjustment step size. For each individual in the population, the fitness of the individual is determined based on the scanning function, the microwave frequency range, the power range of the scanning rounds, and the initial scanning frequency adjustment step size and the initial scanning power adjustment step size of the individual. The initial scan frequency adjustment step size corresponding to the individual with the lowest fitness is used as the single scan frequency adjustment step size of the scan round, and the initial scan power adjustment step size corresponding to the individual with the lowest fitness is used as the single scan power adjustment step size of the scan round.

7. The method according to claim 6, characterized in that, The constraint functions include a frequency constraint function that constrains the frequency adjustment step size for a single scan and a power constraint function that constrains the power adjustment step size for a single scan; the constraint functions are constructed in the following manner: Based on the frequency adjustment step size requirements, determine the maximum and minimum frequency adjustment step sizes; Determine the maximum power adjustment step size and the minimum frequency adjustment step size based on the power adjustment step size requirements; The frequency constraint function is constructed based on the maximum frequency adjustment step size and the minimum frequency adjustment step size; The power constraint function is constructed based on the maximum power adjustment step size and the minimum frequency adjustment step size.

8. A device for measuring the width of a quantum voltage step, characterized in that, The device includes: The first determining module is used to determine the microwave frequency range and microwave power range of the microwave source according to the voltage step width requirement of the Josephson array during the implementation of the programmable Josephson quantum voltage standard. The second determining module is used to determine the power range of each scanning round during the multi-round scanning process of the microwave source based on the microwave power range. A multi-round scanning module is used to perform multiple rounds of scanning on the microwave source based on a scanning function, according to the microwave frequency range and the power range of each scanning round; wherein, the scanning function is a function characterizing the scanning time and the accuracy of quantum voltage step measurement; The width determination module is used to determine the quantum voltage step width of the Josephson array based on the scan results of each scan round; The function construction module is used to construct a scan time function based on the maximum microwave frequency parameter, minimum microwave frequency parameter, maximum power parameter, minimum power parameter, single scan frequency adjustment variable, and single scan power adjustment variable of the microwave source; construct a measurement accuracy function based on the single scan frequency adjustment variable and the single scan power adjustment variable; and construct a target function based on the scan time function and the measurement accuracy function.

9. The apparatus according to claim 8, characterized in that, The multi-round scanning module includes: The step size adjustment unit is used to determine the single scan frequency adjustment step size and single scan power adjustment step size for each scan cycle. The scanning unit is used to adjust the step size of the single frequency and the single scan power according to the scanning round, and to scan the microwave source within the power range and frequency range of the round to obtain the scanning results of the scanning round.

10. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 7.

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