一种低应力玻璃基板与重布线层的封装结构

By setting stress relief grooves and local bridging structures on the glass substrate, the warping problem caused by the difference in thermal expansion coefficients is solved, achieving high stability and efficient signal transmission, and improving the reliability and yield of the packaging structure.

CN120565546BActive Publication Date: 2026-07-17AALTOSEMI INC

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
AALTOSEMI INC
Filing Date
2025-06-06
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Traditional packaging solutions suffer from warping due to the difference in thermal expansion coefficients between the substrate material and the metal wires, which affects transmission stability and signal efficiency. Furthermore, the multi-layer stacked structure results in low yield.

Method used

A combination structure of high-rigidity glass substrate and stress relief groove is adopted. By setting stress relief grooves with a width of 1 to 50 μm on the outside of the dielectric layer, thermal stress is dispersed, and the interconnection layer is simplified by using a local bridging structure.

Benefits of technology

It effectively reduces substrate warpage, improves signal transmission stability and efficiency, enhances packaging reliability and yield, and simplifies manufacturing processes.

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Abstract

本发明公开了一种低应力玻璃基板与重布线层的封装结构,包括:玻璃基板;介质层,设置于所述玻璃基板的上表面;至少两个芯片,设置于所述介质层的上表面,且至少两个所述芯片相互之间进行连接;所述芯片的连接区域位于所述介质层的两侧;多个应力释放槽,设置于所述介质层中,且位于所述芯片的连接区域外侧;所述应力释放槽的深度延伸至所述玻璃基板层表面,其宽度为1~50μm;本申请通过在介质层的芯片连接区域外侧设置宽度为1~50μm且延伸至玻璃基板表面的应力释放槽,有效分散热应力集中,减少基板翘曲变形和互连线路失效风险;同时介质层表面设置的表层线路简化互连层级,从而起到提升封装可靠性和制造良率的作用。
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