一种对数检波器的灵敏度的测量方法以及FT测试系统
By determining the ideal curve and design verification data of the logarithmic detector, the sensitivity of the logarithmic detector is quickly measured using the FT test system, which solves the problem of slow testing speed in the prior art and realizes rapid and accurate sensitivity measurement and cost reduction.
CN120577753BActive Publication Date: 2026-07-17SHANGHAI ARCHIWAVE MICROELECTRONICS CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI ARCHIWAVE MICROELECTRONICS CO LTD
- Filing Date
- 2025-06-30
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Existing methods for measuring the sensitivity of logarithmic detectors are slow, inefficient, and cannot quickly and accurately calibrate the sensitivity.
Method used
By determining the ideal logarithmic detection curve of the logarithmic detector, measuring the first detection voltage under no input power, calculating the sensitivity error by combining the ideal curve and design verification data, and quickly measuring the sensitivity using an FT test system.
Benefits of technology
It simplifies the testing process, improves measurement efficiency, reduces testing costs, and enables rapid and accurate measurement of the sensitivity of logarithmic detectors.
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Figure CN120577753B_ABST
Abstract
本申请提供了一种对数检波器的灵敏度的测量方法，包括：步骤S1，确定所述对数检波器的理想对数检波曲线，所述曲线函数为y＝ax+b，其中y为检波电压，x为输入所述对数检波器的输入功率，a为所述理想对数检波曲线的斜率，b为偏置常数；步骤S2，测量所述对数检波器在无输入功率时输出的第一检波电压；步骤S3，根据所述理想对数检波曲线确定在所述第一检波电压下对应的第一输入功率，所述第一输入功率作为待校准灵敏度；步骤S4，确定所述对数检波器可接受的对数误差点下的第二输入功率，所述第一输入功率与第二输入功率之差为灵敏度误差；步骤S5，确定所述灵敏度为：所述待校准灵敏度减去所述灵敏度误差。
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