等离子体激发原子、分子发射光谱与质谱结合的金属化合物检测装置和方法
By combining plasma-excited atomic and molecular emission spectroscopy with mass spectrometry, and using arc plasma as both an excitation and ion source, the limitations of traditional spectroscopy and mass spectrometry in the detection of organometallic compounds are overcome, enabling efficient non-targeted screening and precise analysis.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- ZHEJIANG UNIV
- Filing Date
- 2025-06-24
- Publication Date
- 2026-07-17
AI Technical Summary
Traditional spectroscopic techniques cannot resolve molecular structures or differences in organic/inorganic forms, and mass spectrometry struggles to preserve elemental information, thus limiting the accurate identification of novel or unknown organometallic pollutants and the assessment of their environmental risks.
By combining plasma-excited atomic and molecular emission spectroscopy with mass spectrometry, and using arc plasma as the excitation source for emission spectroscopy and the ion source for mass spectrometry, online detection of the atomic and molecular emission spectra and molecular weights of compounds can be achieved.
It improves the analytical dimensions and accuracy of organometallic compound detection, enables rapid identification of multiple organometallic compounds in non-targeted samples, and is suitable for precise analysis of complex environmental systems.
Smart Images
Figure CN120629125B_ABST