A method for determining a chip screening specification, a storage medium and an electronic device

Abstract

Embodiments of the present application provide a chip screening specification determination method, a storage medium and an electronic device, wherein the method comprises: obtaining statistical distributions of sensitive parameters of a sample of a chip to be screened in a burn-in BI experiment and an accelerated life test ALT respectively; extracting feature quantities of the statistical distributions in the BI experiment and the ALT respectively; determining a screening specification of the chip to be screened based on a comparison result of the feature quantities of the BI experiment and the ALT, solving the problem that early failure chip products are ignored or misjudged in chip degradation scenarios in related technologies, and enabling more accurate chip screening specifications to be obtained in degradation scenarios.

Description

Technical Field

[0001] The present invention relates to the field of chips, and more specifically, to a method for determining chip screening specifications, a storage medium, and an electronic device. Background Technology

[0002] Early failure screening technology relies more on large-scale burn-in (BI) experiments combined with final test (FT) screening tests for post-test judgment. By performing accelerated life test (ALT) on some chips to cover the early failure stage in advance, products (chips) with premature failure defects are identified and then sorted through functional tests.

[0003] As chip size and complexity increase, early failures may no longer manifest as a complete or partial loss of chip functionality, but rather as a relatively large performance degradation. In other words, early failure risks are hidden in chip performance degradation scenarios, which existing early failure screening technologies are prone to overlooking or misjudging.

[0004] There is currently no solution to the problem of overlooking or misjudging early-failure chip products in chip degradation scenarios in related technologies. Summary of the Invention

[0005] This invention provides a method, storage medium, and electronic device for determining chip screening specifications, in order to at least solve the problem of neglecting or misjudging early-failure chip products in related technologies under chip degradation scenarios.

[0006] According to an embodiment of the present invention, a method for determining chip screening specifications is provided, comprising:

[0007] The statistical distribution of the sensitivity parameters of the chips to be screened in the aging BI experiment and accelerated life experiment ALT were obtained respectively.

[0008] Extract the feature quantities of the statistical distributions of the BI experiment and the ALT, respectively;

[0009] The screening specifications of the chips to be screened are determined based on the comparison results of the BI experiment and the ALT feature quantities.

[0010] According to yet another embodiment of the present invention, a computer-readable storage medium is also provided, wherein a computer program is stored therein, wherein the computer program is configured to perform the steps in any of the above method embodiments when executed.

[0011] According to yet another embodiment of the present invention, an electronic device is also provided, including a memory and a processor, wherein the memory stores a computer program and the processor is configured to run the computer program to perform the steps in any of the above method embodiments.

[0012] By using this invention, the statistical distribution of sensitive parameters of the chips to be screened in the aging BI experiment and accelerated life test ALT is obtained respectively; feature quantities of the statistical distributions of the BI experiment and the ALT are extracted respectively; and the screening specifications of the chips to be screened are determined based on the comparison results of the feature quantities of the BI experiment and the ALT. This can solve the problem of neglecting or misjudging early failure chip products in chip degradation scenarios in related technologies, and can obtain more accurate chip screening specifications in degradation scenarios. Attached Figure Description

[0013] Figure 1 This is a hardware structure block diagram of a computer terminal for a chip screening specification determination method according to an embodiment of the present invention.

[0014] Figure 2 This is a flowchart of a method for determining chip screening specifications according to an embodiment of the present invention;

[0015] Figure 3 This is a flowchart illustrating the statistical distribution of sensitive parameters of chip samples in BI and ALT experiments, respectively, according to an embodiment of the present invention.

[0016] Figure 4 The distribution of sensitive parameters according to embodiments of the present invention Figure 1 ;

[0017] Figure 5 The distribution of sensitive parameters according to embodiments of the present invention Figure 2 ;

[0018] Figure 6 This is a detailed flowchart of a method for determining chip screening specifications according to an embodiment of the present invention;

[0019] Figure 7 This is a flowchart illustrating chip screening during the mass production screening stage, including BI experiments, according to an embodiment of the present invention.

[0020] Figure 8 This is a flowchart illustrating chip screening during the mass production screening stage without BI experiments, according to an embodiment of the present invention.

[0021] Figure 9 The distribution of sensitive parameters according to embodiments of the present invention Figure 3 ;

[0022] Figure 10The distribution of sensitive parameters according to embodiments of the present invention Figure 4 . Detailed Implementation

[0023] The embodiments of the present invention will be described in detail below with reference to the accompanying drawings and examples.

[0024] It should be noted that the terms "first," "second," etc., in the specification, claims, and drawings of this invention are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0025] The methods and embodiments provided in this application can be executed on a computer terminal or similar computing device. Taking running on a computer terminal as an example, Figure 1 This is a hardware structure block diagram of a computer terminal for a chip screening specification determination method according to an embodiment of the present invention. Figure 1 As shown, a computer terminal may include one or more ( Figure 1 Only one is shown in the diagram. A processor 102 (which may include, but is not limited to, a microprocessor MCU or a programmable logic device FPGA, etc.) and a memory 104 for storing data are also shown. The computer terminal may further include a transmission device 106 for communication functions and an input / output device 108. Those skilled in the art will understand that... Figure 1 The structure shown is for illustrative purposes only and does not limit the structure of the computer terminal described above. For example, the computer terminal may also include components that are more complex than those described above. Figure 1 The more or fewer components shown, or having the same Figure 1 The different configurations shown.

[0026] The memory 104 can be used to store computer programs, such as application software programs and modules, like the computer program corresponding to a chip screening specification determination method in this embodiment of the invention. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, thereby implementing the aforementioned method. The memory 104 may include high-speed random access memory and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 104 may further include memory remotely located relative to the processor 102, and these remote memories can be connected to a computer terminal via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0027] The transmission device 106 is used to receive or send data via a network. Specific examples of the network described above may include a wireless network provided by a communication provider for the computer terminal. In one example, the transmission device 106 includes a Network Interface Controller (NIC), which can connect to other network devices via a base station to communicate with the Internet. In another example, the transmission device 106 may be a Radio Frequency (RF) module used for wireless communication with the Internet.

[0028] This embodiment provides a method for determining chip screening specifications that runs on the aforementioned computer terminal. Figure 2 This is a flowchart of a method for determining chip screening specifications according to an embodiment of the present invention, such as... Figure 2 As shown, the process includes the following steps:

[0029] Step S202: Obtain the statistical distribution of the sensitive parameters of the chips to be screened in the aging BI experiment and accelerated life experiment ALT, respectively.

[0030] In this embodiment, before step S202 above, the method further includes experimental condition preparation, including at least one of the following steps: chip design, chip testing, chip sample preparation, BI experimental condition preparation, ALT condition preparation, and Design of Experiments (DOE) formulation.

[0031] In this embodiment, Figure 3 This is a flowchart illustrating the statistical distribution of sensitive parameters of chip samples in BI and ALT experiments according to an embodiment of the present invention, as shown below. Figure 3 As shown, step S202 above may specifically include:

[0032] Step S302: Perform the BI experiment and the ALT experiment on the sample respectively;

[0033] Performing ALT and BI experiments on chip samples is to accurately reflect the distribution of sensitive parameters under long-term and early-term chip lifespan. The method in this embodiment of the invention is compatible with the differences between different chips, experimental equipment, and reliability experimental schemes. For the experimental conditions of ALT and BI, only the consistency of the experimental environment and sample source for ALT and BI is required; other conditions are not restricted.

[0034] Step S304: Collect the sensitivity parameters of the sample in the BI experiment and the ALT experiment, respectively;

[0035] In this embodiment, the sensitive parameters include test parameters characterizing the chip degradation process. Specifically, the sensitive parameters increase with aging time.

[0036] Specifically, step S304 may include: selecting sensitive parameters and collecting their values ​​before, during, and after the BI and ALT experiments. The purpose and principle of selecting sensitive parameters is to ensure that the acquired test parameters can effectively characterize the degradation path of the chip to be screened.

[0037] For chips: 1. Under normal circumstances, the distribution boundary of sensitive parameters under long-term lifetime is larger than that under early-term lifetime. In this case, the degradation path of sensitive parameters under early-term lifetime can be considered normal, and the risk of early failure caused by defects is relatively small. 2. Since the ALT sample excludes samples with early failure, it can be considered that ALT directly reflects the statistical characteristics of sensitive parameters under long-term lifetime conditions dominated by the intrinsic failure mechanism of the product. If the distribution boundary of sensitive parameters under early-term lifetime is larger than that under long-term lifetime, the subset of samples exceeding this boundary can be considered to have the risk of early failure. In this embodiment, the samples used for ALT are those that exclude samples with early failure.

[0038] Step S306: Determine the statistical distribution of the sensitivity parameters of the BI experiment and the ALT based on the sensitivity parameters.

[0039] The distributions of the sensitivity parameters of the BI experiment and the ALT were fitted based on the acquired sensitivity parameters.

[0040] Step S204: Extract the feature quantities of the statistical distribution of the BI experiment and the ALT, respectively;

[0041] In this embodiment, the feature quantity includes at least one of the following: maximum value, 6-sigma value. Specifically, the feature quantity can be selected according to the actual chip performance characterization needs. The 6-sigma value represents the interval that is 6 standard deviations away from the mean in a statistical distribution.

[0042] Step S206: Determine the screening specifications of the chip to be screened based on the comparison results of the BI experiment and the ALT feature quantities.

[0043] Through steps S202 to S206 above, based on two different types of reliability tests, ALT and BI tests, the statistical distribution of sensitive parameters under long-term and early-term lifespan of the chip is obtained respectively. By comparing the characteristic quantities of the statistical distributions of the two types of tests, a screening specification more suitable for the chip in chip degradation scenarios is obtained. This solves the problem of neglecting or misjudging chip products with early failure in chip degradation scenarios in related technologies, and can obtain more accurate chip screening specifications in degradation scenarios.

[0044] Meanwhile, since early failure leakage can lead to yield loss in chip mass production, the overall cost of chip production becomes unbearably high. The solution of this invention can obtain more accurate chip screening specifications, can provide early warning and identify chip products with potential early failure risks, can reduce chip production costs, and can ensure and improve chip reliability.

[0045] Due to the diversification of early failure mechanisms, especially the neglect and misjudgment in degradation scenarios, the original chip mass production screening specifications or functional test specifications are no longer applicable and need to be adjusted and tightened. The solution of this invention provides a chip screening specification in degradation scenarios, which tightens the Sign-Off standard.

[0046] The solutions of this invention are applicable to reliability screening of any chip product, especially automotive-grade chip products that are sensitive to early failures.

[0047] In one embodiment, step S206 may specifically include: if the feature value of the BI experiment is less than or equal to the feature value of the ALT, then the feature value of the ALT is used as the screening specification.

[0048] When the distribution boundary of the sensitive parameter under long-term lifetime is greater than that under early lifetime, it can be considered that the degradation path under early lifetime is not abnormal and the risk of early failure caused by defects is small. In this case, the boundary of the sensitive parameter under long-term lifetime should be used as the new screening specification.

[0049] Figure 4 The distribution of sensitive parameters according to embodiments of the present invention Figure 1 Where P_raw_spec is the initial screening specification for sensitive parameters, ΔP is the difference between the screening specifications P_BI_spec and P_raw_spec in the BI mass production experiment, and P_ALT_max is the feature value of ALT, such as... Figure 4 As shown, when P_BI_max ≤ P_ALT_max, P_BI_spec, P_raw_spec, and ΔP satisfy the following formula:

[0050] P_BI_spec = P_raw_spec - ΔP;

[0051] ΔP = P_raw_spec - P_ALT_max;

[0052] In summary, when P_BI_max ≤ P_ALT_max, P_BI_spec = P_ALT_max. That is, under the condition that P_BI_max ≤ P_ALT_max, choosing P_ALT_max as the new P_BI_spec is sufficient to cover the screening application of degradation-type premature defects in BI mass production experiments.

[0053] In one embodiment, step S206 further includes: when the feature quantity of the BI experiment is greater than the feature quantity of the ALT, determining the interval where early failure exists, and determining the screening specification in the interval.

[0054] Since the ALT sample excludes samples with early failures, it can be assumed that the ALT directly reflects the characteristics of sensitive parameters under long-term lifetime conditions dominated by the chip's intrinsic failure mechanism. If the distribution boundary of sensitive parameters under early lifetime conditions is larger than that under long-term lifetime conditions, then the subset of samples exceeding this boundary can be considered to have a risk of early failure, and new screening specifications need to be determined for the excess portion.

[0055] Figure 5 The distribution of sensitive parameters according to embodiments of the present invention Figure 2 ,like Figure 5 As shown, when P_BI_max > P_ALT_max, the sensitive parameters of early failed samples may fall in the interval (P_ALT_max, P_BI_max). Therefore, it is necessary to determine a new screening specification in the interval (P_ALT_max, P_BI_max).

[0056] In one embodiment, determining the screening specification in the interval includes: if there are samples with early failures in the interval, using the value of the sensitive parameter corresponding to the sample as the screening specification; if there are no samples with early failures in the interval, using the feature quantity of the BI experiment as the screening specification of the chip.

[0057] Specifically, failure analysis is performed on samples with sensitive parameters at (P_ALT_max, P_BI_max) to determine whether early failure exists. If it exists, the sensitive parameter corresponding to the sample is recorded as P_BI_threshold, and P_BI_spec = P_BI_threshold. If it does not exist, that is, there are no samples with early failure at (P_ALT_max, P_BI_max), and P_BI_spec = P_BI_max.

[0058] In summary, when P_BI_max > P_ALT_max,

[0059] In one embodiment, step S206 may further include: setting a variable value in the interval, integrating the density function of the sensitive parameter of the BI experiment over the interval from the variable value to the characteristic quantity of the BI experiment to obtain an integral function, calculating the variable value when the function value of the integral function is equal to a set threshold, and using the variable value as the screening specification, wherein the set threshold is a set early failure rate.

[0060] Specifically, define the variable value P_BI_threshold, set the early failure rate (EFR), and integrate the density function f(p) of the sensitivity parameter P of the BI experiment over the interval (P_BI_threshold, P_BI_max), where p is the value of the sensitivity parameter P. Calculate P_BI_threshold when the function value of the integral function equals EFR, then P_BI_spec = P_BI_threshold.

[0061] Figure 6 This is a detailed flowchart of a method for determining chip screening specifications according to an embodiment of the present invention, as follows: Figure 6 As shown, the process includes the following steps:

[0062] Step S601, Preparation of experimental conditions;

[0063] Step S602: Perform ALT and BI tests respectively;

[0064] Step S603, Sensitive parameter collection;

[0065] Reliability data were collected before and after the ALT and BI tests, respectively, to characterize the degradation path and statistical distribution of the sensitive parameters.

[0066] Step S604, Degenerate Distribution;

[0067] Based on reliability test data, the distribution of sensitive parameters of ALT and BI before and after aging were fitted.

[0068] Step S605, Compare;

[0069] By combining the distributions of sensitive parameters obtained from ALT and BI tests under long-term and short-term lifetimes, a binary distribution comparison is performed to plan the BI sieve specifications.

[0070] Step S606, Burn-in sieve specification correction;

[0071] A precise threshold (i.e., BI sieve specification) is obtained based on step S605.

[0072] Step S607, small batch screening;

[0073] Based on the BI sieve specifications established in steps S602-S605, the sieve test is conducted before formal mass production, simulating the online use scenario of the product and lasting for a period of time, and the sample size is expanded compared to the BI test in step S602.

[0074] Step S608, yield feedback;

[0075] If the yield of small-batch sieves implemented based on the sieve specifications defined in steps S602-S605 is found to be unsatisfactory, return to step S606 for correction.

[0076] It should be noted that steps S607-S608 are for a secondary fine-tuning of the Bi sieve specifications extracted in steps S604-S606 based on the product's online usage data. If no additional BI experimental screening is performed on the mass-produced sieves in step S609, these steps can be omitted.

[0077] Step S609: Mass production of sieve plates.

[0078] In one embodiment, the method further includes: if the mass production screening stage of the chip to be screened includes the BI experiment, screening the chip to be screened using the screening specifications.

[0079] Figure 7 This is a flowchart illustrating chip screening during the mass production screening stage, including BI experiments, according to an embodiment of the present invention. Figure 7 As shown, the process includes:

[0080] Step S701, Sample production;

[0081] Step S702, BI experiment;

[0082] Step S703, Functional testing;

[0083] Step S704, Failure determination;

[0084] As can be seen from the steps in the above method,

[0085] When P_BI_max ≤ P_ALT_max, P_BI_spec = P_ALT_max;

[0086] When P_BI_max > P_ALT_max, P_BI_spec = P_BI_threshold.

[0087] It should be noted that when using failure analysis methods, there is a special case under the condition that P_BI_max > P_ALT_max, namely, when there are no early failure samples on (P_ALT_max, P_BI_max), P_BI_spec = P_BI_max.

[0088] The test results of the chip are screened using the above screening specification P_BI_spec. If the screening is passed, i.e., the failure is not determined, then proceed to step S705; otherwise, proceed to step S706.

[0089] Step S705, sample grading bin;

[0090] For chips that meet the above sieve specifications, they are determined to have no risk of early failure. Further assessment is then conducted to determine if there are any other performance defects and to classify them accordingly.

[0091] Step S706: Chip online; process ends.

[0092] If there are no other performance defects, the chip will be put into production.

[0093] Step S707: Failure and scrapping.

[0094] Chips that do not meet the above sieve specifications are judged to be early failures, scrapped, and the process ends.

[0095] In one embodiment, the method further includes:

[0096] In the absence of the BI experiment during the mass production screening stage of the chip to be screened, the screening specification is subtracted from the difference to obtain a revised value. The screening specification is updated using the revised value, and the chip to be screened is screened using the updated screening specification. The difference is the difference in the sensitive parameters of the sample before and after the BI experiment.

[0097] Figure 8 This is a flowchart illustrating chip screening during the mass production screening stage, excluding BI experiments, according to an embodiment of the present invention. Figure 8 As shown, the process includes:

[0098] Step S801, Sample production;

[0099] Step S802, Functional testing;

[0100] Step S803, Failure determination;

[0101] Compared to step S704 above, if the mass production screening stage does not include the BI experiment, then the degradation amount Δp of the sensitive parameter after the BI experiment needs to be calculated in advance. ′Compensation is performed, where Δp ′ Δp is the difference between the value of the sensitivity parameter P_BI before the BI experiment and the value of the sensitivity parameter P_BI′ after the experiment. ′ =P_BI-P_BI′.

[0102] The above step S803 specifically includes: subtracting the difference from the screening specification to obtain a revision value, updating the screening specification using the revision value, and if the screening passes, i.e. the failure determination is not, then proceeding to step S804; otherwise, proceeding to step S806.

[0103] Figure 9 The distribution of sensitive parameters according to embodiments of the present invention Figure 3 ,like Figure 9 As shown,

[0104] If P_BI_max ≤ P_ALT_max, then P_BI_spec, ΔP, and Δp ′ Satisfy the following formula:

[0105] ΔP = P_raw_spec - P_ALT_max;

[0106] P_BI_spec=P_raw_spec-ΔP-Δp ′ ;

[0107] Therefore, P_BI_spec = P_ALT_max - Δp ′ .

[0108] Figure 10 The distribution of sensitive parameters according to embodiments of the present invention Figure 4 ,like Figure 10 As shown,

[0109] If P_BI_max > P_ALT_max, then P_BI_spec, ΔP, and Δp ′ Satisfy the following formula:

[0110] ΔP=P_raw_spec-P_BI_theshold;

[0111] P_BI_spec=P_raw_spec-ΔP-Δp ′ ;

[0112] Therefore, P_BI_spec = P_BI_theshold - Δp ′ .

[0113] In conclusion:

[0114] When P_BI_max ≤ P_ALT_max, P_BI_spec = P_ALT_max - Δp ′ ;

[0115] When P_BI_max > P_ALT_max, P_BI_spec = P_BI_theshold - Δp ′ .

[0116] It should be noted that when using failure analysis methods, under the condition that P_BI_max > P_ALT_max, there is a special case: when there are no early failure samples on (P_ALT_max, P_BI_max), then P_BI_spec = P_BI_max - Δp ′ .

[0117] Therefore, P_BI_spec (excluding BI experiments during the mass production screening phase) = P_BI_spec (including BI experiments during the mass production screening phase) - Δp ′ .

[0118] Step S804: Samples are divided into bins;

[0119] For chips that meet the above sieve specifications, they are determined to have no risk of early failure, and further assessment is needed to determine whether there are other performance defects or to classify them.

[0120] Step S805: Chip online; process ends.

[0121] If there are no other performance defects, the chip will be put into production.

[0122] Step S806: Failure and scrapping.

[0123] Chips that do not meet the above sieve specifications are judged to be early failures, scrapped, and the process ends.

[0124] The screening specifications provided in this embodiment of the invention do not have special requirements for whether or not BI experiments are included in the mass production stage, which provides a certain degree of flexibility for the overall BI screening scheme and can reduce testing costs.

[0125] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods according to the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal device (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of the present invention.

[0126] Embodiments of the present invention also provide a computer-readable storage medium storing a computer program, wherein the computer program is configured to perform the steps in any of the above method embodiments when executed.

[0127] In one exemplary embodiment, the aforementioned computer-readable storage medium may include, but is not limited to, various media capable of storing computer programs, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard disk, magnetic disk, or optical disk.

[0128] Embodiments of the present invention also provide an electronic device including a memory and a processor, the memory storing a computer program and the processor being configured to run the computer program to perform the steps in any of the above method embodiments.

[0129] In one exemplary embodiment, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor and the input / output device is connected to the processor.

[0130] Specific examples in this embodiment can be found in the examples described in the above embodiments and exemplary implementations, and will not be repeated here.

[0131] It is obvious to those skilled in the art that the modules or steps of the present invention described above can be implemented using general-purpose computing devices. They can be centralized on a single computing device or distributed across a network of multiple computing devices. They can be implemented using computer-executable program code, and thus can be stored in a storage device for execution by a computing device. In some cases, the steps shown or described can be performed in a different order than those described herein, or they can be fabricated as separate integrated circuit modules, or multiple modules or steps can be fabricated as a single integrated circuit module. Thus, the present invention is not limited to any particular combination of hardware and software.

[0132] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, or improvements made within the principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A method for determining chip screening specifications, characterized in that, include: The statistical distribution of the sensitivity parameters of the chips to be screened in the aging BI experiment and accelerated life experiment ALT were obtained respectively. Extract the feature quantities of the statistical distributions of the BI experiment and the ALT, respectively; If the feature value of the BI experiment is less than or equal to the feature value of the ALT, the feature value of the ALT shall be used as the screening specification. If the feature value of the BI experiment is greater than the feature value of the ALT, an interval where early failure exists is determined, and the screening specification is determined in the interval. The process of obtaining the statistical distribution of the sensitivity parameters of the chip samples to be screened in the aging BI experiment and the accelerated life test ALT includes: performing the BI experiment and the ALT on the samples respectively; collecting the sensitivity parameters of the samples in the BI experiment and the ALT respectively; and determining the statistical distribution of the sensitivity parameters of the BI experiment and the ALT based on the sensitivity parameters.

2. The method according to claim 1, characterized in that, Determining the screening specifications within the specified range includes: If there are samples that fail early in the specified interval, the value of the sensitive parameter corresponding to the sample is used as the screening specification. If there are no early-failure samples in the specified interval, the feature quantity of the BI experiment will be used as the screening specification.

3. The method according to claim 1, characterized in that, Determining the screening specifications within the specified range includes: A variable value is set in the specified interval. An integral function is obtained by integrating the density function of the sensitive parameter of the BI experiment over the interval from the variable value to the characteristic quantity of the BI experiment. The variable value is calculated when the function value of the integral function is equal to a set threshold. The variable value is used as the screening specification, wherein the set threshold is the set early failure rate.

4. The method according to any one of claims 1-3, characterized in that, The method further includes: When the mass production screening stage of the chip to be screened includes the BI experiment, the chip to be screened is screened using the screening specifications.

5. The method according to any one of claims 1-3, characterized in that, The method further includes: In the absence of the BI experiment during the mass production screening stage of the chip to be screened, the screening specification is subtracted from the difference to obtain a revised value. The screening specification is updated using the revised value, and the chip to be screened is screened using the updated screening specification. The difference is the difference in the sensitive parameters of the sample before and after the BI experiment.

6. The method according to claim 1, characterized in that, The sensitive parameters include test parameters that characterize the chip degradation process.

7. The method according to claim 1, characterized in that, The characteristic quantity includes at least one of the following: maximum value, 6-sigma value.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program, wherein when the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 3, or implements the steps of the method according to any one of claims 6 to 7.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the method described in any one of claims 1 to 3, or the steps of the method described in any one of claims 6 to 7.

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