纳米晶继电器耐压测试装置
By designing a nanocrystalline relay withstand voltage testing device with a streamlined transmission and fast-disconnecting debounce mechanism, the problem of low automation level was solved, and efficient and reliable relay testing was achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- HUNAN SANYI PRECISION TECH CO LTD
- Filing Date
- 2025-06-12
- Publication Date
- 2026-07-17
AI Technical Summary
Existing nanocrystalline relay withstand voltage testing devices have low automation, low testing efficiency, and are prone to missed detections, making it difficult to meet production needs.
A withstand voltage testing device for nanocrystalline relays was designed. It adopts a transmission frame, a testing mechanism, and a fast-separation debounce mechanism to achieve streamlined transmission and rapid probe separation. Combined with an electric push rod and spring structure, it ensures rapid separation of the probe after contact with the relay to avoid arcing. The detection accuracy is improved by using an arc-suppressing plate and a positioning mechanism.
It enables continuous and automated detection of relays, improves detection efficiency, avoids probe breakage and arcing, and ensures the reliability and accuracy of detection.
Smart Images
Figure CN120652232B_ABST