对显微扫描分析仪识别的复核目标的定位方法及系统
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- QINGDAO NOVELBEAM TECH
- Filing Date
- 2025-07-10
- Publication Date
- 2026-07-17
AI Technical Summary
Intelligent microscopic scanning analyzers cannot flexibly handle questionable identification results, cross-platform verification is difficult, and sample diversity makes it difficult to locate the verification target, resulting in low efficiency.
The method of identifying verification targets using a microscopic scanning analyzer utilizes coordinate transformation to convert the coordinate system of the sample slide to the coordinate system of the verification microscope stage. By comparing the captured image with the reference image, rapid and accurate positioning can be achieved.
It improves the efficiency and accuracy of verification work, reduces the difficulty of verifying sparse or stacked samples, is applicable to a variety of sample types, simplifies operation steps, and expands the scope of application.
Smart Images
Figure CN120685638B_ABST