An isotropic thermal neutron radiation field angular distribution uniformity control device and method

CN120692736BActive Publication Date: 2026-08-21CHINA INST FOR RADIATION PROTECTION
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Patent Information

Application Number
CN202510878453.2
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2025-06-27
Publication Date
2026-08-21
Estimated Expiration
2045-06-27

AI Technical Summary

Technical Problem

[0003]但相关技术中,中子注量探测器多采用γ补充电离室才能在高γ本底下准确测量到中子注量,中子注量探测器的成本较高,且为保证反馈调节粒子束的位置更加准确,需要至少三个探测器才能反馈整个热中子辐照时中子的情况,整体装置造价较高

Benefits of technology

[0018]在本发明实施例中,通过粒子加速器,用于发出带有束流位置的高能带电粒子束;铍靶,放置于所述高能带电粒子束发射的沿线上,所述高能带电粒子束轰击在所述铍靶上,产生电荷;绝缘隔离垫圈,缠绕在所述铍靶外侧,阻隔所述电荷由所述铍靶向外界导出;调节组件,与所述铍靶连接,用于获取所述铍靶上的电荷量,与所述粒子加速器连接,用于调节所述高能带电粒子束射向所述铍靶的角度。达到了基于绝缘隔绝垫圈阻隔电荷向外导出,可以通过调节组件获取电荷量调节粒子加速器的目的,从而实现了不使用造价较高的多个探测器检测中子来调节粒子加速器,使用更加便宜的绝缘隔绝垫圈阻隔后,检测电荷量去调节粒子加速器,有效的节约成本的技术效果,进而解决了由于相关技术中需要至少三个造价较高的探测器才能反馈整个中子的情况,调节粒子加速器,造价较高的技术问题。

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Abstract

The application relates to an isotropic thermal neutron radiation field angle distribution uniformity control device and method, wherein a particle accelerator is used for emitting a high-energy charged particle beam with a beam position; a beryllium target is placed on a line along which the high-energy charged particle beam is emitted, the high-energy charged particle beam is bombarded on the beryllium target to generate electric charges; an insulating isolation gasket is wound outside the beryllium target to block the electric charges from being conducted to the outside world; and an adjusting assembly is connected with the beryllium target and used for acquiring the amount of electric charges on the beryllium target, and the adjusting assembly is connected with the particle accelerator and used for adjusting the angle of the high-energy charged particle beam to the beryllium target. The application achieves the purpose of blocking the electric charges from being conducted to the outside world based on the insulating isolation gasket and adjusting the particle accelerator by adjusting the amount of electric charges acquired by the adjusting assembly, so that the cost of the insulating isolation gasket is low after being blocked, the amount of electric charges is detected to adjust the particle accelerator, and the technical effect of effectively saving the cost is achieved.
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Description

Technical Field

[0001] This invention relates to the field of thermal neutron radiation field technology, and in particular to a device and method for controlling the angular distribution uniformity of an isotropic thermal neutron radiation field. Background Technology

[0002] Thermal neutron activation analysis, as a non-destructive and highly sensitive analytical technique, plays a vital role in materials science, medicine, archaeology, and forensic medicine. Uniform thermal neutron irradiation is crucial for improving measurement accuracy and repeatability, ensuring reliable results. A dual-target thermal neutron generation method based on a large moderator can produce an isotropic thermal neutron radiation field. Three neutron fluence detectors monitor the neutron fluence at three different locations, allowing for feedback adjustment of the particle beam's position.

[0003] However, in related technologies, neutron flux detectors often use gamma-supplement ionization chambers to accurately measure neutron flux under high gamma background. Neutron flux detectors are expensive, and to ensure more accurate feedback adjustment of the particle beam position, at least three detectors are needed to provide feedback on the neutron situation during the entire thermal neutron irradiation, resulting in a high overall cost of the device.

[0004] The above problems urgently need to be addressed. Summary of the Invention

[0005] This invention discloses a device and method for controlling the angular distribution uniformity of an isotropic thermal neutron radiation field, aiming to solve the technical problems existing in the prior art.

[0006] The present invention adopts the following technical solution:

[0007] On one hand, the present invention provides a device for controlling the angular distribution uniformity of an isotropic thermal neutron radiation field, comprising: a particle accelerator for emitting a high-energy charged particle beam with a beam position; a beryllium target placed along the emission line of the high-energy charged particle beam, wherein the high-energy charged particle beam bombards the beryllium target and generates charge; an insulating gasket wrapped around the outside of the beryllium target to prevent the charge from being discharged from the beryllium target to the outside; and an adjustment component connected to the beryllium target for acquiring the amount of charge on the beryllium target and connected to the particle accelerator for adjusting the angle at which the high-energy charged particle beam is directed toward the beryllium target.

[0008] Optionally, the beryllium target includes an upper beryllium target and a lower beryllium target, both of which are distributed along the emission line of the high-energy charged particle beam; a gap is provided between the upper and lower beryllium targets, and the lower edge of the upper beryllium target and the upper edge of the lower beryllium target are on the same horizontal plane.

[0009] Optionally, the distance between the upper beryllium target and the lower beryllium target is set to be at least 50 cm.

[0010] Optionally, both the upper beryllium target and the lower beryllium target have a semi-circular disc-shaped structure, and the orthographic projections of the upper beryllium target and the lower beryllium target form a complete circle.

[0011] Optionally, the adjustment component includes an electrostatic needle and a microcontroller; the electrostatic needle is connected to the beryllium target, and is used to acquire the charge on the beryllium target and convert it into a voltage signal based on the charge; the electrostatic needle is connected to the microcontroller, and the microcontroller determines the amount of charge generated on the beryllium target based on the voltage signal and adjusts the angle at which the high-energy charged particle beam is directed toward the beryllium target.

[0012] Optionally, the electrostatic needle includes a first electrostatic needle and a second electrostatic needle; the first electrostatic needle is connected to the upper beryllium target to obtain a first voltage signal corresponding to the upper beryllium target; the second electrostatic needle is connected to the lower beryllium target to obtain a second voltage signal corresponding to the lower beryllium target; the microcontroller determines a first charge quantity corresponding to the upper beryllium target based on the first voltage signal, and determines a second charge quantity corresponding to the lower beryllium target based on the second voltage signal; the microcontroller adjusts the angle at which the high-energy charged particle beam is directed toward the beryllium target based on the first charge quantity and the second charge quantity.

[0013] Optionally, the particle accelerator includes an accelerator body and an XY bidirectional beam controller; the accelerator body emits the high-energy charged particle beam, and the high-energy charged particle beam has its beam position adjusted by the XY bidirectional beam controller; the XY bidirectional beam controller is connected to the adjustment component, and the adjustment component is used to control the XY bidirectional beam controller to adjust the beam position of the high-energy charged particle beam.

[0014] According to another aspect of the present invention, a method for controlling the uniformity of the angular distribution of an isotropic thermal neutron radiation field is also provided, comprising: emitting a high-energy charged particle beam from an accelerator body; adjusting the beam position of the high-energy charged particle beam via an XY bidirectional beam controller; wherein a portion of the charged particles in the high-energy charged particle beam bombard an upper beryllium target, and another portion of the charged particles bombard a lower beryllium target, generating charges, wherein the sum of the charged particles bombarding the upper beryllium target and the charged particles bombarding the lower beryllium target is the total number of charged particles in the high-energy charged particle beam; acquiring the charge on the upper beryllium target with a first electrostatic needle, and acquiring the charge on the lower beryllium target with a second electrostatic needle; and adjusting the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller based on the corresponding charges on the upper and lower beryllium targets.

[0015] Optionally, the microcontroller controller adjusts the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller based on the charges corresponding to the upper and lower beryllium targets, including: the first electrostatic needle acquiring the charge corresponding to the upper beryllium target and converting it into a first voltage signal; the second electrostatic needle acquiring the charge corresponding to the lower beryllium target and converting it into a second voltage signal; the microcontroller controller receiving the first voltage signal to determine the first charge amount corresponding to the upper beryllium target, and receiving the second voltage signal to determine the second charge amount corresponding to the lower beryllium target; the microcontroller controller adjusting the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller based on the first charge amount and the second charge amount.

[0016] Optionally, the microcontroller controller adjusts the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller based on the first charge and the second charge, including: determining the difference between the first charge and the second charge; when the difference is positive, controlling the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller to deflect towards the lower beryllium target; when the difference is negative, controlling the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller to deflect towards the upper beryllium target.

[0017] The technical solution adopted in this invention can achieve at least one of the following beneficial effects:

[0018] In this embodiment of the invention, a particle accelerator is used to emit a high-energy charged particle beam with a beam position; a beryllium target is placed along the emission line of the high-energy charged particle beam, and the high-energy charged particle beam bombards the beryllium target, generating an electric charge; an insulating gasket is wrapped around the outside of the beryllium target to prevent the charge from being discharged from the beryllium target to the outside; an adjustment component is connected to the beryllium target to obtain the amount of charge on the beryllium target, and is connected to the particle accelerator to adjust the angle at which the high-energy charged particle beam is directed towards the beryllium target. This achieves the goal of using the insulating gasket to prevent the charge from being discharged outwards, and adjusting the particle accelerator by obtaining the amount of charge through the adjustment component. This eliminates the need for multiple expensive detectors to detect neutrons and adjust the particle accelerator, instead using a cheaper insulating gasket to block the charge and then detecting the amount of charge to adjust the particle accelerator, effectively saving costs. This also solves the technical problem of high costs associated with adjusting particle accelerators, which requires at least three expensive detectors to detect the entire neutron emission tomography. Attached Figure Description

[0019] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the description of the embodiments will be briefly introduced below, forming part of the present invention. The illustrative embodiments of the present invention and their descriptions explain the present invention and do not constitute an improper limitation of the present invention. In the accompanying drawings:

[0020] Figure 1 This is a schematic diagram of the structure of an isotropic thermal neutron radiation field angular distribution uniformity control device according to Embodiment 1 of the present invention;

[0021] Figure 2 This is a schematic diagram of the beryllium target in an isotropic thermal neutron radiation field angular distribution uniformity control device according to Embodiment 1 of the present invention;

[0022] Figure 3 This is a schematic diagram of the structure of the insulating gasket surrounding the beryllium target in an isotropic thermal neutron radiation field angular distribution uniformity control device according to Embodiment 1 of the present invention;

[0023] Figure 4 This is a schematic diagram of the structure of a high-energy charged particle beam passing through a beryllium target in an isotropic thermal neutron radiation field angular distribution uniformity control device according to Embodiment 1 of the present invention.

[0024] Figure 5 This is a flowchart of a method for controlling the angular distribution uniformity of an isotropic thermal neutron radiation field according to Embodiment 2 of the present invention;

[0025] Figure 6 This is a flowchart of an optional isotropic thermal neutron radiation field angular distribution uniformity control method in Embodiment 4 of the present invention.

[0026] Explanation of reference numerals in the attached figures:

[0027] 1. Particle accelerator; 11. Accelerator body; 12. XY bidirectional beam controller;

[0028] 2. Beryllium target; 21. Upper beryllium target; 22. Lower beryllium target;

[0029] 3. Insulating gaskets;

[0030] 4. Adjustment components; 41. First electrostatic needle; 42. Second electrostatic needle; 43. Microcontroller controller. Detailed Implementation

[0031] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions of this invention will be clearly and completely described below in conjunction with specific embodiments and corresponding drawings. In the description of this invention, it should be noted that the term "or" is generally used to include the meaning of "and / or," unless otherwise expressly indicated.

[0032] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or a magnetic connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal communication between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances. Furthermore, in the description of this application, the terms "first," "second," etc., are used only for distinguishing descriptions and should not be construed as indicating or implying relative importance. In the description of this invention, "a plurality of" means at least two, such as two, three, or more, unless otherwise explicitly specified.

[0033] Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0034] First, to facilitate understanding of the embodiments of the present invention, some terms or nouns involved in the present invention will be explained below:

[0035] Isotropic properties refer to the fact that a physical quantity has the same properties or distribution in all directions in space. For neutron flux, isotropic properties mean that the intensity or density of neutron flux is uniform in all directions in space, without any specific directionality.

[0036] A thermal neutron radiation field is a radiation environment composed of low-energy neutrons. The energy range of thermal neutrons is typically 0.01–0.1 electron volts (eV), corresponding to a speed of approximately 2.2 km / s (the most probable speed of the Maxwell-Boltzmann distribution at 290 K).

[0037] A beryllium target is a target material made with metallic beryllium (Be) as its core material. Beryllium is the fourth element in the periodic table, belonging to the alkaline earth metals, with an atomic weight of 9.012. Beryllium targets are usually made of high-purity metallic beryllium, appearing as a hard, gray metallic substance with a hexagonal close-packed crystal structure.

[0038] To address the problems existing in the prior art, this application provides a device and method for controlling the angular distribution uniformity of an isotropic thermal neutron radiation field.

[0039] Example 1

[0040] This embodiment provides a device for controlling the angular distribution uniformity of an isotropic thermal neutron radiation field, such as... Figure 1 As shown, Figure 1This is a schematic diagram of an isotropic thermal neutron radiation field angular distribution uniformity control device according to Embodiment 1 of the present invention. The device includes:

[0041] Particle accelerator 1 is used to emit a high-energy charged particle beam with a beam position; beryllium target 2 is placed along the emission line of the high-energy charged particle beam, and the high-energy charged particle beam bombards the beryllium target 2, generating charge; insulating gasket 3 is wrapped around the outside of beryllium target 2 to prevent charge from being conducted to the outside from beryllium target 2; adjustment component 4 is connected to beryllium target 2 to obtain the amount of charge on beryllium target 2, and is connected to particle accelerator 1 to adjust the angle at which the high-energy charged particle beam is directed towards beryllium target 2.

[0042] Based on the above structure, particle accelerator 1 emits a high-energy charged particle beam, and the deflection angle of the high-energy charged particle beam is adjusted. The high-energy charged particle beam can be a high-energy proton or D-ion beam. Particle accelerator 1 is installed at the end of a cylindrical beamline tube (target tube), from which a high-energy charged particle beam is emitted. The beamline tube is set to a vacuum state, and the high-energy charged particle beam moves horizontally in the beamline tube without being affected by air. It will continue to move along the extension line of the emission direction until it reaches the beryllium target 2 at the other end of the beamline tube, where it reacts with the beryllium target 2. To ensure that the high-energy charged particle beam bombards the beryllium target 2 perpendicularly and is emitted along the central axis of the beamline pipe, the deflection direction of the high-energy charged particle beam needs to be adjusted so that it is emitted along the central axis of the beamline pipe. This ensures that the thermal neutron radiation field generated after the high-energy charged particle beam reacts with the beryllium target 2 is isotropic, achieving a uniform radiation field.

[0043] Optionally, a high-energy charged particle beam bombards the beryllium target 2, ionizing the electrons in the outer shell of the beryllium atoms, producing electron-ion pairs, and releasing neutrons. These neutrons create an isotropic thermal neutron radiation field around the beryllium target 2. Electrons, under the influence of the insulating gasket 3, cannot escape the area enclosed by it, and thus carry a charge. To ensure the high-energy charged particle beam is emitted along the central axis of the beamline, the adjustment component 4 needs to acquire the charge within the insulating gasket 3. The deflection direction of the high-energy charged particle beam is adjusted based on the amount of charge. In the case where a beamline (target tube) is provided between the particle accelerator 1 and the beryllium target 2, the target tube and the beryllium target 2 are fixed together by a target tube fixing plate. The beryllium target has a plate-like structure and can also be called a target sheet. The insulating gasket 3 is positioned between the target tube fixing plate and the target sheet.

[0044] Alternatively, instead of using a high-cost neutron detector, the charge of electrons generated in the reaction can be detected by trapping them. Charge detection is simpler and less expensive, and it can also be used to adjust the deflection direction of a high-energy charged particle beam. This effectively reduces the overall cost of the experiment.

[0045] In some preferred embodiments, the beryllium target 2 includes an upper beryllium target 21 and a lower beryllium target 22, both of which are distributed along the emission line of the high-energy charged particle beam; a gap is provided between the upper beryllium target 21 and the lower beryllium target 22, and the lower edge of the upper beryllium target 21 is on the same horizontal plane as the upper edge of the lower beryllium target 22. Figure 2 As shown, Figure 2 This is a schematic diagram of the structure of the beryllium target 2 in an isotropic thermal neutron radiation field angular distribution uniformity control device according to Embodiment 1 of the present invention.

[0046] Based on the above structure, in order to determine whether the high-energy charged particle beam is deviated, the beryllium target 2 is divided into an upper beryllium target 21 and a lower beryllium target 22. The upper beryllium target 21 and the lower beryllium target 22 are placed symmetrically, and the lower edge of the upper beryllium target 21 and the upper edge of the lower beryllium target 22 are on the same horizontal line. By detecting the amount of charge on the upper beryllium target 21 and the amount of charge on the lower beryllium target 22, when the amount of charge on the upper beryllium target 21 is greater than the amount of charge on the lower beryllium target 22, it indicates that the high-energy charged particle beam is deviating upward. At this time, the adjustment component 4 intervenes to adjust the beam position of the particle accelerator 1, thereby keeping the high-energy charged particle beam on the central axis.

[0047] Optionally, due to the thickness of the insulating gasket 3, after the insulating gasket surrounds the upper beryllium target 21 and the lower beryllium target 22 respectively, in order to ensure that the edge lines of the upper beryllium target 21 and the lower beryllium target 22 are at the same horizontal level, their positions need to be staggered, that is, one in front and one behind. At this time, the edge lines of the upper beryllium target 21 and the lower beryllium target 22 are at the same horizontal level. As shown in the figure, the upper beryllium target 21 can be placed close to the particle accelerator 1, and the lower beryllium target 22 can be placed far away from the particle accelerator 1. Alternatively, the upper beryllium target 21 can be placed far away from the particle accelerator 1, and the lower beryllium target 22 can be placed close to the particle accelerator 1.

[0048] In some preferred embodiments, the distance between the upper beryllium target 21 and the lower beryllium target 22 is set to be at least 50 cm.

[0049] Based on the above structure, to prevent mutual interference between the reactions of the high-energy charged particle beam on the upper beryllium target 21 and the lower beryllium target 22, the distance between the upper and lower beryllium targets 21 needs to be set to at least 50 cm. Specifically, the high-energy charged particle beam is equivalent to a relatively thick cylindrical beam. After the beam is emitted, the upper part bombards the upper beryllium target 21 and is blocked by it. The lower part of the high-energy charged particle beam continues to be emitted to the right until it bombards the lower beryllium target 22. To avoid mutual interference between the reactions on the surface of the upper beryllium target 21 and the lower beryllium target 22, the distance between the upper and lower beryllium targets 21 needs to be increased to at least 50 cm.

[0050] In some preferred embodiments, both the upper beryllium target 21 and the lower beryllium target 22 have a semi-circular disc-shaped structure, and the orthographic projections of the upper beryllium target 21 and the lower beryllium target 22 form a complete circle. For example... Figure 3 and Figure 4 As shown, Figure 3 This is a schematic diagram of the structure of the beryllium target 2 surrounded by the insulating gasket 3 in an isotropic thermal neutron radiation field angular distribution uniformity control device according to Embodiment 1 of the present invention. Figure 4 This is a schematic diagram of the structure of a high-energy charged particle beam passing through a beryllium target 2 in an isotropic thermal neutron radiation field angular distribution uniformity control device according to Embodiment 1 of the present invention.

[0051] Based on the above structure, the high-energy charged particle beam is cylindrical. When bombarding the upper beryllium target 21 and the lower beryllium target 22, to ensure all particles hit the beryllium target 2, the shape of the beryllium target 2 is set to be the same as the cross-sectional shape of the high-energy charged particle beam. Therefore, the upper beryllium target 21 and the lower beryllium target 22, when joined together, need to form a circular structure; thus, the upper beryllium target 21 and the lower beryllium target 22 are both semi-circular structures. Simultaneously, the upper beryllium target 21 and the lower beryllium target 22 are identical in shape and size, and are symmetrically placed on the extension line of the high-energy charged particle beam emission.

[0052] Optionally, both the upper beryllium target 21 and the lower beryllium target 22 can be set in a semi-circular shape. When the high-energy charged particle beam completely bombards the beryllium target 2, the amount of material used in the beryllium target 2 can be reduced, thereby saving costs.

[0053] In some preferred embodiments, the adjustment component 4 includes an electrostatic needle and a microcontroller 43; the electrostatic needle is connected to the beryllium target 2 and is used to acquire the charge on the beryllium target 2 and convert the charge into a voltage signal; the electrostatic needle is connected to the microcontroller 43 and the microcontroller 43 determines the amount of charge generated on the beryllium target 2 based on the voltage signal and adjusts the angle at which the high-energy charged particle beam is directed toward the beryllium target 2.

[0054] Based on the above structure, the adjustment component 4 includes an electrostatic needle and a microcontroller 43. The electrostatic needle conducts the charge trapped on the beryllium target 2 by the insulating washer and amplifies the charge. At the same time, it converts the charge into a voltage signal or a current signal. The electrostatic needle and the microcontroller 43 are connected by a wire wrapped with insulating rubber. The voltage signal or current signal is transmitted to the microcontroller 43 through the wire. The microcontroller 43 converts the voltage signal into information about the amount of charge, thereby determining the amount of charge generated on the beryllium target 2, that is, the amount of electrons generated on the beryllium target 2. Based on the amount of electrons, the amount of neutrons can be determined, thus realizing the function of a high-cost detector.

[0055] In some preferred embodiments, the electrostatic needle includes a first electrostatic needle 41 and a second electrostatic needle 42; the first electrostatic needle 41 is connected to the upper beryllium target 21 to obtain a first voltage signal corresponding to the upper beryllium target 21; the second electrostatic needle 42 is connected to the lower beryllium target 22 to obtain a second voltage signal corresponding to the lower beryllium target 22; the microcontroller controller 43 determines the first charge amount corresponding to the upper beryllium target 21 based on the first voltage signal, and determines the second charge amount corresponding to the lower beryllium target 22 based on the second voltage signal; the microcontroller controller 43 adjusts the angle at which the high-energy charged particle beam is directed toward the beryllium target 2 based on the first charge amount and the second charge amount.

[0056] Based on the above structure, since there are upper beryllium target 21 and lower beryllium target 22, and it is necessary to measure the first charge of upper beryllium target 21 and the second charge of lower beryllium target 22, a first electrostatic needle 41 and a second electrostatic needle 42 are set. The first electrostatic needle 41 is connected to upper beryllium target 21 to extract the charge in upper beryllium target 21 and transmit it to the microcontroller controller 43 through a wire. The microcontroller controller 43 simultaneously collects the first charge of upper beryllium target 21 and the second charge of lower beryllium target 22. If the first charge is greater than the second charge, it means that the number of high-energy charged particle beams hitting upper beryllium target 21 is greater than the number hitting lower beryllium target 22. The deflection direction of high-energy charged particle beam needs to be adjusted downwards slightly to make the emission direction of high-energy charged particle beam coincide with the direction of the central axis.

[0057] Optionally, converting the charge carried by electrons into voltage or current signals makes it easier to extract electrons and transmit them in wires. Only wires are needed to transmit charge information to the microcontroller 43, effectively reducing material costs.

[0058] In some preferred embodiments, the particle accelerator 1 includes an accelerator body 11 and an XY bidirectional beam controller 12; the accelerator body 11 emits a high-energy charged particle beam, and the high-energy charged particle beam is adjusted in position by the XY bidirectional beam controller 12; the XY bidirectional beam controller 12 is connected to an adjustment component 4, and the adjustment component 4 is used to control the XY bidirectional beam controller 12 to adjust the beam position of the high-energy charged particle beam.

[0059] Based on the above structure, the particle accelerator 1 includes an accelerator body 11 and an XY bidirectional beam controller 12. The accelerator body 11 contains an electric field that accelerates the emitted charged particles, causing them to be emitted at high speed. The high-speed emitted particles enter the XY bidirectional beam controller 12 and are deflected under its action, resulting in a high-speed, high-energy charged particle beam with a deflection direction. The high-energy charged particle beam bombards the upper and lower target materials. When the amount of charge generated on the two materials is different, the microcontroller controller 43 adjusts the deflection angle of the XY bidirectional beam controller 12 based on the amount of charge, thereby adjusting the deflection angle of the high-energy charged particles and effectively realizing the formation of an isotropic thermal neutron radiation field after the high-energy charged particles bombard the target material.

[0060] Example 2

[0061] Based on the above embodiments, the present invention also proposes an implementation method for controlling the angular distribution uniformity of isotropic thermal neutron radiation fields. Figure 5 This is a flowchart of a method for controlling the angular distribution uniformity of an isotropic thermal neutron radiation field according to Embodiment 2 of the present invention, as shown below. Figure 5 As shown, the method includes:

[0062] In step S102, the accelerator body 11 emits a high-energy charged particle beam;

[0063] In step S104, the high-energy charged particle beam has its beam position adjusted by the XY bidirectional beam controller 12.

[0064] In step S106, some charged particles in the high-energy charged particle beam bombard the upper beryllium target 21, and another part of the charged particles bombard the lower beryllium target 22, generating charges. The sum of the charged particles bombarding the upper beryllium target 21 and the charged particles bombarding the lower beryllium target 22 is the total number of charged particles in the high-energy charged particle beam.

[0065] In step S108, the first electrostatic needle 41 acquires the charge on the upper beryllium target 21, and the second electrostatic needle 42 acquires the charge on the lower beryllium target 22;

[0066] In step S110, the microcontroller controller 43 adjusts the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller 12 based on the corresponding charges of the upper beryllium target 21 and the lower beryllium target 22.

[0067] In some preferred embodiments, the microcontroller controller 43 adjusts the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller 12 based on the charges corresponding to the upper beryllium target 21 and the lower beryllium target 22. This includes: the first electrostatic needle 41 acquiring the charge corresponding to the upper beryllium target 21 and converting it into a first voltage signal; the second electrostatic needle 42 acquiring the charge corresponding to the lower beryllium target 22 and converting it into a second voltage signal; the microcontroller controller 43 receiving the first voltage signal to determine the first charge amount corresponding to the upper beryllium target 21 and receiving the second voltage signal to determine the second charge amount corresponding to the lower beryllium target 22; and the microcontroller controller 43 adjusting the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller 12 based on the first charge amount and the second charge amount.

[0068] In some preferred embodiments, the microcontroller controller 43 adjusts the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller 12 based on the first charge quantity and the second charge quantity, including: determining the difference between the first charge quantity and the second charge quantity; when the difference is positive, controlling the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller 12 to deflect towards the downward beryllium target 22; when the difference is negative, controlling the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller 12 to deflect towards the upward beryllium target 21.

[0069] Through the above steps S102 to S110, the goal of adjusting the particle accelerator 1 by adjusting the charge quantity obtained by adjusting component 4 is achieved by blocking the outward discharge of charge based on the insulating gasket. This achieves the technical effect of adjusting the particle accelerator 1 without using multiple expensive detectors to detect neutrons, and by using cheaper insulating gaskets to block the charge and then detecting the charge quantity to adjust the particle accelerator 1, effectively saving costs. This solves the technical problem of high cost in adjusting the particle accelerator 1, which requires at least three expensive detectors to receive the entire neutron data in related technologies.

[0070] Example 3

[0071] Based on the above embodiments, the present invention also proposes an optional device implementation method, which includes: a semi-circular Be target (metal beryllium target 2), an insulating washer 3, an electrometer, a microcontroller 43, and an XY bidirectional beam controller 12.

[0072] The insulating gasket 3 provides electrical insulation between the two semi-circular Be targets and the overall target tube in the experiment. The semi-circular Be targets use insulated wires to extract the charge deposited on the beryllium target 2 by the incident high-energy charged particle beam (high-energy proton or D-ion beam), which is then amplified and transmitted by an electrometer to the microcontroller controller 43. The position information (charge amount) is then fed back to the XY bidirectional beam controller 12.

[0073] Example 4

[0074] According to embodiments of the present invention, an optional method implementation is also provided, such as... Figure 6 As shown, Figure 6 This is a flowchart of an optional isotropic thermal neutron radiation field angular distribution uniformity control method in Embodiment 4 of the present invention.

[0075] Step S1: Adjust the output of the high-energy charged particle beam (high-energy proton or D-ion beam) of the accelerator body 11. The high-energy charged particle beam is adjusted by the XY bidirectional beam controller 12 so that the beam spot of the high-energy proton / D-ion beam is 20mm to 500mm.

[0076] In step S2, a high-energy proton / D-ion beam bombards two semi-circular Be targets (metallic beryllium targets 2). Since the Be targets are electrically insulating, charge begins to deposit.

[0077] In step S3, the charge deposited on the semi-circular Be target is transferred to the electrometer via an insulated wire, and then amplified and transmitted to the microcontroller 43.

[0078] In step S4, the microcontroller controller 43 analyzes the charge information on the two Be targets and does not feed back information to the XY bidirectional beam controller 12 when they are equal.

[0079] Step S5: When the charge information on the two Be targets is not equal, the adjustment information is fed back to the XY bidirectional beam controller 12.

[0080] Step S6: Adjust the XY bidirectional beam controller 12 on the beamline so that the beam spot center of the high-energy proton / D ion beam is located on the geometric center of the beamline channel.

[0081] By using the above steps S1 to S6, the accuracy of neutron uniformity control can be effectively improved, while reducing the cost of related equipment.

[0082] The above are merely preferred embodiments of the present invention. It should be noted that those skilled in the art can make various improvements and modifications without departing from the principle of the present invention, and these improvements and modifications should also be considered within the scope of protection of the present invention.

Claims

1. A device for controlling the uniformity of angular distribution of isotropic thermal neutron radiation field, characterized in that, include: Particle accelerator (1), used to emit high-energy charged particle beams with beam position; A beryllium target (2) is placed along the line of the high-energy charged particle beam emission, and the high-energy charged particle beam bombards the beryllium target (2) to generate charge; An insulating gasket (3) is wrapped around the outside of the beryllium target (2) to prevent the charge from being conducted out of the beryllium target (2); The adjustment component (4) is connected to the beryllium target (2) to obtain the amount of charge on the beryllium target (2) and is connected to the particle accelerator (1) to adjust the angle at which the high-energy charged particle beam is directed toward the beryllium target (2); The adjustment component (4) includes an electrostatic needle and a microcontroller (43); the electrostatic needle is connected to the beryllium target (2), and is used to acquire the charge on the beryllium target (2) and convert the charge into a voltage signal; the electrostatic needle is connected to the microcontroller (43), and the microcontroller (43) determines the amount of charge generated on the beryllium target (2) based on the voltage signal and adjusts the angle at which the high-energy charged particle beam is directed toward the beryllium target (2); The beryllium target (2) includes an upper beryllium target (21) and a lower beryllium target (22), both of which are distributed along the emission line of the high-energy charged particle beam; a gap is provided between the upper beryllium target (21) and the lower beryllium target (22), and the lower edge of the upper beryllium target (21) and the upper edge of the upper beryllium target (22) are on the same horizontal plane; The electrostatic needle includes a first electrostatic needle (41) and a second electrostatic needle (42); the first electrostatic needle (41) is connected to the upper beryllium target (21) to obtain a first voltage signal corresponding to the upper beryllium target (21); the second electrostatic needle (42) is connected to the lower beryllium target (22) to obtain a second voltage signal corresponding to the lower beryllium target (22); the microcontroller controller (43) determines the first charge amount corresponding to the upper beryllium target (21) based on the first voltage signal, and determines the second charge amount corresponding to the lower beryllium target (22) based on the second voltage signal; the microcontroller controller (43) adjusts the angle at which the high-energy charged particle beam is directed toward the beryllium target (2) based on the first charge amount and the second charge amount.

2. The isotropic thermal neutron radiation field angular distribution uniformity control device according to claim 1, characterized in that, The particle accelerator (1) includes an accelerator body (11) and an XY bidirectional beam controller (12). The accelerator body (11) emits the high-energy charged particle beam, and the beam position of the high-energy charged particle beam is adjusted by the XY bidirectional beam controller (12). The XY bidirectional beam controller (12) is connected to the adjustment component (4), and the adjustment component (4) is used to control the XY bidirectional beam controller (12) to adjust the beam position of the high-energy charged particle beam.

3. The isotropic thermal neutron radiation field angular distribution uniformity control device according to claim 1, characterized in that, The distance between the upper beryllium target (21) and the lower beryllium target (22) is set to be at least 50 cm.

4. The isotropic thermal neutron radiation field angular distribution uniformity control device according to claim 1, characterized in that, Both the upper beryllium target (21) and the lower beryllium target (22) have a semi-circular disc structure, and the orthographic projections of the upper beryllium target (21) and the lower beryllium target (22) form a complete circle.

5. A method for controlling the uniformity of the angular distribution of an isotropic thermal neutron radiation field, characterized in that, include: The accelerator body (11) emits a high-energy charged particle beam; The high-energy charged particle beam has its beam position adjusted by an XY bidirectional beam controller (12); In the high-energy charged particle beam, some charged particles bombard the upper beryllium target (21), and another part of the charged particles bombard the lower beryllium target (22), generating charge. The sum of the charged particles bombarding the upper beryllium target (21) and the charged particles bombarding the lower beryllium target (22) is the total number of charged particles in the high-energy charged particle beam. The first electrostatic needle (41) acquires the charge on the upper beryllium target (21), and the second electrostatic needle (42) acquires the charge on the lower beryllium target (22); The microcontroller controller (43) adjusts the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller (12) based on the corresponding charges of the upper beryllium target (21) and the lower beryllium target (22); An insulating gasket (3) is wrapped around the outside of the beryllium target (2) to prevent the charge from being discharged from the beryllium target (2) to the outside.

6. The method for controlling the uniformity of the angular distribution of an isotropic thermal neutron radiation field according to claim 5, characterized in that, The microcontroller controller (43) adjusts the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller (12) based on the corresponding charges of the upper beryllium target (21) and the lower beryllium target (22), including: The first electrostatic needle (41) acquires the charge corresponding to the upper beryllium target (21) and converts it into a first voltage signal; The second electrostatic needle (42) acquires the second voltage signal of the charge conversion position corresponding to the lower beryllium target (22); The microcontroller (43) receives the first voltage signal to determine the first charge amount corresponding to the upper beryllium target (21), and receives the second voltage signal to determine the second charge amount corresponding to the lower beryllium target (22); The microcontroller controller (43) adjusts the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller (12) based on the first charge amount and the second charge amount.

7. The method for controlling the uniformity of the angular distribution of an isotropic thermal neutron radiation field according to claim 6, characterized in that, The microcontroller controller (43) adjusts the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller (12) based on the first charge quantity and the second charge quantity, including: Determine the difference between the first charge and the second charge; When the difference is positive, the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller (12) is deflected toward the lower beryllium target (22); When the difference is negative, the beam position of the high-energy charged particle beam emitted by the XY bidirectional beam controller (12) is deflected toward the upper beryllium target (21).

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