A device for testing components and assemblies for in-orbit servicing of a spacecraft

Abstract

A kind of component and assembly test device for supporting in-orbit maintenance in cabin, including device main body structure, external test structure, internal test structure, power supply management structure, central control structure, wherein: device main body structure is the box-like structure of front baffle, back baffle, left side plate, right side plate, top plate and bottom plate, provides installation support for other structures, and the space between top plate and bottom plate is separated into two parts by lower partition; the upper space is further separated into two parts by vertical partition; the inner side of left side plate and right side plate and the two sides of vertical partition are provided with multiple positioning guide rails in horizontal direction;Mounting guide slot is arranged on the upper surface of bottom plate;External test structure is installed on the outside of right side plate;Internal test structure is installed in the upper space between top plate and bottom plate by the opposite positioning guide rails on left side plate and vertical partition or right side plate and vertical partition;Power supply management structure is used for installing power supply circuit;Central control structure is used for installing control circuit board.

Description

Technical Field

[0001] This invention relates to a testing device for components and parts that supports in-orbit maintenance within the cabin, belonging to the field of aerospace equipment technology. Background Technology

[0002] With the rapid development of commercial spaceflight, the marketization of the aerospace industry has intensified competition for spacecraft project initiation and launch. Reducing the grade and quality assurance costs of components to lower the overall cost of spacecraft components is an effective way to enhance the market competitiveness of commercial spacecraft. As a crucial means of evaluating the on-orbit performance of components, on-orbit flight testing of components and assemblies will become increasingly necessary in the future.

[0003] Currently, all domestic on-orbit testing equipment for components and assemblies is for single use only. After the on-orbit test is completed, it is destroyed along with the satellite it is carried on board, and there is no on-orbit maintenance design. Summary of the Invention

[0004] The technical problem solved by this invention is to overcome the shortcomings of the prior art and provide a component and assembly testing device that supports in-orbit maintenance within the spacecraft cabin. This device enables maintenance personnel to quickly replace and repair faulty components inside the spacecraft cabin, reducing the maintenance cost of in-orbit component testing and improving maintenance efficiency.

[0005] The technical solution of this invention is: a component and assembly testing device supporting in-cabin on-orbit maintenance, comprising: a main device structure, an external testing structure, an internal testing structure, a power supply management structure, and a central control structure, wherein:

[0006] The main structure of the device is a box-shaped structure composed of a front baffle, a rear baffle, a left side plate, a right side plate, a top plate, and a bottom plate. It provides installation support for the external test structure, the internal test structure, the power supply management structure, and the central control structure. The lower partition is placed horizontally in the box-shaped structure, dividing the internal space of the main structure of the device into upper and lower parts. The middle partition is placed vertically between the top plate and the lower partition and is parallel to the left and right side plates, further dividing the upper space between the top plate and the bottom plate into left and right parts.

[0007] Define the surfaces of the front baffle, rear baffle, left side plate, and right side plate facing the interior of the main structure of the device as the inner side, and the other side as the outer side;

[0008] Multiple positioning guide rails are provided horizontally on the inner sides of the left and right side plates and on both sides of the middle partition; the upper surface of the bottom plate is provided with mounting guide grooves.

[0009] The external test structure is installed on the outside of the right side panel for mounting the test circuit;

[0010] The internal test structure is horizontally mounted in the upper space between the top and bottom plates via positioning guides on the left and right side plates and the middle partition, or the right and right side plates and the middle partition, for mounting the test circuit.

[0011] The power supply management structure is used to install the power supply circuit, and is installed on the base plate of the main structure of the device through the mounting guide groove on the upper surface of the base plate;

[0012] The central control structure is used to mount the control circuit board, which is horizontally mounted between the lower partition and the power management structure via opposing positioning guides on the left and right side panels.

[0013] Preferably, wedge-shaped locking structures are provided on both sides of the central control structure to cooperate with the positioning guide rails on the inner sidewalls of the left and right side plates;

[0014] The wedge-shaped locking structure includes: a locking screw, a locking guide rail, a head wedge, a central wedge, and a tail wedge, wherein:

[0015] The locking guide rail is fixed to the central control structure, and the locking guide rail is provided with guide grooves;

[0016] The central wedge is installed in the guide groove of the locking guide rail. The central wedge can slide horizontally in the guide groove and move vertically in the guide groove.

[0017] The head wedge is installed at one end of the locking guide rail via a guide groove; the tail wedge is fixed at the other end of the locking guide rail.

[0018] The locking screw passes through the head wedge and is threaded into the locking guide rail. By adjusting the tightening depth of the locking screw, the relative position of the head wedge and the tail wedge, as well as the height of the central wedge and the mounting surface of the locking guide rail, can be adjusted.

[0019] Preferably, the inner sides of the front baffle and the rear baffle are provided with protruding grids, and positioning teeth are provided around the perimeter for auxiliary positioning;

[0020] Loose, non-detachable screws are distributed on the outer edges of the front and rear baffles for connecting the front baffle, rear baffle, left side plate, right side plate, top plate, bottom plate, and lower partition.

[0021] Preferably, the number and shape of the external test structures are designed according to actual needs;

[0022] Each external test structure is designed with two positioning pin holes of different sizes on its edge. Two irregularly shaped positioning pins of different sizes are set at the positions corresponding to the positioning pin holes on the right side plate to ensure the rapid and accurate positioning of the external test structure.

[0023] Each locating pin hole has a locking screw mounting thread on both sides, and the external test structure is mounted on the outside of the right side plate using locking screws.

[0024] Preferably, a self-locking screw is provided on the lower surface of the base plate for tightening and fixing the power supply management structure; the tightening method of the self-locking screw ensures that the power supply management structure is in close contact with the upper surface of the base plate, providing a heat conduction path for the power supply management structure.

[0025] Preferably, the internal test structure is box-shaped, and is provided with a wedge-shaped locking structure and a pull-out assist mechanism, wherein:

[0026] The internal test structure is equipped with a wedge-shaped locking structure installed horizontally on both sides of the internal test structure, which is used to cooperate with the positioning guide rails on the left side plate and the middle partition plate, or the right side plate and the middle partition plate.

[0027] The mounting surface of the pull-out mechanism faces the outside of the main structure of the device, located near the locking screw of the wedge-shaped locking structure. It is rectangular in shape and is used to assist in the removal of the internal test structure.

[0028] Preferably, positioning guide rails are provided on the inner sides of the left and right side plates and on both sides of the middle partition in the horizontal direction, and the beginning of each positioning guide rail is a flared opening that decreases in size from large to small.

[0029] Compared with the prior art, the present invention has the following advantages:

[0030] (1) The device of the present invention consists of a central control structure that can be replaced in orbit, a power supply management structure that can be replaced in orbit, an external test structure that can be replaced in orbit, an internal test structure that can be replaced in orbit, and a device structure that supports on-orbit maintenance. When any module fails in orbit, it can be quickly and individually replaced inside the spacecraft, which reduces the maintenance cost and maintenance time of the test device.

[0031] (2) The replaceable central control structure of the present invention is installed by means of a wedge locking structure and a guide rail for the device structure, which increases the operability of replacing the central control structure inside the spacecraft and shortens the replacement time of the central control structure.

[0032] (3) The on-orbit replaceable power management structure of the present invention is installed by means of a non-detachable screw mounting interface and a device structure guide rail and a non-detachable screw, which increases the operability of replacing the power management module inside the spacecraft, shortens the replacement time of the power management structure, and increases the safety of screw disassembly and assembly.

[0033] (4) The external test structure that can be replaced on the orbit of the present invention is installed by the cooperation of the non-detachable screw and positioning hole with the positioning pin and non-detachable screw installation interface of the device structure, which increases the operability of replacing the external test structure inside the spacecraft, shortens the replacement time of the external test structure, and increases the safety of screw disassembly and assembly.

[0034] (5) The internal test structure of the present invention, which can be replaced on the orbit, is installed by the wedge locking structure and the guide rail of the device structure, which increases the operability of replacing the internal test structure inside the spacecraft and shortens the replacement time of the internal test module. Attached Figure Description

[0035] Figure 1 This is a schematic diagram of the device composition of the present invention;

[0036] Figure 2 This is a schematic diagram of the central control structure of the present invention;

[0037] Figure 3 The following are schematic diagrams of the power supply management structure of the present invention: (a) is a schematic diagram of the power supply management structure in the installed state, and (b) is a schematic diagram of the power supply management structure in the flipped state.

[0038] Figure 4 This is a schematic diagram of the external test structure of the present invention;

[0039] Figure 5 This is a schematic diagram of the internal experimental structure of the present invention;

[0040] Figure 6 This is a schematic diagram of the main structure of the device of the present invention;

[0041] Figure 7 This is a schematic diagram of the wedge-shaped locking structure of the present invention;

[0042] Figure 8 The following are schematic diagrams of the front baffle design of the present invention: (a) is an internal schematic diagram, and (b) is an external schematic diagram;

[0043] Figure 9 This is a schematic diagram of the guide rail design for the left side plate, right side plate, and middle partition plate of the present invention;

[0044] Figure 10 This is a schematic diagram of the right side plate positioning pin design of the present invention;

[0045] Figure 11 This is a schematic diagram of the base plate design of the present invention.

[0046] Attached image labels:

[0047] 1. Main structure of the device; 2. External test structure; 3. Internal test structure; 4. Power supply management structure; 5. Central control structure; 6. Wedge locking structure; 7. Non-removable screw mounting interface; 8. Special-shaped positioning pin; 9. Non-removable screw; 1-1 Front baffle; 1-2 Rear baffle; 1-3 Left side plate; 1-4 Right side plate; 1-5 Top plate; 1-6 Bottom plate; 1-7 Middle partition plate; 1-8 Lower partition plate; 1-6-1 Mounting guide groove; 1-9 Flared mouth of positioning guide rail; 1-1-1 Positioning tooth; 5-9 Locking screw; 5-10 Locking guide rail; 5-11 Head wedge; 5-12 Central wedge; 5-13 Tail wedge; 2-1 Positioning pin hole; 3-1 Pulling mechanism. Detailed Implementation

[0048] The purpose of this invention is to provide a component and assembly testing device that enables maintenance personnel to quickly replace and repair faulty parts inside a spacecraft cabin, thereby reducing the maintenance cost of on-orbit testing of components and improving maintenance efficiency.

[0049] like Figure 1 As shown, the component and assembly testing device for supporting in-cabin on-orbit maintenance according to the present invention specifically includes the following structure:

[0050] 5. On-orbit replaceable central control structure; 4. On-orbit replaceable power supply management structure; 2. On-orbit replaceable external test structure; 3. On-orbit replaceable internal test structure; 1. Main structure of the device supporting on-orbit maintenance.

[0051] The main structure of the device provides installation support for other structures, such as Figure 6 As shown, it includes a box-shaped structure composed of a front baffle 1-1, a rear baffle 1-2, a left side plate 1-3, a right side plate 1-4, a top plate 1-5, and a bottom plate 1-6. A lower partition 1-8 is placed horizontally in the box-shaped structure, dividing the space between the top plate 1-5 and the bottom plate 1-6 into upper and lower parts, respectively denoted as the upper space and the lower space. A middle partition 1-7 is vertically located between the top plate 1-5 and the lower partition 1-8, and is parallel to the left side plate 1-3 and the right side plate 1-4. Its upper and lower ends contact the top plate 1-5 and the lower partition 1-8, respectively, and its left and right ends contact the front baffle 1-1 and the rear baffle 1-2, respectively, further dividing the upper space between the top plate 1-5 and the bottom plate 1-6 into two parts.

[0052] The front baffle 1-1, rear baffle 1-2, left side plate 1-3 and right side plate 1-4 facing the interior of the main structure of the device are defined as the inner side, and the other side is defined as the outer side; multiple positioning guide rails are provided in the horizontal direction on the inner side of the left side plate 1-3 and right side plate 1-4, as well as on both sides of the middle partition plate 1-7; the upper surface of the bottom plate 1-6 is provided with an installation guide groove;

[0053] The external test structure is installed on the outside of the right side panel 1-4 for mounting the test circuit;

[0054] The internal test structure is horizontally installed in the upper space between the top plate 1-5 and the bottom plate 1-6 via the opposing positioning guide rails on the left side plate 1-3 and the middle partition plate 1-7, or the right side plate 1-4 and the middle partition plate 1-7, for installing the test circuit.

[0055] The power supply management structure is used to install the power supply circuit, and is installed on the base plate 1-6 of the main structure of the device through the mounting guide groove on the upper surface of the base plate 1-6;

[0056] A. Central control structure

[0057] like Figure 2 As shown, the central control structure is used to install the control circuit board, which is horizontally installed between the lower partition 1-8 and the power supply management structure via the opposing positioning guides on the left side plate 1-3 and the right side plate 1-4.

[0058] The two sides of the central control structure are equipped with wedge-shaped locking structures at the positions where they cooperate with the positioning guide rails on the inner walls of the left side plate 1-3 and the right side plate 1-4, respectively. These structures are used to cooperate with the positioning guide rails on the inner walls of the left side plate 1-3 and the right side plate 1-4 to fix the central control structure to the main structure of the device while allowing the central control structure to be quickly assembled and disassembled within the device.

[0059] The wedge-shaped locking structure 6 includes: a locking screw 5-9, a locking guide rail 5-10, a head wedge 5-11, a central wedge 5-12, and a tail wedge 5-13. The connection method of the above parts is as follows:

[0060] The locking screw 5-9 connects the head wedge 5-11, the central wedge 5-12, and the tail wedge 5-13 together via the thread on the locking guide rail 5-10.

[0061] The locking guide rail 5-10 is fixed to both sides of the central control structure with M2 screws; the tail wedge 5-13 is fixed to the tail of the locking guide rail 5-10 with M2 screws; the central wedge 5-12 is installed on the locking guide rail 5-10, and the central wedge 5-12 can slide horizontally along the guide groove of the locking guide rail 5-10, but can only move within a small range along the vertical direction of the guide groove, with a movement distance of <12.5mm; the head wedge 5-11 is installed at one end of the locking guide rail through the guide groove of the locking guide rail 5-12; the locking screw 5-9 passes through the head wedge and is threadedly connected to the locking guide rail 5-10. By adjusting the tightening depth of the locking screw 5-9, the relative position of the head wedge 5-11 and the tail wedge 5-13 is adjusted, thereby adjusting the height of the central wedge 5-12 and the mounting surface of the locking guide rail 5-10.

[0062] B. The inner sides of the front baffle 1-1 and the rear baffle 1-2 are provided with protruding grids, and are also equipped with positioning teeth and non-removable screws 9, specifically:

[0063] The positioning teeth are located around the front baffle 1-1 and the rear baffle 1-2, and cooperate with the left side plate 1-3, the right side plate 1-4, the top plate 1-5, the bottom plate 1-6, the middle partition 1-7, and the lower partition 1-8 to quickly position the front baffle 1-1 and the rear baffle 1-2.

[0064] The non-detachable screws 9 are distributed on the outer edges of the front baffle 1-1 and the rear baffle 1-2, and are used to connect the front baffle 1-1, the rear baffle 1-2, the left side plate 1-3 and the right side plate 1-4.

[0065] C. External test structure 2

[0066] like Figure 4 As shown, the number and shape of the external test structure 2 can be designed according to actual needs;

[0067] Each external test structure 2 has two positioning pin holes 2-1 of different sizes on its edge. On the right side plate 1-4, two irregularly shaped positioning pins 8 of different sizes are set at the positions corresponding to the positioning pin holes to ensure the rapid and accurate positioning of the external test structure.

[0068] Each locating pin hole has a self-locking screw mounting interface 7 on both sides. The external test structure 2 is mounted on the outside of the right side plate 1-4 by self-locking screws.

[0069] D. The mounting guide groove 1-6-1 for installing the power supply management structure 4 is located on the upper surface of the base plate 1-6 and cooperates with the power supply management structure to support the quick fixing and installation of the power supply management structure.

[0070] The non-removable screws are located on the lower surface of the base plate 1-6 and are used to tighten and fix the power supply module.

[0071] The non-removable screw locking mechanism provides a good heat conduction path for the power supply module and the device structure.

[0072] E. Internal test structure 3

[0073] like Figure 5 As shown, the internal test structure 3 is box-shaped, and it is equipped with a wedge-shaped locking structure 6 and a pull-out assist mechanism 3-1, wherein:

[0074] The internal test structure is also equipped with a wedge-shaped locking structure, which is horizontally installed on both sides of the internal test structure and cooperates with the positioning guide rails on the left side plate 1-3 and the middle partition plate 1-7, or the right side plate 1-4 and the middle partition plate 1-7.

[0075] The mounting surface of the pull-out mechanism faces the outside of the main structure of the device and is located near the locking screw 5-9 of the wedge-shaped locking structure. It is rectangular and its rotation trajectory is fan-shaped. It is used to cooperate with the internal test structure. During the rotation, the pull-out mechanism interferes with the left side plate, etc. After contact, it will exert a force during rotation, thereby pushing out the internal test structure.

[0076] The central control structure, power supply management structure, external test structure, and internal test structure are installed on the device structure.

[0077] The replaceable center control structure includes a wedge-shaped locking structure and a body structure for mounting the control circuit board;

[0078] The aforementioned on-orbit replaceable power management structure includes a non-detachable screw mounting interface and a main body structure for mounting the power supply circuit;

[0079] The aforementioned replaceable external test structure includes positioning holes and a non-removable screw mounting interface for installing test circuits;

[0080] The replaceable internal test structure includes a wedge-shaped locking structure and a pull-out mechanism for installing test circuits;

[0081] Furthermore, such as Figure 7 As shown, the wedge-shaped locking structure of the internal test structure includes a locking screw 5-9, a locking guide rail 5-10, a head wedge 5-11, a central wedge 5-12, and a tail wedge 5-13. By tightening or loosening the locking screw with an Allen wrench, the head wedge exerts a squeezing force on the central wedge or eliminates the squeezing force, thereby increasing or decreasing the distance between the top of the central wedge and the bottom of the locking guide rail, thus increasing or decreasing the friction between the wedge-shaped locking structure and the mounting guide rail, achieving the fixation and removal of the central control structure and the internal test structure on the device structure.

[0082] Furthermore, such as Figure 8 As shown, the inner sides of the front baffle 1-1 and the rear baffle 1-2 are provided with protruding grids, and positioning teeth are provided around all four sides; the outer edges of the front baffle 1-1 and the rear baffle 1-2 are distributed with non-removable screws; the front baffle 1-1 and the rear baffle 1-2 are designed with positioning teeth 1-1-1 and non-removable screws 9 for quick installation and removal of the front baffle 1-1 and the rear baffle 1-2 on the rail. The positioning teeth can help maintenance personnel to quickly position the front baffle 1-1 and the rear baffle 1-2 when installing them. The non-removable screw design avoids the accumulation of floating debris on the rail, which could cause untidiness and safety hazards in the cabin when installing / removing the front baffle 1-1 and the rear baffle 1-2.

[0083] Furthermore, the left side plate 1-3, right side plate 1-4, and middle partition plate 1-7 are designed with positioning guide rails to support the rapid installation and fixation of the central control structure and the internal test structure wedge locking structure, such as... Figure 9 As shown, the positioning guide rail is designed with a flared opening that gradually decreases in size at the beginning (flared opening 1-9 of the positioning guide rail), so that the internal test structure 3 can be quickly positioned when the guide rail is installed.

[0084] Furthermore, such as Figure 10 As shown, the right side plate 1-4 is designed with irregularly shaped positioning pins 8 and non-removable screw mounting interfaces 7 to support the rapid installation and fixation of external test structures. Each external test structure mounting position is designed with two positioning pin holes of different sizes. The design of irregularly shaped double positioning pins not only ensures the rapid installation of external test structures but also avoids incorrect posture during the installation of external test structures.

[0085] Furthermore, such as Figure 11 As shown, the base plates 1-6 are designed with mounting guide grooves and non-removable screws to support the rapid fixing and installation of the power management structure, as shown in the figure. Figure 3 As shown, the design of the installation guide groove ensures the rapid installation of the power supply management structure. The non-detachable screws are used to tighten and fix the power supply management structure, which not only avoids the mess and safety hazards caused by excess objects floating in the rail during the installation and removal of the power supply management structure, but also provides a good heat conduction path between the power supply management structure and the device structure.

[0086] In summary, this invention addresses the future flight testing needs of components and assemblies by proposing a testing device that supports in-orbit maintenance. Its structural design, which facilitates installation and positioning, reduces the maintenance cost and improves efficiency for in-orbit component testing. This invention's design of a testing device supporting in-orbit maintenance provides assistance in reducing the cost of in-orbit testing of components and assemblies in the future.

[0087] The present invention has been described in detail above with reference to specific embodiments and exemplary examples; however, these descriptions should not be construed as limiting the present invention. Those skilled in the art will understand that various equivalent substitutions, modifications, or improvements can be made to the technical solutions and embodiments of the present invention without departing from the spirit and scope of the invention, and all such modifications and improvements fall within the scope of the present invention. The scope of protection of the present invention is defined by the appended claims.

[0088] The contents not described in detail in this specification are existing technologies known to those skilled in the art.

Claims

1. A testing device for components and assemblies supporting in-cabin on-orbit maintenance, characterized in that... include: The device consists of a main structure (1), an external test structure (2), an internal test structure (3), a power supply management structure (4), and a central control structure (5), wherein: The main structure (1) of the device is a box-shaped structure composed of a front baffle (1-1), a rear baffle (1-2), a left side plate (1-3), a right side plate (1-4), a top plate (1-5), and a bottom plate (1-6), which provides installation support for the external test structure (2), the internal test structure (3), the power supply management structure (4), and the central control structure (5). The lower partition (1-8) is placed horizontally in the box-shaped structure, dividing the space inside the main structure (1) of the device into upper and lower parts. The middle partition (1-7) is placed vertically between the top plate (1-5) and the lower partition (1-8) and parallel to the left side plate (1-3) and the right side plate (1-4), further dividing the upper space between the top plate (1-5) and the bottom plate (1-6) into left and right parts. Define the front baffle (1-1), rear baffle (1-2), left side plate (1-3), and right side plate (1-4) facing the interior of the main structure of the device as the inner side, and the other side as the outer side; Multiple positioning guide rails are provided horizontally on the inner sides of the left side plate (1-3) and the right side plate (1-4), as well as on both sides of the middle partition plate (1-7); an installation guide groove is provided on the upper surface of the bottom plate (1-6); The external test structure (2) is installed on the outside of the right side plate (1-4) for installing the test circuit; The internal test structure (3) is horizontally installed in the upper space between the top plate (1-5) and the bottom plate (1-6) via the positioning guide rails on the left side plate (1-3) and the middle partition plate (1-7), or the right side plate (1-4) and the middle partition plate (1-7), for installing the test circuit; The power supply management structure (4) is used to install the power supply circuit and is installed on the base plate (1-6) of the main structure of the device through the mounting guide groove on the upper surface of the base plate (1-6); The central control structure (5) is used to install the control circuit board, which is horizontally installed between the lower partition (1-8) and the power supply management structure (4) via the corresponding positioning guide rails on the left side plate (1-3) and the right side plate (1-4).

2. The component and assembly testing device for supporting in-cabin on-orbit maintenance according to claim 1, characterized in that: The central control structure (5) is provided with wedge-shaped locking structures on both sides, which are used to cooperate with the positioning guide rails on the inner sidewalls of the left side plate (1-3) and the right side plate (1-4); The wedge-shaped locking structure includes: a locking screw (5-9), a locking guide rail (5-10), a head wedge (5-11), a central wedge (5-12), and a tail wedge (5-13), wherein: The locking guide rail (5-10) is fixed on the central control structure, and the locking guide rail (5-10) is provided with a guide groove; The central wedge (5-12) is installed in the guide groove of the locking guide rail (5-10). The central wedge (5-12) can slide in the horizontal direction and move in the vertical direction of the guide groove. The head wedge (5-11) is installed at one end of the locking guide rail (5-10) via a guide groove on the locking guide rail (5-10); the tail wedge (5-13) is fixed at the other end of the locking guide rail (5-10); The locking screw (5-9) passes through the head wedge (5-11) and is threadedly connected to the locking guide rail (5-10). By adjusting the tightening depth of the locking screw (5-9), the relative position of the head wedge (5-11) and the tail wedge (5-13), as well as the height of the central wedge (5-12) and the mounting surface of the locking guide rail (5-10) are adjusted.

3. The component and assembly testing device for supporting in-cabin on-orbit maintenance according to claim 1, characterized in that: The inner sides of the front baffle (1-1) and the rear baffle (1-2) are provided with protruding grids, and positioning teeth are provided around them for auxiliary positioning. Loose screws are distributed on the outer edges of the front baffle (1-1) and the rear baffle (1-2) for connecting the front baffle (1-1), the rear baffle (1-2), the left side plate (1-3), the right side plate (1-4), the top plate (1-5), the bottom plate (1-6), and the lower partition (1-8).

4. The component and assembly testing device for supporting in-cabin on-orbit maintenance according to claim 1, characterized in that: The number and shape of the external test structure (2) shall be designed according to actual needs; Each external test structure (2) has two positioning pin holes of different sizes on its edge. Two irregularly shaped positioning pins of different sizes are set on the right side plate (1-4) at the position corresponding to the positioning pin holes to ensure the rapid and accurate positioning of the external test structure. Each locating pin hole has a locking screw mounting thread on both sides, and the external test structure (2) is mounted on the outside of the right side plate (1-4) by locking screws.

5. The component and assembly testing device for supporting in-cabin on-orbit maintenance according to claim 1, characterized in that: The bottom surface of the base plate (1-6) is provided with a non-detachable screw for tightening and fixing the power supply management structure (4); the tightening method of the non-detachable screw makes the power supply management structure (4) in close contact with the upper surface of the base plate (1-6), providing a heat conduction path for the power supply management structure (4).

6. The component and assembly testing device for supporting in-cabin on-orbit maintenance according to claim 2, characterized in that: The internal test structure (3) is box-shaped, and is equipped with a wedge-shaped locking structure (6) and a pull-out assist mechanism, wherein: The internal test structure (3) is provided with a wedge-shaped locking structure horizontally installed on both sides of the internal test structure, which is used to cooperate with the positioning guide rails on the left side plate (1-3) and the middle partition plate (1-7), or the right side plate (1-4) and the middle partition plate (1-7); The mounting surface of the pull-out mechanism faces the outside of the main structure of the device and is located near the locking screw (5-9) of the wedge-shaped locking structure. It is rectangular in shape and is used to assist in the removal of the internal test structure (3).

7. The component and assembly testing device for supporting in-cabin on-orbit maintenance according to claim 2, characterized in that: Positioning guide rails are provided on the inner sides of the left side plate (1-3) and the right side plate (1-4), as well as on both sides of the middle partition plate (1-7) in the horizontal direction. The beginning of each positioning guide rail is a flared opening that decreases in size from large to small.

Images