一种MIPIPHY电路测试系统及其测试方法
By using a built-in excitation MIPI PHY circuit test system, the problems of high cost of MIPI signal generators and test results being affected by external equipment are solved. It realizes low-cost and reliable automatic loopback testing of MIPI PHY circuits, supports HS and LP mode switching, and improves test efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- NANJING GUOZHAO OPTOELECTRONICS TECH CO LTD
- Filing Date
- 2025-06-26
- Publication Date
- 2026-07-17
AI Technical Summary
Existing MIPI signal generators are expensive and difficult to use, resulting in high testing costs for MIPI PHY circuits and test results that are affected by external conversion chips and connecting cables, making it impossible to accurately test the receiving rate of MIPI PHY circuits.
The test system employs a fully integrated on-chip MIPI PHY circuit, including a test signal generation module, MIPI PHY circuit, and digital logic judgment and processing circuit. It achieves automatic signal loopback testing through built-in excitation, supports HS and LP mode switching, and simulates actual signal sequences.
It reduces testing costs, improves the reliability and efficiency of test results, and enables automatic loopback testing of MIPI PHY circuits without the need for external signal generators or conversion chips.
Smart Images
Figure CN120779206B_ABST