A space experimental sample temperature processing device and a space fluid physics experimental cabinet

Abstract

This invention relates to a space experimental sample temperature processing device and a space fluid physics experimental cabinet. The space experimental sample temperature processing device includes a shell, an alternating temperature on-orbit sample drawer, a constant temperature on-orbit sample drawer, an alternating temperature down-flow sample drawer, and a constant temperature down-flow sample drawer. The shell contains an alternating temperature on-orbit sample chamber, a constant temperature on-orbit sample chamber, an alternating temperature down-flow sample chamber, and a constant temperature down-flow sample chamber. The alternating temperature on-orbit sample drawer is disposed within the alternating temperature on-orbit sample chamber, the constant temperature on-orbit sample drawer is disposed within the constant temperature on-orbit sample chamber, the alternating temperature down-flow sample drawer is disposed within the alternating temperature down-flow sample chamber, and the constant temperature down-flow sample drawer is disposed within the constant temperature down-flow sample chamber. The shell is provided with a temperature regulating mechanism for temperature control of the alternating temperature on-orbit sample drawer, the constant temperature on-orbit sample drawer, the alternating temperature down-flow sample drawer, and the constant temperature down-flow sample drawer.

Description

Technical Field

[0001] This invention relates to the technical field of space fluid science experiments, specifically to a space experimental sample temperature treatment device and a space fluid physics experimental cabinet. Background Technology

[0002] Solid-liquid phase transition (SLT) is a widespread natural phenomenon with broad applications in renewable energy thermal storage, thermal management of new energy vehicles, industrial waste heat utilization, and aerospace engineering. In aerospace engineering, SLT is a core technology for addressing the temporal, spatial, and intensity inconsistencies in heat load under extreme high and low temperature alternating environments in space. However, the low power density of existing space SLT technologies restricts the development of high-power energy utilization and thermal management technologies in space, such as those for deep space exploration spacecraft, long-term space missions, and space-based directed energy weapons. Existing bottlenecks limiting power density include: low thermal conductivity of phase change materials, high thermal resistance during non-contact melting, and non-uniform solidification.

[0003] To address the aforementioned issues, this research focuses on the scientific question of "the microscopic mechanism and structural construction method of high thermal conductivity and low viscosity nanocomposite phase change materials adapted to microgravity environments." Utilizing the "complex fluid module" in the "fluid physics experimental cabinet," this research investigates the dispersion and aggregation behavior of nanocomposite phase change materials under space phase change thermal conditions. It analyzes the evolution of the material's microstructure and fundamental thermophysical properties such as thermal conductivity and viscosity during microgravity phase change processes, guiding the optimization of phase change material structural construction. Therefore, based on the needs of scientific experiments, there is an urgent need to develop experimental units for nanocomposite phase change materials to provide a microgravity thermal environment for the melting-solidification phase transition and optical testing of nanocomposite phase change materials. Summary of the Invention

[0004] In order to solve one or more technical problems existing in the prior art, the present invention provides a space experimental sample temperature processing device and a space fluid physics experimental cabinet.

[0005] The technical solution of the present invention to solve the above-mentioned technical problems is as follows: a space experiment sample temperature processing device, comprising a shell, an alternating temperature on-orbit sample drawer, a constant temperature on-orbit sample drawer, an alternating temperature down-traffic sample drawer, and a constant temperature down-traffic sample drawer. The shell contains an alternating temperature on-orbit sample chamber, a constant temperature on-orbit sample chamber, an alternating temperature down-traffic sample chamber, and a constant temperature down-traffic sample chamber. The alternating temperature on-orbit sample drawer is disposed within the alternating temperature on-orbit sample chamber, the constant temperature on-orbit sample drawer is disposed within the constant temperature on-orbit sample chamber, the alternating temperature down-traffic sample drawer is disposed within the alternating temperature down-traffic sample chamber, and the constant temperature down-traffic sample drawer is disposed within the constant temperature down-traffic sample chamber. The shell is provided with a temperature regulating mechanism for temperature control of the alternating temperature on-orbit sample drawer, the constant temperature on-orbit sample drawer, the alternating temperature down-traffic sample drawer, and the constant temperature down-traffic sample drawer.

[0006] The beneficial effects of the present invention are as follows: The space experimental sample temperature processing device of the present invention, by setting up a shell and setting up an alternating temperature on-orbit sample drawer, a constant temperature on-orbit sample drawer, an alternating temperature down-orbit sample drawer, and a constant temperature down-orbit sample drawer inside the shell, and using a temperature adjustment mechanism to adjust the temperature of the sample, can maintain the sample at a specific temperature in both the sample testing state and the sample processing state, which can meet the space experimental conditions of nanocomposite materials and provide basic conditions for the research of nanocomposite phase change materials.

[0007] Based on the above technical solution, the present invention can be further improved as follows.

[0008] Furthermore, the temperature regulation mechanism includes heating elements and cooling elements. Heating elements are provided on the inner walls of the alternating temperature on-orbit sample chamber, the constant temperature on-orbit sample chamber, the alternating temperature down-orbit sample chamber, and the constant temperature down-orbit sample chamber. Cooling elements are provided on the outer walls of the alternating temperature on-orbit sample chamber and the alternating temperature down-orbit sample chamber.

[0009] The beneficial effect of adopting the above-mentioned further scheme is that by setting heating and cooling plates, the sample chamber can be controlled at a constant temperature or an alternating temperature.

[0010] Furthermore, the temperature regulation mechanism also includes a cooling fan and a temperature equalization fan. A temperature equalization fan is provided on the housing at a position corresponding to the alternating temperature on-orbit sample chamber and the alternating temperature downward sample chamber, and a cooling fan is provided at the hot end of the cooling chip.

[0011] The beneficial effects of adopting the above-mentioned further solution are: by setting up a cooling fan, the cooling chip can be cooled, and the temperature equalization fan can equalize the temperature of the corresponding sample chamber.

[0012] Furthermore, both the constant temperature on-orbit sample drawer and the alternating temperature on-orbit sample drawer include a microscopic analysis sample cell, a turbidity analysis sample cell, and a light scattering analysis sample cell, and the inner sidewalls of the microscopic analysis sample cell, the turbidity analysis sample cell, and the light scattering analysis sample cell are provided with first limiting springs.

[0013] Furthermore, both the constant temperature down sample drawer and the alternating temperature down sample drawer include a down sample slot, and a second limiting spring is provided on the inner side wall of the down sample slot.

[0014] Furthermore, an electrical control box is provided at the bottom of the housing. The electrical control box contains a power board, a main control board, a temperature control board, a data acquisition board, and a TEC control board. The power board is electrically connected to the main control board, the temperature control board, the data acquisition board, and the TEC control board. The main control board is electrically connected to the temperature control board, the data acquisition board, and the TEC control board. The data acquisition board is electrically connected to the temperature control board and the TEC control board.

[0015] Temperature sensors are installed at the locations of multiple sample drawers inside the housing;

[0016] The acquisition board is electrically connected to the temperature sensor and is used to acquire the temperature signal detected by the temperature sensor and send it to the temperature control board. The temperature control board is electrically connected to the heating element and, under the control of the main control board, starts the heating element to heat or stops the heating element from working. The TEC control board is electrically connected to the cooling element and, under the control of the main control board, starts the cooling element to cool or stops the cooling element from working.

[0017] Furthermore, when the sample drawer is in the testing state, the heating element corresponding to the sample drawer is controlled in a closed loop by the temperature control board, the temperature sensor corresponding to the sample drawer, the acquisition board and the main control board, so that the temperature inside the sample drawer is maintained within the first set temperature range.

[0018] When the sample drawer is in the processing state, the heating element and cooling element corresponding to the sample drawer are controlled in a closed loop by the temperature control board, the temperature sensor corresponding to the sample drawer, the TEC control board, the acquisition board and the main control board, so that the temperature in the sample drawer is cyclically alternating between maintaining a first preset time in a first set temperature range and maintaining a second preset time in a second set temperature range.

[0019] Furthermore, the first set temperature range is 42℃±1℃, and the second set temperature range is 29℃±1℃.

[0020] Furthermore, when the alternating temperature on-orbit sample drawer, the constant temperature on-orbit sample drawer, the alternating temperature down-orbit sample drawer, and the constant temperature down-orbit sample drawer are placed inside the housing, the front panel of each sample drawer is connected to the front panel of the housing by a lock-lock screw; each sample drawer is also provided with a pull-out handle on its front panel.

[0021] A space fluid physics experimental cabinet includes an experimental cabinet body and a space experimental sample temperature treatment device as described above. The interior of the experimental cabinet body is provided with a slide rail that extends forward and backward, and the bottom of the space experimental sample temperature treatment device is adapted to slide on the slide rail.

[0022] The beneficial effects of this invention are: the space fluid physics experimental cabinet of this invention has a space experimental sample temperature treatment device set inside the cabinet body, which can be used to detect the sample after temperature treatment by the relevant detection equipment inside the cabinet body, providing a basis for studying the solid-liquid phase change process of nanocomposite phase change materials. Attached Figure Description

[0023] Figure 1 This is a schematic diagram of the space experiment sample temperature processing device of the present invention without drawers. Figure 1 ;

[0024] Figure 2 This is a schematic diagram of the space experiment sample temperature processing device of the present invention without drawers. Figure 2 ;

[0025] Figure 3 This is a three-dimensional structural diagram of the space experimental sample temperature processing device of the present invention;

[0026] Figure 4 This is a three-dimensional structural diagram of the alternating temperature on-orbit sample drawer of the present invention;

[0027] Figure 5 This is a three-dimensional structural diagram of the alternating temperature descending sample drawer of the present invention;

[0028] Figure 6 This is a schematic diagram showing the assembly position of the space experiment sample temperature treatment device of the present invention within the experimental cabinet.

[0029] The attached diagram lists the components represented by each number as follows:

[0030] 100. Housing; 101. Alternating temperature on-orbit sample drawer; 102. Constant temperature on-orbit sample drawer; 103. Alternating temperature descending sample drawer; 104. Constant temperature descending sample drawer; 106. Alternating temperature on-orbit sample chamber; 107. Constant temperature on-orbit sample chamber; 108. Alternating temperature descending sample chamber; 109. Constant temperature descending sample chamber; 110. Heating element; 111. Cooling element; 112. Cooling fan; 113. Temperature equalization fan; 114. First limiting spring; 115. Microscopic analysis sample slot; 116. Descending sample slot; 117. Light scattering analysis sample slot; 118. Second limiting spring;

[0031] 400. Electrical control box;

[0032] 500. Experiment cabinet body; 501. First optical path; 502. Second optical path; 503. Slide rail. Detailed Implementation

[0033] The principles and features of the present invention are described below with reference to the accompanying drawings. The examples given are only for explaining the present invention and are not intended to limit the scope of the present invention.

[0034] like Figures 1-5As shown, the space experiment sample temperature processing device of this embodiment includes a housing 100, an alternating temperature on-orbit sample drawer 101, a constant temperature on-orbit sample drawer 102, an alternating temperature down-traffic sample drawer 103, and a constant temperature down-traffic sample drawer 104. The housing 100 contains an alternating temperature on-orbit sample chamber 106, a constant temperature on-orbit sample chamber 107, an alternating temperature down-traffic sample chamber 108, and a constant temperature down-traffic sample chamber 109. The alternating temperature on-orbit sample drawer 101 is disposed within the alternating temperature on-orbit sample chamber 106, the constant temperature on-orbit sample drawer 102 is disposed within the constant temperature on-orbit sample chamber 107, the alternating temperature down-traffic sample drawer 103 is disposed within the alternating temperature down-traffic sample chamber 108, and the constant temperature down-traffic sample drawer 104 is disposed within the constant temperature down-traffic sample chamber 109. The housing 100 is provided with a temperature regulating mechanism for controlling the temperature of the alternating temperature on-orbit sample drawers 101, 102, 103, and 104.

[0035] like Figure 2 As shown, the temperature regulation mechanism in this embodiment includes a heating element 110 and a cooling element 111. Heating elements 110 are provided on the inner walls of the alternating temperature on-orbit sample chamber 106, the constant temperature on-orbit sample chamber 107, the alternating temperature descending sample chamber 108, and the constant temperature descending sample chamber 109. Cooling elements 111 are provided on the outer walls of the alternating temperature on-orbit sample chamber 106 and the alternating temperature descending sample chamber 108. By setting the heating element and the cooling element, the sample chamber can be controlled at a constant temperature or an alternating temperature.

[0036] like Figures 1-4 As shown, the temperature regulation mechanism in this embodiment further includes a cooling fan 112 and a temperature equalization fan 113. A temperature equalization fan 113 is provided on the housing 100 at positions corresponding to the alternating temperature on-track sample chamber 106 and the alternating temperature downward sample chamber 108. A cooling fan 112 is provided at the hot end of the cooling chip 111. By providing the cooling fan, heat can be dissipated from the cooling chip, and the temperature equalization fan can equalize the temperature of the corresponding sample chamber.

[0037] like Figure 4 As shown, both the constant temperature on-orbit sample drawer 102 and the alternating temperature on-orbit sample drawer 101 in this embodiment include a microscopic analysis sample tank 115, a turbidity analysis sample tank, and a light scattering analysis sample tank 117. The inner sidewalls of the microscopic analysis sample tank 115, the turbidity analysis sample tank, and the light scattering analysis sample tank 117 are provided with first limiting springs 114.

[0038] like Figure 5As shown, both the constant temperature down sample drawer 104 and the alternating temperature down sample drawer 103 in this embodiment include a down sample groove 116, and a second limiting spring 118 is provided on the inner side wall of the down sample groove 116.

[0039] like Figures 1-3 As shown, the bottom of the housing in this embodiment is provided with an electrical control box 400. The electrical control box 400 is provided with a power supply board, a main control board, a temperature control board, a data acquisition board and a TEC control board. The power supply board is electrically connected to the main control board, the temperature control board, the data acquisition board and the TEC control board respectively. The main control board is electrically connected to the temperature control board, the data acquisition board and the TEC control board respectively. The data acquisition board is electrically connected to the temperature control board and the TEC control board respectively.

[0040] Temperature sensors are provided at the positions corresponding to multiple sample drawers inside the housing 100; the acquisition board is electrically connected to the temperature sensors respectively, and is used to collect the temperature signals detected by the temperature sensors and send them to the temperature control board. The temperature control board is electrically connected to the heating element and, under the control of the main control board, starts the heating element to heat or stops the heating element from working. The TEC control board is electrically connected to the cooling element and, under the control of the main control board, starts the cooling element to cool or stops the cooling element from working.

[0041] Specifically, when the sample drawer is in testing mode, the heating element corresponding to the sample drawer is controlled in a closed loop by the temperature control board, the temperature sensor corresponding to the sample drawer, the acquisition board, and the main control board to maintain the temperature inside the sample drawer within a first set temperature range. When the sample drawer is in processing mode, it needs to provide the sample with a "melting-solidification" cyclic temperature condition. The heating element 110 and the cooling element 111 corresponding to the sample drawer are controlled in a closed loop by the temperature control board, the temperature sensor corresponding to the sample drawer, the TEC control board, the acquisition board, and the main control board to cyclically alternate between maintaining the temperature inside the sample drawer within the first set temperature range for a first preset time and maintaining it within the second set temperature range for a second preset time. Preferably, the first set temperature range is 42℃±1℃, and the second set temperature range is 29℃±1℃. Specifically, when the sample temperature reaches 42℃±1℃, it is maintained for an indefinite period of 90 minutes before the heating element is powered off and the semiconductor cooling element is activated; when the sample temperature is below 29℃±1℃, it is maintained for a preset time of 30 minutes before the semiconductor cooling element is turned off and the heating element is activated.

[0042] like Figure 3As shown, in this embodiment, when the alternating temperature on-orbit sample drawer 101, the constant temperature on-orbit sample drawer 102, the alternating temperature downward sample drawer 103, and the constant temperature downward sample drawer 104 are placed inside the housing 100, the front panels of each sample drawer are connected to the front panel of the housing 100 by captive screws; each sample drawer's front panel is also provided with a pull-out handle. The alternating temperature on-orbit sample drawer 101, the constant temperature on-orbit sample drawer 102, the alternating temperature downward sample drawer 103, and the constant temperature downward sample drawer 104 are all arranged inside the housing 100 through guide rails and grooves, that is, the corresponding cavity of the housing 100 is provided with a groove, and the bottom of the drawer is provided with a guide rail.

[0043] In this embodiment, both the main structure of the housing and the main structure of the electrical control box are assembled from high-strength titanium alloy materials. The housing and the electrical control box provide installation interfaces for both the inside and outside.

[0044] The purpose of the space experiment sample temperature processing device in this embodiment is to provide a specific temperature processing environment for the samples, while also providing heat dissipation support for each electrical device so that all devices can operate in a favorable thermal environment. Based on the thermal control interface of the space experiment sample temperature processing device and the requirements of the sample environment, an alternating temperature zone is achieved by integrating the heating component, cooling component, fan, and temperature sensor inside a closed structure. A constant temperature zone is achieved by integrating the heating component and temperature sensor inside a closed structure, with a separate electronic module implementing PID temperature closed-loop control.

[0045] Based on the temperature requirements of the constant temperature drawer, the sample drawer must be kept in a constant temperature environment of 42℃±1℃, and localized excessively high temperatures are not allowed; the temperature of the unit shell should not have a significant impact on the overall experimental cabinet. In summary, active temperature control is adopted for the sample drawer, mainly through the following measures: 1. The constant temperature drawer is divided into upper and lower sample drawers. The upper drawer is for the on-orbit experimental group, and the lower drawer is for the downward-moving group. Neither module consumes heat. 2. Electric heating elements are attached to the right side wall of the sample drawer. Temperature control points are set on the top plate, and temperature measuring points are set on the side walls. The design uses a control unit to control the internal temperature of the sample drawer through a PID closed-loop control. When the sample temperature is below 42℃±1℃, the heating elements start working; when the sample temperature reaches 42℃±1℃, the heating elements stop working. 3. To improve the insulation effect, multi-layer heat insulation components are added to the sample drawer walls.

[0046] The alternating temperature drawer primarily requires that the ambient temperature inside the sample drawer periodically alternate between 29℃ and 42℃, without any locally excessively high temperatures; the temperature of the unit shell should not have a significant impact on the overall experimental cabinet. In summary, active temperature control is adopted for the sample drawer, mainly through the following measures: 1. The alternating temperature drawer is divided into upper and lower sample drawers. The upper drawer is for the on-orbit experimental group, and the lower drawer is for the downward-moving group. Neither module consumes heat. 2. Electric heating elements are mounted on the right wall of the sample drawer, and semiconductor cooling elements are mounted on the left wall. Temperature control points are set on the top plate, and temperature measuring points are set on the side walls. The design uses a PID closed-loop control unit to control the internal temperature of the sample drawer. During sample testing, the sample temperature is maintained at 42℃±1℃ by turning the electric heating elements on and off. The sample processing requires a "melting-solidification" cyclical temperature condition. When the sample temperature reaches 42℃±1℃, maintain this temperature for 90 minutes, then de-energize the electric heating element and activate the thermoelectric cooler. When the sample temperature is below 29℃±1℃, de-energize the thermoelectric cooler and activate the electric heating element after 60 minutes. The heat generated by the thermoelectric cooler is dissipated by a cooling fan. 3. A fan is installed on the back panel of the sample drawer to generate forced convection, ensuring uniform airflow inside the drawer and maintaining a certain temperature uniformity. The heating and cooling rates are determined based on the actual capabilities of the electric heating element and the thermoelectric cooler. 4. To improve insulation, multi-layer thermal insulation components are installed on the walls of the sample drawer.

[0047] In this embodiment, the top, middle, and bottom plates of the shell are designed as a single unit. These three structural plates span both alternating and constant temperature zones, thus requiring the use of titanium alloy, a metal with low thermal conductivity. A thermal insulation layer is designed on the outer layer of the shell to reduce heat leakage. An insulation layer is added between the alternating temperature sample zone and the constant temperature sample zone to reduce heat exchange between the high and low temperature zones. The thermal insulation layer consists of, from the inside out: a titanium alloy main structure, multi-layer insulation components, and a polyimide insulation layer. The inner 6mm titanium alloy structure serves as the main load-bearing structure of the experimental unit; the middle 5.5mm layer mainly consists of multi-layer insulation components with low thermal conductivity; and the outer 1.5mm polyimide shell protects the insulation layer.

[0048] In this embodiment, the space experiment sample temperature processing device first conducts alternating temperature processing condition tests during experiments. All alternating turbidity analysis samples, particle size analysis samples, and microscopic analysis samples are removed from the cargo package and placed in their corresponding sample positions within the alternating temperature on-orbit sample drawer. After melting, the samples are grouped and placed in the light scattering heating gun and microscopic observation sample holder, respectively. The turbidity, light scattering data, and particle micromorphology of the samples are then tested. The samples are then returned to their corresponding sample positions within the alternating temperature on-orbit sample drawer. After alternating temperature processing for 0, 4, 8, 12, 16, 20, 40, 60, 80, and 100 cycles, the liquid samples are placed in the light scattering heating gun and microscopic observation sample holder, respectively, to test the turbidity, light scattering data, and particle micromorphology, and the results are compared.

[0049] After 20 cycles of alternating temperature treatment, constant temperature treatment testing began.

[0050] A set of turbidity analysis samples, particle size analysis samples, and microscopic analysis samples were taken from the cargo package and placed in a light scattering heating gun and a microscopic observation sample holder, and kept in a liquid state at 42°C. With the assistance of the astronauts, the positions of various optical detection fields were determined. The transmitted light intensity and light scattering of the samples were tested every 1 hour, and the microscopic morphology was tested every 2 hours. The tests were conducted continuously for 24 hours. After completion, the set of samples was placed in a constant temperature on-orbit sample drawer for continued constant temperature treatment. Subsequently, on the 5th, 10th, 20th, and 30th days after the start of the test calculation, the samples were taken out for transmitted light intensity, light scattering tests, and microscopic observations, respectively.

[0051] After the first set of constant-temperature samples is placed in the constant-temperature on-orbit sample drawer, another set of turbidity analysis samples, particle size analysis samples, and microscopic analysis samples are taken out from the cargo package, and the above operation is repeated. The second set of samples can be processed simultaneously with the first set of samples in the constant-temperature on-orbit sample drawer, and its processing time is determined from its specific start time.

[0052] After all optical sample experiments and tests are completed, the downlink samples are placed in the corresponding sample positions of the constant temperature downlink sample drawer and the alternating temperature downlink sample drawer for constant temperature and alternating temperature treatment. After a certain constant temperature treatment time (maximum 30 days) and alternating number of times (maximum 100 times, about 100 days for two batches), the samples are taken out and placed in the corresponding sample positions of the downlink cargo package.

[0053] The space experimental sample temperature processing device of this embodiment sets up a shell and sets up an alternating temperature on-orbit sample drawer, a constant temperature on-orbit sample drawer, an alternating temperature down-orbit sample drawer, and a constant temperature down-orbit sample drawer inside the shell. The temperature is regulated by a temperature regulation mechanism so that the sample can be maintained at a specific temperature in both the sample testing state and the sample processing state. This can meet the space experimental conditions of nanocomposite materials and provide basic conditions for the research of nanocomposite phase change materials.

[0054] like Figure 6 As shown, this embodiment of a space fluid physics experimental cabinet includes an experimental cabinet body 500 and the aforementioned space experimental sample temperature processing device. The interior of the experimental cabinet body 500 is provided with a slide rail 503 extending forward and backward. The bottom of the space experimental sample temperature processing device is adapted to slide on the slide rail 503. The back of the interior of the experimental cabinet body 500 is provided with a turbidity detection device and a light scattering detection device. The first optical path 501 of the turbidity detection device and the second optical path 502 of the light scattering detection device are both arranged perpendicular to the slide rail 503.

[0055] The space fluid physics experimental cabinet of this embodiment has a space experimental sample temperature treatment device set inside the cabinet body. The sample after temperature treatment can be tested using the relevant detection equipment inside the cabinet body, providing a basis for studying the solid-liquid phase change process of nanocomposite phase change materials.

[0056] In the description of this invention, it should be understood that the terms "center," "longitudinal," "lateral," "length," "width," "thickness," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," "clockwise," "counterclockwise," "axial," "radial," and "circumferential" indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this invention.

[0057] Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this invention, "a plurality of" means at least two, such as two, three, etc., unless otherwise explicitly specified.

[0058] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0059] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0060] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0061] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A space experimental sample temperature processing device, characterized in that, The system includes a housing, an alternating temperature on-orbit sample drawer, a constant temperature on-orbit sample drawer, an alternating temperature down-current sample drawer, and a constant temperature down-current sample drawer. The housing contains an alternating temperature on-orbit sample chamber, a constant temperature on-orbit sample chamber, an alternating temperature down-current sample chamber, and a constant temperature down-current sample chamber. The alternating temperature on-orbit sample drawer is located within the alternating temperature on-orbit sample chamber, the constant temperature on-orbit sample drawer is located within the constant temperature on-orbit sample chamber, and the alternating temperature down-current sample drawer is located within the constant temperature down-current sample chamber. The housing is equipped with a temperature regulating mechanism for controlling the temperature of the alternating temperature on-orbit sample drawer, the constant temperature on-orbit sample drawer, the alternating temperature down-current sample drawer, and the constant temperature down-current sample drawer. The temperature regulation mechanism includes heating elements and cooling elements. Heating elements are provided on the inner walls of the alternating temperature on-orbit sample chamber, the constant temperature on-orbit sample chamber, the alternating temperature down-orbit sample chamber, and the constant temperature down-orbit sample chamber. Cooling elements are provided on the outer walls of the alternating temperature on-orbit sample chamber and the alternating temperature down-orbit sample chamber. The temperature regulation mechanism also includes a cooling fan and a temperature equalization fan. A temperature equalization fan is provided on the housing at the position corresponding to the alternating temperature on-orbit sample chamber and the alternating temperature downward sample chamber. A cooling fan is provided at the hot end of the cooling chip. Both the constant temperature on-orbit sample drawer and the alternating temperature on-orbit sample drawer include a microscopic analysis sample cell, a turbidity analysis sample cell, and a light scattering analysis sample cell. The inner sidewalls of the microscopic analysis sample cell, the turbidity analysis sample cell, and the light scattering analysis sample cell are provided with first limiting springs. Both the constant temperature down sample drawer and the alternating temperature down sample drawer include a down sample slot, and the inner wall of the down sample slot is provided with a second limiting spring. The bottom of the housing is provided with an electrical control box, which contains a power supply board, a main control board, a temperature control board, a data acquisition board, and a TEC control board. The power supply board is electrically connected to the main control board, the temperature control board, the data acquisition board, and the TEC control board. The main control board is electrically connected to the temperature control board, the data acquisition board, and the TEC control board. The data acquisition board is electrically connected to the temperature control board and the TEC control board. Temperature sensors are installed at the locations of multiple sample drawers inside the housing; The acquisition board is electrically connected to the temperature sensor and is used to acquire the temperature signal detected by the temperature sensor and send it to the temperature control board. The temperature control board is electrically connected to the heating element and, under the control of the main control board, starts the heating element to heat or stops the heating element from working. The TEC control board is electrically connected to the cooling element and, under the control of the main control board, starts the cooling element to cool or stops the cooling element from working. When the sample drawer is in the test state, the heating element corresponding to the sample drawer is controlled in a closed loop by the temperature control board, the temperature sensor corresponding to the sample drawer, the acquisition board and the main control board to maintain the temperature in the sample drawer within the first set temperature range. When the sample drawer is in the processing state, the heating element and cooling element corresponding to the sample drawer are controlled in a closed loop by the temperature control board, the temperature sensor corresponding to the sample drawer, the TEC control board, the acquisition board and the main control board, so that the temperature in the sample drawer is cyclically alternating between maintaining a first preset time in a first set temperature range and maintaining a second preset time in a second set temperature range. The first set temperature range is 42℃±1℃, and the second set temperature range is 29℃±1℃; When the alternating temperature on-orbit sample drawer, the constant temperature on-orbit sample drawer, the alternating temperature down-temperature sample drawer, and the constant temperature down-temperature sample drawer are placed inside the housing, the front panel of each sample drawer is connected to the front panel of the housing by a lock-and-hold screw; each sample drawer is also provided with a pull-out handle on its front panel. The top, middle and bottom plates of the shell are designed as a single unit. These three structural plates span two temperature zones, alternating and constant, and are made of titanium alloy. A thermal insulation layer is designed on the outer layer of the shell. A thermal insulation layer is installed between the alternating temperature sample zone and the constant temperature sample zone. The thermal insulation layer consists of the following layers from the inside out: titanium alloy main structure - multi-layer thermal insulation components - polyimide thermal insulation layer.

2. A space fluid physics experimental cabinet, characterized in that, The device includes an experimental cabinet body and a space experimental sample temperature treatment device as described in claim 1. The interior of the experimental cabinet body is provided with a slide rail that extends forward and backward, and the bottom of the space experimental sample temperature treatment device is adapted to slide on the slide rail.

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