Data platform fault positioning system and method based on knowledge graph
Patent Information
- Application Number
- CN202511299851.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-09-12
- Publication Date
- 2025-10-17
- Estimated Expiration
- 2045-09-12
AI Technical Summary
Existing data platform fault location technology cannot effectively screen out historical samples with large differences in structure, load, and configuration in platform transformation scenarios, resulting in redundant selections for fault root cause location and reduced accuracy, and is unable to adapt to the fault location needs of post-transformation scenarios.
By defining the trusted migration factor (CTF), the matching degree between historical samples and current scenarios is quantified from four dimensions: structural similarity, load similarity, configuration similarity, and time decay. Valid historical samples are screened out, and the entity relationship network of the data platform is constructed using the knowledge graph. Combined with the entity vulnerability index and the final score ranking, the root cause of the fault can be accurately identified.
It achieves accurate reuse of historical fault experience in platform transformation scenarios, avoids interference from invalid samples, improves the accuracy and efficiency of fault location, and supports continuous optimization.
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Figure CN120803797A_ABST
Abstract
Citation Information
Patent Citations
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