Machine learning removing method for in-situ electric heating electromagnetic interference of scanning electron microscope
Patent Information
- Application Number
- CN202510818242.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-06-18
- Publication Date
- 2025-10-17
AI Technical Summary
During in-situ high-temperature mechanical testing using a scanning electron microscope, electromagnetic interference introduced by direct current heating of metal foil samples causes electron beam deflection and 50Hz power frequency interference, affecting imaging accuracy and clarity. Traditional shielding methods are costly and hinder in-situ observations.
A machine learning method is used to construct a U-Net arc-structured generator and a PatchGAN discriminator. Combined with sliding window data expansion and feature area cropping, the interference-free in-situ electrically heated metal sheet sample image is reconstructed. The image quality is optimized by alternating training of the generator and discriminator.
It effectively removes electromagnetic interference noise, improves image clarity, provides high-quality in-situ dynamic observation images, reduces equipment costs, and facilitates material failure mechanism analysis and phase change process monitoring.
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Figure CN120807358A_ABST