Ethylene plant control method, system, apparatus, and computer readable storage medium

CN120821243BActive Publication Date: 2026-09-29WANHUA CHEM GRP CO LTD
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Patent Information

Application Number
CN202410438317.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-04-12
Publication Date
2026-09-29
Estimated Expiration
2044-04-12

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Technical Problem

这些操作对下游分离系统影响较大,很容易对下游分离各精馏塔的分离效果产生影响,甚至产生不合格的产品和质量事故,增加企业损失

Benefits of technology

[0036]根据本公开的第四方面,提供了一种计算机可读存储介质,其上存储有计算机程序,所述程序被处理器执行时实现如根据本公开的第一方面的方法。

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Abstract

Embodiments of the present disclosure provide an ethylene plant control method, system, device and computer readable storage medium. The method comprises: obtaining an interference parameter of the cracking furnace; obtaining an influence transmission time required for the interference parameter of the cracking furnace to affect the separation system; obtaining an anti-interference performance parameter of the separation system, a preset allowed parameter fluctuation range and a control response time length of a key parameter of the separation system; and adjusting the key parameter of the separation system according to the interference parameter, the influence transmission time, the anti-interference performance parameter, the preset allowed parameter fluctuation range and the control response time length. In this way, the influence of the cracking furnace interference on the separation effect of the separation system can be avoided, and even unqualified products and quality accidents can be avoided.
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Description

Technical Field

[0001] This disclosure relates to the chemical industry, and in particular to the field of ethylene plant control technology. Background Technology

[0002] Ethylene production capacity is a standard for measuring a country's chemical industry capabilities, and in recent years, many large-scale ethylene plants have been added nationwide. The stable operation and quality improvement of ethylene plants are crucial. As a continuous production process, ethylene plants are unique in that their cracking furnaces experience reduced yields due to coking, requiring periodic furnace shut-off and coke burning operations. These operations significantly impact downstream separation systems, easily affecting the separation efficiency of downstream distillation columns, and even leading to substandard products and quality incidents, increasing losses for the company. Therefore, how to minimize the impact on downstream separation systems after these operations disrupt the cracking furnaces, and how to prevent disruptions to the separation efficiency of downstream systems, has become an urgent problem to be solved. Summary of the Invention

[0003] This disclosure provides a method, system, device, and storage medium for controlling an ethylene plant.

[0004] According to a first aspect of this disclosure, a method for controlling an ethylene plant is provided. The method includes:

[0005] Obtain the interference parameters of the pyrolysis furnace;

[0006] The time required for the interference parameters of the pyrolysis furnace to affect the separation system is determined.

[0007] Obtain the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system;

[0008] The key parameters of the separation system are adjusted based on the interference parameters, the influence propagation time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time.

[0009] In addition to the aspects and any possible implementations described above, a further implementation is provided in which the separation system includes multiple subsystems;

[0010] The process of acquiring the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system includes:

[0011] Obtain the anti-interference performance parameters of each subsystem in the multiple subsystems, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem;

[0012] The adjustment of key parameters of the separation system based on the interference parameters, the influence propagation time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time includes:

[0013] The key parameters of each subsystem are adjusted based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem.

[0014] In addition to the aspects described above and any possible implementation, a further implementation is provided, wherein adjusting the key parameters of each subsystem based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem includes:

[0015] For each subsystem, calculate the product of the interference parameter and the anti-interference performance parameter of each subsystem;

[0016] For each subsystem, if the product is less than the preset allowable parameter fluctuation range of the key parameter of each subsystem, then there is no need to adjust the key parameter of each subsystem.

[0017] In addition to the aspects described above and any possible implementation, a further implementation is provided, wherein adjusting the key parameters of each subsystem based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem includes:

[0018] For each subsystem, calculate the product of the interference parameter and the anti-interference performance parameter of each subsystem;

[0019] For each subsystem, if the product is greater than the preset allowable parameter fluctuation range of the key parameter of each subsystem, then the difference between the product and the preset allowable parameter fluctuation range of the key parameter of each subsystem is calculated.

[0020] If the quotient of the difference corresponding to any subsystem in each subsystem and the preset allowable parameter fluctuation range of any subsystem is less than the preset threshold, then it is determined that only the key parameter of any subsystem needs to be adjusted once.

[0021] If the quotient of the difference between any subsystem and the preset allowable parameter fluctuation range of any subsystem is not less than a preset threshold, then it is determined that the key parameters of any subsystem need to be adjusted multiple times.

[0022] In addition to the aspects described above and any possible implementations, a further implementation is provided in which, after determining that only one adjustment of the key parameters of any of the subsystems is required, the method further includes:

[0023] The adjustment time of the key parameters of any subsystem is determined based on the influence propagation time of the key parameters of any subsystem and the control response time of the key parameters of any subsystem.

[0024] For any of the subsystems, the adjustment range of the key parameter is determined based on the interference parameter, the anti-interference performance parameter of the subsystem, and the preset allowable parameter fluctuation range of the key parameter of the subsystem.

[0025] In addition to the aspects and any possible implementations described above, a further implementation is provided in which, after determining that key parameters of any of the subsystems need to be adjusted multiple times, the method further includes:

[0026] Based on the interference parameters, the anti-interference performance parameters of any subsystem, and the preset allowable parameter fluctuation range of the key parameters of any subsystem, determine the number of adjustments required for the key parameters of any subsystem.

[0027] In addition to the aspects and any possible implementations described above, a further implementation is provided in which, after determining that key parameters of any of the subsystems need to be adjusted multiple times, the method further includes:

[0028] Based on the preset allowable parameter fluctuation range of the key parameter of any of the subsystems, calculate the required adjustment range of the key parameter each time;

[0029] The adjustment time of each key parameter is determined based on the influence propagation time of any subsystem, the control response time of the key parameter of any subsystem, and the current number of adjustments of the key parameter of any subsystem.

[0030] According to a second aspect of this disclosure, an ethylene plant control system is provided. The system includes:

[0031] The first acquisition module is used to acquire the interference parameters of the pyrolysis furnace;

[0032] The second acquisition module is used to acquire the influence transmission time required for the interference parameters of the pyrolysis furnace to affect the separation system;

[0033] The third acquisition module is used to acquire the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system.

[0034] The adjustment module is used to adjust the key parameters of the separation system according to the interference parameters, the influence transmission time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time.

[0035] According to a third aspect of this disclosure, an electronic device is provided. The electronic device includes a memory and a processor, wherein the memory stores a computer program, and the processor executes the program to implement the method described above.

[0036] According to a fourth aspect of this disclosure, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the method according to a first aspect of this disclosure.

[0037] In this disclosure, after obtaining the interference parameters of the pyrolysis furnace, the influence transmission time required for the interference parameters of the pyrolysis furnace to affect the separation system, the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system, the key parameters of the separation system can be automatically adjusted according to the interference parameters, the influence transmission time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time. This avoids the pyrolysis furnace from interfering with the separation effect of the separation system, or even causing unqualified products and quality accidents.

[0038] It should be understood that the description in the Summary of the Invention is not intended to limit the key or essential features of the embodiments of this disclosure, nor is it intended to restrict the scope of this disclosure. Other features of this disclosure will become readily apparent from the following description. Attached Figure Description

[0039] The above and other features, advantages, and aspects of each embodiment of this disclosure will become more apparent from the accompanying drawings and the following detailed description. The drawings are provided for a better understanding of the invention and are not intended to limit the scope of this disclosure. In the drawings, the same or similar reference numerals denote the same or similar elements, wherein:

[0040] Figure 1 A flowchart of an ethylene plant control method according to an embodiment of the present disclosure is shown;

[0041] Figure 2 A block diagram of an ethylene plant control system according to an embodiment of the present disclosure is shown;

[0042] Figure 3A block diagram of another ethylene plant control system according to an embodiment of the present disclosure is shown;

[0043] Figure 4 A block diagram of an exemplary electronic device capable of implementing embodiments of the present disclosure is shown. Detailed Implementation

[0044] To make the objectives, technical solutions, and advantages of the embodiments of this disclosure clearer, the technical solutions of the embodiments of this disclosure will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this disclosure, and not all embodiments. Based on the embodiments of this disclosure, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this disclosure.

[0045] Furthermore, the term "and / or" in this article is merely a description of the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A existing alone, A and B existing simultaneously, or B existing alone. Additionally, the character " / " in this article generally indicates that the preceding and following related objects have an "or" relationship.

[0046] Figure 1 A flowchart of an ethylene plant control method 100 according to an embodiment of the present disclosure is shown. The ethylene plant includes a cracking furnace and a separation system connected downstream of the cracking furnace. Method 100 may include:

[0047] Step 110: Obtain the interference parameters of the pyrolysis furnace;

[0048] An ethylene plant is a whole, and its process flow includes cracking reaction and separation process. The equipment for cracking reaction is the cracking furnace, which can be used to react ethylene, and its product is ethylene. The reactants can be propane, or naphtha, propane, butane, ethane, etc. The equipment for separation process is called separation system, which includes multiple distillation columns, such as high-pressure depropane column, low-pressure depropane column, demethan column, deethane column, etc.

[0049] Step 120: Obtain the influence propagation time required for the interference parameters of the pyrolysis furnace to affect the separation system;

[0050] The impact propagation time refers to the time difference between the time it takes for the interference parameter to affect the key parameters in the separation system (i.e., the time it takes for the key parameters to change after the interference parameter is generated) and the time when the interference parameter is generated.

[0051] Step 130: Obtain the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system;

[0052] Control response time refers to the time it takes for the key parameters of the separation system to reach a new steady state (i.e., the set value of the key parameter ± the preset allowable fluctuation range of the key parameter).

[0053] Step 140: Adjust the key parameters of the separation system according to the interference parameters, the influence transmission time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time.

[0054] After obtaining the interference parameters of the pyrolysis furnace, the time required for the interference parameters of the pyrolysis furnace to affect the separation system, the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system, the key parameters of the separation system can be automatically adjusted according to the interference parameters, the influence transmission time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time. This will prevent the interference from the pyrolysis furnace from affecting the separation effect of the separation system, or even causing unqualified products and quality accidents.

[0055] In some embodiments, the separation system includes multiple subsystems;

[0056] A separation system is used to achieve separation and may include multiple distillation columns, each of which is a subsystem.

[0057] The process of acquiring the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system includes:

[0058] Obtain the anti-interference performance parameters of each subsystem in the multiple subsystems, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem;

[0059] The adjustment of key parameters of the separation system based on the interference parameters, the influence propagation time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time includes:

[0060] The key parameters of each subsystem are adjusted based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem.

[0061] By acquiring the anti-interference performance parameters of each subsystem, the preset allowable fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem, the key parameters of each subsystem can be automatically adjusted according to the interference parameters, the impact transmission time, the anti-interference performance parameters of each subsystem, the preset allowable fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem. Thus, after interference occurs in the pyrolysis furnace, the key parameters of each downstream subsystem can be automatically adjusted to offset the impact of the interference, thereby avoiding the impact of interference on the separation effect of the separation system, or even the generation of unqualified products and quality accidents.

[0062] In some embodiments, adjusting the key parameters of each subsystem based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem includes:

[0063] For each subsystem, calculate the product of the interference parameter and the anti-interference performance parameter of each subsystem;

[0064] For each subsystem, if the product is less than the preset allowable parameter fluctuation range of the key parameter of each subsystem, then there is no need to adjust the key parameter of each subsystem.

[0065] That is, assuming the interference parameter is a, and the anti-interference performance parameter of the i-th subsystem in each subsystem is x. i If the preset allowable fluctuation range of the key parameters of the i-th subsystem is yi, then if the i-th subsystem satisfies a*x i ≤y i If so, then the i-th subsystem does not need to be adjusted.

[0066] For each subsystem, if the product is less than the preset allowable parameter fluctuation range of the key parameter of each subsystem, it indicates that the interference caused by the interference parameter is small. Therefore, after the above interference parameter is generated in the cracking furnace, each subsystem can overcome the interference autonomously without adjusting the key parameter.

[0067] In some embodiments, adjusting the key parameters of each subsystem based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem includes:

[0068] For each subsystem, calculate the product of the interference parameter and the anti-interference performance parameter of each subsystem;

[0069] For each subsystem, if the product is greater than the preset allowable parameter fluctuation range of the key parameter of each subsystem, then the difference between the product and the preset allowable parameter fluctuation range of the key parameter of each subsystem is calculated.

[0070] For each subsystem, if the product is greater than the preset allowable fluctuation range of the key parameter of each subsystem, it indicates that the interference caused by the interference parameter is large. Therefore, the key parameter of each subsystem must be automatically adjusted to overcome the above interference.

[0071] If the quotient of the difference corresponding to any subsystem in each subsystem and the preset allowable parameter fluctuation range of any subsystem is less than the preset threshold, then it is determined that only the key parameter of any subsystem needs to be adjusted once.

[0072] If the quotient of the difference between any subsystem and the preset allowable parameter fluctuation range of any subsystem is not less than a preset threshold, then it is determined that the key parameters of any subsystem need to be adjusted multiple times.

[0073] For each subsystem, if the difference between the product of the interference parameter and the anti-interference performance parameter of each subsystem and the preset allowable fluctuation range of the key parameter of each subsystem, and the quotient of the preset allowable fluctuation range of any subsystem, is less than a preset threshold, it indicates that although the interference caused by the interference parameter is large, it is not very large and has little impact, and can be quickly overcome. Therefore, it is determined that only one adjustment of the key parameter of any subsystem is needed. However, if the quotient of the difference corresponding to any subsystem and the preset allowable fluctuation range of any subsystem is not less than the preset threshold, it indicates that the interference caused by the interference parameter is relatively large and cannot be quickly overcome. Therefore, the key parameter of any subsystem needs to be adjusted multiple times.

[0074] In some embodiments, after determining that only one key parameter of any of the subsystems needs to be adjusted, the method further includes:

[0075] The adjustment time of the key parameters of any subsystem is determined based on the influence propagation time of the key parameters of any subsystem and the control response time of the key parameters of any subsystem.

[0076] For any of the subsystems, the adjustment range of the key parameter is determined based on the interference parameter, the anti-interference performance parameter of the subsystem, and the preset allowable parameter fluctuation range of the key parameter of the subsystem.

[0077] Once it is determined that only one adjustment is needed for the key parameter of any subsystem, the adjustment time of the key parameter of any subsystem can be accurately and automatically determined based on the influence transmission time and control response time of the key parameter of any subsystem; and the adjustment range of the key parameter can be accurately and automatically determined based on the interference parameter, the anti-interference performance parameter of any subsystem, and the preset allowable parameter fluctuation range of the key parameter of any subsystem.

[0078] Specifically, assuming the interference parameter is a, and the anti-interference performance parameter of the i-th subsystem in each subsystem is x. i The preset allowable fluctuation range of the key parameter of the i-th subsystem is yi, and the influence propagation time of the key parameter of the i-th subsystem is t. i The control response time of the key parameter of the i-th subsystem is t′. i Then, when the i-th subsystem satisfies a*x i >y i and At that time, the key parameters of the i-th subsystem only need to be adjusted in one step:

[0079] The key control adjustment times and amplitudes are as follows:

[0080] Time ct[i][j] = t i -t′ i (Where i represents the nth subsystem, and j represents the number of adjustments)

[0081] Amplitude z[i][j]=a*x i -y i

[0082] In some embodiments, after determining that key parameters of any of the subsystems need to be adjusted multiple times, the method further includes:

[0083] Based on the interference parameters, the anti-interference performance parameters of any subsystem, and the preset allowable parameter fluctuation range of the key parameters of any subsystem, determine the number of adjustments required for the key parameters of any subsystem.

[0084] Based on the interference parameters, the anti-interference performance parameters of any subsystem, and the preset allowable fluctuation range of the key parameters of any subsystem, the number of adjustments required for the key parameters of any subsystem can be accurately and automatically determined. The specific adjustment formula is as follows:

[0085] Taking the number of adjustments m of the i-th subsystem as an example, The explanations for the other parameters are the same as above, and will not be repeated here.

[0086] In some embodiments, after determining that key parameters of any of the subsystems need to be adjusted multiple times, the method further includes:

[0087] Based on the preset allowable parameter fluctuation range of the key parameter of any of the subsystems, calculate the required adjustment range of the key parameter each time;

[0088] Based on the preset allowable fluctuation range of the key parameters of any of the subsystems, the required adjustment range of the key parameters each time can be accurately and automatically calculated. The specific adjustment formula is as follows:

[0089] Taking the i-th subsystem as an example, the adjustment range required by the i-th subsystem each time is:

[0090] z[i][j]=y i The value of j ranges from 1 to m. The other parameters are explained as above and will not be repeated here.

[0091] The adjustment time of each key parameter is determined based on the influence propagation time of any subsystem, the control response time of the key parameter of any subsystem, and the current number of adjustments of the key parameter of any subsystem.

[0092] Based on the impact propagation time of any subsystem, the control response time of the key parameter of any subsystem, and the current adjustment count j of the key parameter of any subsystem, the adjustment time of the key parameter each time can be accurately and automatically determined. The adjustment time of the key parameter each time refers to how long after the key parameter needs to be adjusted, with reference to the time when the disturbance parameter is generated.

[0093] Based on the impact propagation time of any subsystem, the control response time of the key parameter of any subsystem, and the current number of adjustments of the key parameter of any subsystem, the adjustment time of the key parameter each time can be accurately and automatically determined. The specific adjustment formula is as follows:

[0094] Taking the i-th subsystem as an example, the adjustment time ct[i][j] required for the i-th subsystem each time is:

[0095] ct[i][j]=t i -t′ i *(j), where j ranges from 1 to m. The other parameters are explained as above and will not be repeated here.

[0096] The following will combine Figure 2 This disclosure describes the control method for an ethylene plant.

[0097] Figure 2The explanations of each number are as follows: ① indicates the system interference characteristic parameters; ② indicates the anti-interference performance parameters, unit fluctuation constraints (i.e., the preset allowable parameter fluctuation range), and control response time of unit 1; ③ indicates the anti-interference performance parameters, unit fluctuation constraints, and control response time of unit n; ④ indicates the time and magnitude at which the key parameters of each unit of the system need to be adjusted.

[0098] This disclosure provides a control method for an ethylene plant. First, the system disturbance characteristic parameters are transmitted to the control parameter calculation module. Then, the anti-interference performance parameters of each unit (i.e., each subsystem) in the downstream system (i.e., the separation system) are transmitted to the control parameter calculation module. Finally, the control parameter calculation module calculates the adjustment time and adjustment range of key parameters based on the disturbance and anti-interference characteristics and sends them to the control system for component stability control. The specific steps are as follows:

[0099] The system is divided into units, the system production data is monitored, the system interference characteristic parameters are obtained, and the system interference characteristic parameters are transmitted to the control parameter calculation module.

[0100] After obtaining the anti-interference performance parameters, unit fluctuation constraints, and control response time of each unit in the system, the anti-interference performance parameters and unit fluctuation constraints of each unit in the system are transmitted to the control parameter calculation module.

[0101] The control parameter calculation module calculates the time and magnitude of the parameters that the system needs to adjust according to the interference and anti-interference characteristic parameters, and sends the calculation results to the control system for component stability control.

[0102] The system interference characteristic parameters mentioned in step (1) include the amplitude of the interference (i.e., the interference parameter) and the time it takes for the interference to propagate to each unit of the subsequent system (i.e., the impact propagation time). The amplitude of the interference needs to be measured by the measurement system at all times. The time it takes for the interference to propagate to each unit of the subsequent system can be obtained in advance by personnel through historical data, on-site testing, or big data models.

[0103] The anti-interference performance parameters of each unit in the post-system described in step (2) are expressed as the deviation of the key parameters of each unit from the set value when the amplitude of the interference is unit 1. The unit fluctuation constraint is expressed as the allowable fluctuation range of the key parameters in each unit. The control response time is the time to reach a new steady state after the key parameters are adjusted (i.e., the set value of the key parameter ± the allowable fluctuation range of the key parameter).

[0104] The calculation method described in step (3) is as follows:

[0105] Let the number of units in the subsequent system be n, and the change amplitude of the disturbance variable (i.e., the disturbance parameter) be a. The time it takes for the disturbance to propagate to each unit in the subsequent system (i.e., the time for the impact of the key parameters of each subsystem to propagate) after it occurs are t1…t2.n The anti-interference parameters of each unit in the system (i.e., the anti-interference performance parameters of each subsystem) are x1…x n The fluctuation constraints of each unit in the subsequent system (i.e., the preset allowable parameter fluctuation range of each subsystem) are y1…y n The control response times of each unit in the subsequent system (i.e., the control response times of each subsystem) are t′1…t′. n The calculation method for the adjustment time and amplitude (i.e., adjustment amplitude) of the key parameters of each unit is as follows:

[0106] When the i-th unit satisfies a*x i ≤y i When the i-th unit does not need to be adjusted:

[0107] Adjustment time z[i][j]=0(1) (where i represents the nth unit, j represents the nth adjustment, and the value of i ranges from 1 to n)

[0108] When the i-th unit satisfies a*x i >y i and The i-th unit only requires one adjustment step:

[0109] The adjustment time and magnitude of the key parameters of the i-th unit are respectively

[0110] Time ct[i][j] = t i -t′ i (2)

[0111] Amplitude z[i][j]=a*x i -y i (3)

[0112] When the i-th unit satisfies a*x i >y i and The i-th unit requires multiple adjustments;

[0113] Number of adjustments for the i-th unit

[0114] Amplitude z[i][j]=y i The value of j ranges from 1 to m (5)

[0115] Time ct[i][j] = t i -t′ i *(j) (6)

[0116] Where m represents the number of adjustment steps (i.e., the number of adjustments) required for a unit. If the calculated m has a decimal point, regardless of whether the decimal places of m are greater than or less than 5, the number of decimal places should be rounded up by 1. For example, when m = 0.2, m should be adjusted to 1. b is the percentage of a unit that cannot overcome interference. B (value range 0-10, preferably 0.5-2, generally 0.5) is a manually set parameter, and its initial value is determined according to the proportion of each unit that cannot overcome interference. Units that can overcome interference are not included in the calculation (i.e., the denominator in b[i] is the sum of the values ​​of (a*xi-yi) / yi that cannot overcome interference), that is:

[0117]

[0118] It should be noted that if there are multiple interference parameters, each interference parameter a needs to be individually applied to the above formulas (1)-(7) to determine the adjustment time and adjustment range of the key parameters of each unit under each interference.

[0119] If multiple different interference parameters correspond to multiple different adjustments of the same key parameter, then it is determined whether the differences in the multiple adjustment times of the key parameter are large. If the differences in the multiple adjustment times of the key parameter are not large, the adjustment is made according to the largest adjustment range among the multiple adjustment ranges of the key parameter. However, if the largest adjustment range exceeds the preset allowable fluctuation range of the key parameter, the adjustment is made according to the preset allowable fluctuation range of the key parameter. If the differences in the multiple adjustment times of the key parameter are large, the corresponding adjustment range is adjusted sequentially according to the adjustment times of the key parameter calculated under each interference parameter.

[0120] Taking the separation system of an ethylene plant as an example, the main disturbance is the change in system load when one of the cracking furnaces is shut down. The separation system is divided into sub-units: high-pressure propane stripper, low-pressure propane stripper, demethanizer, deethaner, ethylene distillation column, and propylene distillation column.

[0121] When one furnace in the cracking furnace is shut down, the system load change is a = 20 t / h. After the disturbance occurs, the time it takes for the disturbance to propane removal tower, low-pressure propane removal tower, demethanizer tower, deethaner tower, ethylene distillation tower, and propylene distillation tower to be transmitted to each unit is t1 to t6, which are 30 min, 40 min, 50 min, 60 min, 70 min, and 80 min, respectively. The anti-interference parameters x1 to x6 of the sensitive plates of each tower are 0.3℃ / t / h, 0.15℃ / t / h, 0.025℃ / t / h, 0.025℃ / t / h, 0.0125℃ / t / h, and 0.0125℃ / t / h, respectively. Then, the fluctuation constraints y1 to y6 of each unit of the system are 2℃, 2℃, 1℃, 1℃, 0.5℃, and 0.5℃, respectively. Then, the control response times t′1…t′6 of each unit of the system are 3 min, 4 min, 5 min, 6 min, 7 min, and 8 min, respectively.

[0122] The system monitors and collects interference characteristic parameters from the data, and then transmits them to the control calculation module.

[0123] The system collects the anti-interference performance parameters, unit fluctuation constraints, and control response time of each unit in the system and transmits them to the control calculation module.

[0124] The adjustment time and magnitude of the key parameters for each unit are calculated by the control parameter calculation module as follows:

[0125] High-pressure propane stripper: 20 × 0.3 = 6 > 2. The process needs adjustment;

[0126] Low-pressure propane stripper: 20 × 0.15 = 3 > 2. Only one adjustment is needed;

[0127] Demethanizer: 20 × 0.025 = 0.5 < 1, no adjustment is needed;

[0128] Ethane stripper: 20 × 0.025 = 0.5 < 1, no adjustment is needed;

[0129] Ethylene distillation column: 20 × 0.0125 = 0.25 < 0.5, no adjustment is required;

[0130] Propylene distillation column: 20 × 0.0125 = 0.25 < 0.5, no adjustment is required;

[0131] The percentage of high-pressure propane stripping tower units that cannot overcome interference is calculated as follows:

[0132]

[0133] Where, if the i-th unit satisfies a*x i ≤y i If the value is 0, it means that the i-th unit can overcome the interference and no adjustment is needed; otherwise, it means that it cannot overcome the interference. According to the calculation above, the last four units of the above six units can overcome the interference. Therefore, when calculating b[i], the denominator does not need to include (a*xi-yi) / yi of the last four units.

[0134] The percentage of low-pressure propane stripping tower units that cannot overcome interference is calculated as follows:

[0135]

[0136] The adjustment time and range of key parameters for the high-pressure propane stripper are calculated as follows:

[0137] Rounded down to 1

[0138] z[1][1]=2

[0139] ct[1][1]=30-3=27min

[0140] That is, 27 minutes after the interference occurs, the temperature of the sensitive plate is adjusted by 2°C.

[0141] The adjustment time and range of the key parameters for the low-pressure propane stripper are calculated as follows:

[0142] ct[2][1]=40-4=36min

[0143] z[2][1]=20×0.15-2=1℃

[0144] That is, 27 minutes after the interference occurs, the temperature of the sensitive plate is adjusted by 1℃.

[0145] It should be noted that, for each of the foregoing method embodiments, for the sake of simplicity, they are all described as a series of actions. However, those skilled in the art should understand that this disclosure is not limited to the described order of actions, because according to this disclosure, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also understand that the embodiments described in the specification are all optional embodiments, and the actions and modules involved are not necessarily essential to this disclosure.

[0146] The above is an introduction to the method embodiments. The following describes the solution described in this disclosure further through device embodiments.

[0147] Figure 3 A block diagram of an ethylene plant control system 300 according to an embodiment of the present disclosure is shown. Figure 3 As shown, system 300 includes:

[0148] The first acquisition module 310 is used to acquire the interference parameters of the pyrolysis furnace;

[0149] The second acquisition module 320 is used to acquire the influence transmission time required for the interference parameters of the pyrolysis furnace to affect the separation system;

[0150] The third acquisition module 330 is used to acquire the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system.

[0151] The adjustment module 340 is used to adjust the key parameters of the separation system according to the interference parameters, the influence transmission time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time.

[0152] Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the described module can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0153] According to embodiments of the present disclosure, the present disclosure also provides an electronic device and a non-transitory computer-readable storage medium storing computer instructions.

[0154] Figure 4 A schematic block diagram of an electronic device 800 that can be used to implement embodiments of the present disclosure is shown. The electronic device is intended to represent every type of digital computer, such as a laptop computer, desktop computer, workbench, personal digital assistant, server, blade server, mainframe computer, and other suitable computer. The electronic device may also represent every type of mobile device, such as a personal digital processor, cellular phone, smartphone, wearable device, and other similar computing device. The components shown herein, their connections and relationships, and their functions are merely illustrative and are not intended to limit the implementation of the present disclosure described and / or claimed herein.

[0155] Device 800 includes a computing unit 801, which can perform various appropriate actions and processes based on a computer program stored in read-only memory (ROM) 802 or a computer program loaded from storage unit 808 into random access memory (RAM) 803. RAM 803 may also store various programs and data required for the operation of device 800. The computing unit 801, ROM 802, and RAM 803 are interconnected via bus 804. Input / output (I / O) interface 805 is also connected to bus 804.

[0156] Multiple components in device 800 are connected to I / O interface 805, including: input unit 806, such as keyboard, mouse, etc.; output unit 807, such as various types of displays, speakers, etc.; storage unit 808, such as disk, optical disk, etc.; and communication unit 809, such as network card, modem, wireless transceiver, etc. Communication unit 809 allows device 800 to exchange information / data with other devices through computer networks such as the Internet and / or various types of telecommunications networks.

[0157] The computing unit 801 can be a general-purpose and / or dedicated processing component with processing and computing capabilities. Some examples of the computing unit 801 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), a dedicated artificial intelligence (AI) computing chip, a computing unit that runs machine learning model algorithms, a digital signal processor (DSP), and any suitable processor, controller, microcontroller, etc. The computing unit 801 performs each of the methods and processes described above, such as method 100. For example, in some embodiments, method 100 may be implemented as a computer software program tangibly contained in a machine-readable medium, such as storage unit 808. In some embodiments, part or all of the computer program may be loaded and / or installed on device 800 via ROM 802 and / or communication unit 809. When the computer program is loaded into RAM 803 and executed by the computing unit 801, one or more steps of method 100 described above may be performed. Alternatively, in other embodiments, the computing unit 801 may be configured to perform method 100 by any other suitable means (e.g., by means of firmware).

[0158] Each embodiment of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field-programmable gate arrays (FPGAs), application-specific integrated circuits (ASICs), application-specific standard products (ASSPs), systems-on-a-chip (SoCs), payload-programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. Each of these embodiments may include: implementations in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which may be a dedicated or general-purpose programmable processor, capable of receiving data and instructions from a storage system, at least one input device, and at least one output device, and transmitting data and instructions to the storage system, the at least one input device, and the at least one output device.

[0159] The program code used to implement the methods of this disclosure may be written in any combination of one or more programming languages. This program code may be provided to a processor or controller of a general-purpose computer, special-purpose computer, or other programmable data processing apparatus, such that when executed by the processor or controller, the program code causes the functions / operations specified in the flowcharts and / or block diagrams to be implemented. The program code may be executed entirely on a machine, partially on a machine, as a standalone software package partially on a machine and partially on a remote machine, or entirely on a remote machine or server.

[0160] In the context of this disclosure, a machine-readable medium can be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, apparatus, or device. A machine-readable medium can be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium can be, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. More specific examples of machine-readable storage media include electrical connections based on one or more wires, portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

[0161] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device for displaying information to the user (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor); and a keyboard and pointing device (e.g., a mouse or trackball) through which the user provides input to the computer. Other types of devices can also be used to provide interaction with the user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including sound input, voice input, or tactile input).

[0162] The systems and technologies described herein can be implemented in computing systems that include backend components (e.g., as a data server), or computing systems that include middleware components (e.g., an application server), or computing systems that include frontend components (e.g., a user computer with a graphical user interface or web browser through which a user can interact with embodiments of the systems and technologies described herein), or any combination of such backend, middleware, or frontend components. The components of the system can be interconnected via digital data communication of any form or medium (e.g., a communication network). Examples of communication networks include local area networks (LANs), wide area networks (WANs), and the Internet.

[0163] Computing systems can include clients and servers. Clients and servers are generally located far apart and typically interact via communication networks. Client-server relationships are created by computer programs running on the respective computers and having a client-server relationship with each other. Servers can be cloud servers, servers in distributed systems, or servers incorporating blockchain technology.

[0164] It should be understood that steps can be reordered, added, or deleted using each of the above-described forms of the process. For example, each step described in this disclosure can be executed in parallel, sequentially, or in a different order, as long as the desired result of the technical solution disclosed in this disclosure can be achieved, and this is not limited herein. The above specific embodiments do not constitute a limitation on the scope of protection of this disclosure. Those skilled in the art should understand that each type of modification, combination, sub-combination, and substitution can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of this disclosure should be included within the scope of protection of this disclosure.

Claims

1. A method for controlling an ethylene plant, the ethylene plant comprising: A pyrolysis furnace and a separation system connected downstream of the pyrolysis furnace, characterized in that the method comprises: Obtain the interference parameters of the pyrolysis furnace; The time required for the interference parameters of the pyrolysis furnace to affect the separation system is determined. Obtain the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system; The key parameters of the separation system are adjusted based on the interference parameters, the influence propagation time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time. The separation system includes multiple subsystems; The process of acquiring the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system includes: Obtain the anti-interference performance parameters of each subsystem in the multiple subsystems, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem; The adjustment of key parameters of the separation system based on the interference parameters, the influence propagation time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time includes: Based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem, the key parameters of each subsystem are adjusted. The step of adjusting the key parameters of each subsystem based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem includes: For each subsystem, calculate the product of the interference parameter and the anti-interference performance parameter of each subsystem; For each subsystem, if the product is less than the preset allowable parameter fluctuation range of the key parameter of each subsystem, then there is no need to adjust the key parameter of each subsystem.

2. The method according to claim 1, characterized in that, The step of adjusting the key parameters of each subsystem based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem includes: For each subsystem, calculate the product of the interference parameter and the anti-interference performance parameter of each subsystem; For each subsystem, if the product is greater than the preset allowable parameter fluctuation range of the key parameter of each subsystem, then the difference between the product and the preset allowable parameter fluctuation range of the key parameter of each subsystem is calculated. If the quotient of the difference corresponding to any subsystem in each subsystem and the preset allowable parameter fluctuation range of any subsystem is less than the preset threshold, then it is determined that only the key parameter of any subsystem needs to be adjusted once. If the quotient of the difference corresponding to any subsystem in each subsystem and the preset allowable parameter fluctuation range of any subsystem is not less than a preset threshold, then it is determined that the key parameters of any subsystem need to be adjusted multiple times.

3. The method according to claim 2, characterized in that, After determining that only one adjustment of the key parameter of any of the subsystems is required, the method further includes: The adjustment time of the key parameters of any subsystem is determined based on the influence propagation time of the key parameters of any subsystem and the control response time of the key parameters of any subsystem. For any of the subsystems, the adjustment range of the key parameter is determined based on the interference parameter, the anti-interference performance parameter of the subsystem, and the preset allowable parameter fluctuation range of the key parameter of the subsystem.

4. The method according to claim 2, characterized in that, After determining that multiple adjustments to the key parameters of any of the subsystems are required, the method further includes: Based on the interference parameters, the anti-interference performance parameters of any subsystem, and the preset allowable parameter fluctuation range of the key parameters of any subsystem, determine the number of adjustments required for the key parameters of any subsystem.

5. The method according to claim 2, characterized in that, After determining that multiple adjustments to the key parameters of any of the subsystems are required, the method further includes: Based on the preset allowable parameter fluctuation range of the key parameter of any of the subsystems, calculate the required adjustment range of the key parameter each time; The adjustment time of each key parameter is determined based on the influence propagation time of any subsystem, the control response time of the key parameter of any subsystem, and the current number of adjustments of the key parameter of any subsystem.

6. A control system for an ethylene plant, the ethylene plant comprising: A pyrolysis furnace and a separation system connected downstream of the pyrolysis furnace, characterized in that the system comprises: The first acquisition module is used to acquire the interference parameters of the pyrolysis furnace; The second acquisition module is used to acquire the influence transmission time required for the interference parameters of the pyrolysis furnace to affect the separation system; The third acquisition module is used to acquire the anti-interference performance parameters of the separation system, the preset allowable parameter fluctuation range, and the control response time of the key parameters of the separation system. The adjustment module is used to adjust the key parameters of the separation system according to the interference parameters, the influence transmission time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time. The separation system includes multiple subsystems; The third acquisition module is specifically used for: Obtain the anti-interference performance parameters of each subsystem in the multiple subsystems, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem; The adjustment of key parameters of the separation system based on the interference parameters, the influence propagation time, the anti-interference performance parameters, the preset allowable parameter fluctuation range, and the control response time includes: Based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem, the key parameters of each subsystem are adjusted. The step of adjusting the key parameters of each subsystem based on the interference parameters, the influence propagation time, the anti-interference performance parameters of each subsystem, the preset allowable parameter fluctuation range of the key parameters of each subsystem, and the control response time of the key parameters of each subsystem includes: For each subsystem, calculate the product of the interference parameter and the anti-interference performance parameter of each subsystem; For each subsystem, if the product is less than the preset allowable parameter fluctuation range of the key parameter of each subsystem, then there is no need to adjust the key parameter of each subsystem.

7. An electronic device, characterized in that, include: At least one processor; as well as A memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor to enable the at least one processor to perform the method of any one of claims 1-5.

8. A non-transitory computer-readable storage medium storing computer instructions, characterized in that, The computer instructions are used to cause the computer to perform the method according to any one of claims 1-5.

Citation Information

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