Variable-temperature Dewar system capable of keeping dynamic vacuum and assembling method of variable-temperature Dewar system

CN120907666APending Publication Date: 2025-11-07BEIJING CHIPTRON TECH CO LTD

Patent Information

Application Number
CN202510869917.3
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-06-26
Publication Date
2025-11-07

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Abstract

The invention relates to a variable-temperature Dewar system capable of keeping dynamic vacuum and an assembling method thereof.The variable-temperature Dewar system comprises a Dewar body, an exhaust mechanism, a refrigerating machine and a sealing mechanism, the Dewar body and a window assembly are connected in a sealed mode, so that construction of a vacuum closed space and integration of a refrigerating assembly and a shell are achieved; the stability of a performance test environment of an infrared detector chip is ensured, establishment and maintenance of a dynamic vacuum environment are realized through pipeline communication of the exhaust mechanism and the window assembly, the interior of the system can continuously maintain a high vacuum state, and reliable sealing of each joint of the Dewar system is realized through cooperation with multi-point sealing of the sealing mechanism. In addition, precise temperature control is achieved through cooperation of the refrigerating machine and the refrigerating assembly, the infrared detector chip can work stably at the preset temperature, and high-precision performance testing of the infrared detector chip is achieved through cooperation of all functional modules.
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Citation Information

Patent Citations

  • Detachable integrated temperature changing testing Dewar and assembly thereof

    CN106441401A

  • Variable-temperature middle-measurement dewar and dewar component for chip testing

    CN109084902A

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    CN119471303A

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    CN119716498A

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