A bms lithium battery chip test detection equipment

Abstract

This invention discloses a BMS lithium battery chip testing and inspection device. The invention relates to the field of lithium battery chip testing technology and includes a frame. A lifting cylinder is installed at the top center of the frame. A test piece is installed below the lifting cylinder, and a positioning shell is installed below the test piece. A chip is installed inside the positioning shell. A guide rail is fitted to the front of the positioning shell to guide the chip. A horizontal mounting plate is installed on the top of the test piece. A test probe is assembled at the end of the test piece away from the T-shaped hanging plate. An H-shaped sliding buckle is fitted in the middle of the top of the horizontal mounting plate. This BMS lithium battery chip testing and inspection device allows for convenient replacement of damaged test probes through simple pull-out and push-moving operations, maintaining the continuous use of the test piece and continuous testing operations. The test probes are modularly designed specifically for the test piece, allowing for automatic replacement of damaged test probes without the need for experienced operators, ensuring the continued use of the test piece.

Description

Technical Field

[0001] This invention relates to the field of lithium battery chip testing technology, specifically to a BMS lithium battery chip testing and inspection device. Background Technology

[0002] As a core component of modern energy storage devices, lithium batteries directly impact the user experience and lifespan of electric vehicles, smartphones, and other devices due to their performance and safety. The Battery Management System (BMS) plays a crucial role in lithium battery management. Testing the lithium battery chips within the BMS is a key step in ensuring their performance and safety. However, current BMS lithium battery chip testing equipment on the market still suffers from several shortcomings in its mechanical design. These shortcomings include: test probes are prone to fatigue and breakage during frequent testing; existing test probes and testing head assemblies are integrated and cannot be replaced; moreover, replacing these test probes requires specialized technical personnel for disassembly and replacement, failing to meet the requirements for efficient operation and resulting in waste of the entire testing head assembly, increasing losses and investment costs.

[0003] Therefore, there is an urgent need for a BMS lithium battery chip testing and inspection equipment to improve testing efficiency, reduce losses and investment costs, and simplify the subsequent inspection and maintenance process of the test head assembly. Summary of the Invention

[0004] To solve the above-mentioned technical problems, the present invention is implemented through the following technical solution:

[0005] A BMS lithium battery chip testing and inspection device includes a frame. A lifting cylinder is installed at the top center of the frame. A test piece is installed below the lifting cylinder. A positioning shell is installed below the test piece. Three positioning shells are equally spaced and fitted onto the base plate of the frame. A chip is installed inside the positioning shell. A guide rail is fitted to the front of the positioning shell to guide the chip. The guide rail corresponds one-to-one with the positioning shell. A material guiding assembly is installed at the rear center of the positioning shell and bolted to the base plate of the frame. A T-shaped hanging plate is installed between the test piece and the top plate of the frame. An air pump is fitted into the middle right side of the base plate of the frame. A data acquisition box is bolted to the middle right side of the top plate of the frame. The data acquisition box is electrically connected to the test piece and is used to collect test data.

[0006] A horizontal mounting plate is installed on the top of the test piece. A test probe is assembled at the end of the test piece away from the T-shaped hanging plate. An H-shaped sliding buckle is fitted into the middle of the top of the horizontal mounting plate. A short screw is threaded onto the top corner of the horizontal mounting plate. The horizontal mounting plate is threaded to the test piece via the short screw. A folding spring is fitted inside the horizontal mounting plate. The folding spring is connected to the H-shaped sliding buckle. The H-shaped sliding buckle is slidably installed with the horizontal mounting plate via the folding spring. An L-shaped mounting groove is opened in the middle of the side of the test piece away from the data acquisition box. The test probe is assembled and limited in the L-shaped mounting groove of the test piece by the cooperation of the horizontal mounting plate and the short screw. A short pin is inserted into the top of the horizontal mounting plate on the side away from the data acquisition box. The short pin is used to limit and block the test probe inside the L-shaped mounting groove.

[0007] Preferably, the test piece has a cavity in the middle of its top, and the cavity is not directly connected to the L-shaped slot. A spring rod is installed symmetrically on the inner side of the cavity. A ball probe is connected to the end of the spring rod near the L-shaped slot. The ball probe is connected to the test piece through the spring rod and the cavity, and is pushed into the L-shaped slot by the spring rod. An arc-shaped spring is connected to the inner wall of the L-shaped slot near the cavity. The arc-shaped spring is used to shield the test needle that is fitted into the L-shaped slot, and at the same time prevent the test needle from directly squeezing and damaging the ball probe and the spring rod during the fitting of the test needle into the L-shaped slot, so as to help the test needle smoothly enter the L-shaped slot.

[0008] Preferably, the test needle includes a bow-shaped test needle fitted inside the L-shaped groove. The bow-shaped test needle has a groove at one end near the ball-head probe. The ball-head probe is connected to the bow-shaped test needle through the groove. A short needle is connected to the end of the bow-shaped test needle away from the ball-head probe. An oblique needle is connected to the side of the short needle facing the ball-head probe, and the bottom of the oblique needle is flush with the bottom of the short needle.

[0009] Preferably, a frame is installed inside the positioning shell, and telescopic spring rods are connected to the four corners of the bottom of the frame. The frame is connected to the positioning shell by telescopic spring rods. Shallow foot grooves are symmetrically opened on the top of the frame along the direction of the long edge, and the edges of the shallow foot grooves are all rounded.

[0010] Preferably, a rubber square plate is installed at the top center of the frame, and a circular opening is provided through the top center of the rubber square plate. Small springs are connected to the four bottom corners of the rubber square plate. The rubber square plate is spring-loaded to the frame by the small springs. A short head is fixedly connected to the top of the frame and the part corresponding to the small spring. The frame as a whole is hollow to facilitate heat dissipation.

[0011] Preferably, the chip has pins connected to its side along the direction of its long edge, and the pins correspond to the shallow grooves. The chip is mounted with the frame by the cooperation of the pins and the shallow grooves. The chip is also mounted with the positioning shell by the cooperation of the frame and the telescopic spring rod. The short needle and the angled needle are in contact with the pins. The edges of the shallow grooves are rounded to eliminate the right-angle edges from blocking the pins inside the shallow grooves, thus eliminating the risk of scratches and the risk of the pins being partially damaged when the chip is pushed out of the top of the frame by the feeding assembly.

[0012] Preferably, a controller is installed on the top of the guide rail and on the side near the positioning shell. A valve plate is installed in the middle of the inner side of the guide rail. A DD motor is embedded inside the guide rail. The output end of the DD motor is installed with a pin on the valve plate. The valve plate has a guide branch port at the installation position inside the guide rail. The guide branch port is used to guide abnormal chips to the guide box through the guide branch port. The valve plate is rotated and installed with the guide rail through the cooperation of the DD motor and the guide branch port. The controller is used to control the opening and closing of the valve plate. A guide box is installed at the bottom of the frame. A plate-type jet head is embedded in the end of the guide box near the air pump and is connected to the air pump. The end of the guide box away from the air pump is open to facilitate the individual pushing and collection of defective chips under the push of airflow.

[0013] Preferably, the guide assembly is bolted to a bracket in the middle of the base plate of the frame. An electric push rod is installed in the middle of the bracket, near the top. Guide rods are centrally symmetrically installed around the electric push rod, and these guide rods are telescopically mounted to the bracket. A push plate is installed on the chip-facing side of the bracket. The telescopic end of the electric push rod and the guide rods are both connected to the push plate. The push plate is telescopically mounted to the bracket via the electric push rod and guide rods. A hollow rubber pleated strip is fitted onto the chip-facing side of the push plate, serving as a flexible, deformable contact point between the bottom edge of the push plate and the top of the positioning shell. The structure avoids the risk of the pusher plate scraping against the top of the positioning shell, and also avoids the risk of secondary wear or pressure damage to the chip surface if the pusher plate fails to push the chip out smoothly. This allows the pusher plate to have its own self-protection mechanism for the chip during the chip pushing process from the positioning shell, improving the safety of the testing equipment from chip detection to unloading. Rubber brush plates are connected to the long edges of the top and bottom of the pusher plate to reduce the hard pushing force on the chip and achieve flexible pushing of the chip position. The main purpose of this structural improvement is to protect the chip from secondary damage. The pusher plate is slightly higher than the top of the positioning shell.

[0014] Preferably, a threaded joint is fixedly connected to the middle position of the top of the T-shaped hanging plate, the threaded joint is threadedly connected to the output end of the lifting cylinder, a hollow plate is bolted to the bottom of the T-shaped hanging plate, a pin is bolted to the hollow plate, and the hollow plate is inserted into the horizontal mounting plate through the pin. The horizontal mounting plate is fastened to the hollow plate through an H-shaped sliding buckle and a folding spring.

[0015] Preferably, a flat tube is horizontally inserted into the inner center of the positioning shell. The output end of the air pump is connected to the flat tube. Piston columns are installed at equal intervals on the top of the flat tube. A piston rod is installed in the inner center of the piston column. The piston rod can move up and down within the piston column. The piston rod is installed in conjunction with the flat tube and the air pump to move up and down with the piston column. The piston rod is installed in the middle of the inner side of the positioning shell through the piston column. A rubber pusher is connected to the top of the piston rod. The rubber pusher is installed through the frame. The inner diameter of the rubber pusher is larger than the inner diameter of the round opening, which facilitates pushing the rubber square plate upward with the rubber pusher. By using the rubber square plate to lift the chip from the top of the frame, the chip is lifted up, which facilitates the discharge of subsequent chips and will not cause hard interception or scratch damage to the chip pins.

[0016] The present invention has the following beneficial effects:

[0017] This invention utilizes a short pin to limit and lock the test probe installed inside the L-shaped slot. By removing the short pin at the corresponding position, manually holding the test probe, and pushing it along the direction of the spring rod to press the ball probe, the test probe can be moved away from the data acquisition box, allowing the entire test probe to be removed from the test piece. This enables convenient replacement of locally deformed test probes without disassembling the entire structure of the test piece or removing it from the T-shaped hanging plate. The damaged test probe can be easily replaced by simply pulling and pushing, and then reversing the operation, ensuring the continuous use of the test piece and continuous testing operations.

[0018] By separating the test probe from the structure of the test piece, a specialized modular design was implemented, allowing for the replacement of damaged test probes without the need for experienced operators, thus ensuring the continued use of the test piece. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the external structure of a BMS lithium battery chip testing and inspection device according to the present invention;

[0020] Figure 2 This is a rear view of a BMS lithium battery chip testing and inspection device according to the present invention.

[0021] Figure 3This is a schematic diagram of a partial assembly structure of the guide rail and the frame of the present invention;

[0022] Figure 4 This is a schematic diagram of the assembly structure of the T-shaped hanging plate and the test piece of the present invention;

[0023] Figure 5 This is a schematic diagram of a partial assembly structure of the test piece and the hollow plate of the present invention;

[0024] Figure 6 This is a schematic diagram of a partial assembly structure of the horizontal plate and the hollow plate of the present invention;

[0025] Figure 7 This is a schematic diagram of the back-to-back assembly structure of the two test pieces in this invention;

[0026] Figure 8 This is a schematic diagram of the internal structure of the test piece of the present invention;

[0027] Figure 9 This is a schematic diagram of the structure of the test probe of the present invention;

[0028] Figure 10 This is a schematic diagram of the internal structure of the positioning shell of the present invention;

[0029] Figure 11 This is a schematic diagram of the disassembled structure of the rubber square plate and frame of the present invention;

[0030] Figure 12 This is a schematic diagram of the material guiding assembly of the present invention;

[0031] In the diagram: 1. Frame; 2. Lifting cylinder; 3. Test piece; 4. Positioning shell; 5. Chip; 6. Guide rail; 7. Material guide assembly; 8. T-shaped hanging plate; 9. Air pump; 10. Data acquisition box; 31. Horizontal mounting plate; 32. Test probe; 33. H-shaped sliding buckle; 34. Short lead screw; 35. Folding spring; 36. L-shaped mounting slot; 301. Cavity; 37. Spring push rod; 38. Ball head probe; 39. Arc-shaped spring; 310. Short pin; 321. Bow-shaped test probe; 322. Short needle; 323. Angled needle; 324. Groove; 41 42. Frame; 43. Telescopic spring rod; 44. Shallow foot groove; 45. Rubber square plate; 46. Round opening; 47. Small spring; 58. Short head; 59. Pin; 60. Controller; 61. Valve plate; 62. Material guide box; 63. Plate-type jet nozzle; 64. DD motor; 71. Bracket; 72. Electric push rod; 73. Guide rod; 74. Push plate; 75. Rubber pleated belt; 76. Rubber brush plate; 81. Threaded joint; 82. Hollow plate body; 83. Pin; 91. Flat tube body; 92. Piston column; 93. Piston rod; 94. Rubber push head. Detailed Implementation

[0032] The present invention will now be described in further detail with reference to the accompanying drawings and specific embodiments.

[0033] like Figures 1 to 12 As shown in the embodiment of the present invention, a BMS lithium battery chip testing and inspection equipment includes a frame 1. A lifting cylinder 2 is installed at the middle of the top of the frame 1. A test piece 3 is installed below the lifting cylinder 2. A positioning shell 4 is installed below the test piece 3. There are three positioning shells 4, which are equally spaced and fitted onto the bottom plate of the frame 1. A chip 5 is installed inside the positioning shell 4. A guide rail 6 is fitted to the front of the positioning shell 4. The guide rail 6 is used to guide the chip 5 and corresponds one-to-one with the positioning shell 4. A material guiding component 7 is installed at the middle of the rear of the positioning shell 4 and is bolted to the bottom plate of the frame 1. A T-shaped hanging plate 8 is installed between the test piece 3 and the top plate of the frame 1. An air pump 9 is fitted into the middle of the right side of the bottom plate of the frame 1. A data acquisition box 10 is bolted to the middle of the right side of the top plate of the frame 1. The data acquisition box 10 is electrically connected to the test piece 3 and is used to collect test data.

[0034] A horizontal mounting plate 31 is installed on the top of the test piece 3. A test needle 32 is assembled on the end of the test piece 3 away from the T-shaped hanging plate 8. An h-shaped sliding buckle 33 is fitted into the middle of the top of the horizontal mounting plate 31. A short screw rod 34 is threaded onto the top corner of the horizontal mounting plate 31. The horizontal mounting plate 31 is threaded to the test piece 3 via the short screw rod 34. A folding spring 35 is fitted into the horizontal mounting plate 31. The folding spring 35 is connected to the h-shaped sliding buckle 33. The h-shaped sliding buckle 33 is slidably installed with the horizontal mounting plate 31 via the folding spring 35. An L-shaped mounting groove 36 is opened in the middle of the side of the test piece 3 facing away from the data acquisition box 10. The test needle 32 is assembled in the L-shaped mounting groove 36 of the test piece 3 through the cooperation of the horizontal mounting plate 31 and the short screw rod 34. A short pin 310 is inserted into the top of the horizontal mounting plate 31 and on the side away from the data acquisition box 10. The short pin 310 is used to limit and block the test needle 32 inside the L-shaped mounting groove 36.

[0035] A cavity 301 is provided in the middle of the top of the test piece 3, and the cavity 301 is not directly connected to the L-shaped mounting slot 36. A spring rod 37 is installed symmetrically on the inner side of the cavity 301. A ball probe 38 is connected to the end of the spring rod 37 near the L-shaped mounting slot 36. The ball probe 38 is connected to the test piece 3 in a spring-loaded telescopic connection through the spring rod 37 and the cavity 301. The ball probe 38 is pushed into the inner side of the L-shaped mounting slot 36 through the spring rod 37. An arc-shaped spring piece 39 is connected to the inner wall of the L-shaped mounting slot 36 near the cavity 301. The arc-shaped spring piece 39 is used to shield the test needle 32 that is fitted into the inner side of the L-shaped mounting slot 36, and at the same time prevent the test needle 32 from directly squeezing and damaging the ball probe 38 and the spring rod 37 during the fitting of the test needle into the L-shaped mounting slot 36, so as to help the test needle 32 smoothly enter the inner side of the L-shaped mounting slot 36.

[0036] The test needle 32 includes a bow-shaped test needle 321 fitted inside the L-shaped groove 36. A groove 324 is provided at one end of the bow-shaped test needle 321 near the ball-head probe 38. The ball-head probe 38 is connected to the bow-shaped test needle 321 through the groove 324. A short needle 322 is connected to the end of the bow-shaped test needle 321 away from the ball-head probe 38. An angled needle 323 is connected to the side of the short needle 322 facing the ball-head probe 38, and the bottom of the angled needle 323 is flush with the bottom of the short needle 322.

[0037] A frame 41 is installed inside the positioning shell 4. The four corners of the bottom of the frame 41 are connected to telescopic spring rods 42. The frame 41 is connected to the positioning shell 4 in a spring-like telescopic connection through the telescopic spring rods 42. Shallow foot grooves 43 are symmetrically opened on the top of the frame 41 along the direction of the long edge, and the edges inside the shallow foot grooves 43 are all rounded.

[0038] A rubber square plate 44 is installed at the top center of the frame 41. A circular opening 45 is provided through the top center of the rubber square plate 44. Small springs 46 are connected to the four corners of the bottom of the rubber square plate 44. The rubber square plate 44 is spring-loaded to the frame 41 through the small springs 46. A short head 47 is fixedly connected to the top of the frame 41 and the part corresponding to the small springs 46. The short head 47 covers the bottom of the rubber square plate 44 to lift the rubber square plate 44 from the inside of the frame 41, supporting the bottom center of the chip 5 and preventing the bottom of the chip 5 from directly contacting the side of the frame 41, thus avoiding scratches on the chip 5. The frame 41 is hollow, which facilitates ventilation and heat dissipation of the chip body in the upper and lower directions during the test, and avoids the frame 41 completely blocking the chip body.

[0039] A controller 61 is installed on the top of the guide rail 6 and on the side near the positioning shell 4. A valve plate 62 is installed in the middle of the inner side of the guide rail 6. A DD motor 621 is fitted inside the guide rail 6. The output end of the DD motor 621 is installed with a pin on the valve plate 62. The valve plate 62 has a guide branch port at the installation position inside the guide rail 6. The guide branch port is used to guide the abnormal chip 5 to the guide box 63 through the guide branch port. The valve plate 62 is rotated and installed with the guide rail 6 through the cooperation of the DD motor 621 and the guide branch port. The controller 61 is used to control the opening and closing of the valve plate 62. A guide box 63 is installed at the bottom of the frame 1. A plate-type jet head 64 is fitted into the end of the guide box 63 near the air pump 9 and is connected to the air pump 9. The end of the guide box 63 away from the air pump 9 is open to facilitate the individual pushing and collection of defective chips 5 under the push of airflow.

[0040] The guide assembly 7 is bolted to the bracket 71 in the middle of the base plate of the frame 1. An electric push rod 72 is installed in the middle and near the top of the bracket 71. Guide rods 73 are installed in a centrally symmetrical manner around the electric push rod 72. The guide rods 73 are telescopically installed with the bracket 71. A push plate 74 is installed on the side of the bracket 71 facing the chip 5. The telescopic end of the electric push rod 72 and the guide rods 73 are connected to the push plate 74. The push plate 74 is telescopically installed with the bracket 71 through the cooperation of the electric push rod 72 and the guide rods 73. A rubber pleated strip 75 is attached to the side of the push plate 74 facing the chip 5. The rubber pleated strip 75 is hollow. Rubber brush plates 76 are connected to the long edges of the top and bottom of the push plate 74. The push plate 74 is slightly higher than the top of the positioning shell 4.

[0041] A threaded connector 81 is fixedly connected to the middle of the top of the T-shaped hanging plate 8. The threaded connector 81 is threadedly connected to the output end of the lifting cylinder 2. A hollow plate 82 is bolted to the bottom of the T-shaped hanging plate 8. A pin 83 is bolted to the hollow plate 82. The hollow plate 82 is inserted into the horizontal plate 31 through the pin 83. The horizontal plate 31 is fastened to the hollow plate 82 through the cooperation of the h-shaped sliding buckle 33 and the folding spring 35.

[0042] In use, the lifting cylinder 2 is activated to extend, and through the smooth guidance of the threaded connector 81 and the hollow plate 82, the test pin 32 on the test piece 3 is brought into contact with the pin 51. The chip 5 is tested through the connection between the test piece 3 and the test pin 32 via the spring push rod 37, the ball probe 38 and the test pin 32. Then, the test data is transmitted to the data acquisition box 10 through the connection between the output end of the test piece 3 and the data acquisition box 10. The test data is collected. Then, based on the feedback of the collected data from the data acquisition box 10, the air pump 9 is activated to deliver gas into the flat tube 91. The piston rod 93 is vertically lifted in the piston column 92, and the rubber push head 94 pushes the rubber square plate 44 upward, pushing the rubber square plate 44 and the frame 41 upward together. After the small springs 46 on the four corners of the rubber square plate 44 are pushed and stretched, the rubber square plate 44 pushes the chip 5 out from the inside of the positioning shell 4. At this time, the pin 51 has already been disengaged from the shallow foot. The slot 43 is then activated. The electric push rod 72 drives the rubber brush plate 76 on the push plate 74 to push the chip 5 into the guide rail 6. During this period, combined with the detection data signal collected by the data acquisition box 10 received by the controller 61, the DD motor 621 on the guide rail 6 is activated to fold down and open the valve plate 62 in the guide branch port, so that the abnormal chip 5 is guided into the guide box 63 through the guide branch port. The non-normal chip 5 will be in the state where the valve plate 62 inside the guide rail 6 is closed in the guide branch port, so that the qualified chip 5 can be successfully discharged. The abnormal chip 5 that enters the guide box 63 will be sprayed out of the guide box 63 by the plate jet head 64 after the air pump 9 is activated, and collected separately. Then, a new chip 5 to be tested is placed on the frame 41 inside the positioning shell 4, and the above operation is repeated to realize the continuous automatic detection of battery chips.

[0043] During use, the short pin 310 is used to lock the test needle 32 installed inside the L-shaped slot 36. By pulling out the short pin 310 at the corresponding position, and then manually holding the test needle 32, the test needle 32 is driven to press the ball probe 38 along the direction of the spring rod 37. The test needle 32 is then moved in a direction away from the data acquisition box 10, and the test needle 32 can be removed from the test piece 3 as a whole. This allows for convenient replacement of locally deformed test needles 32 without disassembling the entire structure of the test piece 3 or removing the test piece 3 from the T-shaped hanging plate 8 for replacement. The damaged test needle 32 can be easily replaced by simply pulling out and pushing the test piece 3, and then reversing the operation once more, thus maintaining the continuous use and continuous testing of the test piece 3.

[0044] The test probe 32 is separated from the structure of the test piece 3 and has been specially modularized. No experienced operators are required to replace the damaged test probe 32, ensuring the continued use of the test piece 3.

[0045] Furthermore, the hollow plate 82 and the horizontal mounting plate 31 can be easily assembled and disassembled through the snap-fit ​​between the H-shaped sliding buckle 33 and the hollow plate 82, and the vertical insertion of the hollow plate 82 into the horizontal mounting plate 31 via the pin 83. The horizontal mounting plate 31 can be easily removed without the use of additional disassembly tools, so that the test piece 3 and the components can be disassembled without the aid of tools, which facilitates the subsequent inspection and maintenance of the test piece 3.

[0046] By using the spring push rod 37 installed inside the cavity 301 and the ball probe 38 connected to the top of the spring push rod 37, the ball probe 38 can be fitted into the groove 324 by the elastic pushing action of the spring push rod 37. In this way, the test piece 3 and the test needle 32 are electrically connected, and the test needle 32 is fitted into the part inside the L-shaped mounting groove 36 for limiting and locking, preventing the end of the test needle 32 from shaking inside the L-shaped mounting groove 36 and avoiding poor contact. With the auxiliary shielding effect of the arc-shaped spring piece 39 on the side of the test needle 32, the test needle 32 can be stably installed inside the L-shaped mounting groove 36, ensuring the detection performance of the test piece 3 on the chip 5 through the test needle 32.

[0047] Meanwhile, through the structural design of the test needle 32 itself, the bow-shaped hollow structure of the bow-shaped test needle 321 enables the bow-shaped test needle 321 to have a certain elastic shock absorption performance, while reducing the overall weight of the bow-shaped test needle 321. This avoids secondary compression damage to the pin 51 when the bow-shaped test needle 321 contacts the pin 51, and also avoids the impact and displacement of the bow-shaped test needle 321's own position caused by the reaction force when the bow-shaped test needle 321 contacts the pin 51. This extends the service life of the bow-shaped test needle 321 and reduces material consumption in the bow-shaped test needle 321 structure.

[0048] Meanwhile, the short needle 322 is used as the main structure for contact between the bow-shaped test needle 321 and the pin 51. The angled needle 323 is used to expand the contact area and contact points between the short needle 322 and the pin 51 in the longitudinal direction. At the same time, since the angled needle 323 is connected to the short needle 322 at an angle, it also has a certain self-deformation and resilience, realizing shock absorption and protection of its own structure, and ensuring that the test needle 32 can make smooth contact and test with the chip 5.

[0049] Furthermore, the angled needle 323 extends the longitudinal contact span of the short needle 322, allowing the test needle 32 to adapt to the detection of pins 51 of different lengths. Simultaneously, the acute-angled Y-shaped structure formed by the angled needle 323 and the short needle 322 ensures that the pin 51 is smoothly pressed onto the frame 41 while protecting it from compression and breakage. Combined with the auxiliary limiting effect of the shallow groove 43 on the pin 51, this avoids damage to the pin 51 caused by relying solely on the angled needle 323 or the short needle 322 for contact. This reduces the concentrated pressure on pin 51, mitigating the damage caused by localized stress concentration. While ensuring precise control of the lifting cylinder 2, it achieves a connection detection method that allows contact with pin 51 without pressure. It also allows the chip 5 to be stably positioned and pressed onto the frame 41, preventing the chip 5 from shifting due to pressure on the frame 41, which would hinder subsequent unloading processes. Furthermore, it provides assistance for pin 51 to smoothly and completely enter the guide rail 6 under the guidance of the shallow foot groove 43 with rounded corners.

[0050] When the lifting cylinder 2 is activated and the test piece 3 is driven by the T-shaped hanging plate 8 to test the chip 5 inside the positioning shell 4, the spring-loaded retraction of the telescopic rod 42 can be used to reduce the hard pressing contact of the test pin 32 on the pin 51, thereby ensuring the safe use of the pin 51.

[0051] During use, the positioning shell 4 can use the rubber square plate 44 as a shielding medium for the chip 5 to contact the frame 41, providing shock absorption and anti-friction protection. At the same time, the rubber square plate 44 increases the contact friction between the chip 5 and the frame 41, avoids the relative displacement between the chip 5 and the frame 41, and ensures that the pin 51 is located directly below the test pin 32, so as to facilitate accurate alignment and detection.

[0052] By using the rubber brush plate 76 as a medium for direct contact between the push plate 74 and the chip 5, the push plate 74 can make flexible contact and push the chip 5, which can avoid the risk of scratching or breaking the chip 5 surface or pins 51 by the push plate 74, and ensure that the chip 5 after testing will not be damaged again.

[0053] Through the above operations, the testing equipment can automatically test the chips, automatically discharge and guide the chips, automatically guide and collect abnormal chips separately based on the feedback of the test data, and also realize the non-contact air-jet pushing and discharge function of the chips, autonomously and non-contactly remove abnormal chips, while avoiding the problem of chip breakage during the removal of abnormal chips and avoiding the occurrence of secondary damage to abnormal chips during the discharge process.

[0054] Please see Figure 10 and Figure 11As shown, in some embodiments of the BMS lithium battery chip testing and inspection equipment described in this embodiment, the chip 5 has a pin 51 connected to its side along the direction of its long edge. The pin 51 corresponds to the shallow groove 43. The chip 5 is installed in a limited position with the frame 41 through the cooperation of the pin 51 and the shallow groove 43. The chip 5 is installed in a lifting position with the positioning shell 4 through the cooperation of the frame 41 and the telescopic spring rod 42. The short needle 322 and the oblique needle 323 are both in contact with the pin 51.

[0055] By rounding the edges of the inner side of the shallow foot groove 43, the right-angle edges can be eliminated from limiting and obstructing the pin 51 inside the shallow foot groove 43, eliminating the risk of scratching and eliminating the risk of the pin 51 being partially damaged when the chip 5 is pushed out of the top of the frame 41 by the feeding component 7.

[0056] Please see Figure 10 and Figure 11 As shown, in some embodiments of the BMS lithium battery chip testing and inspection equipment described in this embodiment, a flat tube 91 is horizontally inserted into the inner middle of the positioning shell 4. The output end of the air pump 9 is connected to the flat tube 91. Piston columns 92 are installed at equal intervals on the top of the flat tube 91. A piston rod 93 is installed in the inner middle of the piston column 92. The piston rod 93 is installed in a lifting and lowering manner with the piston column 92 through the cooperation of the flat tube 91 and the air pump 9. The piston rod 93 is installed in the middle position inside the positioning shell 4 through the piston column 92. A rubber push head 94 is connected to the top of the piston rod 93. The rubber push head 94 is installed through the frame 41. The inner diameter of the rubber push head 94 is larger than the inner diameter of the round opening 45.

[0057] During the process of using piston rod 93 to push frame 41 and rubber square plate 44, the structural advantage of rubber square plate 44 being directly pushed by piston rod 93 can be utilized to push chip 5 out of frame 41 and make it stand out. This facilitates the subsequent horizontal pushing motion of rubber brush plate 76 to smoothly and safely push chip 5 from frame 41 into guide rail 6, ensuring the safe transfer of chip 5 from positioning shell 4 to guide rail 6 and guaranteeing the safe discharge of chip 5 by the testing equipment.

[0058] Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.

Claims

1. A BMS lithium battery chip testing and inspection device, comprising a frame (1), wherein a lifting cylinder (2) is installed at the middle of the top of the frame (1), characterized in that: The test piece (3) is installed below the lifting cylinder (2), and the positioning shell (4) is installed below the test piece (3). There are three positioning shells (4) installed at equal intervals on the bottom plate of the frame (1). The chip (5) is installed inside the positioning shell (4). The guide rail (6) is installed in close contact with the front of the positioning shell (4). The guide rail (6) is used to guide the chip (5). The guide rail (6) corresponds one-to-one with the positioning shell (4). The material guide assembly (7) is installed in the middle of the rear of the positioning shell (4). The material guide assembly (7) is bolted to the bottom plate of the frame (1). A T-shaped hanging plate (8) is installed between the test piece (3) and the top plate of the frame (1). An air pump (9) is installed in the middle of the right side of the bottom plate of the frame (1). A data acquisition box (10) is bolted to the middle of the right side of the top plate of the frame (1). The data acquisition box (10) is electrically connected to the test piece (3). The test piece (3) is fitted with a horizontal plate (31) on its top. A test needle (32) is assembled at the end of the test piece (3) away from the T-shaped hanging plate (8). An h-shaped sliding buckle (33) is fitted into the middle of the top of the horizontal plate (31). A short screw (34) is threaded onto the top corner of the horizontal plate (31). The horizontal plate (31) is threaded onto the test piece (3) via the short screw (34). A folding spring (35) is fitted into the horizontal plate (31). The folding spring (35) is connected to the test piece (3) by threads. The H-shaped sliding buckle (33) is connected and is slidably installed with the horizontal mounting plate (31) by means of the folding spring (35). The test piece (3) has an L-shaped mounting groove (36) in the middle of the side facing away from the data acquisition box (10). The test needle (32) is assembled in the L-shaped mounting groove (36) of the test piece (3) by means of the horizontal mounting plate (31) and the short screw (34). A short pin (310) is inserted into the top of the horizontal mounting plate (31) and the side away from the data acquisition box (10). The test needle (32) includes a bow-shaped test needle (321) fitted inside the L-shaped groove (36). The bow-shaped test needle (321) has a groove (324) at one end near the ball-head probe (38). The ball-head probe (38) is connected to the bow-shaped test needle (321) through the groove (324). A short needle (322) is connected to the end of the bow-shaped test needle (321) away from the ball-head probe (38). A beveled needle (323) is connected to the side of the short needle (322) facing the ball-head probe (38), and the bottom of the beveled needle (323) is flush with the bottom of the short needle (322).

2. The BMS lithium battery chip testing and inspection equipment according to claim 1, characterized in that: The test piece (3) has a cavity (301) in the middle of its top, and the cavity (301) is not directly connected to the L-shaped mounting slot (36). A spring rod (37) is installed symmetrically on the inner side of the cavity (301). A ball probe (38) is connected to one end of the spring rod (37) near the L-shaped mounting slot (36). The ball probe (38) is connected to the test piece (3) in a spring-loaded telescopic connection through the spring rod (37) and the cavity (301). An arc-shaped spring piece (39) is connected to the inner wall of the L-shaped mounting slot (36) and the side near the cavity (301).

3. The BMS lithium battery chip testing and inspection equipment according to claim 2, characterized in that: A frame (41) is installed inside the positioning shell (4). The four corners of the bottom of the frame (41) are connected to telescopic spring rods (42). The frame (41) is connected to the positioning shell (4) by telescopic spring rods (42). Shallow foot grooves (43) are symmetrically opened on the top of the frame (41) along the direction of the long edge. The edges of the shallow foot grooves (43) inside are all rounded.

4. The BMS lithium battery chip testing and inspection equipment according to claim 3, characterized in that: A rubber square plate (44) is installed at the top center of the frame (41). A round opening (45) is provided through the top center of the rubber square plate (44). Small springs (46) are connected to the four bottom corners of the rubber square plate (44). The rubber square plate (44) is spring-loaded to the frame (41) through the small springs (46). A short head (47) is fixedly connected to the top of the frame (41) and the part corresponding to the small springs (46). The frame (41) is hollow in the whole.

5. The BMS lithium battery chip testing and inspection equipment according to claim 4, characterized in that: The chip (5) has pins (51) connected to its side and along its long edge. The pins (51) correspond to the shallow grooves (43). The chip (5) is installed in a limited position with the frame (41) through the cooperation of the pins (51) and the shallow grooves (43). The chip (5) is installed in a lifting position with the positioning shell (4) through the cooperation of the frame (41) and the telescopic spring rod (42). The short needle (322) and the oblique needle (323) are both in contact with the pins (51).

6. The BMS lithium battery chip testing and inspection equipment according to claim 5, characterized in that: A controller (61) is installed on the top of the guide rail (6) and on the side near the positioning shell (4). A valve plate (62) is installed in the middle of the inner side of the guide rail (6). A DD motor (621) is fitted inside the guide rail (6). The output end of the DD motor (621) is installed with the valve plate (62) by a pin. The valve plate (62) has a material guide branch port at the part where it is installed inside the guide rail (6). The valve plate (62) is rotated and installed with the guide rail (6) through the cooperation of the DD motor (621) and the material guide branch port. The controller (61) is used to control the opening and closing of the valve plate (62). A material guide box (63) is installed at the bottom of the frame (1). A plate-type jet nozzle (64) is fitted at the end of the material guide box (63) near the air pump (9). The plate-type jet nozzle (64) is connected to the air pump (9). The end of the material guide box (63) away from the air pump (9) is open.

7. The BMS lithium battery chip testing and inspection equipment according to claim 6, characterized in that: The guide assembly (7) is bolted to a bracket (71) in the middle of the base plate of the frame (1). An electric push rod (72) is installed in the middle and near the top of the bracket (71). Guide rods (73) are installed around the electric push rod (72) in a centrally symmetrical manner. The guide rods (73) are telescopically mounted to the bracket (71). A push plate (74) is installed on the side of the bracket (71) facing the chip (5). The telescopic end of the electric push rod (72) and the guide plate are connected to the guide rod. The guide rods (73) are all connected to the push plate (74). The push plate (74) is telescopically installed with the bracket (71) through the cooperation of the electric push rod (72) and the guide rod (73). The side of the push plate (74) facing the chip (5) is fitted with a rubber pleated strip (75), and the rubber pleated strip (75) is hollow. The top and bottom long edges of the push plate (74) are connected with rubber brush plates (76), and the push plate (74) is slightly higher than the top of the positioning shell (4).

8. The BMS lithium battery chip testing and inspection equipment according to claim 7, characterized in that: A threaded connector (81) is fixedly connected to the middle of the top of the T-shaped hanging plate (8). The threaded connector (81) is threadedly connected to the output end of the lifting cylinder (2). A hollow plate (82) is bolted to the bottom of the T-shaped hanging plate (8). A pin (83) is bolted to the hollow plate (82). The hollow plate (82) is inserted into the horizontal plate (31) through the pin (83). The horizontal plate (31) is fastened to the hollow plate (82) through the cooperation of the h-shaped sliding buckle (33) and the folding spring (35).

9. The BMS lithium battery chip testing and inspection equipment according to claim 8, characterized in that: A flat tube (91) is horizontally inserted into the middle of the inner side of the positioning shell (4). The output end of the air pump (9) is connected to the flat tube (91). Piston columns (92) are installed at equal intervals on the top of the flat tube (91). A piston rod (93) is installed in the middle of the inner side of the piston column (92). The piston rod (93) is installed in a lifting and lowering manner with the piston column (92) through the cooperation of the flat tube (91) and the air pump (9). The piston rod (93) is installed in the middle of the inner side of the positioning shell (4) through the piston column (92). A rubber push head (94) is connected to the top of the piston rod (93). The rubber push head (94) is installed through the frame (41). The inner diameter of the rubber push head (94) is larger than the inner diameter of the round opening (45).

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