一种电容器的绝缘电阻自动测试方法及系统
By constructing a simulated insulation resistance test curve through gradually increasing reference test voltage and dynamic correction coefficient, the degradation problem caused by high voltage in capacitor insulation resistance testing is solved, the test accuracy and reliability are improved, the capacitor is ensured to exhibit consistent good insulation performance in multiple tests, and the service life of the capacitor is extended.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SICHUAN PROVINCE SCI CITY JIUXIN SCI & TECH
- Filing Date
- 2025-08-11
- Publication Date
- 2026-07-17
AI Technical Summary
Existing technologies for testing capacitor insulation resistance often result in the degradation of good capacitors due to high-voltage testing, and lack personalized testing strategies for capacitors from different manufacturers and models, affecting test accuracy and reliability.
By using a gradually increasing reference test voltage, combined with capacitor type labels and dynamic correction factors, an insulation resistance test simulation curve is constructed to ensure that the test voltage is always lower than the rated voltage. The insulation performance of the capacitor is evaluated through multiple tests.
This effectively avoids capacitor degradation caused by high-voltage testing, improves testing accuracy and reliability, ensures consistent good insulation performance of capacitors in multiple tests, and extends the service life of capacitors.
Smart Images
Figure CN120971811B_ABST