一种电子产品老化自动测试装置
The test assembly, designed with an indexing plate and floating blocks, combined with a dual positioning structure of positioning bushings, positioning pins, and positioning shafts, solves the problem of inaccurate positioning of probes and product pins, achieving high-precision and efficient aging tests for electronic products, while reducing probe wear and equipment costs.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- 昆山瑞弘测控自动化设备有限公司
- Filing Date
- 2025-09-12
- Publication Date
- 2026-07-17
AI Technical Summary
Existing electronic product aging test equipment has insufficient positioning accuracy between the probe and the product PIN, resulting in poor testing accuracy, severe probe wear, and affecting the service life and cost of the test equipment.
The test assembly, designed with an indexing plate and floating blocks, combines a dual positioning structure with positioning bushings, positioning pins, and positioning shafts, along with floating elastic elements, to ensure precise alignment of the probe with the product pin point. It also achieves efficient product transfer and positioning through a robotic arm and a loading and handling device.
It improves the accuracy and efficiency of aging tests for electronic products, reduces probe wear, extends equipment life, and enhances the stability and automation of the testing process.
Smart Images
Figure CN121069067B_ABST