基于开尔文探针力显微镜对电势的测量方法及相关装置

By using a coaxial optical path and collimating lens design, combined with a synchronous control unit, precise focusing of the laser beam and precise in-situ detection of sample micro-areas are achieved. This solves the measurement shortcomings of traditional KPFM under illumination conditions and realizes high-resolution and real-time synchronous photogenerated surface potential measurement.

CN121114498BActive Publication Date: 2026-07-17INST OF PHYSICS HENAN ACAD OF SCI +2

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
INST OF PHYSICS HENAN ACAD OF SCI
Filing Date
2025-10-14
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing technologies have shortcomings in achieving high spatial resolution, high temporal accuracy, and low noise in-situ illumination dynamic measurement of nanoscale surface potential, especially in terms of the synchronization and resolution of illumination conditions and potential measurement. Furthermore, commercial AFM systems lack a highly integrated and controllable built-in laser excitation module.

Method used

By designing a physical coaxial optical path and a collimating lens, the laser optical path is made coaxial with the illumination optical path of the AFM body. Combined with a synchronous control unit, the laser parameters are adjusted in real time and surface potential data is collected synchronously to generate time-potential curves or spatial potential distribution maps.

Benefits of technology

It achieves precise focusing of the laser beam and precise in-situ detection of sample micro-areas, solving the problem that traditional KPFM can only measure the dark-state surface potential of photosensitive materials, overcoming the difficulties of introducing external light sources, and realizing high-resolution and real-time synchronous photogenerated surface potential measurement.

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Abstract

本申请提供基于开尔文探针力显微镜对电势的测量方法及相关装置,通过光路耦合组件的转接接口将激光器的激光输出光路与AFM主体原有照明光路实现物理同轴,在AFM照明光路末端增设准直镜以确保激光为准直光并覆盖于探针‑样品接触区域,再将光敏材料样品清洁后、干燥后固定于样品台,随后启动激光激发模块与KPFM控制单元,实时调节激光参数并同步采集表面电势数据,生成时间‑电势曲线或空间电势分布图。能够通过光路物理同轴和准直镜实现激光光束精准聚焦、样品微区精密原位检测和标准化参数调控,解决了传统KPFM只能测量光敏材料暗态的表面电势,而激光辐照下的光生表面电势缺乏原位测量专业设备的难题,同时克服了外部引入光源困难的问题。
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