A HIL test method, device and system
By simulating the state data of only one battery pack and generating the state data of other battery packs in HIL testing, the problem of high resource demand in multi-battery pack parallel architecture is solved, achieving efficient resource utilization and improved testing efficiency.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- JIANGSU XCMG CONSTRUCTION MACHINERY RESEARCH INSTITUTE LTD
- Filing Date
- 2025-09-03
- Publication Date
- 2026-07-31
AI Technical Summary
Existing HIL testing methods have high channel resource requirements, especially in multi-battery pack parallel architectures, where each battery pack needs to be configured with an independent physical board and wiring harness, resulting in an exponential increase in resource requirements.
The status data of only one battery pack is simulated, and the status data of other battery packs is generated based on this status data. The requirement for channel resources is reduced by copying and modifying, and the wiring harness and acquisition channel are connected by multiplexing.
This significantly reduces the demand for channel resources, lowers the configuration requirements for independent physical boards and wiring harnesses, and improves testing efficiency.
Smart Images
Figure CN121232020B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to a HIL testing method, apparatus, and system, belonging to the field of HIL testing. Background Technology
[0002] In modern large-scale electric engineering machinery (such as electric excavators, loaders, mining trucks, forklifts, etc.), in order to meet the requirements of high power output, long endurance and space layout, a multi-battery pack parallel architecture is generally adopted.
[0003] Currently, HIL (Hardware-In-the-Loop) testing for multiple parallel battery packs involves connecting multiple real BMSs to a HIL test bench. This is achieved by simulating the state of each battery pack through individual cell voltage simulation channels, configuring communication interfaces for each BMS through communication modules, and simulating battery pack temperature through resistance simulation channels. This testing method has extremely high requirements for channel resources. Specifically, new energy engineering machinery battery packs have a large number of cells per pack, requiring independent physical boards and wiring harnesses for each pack, leading to an exponential increase in channel resource requirements with the number of packs. Summary of the Invention
[0004] This invention provides a HIL testing method, apparatus, and system, which solves the problems disclosed in the background art.
[0005] According to one aspect of this application, a HIL testing method is provided, comprising: Receive selected battery pack status data sent by the selected battery pack BMS; wherein, the selected battery pack status data is data simulated by the HIL device and sent to the selected battery pack BMS; the selected battery pack is any battery pack in the multi-battery pack parallel architecture; the selected battery pack BMS also sends the selected battery pack status data to the MBMS; Copy the selected battery pack status data to each non-selected battery pack; where the non-selected battery packs are the other battery packs in the parallel battery pack architecture excluding the selected battery pack. For each non-selected battery pack, if external input fault data is received, the status data of the copied selected battery pack is modified based on the external input fault data, and the modified status data of the selected battery pack is sent to MBMS as the status data of the non-selected battery pack; wherein, MBMS performs HIL test based on the status data of all battery packs in the multi-battery pack parallel architecture.
[0006] Furthermore, the method also includes: if no external input fault data is received, sending the copied selected battery pack status data as the status data of the non-selected battery pack to the MBMS.
[0007] Furthermore, the copied selected battery pack status data is modified based on externally input fault data, including: Based on externally input fault data, determine the data that needs to be replaced in the copied selected battery pack status data; Externally input fault data is used to overwrite the data that needs to be replaced, and the modified status data of the selected battery pack is obtained.
[0008] Furthermore, the method also includes: sending an adjustment command to the HIL device in response to the need to adjust the selected battery pack status data.
[0009] According to another aspect of this application, a HIL testing apparatus is provided, comprising: The receiving module receives the selected battery pack status data sent by the selected battery pack BMS; wherein, the selected battery pack status data is data simulated by the HIL device and sent to the selected battery pack BMS; the selected battery pack is any battery pack in the multi-battery pack parallel architecture; the selected battery pack BMS also sends the selected battery pack status data to the MBMS; The copy module copies the selected battery pack status data for each non-selected battery pack; where the non-selected battery packs are the other battery packs in the parallel battery pack architecture excluding the selected battery pack. The coverage module, for each non-selected battery pack, if it receives external input fault data, modifies the copied selected battery pack status data based on the external input fault data, and sends the modified selected battery pack status data as the status data of the non-selected battery pack to MBMS; wherein, MBMS performs HIL test based on the status data of all battery packs in the multi-battery pack parallel architecture.
[0010] Furthermore, the overlay module is also used to send the copied status data of the selected battery pack as the status data of the non-selected battery pack to the MBMS if no external input fault data is received.
[0011] According to another aspect of this application, a HIL testing system is provided, including a HIL device and a host computer; The HIL device simulates the status data of the selected battery pack and sends the simulated status data of the selected battery pack to the BMS of the selected battery pack; the host computer implements the above HIL test method.
[0012] Furthermore, the selected battery pack status data includes the individual cell voltage and temperature of the selected battery pack. Multiple AFEs in the selected battery pack BMS are connected in parallel in the same acquisition channel to acquire the individual cell voltage / temperature of the selected battery pack.
[0013] Furthermore, the HIL device is connected to multiple parallel AFEs via wiring harnesses manufactured using a multiplexing method.
[0014] Furthermore, data transmission is performed via CAN signals between the selected battery pack's BMS and the host computer, between the selected battery pack's BMS and the MBMS, and between the host computer and the MBMS.
[0015] The beneficial effects achieved by this invention are as follows: This invention only simulates the status data of selected battery packs and generates status data of non-selected battery packs based on the status data of selected battery packs. It does not require configuring independent physical boards and wiring harnesses for each battery pack to collect status data, which greatly reduces the channel resource requirements. Attached Figure Description
[0016] Figure 1 A flowchart of the HIL testing method; Figure 2 A block diagram of the HIL test setup; Figure 3 This is a schematic diagram of the HIL testing system. Figure 4 This is a schematic diagram of the HIL test system for collecting the voltage of individual cells in a selected battery pack. Figure 5 Schematic diagram for generating state data of non-selected battery packs in the HIL test system; Figure 6 A detailed schematic diagram for generating state data for a non-selected battery pack in the HIL test system. Detailed Implementation
[0017] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit this application or its application or use. All other embodiments obtained by those skilled in the art based on the embodiments of this application without creative effort are within the scope of protection of this application.
[0018] Unless otherwise specifically stated, the relative arrangement, numerical expressions, and values of the components and steps described in these embodiments do not limit the scope of this application.
[0019] At the same time, it should be understood that, for ease of description, the dimensions of the various parts shown in the accompanying drawings are not drawn according to actual scale.
[0020] Techniques, methods, and equipment known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and equipment should be considered part of the specification.
[0021] In all examples shown and discussed herein, any specific values should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values.
[0022] It should be noted that similar symbols and letters in the following figures represent similar items; therefore, once an item is defined in one figure, it does not need to be discussed further in subsequent figures.
[0023] To address the high channel resource requirements of existing HIL testing methods, this application proposes a novel HIL testing method. Specifically, it simulates the state data of only one battery pack, with the data for the remaining battery packs generated based on the simulated data, thereby significantly reducing channel resource requirements. This testing method can be executed by a testing device, which can be a terminal device, a server, etc. The terminal device can include, but is not limited to, mobile phones, computers, smart wearable devices, smart vehicle devices, etc., as described in this application. The server can be a standalone physical server, a server cluster or distributed system composed of multiple physical servers, or a cloud server providing basic cloud computing services such as cloud services, cloud databases, cloud computing, big data, and artificial intelligence platforms, etc., as described in this application. Optionally, this testing method can also be executed collaboratively by multiple electronic devices with computing power. For ease of explanation, subsequent embodiments will be described as being executed by a substitute testing device.
[0024] See Figure 1 , Figure 1 This is a flowchart of a HIL testing method provided in an embodiment of this application. The testing method can be executed by a testing device and may include at least the following steps: Step 1: Receive the selected battery pack status data sent by the selected battery pack BMS.
[0025] It should be noted that the selected battery pack status data is data simulated by the HIL device and sent to the selected battery pack BMS. The HIL device can be an existing device. The HIL device integrates a single cell voltage simulator, a resistor simulator, a high-voltage board, hardware I / O boards, and communication boards, etc. Among them, the single cell voltage simulator is used to simulate the single cell voltage in the status data, the resistor simulator is used to simulate the single cell temperature in the status data (the temperature of the cells is collected by temperature sensors on the battery pack. The temperature sensors have a fixed RT meter, that is, one resistor corresponds to one temperature. That is, changing the resistance value, the sensor can obtain a temperature value, so the resistor simulator can simulate temperature), the high-voltage board is used to simulate the high voltage in the status data, such as the voltage across the battery pack and the voltage at the rear end of the relay. After these high-voltage data are collected, they are used for fault diagnosis, that is, to determine whether the battery pack is normal. The hardware DI (digital input) and AI (analog input) boards are used to collect various hard-wired signals of the BMS. For example, the AI can collect the relay high-side drive signal and the BMS power supply signal. The hardware DO and AO boards are used to output hard-wired signals. Each manufacturer's DI and AI boards have a corresponding host computer, which can be directly read from the host computer; similarly, DO and AO boards can be controlled by the host computer to output the required signals.
[0026] To facilitate the control of HIL device simulation data, in some embodiments, in response to the need to adjust the selected battery pack status data, an adjustment command is sent to the HIL device. The adjustment command can adjust the selected battery pack status data, such as individual cell voltage, individual cell temperature, DO / DI / AI / AO, and high voltage.
[0027] For example, when using a host computer as a testing device, and it is necessary to adjust the status data of a selected battery pack, adjustment parameters can be input manually. Based on the adjustment parameters, adjustment commands are generated, and the status data simulated by the HIL device is controlled by the adjustment commands.
[0028] It should be noted that there are no specific requirements for selecting a battery pack; it is simply any battery pack in a multi-battery pack parallel architecture, provided that the battery pack is functioning normally.
[0029] It should be noted that when selecting the battery pack BMS (Battery Management System) to send status data to the test equipment, it will also select the battery pack status data to send to the MBMS (i.e., the main controller of the multi-battery pack parallel architecture), so as to facilitate the subsequent HIL test by the MBMS.
[0030] Step 2: Copy the selected battery pack status data for each non-selected battery pack; where the non-selected battery packs are the other battery packs in the parallel battery pack architecture besides the selected battery pack.
[0031] Step 3: For each non-selected battery pack, if external input fault data is received, modify the copied selected battery pack status data based on the external input fault data, and send the modified selected battery pack status data as the status data of the non-selected battery pack to MBMS; wherein, MBMS performs HIL test based on the status data of all battery packs in the multi-battery pack parallel architecture.
[0032] It should be noted that the externally input fault data is fault data that is manually entered by people, and this fault data can be injected based on experience.
[0033] For all non-selected battery packs in a multi-battery pack parallel architecture, fault data can be injected into all non-selected battery packs, none of them can be injected, or some non-selected battery packs can be injected with fault data while others are not. The fault data injected into different non-selected battery packs can be the same or different, and can be manually set according to the actual situation.
[0034] Therefore, for non-selected battery packs with external input fault data, the status data of the copied selected battery pack will be modified based on the external input fault data. For non-selected battery packs without external input fault data, the copied data will be transmitted directly. That is, if no external input fault data is received, the status data of the copied selected battery pack will be sent to MBMS as the status data of the non-selected battery pack.
[0035] It should be noted that modifying the status data of a selected battery pack mainly involves using externally input fault data to overwrite the corresponding segments in the original status data. The specific process is as follows: Based on the externally input fault data, the data that needs to be replaced in the copied selected battery pack status data is determined, and the remaining data is the data that does not need to be replaced. The externally input fault data is used to overwrite the data that needs to be replaced, and the modified selected battery pack status data is obtained. That is, the externally input fault data and the data that does not need to be replaced constitute the modified selected battery pack status data.
[0036] By modifying or not modifying as described above, status data for each non-selected battery pack can be generated. This generated data is then sent to the MBMS. The MBMS controls the entire multi-battery pack parallel architecture based on the status data of the selected and non-selected battery packs, thereby completing the HIL test.
[0037] The above method only simulates the status data of the selected battery pack and generates the status data of the non-selected battery pack based on the status data of the selected battery pack. It does not require configuring an independent physical board and wiring harness for each battery pack to collect status data, which greatly reduces the channel resource requirements.
[0038] See Figure 2 , Figure 2 This is a block diagram of a HIL testing device provided in an embodiment of this application. Figure 2 The embodiment is a virtual device that can be loaded and executed by a computer device, which may include the aforementioned test equipment. This device may include at least a receiving module, a copying module, and an overlay module. When executing the aforementioned HIL test method, it can: The receiving module receives the selected battery pack status data sent by the selected battery pack BMS; wherein, the selected battery pack status data is data simulated by the HIL device and sent to the selected battery pack BMS; the selected battery pack is any battery pack in the multi-battery pack parallel architecture; the selected battery pack BMS also sends the selected battery pack status data to the MBMS.
[0039] The copy module copies the selected battery pack status data for each non-selected battery pack; the non-selected battery packs are the other battery packs in the parallel battery pack architecture besides the selected battery pack.
[0040] The coverage module, for each non-selected battery pack, if it receives external input fault data, modifies the copied selected battery pack status data based on the external input fault data, and sends the modified selected battery pack status data as the status data of the non-selected battery pack to MBMS; wherein, MBMS performs HIL test based on the status data of all battery packs in the multi-battery pack parallel architecture.
[0041] It should be noted that for all non-selected battery packs in a multi-battery pack parallel architecture, fault data can be injected into all non-selected battery packs, none of them can be injected with fault data, or some non-selected battery packs can be injected with fault data while others are not. The fault data injected into different non-selected battery packs can be the same or different, and can be manually set according to the actual situation.
[0042] Therefore, in the coverage module, for non-selected battery packs with external input fault data, the status data of the copied selected battery pack will be modified based on the external input fault data. For non-selected battery packs without external input fault data, the copied data will be transmitted directly. That is, if no external input fault data is received, the status data of the copied selected battery pack will be sent to MBMS as the status data of the non-selected battery pack.
[0043] The above device only simulates the status data of the selected battery pack and generates the status data of the non-selected battery pack based on the status data of the selected battery pack. It does not require configuring an independent physical board and wiring harness for each battery pack to collect status data, which greatly reduces the channel resource requirements.
[0044] See Figure 3 , Figure 3 This is a schematic diagram of the structure of a HIL testing system provided in an embodiment of this application. The system may include at least a HIL device and a host computer. The HIL device simulates the state data of a selected battery pack and sends the simulated state data of the selected battery pack to the BMS of the selected battery pack. The host computer is the aforementioned testing device and specifically implements the aforementioned HIL testing method.
[0045] Figure 3 In the existing multi-battery pack parallel architecture, BMS and MBMS are components. The host computer can connect to the HIL device via Ethernet and send adjustment commands to the HIL device to adjust the selected battery pack status data issued by the HIL device. The HIL device can connect to the BMS of the selected battery pack via a wiring harness. The BMS of the selected battery pack is connected to the host computer and the MBMS. The host computer is connected to the MBMS. Data can be transmitted between the BMS of the selected battery pack and the host computer, between the BMS of the selected battery pack and the MBMS, and between the host computer and the MBMS via CAN signals. Figure 3 In the diagram, CAN1 represents the CAN signal containing the status data of the selected battery pack, and CAN2~CAN... n These represent n-1 CAN signals, each containing n-1 non-selected battery pack status data.
[0046] It should be noted that, in order to further reduce the demand for channel resources, in some embodiments, multiple AFEs in the selected battery pack BMS are connected in parallel in the same acquisition channel to acquire the voltage / temperature of the selected battery cells, while other data can be acquired using pins on the BMS. The specific HIL device and the multiple parallel AFEs can be connected by a wiring harness made using a multiplexing method.
[0047] Taking the acquisition of individual cell voltage as an example, such as Figure 4 As shown, the AFE (Analog Front End) in the BMS is responsible for acquiring the individual cell voltage. The first voltage acquisition channel of the three AFEs is connected in parallel to the individual cell voltage analog channel 1, and the second voltage acquisition channel of the three AFEs is connected in parallel to the individual cell voltage analog channel 2. This achieves the one-to-three multiplexing of the individual cell voltage analog channel, that is, one individual cell voltage analog channel can simulate three cells, and the parallel connection does not affect the voltage acquisition. Therefore, the required resources are reduced by 2 times.
[0048] See Figure 5 In the host computer, after receiving CAN1 (including data Data1 to DataN), CAN1 is copied, and the data on CAN1 is forwarded or modified and then forwarded to the multiple CAN channels, thus generating CAN2 to CAN3. n This simulates the information sent from the non-selected battery pack BMS to the MBMS.
[0049] Figure 5 The Override module in the text refers to the aforementioned overriding module. Taking the modification of CAN1 to generate CAN2 as an example, see [link to relevant documentation]. Figure 6 The Override module mainly includes a fault handling module, a signal parsing module, a data overlay module, and a signal encoding module.
[0050] The fault handling module receives external input fault data (which includes the fault type) and processes it to identify the data that needs to be replaced. The signal parsing module parses CAN1 and, based on the output of the fault handling module, separates the data that needs to be replaced from the data that does not need to be replaced. The data overlay module uses the external input fault data to overlay the data that needs to be replaced and packages the modified data and the data that does not need to be replaced together and sends them to the encoding module. The encoding module encodes the packaged data into CAN2 and sends it to MBMS.
[0051] MBMS aggregates multiple data streams based on CAN1, which is simulated using single-packet hardware resources. By changing the status data of a selected battery pack, CAN1 is affected, thus enabling environmental changes across the entire architecture. Alternatively, the status data of a selected battery pack can remain unchanged, enabling the Override module corresponding to each pack to inject faults into individual packs, thereby achieving functional testing and verification of the architecture.
[0052] The system described above parses and processes CAN signals through a host computer, and can inject faults by modifying the data, thereby enabling the functional verification of the entire architecture.
[0053] The above description is only a preferred embodiment of this application. It should be noted that for those skilled in the art, several improvements and modifications can be made without departing from the technical principles of this invention, and these improvements and modifications should also be considered within the scope of protection of this invention.
Claims
1. A HIL test method, characterized in that, include: Receive selected battery pack status data sent by the selected battery pack BMS; wherein, the selected battery pack status data is data simulated by the HIL device and sent to the selected battery pack BMS; the selected battery pack is any battery pack in the multi-battery pack parallel architecture; the selected battery pack BMS also sends the selected battery pack status data to the MBMS; Copy the selected battery pack status data to each non-selected battery pack; where the non-selected battery packs are the other battery packs in the parallel battery pack architecture excluding the selected battery pack. For each non-selected battery pack, if external input fault data is received, the status data of the copied selected battery pack is modified based on the external input fault data, and the modified status data of the selected battery pack is sent to MBMS as the status data of the non-selected battery pack; wherein, MBMS performs HIL test based on the status data of all battery packs in the multi-battery pack parallel architecture.
2. The method of claim 1, wherein, The method further includes: if no external input fault data is received, sending the copied selected battery pack status data as the status data of the non-selected battery pack to the MBMS.
3. The method of claim 1, wherein, Modify the copied status data of the selected battery pack based on externally input fault data, including: Based on externally input fault data, determine the data that needs to be replaced in the copied selected battery pack status data; Externally input fault data is used to overwrite the data that needs to be replaced, and the modified status data of the selected battery pack is obtained.
4. The method of claim 1, wherein, The method further includes sending an adjustment command to the HIL device in response to the need to adjust the selected battery pack status data.
5. A HIL test device, characterized by, include: The receiving module receives the selected battery pack status data sent by the selected battery pack BMS; wherein, the selected battery pack status data is data simulated by the HIL device and sent to the selected battery pack BMS; the selected battery pack is any battery pack in the multi-battery pack parallel architecture; the selected battery pack BMS also sends the selected battery pack status data to the MBMS; The copy module copies the selected battery pack status data for each non-selected battery pack; where the non-selected battery packs are the other battery packs in the parallel battery pack architecture excluding the selected battery pack. The coverage module, for each non-selected battery pack, if it receives external input fault data, modifies the copied selected battery pack status data based on the external input fault data, and sends the modified selected battery pack status data as the status data of the non-selected battery pack to MBMS; wherein, MBMS performs HIL test based on the status data of all battery packs in the multi-battery pack parallel architecture.
6. The apparatus of claim 5, wherein, The overlay module is also used to send the copied status data of the selected battery pack as the status data of the non-selected battery pack to the MBMS if no external input fault data is received.
7. A HIL test system characterized by, Includes HIL equipment and host computer; The HIL device simulates the status data of the selected battery pack and sends the simulated status data of the selected battery pack to the BMS of the selected battery pack; the host computer implements the method described in any one of claims 1 to 4.
8. The system of claim 7, wherein, The selected battery pack status data includes the individual cell voltage and temperature of the selected battery pack. Multiple AFEs in the selected battery pack BMS are connected in parallel in the same acquisition channel to acquire the individual cell voltage / temperature of the selected battery pack.
9. The system of claim 8, wherein, The HIL device is connected to multiple parallel AFEs via multiplexed wiring harnesses.
10. The system of claim 7, wherein, Data transmission is performed via CAN signals between the selected battery pack's BMS and the host computer, between the selected battery pack's BMS and the MBMS, and between the host computer and the MBMS.