一种芯片焊接机光学检出的方法、装置及设备

By adding real-time detection of the position and orientation of the lead frame (BA) in the chip bonding machine, combined with lead frame information, and using a parallel zoom lens and image processing system, the problem of insufficient welding position accuracy in the chip bonding machine was solved, thereby improving welding accuracy and product reliability.

CN121297664BActive Publication Date: 2026-07-17QUICK INTELLIGENT EQUIP CO LTD +1

Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
QUICK INTELLIGENT EQUIP CO LTD
Filing Date
2025-10-17
Publication Date
2026-07-17

AI Technical Summary

Technical Problem

Existing optical inspection systems for chip bonding machines cannot monitor chip offset errors and the movement posture of the bonding arm (BA) during the handling process in real time, resulting in insufficient bonding position accuracy, which affects bonding yield and product reliability.

Method used

By adding real-time detection of the BA position and orientation, combined with leadframe position information, and using parallel high-resolution zoom lenses and image processing systems, the relative position of the chip and leadframe is calculated and corrected in real time.

Benefits of technology

It enables real-time detection of chip position and precise correction of leadframe soldering position, improving soldering accuracy and bonding yield, and enhancing product reliability.

✦ Generated by Eureka AI based on patent content.

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Abstract

本发明涉及芯片封装技术领域,本发明提供了一种芯片焊接机光学检出的方法、装置及设备,所述方法包括:启动Die Bond机器,系统初始化;视觉系统获取BA的基准位置信息和姿态信息;BA按预设路径移动至芯片上方进行拾取并将芯片搬送至引线框架上方;视觉系统获取引线框架的位置信息和形状信息,识别引线框架焊接点的位置坐标,并获取BA的当前位置信息和姿态信息;计算BA当前位置信息和姿态信息与BA基准位置信息和姿态信息的偏移量从而计算出BA当前位置与焊接点的相对位置,控制系统根据该位置调整引线框架的位置。本发明增加对BA位置的检测功能,综合考虑BA位置以及引线框架位置,实现对引线框架焊接位置的精确校正,提高产品良率。
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